CN103257465A - Detecting device and method - Google Patents
Detecting device and method Download PDFInfo
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- CN103257465A CN103257465A CN2013101338773A CN201310133877A CN103257465A CN 103257465 A CN103257465 A CN 103257465A CN 2013101338773 A CN2013101338773 A CN 2013101338773A CN 201310133877 A CN201310133877 A CN 201310133877A CN 103257465 A CN103257465 A CN 103257465A
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
- G09G3/34—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source
- G09G3/36—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source using liquid crystals
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
- G06T7/001—Industrial image inspection using an image reference approach
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10024—Color image
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
- G06T2207/30121—CRT, LCD or plasma display
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G2330/00—Aspects of power supply; Aspects of display protection and defect management
- G09G2330/10—Dealing with defective pixels
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G2360/00—Aspects of the architecture of display systems
- G09G2360/14—Detecting light within display terminals, e.g. using a single or a plurality of photosensors
- G09G2360/145—Detecting light within display terminals, e.g. using a single or a plurality of photosensors the light originating from the display screen
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- Quality & Reliability (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
- Liquid Crystal (AREA)
Abstract
The invention relates to the technical field of detection, and discloses detecting device and method. The detecting device comprises an image acquiring module and an image processing module, wherein the image acquiring module acquires image information of a liquid crystal display panel to be detected, and the image processing module is in signal connection with the image acquiring module. The image processing module compares received image information with a defect database and judges defect level of the liquid crystal display panel to be detected. During use of the detecting device, the image acquiring module can acquire image information of any position of the liquid crystal display panel to be detected, the image processing module compares received the image information acquired by the image acquiring module with the defect database and judges the defect level of the liquid crystal display panel to be detected. Accordingly, by the detecting device, defect identification rate and detection efficiency of the liquid crystal display panel are improved.
Description
Technical field
The present invention relates to the detection technique field, particularly a kind of pick-up unit and detection method, this pick-up unit is applicable to the detection of liquid crystal panel.
Background technology
Along with constantly providing of lcd technology, people require also more and more higher to quality and the display effect of liquid crystal display product.
In the production run of LCD, need carry out defects detection to producing the liquid crystal panel of finishing, improve the acceptance rate of liquid crystal panel.Under the prior art, need that artificial visual is thick to the box of liquid crystal panel, the alignment situation of liquid crystal panel, whether exist foreign matter etc. to detect in the liquid crystal panel.
But this detection method under the prior art is lower to the defect recognition rate of liquid crystal panel, occur flase drop easily, and detection efficiency is lower.
Summary of the invention
The invention provides a kind of pick-up unit and detection method, improved defect recognition rate and the detection efficiency of liquid crystal panel.
For achieving the above object, the invention provides following technical scheme:
A kind of pick-up unit comprises:
Gather the image capture module of liquid crystal panel image information to be measured;
With the image processing module that described image capture module signal is connected, described image processing module compares image information and the defect database that receives, and judges the defect rank of liquid crystal panel to be measured.
In some optional embodiments, above-mentioned detection device also comprises:
Housing, described housing surrounds sensing chamber;
Be installed in the described sensing chamber, support the board of liquid crystal panel to be measured;
The support that is positioned at described sensing chamber, can slides relatively with described board, and described support is parallel to the supporting surface of described board, and described image capture module is slidingly mounted on described support.
In some optional embodiments, described image capture module comprises: first pick-up tube that is used for gathering the bad image information that is caused by foreign matter class and/or bubble, be used for gathering second pick-up tube of foreign matter position image information, the 3rd pick-up tube that is used for the thick color difference image information that causes of box of collection liquid crystal panel to be measured, the 4th pick-up tube that is used for the alignment films damage image information of collection liquid crystal panel to be measured, and the 5th pick-up tube that is used for the contraposition situation image information of two substrates in the collection liquid crystal panel to be measured, wherein, described first pick-up tube, described second pick-up tube, described the 3rd pick-up tube, acquisition angles between the supporting surface of described the 4th pick-up tube and the 5th pick-up tube and described board is adjustable.
In some optional embodiments, described first pick-up tube is that infra-red vidicon, described second pick-up tube, described the 3rd pick-up tube, described the 4th pick-up tube and described the 5th pick-up tube are all the charge coupled cell camera lens.
In some optional embodiments, described image processing module comprises: receive the image information that described image capture module collects and the infrared image sensor that described image information is converted to electric signal;
The image recognition device that is connected with described infrared image sensor signal, described electric signal is analyzed and contrasted;
Be connected, judge the computing module of liquid crystal panel defect rank to be measured with described image recognition device signal.
In some optional embodiments, described board has installation shaft respectively on the relative two sides, and the axis of each described installation shaft is parallel with described support, and described board is installed on described housing by each described installation shaft is rotatable.
In some optional embodiments, the both sides that described housing is relative are respectively equipped with first chute and second chute, and described first chute and described second chute are parallel to each other, and described support one end is slidingly matched with described first chute, the other end cooperates with described second chute is interactive.
In some optional embodiments, the supporting surface of described board is provided with the contraposition probe of fixing described liquid crystal panel to be measured.
In some optional embodiments, described pick-up unit also comprises lighting mechanism, and described lighting mechanism is arranged in the described board liquid crystal panel to be detected is thrown light on.
In some optional embodiments, be provided with optical sensor in the described sensing chamber, described optical sensor be used for to be gathered the signal that produces when staff or other objects enter described sensing chamber.
The present invention also provides a kind of detection method to comprise:
Be written into liquid crystal panel to be measured;
Image capture module is gathered the image information of liquid crystal panel to be measured;
Image processing module compares image information and the defect database that receives, and judges the defect rank of liquid crystal panel to be measured.
In some optional embodiments, described image capture module comprises: first pick-up tube, second pick-up tube, the 3rd pick-up tube, the 4th pick-up tube and the 5th pick-up tube, and described step: the image information that image capture module is gathered liquid crystal panel to be measured specifically comprises:
With first pick-up tube liquid crystal panel to be measured is gathered by the bad image information that foreign matter class and/or bubble cause;
With second pick-up tube foreign matter position image information of liquid crystal panel to be measured is gathered;
With the 3rd pick-up tube the thick color difference image information that causes of box of liquid crystal panel to be measured is gathered;
With the 4th pick-up tube the alignment films damage image information of liquid crystal panel to be measured is gathered;
With the 5th pick-up tube the contraposition situation image information of surveying two substrates in the liquid crystal panel is gathered.
In some optional embodiments, described step: image processing module compares image information and the defect database that receives, and judges that the defect rank of liquid crystal panel to be measured specifically comprises:
The image information that collects according to first pick-up tube is judged the size of the bubble that is caused by the fluid sealant poor sealing, if the diameter of bubble is greater than 8mm, then bubble is air pocket; If the diameter of bubble is less than 8mm, then bubble is minute bubbles;
Regulate second pick-up tube and acquisition angles liquid crystal panel to be measured, if the image of described foreign matter is motionless, then foreign matter is positioned at liquid crystal panel to be measured; If the image of described foreign matter moves, then foreign matter is positioned at outside the liquid crystal panel to be measured; If black matrix shelters from the image of described foreign matter, then foreign matter is positioned at the outside of color membrane substrates; If the image of foreign bubble covers black matrix, then foreign matter is positioned at the outside of array base palte;
Whether image information and defect database contrast according to the 3rd pick-up tube collects exist aberration by observing liquid crystal panel to be measured, judge whether the box of liquid crystal panel to be measured is thick normal;
According to image information and the defect database contrast that the 4th pick-up tube collects, judge whether the alignment films of liquid crystal panel to be measured is damaged;
According to image information and the defect database contrast that the 5th pick-up tube collects, if there is skew in two substrate contrapositions in the liquid crystal panel to be measured, calculate side-play amount by computing module.
Pick-up unit provided by the invention comprises:
Gather the image capture module of liquid crystal panel image information to be measured;
With the image processing module that described image capture module signal is connected, described image processing module compares image information and the defect database that receives, and judges the defect rank of liquid crystal panel to be measured.
Whether qualified the machine vision defects detection is based on comparison and the coupling in defective storehouse to be differentiated defective and whether exceeds requirement, and defects detection need be built the defective storehouse of detected article, and replace human eye to make differentiation by quick comparison is in kind with the defective storehouse.Defects detection needs big as far as possible optics visual field, be that the standard of limiting resolution is (because the limiting resolution of human eye is 0.1mm can tell that minimum defective requires, therefore, defect inspection generally only needs to choose the defective greater than 0.1mm, or even several millimeters defect characteristic).The Machine Vision Detection system can carry out outward appearance detection, dimensional measurement, measurement of angle, character recognition etc. to product based on high resolution industrial camera and vision software.
Inventive point of the present invention is based on the defect detecting system of machine vision technique, and non-contact detecting is measured, and has higher accuracy, wideer spectral response range, and steady operation is saved a large amount of human resources for a long time, has greatly improved work efficiency.Can detect the spot of surface of the work, pit, cut, aberration, defective such as damaged.
Machine vision surface defects detection system has been widely used in industries such as plastic sheeting, metal, flat pannel display, printing, glass, papermaking now, accurately all kinds of defectives and the flaw of the existence of evaluating objects object.The online testing product of vision that is used for industrial flow-line quality inspection field, can be in 100% scope, to various high speeds, quantity-produced product, carry out real-time, accurate surface quality testing, for improving the production automation and guaranteeing that quality control provides effective solution.
Pick-up unit provided by the invention, in use, image capture module can collect the image information of the arbitrary position of liquid crystal panel to be measured, image processing module compares image information and the defect database that the image capture module that receives collects, and then judges the defect rank of liquid crystal panel to be measured.
Pick-up unit provided by the invention, avoided mentioning in the background technology manually liquid crystal panel is detected the time, the defect recognition rate is lower, occurs flase drop easily, and problem such as detection efficiency is lower.
So pick-up unit provided by the invention has improved defect recognition rate and the detection efficiency of liquid crystal panel.
A kind of detection method that the present invention also provides comprises:
Be written into liquid crystal panel to be measured;
Image capture module is gathered the image information of liquid crystal panel to be measured;
Image processing module compares image information and the defect database that receives, and judges the defect rank of liquid crystal panel to be measured.
Above-mentioned detection method has also improved defect recognition rate and the detection efficiency of liquid crystal panel.
Description of drawings
Fig. 1 is pick-up unit principle schematic provided by the invention;
Fig. 2 is pick-up unit structural representation provided by the invention;
Fig. 3 is the image capture module structure diagram in the pick-up unit provided by the invention;
Fig. 4 is the image processing module principle schematic in the pick-up unit provided by the invention;
Fig. 5 is detection method process flow diagram provided by the invention;
Fig. 6 is that the foreign matter location drawing in the defect database provided by the invention is as synoptic diagram;
Fig. 7 A is first kind of alignment films damage image synoptic diagram in the defect database provided by the invention;
Fig. 7 B is second kind of alignment films damage image synoptic diagram in the defect database provided by the invention;
Fig. 7 C is the third alignment films damage image synoptic diagram in the defect database provided by the invention.
Reference numeral:
1-liquid crystal panel 11-to be measured color membrane substrates 111-deceives matrix 12-array base palte 13-layer of liquid crystal molecule 14A-foreign matter 14B-foreign matter 14C-foreign matter 3-housing 31-optical sensor 32-first chute 33-second chute 2-support 21-image capture module 211-first pick-up tube 212-the second pick-up tube 213-the 3rd pick-up tube 214-the 4th pick-up tube 215-the 5th pick-up tube 22-image processing module 221-infrared image sensor 222-image recognition device 223-computing module 4-board 41-installation shaft 42-lighting mechanism 43-contraposition probe
Embodiment
Below in conjunction with the accompanying drawing in the embodiment of the invention, the technical scheme in the embodiment of the invention is clearly and completely described, obviously, described embodiment only is the present invention's part embodiment, rather than whole embodiment.Based on the embodiment among the present invention, those of ordinary skills are not making the every other embodiment that obtains under the creative work prerequisite, all belong to the scope of patent protection of the present invention.
Embodiment one
Pick-up unit principle schematic provided by the invention as shown in Figure 1, pick-up unit comprises:
Gather the image capture module 21 of liquid crystal panel 1 image information to be measured;
With the image processing module 22 that image capture module 21 signals are connected, image processing module 22 compares image information and the defect database that receives, and judges the defect rank of liquid crystal panel 1 to be measured.
Whether qualified the machine vision defects detection is based on comparison and the coupling in defective storehouse to be differentiated defective and whether exceeds requirement, and defects detection need be built the defective storehouse of detected article, and replace human eye to make differentiation by quick comparison is in kind with the defective storehouse.Defects detection needs big as far as possible optics visual field, be that the standard of limiting resolution is (because the limiting resolution of human eye is 0.1mm can tell that minimum defective requires, therefore, defect inspection generally only needs to choose the defective greater than 0.1mm, or even several millimeters defect characteristic).The Machine Vision Detection system can carry out outward appearance detection, dimensional measurement, measurement of angle, character recognition etc. to product based on high resolution industrial camera and vision software.
Inventive point of the present invention is based on the defect detecting system of machine vision technique, and non-contact detecting is measured, and has higher accuracy, wideer spectral response range, and steady operation is saved a large amount of human resources for a long time, has greatly improved work efficiency.Can treat the spot, pit, cut, aberration on detection part surface, defective such as damaged detects.
Machine vision surface defects detection system has been widely used in industries such as plastic sheeting, metal, flat pannel display, printing, glass, papermaking now, accurately all kinds of defectives and the flaw of the existence of evaluating objects object.The online testing product of vision that is used for industrial flow-line quality inspection field, can be in 100% scope, to various high speeds, quantity-produced product, carry out real-time, accurate surface quality testing, for improving the production automation and guaranteeing that quality control provides effective solution.
Pick-up unit provided by the invention, image capture module 21 can collect the image information of liquid crystal panel to be measured 1 arbitrary position, image processing module 22 compares image information and the defect database that the image capture module 21 that receives collects, and then judges the defect rank of liquid crystal panel 1 to be measured.
Pick-up unit provided by the invention, avoided mentioning in the background technology manually liquid crystal panel is detected the time, the defect recognition rate is lower, occurs flase drop easily, and problem such as detection efficiency is lower.
So pick-up unit provided by the invention has improved defect recognition rate and the detection efficiency of liquid crystal panel.
Detect for convenience, the structural representation of above-mentioned detection device also comprises as shown in Figure 2:
Be installed in the sensing chamber, support the board 4 of liquid crystal panel 1 to be measured;
The support 2 that is positioned at sensing chamber, can slides relatively with board 4, and support 2 is parallel to the supporting surface of board 4, and image capture module 21 is slidingly mounted on support 2.
Above-mentioned detection device in use, particularly, liquid crystal panel 1 to be measured is placed on the board 4 of sensing chamber, because support 2 board 4 relatively slides, image capture module 21 can slide along support 2, so image capture module 21 can collect the image information of liquid crystal panel to be measured 1 arbitrary position, image processing module 22 compares image information and the defect database that the image capture module 21 that receives collects, and then judges the defect rank of liquid crystal panel 1 to be measured.
In the preferred embodiment of the present invention, housing 3 is the housing of transparent material, so that operating personnel observe the ruuning situation of sensing chamber.
In some optional embodiments, as shown in Figure 3, image capture module comprises: first pick-up tube 211 that is used for gathering the bad image information that is caused by foreign matter class and/or bubble, be used for gathering second pick-up tube 212 of foreign matter position image information, the 3rd pick-up tube 213 that is used for the thick color difference image information that causes of box of collection liquid crystal panel 1 to be measured, the 4th pick-up tube 214 that is used for the alignment films damage image information of collection liquid crystal panel 1 to be measured, and the 5th pick-up tube 215 that is used for the contraposition situation image information of two substrates in the collection liquid crystal panel 1 to be measured, wherein, first pick-up tube 211, second pick-up tube 212, the 3rd pick-up tube 213, the 4th pick-up tube 214 and the 5th supporting surface pick-up tube 215 and board between acquisition angles adjustable.
Preferably, first pick-up tube 211 is all charge coupled cell camera lens (CCD, charge-coupled device) for infra-red vidicon, second pick-up tube 212, the 3rd pick-up tube 213, the 4th pick-up tube 214 and the 5th pick-up tube 215.CCD is a kind of semiconductor devices, can be converted into digital signal to optical image.
Explanation herein, when in detecting liquid crystal panel to be measured, whether having foreign matter class and/or bubble, the infrared induction signal that first pick-up tube (infra-red vidicon) can send respectively according to foreign matter or bubble, judge whether to exist foreign matter or bubble, the generation of bubble generally is because the envelope frame glue sealing effectiveness of coating is bad around the liquid crystal panel to be measured, makes ambient atmos enter in the liquid crystal panel.The thick aberration that causes of box mainly is because liquid crystal cell in uneven thickness, and in the preorder operation, inhomogeneous place, liquid crystal cell surface is worn out by the contraposition probe, and there is aberration in the color that makes liquid crystal panel show.Alignment films damage refers to when being orientated to liquid crystal panel to be measured with the orientation roller, may be orientated between the hair of the orientation cloth on the roller to have foreign material, and foreign material can scratch alignment films.
As shown in Figure 4, above-mentioned image processing module comprises: the image information that the reception image capture module collects and the infrared image sensor 221 that image information is converted to electric signal;
The image recognition device 222 that is connected with infrared image sensor 221 signals, electric signal is analyzed and contrasted;
Be connected, judge the computing module 223 of liquid crystal panel 1 defect rank to be measured with image recognition device 222 signals.
Above-mentioned computing module is preferably computing machine.
In order to prevent in the pick-up unit operational process operating personnel being damaged, preferably, as shown in Figure 2, be provided with optical sensor 31 in the sensing chamber that housing 3 surrounds, optical sensor 31 is for gathering the signal that produces when staff or other objects enter sensing chamber.In the pick-up unit operational process, if having staff or other article to enter sensing chamber, optical sensor will be gathered these signals, and signal is transferred to the control module of pick-up unit, make pick-up unit promptly out of service.
The defective that produces when liquid crystal panel is subjected to gravity detects, as shown in Figure 1, board 4 has installation shaft 41 respectively on the relative two sides, and the axis of each installation shaft 41 is parallel with support 2, and board 4 is by each installation shaft 41 rotatable housing 3 that are installed on.When detecting the defective that produces when liquid crystal panel is subjected to gravity, board 4 is rotated down 90 degree (or installation shaft 41 and board 4 relative fixed around installation shaft 41, installation shaft 41 is rotated down 90 degree, and then drive board rotation), support 2 also revolves simultaneously and turn 90 degrees, liquid crystal panel 1 to be measured will be subjected to the gravity effect of self this moment, gather the image information of liquid crystal panel 1 to be measured at this moment with image capture module 21, and image information and the defect database that collects compared, judge the defect rank of liquid crystal panel to be measured.
Preferably, as shown in Figure 2, housing 3 relative both sides are respectively equipped with first chute 32 and second chute 33, and first chute 32 and second chute 33 be parallel to each other, and an end of support 2 and first chute 32 are slidingly matched, the other end and second chute 33 are slidingly matched.Can realize that support 2 relative boards 4 slide.
In order better to carry liquid crystal panel to be measured, as shown in Figure 2, the supporting surface of board 4 is provided with the contraposition probe 43 of fixing liquid crystal panel 1 to be measured, and the design of board herein can be adopted the board method for designing that has the contraposition probe in the prior art.
Preferably, as shown in Figure 2, pick-up unit comprises lighting mechanism 42, and lighting mechanism 42 is arranged in the board 4, and liquid crystal face 1 to be detected is thrown light on.Lighting mechanism 42 will cooperate the pick-up tube of image capture module, and dissimilar light are provided.Pick-up tube is the polarization camera, and the light of lighting mechanism 42 emissions is polarized light; Pick-up tube is the CCD camera lens, and it is common backlight that lighting mechanism 42 provides.Further, above-mentioned lighting mechanism 42 can comprise: LED-backlit lamp and be positioned at polaroid on a plurality of backlights.The LED light fixture has strong, luminous strong, low in energy consumption, little, the spectral range of heat radiation of colour rendering and life-span advantages of higher.
Embodiment two
The present invention also provides a kind of detection method, and the process flow diagram of detection method comprises as shown in Figure 5:
Step S501: be written into liquid crystal panel to be measured;
Step S502: image capture module is adopted the image information of collection to be measured liquid crystal panel to be measured;
Step S503: image processing module will receive image information and defect database compares, and judges the defect rank of liquid crystal panel to be measured.
Preferably, image capture module comprises: first pick-up tube, second pick-up tube, the 3rd pick-up tube, the 4th pick-up tube and the 5th pick-up tube, and step S502: the image information that image capture module is gathered liquid crystal panel to be measured specifically comprises:
With the bad image information collection that by foreign matter class and/or bubble caused of first pick-up tube to liquid crystal panel to be measured;
With second pick-up tube foreign matter position image information of liquid crystal panel to be measured is gathered;
With the 3rd pick-up tube the thick color difference image information that causes of box of liquid crystal panel to be measured is gathered;
With the 4th pick-up tube the alignment films damage image information of liquid crystal panel to be measured is gathered;
With the 5th pick-up tube the contraposition situation image information of surveying two substrates in the liquid crystal panel is gathered.
Further, step S503: image processing module will receive image information and defect database compares, and judges that the defect rank of liquid crystal panel to be measured specifically comprises:
The image information that collects according to first pick-up tube is judged the size of the bubble that is caused by the fluid sealant poor sealing, if the diameter of bubble is greater than 8mm, then bubble is air pocket; If the diameter of bubble is less than 8mm, then bubble is minute bubbles;
The foreign matter location drawing in the defect database provided by the invention as shown in Figure 6 is as synoptic diagram, and liquid crystal panel generally comprises color membrane substrates 11, array base palte 12 and the layer of liquid crystal molecule 13 between array base palte 12 and color membrane substrates 11.When liquid crystal panel was detected, general array base palte 12 was last, and image capture module 21 is in array base palte 12 1 sides of liquid crystal panel 1.The acquisition angles of second pick-up tube and liquid crystal panel to be measured in the adjusting image capture module 21, if the image of foreign matter 14 is motionless, then foreign matter 14A is positioned at liquid crystal panel 1 to be measured; If the image of foreign matter 14 moves, then foreign matter 14 is positioned at outside the liquid crystal panel 1 to be measured; If black matrix 111 shelters from the image of foreign matter 14, then foreign matter 14B is positioned at the outside of color membrane substrates 12; If the image of foreign matter 14 covers black matrix 111, then foreign matter 14C is positioned at the outside of array base palte 11.
Whether image information and defect database contrast according to the 3rd pick-up tube collects exist aberration by observing liquid crystal panel to be measured, judge whether the box of liquid crystal panel to be measured is thick normal.
According to image information and the defect database contrast that the 4th pick-up tube collects, judge whether the alignment films of liquid crystal panel to be measured is damaged; Fig. 7 A, Fig. 7 B and Fig. 7 C are respectively a kind of alignment films damage image synoptic diagram in the defect database provided by the invention.
According to image information and the defect database contrast that the 5th pick-up tube collects, if there is skew in two substrate contrapositions in the liquid crystal panel to be measured, calculate side-play amount by computing module.
Obviously, those skilled in the art can carry out various changes and modification to the present invention and not break away from the spirit and scope of the present invention.Like this, if of the present invention these are revised and modification belongs within the scope of claim of the present invention and equivalent technologies thereof, then the present invention also is intended to comprise these changes and modification interior.
Claims (13)
1. a pick-up unit is characterized in that, comprising:
Gather the image capture module of liquid crystal panel image information to be measured;
With the image processing module that described image capture module signal is connected, described image processing module compares image information and the defect database that receives, and judges the defect rank of liquid crystal panel to be measured.
2. pick-up unit according to claim 1 is characterized in that, also comprises:
Housing, described housing surrounds sensing chamber;
Be installed in the described sensing chamber, support the board of liquid crystal panel to be measured;
The support that is positioned at described sensing chamber, can slides relatively with described board, and described support is parallel to the supporting surface of described board, and described image capture module is slidingly mounted on described support.
3. pick-up unit according to claim 2, it is characterized in that, described image capture module comprises: first pick-up tube that is used for gathering the bad image information that is caused by foreign matter class and/or bubble, be used for gathering second pick-up tube of foreign matter position image information, the 3rd pick-up tube that is used for the thick color difference image information that causes of box of collection liquid crystal panel to be measured, the 4th pick-up tube that is used for the alignment films damage image information of collection liquid crystal panel to be measured, and the 5th pick-up tube that is used for the contraposition situation image information of two substrates in the collection liquid crystal panel to be measured, wherein, described first pick-up tube, described second pick-up tube, described the 3rd pick-up tube, acquisition angles between the supporting surface of described the 4th pick-up tube and described the 5th pick-up tube and described board is adjustable.
4. pick-up unit according to claim 3 is characterized in that, described first pick-up tube is that infra-red vidicon, described second pick-up tube, described the 3rd pick-up tube, described the 4th pick-up tube and described the 5th pick-up tube are all the charge coupled cell camera lens.
5. pick-up unit according to claim 2 is characterized in that, described image processing module comprises: receive the image information that described image capture module collects and the infrared image sensor that described image information is converted to electric signal;
The image recognition device that is connected with described infrared image sensor signal, described electric signal is analyzed and contrasted;
Be connected, judge the computing module of liquid crystal panel defect rank to be measured with described image recognition device signal.
6. according to each described pick-up unit of claim 2～5, it is characterized in that, described board has installation shaft respectively on the relative two sides, and the axis of each described installation shaft is parallel with described support, and described board is installed on described housing by each described installation shaft is rotatable.
7. pick-up unit according to claim 6, it is characterized in that, the both sides that described housing is relative are respectively equipped with first chute and second chute, and described first chute and described second chute are parallel to each other, and described support one end is slidingly matched with described first chute, the other end cooperates with described second chute is interactive.
8. pick-up unit according to claim 7 is characterized in that, the supporting surface of described board is provided with the contraposition probe of fixing described liquid crystal panel to be measured.
9. pick-up unit according to claim 8 is characterized in that, described pick-up unit comprises lighting mechanism, and described lighting mechanism is arranged in the described board liquid crystal panel to be detected is thrown light on.
10. pick-up unit according to claim 9 is characterized in that, is provided with optical sensor in the described sensing chamber, and described optical sensor be used for to be gathered the signal that produces when staff or other objects enter described sensing chamber.
11. a detection method is characterized in that, comprising:
Be written into liquid crystal panel to be measured;
Image capture module is gathered the image information of liquid crystal panel to be measured;
Image processing module compares image information and the defect database that receives, and judges the defect rank of liquid crystal panel to be measured.
12. detection method according to claim 11, it is characterized in that, described image capture module comprises: first pick-up tube, second pick-up tube, the 3rd pick-up tube, the 4th pick-up tube and the 5th pick-up tube, and described step: the image information that image capture module is gathered liquid crystal panel to be measured specifically comprises:
With first pick-up tube liquid crystal panel to be measured is gathered by the bad image information that foreign matter class and/or bubble cause;
With second pick-up tube foreign matter position image information of liquid crystal panel to be measured is gathered;
With the 3rd pick-up tube the thick color difference image information that causes of box of liquid crystal panel to be measured is gathered;
With the 4th pick-up tube the alignment films damage image information of liquid crystal panel to be measured is gathered;
With the 5th pick-up tube the contraposition situation image information of two substrates in the liquid crystal panel to be measured is gathered.
13. detection method according to claim 12 is characterized in that, described step: image processing module compares image information and the defect database that receives, and judges that the defect rank of liquid crystal panel to be measured specifically comprises:
The image information that collects according to first pick-up tube is judged the size of the bubble that is caused by the fluid sealant poor sealing, if the diameter of bubble is greater than 8mm, then bubble is air pocket; If the diameter of bubble is less than 8mm, then bubble is minute bubbles;
Regulate second pick-up tube and acquisition angles liquid crystal panel to be measured, if the image of described foreign matter is motionless, then foreign matter is positioned at liquid crystal panel to be measured; If the image of described foreign matter moves, then foreign matter is positioned at outside the liquid crystal panel to be measured; If black matrix shelters from the image of described foreign matter, then foreign matter is positioned at the outside of color membrane substrates; If the image of foreign bubble covers black matrix, then foreign matter is positioned at the outside of array base palte;
Whether image information and defect database contrast according to the 3rd pick-up tube collects exist aberration by observing liquid crystal panel to be measured, judge whether the box of liquid crystal panel to be measured is thick normal;
According to image information and the defect database contrast that the 4th pick-up tube collects, judge whether the alignment films of liquid crystal panel to be measured is damaged;
According to image information and the defect database contrast that the 5th pick-up tube collects, if there is skew in two substrate contrapositions in the liquid crystal panel to be measured, calculate side-play amount by computing module.
Priority Applications (2)
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| CN201310133877.3A CN103257465B (en) | 2013-04-17 | 2013-04-17 | A kind of pick-up unit and detection method |
| PCT/CN2013/077418 WO2014169516A1 (en) | 2013-04-17 | 2013-06-18 | Detection device and detection method |
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| CN201310133877.3A CN103257465B (en) | 2013-04-17 | 2013-04-17 | A kind of pick-up unit and detection method |
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| CN103257465B CN103257465B (en) | 2015-11-11 |
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|---|---|
| CN103257465B (en) | 2015-11-11 |
| WO2014169516A1 (en) | 2014-10-23 |
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