CN103186000A - Liquid crystal display device and test method thereof - Google Patents
Liquid crystal display device and test method thereof Download PDFInfo
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- CN103186000A CN103186000A CN2011104595987A CN201110459598A CN103186000A CN 103186000 A CN103186000 A CN 103186000A CN 2011104595987 A CN2011104595987 A CN 2011104595987A CN 201110459598 A CN201110459598 A CN 201110459598A CN 103186000 A CN103186000 A CN 103186000A
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Abstract
The invention discloses a liquid crystal display device and a test method thereof. According to the liquid crystal device, a first switch tube is arranged between two scanning line output signal golden fingers; a second switch tube is arranged between two data line output signal golden fingers; a scanning line and a data line are connected with a scanning line test signal line and a data line test signal line respectively through a third switch tube and a fourth switch tube; one half of the third switch tube and the fourth switch tube is connected to a first switch tube signal line and the other half of the third switch tube and the fourth switch tube is connected to a second switch tube signal line; and the third (fourth) switch tube controlled by the first switch tube signal line and the second switch tube signal line respectively corresponds to the scanning line (data line) output signal golden fingers connected to the first (second) switch tube. When the liquid crystal display device provided by the invention is tested, the short circuit or open circuit condition in a display area can be detected, and the short circuit or open circuit condition at the connection position of the display area and a driving integrated circuit (IC) also can be detected, so that economic loss can be reduced.
Description
Technical field
The present invention relates to the liquid crystal indicator technical field, relate in particular to a kind of liquid crystal indicator and method of testing thereof.
Background technology
Liquid crystal indicator often need be tested to carry out quality management and control and yield and guarantee in process of production, therefore, generally is provided with the circuit that detects usefulness in the liquid crystal indicator.With reference to figure 1, Fig. 1 is the structural representation of a kind of liquid crystal indicator common in the prior art, there is shown viewing area (AA), in the viewing area crisscross be provided with multi-strip scanning line G1, G2 ..., G (2n-1), G2n and many data line S1, S2 ..., S (2n-1), Sn; Wherein, described multi-strip scanning line G1, G2 ..., G (2n-1), G2n be connected to the sweep trace output signal golden finger of scan line drive circuit (GATE IC) respectively by sweep trace lead-in wire, described many data line S1, S2 ..., S (2n-1), S2n be connected to the data line output signal golden finger of data line drive circuit (SOURCE IC) respectively by data cable lead wire.
For this liquid crystal indicator is tested, need be to each sweep trace input scan line test signal and to each data line input data line test signal, therefore, each sweep trace need be connected corresponding test signal circuit with each data line, the odd line interlace line test signal circuit Gate-Odd (being called for short G_O) that links to each other with the odd line interlace line has been shown among Fig. 1, the even number line sweep trace test signal circuit Gate-Even that links to each other with the even number line sweep trace (being called for short G_E), the odd column data line test signal circuit Data-Odd that links to each other with the odd column data line (being called for short D_O), the even column data line test signal circuit Data-Even that links to each other with the even column data line (being called for short D_E), and be provided with switching tube between each sweep trace and each data line and the corresponding test signal circuit, the conducting simultaneously or end under the control of same switching tube signal line SW1 of described switching tube.
In the early stage liquid crystal indicator, often with each test signal circuit, switching tube and switching tube signal line are arranged on drive IC (comprising scan line drive circuit and data line drive circuit) below, but along with drive IC is more and more littler, and the test load of large-sized monitor is bigger, need to arrange bigger switching tube, therefore, the space of drive IC below is big inadequately, can not hold corresponding test signal circuit, switching tube and switching tube signal line, therefore, described each test signal circuit, switching tube and switching tube signal line have been arranged on the opposite of drive IC, and middle ware is across viewing area AA, as shown in Figure 1.
In conjunction with Fig. 1 and Fig. 2, Fig. 2 is the signal output waveform figure of each test signal circuit and switching tube signal line among Fig. 1, when this liquid crystal indicator is tested, make switching tube signal line SW1 output high level, thereby open each coupled switching tube of (being conducting), therefore, odd line interlace line test signal circuit G_O, even number line sweep trace test signal circuit G_E, the output signal of odd column data line test signal circuit D_O and even column data line test signal circuit D_E will arrive corresponding sweep trace respectively and data line is (certain, also corresponding common electrode signal should be arranged), thus the black-white-gray picture can be shown in the viewing area.If the situation that short circuit is arranged or open circuit in the viewing area then shows and can detect by picture.
But, if short circuit or open circuit conditions occur in the line place between viewing area and the drive IC, if that is: short circuit or open circuit conditions occur in the junction (position shown in the fork among the figure) of each data cable lead wire and data line output signal golden finger, perhaps occur in the junction (position shown in the fork among the figure) of each sweep trace lead-in wire and sweep trace output signal golden finger, then at this moment, because the data line test signal directly outputs to each data line in the viewing area from the opposite of data line drive circuit, the sweep trace test signal directly outputs to each sweep trace in the viewing area from the opposite of scan line drive circuit, therefore, each test signal is not all passed through corresponding driving circuit, so picture still can normally show in the viewing area, that is: detect not come out this kind short circuit or open circuit conditions by the picture in the viewing area this moment.And this situation only remains this liquid crystal indicator and is assembled into just can show behind the module and shows bright line or do not have and show, but has caused heavy losses this moment.
Summary of the invention
In view of this, the embodiment of the invention provides a kind of liquid crystal indicator and method of testing thereof, this liquid crystal indicator when testing, can detect in the viewing area effectively and viewing area and drive IC between short circuit or the open circuit conditions of junction, thereby can reduce the loss.
For addressing the above problem, the embodiment of the invention provides following technical scheme:
A kind of liquid crystal indicator, this liquid crystal indicator comprises:
The viewing area is provided with many crisscross sweep traces and data line in the described viewing area;
Be arranged on scan line drive circuit and/or the data line drive circuit in the outside, viewing area, the sweep trace output signal golden finger of described scan line drive circuit connects each sweep trace respectively by the sweep trace lead-in wire, and is provided with first switching tube between two sweep trace output signal golden fingers; The data line output signal golden finger of described data line drive circuit connects each data line respectively by data cable lead wire, and is provided with the second switch pipe between two data line output signal golden fingers;
The 3rd switching tube signal line that connects first switching tube and/or second switch pipe;
Described scan line drive circuit offside in the outside, viewing area, described sweep trace is connected with sweep trace test signal circuit by the 3rd switching tube; And/or, the described data line drive circuit offside in the outside, viewing area, described data line is connected with data line test signal circuit by the 4th switching tube;
The first switching tube signal line and the second switch pipe signal line that connect a plurality of the 3rd switching tubes; And/or, connect the first switching tube signal line and the second switch pipe signal line of a plurality of the 4th switching tubes;
And the 3rd switching tube that links to each other with the first switching tube signal line all links to each other respectively by two sweep trace output signal golden fingers that corresponding sweep trace, sweep trace lead-in wire are connected with first switching tube with the 3rd switching tube that links to each other with second switch pipe signal line;
The 4th switching tube that links to each other with the first switching tube signal line all links to each other respectively by two data line output signal golden fingers that corresponding data line, data cable lead wire are connected with the second switch pipe with the 4th switching tube that links to each other with second switch pipe signal line.
Preferably, in the above-mentioned liquid crystal indicator, be provided with first switching tube between adjacent two sweep trace output signal golden fingers, and each first switching tube connects different sweep trace output signal golden fingers.
Preferably, in the above-mentioned liquid crystal indicator, be provided with a second switch pipe between adjacent two data line output signal golden fingers, and each second switch pipe connects different data line output signal golden fingers.
Preferably, in the above-mentioned liquid crystal indicator, the 3rd switching tube on the described first switching tube signal line connection odd line interlace line and/or the 4th switching tube on the odd column data line; The 3rd switching tube on the described second switch pipe signal line connection even number line sweep trace and/or the 4th switching tube on the even column data line.
Preferably, in the above-mentioned liquid crystal indicator, described sweep trace test signal circuit comprises odd line interlace line test signal circuit and even number line sweep trace test signal circuit, each odd line interlace line links to each other with described odd line interlace line test signal circuit by the 3rd switching tube, and each even number line sweep trace links to each other with described even number line sweep trace test signal circuit by the 3rd switching tube.
Preferably, in the above-mentioned liquid crystal indicator, described data line test signal circuit comprises odd column data line test signal circuit and even column data line test signal circuit, each odd column data line links to each other with described odd column data line test signal circuit by the 4th switching tube, and each even column data line links to each other with described even column data line test signal circuit by the 4th switching tube.
Preferably, in the above-mentioned liquid crystal indicator, described first switching tube, second switch pipe, the 3rd switching tube, the 4th switching tube are N-type transistor or P transistor npn npn.
The present invention also provides a kind of method of testing of liquid crystal indicator, and this method of testing comprises:
Open each the 3rd switching tube and/or each the 4th switching tube, close each first switching tube and each second switch pipe;
To sweep trace test signal circuit input scan line test signal and/or to data line test signal circuit input data line test signal, the sweep trace in the viewing area and/or data line are tested;
Close the 3rd switching tube and/or the 4th switching tube by the control of the first switching tube signal line, perhaps close the 3rd switching tube and/or the 4th switching tube by the control of second switch pipe signal line, open each first switching tube and each second switch pipe, scan line drive circuit and/or data line drive circuit and junction, viewing area are tested.
Preferably, in the above-mentioned method of testing, described first switching tube connects adjacent two sweep trace output signal golden fingers, and each first switching tube connects different sweep trace output signal golden fingers.
Preferably, in the above-mentioned method of testing, described second switch pipe connects adjacent two data line output signal golden finger, and each second switch pipe connects different data line output signal golden fingers.
Preferably, in the above-mentioned method of testing, the 3rd switching tube on the described first switching tube signal line control odd line interlace line and/or the 4th switching tube on the odd column data line; The 3rd switching tube on the described second switch pipe signal line control even number line sweep trace and/or the 4th switching tube on the even column data line.
Preferably, in the above-mentioned method of testing, described sweep trace test signal circuit comprises odd line interlace line test signal circuit and even number line sweep trace test signal circuit, each odd line interlace line links to each other with described odd line interlace line test signal circuit by the 3rd switching tube, and each even number line sweep trace links to each other with described even number line sweep trace test signal circuit by the 3rd switching tube.
Preferably, in the above-mentioned method of testing, described data line test signal circuit comprises odd column data line test signal circuit and even column data line test signal circuit, each odd column data line links to each other with described odd column data line test signal circuit by the 4th switching tube, and each even column data line links to each other with described even column data line test signal circuit by the 4th switching tube.
From technique scheme as can be seen, the method for testing of the liquid crystal indicator that the embodiment of the invention provides is at first opened each the 3rd switching tube and/or each the 4th switching tube, closes each first switching tube and each second switch pipe; Afterwards to sweep trace test signal circuit input scan line test signal and/or to data line test signal circuit input data line test signal, this moment, described sweep trace test signal can enter in the viewing area and/or the data line test signal can enter in the viewing area by corresponding the 4th switching tube by corresponding the 3rd switching tube, thereby can detect whether have short circuit or open circuit conditions on viewing area interscan line and/or the data line; When the sweep trace in the viewing area and/or data line are detected finish after, close the 3rd switching tube and/or the 4th switching tube by the control of the first switching tube signal line, perhaps close the 3rd switching tube and/or the 4th switching tube by the control of second switch pipe signal line, open each first switching tube and each second switch pipe, at this moment, the sweep trace test signal of half can not be directly enters in the viewing area and/or half data line test signal can not directly enter in the viewing area by corresponding the 4th switching tube by corresponding the 3rd switching tube, but this moment is because each first switching tube and the equal conducting of each second switch pipe, and described first switching tube connects two sweep trace output signal golden fingers, described second switch pipe connects two data line output signal golden fingers, and two sweep trace output signal golden fingers that first switching tube connects are respectively by corresponding sweep trace lead-in wire, sweep trace is connected to the 3rd switching tube that links to each other with the first switching tube signal line and the 3rd switching tube that links to each other with second switch pipe signal line, though one of them has closed the 3rd coupled switching tube the first switching tube signal line and second switch pipe signal line, making on half sweep trace can not the received scanline test signal, but second half reception has the sweep trace of sweep trace test signal the sweep trace test signal that receives can be transferred on it by sweep trace output signal golden finger and first switching tube, thereby making all has the sweep trace test signal on each sweep trace in the viewing area, therefore, if the junction does not have any problem between sweep trace lead-in wire and the sweep trace output signal golden finger, then interscan line in viewing area just can normally show, if and interscan line in viewing area can not normally show or show bright line, then show between sweep trace lead-in wire and the sweep trace output signal golden finger short circuit or open circuit conditions to occur; In like manner, short circuit or the open circuit conditions of junction also can detect between data cable lead wire and the data line output signal golden finger, therefore, adopt method provided by the present invention not only can detect short circuit or the open circuit conditions of viewing area interscan line and/or data line, can also detect short circuit or the open circuit conditions of junction between viewing area and the drive IC, compared to existing technologies, can reduce economic loss.
Description of drawings
In order to be illustrated more clearly in the embodiment of the invention or technical scheme of the prior art, to do to introduce simply to the accompanying drawing of required use in embodiment or the description of the Prior Art below, apparently, accompanying drawing in describing below only is some embodiments of the present invention, for those of ordinary skills, under the prerequisite of not paying creative work, can also obtain other accompanying drawing according to these accompanying drawings.
Fig. 1 is the structural representation of a kind of liquid crystal indicator common in the prior art;
Fig. 2 is the signal output waveform figure of each test signal circuit and switching tube signal line among Fig. 1;
The structural representation of a kind of liquid crystal indicator that Fig. 3 provides for the embodiment of the invention;
Fig. 4 is the signal output waveform figure of each test signal circuit and switching tube signal line among Fig. 3.
Embodiment
Below in conjunction with the accompanying drawing in the embodiment of the invention, the technical scheme in the embodiment of the invention is clearly and completely described, obviously, described embodiment only is the present invention's part embodiment, rather than whole embodiment.Based on the embodiment among the present invention, those of ordinary skills belong to the scope of protection of the invention not making the every other embodiment that obtains under the creative work prerequisite.
A lot of details have been set forth in the following description so that fully understand the present invention, but the present invention can also adopt other to be different from alternate manner described here and implement, those skilled in the art can do similar popularization under the situation of intension of the present invention, so the present invention is not subjected to the restriction of following public specific embodiment.
Embodiment one
With reference to figure 3, the structural representation of a kind of liquid crystal indicator that Fig. 3 provides for the embodiment of the invention, this liquid crystal indicator comprises: the viewing area AA that is positioned at zone line, be provided with many crisscross sweep traces and data line in the AA of this viewing area, and described multi-strip scanning line and data line all extend to the outside of described viewing area; Wherein, sweep trace is horizontal line, be respectively sweep trace G1, G2 ..., G (2n-1), G2n etc., data line is vertical curve, be respectively S1, S2 ..., S (2n-1), S2n etc., wherein n is the positive integer more than or equal to 1; The unit that described sweep trace and data line surround is a pixel, therefore, viewing area AA is the pel array that is made of a plurality of pixels, be provided with a thin film transistor (TFT) in each pixel, the grid of described thin film transistor (TFT) connects the sweep trace of this row, and under the control of the sweep signal that described sweep trace transmits and open, the source electrode of described thin film transistor (TFT) connects the data line of these row, make this pixel reception from the data-signal of described data line, thus display frame in the AA of viewing area.
That give that each sweep trace provides sweep signal is scan line drive circuit GATE IC, described scan line drive circuit is arranged on the outside (being the right side among the figure) of described viewing area, be provided with a plurality of sweep trace output signal golden fingers in the described scan line drive circuit, the many sweep trace lead-in wires that are used for sweep signal is flowed to viewing area interscan line, described a plurality of sweep trace output signal golden finger is corresponding continuous one by one with multi-strip scanning line lead-in wire respectively, and described scan line drive circuit is exported to corresponding scanning line by corresponding sweep trace output signal golden finger and sweep trace lead-in wire with sweep signal.
That give that each data line provides data-signal is data line drive circuit SOURCE IC, data line drive circuit described in the figure is arranged on the below of described viewing area, be provided with a plurality of data line output signal golden fingers in the described data line drive circuit, many the data cable lead wires that are used for data-signal is flowed to data line in the viewing area, described a plurality of data line output signal golden finger is corresponding continuous one by one with many data cable lead wires respectively, and described data line drive circuit is exported to corresponding data line by corresponding data line output signal golden finger and data cable lead wire with data-signal.
In scan line drive circuit, be connected by first switching tube between adjacent two sweep trace output signal golden fingers, the source electrode of described first switching tube is connected with odd line interlace line lead-in wire, and drain electrode is connected with even number line sweep trace lead-in wire, and grid is connected with the 3rd switching tube signal line SW3; Each first switching tube connects different sweep trace output signal golden fingers, there is shown the first switching tube SG1 and SG (2n/2).
In data line drive circuit, be connected by a second switch pipe between the adjacent two data line output signal golden finger, the source electrode of described second switch pipe is connected with the odd column data cable lead wire, and drain electrode is connected with the even column data cable lead wire, and grid is connected with the 3rd switching tube signal line SW3; Each second switch pipe connects different data line output signal golden fingers, there is shown second switch pipe SS1 and SS (2n/2).
Need to prove, the connected mode of above-mentioned switching tube only is a kind of among the embodiment, the source electrode of first and second switching tubes also can be connected with the even column data cable lead wire with even number line sweep trace lead-in wire respectively, and drain electrode is connected with the odd column data cable lead wire with odd line interlace line lead-in wire respectively; The source-drain electrode of described switching tube also can connect non-conterminous two horizontal scanning lines or two column data lines, as long as satisfy when the source electrode of switching tube is connected with the test signal circuit that odd-numbered line or even number line test signal are provided by sweep trace or data line, the drain electrode of this switching tube is connected with in contrast the test signal circuit that even number line or odd-numbered line test signal are provided by another sweep trace or data line.
Described first switching tube and second switch Guan Junke think amorphous silicon N-type transistor or amorphous silicon P transistor npn npn, be that example describes with amorphous silicon N-type transistor all in the present embodiment, be the situation of amorphous silicon P transistor npn npn for it, only corresponding input signal (or high-low level) need be set and get final product on the contrary.
Described each first switching tube and each second switch pipe are connected on the switching tube signal line SW3, in the embodiment of the invention this switching tube signal line is called the 3rd switching tube signal line, certainly, also each first switching tube can be connected on the switching tube signal line, each second switch pipe is connected on another switching tube signal line.
When going up input high level to described the 3rd switching tube signal line SW3, described each first switching tube and each second switch pipe are with equal conducting, thereby adjacent two sweep trace output signal golden fingers conducting that the switching tube of winning is connected, and make the adjacent two data line output signal golden finger conducting that the second switch pipe connects; When going up input low level to described the 3rd switching tube signal line SW3, described each first switching tube and each second switch pipe will all end, not conducting between adjacent two sweep trace output signal golden fingers, and also not conducting between the adjacent two data line output signal golden finger at this moment.
Be provided with odd line interlace line test signal circuit G_O and even number line sweep trace test signal circuit G_E in the viewing area AA outside and a side relative with described scan line drive circuit, described odd line interlace line test signal circuit G_O and even number line sweep trace test signal circuit G_E are vertical circuit.Described odd line interlace line test signal circuit G_O and each odd line interlace line G1 ..., G (2n-1) etc. links to each other, described even number line sweep trace test signal circuit G_E and each even number line sweep trace G2 ..., G2n etc. is continuous; And the location that every horizontal scanning line extends to (side relative with described scan line drive circuit) outside the viewing area is provided with the 3rd switching tube, these the 3rd switching tubes be respectively MG1, MG2 ..., MG (2n-1), MG2n etc., described every horizontal scanning line all links to each other with corresponding sweep trace test signal circuit by corresponding the 3rd switching tube.
Be provided with odd column data line test signal circuit D_O and even column data line test signal circuit D_E in the viewing area AA outside and a side relative with described data line drive circuit, described odd column data line test signal circuit D_O and even column data line test signal circuit D_E are horizontal alignment.Described odd column data line test signal circuit D_O and each odd column data line S1 ..., S (2n-1) etc. links to each other, described even column data line test signal circuit D_E and each even column data line S2 ..., S2n etc. is continuous; And the location that every column data line extends to (side relative with described data line drive circuit) outside the viewing area is provided with the 4th switching tube, these the 4th switching tubes be respectively MS1, MS2 ..., MS (2n-1), MS2n etc., described every column data line all links to each other with corresponding data line test signal circuit by corresponding the 4th switching tube.
Also be provided with the first switching tube signal line SW1 and second switch pipe signal line SW2 in the viewing area AA outside, the described first switching tube signal line SW1 connect each odd line interlace line G1 ..., the 3rd switching tube MG1 between G (2n-1) etc. and the odd line interlace line test signal circuit G_O ..., MG (2n-1) etc., and each odd column data line S1 ..., the 4th switching tube MS1 between S (2n-1) etc. and the odd column data line test signal circuit D_O ..., MS (2n-1) etc.; Described second switch pipe signal line SW2 connect each even number line sweep trace G2 ..., the 3rd switching tube MG2 between G2n etc. and the even number line sweep trace test signal circuit G_E ..., MG2n etc., and each even column data line S2 ..., the 4th switching tube MS2 between S2n etc. and the even column data line test signal circuit D_E ..., MS2n etc.
Being amorphous silicon N-type transistor with the 3rd switching tube and the 4th switching tube in the embodiment of the invention is that example describes, and certainly, it also can be amorphous silicon P transistor npn npn.
Liquid crystal indicator provided by the present invention also comprises: the common electrode signal circuit that links to each other with each sweep trace (not shown among Fig. 3) when wanting in viewing area display frame, also needs to described common electrode signal circuit input common electric voltage.
Liquid crystal indicator provided by the present invention, if give the first switching tube signal line SW1 and the equal input high level of second switch pipe signal line SW2, give the 3rd switching tube signal line SW3 input low level, provide the sweep trace test signal by each test signal circuit to each sweep trace afterwards, provide the data line test signal to each data line, then can detect in the viewing area by picture shown in the viewing area and whether be short-circuited or open circuit conditions; Arbitrary circuit input low level in the first switching tube signal line SW1 and the second switch pipe signal line SW2 afterwards, and to the 3rd switching tube signal line SW3 input high level, whether can be short-circuited or open circuit conditions this moment by the junction that picture shown in the viewing area detects between viewing area and the drive IC (comprising scan line drive circuit and data line drive circuit), therefore, compared to existing technologies, whether the junction that can namely detect before liquid crystal indicator is assembled into module between viewing area and the drive IC has problem, thereby can reduce economic loss.
Need to prove, sweep trace test signal circuit is divided into odd line interlace line test signal circuit G_O and even number line sweep trace test signal circuit G_E; It only is a kind of embodiment in order to clearly demonstrate that data line test signal circuit is divided into odd-numbered line data line test signal circuit S_O and even number line data line test signal circuit S_O, wherein sweep trace test signal circuit or data line test signal circuit can be divided into any bar number, simultaneously, two kinds of test signals also can be provided, a kind of part of scanning line (data line) high level test signals that provides, another kind provide part of scanning line (data line) low level test signal to get final product.
Embodiment two
Describe the method for testing of liquid crystal indicator provided by the present invention in the present embodiment in detail.
In conjunction with Fig. 3 and Fig. 4, the method for testing of liquid crystal indicator provided by the present invention comprises the steps:
Step S1: the common electrode signal circuit to the viewing area AA outside is imported a direct current voltage signal, import odd column data-signal and even column data-signal respectively to odd column data line test signal circuit D_O and even column data line test signal circuit D_E, described odd column data-signal and even column data-signal are all normally exported according to sequential, in regular turn to odd line interlace line test signal circuit G_O and even number line sweep trace test signal circuit G_E input high level.
Step S2: in very first time section T1, to the first switching tube signal line SW1 and second switch pipe signal line SW2 input high level, and to the 3rd switching tube signal line SW3 input low level, at this moment, the 4th switching tube MS1 that links to each other with the first switching tube signal line SW1 or second switch pipe signal line SW2, MS2, ..., MS (2n-1), MS2n etc. and the 3rd switching tube MG1, MG2, ..., MG (2n-1), all conductings such as MG2n, the first switching tube SG1 that links to each other with the 3rd switching tube signal line SW3, ..., SG (2n/2) etc. and second switch pipe SS1, ..., SS (2n/2) etc. all ends, therefore, the data-signal that is provided by odd column data line test signal circuit D_O and even column data line test signal circuit D_E passes through the 4th switching tube MS1 respectively, MS2, ..., MS (2n-1), MS2n etc. and entering in the AA of viewing area, pass through the 3rd switching tube MG1 by the sweep signal that odd line interlace line test signal circuit G_O and even number line sweep trace test signal circuit G_E provide, MG2, ..., MG (2n-1), MG2n etc. and entering in the AA of viewing area, so normally display frame can judge whether have short circuit or open circuit conditions in the viewing area by shown picture in the AA of viewing area.
So far, finished test in the viewing area of liquid crystal indicator.
Certainly, the order of above-mentioned two steps can be exchanged, and this does not influence test result.
Step S3: after in very first time section T1, finishing the test in the viewing area of liquid crystal indicator, in the second time period T2, arbitrary circuit input low level in the first switching tube signal line SW1 and the second switch pipe signal line SW2, keep input high level to another circuit, and to the 3rd switching tube signal line SW3 input high level, the junction of viewing area and scan line drive circuit and data line drive circuit is detected.Certainly, in the second time period T2, also need all to import normal signal to common electrode signal circuit, odd column data line test signal circuit D_O, even column data line test signal circuit D_E, odd line interlace line test signal circuit G_O and even number line sweep trace test signal circuit G_E.
In the embodiment of the invention being that example describes to second switch pipe signal line SW2 input low level.When to second switch pipe signal line SW2 input low level, the 3rd switching tube MG2 that links to each other with described second switch pipe signal line SW2 ..., MG2n etc. and the 4th switching tube MS2 ..., MS2n etc. all ends; And because to the first switching tube signal line SW1 still input high level, so the 4th switching tube MS1 that links to each other with the first switching tube signal line SW1 ..., MS (2n-1) waits with the 3rd switching tube MG1 ..., still equal conducting such as MG (2n-1); At this moment, the sweep signal that odd line interlace line test signal circuit G_O provides will be by the 3rd switching tube MG1, ..., MG (2n-1) etc. arrive each odd line interlace line G1, ..., G (2n-1) etc., the data-signal that odd column data line test signal circuit D_O provides will be by the 4th switching tube MS1, ..., MS (2n-1) etc. arrive each odd column data line S1, ..., S (2n-1) etc., and the sweep signal that even number line sweep trace test signal circuit G_E provides can not be passed through the 3rd switching tube MG2, ..., MG2n etc. and arrive each even number line sweep trace G2, ..., G2n etc., in like manner, the data-signal that provides of even column data line test signal circuit D_E can not pass through the 4th switching tube MS2, ..., MS2n etc. and arrive each even column data line S2, ..., S2n etc.
But, in this step owing to imported high level to the 3rd switching tube signal line SW3, therefore, the first switching tube SG1 that links to each other with described the 3rd switching tube signal line SW3, ..., SG (2n/2) etc. and second switch pipe SS1, ..., SS equal conductings such as (2n/2), the described first switching tube SG1, ..., SG (2n/2) etc. and second switch pipe SS1, ..., the conducting of SS (2n/2) etc., mean that adjacent two sweep trace output signal golden fingers are with conducting in the scan line drive circuit, and also conducting of adjacent two data line output signal golden finger in the data line drive circuit, again because a plurality of sweep trace output signal golden fingers connect each sweep trace by the sweep trace lead-in wire respectively, a plurality of data line output signal golden fingers connect each data line respectively by data cable lead wire, therefore, the conducting of adjacent two sweep trace output signal golden fingers will make adjacent two sweep trace conductings, the conducting of adjacent two data line output signal golden finger will make adjacent two data line conductings, so, sweep trace test signal in the AA of viewing area on the odd line interlace line can arrive on the even number line sweep trace adjacent with corresponding odd line interlace line in the AA of viewing area by corresponding sweep trace output signal golden finger, data line test signal in the AA of viewing area on the odd column data line can arrive on the even column data line adjacent with corresponding odd column data line in the AA of viewing area by corresponding data line output signal golden finger, thereby making all has the sweep trace test signal on interior each sweep trace of viewing area AA, and on each data line the data line test signal is arranged all in the AA of viewing area, make normally display frame in the viewing area.
Because the sweep trace test signal in the AA of viewing area on the even number line sweep trace is to transmit by the sweep trace output signal golden finger in the scan line drive circuit, and the data line test signal in the AA of viewing area on the even column data line is to transmit by the data line output signal golden finger in the data line drive circuit, therefore, junction when described viewing area and scan line drive circuit, perhaps short circuit or open circuit conditions appear in the junction of viewing area and data line drive circuit, then just can embody from shown picture in the AA of viewing area, this moment just can detect the viewing area and whether the drive IC junction has short circuit or open circuit conditions.
Above being that example describes to second switch pipe signal line SW2 input low level, for to the first switching tube signal line SW1 input low level, still this situation of input high level is similar to the above to second switch pipe signal line SW2, repeats no more.
As from the foregoing, liquid crystal indicator provided by the present invention, by corresponding method of testing, before this liquid crystal indicator is assembled into module, can not only detect whether have short circuit or open circuit conditions in the viewing area, and can also detect the viewing area and whether the drive IC junction exists short circuit or open circuit conditions, therefore, compared to existing technologies, can reduce economic loss.
Various piece adopts the mode of going forward one by one to describe in this instructions, and what each part stressed is and the difference of other parts that identical similar part is mutually referring to getting final product between the various piece.
Need to prove, in this article, relational terms such as first and second grades only is used for an entity or operation are made a distinction with another entity or operation, and not necessarily requires or hint and have the relation of any this reality or in proper order between these entities or the operation.And, term " comprises ", " comprising " or its any other variant are intended to contain comprising of nonexcludability, thereby make and comprise that process, method, article or the equipment of a series of key elements not only comprise those key elements, but also comprise other key elements of clearly not listing, or also be included as the intrinsic key element of this process, method, article or equipment.Do not having under the situation of more restrictions, the key element that is limited by statement " comprising ... ", and be not precluded within process, method, article or the equipment that comprises described key element and also have other identical element.
To the above-mentioned explanation of the disclosed embodiments, make this area professional and technical personnel can realize or use the present invention.Multiple modification to these embodiment will be apparent concerning those skilled in the art, and defined General Principle can realize under the situation that does not break away from the spirit or scope of the present invention in other embodiments herein.Therefore, the present invention will can not be restricted to embodiment illustrated herein, but will meet the wideest scope consistent with principle disclosed herein and features of novelty.
Claims (13)
1. a liquid crystal indicator is characterized in that, comprising:
The viewing area is provided with many crisscross sweep traces and data line in the described viewing area;
Be arranged on scan line drive circuit and/or the data line drive circuit in the outside, viewing area, the sweep trace output signal golden finger of described scan line drive circuit connects each sweep trace respectively by the sweep trace lead-in wire, and is provided with first switching tube between two sweep trace output signal golden fingers; The data line output signal golden finger of described data line drive circuit connects each data line respectively by data cable lead wire, and is provided with the second switch pipe between two data line output signal golden fingers;
The 3rd switching tube signal line that connects first switching tube and/or second switch pipe;
Described scan line drive circuit offside in the outside, viewing area, described sweep trace is connected with sweep trace test signal circuit by the 3rd switching tube; And/or, the described data line drive circuit offside in the outside, viewing area, described data line is connected with data line test signal circuit by the 4th switching tube;
The first switching tube signal line and the second switch pipe signal line that connect a plurality of the 3rd switching tubes; And/or, connect the first switching tube signal line and the second switch pipe signal line of a plurality of the 4th switching tubes;
And the 3rd switching tube that links to each other with the first switching tube signal line all links to each other respectively by two sweep trace output signal golden fingers that corresponding sweep trace, sweep trace lead-in wire are connected with first switching tube with the 3rd switching tube that links to each other with second switch pipe signal line;
The 4th switching tube that links to each other with the first switching tube signal line all links to each other respectively by two data line output signal golden fingers that corresponding data line, data cable lead wire are connected with the second switch pipe with the 4th switching tube that links to each other with second switch pipe signal line.
2. liquid crystal indicator according to claim 1 is characterized in that, is provided with first switching tube between adjacent two sweep trace output signal golden fingers, and each first switching tube connects different sweep trace output signal golden fingers.
3. liquid crystal indicator according to claim 2 is characterized in that, is provided with a second switch pipe between adjacent two data line output signal golden fingers, and each second switch pipe connects different data line output signal golden fingers.
4. liquid crystal indicator according to claim 3 is characterized in that, the 3rd switching tube on the described first switching tube signal line connection odd line interlace line and/or the 4th switching tube on the odd column data line; The 3rd switching tube on the described second switch pipe signal line connection even number line sweep trace and/or the 4th switching tube on the even column data line.
5. liquid crystal indicator according to claim 4, it is characterized in that, described sweep trace test signal circuit comprises odd line interlace line test signal circuit and even number line sweep trace test signal circuit, each odd line interlace line links to each other with described odd line interlace line test signal circuit by the 3rd switching tube, and each even number line sweep trace links to each other with described even number line sweep trace test signal circuit by the 3rd switching tube.
6. liquid crystal indicator according to claim 4, it is characterized in that, described data line test signal circuit comprises odd column data line test signal circuit and even column data line test signal circuit, each odd column data line links to each other with described odd column data line test signal circuit by the 4th switching tube, and each even column data line links to each other with described even column data line test signal circuit by the 4th switching tube.
7. according to each described liquid crystal indicator of claim 1～6, it is characterized in that described first switching tube, second switch pipe, the 3rd switching tube, the 4th switching tube are N-type transistor or P transistor npn npn.
8. the method for testing of a liquid crystal indicator, this liquid crystal indicator is aforesaid right requirement 1 described liquid crystal indicator, it is characterized in that this method of testing comprises:
Open each the 3rd switching tube and/or each the 4th switching tube, close each first switching tube and each second switch pipe;
To sweep trace test signal circuit input scan line test signal and/or to data line test signal circuit input data line test signal, the sweep trace in the viewing area and/or data line are tested;
Close the 3rd switching tube and/or the 4th switching tube by the control of the first switching tube signal line, perhaps close the 3rd switching tube and/or the 4th switching tube by the control of second switch pipe signal line, open each first switching tube and each second switch pipe, scan line drive circuit and/or data line drive circuit and junction, viewing area are tested.
9. the method for testing of liquid crystal indicator according to claim 8 is characterized in that,
Described first switching tube connects adjacent two sweep trace output signal golden fingers, and each first switching tube connects different sweep trace output signal golden fingers.
10. the method for testing of liquid crystal indicator according to claim 9 is characterized in that,
Described second switch pipe connects adjacent two data line output signal golden finger, and each second switch pipe connects different data line output signal golden fingers.
11. the method for testing of liquid crystal indicator according to claim 10 is characterized in that,
The 3rd switching tube on the described first switching tube signal line control odd line interlace line and/or the 4th switching tube on the odd column data line; The 3rd switching tube on the described second switch pipe signal line control even number line sweep trace and/or the 4th switching tube on the even column data line.
12. the method for testing of liquid crystal indicator according to claim 11 is characterized in that,
Described sweep trace test signal circuit comprises odd line interlace line test signal circuit and even number line sweep trace test signal circuit, each odd line interlace line links to each other with described odd line interlace line test signal circuit by the 3rd switching tube, and each even number line sweep trace links to each other with described even number line sweep trace test signal circuit by the 3rd switching tube.
13. the method for testing of liquid crystal indicator according to claim 11 is characterized in that,
Described data line test signal circuit comprises odd column data line test signal circuit and even column data line test signal circuit, each odd column data line links to each other with described odd column data line test signal circuit by the 4th switching tube, and each even column data line links to each other with described even column data line test signal circuit by the 4th switching tube.
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| CN2011104595987A CN103186000A (en) | 2011-12-31 | 2011-12-31 | Liquid crystal display device and test method thereof |
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| CN2011104595987A CN103186000A (en) | 2011-12-31 | 2011-12-31 | Liquid crystal display device and test method thereof |
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