CN103347113A - Testing device and method of mobile phone SIM socket - Google Patents

Testing device and method of mobile phone SIM socket Download PDF

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Publication number
CN103347113A
CN103347113A CN2013102612192A CN201310261219A CN103347113A CN 103347113 A CN103347113 A CN 103347113A CN 2013102612192 A CN2013102612192 A CN 2013102612192A CN 201310261219 A CN201310261219 A CN 201310261219A CN 103347113 A CN103347113 A CN 103347113A
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CN
China
Prior art keywords
mobile phone
sim card
test
testing
circuit board
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN2013102612192A
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Chinese (zh)
Inventor
赵红
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SHENZHEN ZHONGRUAN XINDA ELECTRONICS CO Ltd
Original Assignee
SHENZHEN ZHONGRUAN XINDA ELECTRONICS CO Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SHENZHEN ZHONGRUAN XINDA ELECTRONICS CO Ltd filed Critical SHENZHEN ZHONGRUAN XINDA ELECTRONICS CO Ltd
Priority to CN2013102612192A priority Critical patent/CN103347113A/en
Publication of CN103347113A publication Critical patent/CN103347113A/en
Pending legal-status Critical Current

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  • Mobile Radio Communication Systems (AREA)

Abstract

The invention provides a testing device and method of a mobile phone SIM socket. A PCB for simulating a mobile phone SIM card is designed, the PCB is provided with a SIM card circuit which is the same as that of the mobile phone SIM card and used for simulating the SIM card, the SIM card circuit is connected with a mobile phone SIM socket to be tested through circuits, and meanwhile the PCB is further provided with a testing connecting terminal which is connected with the SIM card circuit and used for being connected with a multifunctional tester. According to the testing method, the SIM socket does not need to be fixed on a tool jig to be tested, the testing process is simpler, the defects, existing in an existing method, that positioning is inaccuracy and efficiency is low are overcome, and a double-layer card or a TF card can also be tested conveniently.

Description

A kind of testing apparatus of mobile phone deck and method of testing
Technical field
The present invention relates to the measuring technology of mobile phone deck.
Background technology
Frock is adopted in existing mobile phone deck test; by being installed, pilot pin tests; the tool design of frock test as shown in Figure 1; comprise housing 1, patrix needle plate 2, counterdie needle plate 3 and counterdie backplate 4; during test, the mobile phone deck is put on the counterdie backplate 4, the mobile phone deck is aimed at counterdie needle plate 3; then patrix needle plate 2 is depressed, by the PFC multifunctional tester performances such as the conducting of mobile phone deck, insulation are tested.
Existing mobile phone deck method of testing is tested owing to deck being fixed on the tool fixture, and it is inaccurate to exist the location, and the shortcoming that efficient is slower sticks into the row test as needs to bilayer card or TF, and existing tool structure can't be tested.
Summary of the invention
For this reason, the present invention provides a kind of testing apparatus and method of testing of mobile phone deck for overcoming above-mentioned the deficiencies in the prior art.
The present invention realizes that the technical scheme that goal of the invention adopts is: a kind of testing apparatus of mobile phone deck, the PCB circuit board that comprises an analogue mobile phone SIM card, described PCB circuit board has the SIM card circuit identical with described SIM cards of mobile phones, and has a test splicing ear that is connected with described SIM card circuit, described SIM card circuit is electrically connected with the mobile phone deck, and described test splicing ear is connected to the PFC multifunctional tester in order to described mobile phone deck is carried out functional test.
Particularly, described test splicing ear is provided with 6.
The present invention also provides a kind of method of testing of mobile phone deck, may further comprise the steps:
A. design the PCB circuit board of an analogue mobile phone SIM card, described PCB circuit board has the SIM card circuit identical with described SIM cards of mobile phones, and has the test splicing ear that is connected with described SIM card circuit;
B. described PCB circuit board is inserted mobile phone deck to be measured, described SIM card circuit is electrically connected with the mobile phone deck;
C. described test splicing ear is connected to the PFC multifunctional tester, by the PFC multifunctional tester described mobile phone deck is carried out functional test.
Particularly, the described functional test among the step C comprises continuity test, Insulation test, short circuit current and fault current.
The invention has the beneficial effects as follows: the present invention is by the PCB circuit board of design simulation SIM cards of mobile phones, this PCB circuit board has the SIM card circuit identical with SIM cards of mobile phones, carrying out circuit with analogue mobile phone SIM card and mobile phone deck to be measured is connected, this PCB circuit board also has the test splicing ear that is connected with the SIM card circuit simultaneously, is connected for testing with multifunctional tester; By method of testing of the present invention, deck need not be fixed on the tool fixture and test, test process is more simple, and the location that has overcome present method of testing existence simultaneously is inaccurate, and the shortcoming that efficient is slower can also stick into the row test to bilayer card or TF easily.
Description of drawings
Fig. 1 is the structure chart of existing frock measurement jig;
The structural representation of Fig. 2 PCB circuit board.
Embodiment
The present invention is described in detail below in conjunction with specific embodiment.
Mobile phone deck testing apparatus of the present invention comprises: the PCB circuit board of an analogue mobile phone SIM card, the structural representation of PCB circuit board is referring to accompanying drawing 2, comprise the SIM card circuit 5 identical with SIM cards of mobile phones and the test splicing ear 6 that is connected with SIM card circuit 5, the test splicing ear is provided with 6, tests splicing ear 6 and is connected for testing with multifunctional tester.
The concrete steps of mobile phone deck method of testing of the present invention are as follows:
A. at first design the PCB circuit board of an analogue mobile phone SIM card, the structural representation of PCB circuit board is referring to accompanying drawing 2, comprise the SIM card circuit 5 identical with SIM cards of mobile phones and the test splicing ear 6 that is connected with SIM card circuit 5, test splicing ear 6 and be connected for testing with multifunctional tester;
B. the PCB circuit board is inserted mobile phone deck to be measured, the SIM card circuit is electrically connected with the mobile phone deck;
C. will test splicing ear 6 and be connected to the PFC multifunctional tester, and by the PFC multifunctional tester mobile phone deck be carried out functional test, functional test comprises continuity test, Insulation test, short circuit current and fault current etc.
In the present embodiment, the multifunctional tester 6016 that the PFC multifunctional tester can adopt Japan to stand is altogether tested, and it has following test function:
Continuity test: but this function use test key lock function selects buzzing to carry out the moment prompting, and the conduction of mobile phone deck and SIM card circuit is tested;
Insulation test: the insulating properties to mobile phone deck and SIM card circuit is tested, and has 3 test voltage 250V/500V/1000V, the loop safety after discharging function can be guaranteed to test automatically;
The loop resistance test: the ATT technology is taken off in knock-on can carry out pinpoint accuracy loop-around test and quick the test to avoid the RCD escape;
PSC/PFC test: calculate automatically and show short circuit current (PSC) and expect fault current (PFC).
The present invention is by the PCB circuit board of design simulation SIM cards of mobile phones, this PCB circuit board has the SIM card circuit identical with SIM cards of mobile phones, carrying out circuit with analogue mobile phone SIM card and mobile phone deck to be measured is connected, this PCB circuit board also has the test splicing ear that is connected with the SIM card circuit simultaneously, is connected for testing with multifunctional tester; By method of testing of the present invention, deck need not be fixed on the tool fixture and test, test process is more simple, and the location that has overcome present method of testing existence simultaneously is inaccurate, and the shortcoming that efficient is slower can also stick into the row test to bilayer card or TF easily.
The above only is preferred embodiment of the present invention, and is in order to limit the present invention, within the spirit and principles in the present invention not all, any modification of doing, is equal to replacement, improvement etc., all should be included within protection scope of the present invention.

Claims (4)

1. the testing apparatus of a mobile phone deck, it is characterized in that: the PCB circuit board that comprises an analogue mobile phone SIM card, described PCB circuit board has the SIM card circuit identical with described SIM cards of mobile phones, and has a test splicing ear that is connected with described SIM card circuit, described SIM card circuit is electrically connected with the mobile phone deck, and described test splicing ear is connected to the PFC multifunctional tester in order to described mobile phone deck is carried out functional test.
2. the testing apparatus of mobile phone deck according to claim 1, it is characterized in that: described test splicing ear is provided with 6.
3. the method for testing of a mobile phone deck may further comprise the steps:
A. design the PCB circuit board of an analogue mobile phone SIM card, described PCB circuit board has the SIM card circuit identical with described SIM cards of mobile phones, and has the test splicing ear that is connected with described SIM card circuit;
B. described PCB circuit board is inserted mobile phone deck to be measured, described SIM card circuit is electrically connected with the mobile phone deck;
C. described test splicing ear is connected to the PFC multifunctional tester, by the PFC multifunctional tester described mobile phone deck is carried out functional test.
4. the method for testing of mobile phone deck according to claim 3, it is characterized in that: the described functional test among the step C comprises continuity test, Insulation test, short circuit current and fault current.
CN2013102612192A 2013-06-27 2013-06-27 Testing device and method of mobile phone SIM socket Pending CN103347113A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN2013102612192A CN103347113A (en) 2013-06-27 2013-06-27 Testing device and method of mobile phone SIM socket

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN2013102612192A CN103347113A (en) 2013-06-27 2013-06-27 Testing device and method of mobile phone SIM socket

Publications (1)

Publication Number Publication Date
CN103347113A true CN103347113A (en) 2013-10-09

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Family Applications (1)

Application Number Title Priority Date Filing Date
CN2013102612192A Pending CN103347113A (en) 2013-06-27 2013-06-27 Testing device and method of mobile phone SIM socket

Country Status (1)

Country Link
CN (1) CN103347113A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105277746A (en) * 2015-11-26 2016-01-27 福建联迪商用设备有限公司 Flexible FPC test card and working method
CN106707136A (en) * 2016-12-19 2017-05-24 维沃移动通信有限公司 SIM (Subscriber Identity Module) card simulation testing piece and electric performance testing method of SIM card seat
CN107231462A (en) * 2017-05-26 2017-10-03 北京小米移动软件有限公司 The test device of terminal
CN108226802A (en) * 2018-01-12 2018-06-29 深圳市欧盛自动化有限公司 Battery performance test method and device

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN2777869Y (en) * 2005-03-16 2006-05-03 许先政 Tester for holder circuit of cell phone
CN1845626A (en) * 2005-04-07 2006-10-11 明基电通股份有限公司 Automatic test system and its method
EP1832093B1 (en) * 2004-12-28 2011-10-19 Keynote Systems, Inc. Testing apparatus used in a testing system for checking transmission processes in a mobile radio communication network

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1832093B1 (en) * 2004-12-28 2011-10-19 Keynote Systems, Inc. Testing apparatus used in a testing system for checking transmission processes in a mobile radio communication network
CN2777869Y (en) * 2005-03-16 2006-05-03 许先政 Tester for holder circuit of cell phone
CN1845626A (en) * 2005-04-07 2006-10-11 明基电通股份有限公司 Automatic test system and its method

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105277746A (en) * 2015-11-26 2016-01-27 福建联迪商用设备有限公司 Flexible FPC test card and working method
CN106707136A (en) * 2016-12-19 2017-05-24 维沃移动通信有限公司 SIM (Subscriber Identity Module) card simulation testing piece and electric performance testing method of SIM card seat
CN107231462A (en) * 2017-05-26 2017-10-03 北京小米移动软件有限公司 The test device of terminal
CN108226802A (en) * 2018-01-12 2018-06-29 深圳市欧盛自动化有限公司 Battery performance test method and device
CN108226802B (en) * 2018-01-12 2020-07-14 深圳市欧盛自动化有限公司 Battery performance testing method and device

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Application publication date: 20131009