CN103115639B - A kind of reference positioner - Google Patents
A kind of reference positioner Download PDFInfo
- Publication number
- CN103115639B CN103115639B CN201310028676.7A CN201310028676A CN103115639B CN 103115639 B CN103115639 B CN 103115639B CN 201310028676 A CN201310028676 A CN 201310028676A CN 103115639 B CN103115639 B CN 103115639B
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- Prior art keywords
- dish
- magnet
- reference edge
- test
- arc
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- A Measuring Device Byusing Mechanical Method (AREA)
Abstract
A kind of reference positioner, comprises the dish A and the dish B that is located by connecting that is located by connecting; Be located by connecting dish A and be located by connecting dish B between angle be 90 degree; The described dish A lower surface that is located by connecting is installed with magnet A; The described dish B lower surface that is located by connecting is installed with magnet B; Described be located by connecting dish A and be located by connecting dish B between connected by arc connecting bridge; The described dish A that is located by connecting is provided with reference edge A; The described dish B that is located by connecting is provided with reference edge B; Angle between described reference edge A and reference edge B is 90 degree.The present invention can carry out the location in reference point and whole test orientation; Can be peripheral test device and positioning datum and coupling arrangement are provided; Can quick position be carried out, improve test job efficiency; Cost is low, and structure is simple, easy to carry.
Description
Technical field
The present invention relates to a kind of steady arm, especially relate to a kind of with reference edge static fixing, can the reference positioner of affixed peripheral test system or device; It can determine this reference plane build-in test summit and test orientation according to test zone two reference edge, and can be connected and fixed space testing jig or outer testing system, for peripheral test system provides the steady arm of benchmark.
Background technology
At present, the proving installation in laboratory is brace foundation substantially with tripod, and proving installation that is complicated or system also has and controls polarization or the variation partly such as highly.But test zone reference point initial position put in problem, major part is all the position being adjusted testing jig or whole test platform by the mode of moved by hand, the initialized benchmark of whole test macro is made to be difficult to ensure, and then a series of test data test uncertainty factor that just existence one is very important.
Summary of the invention
The technical problem to be solved in the present invention is to provide a kind of reference positioner; This reference positioner solves some problem following: 1) determine reference edge, 2) determine reference point, 3) determine measurement direction, 4) fix with reference field relative position, 5) can docking be coordinated with peripheral test device; The problem of testing jig reference position precision can be solved, can according to determine the datum line in region determine this reference plane build-in test summit and test orientation; Space testing jig or outer testing system can be connected and fixed, for peripheral test system provides reference for installation; Improve the positioning precision of integrated testability device, thus improve overall measuring accuracy.
For solving the problems of the technologies described above, the present invention adopts following technical scheme:
A kind of reference positioner, comprises the dish A and the dish B that is located by connecting that is located by connecting;
The described dish A that is located by connecting is provided with reference edge A; The described dish B that is located by connecting is provided with reference edge B; Angle between described reference edge A and reference edge B is 90 degree;
The dish A and the dish B that is located by connecting that is located by connecting locates by two reference edges, can carry out coordinating with external test arrangements and dock;
The described dish A lower surface that is located by connecting is installed with magnet A; The described dish B lower surface that is located by connecting is installed with magnet B; Magnet A and magnet B play the role of positioning, and by magnet A and magnet B, steady arm and ground are pulled together, no longer include relative movement relation with benchmark;
The described dish A and being located by connecting between dish B of being located by connecting is connected by arc connecting bridge, and the arc space region that this arc connecting bridge is formed is probe placement district on peripheral test device; For providing region and the particular location of placement for the probe on peripheral test device.
The present invention has following beneficial effect:
1. the invention solves the problem that test zone reference point initial position puts precision: the location that reference point and whole test orientation can be carried out by reference edge, fix whole steady arm and reference field relative position by two magnet; Terminal pad can be peripheral test device and provides positioning datum and coupling arrangement;
2. can carry out quick position, improve the efficiency of test job;
3. cost is low, and structure is simple, easy to carry.
Accompanying drawing explanation
Below in conjunction with accompanying drawing, the specific embodiment of the present invention is described in further detail
Fig. 1 is structural representation of the present invention;
Fig. 2 is the structural representation that the present invention locates a test point;
Fig. 3 is of the present invention and carries out being connected design sketch between peripheral test device.
Embodiment
Embodiment 1
Shown in Fig. 1-3, a kind of reference positioner, comprises the dish A1 and the dish B2 that is located by connecting that is located by connecting;
The described dish A1 that is located by connecting is provided with reference edge A11; The described dish B21 that is located by connecting is provided with reference edge B21; Angle between described reference edge A11 and reference edge B21 is 90 degree; The dish A1 and the dish B2 that is located by connecting that is located by connecting locates by two reference edges 11,21, can carry out coordinating with external test arrangements 4 and dock
The described dish A1 lower surface that is located by connecting is installed with magnet A 12; The described dish B2 lower surface that is located by connecting is installed with magnet B 22; Magnet A 12 and magnet B 22 play the role of positioning, and by magnet A 12 and magnet B 22, steady arm and ground are fixed together, no longer include relative movement relation with benchmark;
Described be located by connecting dish A1 and be located by connecting dish B2 between connected by arc connecting bridge 3, this arc connecting bridge 3 formed arc space region be probe placement district 5 on peripheral test device; For providing region and the particular location of placement for external test arrangements 4.
Reference positioner principle of work: align with the reference edge 11,21 coiled that is located by connecting respectively in arbitrary neighborhood two benchmark sidelines of test zone, after alignment, the relative position on two reference edges 11,21 and summit 6 is just determined, in steady arm, namely find one of them summit 6 of test zone.This summit 6 is a probe test point in the external test arrangements 4 in test test zone.After determining the position of steady arm by two reference edges 11,21, utilize magnet A 12 and magnet B 22 that whole steady arm is fixed on reference plane place, play the effect of location; Again by magnet A 12 and magnet B 22 are departed from from reference plane, can move or dismantle steady arm.Whole device stiff end can be made stressed by symmetrically arranged magnet A 12 and magnet B 22 evenly, whole device is more stable; Second effect of dish 1,2 of being located by connecting is connected and fixed with peripheral test system or device 4, namely the dish 1,2 that is now located by connecting plays the function of origin reference location, carry out coordinating with peripheral test device 4 by the dish 1,2 that is located by connecting and dock, thus the test of other test zones of space can be carried out; Fig. 3 is the example of wherein a kind of form, and carries out being connected design sketch between peripheral test device 4.
The word in description orientation adopted herein " on ", D score, "left", "right" etc. are all convenience in order to illustrate based on the orientation in accompanying drawing shown in drawing, in actual device, these orientation may be different due to the disposing way of device.
Obviously, the above embodiment of the present invention is only for example of the present invention is clearly described, and is not the restriction to embodiments of the present invention.For those of ordinary skill in the field, can also make other changes in different forms on the basis of the above description.Here cannot give exhaustive to all embodiments.Every belong to technical scheme of the present invention the apparent change of extending out or variation be still in the row of protection scope of the present invention.
Claims (1)
1. a reference positioner, is characterized in that: comprise be located by connecting dish A (1) and dish B (2) that is located by connecting; Be located by connecting to coil A (1) and be located by connecting and coil B (2) by two reference edges (11,21) location, can carry out coordinating with external test arrangements (4) and dock;
Described dish A (1) lower surface that is located by connecting is installed with magnet A (12); Described dish B (2) lower surface that is located by connecting is installed with magnet B (22); By magnet A (12) and magnet B (22), steady arm and ground are pulled together, no longer include relative movement relation with benchmark;
Described being located by connecting is coiled A (1) and is located by connecting between dish B (2) by arc connecting bridge (3) connection; The arc space region that this arc connecting bridge (3) is formed is probe placement district (5) on peripheral test device; For providing region and the particular location of placement for external test arrangements (4);
Described dish A (1) that is located by connecting is provided with reference edge A (11); The described dish B that is located by connecting is provided with reference edge B (21); Angle between described reference edge A (11) and reference edge B (21) is 90 degree.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310028676.7A CN103115639B (en) | 2013-01-25 | 2013-01-25 | A kind of reference positioner |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310028676.7A CN103115639B (en) | 2013-01-25 | 2013-01-25 | A kind of reference positioner |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN103115639A CN103115639A (en) | 2013-05-22 |
| CN103115639B true CN103115639B (en) | 2015-08-12 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201310028676.7A Expired - Fee Related CN103115639B (en) | 2013-01-25 | 2013-01-25 | A kind of reference positioner |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN103115639B (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108571939A (en) * | 2018-04-24 | 2018-09-25 | 宁波江丰电子材料股份有限公司 | Positioning device and three-coordinates measuring machine |
Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2372355Y (en) * | 1999-06-25 | 2000-04-05 | 郏保琪 | Rail displacement viewer |
| EP1721783A1 (en) * | 2005-05-12 | 2006-11-15 | Silicon Pyramid Electron Ltd. | Suction fixture |
| CN1922645A (en) * | 2003-12-31 | 2007-02-28 | 塞格·乔斯·多·卡尔莫 | Advertising panel support device |
| CN201751666U (en) * | 2010-06-09 | 2011-02-23 | 蔡文峰 | Bracing arm support provided with multiple sucking disc type foot rests |
| CN201992293U (en) * | 2010-12-09 | 2011-09-28 | 武昌船舶重工有限责任公司 | Universal measurement apparatus positioning device |
| CN102829296A (en) * | 2012-08-27 | 2012-12-19 | 北京无线电计量测试研究所 | Supporting device for correcting uniformity of transient electromagnetic field |
| CN102841263A (en) * | 2012-08-27 | 2012-12-26 | 北京无线电计量测试研究所 | Device for calibrating uniformity of transient electromagnetic field |
| CN203132568U (en) * | 2013-01-25 | 2013-08-14 | 北京无线电计量测试研究所 | A reference locator |
-
2013
- 2013-01-25 CN CN201310028676.7A patent/CN103115639B/en not_active Expired - Fee Related
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2372355Y (en) * | 1999-06-25 | 2000-04-05 | 郏保琪 | Rail displacement viewer |
| CN1922645A (en) * | 2003-12-31 | 2007-02-28 | 塞格·乔斯·多·卡尔莫 | Advertising panel support device |
| EP1721783A1 (en) * | 2005-05-12 | 2006-11-15 | Silicon Pyramid Electron Ltd. | Suction fixture |
| CN201751666U (en) * | 2010-06-09 | 2011-02-23 | 蔡文峰 | Bracing arm support provided with multiple sucking disc type foot rests |
| CN201992293U (en) * | 2010-12-09 | 2011-09-28 | 武昌船舶重工有限责任公司 | Universal measurement apparatus positioning device |
| CN102829296A (en) * | 2012-08-27 | 2012-12-19 | 北京无线电计量测试研究所 | Supporting device for correcting uniformity of transient electromagnetic field |
| CN102841263A (en) * | 2012-08-27 | 2012-12-26 | 北京无线电计量测试研究所 | Device for calibrating uniformity of transient electromagnetic field |
| CN203132568U (en) * | 2013-01-25 | 2013-08-14 | 北京无线电计量测试研究所 | A reference locator |
Also Published As
| Publication number | Publication date |
|---|---|
| CN103115639A (en) | 2013-05-22 |
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