CN103324560A - Testing method and device of flash memory - Google Patents
Testing method and device of flash memory Download PDFInfo
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- CN103324560A CN103324560A CN2013102718695A CN201310271869A CN103324560A CN 103324560 A CN103324560 A CN 103324560A CN 2013102718695 A CN2013102718695 A CN 2013102718695A CN 201310271869 A CN201310271869 A CN 201310271869A CN 103324560 A CN103324560 A CN 103324560A
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Abstract
The invention is adaptable to the technical field of flash memory testing, and provides a testing method and device of a flash memory applied in terminal equipment based on the Android operating system. The method includes that the terminal equipment receives information starting a flash memory testing program; the terminal equipment receives unbuffered signs, set by users, of testing functions in a non-JAVA function library; the terminal equipment tests the flash memory by calling the testing functions with the arranged unbuffered signs in the non-JAVA function library through an JAVA local calling interface. By the aid of the testing method, the problem that a flash memory cannot be tested on Android platform by the prior art can be solved effectively, the terminal equipment for testing the flash memory can be transferred from a PC (personal computer) of the windows operating system to Android terminal equipment of a mobile phone with the Android operating system, a tablet personal computer and the like.
Description
Technical field
The invention belongs to the flash memories technical field of measurement and test, relate in particular to flash memories method of testing and device under a kind of Android platform.
Background technology
Flash memory (Flash) as the storage medium of various types of memory (such as USB flash disk, SD card etc.) be employed more and more extensive.Yet Flash has certain serviceable life, needs instrument to test its performance, and more testing tool is arranged under windows operating system, such as BurninTest etc.But these instruments are applicable windows platform only, and under the Android platform, existing testing tool can't be tested the storer (being flash memories) that comprises Flash.
Summary of the invention
The embodiment of the invention is to provide a kind of flash memories method of testing, the problem that can't test flash memories to solve under the Android platform existing testing tool.
The embodiment of the invention is achieved in that a kind of flash memories method of testing, is applied to the terminal device based on Android operating system, and described method comprises:
Described terminal device receives the information that starts the flash memories test procedure;
Described terminal device receive the user to the trial function in the non-JAVA function library arrange without buffer mark;
Described terminal device calls by the local calling interface of JAVA and is provided with described trial function without buffer mark in the non-JAVA function library flash memories is tested.
Another purpose of the embodiment of the invention is to provide a kind of flash memories proving installation, is applied to the terminal device based on Android operating system, and described device comprises:
Information receiving unit is used for receiving the information that starts the flash memories test procedure;
The sign setting unit, be used for to receive the user to the trial function of non-JAVA function library arrange without buffer mark;
Test cell is used for calling the described trial function without buffer mark that has that identifies the setting unit setting described in the non-JAVA function library by the local calling interface of JAVA flash memories is tested.
The beneficial effect that the embodiment of the invention compared with prior art exists is: the embodiment of the invention can be called the trial function that has or not buffer mark that arranges in the non-JAVA function library by the local calling interface of JAVA based on the terminal device of Android operating system flash memories is tested, solve the problem that prior art can't be tested flash memories under the Android platform, make the Android terminal devices such as mobile phone, panel computer that to transfer to Android operating system to the terminal device of flash memories test from the PC of windows operating system.
Description of drawings
In order to be illustrated more clearly in the technical scheme in the embodiment of the invention, the below will do to introduce simply to the accompanying drawing of required use in embodiment or the description of the Prior Art, apparently, accompanying drawing in the following describes only is some embodiments of the present invention, for those of ordinary skills, under the prerequisite of not paying creative work, can also obtain according to these accompanying drawings other accompanying drawing.
Fig. 1 is the realization flow figure of the flash memories method of testing that provides of the embodiment of the invention one;
Fig. 2 is the composition structural drawing of the flash memories proving installation that provides of the embodiment of the invention two;
Fig. 3 is the composition structural drawing of the terminal device that provides of the embodiment of the invention three.
Embodiment
In order to make purpose of the present invention, technical scheme and advantage clearer, below in conjunction with drawings and Examples, the present invention is further elaborated.Should be appreciated that specific embodiment described herein only in order to explain the present invention, is not intended to limit the present invention.
For technical solutions according to the invention are described, describe below by specific embodiment.
Embodiment one:
Fig. 1 shows the realization flow of the flash memories method of testing that the embodiment of the invention one provides, and the method is applied to the terminal device based on Android operating system, and details are as follows for the method process:
In step S101, described terminal device receives the information that starts the flash memories test procedure.
In actual applications, can set in advance a flash memories test procedure start button or the enabled instruction of flash memories test procedure (such as the instruction etc. of on touch-screen, sliding clockwise or counterclockwise), the described flash memories test procedure enabled instruction that is receiving the user and click described button or send, behind the trigger message of the startup flash memories test procedure that perhaps produces according to the default time interval, start the flash memories test procedure, namely be used for the program of test flash memory storer.
In step S102, described terminal device receive the user to the trial function in the non-JAVA function library arrange without buffer mark.
Need to prove, under the Android platform, comprise JAVA function library and non-JAVA function library in the function library that Linux carries, all include trial function in described JAVA function library and the non-JAVA function library, when the trial function in the JAVA function library can't carry out without buffering test (namely with non-cushioned read-write mode flash memories being tested) to flash memories, need to test (because under the Android platform by arranging in the non-JAVA function library without the trial function of buffer mark, what programming was used all is the JAVA interface, its file read-write interface all is the mode that cushions, when the data that both write are read again, directly from buffer memory, to read, from physical storage device, do not read, thereby inaccurate (data that namely read may be the data that just write, rather than required data) that may cause reading out data.Therefore the present embodiment is tested flash memories with nothing buffering read-write mode by the trial function that calls in the non-JAVA function library, namely directly carries out readwrite tests from physical storage device).
Wherein, the trial function without buffer mark of setting mainly is the function of testing for flash memories reading and writing operation.Described reading and writing operational testing function can be used for test reading, writing rate, the life-span that can also mate to come the test flash memory storer by the data that will read and the data that write, for example when data that read when matching degree surpasses a certain threshold value with the data that write, think that then this flash memories is bad.
In step S103, described terminal device calls by the local calling interface of JAVA and is provided with described trial function without buffer mark in the non-JAVA function library flash memories is tested.
Concrete is that described terminal device judges that the trial function that can described flash memories test procedure directly call in the JAVA function library carries out without buffering test flash memories;
If can, the described trial function that then directly calls in the JAVA function library is tested flash memories;
If not, call by the local calling interface of JAVA (JNI) and be provided with described trial function without buffer mark in the non-JAVA function library flash memories is tested.
In the present embodiment, can in described flash memories test procedure, a zone bit be set, determine that by the state of judging described zone bit can the trial function that directly call in the JAVA function library carry out without buffering test flash memories, for example when the state of described zone bit is TRUE, determine that the trial function that can directly call in the JAVA function library carries out without buffering test flash memories, when the state of described zone bit is FALSE, determine that the trial function that can't directly call in the JAVA function library carries out without buffering test flash memories.
Further, the described terminal device of the present embodiment also comprises after starting the flash memories test procedure:
Receive the testing requirement that the user arranges, wherein said testing requirement comprises the life-span, reading and writing speed of test flash memory storer etc.
Further, described terminal device calls by the local calling interface of JAVA and is provided with described trial function without buffer mark in the non-JAVA function library and flash memories is tested is comprised:
Described terminal device calls by the local calling interface of JAVA and is provided with described trial function without buffer mark in the non-JAVA function library and by described testing requirement flash memories is tested.
Need to prove, JAVA calls this locality (Java Native Interface, JNI) and is the part of JAVA platform, and the code that it allows JAVA code and other language to write carries out alternately.JNI is applicable to call other language, as long as this language convention that calls is supported, such as C, C++.
Can realize based on the test to flash memories of the terminal device of Android operating system by the embodiment of the invention, especially described terminal device is with without the test of buffering read-write mode to flash memories.
Embodiment two:
Fig. 2 shows the composition structure of the flash memories proving installation that the embodiment of the invention two provides, and for convenience of explanation, only shows the part relevant with the embodiment of the invention.
This flash memories proving installation can be applied to the terminal device based on Android operating system, can be to run on the unit that software unit, hardware cell or software and hardware in the described terminal device combine, also can be used as independently, suspension member be integrated in the described terminal device or runs in the application system of described terminal device.
This flash memories proving installation comprises information receiving unit 21, sign setting unit 22 and test cell 23, wherein:
Sign setting unit 22, be used for to receive the user to the trial function of non-JAVA function library arrange without buffer mark;
Wherein, the information of described startup flash memories test procedure comprises:
The instruction of the startup flash memories test procedure that the user sends, the trigger message of the startup flash memories test procedure that perhaps produces according to the default time interval.
Further, described test cell 23 comprises:
Judge module 231 is used for judging that the trial function that can described flash memories test procedure directly call the JAVA function library carries out without buffering test flash memories;
The first test module 232 is used in described judge module 231 judged results when being, the described trial function that directly calls in the JAVA function library is tested flash memories;
The second test module 233 is used at described judge module 231 when the determination result is NO, calls by the local calling interface of JAVA to be provided with described trial function without buffer mark in the non-JAVA function library flash memories is tested.
Further, described device also comprises after starting the flash memories test procedure:
Testing requirement receiving element 24 is used for receiving the testing requirement that the user arranges.
Further, described test cell 23 specifically is used for:
Call by the local calling interface of JAVA and to be provided with described trial function without buffer mark in the non-JAVA function library and by described testing requirement flash memories to be tested.
The those skilled in the art can be well understood to, be the convenience described and succinct, only the division with above-mentioned each functional unit, module is illustrated, in the practical application, can as required the above-mentioned functions distribution be finished by different functional units or module, the inner structure that is about to device is divided into different functional units or module, to finish all or part of function described above.Each functional unit among the embodiment, module can be integrated in the processing unit, also can be that the independent physics of unit exists, also can be integrated in the unit two or more unit, above-mentioned integrated unit both can adopt the form of hardware to realize, also can adopt the form of SFU software functional unit to realize.In addition, the concrete title of each functional unit, module also just for the ease of mutual differentiation, is not limited to the application's protection domain.The specific works process of unit, module in the said apparatus can with reference to the corresponding process among the preceding method embodiment, not repeat them here.
Embodiment three:
Fig. 3 shows a kind of structured flowchart of terminal device, this terminal device 1200 and flash memories 1100(such as the USB flash disk that includes flash memory 110 and controller 111, SD card etc.) be connected, the test to the flash memories 1100 that includes flash memory 110 and controller 111 that can be used for implement that above-described embodiment provides, described flash memory 110 is connected with controller 111.
As shown in Figure 3, terminal device 1200 can comprise RF(Radio Frequency, radio frequency) circuit 110, the storer 120 that includes one or more (only illustrating one among the figure) computer-readable recording mediums, input block 130, display unit 140, sensor 150, voicefrequency circuit 160, transport module 170, include the parts such as the processor 180 that (only illustrates one among the figure) more than one or one and process core and power supply 190.It will be understood by those skilled in the art that the terminal device structure shown in Fig. 3 does not consist of the restriction to terminal device, can comprise the parts more more or less than diagram, perhaps make up some parts, perhaps different arrangements of components.Wherein:
Storer 104 can be used for storing software program and module, programmed instruction/the module corresponding such as flash memories method of testing among the above-mentioned embodiment/device, processor 102 is stored in software program and module in the storer 104 by operation, various functions are used and data are processed thereby carry out, and namely realize the test to flash memories.
Terminal 1200 also can comprise at least a sensor 150, such as optical sensor, motion sensor and other sensors.
Although not shown, terminal device 1200 can also comprise camera, bluetooth module etc., does not repeat them here.Specifically in the present embodiment, the display unit of terminal device is touch-screen display, terminal device also includes storer, and one or more than one program, one of them or an above procedure stores and are configured to be carried out by the above processor of or and state one or an above program and comprise be used to the instruction of carrying out following operation in storer:
Receive the information that starts the flash memories test procedure;
Receive the user to the trial function in the non-JAVA function library arrange without buffer mark;
Call by the local calling interface of JAVA and to be provided with described trial function without buffer mark in the non-JAVA function library flash memories is tested.
Suppose the above-mentioned possible embodiment of the first that is, then in the possible embodiment of the second that the possible embodiment of the first provides as the basis, the information of described startup flash memories test procedure comprises:
The instruction of the startup flash memories test procedure that the user sends, the trigger message of the startup flash memories test procedure that perhaps produces according to the default time interval.
Suppose the above-mentioned possible embodiment of the first that is, then in the third possible embodiment that the possible embodiment of the first provides as the basis, described calling by the local calling interface of JAVA is provided with described trial function without buffer mark and flash memories is tested specifically comprised in the non-JAVA function library:
Judge that the trial function that can described flash memories test procedure directly call in the JAVA function library carries out without buffering test flash memories;
If can, the described trial function that then directly calls in the JAVA function library is tested flash memories;
If not, call by the local calling interface of JAVA and be provided with described trial function without buffer mark in the non-JAVA function library flash memories is tested.
Suppose the above-mentioned possible embodiment of the first that is, then in the 4th kind of possible embodiment that the possible embodiment of the first provides as the basis, in the storer of described terminal device, also comprise for the instruction of carrying out following operation:
Receive the testing requirement that the user arranges.
Supposing above-mentioned is the 4th kind of possible embodiment, then in the 5th kind of possible embodiment that the 4th kind of possible embodiment provides as the basis, in the storer of described terminal device, also comprises for the instruction of carrying out following operation:
Call by the local calling interface of JAVA and to be provided with described trial function without buffer mark in the non-JAVA function library and by described testing requirement flash memories to be tested.
In sum, the embodiment of the invention can be called the trial function that has or not buffer mark that arranges in the non-JAVA function library by the local calling interface of JAVA based on the terminal device of Android operating system flash memories is tested, solve the problem that prior art can't be tested flash memories under the Android platform, make the terminal device that flash memories is tested to transfer to the Android terminal devices such as the mobile phone of Android operating system, panel computer from the PC of windows operating system, have stronger practicality.
Those of ordinary skills it is also understood that, realize that all or part of step in above-described embodiment method is to come the relevant hardware of instruction to finish by program, described program can be in being stored in a computer read/write memory medium, described storage medium comprises ROM/RAM, disk, CD etc.
Above content is in conjunction with concrete preferred implementation further description made for the present invention, can not assert that implementation of the present invention is confined to these explanations.For the general technical staff of the technical field of the invention; make without departing from the inventive concept of the premise some alternative or obvious modification that are equal to; and performance or purposes are identical, all should be considered as belonging to the scope of patent protection that the present invention is determined by claims of submitting to.
Claims (10)
1. a flash memories method of testing is characterized in that, is applied to the terminal device based on Android operating system, and described method comprises:
Described terminal device receives the information that starts the flash memories test procedure;
Described terminal device receive the user to the trial function in the non-JAVA function library arrange without buffer mark;
Described terminal device calls by the local calling interface of JAVA and is provided with described trial function without buffer mark in the non-JAVA function library flash memories is tested.
2. the method for claim 1 is characterized in that, the information of described startup flash memories test procedure comprises:
The instruction of the startup flash memories test procedure that the user sends, the trigger message of the startup flash memories test procedure that perhaps produces according to the default time interval.
3. the method for claim 1 is characterized in that, described terminal device calls by the local calling interface of JAVA and is provided with described trial function without buffer mark in the non-JAVA function library and flash memories is tested specifically comprised:
Described terminal device judges that the trial function that can described flash memories test procedure directly call in the JAVA function library carries out without buffering test flash memories;
If can, then the described trial function that directly calls in the JAVA function library of described terminal device is tested flash memories;
If not, described terminal device calls by the local calling interface of JAVA and is provided with described trial function without buffer mark in the non-JAVA function library flash memories is tested.
4. the method for claim 1 is characterized in that, described terminal device also comprises after starting the flash memories test procedure:
Receive the testing requirement that the user arranges.
5. method as claimed in claim 4 is characterized in that, described terminal device calls by the local calling interface of JAVA and is provided with described trial function without buffer mark in the non-JAVA function library and flash memories is tested comprised:
Described terminal device calls by the local calling interface of JAVA and is provided with described trial function without buffer mark in the non-JAVA function library and by described testing requirement flash memories is tested.
6. a flash memories proving installation is characterized in that, is applied to the terminal device based on Android operating system, and described device comprises:
Information receiving unit is used for receiving the information that starts the flash memories test procedure;
The sign setting unit, be used for to receive the user to the trial function of non-JAVA function library arrange without buffer mark;
Test cell is used for calling the described trial function without buffer mark that has that identifies the setting unit setting described in the non-JAVA function library by the local calling interface of JAVA flash memories is tested.
7. device as claimed in claim 6 is characterized in that, the information of described startup flash memories test procedure comprises:
The instruction of the startup flash memories test procedure that the user sends, the trigger message of the startup flash memories test procedure that perhaps produces according to the default time interval.
8. device as claimed in claim 6 is characterized in that, described test cell comprises:
Judge module is used for judging that the trial function that can described flash memories test procedure directly call the JAVA function library carries out without buffering test flash memories;
The first test module is used in described judge module judged result when being, the described trial function that directly calls in the JAVA function library is tested flash memories;
The second test module is used at described judge module when the determination result is NO, calls by the local calling interface of JAVA to be provided with described trial function without buffer mark in the non-JAVA function library flash memories is tested.
9. device as claimed in claim 6 is characterized in that, described device also comprises after starting the flash memories test procedure:
The testing requirement receiving element is used for receiving the testing requirement that the user arranges.
10. device as claimed in claim 9 is characterized in that, described test cell specifically is used for:
Call by the local calling interface of JAVA and to be provided with described trial function without buffer mark in the non-JAVA function library and by described testing requirement flash memories to be tested.
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CN105004957A (en) * | 2015-07-31 | 2015-10-28 | 福州瑞芯微电子股份有限公司 | SD card test method and test device |
CN106683709A (en) * | 2016-12-28 | 2017-05-17 | 西北工业大学 | Method for evaluating NOR and NAND flash memory performance |
CN106991043A (en) * | 2017-03-21 | 2017-07-28 | 惠州Tcl移动通信有限公司 | Outside SD card program writing test processing method and system based on mobile terminal |
CN108564985A (en) * | 2018-03-16 | 2018-09-21 | 广州视源电子科技股份有限公司 | EMMC test methods, device, mobile terminal and storage medium |
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Publication number | Priority date | Publication date | Assignee | Title |
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CN105004957A (en) * | 2015-07-31 | 2015-10-28 | 福州瑞芯微电子股份有限公司 | SD card test method and test device |
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CN106991043A (en) * | 2017-03-21 | 2017-07-28 | 惠州Tcl移动通信有限公司 | Outside SD card program writing test processing method and system based on mobile terminal |
CN106991043B (en) * | 2017-03-21 | 2021-04-20 | 惠州Tcl移动通信有限公司 | External SD card writing program test processing method and system based on mobile terminal |
CN108564985A (en) * | 2018-03-16 | 2018-09-21 | 广州视源电子科技股份有限公司 | EMMC test methods, device, mobile terminal and storage medium |
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