CN103148787A - Goos-Haenchen shift measuring method and measuring system thereof - Google Patents
Goos-Haenchen shift measuring method and measuring system thereof Download PDFInfo
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Abstract
The invention discloses a Goos-Haenchen shift measuring method and a measuring system thereof. The method and the system have the advantages that an adjustable polarizing control device is modulated by a time-varying signal, and the Goos-Haenchen shift information related to the polarizing is subjected to collinear detection. The difference detection of a signal to be detected and a reference signal are carried out by the collinear polarizing modulation method, the common-mode noise and the caused baseline drift are effectively eliminated, and the stability of the system is obviously improved.
Description
Technical field
The present invention relates to the sensing detection field.The present invention is specifically related to the Gu Sihanxin displacement measurement method, and the measuring system that realizes the method.
Background technology
Gu Sihanxin effect (Goos-
Effect is called for short the GH effect) be a kind of special optical phenomena.When total reflection occurs at the interface in Finite diameter Light Beam, a series of non-mirror reflection phenomenon may occur, the Gu Sihanxin effect is exactly wherein a kind of, show as linear polarized light and experience a bit of displacement in the process of total reflection: namely reflection spot has a sudden change on phase place with respect to incidence point, and reflected light spatially has one section lateral distance with respect to incident light, and this distance is called as the Gu Sihanxin displacement.This phenomenon is by Fritz Goos and Hilda Lindberg-
At first nineteen forty-seven is verified in experiment, gains the name for some reason.
Aspect theory research, before the sixties in 20th century, after observing experimentally the Gu Sihanxin displacement, K.Artmann and Fragstein have just derived the calculating formula of Gu Sihanxin displacement respectively with diverse ways, and wherein the computing formula of Artmann is used till today.1961 and 1977, the people such as R.H.Renard have proposed again can stream method and angular spectrum method.After this, the object that occurs of Gu Sihanxin displacement also expands to multi-layer film structure or periodic structure, membrane structure, photonic crystal etc. even by single interface.PR.Berman had reported the Gu Sihanxin displacement in the Medium with Negative-refractive Index in 2002.
And more effective mode is to strengthen the GH effect by the excitating surface ripple.Can produce the reflection of GH effect, must first excite the generation evanescent wave, and so-called GH displacement also can be imagined as due to incident light at reflecting surface, propagate and penetrate in incident medium that the certain distance back reflection causes with the form of surface wave, in system, surface wave excites and strengthens and can strengthen the GH effect.The GH displacement of the people such as Schreier when theory had been calculated at two kinds of different diffraction structure generation oscillating conditions in 1998.2004, the people such as the Yin of Stanford University adopted Position-Sensitive Detector and lock-in amplifier, the GH displacement of having measured 50 times of wavelength magnitude in a typical surface plasma resonance (Surface Plasmon Resonance, SPR) detection system.
Bloch surface wave (BSW) is a kind of in photon crystal structure surface area method, along the surface wave of interface direction transmission.A kind of as surface electromagnetic wave (Surface Electromagnetic Wave, SEW), Bloch surface wave and surface plasma wave have many similarities, have larger Application in Sensing potentiality.In recent years, caused increasing concern in fields such as comprising sensing and integrated photon waveguide, and be expected to become the substitute technology of a kind of SPP.
Photonic crystal is that the dielectric material by differing dielectric constant is the structure of periodically arranging in the space.When electromagnetic wave is propagated therein, follow refraction, reflection, transmission principle, the Bragg diffraction of electron period is modulated electromagnetic wave and is formed the band structure of similar electronics.This band structure is called as photonic band gap.Under the condition of the grating constant that is fit to and permittivity ratio, the frequency field that the electromagnetic wave of some characteristic frequency can't see through can appear between the photonic band gap of photonic crystal, similar electronic energy band gap, this frequency zones is called as photon band gap (photonic band gap, PBG) or forbidden photon band.Therefore photon crystal material is also referred to as photonic bandgap material.
Different with dimension according to the direction of periodically arranging, photonic crystal can be divided into one dimension, two and three dimensions.Exist the Physical Mechanism of forbidden photon band to be based on the Bloch of solid state physics in photonic crystal theoretical.When electromagnetic wave is propagated in a node space with discrete, translational symmetry, by Theory of Electromagnetic Field as can be known, be distributed as the form of the plane wave of being modulated by periodic function at the electromagnetic field along the refractive index cycle change direction, become Bloch state (Bloch State), to be its wave vector have periodically in this direction notable feature, and it need not to consider scattering effect when propagating again in photonic crystal.
According to the Bloch principle, and the principle that electronic band gap occurs is similar, and in photonic crystal, periodically variable index distribution can be regarded the effect of draw refractive index and Periodic Perturbation as, and this perturbation namely causes Bloch edge frequency of occurrences band gap.In this frequency band gap, the wave vector of light wave does not have real part, this means in this band gap, and light wave is not able to the fluctuation form and propagates, but exists with the form of light waves of electromagnetic field exponential damping.In order to excite this pattern, can pass through perfectly introducing a defect layer in the middle of photon crystal structure, thereby at photonic crystal internal excitation local mode; Also can pass through at photon crystal structure surface end introducing one deck dielectric material, thereby at photon crystal surface excitating surface ripple.
By building the 1-D photon crystal structure, the pbg structure surface excitation Bloch surface wave that can block at one dimension, produce the Gu Sihanxin displacement that significantly strengthens, on the other hand because this structure forms by nondestructive material, optical loss is much smaller than structures such as the SPR structure that is comprised of metal material or metal gratings, thereby can obtain simultaneously larger Gu Sihanxin displacement and less optical loss.Utilizing the Gu Sihanxin displacement that is strengthened by surface wave of this super large to carry out sensing detection is a kind of new high sensitivity sensing detection scheme: the coupling scheme that adopt similar SPR detection system, by position and the variation thereof of detection of reflected luminous point, obtain the change in physical properties (as refractive index etc.) of the external agency adjacent with the Bloch surface wave structures.And existing Gu Sihanxin displacement detecting method, owing to having mechanical vibration and the long signal drift that causes such as temperature variation, the light spot position result that detects exists larger noise and drift, system comparatively fragility and systematic error larger.
Summary of the invention
Therefore, according to the defective that prior art exists, task of the present invention is to provide a kind of Gu Sihanxin displacement measurement method that can improve system stability;
Another task of the present invention is to provide a kind of measuring system of using above-mentioned measuring method.
On the one hand, the invention provides a kind of measuring method of Gu Sihanxin displacement, comprise the following steps:
The homogeneous beam that (1) will have certain polarization state incides the optical device to be measured that can produce the Gu Sihanxin displacement through after adjustable polarization control device by optical couping device, then the position of reflection or transmitted light beam is detected;
(2) the adjustable polarization control device in step (1) is driven by time varying signal, makes polarization state temporal evolution and variation repeatedly between at least two kinds of different polarization states by the light beam of this device;
(3) for different polarization states, the optical device in step (1) can produce different Gu Sihanxin displacements under described light beam incident condition;
(4) according in step (2) to the rule of the time varying signal that changes light polarization, measure the position of reflection or transmitted light beam, and by analyze not in the same time reflection or the position of transmitted light beam, obtain the Gu Sihanxin displacement information.
In said method, the described change in physical properties that can produce the optical device to be measured of Gu Sihanxin displacement can produce the Gu Sihanxin displacement of respective change thereupon.
In said method, when the physical characteristics of optical device to be measured (as with the sample refractive index of surface optical device to be measured or sample thickness of thin layer etc.) when changing, can obtain Gu Sihanxin displacement and change information thereof in step (4).
In said method, the angle that incides optical device to be measured is that incident light can excite the angle of Gu Sihanxin displacement under a certain polarization state, and in measuring process, this angle is constant.
In said method, the light beam by adjustable polarization control device is linearly polarized light, is preferably orthogonal s polarization and p polarization state.
In said method, the described optical device that can produce the Gu Sihanxin displacement can be the optical surface wave device that comprises surface plasma wave and Bloch surface wave by exciting, can be by the optical device of excitation wave waveguide mode with generation Gu Sihanxin displacement, can be also to utilize the optical device that can produce the Gu Sihanxin displacement that comprises weak absorbing medium, weak gain media, left hand artificial material structure etc.
In one example, by controlling the driving signal of adjustable polarizer, make the polarization state cyclical variation of emergent light.
In one example, by controlling the driving signal of adjustable polarizer, make the polarization state of emergent light not be respectively in the same time s polarization and p polarization, the Gu Sihanxin displacement size of optical device is respectively and can ignores and greater than ten times of wavelength magnitude under these two polarization states.
In one example, the optical device that produces the Gu Sihanxin displacement is the surface plasma body resonant vibration device, and under the incident of resonance angle, the Gu Sihanxin displacement size that it produces under s polarization and p polarization is respectively can be ignored and about 50 times of wavelength.
In one example, the optical device that produces the Gu Sihanxin displacement is the Bloch surface wave device, and under a certain fixed angle incident, the Gu Sihanxin displacement size that it produces under s polarization and p polarization is respectively can be ignored and about 1000 times of wavelength.
On the other hand, the present invention also provides a kind of Gu Sihanxin displacement measurement system that can effectively suppress mechanical vibration, baseline wander, comprises narrow-band light source, adjustable polarization control device, time varying signal source, optical couping device, the optical device that can produce the Gu Sihanxin displacement, detector, signal processing system.
In said system, narrow-band light source can be laser instrument, the light source that also can be comprised of wide spectrum light source and narrow band pass filter.
In said system, the described optical device that can produce the Gu Sihanxin displacement can be the optical surface wave device that comprises surface plasma wave and Bloch surface wave by exciting, can be by the optical device of excitation wave waveguide mode with generation Gu Sihanxin displacement, can be also to utilize the optical device that can produce the Gu Sihanxin displacement that comprises weak absorbing medium, weak gain media, left hand artificial material structure etc.
In said system, described adjustable Polarization Controller comprises spatial light modulator (SLM), Polarization Controller or light polarization modulator etc.
In said system, described detector is the light-beam position detecting device, comprises Position-Sensitive Detector (PSD), bicell or charge coupled cell (CCD) etc.
In said system, described signal processing system comprises that can record signal to described detector implements computing, amplifying signal amplifier and lock-in amplifier.
In one example, described optical couping device adopts traditional Kretschmann prism-coupled device.
In one example, the output signal in time varying signal source drives adjustable Polarization Controller, is input in lock-in amplifier in described signal processing system as the reference signal simultaneously.
In one example, the time varying signal source is produced by software, the signal controlling that adjustable Polarization Controller produces by software, and this signal converts analog electrical signal output to, and is input in lock-in amplifier in described signal processing system as the reference signal.
Gu Sihanxin displacement measurement method of the present invention and measuring system thereof have the following advantages:
1. in the sensing and detecting system by method realization of the present invention, realize the Differential Detection of measured signal and reference signal by the Polarization Modulation method of conllinear, the baseline wander that can effectively eliminate common-mode noise and cause significantly strengthens Systems balanth.
2. light source, optical element and device, checkout equipment etc. in the sensor-based system of realizing by method of the present invention can maintain static, and are convenient to realize integrated, miniaturization and portability.
Description of drawings
Fig. 1 is a kind of Gu Sihanxin displacement measurement system composition frame chart.
Fig. 2 is the detection principle schematic of the Gu Sihanxin displacement measurement system described in example.
Fig. 3 is the long-time testing result that comprises the signal of Gu Sihanxin displacement information in example.
Embodiment
Fig. 1 has provided a kind of Gu Sihanxin displacement detection system schematic diagram provided by the invention.This system is included in narrow-band light source 101, adjustable polarization control device 102, the coupled system 103 that comprises optical device to be measured, detector 104, time varying signal source 105 and the signal processing system 106 that on light path, order arranges.Wherein adjustable polarization control device 102 is driven by time varying signal source 105 and controls, and the output in time varying signal source 105 is input to signal processing system 106 as the reference signal.
Fig. 2 has provided a kind of Gu Sihanxin displacement detection system provided by the invention and principle of work schematic diagram, comprise narrow-band light source 201, adjustable polarization control device 202, optical coupling system 203, optical device to be measured 204, detector 205, time varying signal source 206 and signal processing system 207.
Adopt the Bloch surface wave optical chip that designs for the p polarization state as optical device to be measured in this example, and adopt traditional prism-coupled mode exciting light surface wave (Kretschmann coupling device), incide light beam on chip with this polarization state, only can excite the Bloch surface wave and produce the Gu Sihanxin displacement under a certain angle.The narrow-band light source 201 that experiment is adopted is the FP laser instrument of 980nm, and the couple prism in optical coupling system 203 is Tp, and material is SF10 glass, and optical device 204 to be measured is comprised of Bloch surface wave optical chip 208 and miniflow sample cell 209.Sample 210 in the miniflow sample cell is surperficial adjacent with optical chip 208.
The base material of Bloch surface wave optical chip is ZF10 glass, and its refractive index is 1.668, and the structure that forms Bloch surface wave optical chip is the medium thin layer that replaces of 10 high low-refractions of cycle and finishes with one deck dielectric buffer layer.What be close to substrate is the high refractive index medium material thin-layer, the material of high refractive index medium thin layer is titania, its refractive index is 2.3, thickness is 163nm, and the material of low refractive index dielectric thin layer is silicon dioxide, and its refractive index is 1.434, thickness is 391nm, the material of dielectric buffer layer is titania, and its refractive index is 2.3, and thickness is 23nm.Under the p polarized incident light, when miniflow sample 210 was water, when the Bloch surface wave is excited, maximum can produce the Gu Sihanxin displacement of 800 microns nearly.And when the refractive index of miniflow sample changes, the angle position respective change that maximum Gu Sihanxin displacement produces, namely the Gu Sihanxin displacement size under same angle changes.
The adjustable polarizer 202 that adopts in experimental system is liquid crystal spatial modulator (LCM, CRi128D), and detector 205 adopts Position-Sensitive Detector (PSD, Hamamastsu S3979), and the position of output luminous point is detected.Modulate by the output polarisation of light attitude that adopts the 206 pairs of liquid crystal spatial modulators in time varying signal source, make the output polarization state switch between s polarization and p polarization, the Position-Sensitive Detector that therefore obtains is output as the ac modulation signal.
In this example, signal processing system 207 shown in Figure 2 is comprised of PSD signal amplifier (ON-Trac OT-301) and lock-in amplifier (Stanford Research530).The PSD signal amplifier amplifies the output signal of PSD and computing obtains the relevant electric signal 211 in position, and this signal is inputted lock-in amplifier as measured signal, and the output 212 in time varying signal source 206 is inputted as the reference signal of lock-in amplifier.
When carrying out sensing experiment, the sample in the miniflow sample cell is the glycerine water solution (volume by volume concentration is from 0.1%-0.5%) of variable concentrations, and the variations in refractive index of each adjacent sample is poor is 1.17*10
-4RIU.The Gu Sihanxin displacement information that records continuous time as shown in Figure 3.
The detection method of above-mentioned Gu Sihanxin displacement detection system is as follows:
At first, the FP laser instrument produces the arrowband monochromatic light of 980nm, through process optical beam transformation and collimations such as lens combination, the light beam after collimation is incided polaroid, obtains the homogeneous beam with certain polarization state.Use signal generator as time varying signal source driving LCD space light modulator, the output light that makes LCD space light modulator is that polarization state is periodically alternately switched between p and s polarization.
Then polarized light is by using prism-coupled to surperficial for the Bloch surface wave optical chip of p polarized light design as described before, changing incident angle makes light beam excite the Bloch surface wave to produce the Gu Sihanxin displacement under the p polarization state, and this angle is fixed, under this angle, the s polarized light can not produce.Use location sensing detector PSD(S3979) outgoing beam is detected, obtain the modulation signal that the reflection position signalling changes; Will be through the modulation signal access lock-in amplifier of PSD amplifier, the output with signal generator simultaneously accesses lock-in amplifier as the reference signal, can extract the signal of the low noise Gu Sihanxin of comprising displacement information.
It should be noted that at last above embodiment only in order to structure and the technical scheme of Gu Sihanxin displacement measurement method of the present invention and measuring system thereof to be described, be only the preferred embodiment of the present invention, but protection domain of the present invention is not limited to this.Although with reference to embodiment, the present invention is had been described in detail; those of ordinary skill in the art is to be understood that; technical scheme of the present invention is modified or is equal to replacement, do not break away from the spirit and scope of technical solution of the present invention, within it all should be encompassed in protection scope of the present invention.
Claims (10)
1. Yi Zhong Gu Sihanxin displacement sensing measuring method comprises the following steps:
The homogeneous beam that (1) will have certain polarization state incides the optical device to be measured that can produce the Gu Sihanxin displacement through after adjustable polarization control device by optical couping device, then the position of reflection or transmitted light beam is detected;
(2) the adjustable polarization control device in step (1) is driven by time varying signal, makes polarization state temporal evolution and variation repeatedly between at least two kinds of different polarization states by the light beam of this device;
(3) for different polarization states, the optical device in step (1) can produce different Gu Sihanxin displacements under described light beam incident condition;
(4) according in step (2) to the rule of the time varying signal that changes light polarization, measure the position of reflection or transmitted light beam, and by analyze not in the same time reflection or the position of transmitted light beam, obtain the Gu Sihanxin displacement information.
2. measuring method according to claim 1, it is characterized in that, the described change in physical properties that can produce the optical device to be measured of Gu Sihanxin displacement can produce the Gu Sihanxin displacement that correspondingly changes, by analyzing not reflected light position in the same time, obtain Gu Sihanxin displacement and change information thereof in described step (4).
3. according to claim 1-2 described measuring methods, is characterized in that, the output beam of adjustable polarization control device is linearly polarized light, is preferably orthogonal s polarization state and p polarization state.
4. according to claim 1-2 described measuring methods, it is characterized in that, the described optical device that can produce the Gu Sihanxin displacement can be the optical surface wave device that comprises surface plasma wave and Bloch surface wave by exciting, can be by the optical device of excitation wave waveguide mode with generation Gu Sihanxin displacement, can be also to utilize the optical device that can produce the Gu Sihanxin displacement that comprises weak absorbing medium, weak gain media, left hand artificial material structure.
5. Yi Zhong Gu Sihanxin displacement sensing measuring system comprises narrow-band light source, adjustable polarization control device, time varying signal source, optical couping device, the optical device that can produce the Gu Sihanxin displacement, detector, signal processing system.
6. measuring system according to claim 5, it is characterized in that, the described optical device that can produce the Gu Sihanxin displacement can be the optical surface wave device that comprises surface plasma wave and Bloch surface wave by exciting, can be by the optical device of excitation wave waveguide mode with generation Gu Sihanxin displacement, can be also to utilize the optical device that can produce the Gu Sihanxin displacement that comprises weak absorbing medium, weak gain media, left hand artificial material structure.
7. measuring system according to claim 5, is characterized in that, described narrow-band light source can be laser instrument, the light source that also can be comprised of wide spectrum light source and narrow band pass filter.
8. measuring system according to claim 5, is characterized in that, described adjustable Polarization Controller comprises spatial light modulator (SLM), Polarization Controller or light polarization modulator.
9. measuring system according to claim 5, is characterized in that, described detector is the light-beam position detecting device, comprises Position-Sensitive Detector (PSD), bicell or charge coupled cell (CCD).
10. measuring system according to claim 5, is characterized in that, described signal processing system comprises that can record signal to described detector implements computing, amplifying signal amplifier and lock-in amplifier.
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| WO2015089844A1 (en) * | 2013-12-20 | 2015-06-25 | 华为技术有限公司 | Polarizer and polarization modulation system |
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| CN105278186A (en) * | 2015-11-09 | 2016-01-27 | 复旦大学 | Surface evanescent field intensity-tunable composite planar optical waveguide |
| CN106018289A (en) * | 2016-07-01 | 2016-10-12 | 西北工业大学 | Method for measuring carrier concentration of graphene by virtue of Goos-Hanchen shift |
| CN106247953A (en) * | 2016-09-20 | 2016-12-21 | 中北大学 | A kind of measurement phase place and the method and device of Gu Sihanxin displacement simultaneously |
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| WO2015089844A1 (en) * | 2013-12-20 | 2015-06-25 | 华为技术有限公司 | Polarizer and polarization modulation system |
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| CN105158208B (en) * | 2015-06-23 | 2018-03-02 | 中北大学 | A kind of Gu Sihanxin displacements SPR high sensitivity medium refraction index detection methods |
| CN105158208A (en) * | 2015-06-23 | 2015-12-16 | 中北大学 | Detection method for refractive index of SPR high-sensitivity medium of Goos-Haenchen shift |
| CN105278186A (en) * | 2015-11-09 | 2016-01-27 | 复旦大学 | Surface evanescent field intensity-tunable composite planar optical waveguide |
| CN106018289A (en) * | 2016-07-01 | 2016-10-12 | 西北工业大学 | Method for measuring carrier concentration of graphene by virtue of Goos-Hanchen shift |
| CN106247953A (en) * | 2016-09-20 | 2016-12-21 | 中北大学 | A kind of measurement phase place and the method and device of Gu Sihanxin displacement simultaneously |
| CN106247953B (en) * | 2016-09-20 | 2018-11-02 | 中北大学 | Method and device that is a kind of while measuring phase and Gu Si-Han Xin displacements |
| CN109323661A (en) * | 2018-12-06 | 2019-02-12 | 湖北科技学院 | Based on the highly sensitive angle displacement sensor of light beam space Gu Si-Hansen displacement |
| CN109323661B (en) * | 2018-12-06 | 2020-06-09 | 湖北科技学院 | High-sensitivity angular displacement sensor based on beam space Gus-Hansen displacement |
| CN111442729A (en) * | 2020-04-16 | 2020-07-24 | 中国科学院上海微***与信息技术研究所 | Displacement sensing device based on bloch surface wave one-way coupling effect |
| CN111442729B (en) * | 2020-04-16 | 2022-04-05 | 中国科学院上海微***与信息技术研究所 | Displacement sensing device based on bloch surface wave one-way coupling effect |
| CN112763421A (en) * | 2021-01-18 | 2021-05-07 | 太原理工大学 | Graphene GH displacement and photothermal effect-based solution detection device and method |
| CN112763421B (en) * | 2021-01-18 | 2021-09-28 | 太原理工大学 | Graphene GH displacement and photothermal effect-based solution detection device and method |
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Inventor after: Wan Yuhang Inventor after: Zheng Zheng Inventor after: He Linfang Inventor after: Liu Jiansheng Inventor before: Zheng Zheng Inventor before: He Linfang Inventor before: Wan Yuhang Inventor before: Liu Jiansheng |
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