CN103176631A - Touch substrate, touch screen and touch display device - Google Patents
Touch substrate, touch screen and touch display device Download PDFInfo
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- CN103176631A CN103176631A CN201110431054XA CN201110431054A CN103176631A CN 103176631 A CN103176631 A CN 103176631A CN 201110431054X A CN201110431054X A CN 201110431054XA CN 201110431054 A CN201110431054 A CN 201110431054A CN 103176631 A CN103176631 A CN 103176631A
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- 239000000758 substrate Substances 0.000 title claims abstract description 134
- 238000012360 testing method Methods 0.000 claims abstract description 93
- 230000002093 peripheral effect Effects 0.000 claims abstract description 53
- 239000000463 material Substances 0.000 claims description 21
- 239000003292 glue Substances 0.000 claims description 20
- 229910052751 metal Inorganic materials 0.000 claims description 16
- 239000002184 metal Substances 0.000 claims description 16
- 239000004020 conductor Substances 0.000 claims description 14
- MRNHPUHPBOKKQT-UHFFFAOYSA-N indium;tin;hydrate Chemical group O.[In].[Sn] MRNHPUHPBOKKQT-UHFFFAOYSA-N 0.000 claims description 10
- 238000009413 insulation Methods 0.000 claims description 8
- YVTHLONGBIQYBO-UHFFFAOYSA-N zinc indium(3+) oxygen(2-) Chemical compound [O--].[Zn++].[In+3] YVTHLONGBIQYBO-UHFFFAOYSA-N 0.000 claims description 8
- 230000001681 protective effect Effects 0.000 claims description 6
- 239000000203 mixture Substances 0.000 claims description 4
- 239000012780 transparent material Substances 0.000 claims description 2
- 238000000034 method Methods 0.000 description 18
- 239000000523 sample Substances 0.000 description 11
- 238000004519 manufacturing process Methods 0.000 description 8
- 230000006378 damage Effects 0.000 description 7
- 238000003848 UV Light-Curing Methods 0.000 description 6
- 238000002834 transmittance Methods 0.000 description 6
- 238000005516 engineering process Methods 0.000 description 5
- 230000006698 induction Effects 0.000 description 5
- 239000007769 metal material Substances 0.000 description 4
- 238000012545 processing Methods 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 238000012986 modification Methods 0.000 description 3
- 230000004048 modification Effects 0.000 description 3
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 2
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 2
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 2
- 239000004411 aluminium Substances 0.000 description 2
- 229910052782 aluminium Inorganic materials 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 2
- 229910052802 copper Inorganic materials 0.000 description 2
- 239000010949 copper Substances 0.000 description 2
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 2
- 229910052737 gold Inorganic materials 0.000 description 2
- 239000010931 gold Substances 0.000 description 2
- GRPQBOKWXNIQMF-UHFFFAOYSA-N indium(3+) oxygen(2-) tin(4+) Chemical class [Sn+4].[O-2].[In+3] GRPQBOKWXNIQMF-UHFFFAOYSA-N 0.000 description 2
- 229910052709 silver Inorganic materials 0.000 description 2
- 239000004332 silver Substances 0.000 description 2
- 229910052718 tin Inorganic materials 0.000 description 2
- 239000011135 tin Substances 0.000 description 2
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 2
- 229910052721 tungsten Inorganic materials 0.000 description 2
- 239000010937 tungsten Substances 0.000 description 2
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 1
- 208000027418 Wounds and injury Diseases 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 208000014674 injury Diseases 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 229910052750 molybdenum Inorganic materials 0.000 description 1
- 239000011733 molybdenum Substances 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 238000004528 spin coating Methods 0.000 description 1
- 238000010897 surface acoustic wave method Methods 0.000 description 1
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Abstract
A touch substrate, a touch screen and a touch display device are provided, wherein the touch substrate comprises: a substrate including a touch sensitive area and a peripheral area surrounding the touch sensitive area; the touch sensing electrode array is positioned on the surface of the substrate of the touch sensing area; the test unit is located on the surface of the substrate of the peripheral area, the test unit is correspondingly and electrically connected with the corresponding touch sensing electrode, and the test unit comprises at least two stacked conductive layers. The touch substrate, the touch screen and the touch display device provided by the invention have excellent electrical properties.
Description
Technical field
The present invention relates to touch detection field, particularly a kind of touch substrate, touch-screen and touch display unit.
Background technology
Touch-screen can be used as a kind of interface tool that electronic installation is operated by display screen, allow the user directly to touch or hand-written mode input message by point on the touch display unit surface that is added with touch-screen, more friendly than input equipments such as mouse, keyboards, convenient, therefore be applied to more and more widely on various portable sets.
According to the type (as finger, pen etc.) of the contactant that uses and the difference of confirming point (position that contactant operates touch-screen) mode, touch-screen can be divided into resistance-type, condenser type, surface acoustic wave type, infrared type etc.
What be widely used at present is the capacitive touch screen technology.Capacitive touch screen comes the electric capacity at touch sensitive point place to change by being arranged on touch sensible electrod-array in substrate, thereby can be checked through the position of touch point, carries out order accordingly.
Please refer to Fig. 1, capacitive touch screen comprises: substrate 10, described substrate 10 have touch-sensitive area I and around the outer peripheral areas II of touch-sensitive area I;
Be positioned at the touch sensible electrod-array 11 on touch-sensitive area I substrate 10 surfaces, many row electrodes 13 that described touch sensible electrod-array 11 comprises many column electrodes 12, intersects with described many column electrodes 12; Described many column electrodes 12 and described many row electrodes 13 are positioned on described substrate 10, and every described column electrode 12 is partitioned into a plurality of column electrodes unit 14 by described many row electrodes 13; Be provided with insulation course 15 on row electrode 13 between the adjacent electrode unit 14 of every described column electrode 12, be provided with the cross-line 16 that connects described adjacent lines electrode unit 14 on described insulation course 15.
Be positioned at the peripheral circuit layer 17 on substrate 10 surfaces of outer peripheral areas II, described peripheral circuit layer 17 is electrically connected to touch sensible electrod-array 11;
Be positioned at substrate 10 surfaces of outer peripheral areas II, the stitching operation electrode layer 18 that is electrically connected to peripheral circuit layer 17.
Be in the Chinese invention patent of CN 102193700A at publication number, can find more technology relevant to capacitance touch screen.
But, the column electrode 12 of existing touch sensible electrod-array 11 and row electrode 13 materials are tin indium oxides, and the column electrode 12 of tin indium oxide and row electrode 13 thickness are 270 dusts-330 dusts, the column electrode 12 of above-mentioned thickness and row electrode 13 need to adopt the probe pen to carry out electrical testing, thereby determine whether touch sensible electrod-array 11 meets Production requirement, and the probe pen carries out being easy to damage touch sensible electrod-array 11 in the electrical testing process.
Summary of the invention
The problem that the present invention solves is to provide a kind of low touch substrate of injury tolerance, high touch-screen and touch display unit of production yield tested.
For addressing the above problem, the invention provides a kind of touch substrate, comprising: substrate, described substrate comprise touch-sensitive area and around the outer peripheral areas of touch-sensitive area; Be positioned at the touch sensible electrod-array of touch-sensitive area substrate surface; Be positioned at the test cell of the substrate surface of described outer peripheral areas, described test cell should be electrically connected to corresponding touch sensible electrode pair, and described test cell comprises stacked two conductive layers at least.
Optionally, described test cell comprises the first stacked conductive layer and the second conductive layer.
Optionally, described the second conductive is transparent conductive material.
Optionally, described the second conductive composition that is tin indium oxide, indium zinc oxide or tin indium oxide and indium zinc oxide.
Optionally, described the first conductive is metal.
Optionally, described test cell comprises the first conductive layer that is positioned at substrate surface and the second conductive layer that is positioned at the first conductive layer surface.
Optionally, described test cell comprises the second conductive layer that is positioned at substrate surface and the first conductive layer that is positioned at the second conductive layer surface.
Optionally, many row electrodes that described touch sensible electrod-array comprises many column electrodes, intersects with described many column electrodes, at least one in described many column electrodes and many row electrodes is electrically connected to described test cell.
Optionally, each column electrode and each row electrode all are electrically connected to described test cell.
Optionally, described many column electrodes and described many row electrodes are positioned on described substrate, and every described column electrode is become a plurality of column electrodes unit by described many row electrode gap; Be provided with insulation course on row electrode between the adjacent lines electrode unit of every described column electrode, be provided with the cross-line that connects described adjacent lines electrode unit on described insulation course.
Optionally, the material of described many column electrodes and described many row electrodes is transparent conductive material, and the material of described cross-line is metal.
Optionally, described test cell comprises transparent conductive material layer and the metal level that is formed on transparent conductive material, and the transparent material layer of described test cell and described many column electrodes and described many row electrodes are positioned at same layer; The metal level of described test cell and described cross-line are positioned at same layer.
Optionally, described touch substrate also comprises: be positioned at the peripheral circuit layer of the substrate surface of outer peripheral areas, described peripheral circuit layer is electrically connected to the touch sensible electrod-array; Be positioned at the substrate surface of outer peripheral areas, the stitching operation electrode layer that is electrically connected to the peripheral circuit layer.
Optionally, described peripheral circuit layer, stitching operation electrode layer and described metal level are positioned at same layer.
Optionally, the metal level of described test cell has a plurality of through holes.
Optionally, also comprise: the protective seam that covers described substrate.
The present invention also provides a kind of touch-screen, comprising: the described touch substrate of above-mentioned any one; The second substrate that is oppositely arranged with described touch substrate; The UV that covers described outer peripheral areas solidifies glue; Described touch substrate solidifies glue by UV and described the second substrate is bonding.
The present invention also provides a kind of touch display unit, comprises display panel and above-mentioned touch-screen.
Compared with prior art, the present invention has the following advantages:
Embodiments of the invention adopt the test cell with rhythmo structure that is positioned at outer peripheral areas II to satisfy the demand of the described touch sensible electrod-array of follow-up test; described test cell with rhythmo structure is the first conductive layer 121 that comprises the second conductive layer that is positioned at substrate surface and be positioned at the second conductive layer surface; the first conductive layer of metal material can effectively be protected the second conductive layer, thereby avoids tested probe scratch in test process.
Further, the second conductive layer of described test cell and described many column electrodes and described many row electrodes are positioned at same layer, and material is identical; Described peripheral circuit layer, described stitching operation electrode layer, the first conductive layer and described cross-line can select same material, adopt same mask plate, complete in same deposition-etch technique, be formed on same layer, thereby further save processing step and production cost.
Further, described the first conductive layer has a plurality of through holes, and described through hole exposes the second conductive layer, thereby when the second substrate that adopts UV curing glue bond and described touch substrate to be oppositely arranged, the transmittance that is positioned at the test cell position is high, solidifies the glue bond ability thereby improve UV.
The touch-screen yield that the embodiment of the present invention provides is high, further, described the first conductive layer has a plurality of through holes, described through hole exposes the second conductive layer, thereby when the second substrate that adopts UV curing glue bond and described touch substrate to be oppositely arranged, the transmittance that is positioned at the test cell position is high, solidifies the glue bond ability thereby improve UV.
The touch display unit that the embodiment of the present invention provides can not sustain damage in the process of test touch induction electrode array, and yield is high.
Description of drawings
Fig. 1 is the capacitive touch screen plan structure schematic diagram of prior art;
Fig. 2 is the schematic diagram of prior art testing capacitor formula touch-screen;
Fig. 3 is the touch substrate plan structure schematic diagram of one embodiment of the invention;
Fig. 4 is that Fig. 3 is along the cross-sectional view of AA line.
Embodiment
By background technology as can be known, please in conjunction with reference to figure 1 and Fig. 2, the column electrode 12 of existing touch sensible electrod-array 11 and row electrode 13 materials are tin indium oxides, and the column electrode 12 of tin indium oxide and row electrode 13 thickness are 270 dusts-330 dusts, the column electrode 12 of above-mentioned thickness and row electrode 13 need to adopt the probe pen to carry out electrical testing, thereby determine whether touch sensible electrod-array 11 meets Production requirement, and the probe pen carries out being easy to damage touch sensible electrod-array 11 in the electrical testing process.
For this reason, the present inventor proposes a kind of improved touch substrate, comprising: substrate, described substrate comprise touch-sensitive area and around the outer peripheral areas of touch-sensitive area; Be positioned at the touch sensible electrod-array of touch-sensitive area substrate surface; Be positioned at the test cell of the substrate surface of described outer peripheral areas, described test cell should be electrically connected to corresponding touch sensible electrode pair, and described test cell comprises stacked two conductive layers at least.
Particularly, described test cell comprises the first stacked conductive layer and the second conductive layer.Such as: described test cell comprises the first conductive layer that is positioned at substrate surface and the second conductive layer that is positioned at the first conductive layer surface; Perhaps described test cell comprises the second conductive layer that is positioned at substrate surface and the first conductive layer that is positioned at the second conductive layer surface.
Described the second conductive is transparent conductive material, such as: described the second conductive is the composition of tin indium oxide, indium zinc oxide or tin indium oxide and indium zinc oxide.
The first conductive is metal, such as being gold, silver, copper, aluminium, tungsten, tin, molybdenum etc.
The present invention is at the test cell of the substrate surface of described outer peripheral areas, and described unit comprises stacked two conductive layers at least, can avoid prior art middle probe pen to carry out the defective of damage touch sensible electrod-array in the electrical testing process.
Below in conjunction with a specific embodiment, touch substrate of the present invention is described in detail.
Please refer to Fig. 3, the touch substrate of the embodiment of the present invention comprises:
Be positioned at the touch sensible electrod-array 110 on touch-sensitive area I substrate 100 surfaces;
Be positioned at the test cell 120 on substrate 100 surfaces of described outer peripheral areas II, described test cell 120 and the corresponding electrical connection of corresponding touch sensible electrode (sign), described test cell 120 comprise the second conductive layer 122 (please refer to Fig. 4) that is positioned at substrate 100 surfaces and are positioned at first conductive layer 121 on the second conductive layer 122 surfaces.
Particularly, described substrate 100 is used for as the carrying platform that touches substrate, and described substrate 100 can be glass material.
Described substrate 100 comprises touch-sensitive area I (Active Area) and around the outer peripheral areas II of touch-sensitive area I.
Described touch-sensitive area I is used for carrying touch sensible electrod-array 110, and described outer peripheral areas II is used for bearing test unit 120, peripheral circuit layer 130 and/or stitching operation electrode layer 140 (Fig. 3 illustrates 130 and 140 simultaneously).
Described touch sensible electrod-array 110 is used for user's touch is converted to electric signal, in the present embodiment, many the row electrodes 112 that described touch sensible electrod-array 110 comprises many column electrodes 111, intersects with described many column electrodes 111, in one embodiment, described column electrode 111 is that drive electrode, described row electrode 112 are induction electrode; In another embodiment, described row electrode 112 is that drive electrode, described column electrode 111 are induction electrode.
Described many column electrodes 111 and described many row electrodes 112 are positioned on described substrate 100, and every described column electrode 111 is partitioned into a plurality of column electrodes unit (not sign) by described many row electrodes 112; Be provided with insulation course 113 on row electrode 112 between the adjacent lines electrode unit of every described column electrode 111, be provided with the cross-line 114 that connects described adjacent lines electrode unit on described insulation course 113.
Particularly, the material of described many column electrodes 111 and described many row electrodes 112 is transparent conductive material, and the material of described cross-line 114 is metal.
Need to prove; in the present embodiment take described touch sensible electrod-array 110 comprise many column electrodes 111, many row electrodes 112 intersecting with described many column electrodes 111 are as the explanation of presenting a demonstration property of example; those skilled in the art can select arranging of suitable touch sensible electrod-array according to the touch-screen of actual production; specially illustrate at this, should too not limit protection scope of the present invention.
Described test cell 120 is positioned at substrate 100 surfaces of described outer peripheral areas II, and described test cell 120 is used for the electric property of test touch induction electrode unit, described test cell 120 and the corresponding corresponding electrical connection of touch sensible electrode (identifying).
In the present embodiment, when described touch sensible electrod-array 110 comprises many column electrodes 111, during many row electrodes 112 intersecting with described many column electrodes 111, at least one in described many column electrodes 111 and many row electrodes 112 is electrically connected to.
In one example, each column electrode 111 and each row electrode 112 all are electrically connected to described test cell 120 (as shown in Figure 3).
Also need to prove, described test cell 120 comprises the second conductive layer 122 that is positioned at substrate 100 surfaces and is positioned at first conductive layer 121 on the second conductive layer 122 surfaces.
Described the second conductive layer 122 materials are transparent conductive material, such as: described the second conductive layer 122 materials are the composition of tin indium oxide, indium zinc oxide or tin indium oxide and indium zinc oxide.The first conductive 121 is metal, such as being gold, silver, copper, aluminium, tungsten, tin etc.
In the prior art, outer peripheral areas II does not usually arrange test cell or only only has the test electrode layer of single transparent conductive material, thereby in the process of the described touch sensible electrod-array 110 of follow-up test, test probe easy scratch test electrode layer and with the touch sensible electrod-array of test electrode layer one.
And in the present embodiment; the test cell 120 of employing rhythmo structure satisfies the demand of the described touch sensible electrod-array 110 of follow-up test; the test cell 120 of described rhythmo structure is the first conductive layer 121 that comprises the second conductive layer 122 that is positioned at substrate 100 surfaces and be positioned at the second conductive layer 122 surfaces; the first conductive layer 121 of metal material can effectively be protected the second conductive layer 122, thereby avoids tested probe scratch in test process.
In other embodiments, when described test cell comprises the first conductive layer that is positioned at substrate surface and is positioned at the second conductive layer of the first conductive layer surface, although the second conductive layer may tested probe scratch in test, but because the first conductive layer that is positioned at substrate surface is metal material, can not sustain damage at test process, thereby guarantee that test cell still can provide test environment preferably, guarantee test mass.
Further, the second conductive layer 122 and described many column electrodes 111 and described many row electrodes 112 of described test cell are positioned at same layer, and material is identical; The first conductive layer 121 of described test cell is positioned at same layer with described cross-line 114 and material is identical, thereby in making the process that touches substrate, the second conductive layer 122 can adopt same mask plate with column electrode 111, row electrode 112, complete in same deposition-etch technique, be formed on same layer, and during the first conductive layer 121 adopts same mask plates with described cross-line 114, completes in same deposition-etch technique, is formed on same layer, thereby save processing step and production cost.
In addition, the touch substrate of the embodiment of the present invention also comprises: be positioned at the peripheral circuit layer 130 on substrate 100 surfaces of outer peripheral areas II, described peripheral circuit layer 130 is electrically connected to touch sensible electrod-array 110; Be positioned at substrate 100 surfaces of outer peripheral areas II, the stitching operation electrode layer 140 that is electrically connected to peripheral circuit layer 130, and the protective seam 150 that covers described substrate.
Concrete, described peripheral circuit layer 130 is used for driving touch sensible electrod-array 110, described peripheral circuit layer 130 comprises column electrode lead-in wire (not sign) and row contact conductor (not sign), the electrical connection corresponding to column electrode 111 of described column electrode lead-in wire, the electrical connection corresponding to row electrode 112 of described row contact conductor; Described stitching operation electrode layer 140 is used for connecting external signal.
Described protective seam 150 materials are organic film material, for the protection of touch sensible electrod-array 110 and described peripheral circuit layer 130; Described protective seam 150 has opening at described test cell 120 places, surveys for test probe to expose test cell, and described protective seam has opening at described stitching operation electrode layer 140 places, to expose stitching operation electrode layer 140.
The present inventor also finds, described peripheral circuit layer 130, described stitching operation electrode layer 140, the first conductive layer 121 can select same material with described cross-line 114, adopt same mask plate, complete in same deposition-etch technique, be formed on same layer, thereby further save processing step and production cost.
Further, the present inventor is by carrying out further research discovery to touching substrate, in subsequent technique, described touch substrate can solidify glue (not shown) at outer peripheral areas II spin coating UV (ultraviolet), solidify by UV the second substrate (not shown) that glue bond and described touch substrate are oppositely arranged, and because the first conductive layer 121 materials are metal, the printing opacity rate variance, cause when bonding the second substrate adhesion property low, thereby impact touch the yield of substrate.
For this reason, in another embodiment of the present invention, the test cell 120 of described touch substrate comprises the second conductive layer 122 that is positioned at substrate 100 surfaces and is positioned at first conductive layer 121 on the second conductive layer 122 surfaces, and described the first conductive layer 121 has a plurality of through holes, described through hole exposes the second conductive layer 122, thereby when adopting UV to solidify the second substrate that glue bond and described touch substrate be oppositely arranged, the transmittance that is positioned at the test cell position is high, thereby improves UV curing glue bond ability.
Embodiments of the invention adopt the test cell 120 of the rhythmo structure that is positioned at outer peripheral areas II to satisfy the demand of the described touch sensible electrod-array 110 of follow-up test; the test cell 120 of described rhythmo structure is the first conductive layer 121 that comprises the second conductive layer 122 that is positioned at substrate 100 surfaces and be positioned at the second conductive layer 122 surfaces; the first conductive layer 121 of metal material can effectively be protected the second conductive layer 122, thereby avoids tested probe scratch in test process.
Further, the second conductive layer 122 and described many column electrodes 111 and described many row electrodes 112 of described test cell are positioned at same layer, and material is identical; Described peripheral circuit layer 130, described stitching operation electrode layer 140, the first conductive layer 121 can select same material with described cross-line 114, adopt same mask plate, complete in same deposition-etch technique, be formed on same layer, thereby further save processing step and production cost.
Further, described the first conductive layer 121 has a plurality of through holes, and described through hole exposes the second conductive layer 122, thereby when the second substrate that adopts UV curing glue bond and described touch substrate to be oppositely arranged, the transmittance that is positioned at the test cell position is high, solidifies the glue bond ability thereby improve UV.
In addition, the present invention also provides a kind of touch-screen that adopts above-mentioned touch substrate, comprising:
Touch substrate, described touch substrate comprises:
Substrate, described substrate comprise touch-sensitive area and around the outer peripheral areas of touch-sensitive area;
Be positioned at the touch sensible electrod-array of touch-sensitive area substrate surface;
Be positioned at the test cell of the substrate surface of described outer peripheral areas, described test cell should be electrically connected to corresponding touch sensible electrode pair, and described test cell comprises stacked two conductive layers at least;
The second substrate that is oppositely arranged with described touch substrate
The UV that covers described outer peripheral areas solidifies glue;
Described touch substrate solidifies glue by UV and described the second substrate is bonding.
Touch particularly substrate and please refer to the description of embodiment before, described the second substrate is for the protection of the unit that is positioned at substrate surface.
Better, described the first conductive layer has a plurality of through holes, and described through hole exposes the second conductive layer, thereby when the second substrate that adopts UV curing glue bond and described touch substrate to be oppositely arranged, the transmittance that is positioned at the test cell position is high, solidifies the glue bond ability thereby improve UV.
Touch-screen yield provided by the invention is high, further, described the first conductive layer has a plurality of through holes, described through hole exposes the second conductive layer, thereby when the second substrate that adopts UV curing glue bond and described touch substrate to be oppositely arranged, the transmittance that is positioned at the test cell position is high, solidifies the glue bond ability thereby improve UV.
In addition, a kind of touch display unit comprises display panel and above-mentioned touch-screen.
Particularly, described display panel can be the display panel of prior art, here no longer describes in detail, and touch display unit provided by the invention can not sustain damage in the process of test touch induction electrode array, and yield is high.
Although the present invention with preferred embodiment openly as above; but it is not to limit the present invention; any those skilled in the art without departing from the spirit and scope of the present invention; can utilize method and the technology contents of above-mentioned announcement to make possible change and modification to technical solution of the present invention; therefore; every content that does not break away from technical solution of the present invention; to any simple modification, equivalent variations and modification that above embodiment does, all belong to the protection domain of technical solution of the present invention according to technical spirit of the present invention.
Claims (18)
1. touch substrate comprises:
Substrate, described substrate comprise touch-sensitive area and around the outer peripheral areas of touch-sensitive area;
Be positioned at the touch sensible electrod-array of touch-sensitive area substrate surface;
It is characterized in that, described touch substrate also comprises:
Be positioned at the test cell of the substrate surface of described outer peripheral areas, described test cell should be electrically connected to corresponding touch sensible electrode pair, and described test cell comprises stacked two conductive layers at least.
2. touch as claimed in claim 1 substrate, it is characterized in that, described test cell comprises the first stacked conductive layer and the second conductive layer.
3. touch as claimed in claim 2 substrate, it is characterized in that, described the second conductive is transparent conductive material.
4. touch as claimed in claim 3 substrate, it is characterized in that, described the second conductive is the composition of tin indium oxide, indium zinc oxide or tin indium oxide and indium zinc oxide.
5. touch as claimed in claim 1 substrate, it is characterized in that, described the first conductive is metal.
6. touch as claimed in claim 1 substrate, it is characterized in that, described test cell comprises the first conductive layer that is positioned at substrate surface and the second conductive layer that is positioned at the first conductive layer surface.
7. touch as claimed in claim 1 substrate, it is characterized in that, described test cell comprises the second conductive layer that is positioned at substrate surface and the first conductive layer that is positioned at the second conductive layer surface.
8. touch as claimed in claim 1 substrate, it is characterized in that, many the row electrodes that described touch sensible electrod-array comprises many column electrodes, intersects with described many column electrodes, at least one in described many column electrodes and many row electrodes is electrically connected to described test cell.
9. touch as claimed in claim 8 substrate, it is characterized in that, each column electrode and each row electrode all are electrically connected to described test cell.
10. touch as claimed in claim 8 substrate, it is characterized in that, described many column electrodes and described many row electrodes are positioned on described substrate, and every described column electrode is become a plurality of column electrodes unit by described many row electrode gap; Be provided with insulation course on row electrode between the adjacent lines electrode unit of every described column electrode, be provided with the cross-line that connects described adjacent lines electrode unit on described insulation course.
11. touch as claimed in claim 10 substrate, it is characterized in that, the material of described many column electrodes and described many row electrodes is transparent conductive material, the material of described cross-line is metal.
12. touch as claimed in claim 11 substrate, it is characterized in that, described test cell comprises transparent conductive material layer and the metal level that is formed on transparent conductive material, and the transparent material layer of described test cell and described many column electrodes and described many row electrodes are positioned at same layer; The metal level of described test cell and described cross-line are positioned at same layer.
13. touch as claimed in claim 11 substrate, it is characterized in that, described touch substrate also comprises: be positioned at the peripheral circuit layer of the substrate surface of outer peripheral areas, described peripheral circuit layer is electrically connected to the touch sensible electrod-array; Be positioned at the substrate surface of outer peripheral areas, the stitching operation electrode layer that is electrically connected to the peripheral circuit layer.
14. touch as claimed in claim 13 substrate, it is characterized in that, described peripheral circuit layer, stitching operation electrode layer and described metal level are positioned at same layer.
15. touch as claimed in claim 11 substrate, it is characterized in that, the metal level of described test cell has a plurality of through holes.
16. touch as claimed in claim 1 substrate, it is characterized in that, also comprise: the protective seam that covers described substrate.
17. a touch-screen comprises:
Touch substrate as described in claim 1-16 any one;
The second substrate that is oppositely arranged with described touch substrate;
The UV that covers described outer peripheral areas solidifies glue;
Described touch substrate solidifies glue by UV and described the second substrate is bonding.
18. a touch display unit comprises the described touch-screen of display panel and claim 17.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201110431054XA CN103176631A (en) | 2011-12-20 | 2011-12-20 | Touch substrate, touch screen and touch display device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201110431054XA CN103176631A (en) | 2011-12-20 | 2011-12-20 | Touch substrate, touch screen and touch display device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN103176631A true CN103176631A (en) | 2013-06-26 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201110431054XA Pending CN103176631A (en) | 2011-12-20 | 2011-12-20 | Touch substrate, touch screen and touch display device |
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| Country | Link |
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| CN (1) | CN103176631A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106484190A (en) * | 2016-11-18 | 2017-03-08 | 业成科技（成都）有限公司 | Touch module |
| WO2018227951A1 (en) * | 2017-06-16 | 2018-12-20 | 京东方科技集团股份有限公司 | Panel manufacturing method, panel and display device |
| CN109725752A (en) * | 2017-10-30 | 2019-05-07 | 上海和辉光电有限公司 | A kind of preparation method and flexible touch substrate of flexible touch substrate |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN101699376A (en) * | 2009-09-04 | 2010-04-28 | 深超光电（深圳）有限公司 | Touch panel and method for detecting touch panel |
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| WO2018227951A1 (en) * | 2017-06-16 | 2018-12-20 | 京东方科技集团股份有限公司 | Panel manufacturing method, panel and display device |
| US11237666B2 (en) | 2017-06-16 | 2022-02-01 | Boe Technology Group Co., Ltd. | Fabrication method of panel, panel and display device |
| CN109725752A (en) * | 2017-10-30 | 2019-05-07 | 上海和辉光电有限公司 | A kind of preparation method and flexible touch substrate of flexible touch substrate |
| CN109725752B (en) * | 2017-10-30 | 2022-06-17 | 上海和辉光电股份有限公司 | Preparation method of flexible touch substrate and flexible touch substrate |
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Application publication date: 20130626 |