CN103344854A - Automatic test system and method for logical function device - Google Patents
Automatic test system and method for logical function device Download PDFInfo
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- CN103344854A CN103344854A CN2013102536610A CN201310253661A CN103344854A CN 103344854 A CN103344854 A CN 103344854A CN 2013102536610 A CN2013102536610 A CN 2013102536610A CN 201310253661 A CN201310253661 A CN 201310253661A CN 103344854 A CN103344854 A CN 103344854A
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Abstract
The invention relates to an automatic test system and method for a logical function device, and belongs to the technical field of power electronics. The automatic test method for the logical function device comprises the steps of simulating and outputting various logical input signals of a tested device, comparing the output signals which are computed logically through the tested logical function device with theoretical logical output signals which correspond to testing signals in a processor, judging whether the output signals and the theoretical logical output signals are output consistently or not, and recording inconsistent signals. Therefore, a tester can track and locate error points, and the purpose of quick and efficient test is achieved.
Description
Technical field
The present invention relates to a kind of Auto-Test System and method of logic function means, belong to electric and electronic technical field.
Background technology
In electric power, electron trade, according to user's demand or the needs of engineering design, the input-output unit with Different Logic type has obtained widespread use, as: " two get one " device, " three get two " device etc.; Before these devices dispatch from the factory as finished product, after perhaps the user buys and finishes wiring is installed, need test its logic function, because this types of devices is according to different inputs, after its internal logic was handled, the result of output also had multiple; In the face of complicated array mode, manually Ce Shi time and cycle often very long, omit and slip up and also be difficult to avoid.
Summary of the invention
The Auto-Test System and the method that the purpose of this invention is to provide a kind of logic function means cause the long and inaccurate problem of test result of test duration to solve to adopt to test manually when the current logic functional device is tested.
The present invention is for solving the problems of the technologies described above the Auto-Test System that a kind of logic function means is provided, this test macro comprises processor and indicator, be provided with arithmetic logic unit and comparing unit in the described processor, store in the arithmetic logic unit and tested logic function means internal logic identity logic algorithm, the all kinds test signal that processor can produce for the tested logic function means input of simulation is input to tested logic function means, an input end of comparing unit is used for linking to each other with the output terminal of tested logic function means, another input end is used for the output signal after the treated device logical operation of input, and the output terminal of comparing unit links to each other with the input end of indicator.
Be provided with the storage unit of all kinds test signal of depositing the input of the tested logic function means of simulation and corresponding logic output signal thereof in the described processor, the test signal of storing in this storage unit is used for being input to the input end of tested logic function means, and the logic output signal of the test signal correspondence of storing in the storage unit is used for being input to an input end of comparing unit.
The described all kinds test signal that can produce for the tested logic function means input of simulation is signal generator, an output terminal of signal generator links to each other with the input end of arithmetic logic unit, another output terminal is used for linking to each other with the input end of tested logic function means, and the output terminal of arithmetic logic unit links to each other with the input end of comparing unit.
Described processor is that the mode by bus or switching value or bus/switch amount and usefulness links to each other with input, the output interface of tested logic function means.
Described signal generator can pass through switch, the button external signal triggers, and perhaps software is put several the triggering in the processor of Li Yonging.
Described indicator is for being man-machine interface display or signal lamp.
The present invention is for solving the problems of the technologies described above the automatic test approach that a kind of logic function means also is provided, and this automatic test approach may further comprise the steps:
1) internal logic in the tested logic function means is stored in the processor;
2) produce all kinds test signal to simulate tested logic function means input, and the input end that above-mentioned various types of test signals are input to tested logic function means is successively carried out logical operation;
3) will compare through the corresponding theoretical logic output signal in processor of output signal test signal corresponding with it after the tested logic function means logical operation, judge whether both are consistent;
4) inconsistent signal will occur and note, until finishing all types signal testing;
5) according to the corresponding input signal of inconsistent signal of record, find the guilty culprit of tested logic function means.
Test signal in the described step 3) corresponding theoretical logic output signal in processor is to store in the processor before test, before test, processor is at first simulated all kinds test signal of tested logic function means input, and with the calculate every kind test signal corresponding theoretical logic output valve of above-mentioned test signal by arithmetic logic unit in the processor, then above-mentioned test signal and corresponding theoretical logic output valve thereof are stored in the storage unit of processor in the lump, test signal and the corresponding theoretical logic output valve thereof of directly calling storage during test get final product.
Theoretical logic output signal in the described step 3) is in when test various types of test signals to be input to successively to carry out logical operation in the processor and obtain, during test, test signal sends in the logical operation module of the input end of tested logic function means and processor simultaneously, then the output signal of tested logic function means and the logical operation module output signal of processor is compared to judge.
The information of described step 4) record can show by man-machine interface display or signal lamp.
The invention has the beneficial effects as follows: the present invention is by the various logic input signal of simulation and output device being tested, receive the output result of device being tested simultaneously, the result and the processor logic result calculated that receive are compared in real time, whether the output of judging both is consistent, record inconsistent signal, make the tester carry out track and localization to erroneous point, to reach test purpose fast and efficiently.
Description of drawings
Fig. 1 is the structured flowchart of the Auto-Test System of logic function means of the present invention;
Fig. 2 is the process flow diagram of the automatic test approach of logic function means of the present invention.
Embodiment
Below in conjunction with accompanying drawing the specific embodiment of the present invention is further described.
The embodiment one of the Auto-Test System of a kind of logic function means of the present invention
As shown in Figure 1, the Auto-Test System of the logic function means in the present embodiment comprises processor and indicator, be provided with signal generator in the processing, arithmetic logic unit and comparing unit, the output terminal of signal generator links to each other with the input end of arithmetic logic unit, the output terminal of arithmetic logic unit links to each other with the input end of comparing unit, the output terminal of comparing unit links to each other with indicator, another input end of described comparing unit is used for linking to each other with the output terminal of tested logic function means, the output terminal of described signal generator also is used for linking to each other with the input end of tested logic function means, stores in the arithmetic logic unit and tested logic function means internal logic identity logic algorithm.Adopt testing apparatus and the device being tested (devices of logical types such as " two get ", " three get two ") of programmable processor to carry out interface, testing apparatus can realize and being connected of device being tested by dissimilar interface integrated circuit board, as: can pass through bus or the mode of switching value or bus/switch amount and usefulness and input, the output interface of device being tested; Signal generator can pass through external signals such as switch, button to be triggered, and perhaps software is put several the triggering in the processor of test macro; Signal meter (SM) can be man-machine interface display or signal lamp.After the internal logic computing of confirming device being tested, just can begin to carry out functional test.
Concrete test process is as follows: ready back proving installation begins test, and trigger signal generator sends first type test signal, arithmetic logic unit in the processor calculates its theoretical output valve based on the logic theory of tested device, and proving installation compares output valve and the above-mentioned theory value of receiving tested device; If comparative result unanimity, proving installation are sent the test signal of next type, if comparative result is inconsistent, carry out record automatically, send the test signal of next type then; After finishing all types of tests, end of test (EOT).In this process, the tester can check test result according to HMI man-machine interface or signal lamp real-time follow-up.
The embodiment two of the Auto-Test System of a kind of logic function means of the present invention
The Auto-Test System of logic function means also comprises processor and indicator in the present embodiment, wherein be provided with arithmetic logic unit and comparing unit in the processor, store in the arithmetic logic unit and tested logic function means internal logic identity logic algorithm, the all kinds test signal that processor can produce for the tested logic function means input of simulation is input to tested logic function means, an input end of comparing unit is used for linking to each other with the output terminal of tested logic function means, another input end is used for the output signal after the treated device logical operation of input, and the output terminal of comparing unit links to each other with the input end of indicator.Be provided with the storage unit of all kinds test signal of depositing the input of the tested logic function means of simulation and corresponding logic output signal thereof in the processor, the test signal of storing in this storage unit is used for being input to the input end of tested logic function means, and the logic output signal of the test signal correspondence of storing in the storage unit is used for being input to an input end of comparing unit.Before test, processor is at first simulated all kinds test signal of tested logic function means input, and with the calculate every kind test signal corresponding theoretical logic output valve of above-mentioned test signal by arithmetic logic unit in the processor, then above-mentioned test signal and corresponding theoretical logic output valve thereof are stored in the storage unit of processor in the lump, during test, various types of test signals of storing in the storage unit are input to successively the input end of tested logic function means, to be input to an input end of comparing unit through the logical signal of the output of tested logic function means again, simultaneously, another input end of comparing unit calls the corresponding theoretical logic output valve of the corresponding test signal of storing in the storage unit, comparing unit compares above-mentioned two input values, judge whether both are consistent, if it is consistent, then the test signal of next type is judged, otherwise record error signal, finish until all types of test signal tests, in this process, the tester can check test result according to HMI man-machine interface or signal lamp real-time follow-up.The tester can find the guilty culprit of logic function means according to the result who records.
The embodiment one of the automatic test approach of a kind of logic function means of the present invention
Among the present invention the method for testing flow process as shown in Figure 2, detailed process is as follows:
At first design an arithmetic logic unit, include the logical algorithm identical with internal logic in the tested logic function means in this arithmetic logic unit.Produce by signal generator then and can simulate tested logic function means input types of signals, and the types of signals of above-mentioned generation all is input to successively the input end of arithmetic logic unit and tested logic function means respectively.To compare through the signal of exporting after arithmetic logic unit and the tested logic function means logical operation respectively, whether the signal of judging both is consistent, and inconsistent signal will occur and note, until finishing all types signal testing, after the end of test (EOT), the tester can find the guilty culprit of tested logic function means according to the corresponding input signal of inconsistent signal of record.Signal generator can pass through external signals such as switch, button to be triggered, and perhaps puts number by software and triggers, and institute's recorded information can show by man-machine interface display or signal lamp.
The embodiment two of the automatic test approach of a kind of logic function means of the present invention
The difference of method of testing in this enforcement and a last embodiment is, before testing, processor is at first simulated all kinds test signal of tested logic function means input, and with the calculate every kind test signal corresponding theoretical logic output valve of above-mentioned test signal by logical operation module in the processor, then above-mentioned test signal and corresponding theoretical logic output valve thereof are stored in the lump processor in, during test, various types of test signals of storing in the storage unit are input to successively the input end of tested logic function means, to compare through the corresponding theoretical logic output valve of corresponding test signal of storing in the logical signal of the output of tested logic function means and the processor again, judge whether both are consistent, if it is consistent, then the test signal of next type is judged, otherwise record error signal, finish until all types of test signal tests, in this process, the tester result of record can be shown to the HMI man-machine interface or the signal lamp real-time follow-up is checked test result, and the tester just can find the guilty culprit of logic function means according to the result who records.
Claims (10)
1. the Auto-Test System of a logic function means, it is characterized in that, this test macro comprises processor and indicator, be provided with arithmetic logic unit and comparing unit in the described processor, store in the arithmetic logic unit and tested logic function means internal logic identity logic algorithm, the all kinds test signal that processor can produce for the tested logic function means input of simulation is input to tested logic function means, an input end of comparing unit is used for linking to each other with the output terminal of tested logic function means, another input end is used for the output signal after the treated device logical operation of input, and the output terminal of comparing unit links to each other with the input end of indicator.
2. the Auto-Test System of logic function means according to claim 1, it is characterized in that, be provided with the storage unit of all kinds test signal of depositing the input of the tested logic function means of simulation and corresponding logic output signal thereof in the described processor, the test signal of storing in this storage unit is used for being input to the input end of tested logic function means, and the logic output signal of the test signal correspondence of storing in the storage unit is used for being input to an input end of comparing unit.
3. the Auto-Test System of logic function means according to claim 1, it is characterized in that, the described all kinds test signal that can produce for the tested logic function means input of simulation is signal generator, an output terminal of signal generator links to each other with the input end of arithmetic logic unit, another output terminal is used for linking to each other with the input end of tested logic function means, and the output terminal of arithmetic logic unit links to each other with the input end of comparing unit.
4. according to the Auto-Test System of claim 2 or 3 described logic function means, it is characterized in that described processor is that the mode by bus or switching value or bus/switch amount and usefulness links to each other with input, the output interface of tested logic function means.
5. the Auto-Test System of logic function means according to claim 3 is characterized in that, described signal generator can pass through switch, the button external signal triggers, and perhaps software is put several the triggering in the processor of Li Yonging.
6. according to the Auto-Test System of claim 2 or 3 described logic function means, it is characterized in that described indicator is for being man-machine interface display or signal lamp.
7. the automatic test approach of a logic function means is characterized in that, this automatic test approach may further comprise the steps:
1) internal logic in the tested logic function means is stored in the processor;
2) produce all kinds test signal to simulate tested logic function means input, and the input end that above-mentioned various types of test signals are input to tested logic function means is successively carried out logical operation;
3) will compare through the corresponding theoretical logic output signal in processor of output signal test signal corresponding with it after the tested logic function means logical operation, judge whether both are consistent;
4) inconsistent signal will occur and note, until finishing all types signal testing;
5) according to the corresponding input signal of inconsistent signal of record, find the guilty culprit of tested logic function means.
8. the automatic test approach of logic function means according to claim 7, it is characterized in that, test signal in the described step 3) corresponding theoretical logic output signal in processor is to store in the processor before test, before test, processor is at first simulated all kinds test signal of tested logic function means input, and with the calculate every kind test signal corresponding theoretical logic output valve of above-mentioned test signal by arithmetic logic unit in the processor, then above-mentioned test signal and corresponding theoretical logic output valve thereof are stored in the storage unit of processor in the lump, test signal and the corresponding theoretical logic output valve thereof of directly calling storage during test get final product.
9. the automatic test approach of logic function means according to claim 7, it is characterized in that, theoretical logic output signal in the described step 3) is in when test various types of test signals to be input to successively to carry out logical operation in the processor and obtain, during test, test signal sends in the logical operation module of the input end of tested logic function means and processor simultaneously, then the output signal of tested logic function means and the logical operation module output signal of processor is compared to judge.
10. according to Claim 8 or the automatic test approach of 9 described logic function means, it is characterized in that the information of described step 4) record can show by man-machine interface display or signal lamp.
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| CN105404286A (en) * | 2015-12-17 | 2016-03-16 | 镇江市高等专科学校 | Multifunctional simulation test apparatus for pavement construction machinery product control system, and method |
| CN105988051A (en) * | 2015-07-28 | 2016-10-05 | 北京长城华冠汽车科技股份有限公司 | Unit test apparatus and unit test apparatus method for subsystems |
| CN107015555A (en) * | 2017-04-25 | 2017-08-04 | 歌尔股份有限公司 | A kind of interactive signal test device |
| CN107102221A (en) * | 2017-03-16 | 2017-08-29 | 江苏方天电力技术有限公司 | A kind of quick test platform of protective relaying device logic function |
| CN109188035A (en) * | 2018-11-07 | 2019-01-11 | 华自科技股份有限公司 | Input signal generation method, switching value test macro, storage medium and equipment |
| CN111025183A (en) * | 2019-11-27 | 2020-04-17 | 深圳供电局有限公司 | Transformer substation signal alarm calibration method and device |
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| CN111025183A (en) * | 2019-11-27 | 2020-04-17 | 深圳供电局有限公司 | Transformer substation signal alarm calibration method and device |
| CN111025183B (en) * | 2019-11-27 | 2021-11-02 | 深圳供电局有限公司 | Transformer substation signal alarm calibration method and device |
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Application publication date: 20131009 |