CN103149386A - Electronic load module of power supply aging test and power supply aging test system - Google Patents
Electronic load module of power supply aging test and power supply aging test system Download PDFInfo
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- CN103149386A CN103149386A CN2013100693138A CN201310069313A CN103149386A CN 103149386 A CN103149386 A CN 103149386A CN 2013100693138 A CN2013100693138 A CN 2013100693138A CN 201310069313 A CN201310069313 A CN 201310069313A CN 103149386 A CN103149386 A CN 103149386A
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Abstract
The invention provides an electronic load module of a power supply aging test and a power supply aging test system. The electronic load module of the power supply aging test provides an intelligent electronic load module controlled by an MCU (Microprogrammed Control Unit). According to the power supply aging test system, a plurality of electronic load modules of the power supply aging test are uniformly managed, displayed and stored by adopting an upper computer, so that the system is the intelligent power supply aging test system.
Description
Technical field
The present invention relates to the electronic load field in the power source aging testing apparatus, particularly a kind of for aging testing systems such as the programmable electronic load blocks of switch power supply aging test and the aging vehicle that is formed by many such electronic load modules, burn-in chambers.
Background technology
For reliability, stability and the security of checking and improving power supply product, power supply product is carried out burn-in test become an important step in this type of product processes flow process.The mal-condition that so-called " aging " refers to simulate a kind of high temperature is tested at full capacity for a long time power supply product and (is again burn in process or pot machine, English is called: Burn-in Test), check the performance of product to simulate mal-condition that actual use may occur.
Traditional fictitious load that aging testing apparatus uses is the master mainly with high-power resistance, and also with regard to first generation aging equipment, its advantage is that cost is low, and is simple.But because kind and the specification of power supply product are various, same power supply factory often has a lot of types, and the output specification of every kind of type is not quite similar, the impedance of required fictitious load and power are also different, therefore the shortcoming of traditional resistor-type aging equipment is also just more and more outstanding, and main manifestations is as follows:
1. resistance is fixed, and optional specification is few, much needs to factory's custom-made;
2. power specification is various, and resistance can't arrive aging required accurate electric current by exact matching;
3. resistance error is large, and easily produces deviation after temperature rise, can't guarantee that product 100% load is aging;
4. adjusting load needs first to calculate, and selects pull-up resistor can only obtain the approximate current value;
5. ageing process can't automatic monitoring, needs manually inspection one by one, the low and easy under-enumeration of efficient;
6. can't record the ageing process parameter, be not easy to the quality tracing management;
7. can't generate aging form, be not easy to analysis and the assessment of product quality;
Be directed to the above-mentioned outstanding shortcoming of resistor-type aged load, the aging equipment that the second generation occurred, it is the load of easy adjustable type simulation electronic, although cost is high more a lot of than the product of the first generation, but can be according to the specification regulating load electric current of product, when overcoming the product thread-changing, aging equipment need to be changed the misery of corresponding resistor, has also improved to a certain extent aging precision and efficient simultaneously.Second generation load has overcome first three shortcoming of first generation load, but 4 of back shortcoming is still outstanding, can't satisfy the demand of modern production technique.Although the market has the test type electronic load instrument of a lot of standards can satisfy aging requirement fully on performance and function at present, but this quasi-instrument is usually expensive, bulky, and its design is difficult to realize that mainly for test use such as research and development, engineering, productions the system group network of up to a hundred passages is used for aging in enormous quantities.
Summary of the invention
The objective of the invention is in order to overcome the deficiency of present electronic load, the electronic load module of the power source aging test of a kind of intelligence of design and the Test System On Power Aging that one group of such electronic load module is managed concentratedly.
technical scheme of the present invention is: the electronic load module of power source aging test, described electronic load module comprises driving circuit and as one group of field effect transistor of fictitious load, the source of described field effect transistor, drain electrode is connected respectively between the output terminal and ground of the power supply that is aging, described driving circuit produces the driving signal and is connected with the grid of described field effect transistor, grid current by controlling described field effect transistor or voltage are realized the burn-in test to the power supply that is aging, also comprise the control and management system that the electronic load unit is controlled, described control and management system comprises microprocessing unit, feedback circuit and the communication interface circuit of communicating by letter with host computer,
Described feedback circuit comprises current detection circuit and the voltage detecting circuit of the power supply that test is aging, and the testing result that described current detection circuit and voltage detecting circuit detect is input to described microprocessor;
Described microprocessor receives the detected electric current of described feedback circuit and magnitude of voltage, produce control signal and control described driving circuit, drive described field effect transistor by driving circuit, making described fictitious load is the fictitious load of constant current or constant voltage mode.
Further, in the electronic load module of above-mentioned power source aging test: also comprise pattern switching and control circuit, described pattern is switched and control circuit is controlled by constant current or the constant voltage control signal of microprocessor output;
Described pattern commutation circuit comprises constant voltage mode signal output apparatus and constant current mode signal output apparatus;
Described control circuit comprises constant-current control circuit and constant-voltage control circuit, described constant-voltage control circuit comprises comparer U503A, "+" termination of described comparer U503A is aging the output terminal of power supply, the reference voltage that "-" termination is arranged by described microprocessor, power end is connected with the constant voltage mode signal, when the constant voltage mode signal was effective, comparer U503A gets electric work generation made described driving circuit connect described driving circuit at the driving signal of constant voltage mode work;
Described constant-current control circuit comprises operational amplifier U504A, the reference voltage that "+" termination of described operational amplifier U504A is arranged by described microprocessor, "-" end of described comparer U504A is connected with output terminal and consists of voltage follower, power end is connected with described constant current mode signal, when the constant current mode signal was effective, generation made described driving circuit connect described driving circuit at the driving signal of constant current mode work.
Further, in the electronic load module of above-mentioned power source aging test: in described constant-voltage control circuit, hold and be aging in described comparer U503A "+" also to be provided with by resistance R 101, R102 and R103 between the output terminal of power supply and form bleeder circuit, described resistance R 102 and R103 are connected in parallel between "+" end and ground of comparer U503A, and "+" that resistance R 101 is serially connected in U503A holds and be aging between the output terminal of power supply.
Further, in the electronic load module of above-mentioned power source aging test: described driving circuit comprises operational amplifier U101, exchanges negative feedback capacitor C 101, and MOSFET drives resistance R 109 and MOSFET grid bleeder resistance R110; The constant current signal output terminal of the described constant-current control circuit of homophase termination of described operational amplifier U101 or connect the constant voltage signal output part of constant-voltage control circuit by unidirectional isolating diode D101, the anode of unidirectional isolating diode D101 connects the constant voltage signal output part of constant-voltage control circuit; The end of oppisite phase of described operational amplifier U101 connects the output terminal of operational amplifier U101 by exchanging negative feedback capacitor C 101, the output terminal of operational amplifier U101 drives resistance R 109 by MOSFET and connects grid as the MOSFET of fictitious load, and MOSFET grid bleeder resistance R110 is connected between the output terminal and ground of operational amplifier U101.
Further, in the electronic load module of above-mentioned power source aging test: also be respectively arranged with constant current control signal bleeder circuit and constant voltage control signal bleeder circuit before the in-phase end of the constant current of described constant-current control circuit or constant-voltage control circuit or constant voltage signal output part and described operational amplifier U101 joins;
Described constant current control signal bleeder circuit comprises divider resistance R107, R108 and R105; Described divider resistance R107 is serially connected between the in-phase end of the output terminal of follower U504A and operational amplifier U101, is connected to after divider resistance R108 and R105 parallel connection between the in-phase end and ground of operational amplifier U101;
Described constant voltage control signal bleeder circuit comprises divider resistance R104, R108 and R105; Described divider resistance R104 is serially connected between the in-phase end of the negative electrode of unidirectional isolating diode D101 and operational amplifier U101, is connected to after divider resistance R108 and R105 parallel connection between the in-phase end and ground of operational amplifier U101.
further, in the electronic load module of above-mentioned power source aging test: described constant voltage mode signal output apparatus comprises triode Q503 and triode Q504, the collector of described triode Q503 connects the base stage of described triode Q504 by current-limiting resistance R518, the ground level of described triode Q503 connects described microprocessor by current-limiting resistance R517, the grounded emitter of described triode Q503, the emitter welding system power supply of described triode Q504, described triode Q504 collector drives the constant voltage mode pilot lamp by current-limiting resistance R519, described constant voltage mode signal is drawn by described triode Q504 collector,
The constant current mode signal output apparatus comprises: triode Q505, triode Q506 and triode Q507; The base stage of described triode Q505 connects microprocessor by current-limiting resistance R520, the grounded emitter of triode Q505, and the collector of described triode Q505 is by current-limiting resistance R521 welding system power supply; The base stage of described triode Q506 is connected with the collector of described triode Q505, the grounded emitter of triode Q506, the collector of triode Q506 connects the base stage of described triode Q507 by current-limiting resistance R522, the emitter welding system power supply of described triode Q507, triode Q507 collector drives the constant current mode pilot lamp by current-limiting resistance R523, and the constant current mode signal is drawn by triode Q507 collector.
Further, in the electronic load module of above-mentioned power source aging test: also comprise Intelligent heat dissipation device, described Intelligent heat dissipation device comprises temperature-detecting device, fan control unit and fan, the working temperature of the real-time detected electrons load blocks of described temperature-detecting device, the detection signal of described temperature-detecting device divides two-way output, one the road delivers to described fan control unit, described fan control unit in temperature higher than 45 ℃, start fan, stop fan in temperature during lower than 45 ℃; Described microcontroller is delivered on another road, and during higher than 100 ℃, load blocks quits work when temperature,, automatically resumes work during lower than 100 ℃ when the load blocks temperature.
the present invention has also designed a kind of Test System On Power Aging that is comprised of the electronic load module of one group of power source aging test, this system can carry out burn-in test to some power supplys that are aging simultaneously, unify control ﹠ monitor by host computer, show and record test process, realize power source aging test automation and intellectuality, the technical scheme of this Test System On Power Aging is: this Test System On Power Aging comprises the electronic load module of one group of power source aging test, each passage of the electronic load module of each power source aging test carries out burn-in test to tested power supply respectively, also comprise host computer, described host computer interconnects by the electronic load module of communicator and the test of each power source aging respectively, receive test mode information and indication information that the electronic load module of each power source aging test is uploaded, and test mode information and indication information are shown and stores.
Further, in above-mentioned Test System On Power Aging: the communicator between the electronic load module of described host computer and the test of each power source aging is the asynchronous serial communication device, comprises the RS-485 communication interface circuit of the electronic load module that is separately positioned on host computer and the test of each power source aging.
Further, in above-mentioned Test System On Power Aging: the system power supply of the electronic load module of described each power source aging test is unified to be arranged.
The electronic load of combined standard type of the present invention and front two generation aged load excellent, shortcoming be optimized design for the demand of power source aging test specially, employing high-performance MCU(microprocessor) as the core of control module, modular design.The aged load that belongs to the third generation.Its advantage is as follows:
1. it is optional that same module is up to three kinds of patterns of CC/CV/LED, compatible multiple power sources product;
2. same module is in specification limit, but voltage/current value Set arbitrarily, the exact matching product specification;
3. load model and flexible setting for parameters are quick, can the overall situation set, i.e. also separated regions or setting at different levels;
4. aging of product parameter Real Time Monitoring, bad product space can be accurately located in automatic screening abnormal products and alarm;
5. load arranges wide ranges, draws year precision high, can adapt to the power supply product of plurality of specifications;
6. can record and the electric property of reviewing all test products, be convenient to attributional analysis;
7. the computer Centralized Monitoring is managed, and can effectively supervise the quality of aging processing procedure;
8. can automatically generate aging statistical tables and reports, facilitate the engineering staff to carry out attributional analysis and assessment;
9. system features in convenient, a people can manage a plurality of aging zones, saves labour turnover;
10. modular structural design, facilitate system maintenance;
Below in conjunction with specific embodiment, the present invention is done comparatively detailed description.
Description of drawings
Fig. 1 is the electronic load module principle block diagram of the embodiment of the present invention 1 power source aging test.
Fig. 2 is the embodiment of the present invention 1 Test System On Power Aging theory diagram.
Fig. 3 is the constant current/constant voltage mode commutation circuit schematic diagram that uses in the embodiment of the present invention 1.
Fig. 4 is constant current/constant voltage mode control circuit and the driving circuit principle figure that uses in the embodiment of the present invention 1.
Embodiment
in the present embodiment, the electronic load module of power source aging test as shown in Figure 1, the electronic load module of power source aging test comprises driving circuit and as one group of field effect transistor of fictitious load, the source of field effect transistor, drain electrode is connected respectively between the output terminal and ground of the power supply that is aging, driving circuit produces the driving signal and is connected with the grid of described field effect transistor, grid current by controlling described field effect transistor or voltage are realized the burn-in test to the power supply that is aging, also comprise the control and management system that the electronic load unit is controlled, the control and management system comprises microprocessing unit, feedback circuit and the communication interface circuit of communicating by letter with host computer, feedback circuit comprises current detection circuit and the voltage detecting circuit of the power supply that test is aging, and the testing result that current detection circuit and voltage detecting circuit detect is input to described microprocessor, microprocessor receives the detected electric current of described feedback circuit and magnitude of voltage, produces control signal and controls described driving circuit, drives described field effect transistor by driving circuit, and making described fictitious load is the fictitious load of constant current or constant voltage mode.Comprise also that in the control and management system pattern of being controlled by microprocessor switches and control circuit, as shown in Figure 3, Figure 4, pattern is switched and control circuit is controlled by constant current or the constant voltage control signal of microprocessor output;
The pattern commutation circuit comprises constant voltage mode signal CVPOW output circuit and constant current mode signal CCPOW output circuit; Control circuit comprises constant-current control circuit and constant-voltage control circuit, described constant-voltage control circuit comprises comparer U503A, "+" termination of described comparer U503A is aging the output terminal of power supply, the reference voltage that "-" termination is arranged by described microprocessor, power end is connected with constant voltage mode signal CVPOW, when constant voltage mode signal CVPOW was effective, comparer U503A gets electric work generation made described driving circuit connect described driving circuit at the driving signal of constant voltage mode work;
equally, constant-current control circuit comprises voltage follower U504A, "+" end of voltage follower U504A is connected with "-" end of described comparer U503A, namely be connected to the reference voltage that is arranged by described microprocessor, because holding, U504A "-" be connected with the output terminal of U504A, consist of voltage follower, its output voltage equals to connect the reference voltage by described microprocessor setting of U504A in-phase input end, power end is connected with constant current mode signal CCPOW, when constant current mode signal CCPOW is effective, generation makes described driving circuit connect driving circuit at the driving signal of constant current mode work.Constant voltage mode signal CVPOW output circuit comprises triode Q503 and triode Q504, the collector of described triode Q503 connects the base stage of described triode Q504 by current-limiting resistance R518, the ground level of described triode Q503 connects described microprocessor by current-limiting resistance R517, the grounded emitter of described triode Q503, the emitter welding system power supply of described triode Q504, described triode Q504 collector drives the constant voltage mode pilot lamp by current-limiting resistance R519, and constant voltage mode signal CVPOW is drawn by described triode Q504 collector.
Constant current mode signal (CCPOW) output circuit comprises: triode Q505, triode Q506 and triode Q507; The base stage of described triode Q505 connects microprocessor by current-limiting resistance R520, the grounded emitter of triode Q505, and the collector of described triode Q505 is by current-limiting resistance R521 welding system power supply; The collector of the base stage of described triode Q506 and described triode Q505 connects, the grounded emitter of triode Q506, the collector of triode Q506 connects the base stage of described triode Q507 by current-limiting resistance R522, the emitter welding system power supply of described triode Q507, triode Q507 collector drives the constant current mode pilot lamp by current-limiting resistance R523, and constant current mode signal (CCPOW) is drawn by triode Q507 collector.Also comprise Intelligent heat dissipation device in the electronic load module that the power source aging of the present embodiment is tested, Intelligent heat dissipation device comprises temperature-detecting device, fan control unit and fan, the working temperature of the real-time detected electrons load blocks of described temperature-detecting device, the detection signal of described temperature-detecting device divides two-way output, one the road delivers to described fan control unit, described fan control unit higher than 45 ℃, starts fan in temperature, stops fan during lower than 45 ℃ in temperature; Described microcontroller is delivered on another road, and during higher than 100 ℃, load blocks quits work when temperature, and during lower than 100 ℃, load blocks is resumed work automatically when temperature.
Concrete, in the present embodiment, the basic functional principle of the electronic load module of power source aging test is as follows:
Module arranges a unique address for each module by " address code selector switch " on module when composition system (as aging vehicle, burn-in chamber etc.), just host computer can accurately navigate to each passage of each module like this.When system powered on operation, host computer can scan and show the connection status of each module.Adopt the photoelectricity isolation between microprocessor and RS-485 telecommunication circuit.Because the serial communication institute Application standard interface of host computer (computer) is generally rs-232 standard, so need to use RS232 and the RS485 Photoelectric isolated converter of conversion mutually between module and host computer.
After module powers on, wait for that host computer issues the concrete operations instruction, the load end of module is not in closed condition before receiving instruction, namely can not draw to carry, and is equivalent to open-circuit condition.Host computer will draw the parameters such as the pattern of carrying, voltage, electric current by passing to the microprocessor of module under communication interface, microprocessor is controlled " pattern switching " circuit according to instruction and is selected to draw accordingly the pattern of carrying, simultaneously providing corresponding D/A(D/A according to instruction) signal level is to " FEEDBACK CONTROL " circuit, and the parameter of " driving circuit " basis " pattern switchings " circuit and " FEEDBACK CONTROL " circuit is gone to drive field effect transistor (MOSFET) and is drawn year." voltage detecting " and " current detecting " circuit is real-time will deliver to from the voltage and current signal that load end samples " A/D(mould/number) converter " carry out data acquisition, wait for that host computer reads.
The working temperature of the real-time detection module spreader surface of " temperature detection " circuit, detection signal are divided two-way output, and one the road delivers to " fan control unit ",, start fan and carry out forced refrigeration higher than 45 ℃ when temperature.When temperature during lower than 45 ℃ fan stop, to reduce the product power consumption.Microprocessor (MCU) is delivered on another road, and during higher than 100 ℃, module stops drawing carries, and closes output when temperature, and host computer also can provide corresponding demonstration.When temperature fell back to below 100 ℃, module was resumed work automatically.Fan control and overheat protector all are designed with return difference and control, and prevent that control circuit from moving back and forth in temperature control critical point, improved system stability.
The individual module of this framed structure can become single channel and any hyperchannel number according to Customer Requirement Design, and modal have single channel, 2 passages, 4 passages, 8 passages.The power maximum of individual module can be accomplished 1KW.
Adopt RS-485 serial isolated communication between module and host computer, reduced the interference between module and module.The 5559(of 6 that each module is provided with two parallel connections docks use with 6 5557 terminals) terminal is as communication interface, is convenient to being connected between module and module, simplifies layout and the cabling of system bus.
Module adopts 12V direct current supply, power interface adopts 5559 terminals (docking use with 4 5557 terminals) of two 4 and connects, when forming system, and can be by the industrial power centrally connected power supply, the simplification system installs and wiring, make the configuration of system and maintenance become simply, flexible.The load input interface uses 5559 terminals of 20, docks with 20 5557 terminals on jig plate (interface conversion plate).
The pattern of module is switched and control circuit, and the pattern of module is switched by CC/CV pattern commutation circuit shown in Figure 3 and CC/CV mode control circuit shown in Figure 4 and jointly completed.When the CC/CV control signal of MCU output was high level, module was constant voltage (CV) pattern, was used for the power supply of aging constant current output, as charger, LED driving power etc.; When the CC/CV control signal of MCU output was low level, module was constant current (CC) pattern, was used for the power supply of aging constant voltage output, as power supply adaptor, industrial power etc.
Concrete control principle: during constant voltage mode, the CC/CV control signal of MCU output is high level, Q503 shown in Figure 3, Q504 conducting, and " CVPOW+ " has positive supply output, gives amplifier U503A power supply shown in Figure 4; At this moment, also because of the conducting of MCU output high level, therefore, Q506, Q507 end Q505 shown in Figure 3, and " CCPOW+ " no-output is therefore amplifier U504A shown in Figure 4 is because quitting work without the positive supply power supply.due to the U503A normal operation, its inverting input "-" connects the control voltage that is arranged by described microcontroller, be aging the output level of power supply through resistance R 101, after R102 and R103 dividing potential drop, (being the output level component) is connected to the in-phase input end "+" of U503A, if be aging the control voltage that the output component of power supply arranges higher than microcontroller, U503A the 1st pin output high level, after amplifying, driving circuit make the field effect transistor (MOSFET) as fictitious load deepen conducting, internal resistance diminishes, the output current that is aging power supply is increased, owing to using constant voltage mode to carry out aging power supply, its output is controlled to be constant current mode, when load current reaches the constant current point of its setting, its output current no longer increases, output voltage begins to descend.When the output voltage that is aging power supply descends, the component of voltage of U503A in-phase end "+" descends thereupon, when the level of U503A in-phase end during lower than the level of its end of oppisite phase, U503A is output as low level, driving circuit output weakens, the described field effect transistor conducting degree of depth as fictitious load is shoaled, and internal resistance increases, and is aging corresponding the reducing of output current of power supply.And so forth, through after of short duration adjustment, circuit can enter a stable equilibrium state, the control voltage that the microcontroller that makes the output voltage component that is aging power supply that connects U503A in-phase end "+" equal to be connected to U503A end of oppisite phase "-" arranges.At this moment, be aging the output voltage of power supply constant on set electrical voltage point.Thereby the module of realization " CV " pattern is drawn and is carried function;
on the contrary, during constant current mode, the CC/CV control signal of microcontroller output is low level, Q503, Q504 cut-off, and " CVPOW+ " Non voltage output, U503A quits work because of the non-transformer power supply, simultaneously, because the CC/CV control signal is low level, Q505 also ends, and the conducting due to pull-up resistor R521 welding system power supply of Q506 base stage, and then make also conducting of PNP triode Q507, " CCPOW+ " exports positive supply, be that U504A can work, its in-phase end connects the control voltage that microcontroller arranges, its inverting input "-" is connected with output terminal and consists of voltage follower, that is to say that the voltage of its first pin output equals the input voltage of in-phase end "+", but electric current is amplified, R106 is connected across between output terminal and ground as the pull-up resistor of U504A, improve the antijamming capability of control circuit.As shown in Figure 4, the control voltage " DA1 " that microcontroller arranges carries out after electric current amplifies through voltage follower U504A, then delivers to driving circuit after R107 and R108 and R105 dividing potential drop.Described driving circuit comprises, operational amplifier U101 exchanges negative feedback capacitor C 101, and MOSFET drives resistance R 109 and MOSFET grid bleeder resistance R110.When the control voltage " DA1 " that arranges when microcontroller be 0V, voltage follower U504A output be also 0V, and then operational amplifier U101 output is also 0V, as the field effect transistor MOSFET shutoff of fictitious load, did not namely draw year.the control voltage " DA1 " that arranges when microcontroller is during greater than 0V, voltage follower U504A exports identical voltage, deliver to the in-phase input end of operational amplifier U101 after R107 and R108 and R105 dividing potential drop, because the pressure drop (namely current sampling signal IS101) at current sampling resistor R115 before the field effect transistor conducting and R116 two ends is 0V, be connected to the inverting input of operational amplifier U101 through electric R111, therefore when controlling voltage signal " DA1 " greater than 0V, the in-phase end level of operational amplifier U101 is higher than end of oppisite phase, be output as high level, the field effect transistor Q101 conducting that drives as fictitious load through driving resistance R 109, draw and carry being aging power supply.After the Q101 conducting, load current is in sample resistance R115, R116 two ends generation pressure drop, and namely current sampling signal " IS101 ", deliver to the U101 end of oppisite phase by feedback resistance R111.When current sampling signal " IS101 " during greater than the component of " DA1 ", the operational amplifier output voltage reduces, the Q101 conducting degree of depth is shoaled, internal resistance increases, and reduces load current, when one timing of DA1 level, operational amplifier enters steady state (SS), make load current constant on the current point that DA1 sets, realize that constant current is drawn to carry a function, namely module is in " CC " pattern.
Claims (10)
1. the electronic load module of power source aging test, described electronic load module comprises driving circuit and as one group of field effect transistor (MOSFET) of fictitious load, the source of described field effect transistor, drain electrode is connected respectively between the output terminal and ground of the power supply that is aging, described driving circuit produces the driving signal and is connected with the grid of described field effect transistor, grid current by controlling described field effect transistor or voltage are realized the burn-in test to the power supply that is aging, it is characterized in that: also comprise the control and management system that the electronic load unit is controlled, described control and management system comprises microprocessing unit, feedback circuit and the communication interface circuit of communicating by letter with host computer,
Described feedback circuit comprises current detection circuit and the voltage detecting circuit of the power supply that test is aging, and the testing result that described current detection circuit and voltage detecting circuit detect is input to described microprocessor;
Described microprocessor receives the detected electric current of described feedback circuit and magnitude of voltage, produce control signal and control described driving circuit, drive described field effect transistor by driving circuit, making described fictitious load is the fictitious load of constant current or constant voltage mode.
2. the electronic load module of power source aging test according to claim 1, is characterized in that: also comprise pattern switching and control circuit, described pattern is switched and control circuit is exported by microprocessor constant current or the control of constant voltage control signal;
Described pattern commutation circuit comprises constant voltage mode signal (CVPOW) output circuit and constant current mode signal (CCPOW) output circuit;
Described control circuit comprises constant-current control circuit and constant-voltage control circuit, described constant-voltage control circuit comprises comparer U503A, "+" termination of described comparer U503A is aging the output terminal (LOAD1+) of power supply, the reference voltage (DA1) that "-" termination is arranged by described microprocessor, power end is connected with constant voltage mode signal (CVPOW), when constant voltage mode signal (CVPOW) was effective, comparer U503A gets electric work generation made described driving circuit connect described driving circuit at the driving signal of constant voltage mode work;
Described constant-current control circuit comprises operational amplifier U504A, the reference voltage (DA1) that "+" termination of described operational amplifier U504A is arranged by described microprocessor, "-" end of described operational amplifier U504A is connected with output terminal and consists of voltage follower, power end is connected with described constant current mode signal (CCPOW), when constant current mode signal (CCPOW) was effective, generation made described driving circuit connect described driving circuit at the driving signal of constant current mode work.
3. the electronic load module of power source aging according to claim 2 test, it is characterized in that: in described constant-voltage control circuit, hold and be aging in described comparer U503A "+" also to be provided with by resistance R 101, R102 and R103 between the output terminal (LOADI+) of power supply and form bleeder circuit, described resistance R 102 and R103 are connected in parallel between "+" end and ground of comparer U503A, and "+" that resistance R 101 is serially connected in U503A holds and be aging between the output terminal (LOADI+) of power supply.
4. the electronic load module of power source aging according to claim 2 test, it is characterized in that: described driving circuit comprises operational amplifier U101, exchanges negative feedback capacitor C 101, MOSFET drives resistance R 109 and MOSFET grid bleeder resistance R110; The constant current signal output terminal of the described constant-current control circuit of homophase termination of described operational amplifier U101 or connect the constant voltage signal output part of constant-voltage control circuit by unidirectional isolating diode D101, the anode of unidirectional isolating diode D101 connects the constant voltage signal output part of constant-voltage control circuit; The end of oppisite phase of described operational amplifier U101 connects the output terminal of operational amplifier U101 by exchanging negative feedback capacitor C 101, the output terminal of operational amplifier U101 drives resistance R 109 by MOSFET and connects grid as the MOSFET of fictitious load, and MOSFET grid bleeder resistance R110 is connected between the output terminal and ground of operational amplifier U101.
5. the electronic load module of power source aging according to claim 4 test is characterized in that: also be respectively arranged with constant current control signal bleeder circuit and constant voltage control signal bleeder circuit before the in-phase end of the constant current of described constant-current control circuit or constant-voltage control circuit or constant voltage signal output part and described operational amplifier U101 joins;
Described constant current control signal bleeder circuit comprises divider resistance R107, R108 and R105; Described divider resistance R107 is serially connected between the in-phase end of the output terminal of follower U504A and operational amplifier U101, is connected to after divider resistance R108 and R105 parallel connection between the in-phase end and ground of operational amplifier U101;
Described constant voltage control signal bleeder circuit comprises divider resistance R104, R108 and R105; Described divider resistance R104 is serially connected between the in-phase end of the negative electrode of unidirectional isolating diode D101 and operational amplifier U101, is connected to after divider resistance R108 and R105 parallel connection between the in-phase end and ground of operational amplifier U101.
6. the electronic load module that according to claim 2 to 4, arbitrary described power source aging is tested, it is characterized in that: described constant voltage mode signal (CVPOW) output circuit comprises triode Q503 and triode Q504, the collector of described triode Q503 connects the base stage of described triode Q504 by current-limiting resistance R518, the ground level of described triode Q503 connects described microprocessor by resistance R 517, the grounded emitter of described triode Q503, the emitter welding system power supply of described triode Q504, described triode Q504 collector drives the constant voltage mode pilot lamp by current-limiting resistance R519, described constant voltage mode signal (CVPOW) is drawn by described triode Q504 collector,
Constant current mode signal (CCPOW) output circuit comprises: triode Q505, triode Q506 and triode Q507; The base stage of described triode Q505 connects microprocessor by current-limiting resistance R520, the grounded emitter of triode Q505, and the collector of described triode Q505 is by current-limiting resistance R521 welding system power supply; The base stage of described triode Q506 is connected with the collector of described triode Q505, the grounded emitter of triode Q506, the collector of triode Q506 connects the base stage of described triode Q507 by current-limiting resistance R522, the emitter welding system power supply of described triode Q507, triode Q507 collector drives the constant current mode pilot lamp by current-limiting resistance R523, and constant current mode signal (CCPOW) is drawn by triode Q507 collector.
7. the electronic load module of power source aging according to claim 6 test, it is characterized in that: also comprise Intelligent heat dissipation device, described Intelligent heat dissipation device comprises temperature-detecting device, fan control unit and fan, the working temperature of the real-time detected electrons load blocks of described temperature-detecting device, the detection signal of described temperature-detecting device divides two-way output, one the road delivers to described fan control unit, described fan control unit in temperature higher than 45 ℃, start fan, stop fan in temperature during lower than 45 ℃; Described microcontroller is delivered on another road, and during higher than 100 ℃, load blocks quits work when temperature,, automatically resumes work during lower than 100 ℃ when the load blocks temperature.
8. the Test System On Power Aging that forms of the electronic load module of a power source aging according to claim 1 test, this Test System On Power Aging comprises the electronic load module of one group of power source aging test, the electronic load module of each power source aging test is carried out burn-in test to tested power supply respectively, it is characterized in that: also comprise host computer, described host computer interconnects by the electronic load module of communicator and the test of each power source aging respectively, receive test mode information and indication information that the electronic load module of each power source aging test is uploaded, and test mode information and indication information are shown and stores.
9. Test System On Power Aging according to claim 8, it is characterized in that: the communicator between the electronic load module of described host computer and the test of each power source aging is the asynchronous serial communication device, comprises the RS-485 communication interface circuit of the electronic load module that is separately positioned on host computer and the test of each power source aging.
10. Test System On Power Aging according to claim 8, is characterized in that: the unified setting of the system power supply of the electronic load module of described each power source aging test.
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