Detailed description of the invention
It is the capacitance detecting device 200 as shown in Fig. 2 (A) according to one embodiment of the invention, wherein comprises two electric capacity
C1~C2, five switch SW1~SW5, operational amplifier 22, input node 24 and judge modules 26.Testing capacitance Cx is through defeated
Ingress 24 is connected to capacitance detecting device 200.If capacitance detecting device 200 and testing capacitance Cx are positioned at different encapsulation chip
In, input node 24 can be a weld pad, but is not limited.In practice, capacitance detecting device 200 can be individually present, also can quilt
It is integrated in other systems having detection capacitance demand.
The state of switch SW1~SW5 can be determined by a control module (not shown).In the first stage of detection process, open
Close SW1, SW3, SW4 and be first set to path, and switch SW2, SW5 and be set to open circuit;Circuit in Fig. 2 (A) is equal to
Circuit (ignoring judge module 26 temporarily) shown in Fig. 2 (B).Under setting at this, the outfan (Vout) of operational amplifier 22 and just
The voltage of negative input end all can be equal to reference voltage VL.Electric capacity C2 is discharged to not have electric charge, and electric capacity C1 is charged to be had
Electric charge C1*VL, testing capacitance Cx are then to be charged to there is electric charge Cx*VL.
Subsequently, in the second stage of detection process, switch SW1, SW3, SW4 are switched to open circuit, and switch SW2, SW5 are cut
It is changed to path;Circuit in Fig. 2 (A) is equal to the circuit (ignoring judge module 26 temporarily) shown in Fig. 2 (C).Under setting at this, fortune
The voltage of the positive-negative input end calculating amplifier 22 is all the control nodes X of reference voltage VH, electric capacity C1 side by reconfiguration to controlling
Voltage VS.
Between above-mentioned two benches switch switching the cross-pressure of each electric capacity can be caused to change, in turn result in electric charge electric capacity C1, C2,
Redistribute between Cx.Charge balance relation corresponding to input node 24 may be expressed as:
(VS+VL-VH) * C1+ (Vout-VH) * C2=(VH-VL) * Cx.(3)
Reference voltage VH in this embodiment is higher than VL, and control voltage VS is designed to higher than (VH-VL).Accordingly, by
Formula (3) can be seen that, flows into testing capacitance Cx and by self-capacitance C1 flow direction input joint at second stage electric current from input node 24
Point 24, in other words, flowing into the positive charge of testing capacitance Cx at least part of from input node 24 is to be flowed to defeated by self-capacitance C1
The positive charge of ingress 24 is contributed.As for self-capacitance C2 impact part in one's power, if Vout is more than VH, electric current is from self-capacitance
C2 flows to input node 24, and i.e. flow to input node 24 by self-capacitance C2 is positive charge;If Vout is less than VH, electric current is from input
Node 24 flows to self-capacitance C2, and i.e. flow to input node 24 by self-capacitance C2 is negative charge.It is different from electricity to be measured in Fig. 1 (C)
The electric charge of appearance Cx changes completely by feedbacking the electric capacity Cfb situation of contribution, and in the present embodiment, the electric charge change of testing capacitance Cx is
By electric capacity C1, C2 joint contribution.
Formula (3) can be further rewritten as:
Owing to the numerical value of voltage VL, VH, VS and electric capacity C1, C2 is all it is known that according to output voltage Vout or electric capacity
Cross-pressure change (being become Vout-VH from zero) at C2 two ends, it is judged that module 26 can extrapolate the size of testing capacitance Cx.If will treat
Survey electric capacity Cx and disassemble the total of background capacitance Cbg for i.e. existing before not affected by user and capacitance change Csig further
With, formula (4) can be rewritten as:
Be can be seen that by formula (5), owing to reference voltage VH is higher than VL, and control voltage VS is designed to higher than (VH-VL), electricity
The electric charge holding C1 contribution can offset the electric charge of background capacitance Cbg contribution, makes voltage Vout be less susceptible to reach saturation.Therefore,
Even if selecting less electric capacity C2 to improve the resolution of capacitance change Csig, voltage Vout also will not be made to be easy for because of mistake
High and saturated.In other words, as long as selecting the electric capacity C1 that size is suitable, capacitance detecting device 200 can provide good measurement solution
Analysis degree, and there is not the problem that output voltage is the most saturated.
From the viewpoint of charge distributing, the feature of capacitance detecting device 200 flows to input node for utilizing self-capacitance C1
The electric charge of 24, as flowing into the electric charge of background capacitance Cbg from input node 24, reaches electric charge payment effect, makes voltage Vout less
Easily reach saturation.In the case of reference voltage VH is higher than VL, it is designed as control voltage VS can making certainly higher than (VH-VL)
It is positive charge (be equal to electric current and flow to input node 24 from self-capacitance C1), certainly input that electric capacity C1 flows to the electric charge of input node 24
It is also positive charge (be equal to electric current and flow into background capacitance Cbg from input node 24) that node 24 flows into the electric charge of background capacitance Cbg.
In the case of reference voltage VH is less than VL, it is designed as control voltage VS self-capacitance C1 to be made to flow to input less than (VH-VL)
The electric charge of node 24 is negative charge (be equal to electric current and flow to self-capacitance C1 from input node 24), flows into background from input node 24
The electric charge of electric capacity Cbg is also negative charge (is equal to electric current and flows into input node 24 from background capacitance Cbg), can reach aforementioned equally
Electric charge payment effect.In sum, as long as changing by the cross-pressure of appropriately designed such electric capacity so that self-capacitance C1 flows to input
The electric charge of node 24 is positive and negative identical with the electric charge flowing into testing capacitance Cx from input node 24, can overcome in prior art and be difficult to
Take into account measurement resolution and avoid the problem that output voltage is saturated.
According to another embodiment of the present invention for the capacitance detecting device as shown in Fig. 3 (A).In this embodiment, electric capacity
C1 is arranged on outside the chip 500 at operational amplifier 22 place.It is true that no matter electric capacity C1 whether with operational amplifier 22 etc.
Element is comprised in same chip, can reach foregoing advantages.It should be noted that the electric capacity C1 profit in this embodiment
Realize by the parasitic capacitance of connecting line 400.In case of capacitive touch device, testing capacitance Cx be typically formed in
On one induction panel (block 600 illustrated in such as figure), and through the line line on flexible circuit board or printed circuit board (PCB)
400 are connected with chip 500.
In this embodiment, the circuit board at connecting line 400 place has a shielding (shielding) layer, is present in connection
The parasitic capacitance of line 400 and this shielding interlayer is i.e. as electric capacity C1.The circuit board at connecting line 400 place has one and adjustable connects
Ground terminal potential Vact, as shown in Fig. 3 (A), switch SW4, SW5 that this earth terminal is connected in chip 500 through weld pad 28.By
Control the keying of switch SW4, SW5, can reach according to the control module (not shown) in the capacitance detecting device of the present invention and change
The effect of the cross-pressure of C1 is held in power transformation.In other words, the change of the cross-pressure on electric capacity C1 can be by the earth terminal electricity controlling this screen layer
Position Vact realizes.Should be noted that, as long as suitably planning the characteristics such as the shape of connecting line 400, length, thickness, parasitic capacitance (electricity
Hold C1) size be and can accurately estimate, control.In other words, this connecting line 400 and this screen layer are controlled through design, i.e.
Earth terminal current potential Vact and parasitic capacitance (electric capacity C1) can be adjusted flexibly, to realize controlling the effect of the cross-pressure change on electric capacity C1
Really.In another embodiment, through active shield (active shielding) or subtract the means such as consumption (subtraction), also
Equivalence can find out the electric capacity C1 that can change by the earth terminal current potential Vact controlling this screen layer.This way is advantageous in that can
Save and the space occupied by electric capacity C1 is set in chip 500, the most effectively utilize and be originally considered verbose or negative factor
Parasitic capacitance.
As shown in Fig. 3 (B), in another embodiment, electric capacity C1 also can be disassembled and be two parts: be arranged at chip 500
Outer electric capacity C1A and the electric capacity C1B being arranged in chip 500.Electric capacity C1B is designed to main in order to compensate because of process variation
The electric capacity C1A Size Error caused, therefore need not the biggest.For example, the grade of electric capacity C1B can be in 1~2 micromicrofarads
(pF), but be not limited.
As shown in Fig. 3 (C), in another embodiment, electric capacity C1A and electric capacity C1B can be designed as each by different
Control voltage influence.In this example, when switch SW5 is path, and electric capacity C1B can be connected to provide the voltage controlling voltage VS
Source, but the change in voltage of electric capacity C1A is controlled the control of module 29.Similarly, defeated as long as making self-capacitance C1A, C1B flow to
The electric charge of ingress 24 is positive and negative identical with the electric charge flowing into testing capacitance Cx from input node 24, and it is difficult to overcome in prior art
To take into account measurement resolution and to avoid the problem that output voltage is saturated.
Aforementioned several embodiment is all in case of the voltage of input node 24 can change.It practice, input node
The voltage of 24 is also designed to immobilize, such as the embodiment shown in Fig. 4 (A).Refer to Fig. 4 (A), switch SW1~SW5
State can be determined by a control module (not shown), and the two ends of testing capacitance Cx are respectively through input node 44 with drive joint
Point 48 connects so far capacitance detecting device.
In the first stage of detection process, switch SW1, SW2, SW4 are first set to path, and switch SW3, SW5 quilt
It is set as open circuit;Circuit in Fig. 4 (A) is equal to Fig. 4 (B) those shown (ignoring judge module 46 temporarily).In that case, fortune
The voltage of the outfan (Vout) and positive-negative input end of calculating amplifier 22 all can be equal to reference voltage Vref.Electric capacity C2 is discharged to
Not having electric charge, electric capacity C1 is charged to there is electric charge C1* (VL-Vref), and testing capacitance Cx is then to be charged to there is electric charge
Cx*(VH-Vref)。
Subsequently, in the second stage of detection process, switch SW1, SW2, SW4 are first set to open circuit, and switch SW3,
SW5 is set to path;Circuit in Fig. 4 (A) is equal to Fig. 4 (C) those shown (ignoring judge module 46 temporarily).In this situation
Under, the voltage of the positive-negative input end of operational amplifier 22 is still maintained at equal to reference voltage Vref, the control joint of electric capacity C1 side
Point is by reconfiguration to providing the power supply unit controlling voltage VH, and driving node 48 is then to be relayed to provide the electricity controlling voltage VL
Source supply.
Between above-mentioned two benches switch switching the cross-pressure of each electric capacity can be caused to change, in turn result in electric charge electric capacity C1, C2,
Redistribute between Cx.Charge balance relation corresponding to input node 44 may be expressed as:
(VH-VL) * C1+ (Vout-Vref) * C2=(VH-VL) * Cx.(6)
Reference voltage VH in this embodiment is higher than VL.Accordingly, formula (6) can be seen that, at second stage electric current from input
Node 44 flows into testing capacitance Cx and is flowed to input node 44 by self-capacitance C1, in other words, flows into be measured from input node 44
The positive charge of electric capacity Cx is at least part of is to be flowed to the positive charge of input node 44 by self-capacitance C1 contributed.As for self-capacitance
C2 impact part in one's power, if Vout is more than Vref, electric current is to flow to input node 44 from self-capacitance C2, is i.e. flowed by self-capacitance C2
To input node 44 is positive charge;If Vout is less than Vref, electric current flows to self-capacitance C2 from input node 44, i.e. by self-capacitance
What C2 flowed to input node 44 is negative charge.It is by electric capacity C1, C2 joint contribution that the electric charge of testing capacitance Cx changes.
Formula (6) can be further rewritten as:
Owing to the numerical value of voltage VL, VH, Vref and electric capacity C1, C2 is all it is known that according to output voltage Vout or electricity
Hold cross-pressure change (being become Vout-Vref from zero) at C2 two ends, it is judged that module 46 can extrapolate the size of testing capacitance Cx.If
Testing capacitance Cx is disassembled further background capacitance Cbg for i.e. existing before not affected by user and capacitance change Csig
Summation, formula (7) can be rewritten as again:
Be can be seen that by formula (8), the electric charge of electric capacity C1 contribution can offset the electric charge of background capacitance Cbg contribution, makes voltage Vout
It is less susceptible to reach saturation.Therefore, even if selecting less electric capacity C2 to improve the resolution of capacitance change Csig, the most not
Voltage Vout can be made to be easy for because of too high and saturated.In other words, as long as selecting the electric capacity C1 that size is suitable, this capacitance detecting fills
Put the measurement resolution that can provide good, and there is not the problem that output voltage is the most saturated.
Capacitance detecting device shown in Fig. 4 (A) may be used to coordinate such as mutual capacitance type touch-control system.More particularly, input
Node 44 can be connected to the induction electrode in mutual capacitance type touch-control system, and driving node 48 can be connected to mutual capacitance type touch-control system
In drive electrode, and testing capacitance Cx is exactly the mutual tolerance (mutual between this induction electrode and this drive electrode
capacitance);Switching is supplied to the voltage of driving node 48 and is supply driving signal.Additionally, with aforementioned several embodiments
Identical, the electric capacity C1 in Fig. 4 (A) also can comprise or be entirely the parasitic capacitance between screen layer and connecting line.
In sum, the concept used according to the capacitance detecting device of the present invention is: provide electric capacity C1 mono-first cross-pressure
Change, and provide testing capacitance Cx mono-second cross-pressure to change, thereby make electric capacity C2 one the 3rd cross-pressure change occur, further according to electric capacity
The capacitance of C1, C2 and the change of such cross-pressure judge the capacitance of testing capacitance Cx.As long as by the first cross-pressure change with second
Cross-pressure change is designed such as self-capacitance C1 and flows to the electric charge of input node and the electric charge flowing into testing capacitance Cx from input node
Positive and negative identical, so that it may to overcome and prior art is difficult to take into account measurement resolution and avoid the problem that output voltage is saturated.
It is a capacitance touch control system according to another embodiment of the present invention, wherein comprises a display, multiple faradism
Hold and one or more such as Fig. 2 (A), Fig. 3 (A), Fig. 3 (B), Fig. 3 (C) or the capacitance detecting device shown in Fig. 4 (A).The plurality of
Inductance capacitance respectively correspond tos the provider location on this display, and its size variation can be filled by these one or more capacitance detecting
The detection put.Function mode about capacitance detecting device refers to the related description of previous embodiment, repeats no more.
As it has been described above, embodiments above of the present invention proposes a kind of new capacitance detecting device and applies this capacitance detecting
The capacitance touch control system of device.Testing capacitance is suitably supplied at electric charge weight by the outer newly-increased electric capacity at back coupling electric capacity
The quantity of electric charge needed in new assigning process, can overcome prior art according to the capacitance detecting device of embodiments above of the present invention
In be difficult to take into account measurement resolution and avoid the problem that output voltage is saturated.In addition to matching with capacitive touch-control system, according to
The capacitance detecting device of embodiments above of the present invention also can be widely used in other various occasions needing to measure capacitance.
Detailed description by embodiments above, it would be desirable to more clearly describe inventive feature and spirit, and not
With above-mentioned disclosed preferred embodiment, scope of the invention is any limitation as.On the contrary, its objective is to wish to contain
Cover in the category being arranged in the scope of the claims that the present invention to be applied for of various change and tool equality.