CN103091331B - System and method for visual inspection on burrs and stain defects of radio frequency identification (RFID) antennae - Google Patents
System and method for visual inspection on burrs and stain defects of radio frequency identification (RFID) antennae Download PDFInfo
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Abstract
The invention discloses a method for visual inspection on burrs and stain defects of radio frequency identification (RFID) antennae. The method comprises the following steps of: calibrating a camera device, and then shooting images of each RFID antenna to be inspected through the cooperation of the camera device and a strip-type or backlight source; acquiring the shot images of the antennae, and matching the acquired shot images with images of an antenna template to obtain pre-alignment information; taking off corresponding burrs and stain inspection areas from the images of the antennae according to regions of interest (ROI) on the images of the antenna template and the pre-alignment information; respectively carrying out binary processing on the inspection areas taken off from the images and the ROI, and then carrying out image subtraction; and carrying out blob analysis on residual images subjected to the image subtraction, and determining results of the burrs and the stain defects. The invention also discloses a system for carrying out the corresponding visual inspection. Through the method and the system, the inspection process of the burr/stain quality of the RFID antennae can be carried out efficiently and accurately, and the positions of the defects can be accurately positioned, so that the method and the system are particularly suitable for industrial processing and manufacturing processes of the RFID antennae.
Description
Technical field
The invention belongs to RFID and manufacture field, more specifically, relate to a kind of vision detection system and the method for RFID antenna burr and smudge defect.
Background technology
Video identification also i.e. RFID technique, is also called electronic tag, is by radio signals identification specific objective and reads and writes the communication technology of related data.Its element comprises label, reader and antenna, and wherein label is made up of coupling element and chip, and the corresponding unique electronic code of each label is also attached on object for indicating destination object; Reader is used for read-write or write label information, and antenna is used for transmitting radiofrequency signal between label and reader.Because RFID technique need not set up machinery or optical contact between recognition system and specific objective, and possess the advantages such as high speed identification, anti-adverse environment and strong security, therefore in logistics, warehousing management, medical treatment and identification, food processing, and the production data of industrial manufacturing process is monitored in real time and multiple field such as quality tracing obtains a wide range of applications.
In RFID device; antenna is as main Energy Transfer functional layer; it is the electronic circuit designed according to the function required by radio-frequency (RF) identification; conductive silver paste or conductive carbon paste are arranged on PVC, PC or PET antenna substrate by the mode such as etching, thermoprint or electrically conductive ink printing by it, and encapsulate with surface layer, protective seam and bottom etc. and form.Can the crudy of the wiring pattern of antenna directly has influence between label and reader farthest transmission of signal, even can have influence on the normal operation of RFID device.Common antenna open defect such as comprise live width excessive or too small, there is pattern broken string/adhesion phenomenon, or there is burr and smudge defect etc.Wherein, burr and stain affect one very common in the open defect of antenna quality.So-called burr, refer to due to manufacturing process reasons such as etching, printings, what in antenna plane, the one-sided or both sides of lines occurred is different from the raised or sunken of layout, this phenomenon may have influence on the electric property of antenna, quality factor (Q) or resonant tag frequency (ω), even causes short circuit or the open circuit of antenna traces; So-called stain, refers to outside the normal antenna pattern of removing, the unnecessary pattern that substrate presents.The concrete area of burr and stain or deviation threshold can be determined according to the kind according to RFID label tag, purposes, size and complexity.
At present, high-precision antenna pattern checkout equipment all belongs to blank at home and abroad, in prior art, major part is all perform command detection by artificial (human eye is directly observed antenna substrate and printed situation) or semi-artificial (human eye prints situation by video camera screen viewing antenna substrate), so not only efficiency is low, cost is high, and the accuracy of test result and consistance are difficult to be guaranteed, and strongly limit the development of RFID antenna label manufacturing business.In recent years along with more and more higher to the requirement detecting robotization, also occurred directly detecting antenna performance and provided the detection scheme of the antenna quality of test result, namely whether direct card reader to measure antenna qualified, and obvious this method is for not pasting the antenna of chip and inapplicable.In addition, impedance auto-match technique is utilized to carry out the automatic detection scheme tested in addition, as the detection scheme etc. mentioned in microblogging journal volume August the 24th in 2008 the 4th interim " design of a RFID label antenna testing jig " literary composition, these detection schemes detect based on antenna electrical performance, can only detect that whether antenna is qualified, the detection being applicable to streamlined is produced, but can not explicitly point out Problems existing in manufacturing process.Especially, for the open defect of burr and stain and so on, in prior art, lack effective detection means, and be difficult to the particular location accurately known residing for defect.Correspondingly, the open defect detection mode existed in the related art RFID antenna comprises burr and smudge defect makes the technical need improved further.
Summary of the invention
For above defect or the technical need of prior art, the object of the present invention is to provide vision detection system and the method for a kind of RFID antenna burr and smudge defect, its can high-level efficiency, perform the burr/stain quality testing process of RFID antenna in high accuracy, and the particular location can accurately located residing for burr/smudge defect, be convenient to Real-time Feedback and quality control thus, be applicable to the processing and manufacturing process of industrialization RFID simultaneously.
According to one aspect of the present invention, provide the vision detection system of a kind of RFID antenna burr and smudge defect, this vision detection system comprise camera head, Three Degree Of Freedom moves module, strip source, back light and vision inspection apparatus, it is characterized in that:
Described camera head is arranged on the Three Degree Of Freedom that can move around along X-axis, Y-axis and Z axis three directions and moves on module, and is in the top of RFID antenna to be detected, for taking complete image respectively to each RFID antenna within sweep of the eye at it;
Described strip source is symmetricly set on the both sides of camera head, described back light is arranged on the below of RFID antenna to be detected, thus according to the difference of RFID antenna substrate and selectively unlocking matching with camera head, to perform, the shooting of antenna is operated;
Described vision inspection apparatus comprises demarcates unit, image acquisition unit, image matching unit, image segmentation unit, image operation unit and connected domain analysis unit, wherein demarcate unit to be used for setting up pixel coordinate to the antenna diagram picture captured by camera head, and pixel coordinate is converted to the coordinate figure under same world coordinate system; Image acquisition unit is for gathering the antenna diagram picture captured by camera head; Image matching unit is used for gathered antenna diagram picture to mate with antenna template image, and obtains the pre-align information comprising the anglec of rotation, central point displacement; Image segmentation unit for according to the area-of-interest that antenna template image is preset, and combines the pre-align information that obtains, takes off the burr corresponding with area-of-interest and dust detection region from antenna diagram picture; Image operation unit, for performing binary conversion treatment respectively to the area-of-interest that antenna template image is preset and the burr that takes of image segmentation unit and dust detection region, then performs image subtraction process to both; Connected domain analysis unit for extracting the residual image after image subtraction process, and performs blob analysis operation to it, obtains the testing result about burr and smudge defect thus.
As further preferably, described vision inspection apparatus also comprises display unit, for showing centre in burr and smudge defect testing process and final detection result.
As further preferably, described camera head is industrial CCD camera.
According to another aspect of the present invention, additionally provide corresponding detection method, it is characterized in that, this detection method comprises the following steps:
A (), before employing camera head absorbs RFID antenna image to be detected, performs the demarcating steps of camera head;
B () operation Three Degree Of Freedom moves module and arrives desired location to make camera head, and by itself and coordinating between strip source or back light, take complete image respectively to each RFID antenna to be detected;
Antenna diagram picture captured by (c) collection, and each antenna diagram picture collected is matched with antenna template image respectively, obtain the pre-align information comprising the anglec of rotation, central point displacement thus;
D () is according to one or more area-of-interests that antenna template image is preset, and the pre-align information that integrating step (c) obtains adjusts antenna diagram picture, then from antenna diagram picture, take the burr corresponding with area-of-interest and dust detection region;
Area-of-interest on e burr that () takes step (d) and dust detection region and antenna template image performs binary conversion treatment respectively, then performs image subtraction process to both;
F () carries out blob analysis to the residual image obtained after the process of step (e) image subtraction: after blob analyzes, do not extract connected domain region, or each connected domain region area extracted and the total area thereof are all within tolerance threshold, then judge that this detected antenna does not exist burr smudge defect; And the connected domain region of extracting exists the situation that single region area or the total area exceed tolerance threshold after blob analyzes, then judge that being detected antenna exists burr and smudge defect.
As further preferably, in step (f), according to the real area size in single connected domain region, can judge that this region belongs to burr or smudge defect further.
As further preferably, in step (f), when it is determined that the presence of burr or smudge defect, the central point pixel coordinate of locating this connected domain region records its area information simultaneously, determines defective locations and the type thereof of detected antenna thus.
As further preferably, when the connected domain region total area extracted after blob analyzes exceeds tolerance threshold, the central point pixel coordinates of locating all connected domain regions gets its mean value simultaneously, and using the defect present position of this mean value as detected antenna.
In general, according to the open defect detection system for RFID antenna of the present invention and method thereof compared with prior art, following technological merit is mainly possessed:
1, by adopting vision-based detection mode, can stablize, detect exactly burr or the smudge defect of various dissimilar complex antenna pattern, and accuracy and the consistance of testing result can be ensured while improving detection efficiency;
2, different set and adjustment can be carried out according to detection demand to burr and stain tolerance threshold, be convenient to the requirement of satisfied different production standard, be applicable to industrialized actual manufacture process;
3, compact, the convenient operation of whole detection system architecture, can apply in a flexible way in different substrate type RFID Fields detection and obtain high-resolution detected image; In addition, can also while finding out burr/smudge defect, the particular location residing for accurate location defect and type thereof, be convenient to perform respective quality controlling and adjustment in subsequent manufacturing processes thus.
Accompanying drawing explanation
Fig. 1 is according to the general structure schematic diagram of the present invention for the vision detection system of RFID antenna burr and smudge defect;
Fig. 2 is the process chart according to the visible detection method for RFID antenna burr and smudge defect of the present invention;
In all of the figs, identical Reference numeral is used for representing identical element or structure, wherein:
1-camera head 2-Three Degree Of Freedom moves module 3-strip source 4-back light 5-vision inspection apparatus 6-frame 7-antenna 501-to be detected and demarcates unit 502-image acquisition units 503-image matching unit 504-image segmentation unit 505-image operation unit 506-connected domain analysis unit 507-display unit
Embodiment
In order to make object of the present invention, technical scheme and advantage clearly understand, below in conjunction with drawings and Examples, the present invention is further elaborated.Should be appreciated that specific embodiment described herein only in order to explain the present invention, be not intended to limit the present invention.
Fig. 1 is according to the general structure schematic diagram of the present invention for the vision detection system of RFID antenna burr and smudge defect.As shown in FIG., according to of the present invention for RFID antenna burr and smudge defect vision detection system mainly comprises camera head 1, Three Degree Of Freedom moves module 2, strip source 3, back light 4 and vision inspection apparatus 5.Camera head 1 is for example the form of industrial camera, it is arranged on the Three Degree Of Freedom being arranged at frame 6 and moves on the module 2 and top manufacturing RFID antenna be in as object to be detected, can move freely on X, Y and Z-direction thus, and within sweep of the eye complete image be taken respectively to each RFID antenna to be detected at it.Necessary illumination when taking image is provided in order to give camera head 1, (also can be the left and right sides in the both sides, front and back of camera head 1, it is determined from moving the installation form on module in Three Degree Of Freedom according to camera head) be symmetrically installed with strip source 3, and can move with camera head.In addition, be also provided with back light 4 in the below of RFID antenna, this mainly considers that antenna substrate may be made up of unlike material: when substrate is transparency carrier, and back light 4 can be utilized to be thrown light on; And when substrate is opaque or poor transparency time, then can use strip source 3 instead and be thrown light on.
When camera head 1 by with the coordinating of strip source 3 or back light 4, after obtaining its complete image within the vision respectively to each RFID antenna to be detected, camera head 1 will take image transmitting to vision inspection apparatus 5 by data line or wireless mode.The form of this vision inspection apparatus 5 for example in computing machine, and comprise demarcation unit 501, image acquisition units 502, image matching unit 503, image separation unit 504, image operation unit 505 and connected domain analysis unit 506.Wherein, demarcate unit 501 and set up pixel coordinate for the image will taken camera head 1, and pixel coordinate is converted to the coordinate figure under same world coordinate system; Image acquisition units 502 is for gathering the image captured by camera head 1; Images match detecting unit 503 mates with antenna template image (standard antenna image) for each antenna diagram picture image acquisition units 502 gathered, and obtains the pre-align information comprising the anglec of rotation, central point displacement; Image segmentation unit 504 for according on antenna template image preset area-of-interest (ROI, Region Of Interest), and combine the pre-align information obtained, from antenna diagram picture, take off the burr corresponding with area-of-interest and dust detection region; Image operation unit 505, for performing binary conversion treatment respectively to the area-of-interest that antenna template image is preset and the burr that takes of image segmentation unit and dust detection region, then performs image subtraction operation to both; Connected domain analysis unit 506 for extracting the residual image after image subtraction process, and performs blob analysis operation to it, extracts burr and stain characteristic thus and the testing result obtained about burr and smudge defect.
In addition, for the ease of practical operation and control, vision inspection apparatus 5 can also comprise display unit 507, and this display unit 507, and can the concrete detection of code of teaching process personnel and content for showing centre in burr and smudge defect testing process and final detection result.
Below, will specifically describe according to burr of the present invention and dust detection technological process.As shown in Figure 2, comprise the following steps according to the visible detection method of RFID antenna burr of the present invention and stain:
First, before taking its RFID antenna within the vision by camera head 1, perform the pre-demarcating steps of camera head.Pre-demarcating steps specifically comprises the image will taken for camera head and sets up pixel coordinate, and converts this pixel coordinate to coordinate figure under same world coordinate system.In addition, if change to some extent compared with parameter when running parameter and upper task, also should re-execute pre-demarcating steps, correct and distort and guarantee to obtain correct test result.
Then, move module 2 make camera head 1 arrive desired locations by operation Three Degree Of Freedom, and by with strip source 3 or coordinating of back light 4 its complete image within the vision is taken to each RFID antenna to be detected.Captured general image is transferred to vision inspection apparatus 5 by camera head 1, and is gathered by image acquisition units 502.
Then, for each antenna diagram picture that image acquisition unit 502 gathers, each antenna diagram picture collected is performed image matching operations with antenna template image by image matching unit 503 respectively, obtains the pre-align information comprising the anglec of rotation, central point displacement etc. thus.
After acquisition image pre-align information, image segmentation unit 504 can according to one or more area-of-interests that antenna template image is preset, and the pre-align information that combining image matching unit 503 obtains, after corresponding rotation and skew adjustment are carried out to antenna diagram picture, from gathered antenna diagram picture, take off the burr corresponding with area-of-interest and dust detection region.Specifically, suppose in images match, known image rotation angle θ, and play displacement x, the y of central point relative to standard masterplate central point, and top left co-ordinate is (a, b) on known template image, peak width and be highly respectively w, the region of h is ROI region, then by image rotation-θ degree to be detected, and take off top left co-ordinate for (a-x, b-y), peak width and be highly respectively w, the rectangular area of h is region to be detected.
Then, need the ROI region on taken off burr and dust detection region and antenna template image to make image calculation process.Early stage first can carry out some pre-service to them, as filtering operation etc., then performs binary conversion treatment respectively.Then, image subtraction process is done to both, obtain thus and reflect that antenna diagram picture to be detected and antenna template image distinguish the residual image at place.
Finally, connected domain analysis unit 506 extracts the residual image after image subtraction process, and performs blob analysis operation to it, according to the connected domain quantity be checked through and connected domain area, determines whether there is burr and smudge defect thus and provides testing result.As a rule, if the blob region area a extracted
iin tolerance, (usual tolerance needs to determine, if screening conditions are a according to detection degree of accuracy and detection demand
i≤ a
max, a
maxby each blob region patient maximum area in the detection) and the blob region total area in tolerance, (usual tolerance needs to determine, if screening conditions are ∑ a according to detection degree of accuracy and detection demand
i≤ A
max, A
maxby all with blob region area summation patient maximum area in the detection), then think this antenna surveyed area in there is not burr or smudge defect.If the area a in certain blob region detected
iexceed tolerance (a
i>a
max), then locate this blob regional center point pixel coordinate value (m, n), and record its area information a
i, by this centre coordinate value information (m, n) and area information, it is a that certain coordinate place of known former image to be detected exists area
iburr or smudge defect; In addition, if blob region total area ∑ a
iexceed tolerance (∑ a
i>A
max), think that it exists burr or smudge defect equally, and the center point coordinate mean value getting all blob regions orientates the position that defect exists as.
Those skilled in the art will readily understand; the foregoing is only preferred embodiment of the present invention; not in order to limit the present invention, all any amendments done within the spirit and principles in the present invention, equivalent replacement and improvement etc., all should be included within protection scope of the present invention.
Claims (1)
1. one kind for performing the method for vision-based detection to RFID antenna burr and smudge defect, wherein so-called burr, what to refer in antenna plane due to etching or print production manufacturing process that or both sides one-sided at its lines occur is different from the raised or sunken of layout, so-called stain, refer to the unnecessary pattern that the external substrate of the normal antenna pattern of removing presents, it is characterized in that, the method comprises the following steps:
A () is before employing camera head absorbs RFID antenna image to be detected, perform the demarcating steps of camera head, in this operation, the image first will taken for camera head sets up pixel coordinate, then converts this pixel coordinate to coordinate figure under same world coordinate system;
B () operation Three Degree Of Freedom moves module and arrives to make camera head the desired location be positioned at above RFID antenna to be detected, and by this camera head and coordinating between the strip source being symmetricly set on its both sides or the back light being arranged on below RFID antenna to be detected, complete image is taken respectively to each RFID antenna to be detected;
Antenna diagram picture captured by (c) collection, and each antenna diagram picture collected is matched with antenna template image respectively, obtain the pre-align information comprising the anglec of rotation, central point displacement thus;
D () is according to one or more area-of-interests that antenna template image is preset, and the pre-align information that integrating step (c) obtains adjusts antenna diagram picture, from antenna diagram picture, then take burr and dust detection region that and shape corresponding with area-of-interest is rectangle;
Area-of-interest on e burr that () takes step (d) and dust detection region and antenna template image performs binary conversion treatment respectively, then performs image subtraction process to both;
F () carries out blob analysis to the residual image obtained after the process of step (e) image subtraction: wherein, as each blob region real area a extracted
iall meet screening conditions a
i≤ a
max, a
maxby each blob region patient maximum area in the detection, and the total area in all blob regions meets screening conditions ∑ a
i≤ A
max, A
maxby all blob region area summations in the detection patient maximum area time, there is not burr or smudge defect in the surveyed area judging this antenna; As each blob region real area a extracted
iexceeding tolerance is also a
i>a
maxtime, burr or smudge defect is there is in the surveyed area judging this antenna, and the central point pixel coordinate value continuing this blob region, location records its real area information simultaneously, judge that detected defect existing for antenna belongs to burr type or pollution type thus, learn the concrete coordinate position residing for this defect simultaneously; In addition, as the total area ∑ a in all blob regions of extracting
iexceeding tolerance is also ∑ a
i>A
maxtime, there is burr or smudge defect in the same surveyed area judging this antenna, locate the central point pixel coordinate in all blob regions and get its mean value, then using the defect present position of this mean value as detected antenna.
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| CN110987959A (en) * | 2019-12-16 | 2020-04-10 | 广州量子激光智能装备有限公司 | Online burr detection method |
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| CN113888450A (en) | 2020-07-02 | 2022-01-04 | 中强光电股份有限公司 | Image segmentation method and electronic device |
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| CN113298775B (en) * | 2021-05-21 | 2023-01-24 | 佛山职业技术学院 | Self-priming pump double-sided metal impeller appearance defect detection method, system and medium |
| CN114494122A (en) * | 2021-12-20 | 2022-05-13 | 苏州镁伽科技有限公司 | Target object detection method and device, storage medium and electronic equipment |
| CN115690219A (en) * | 2023-01-03 | 2023-02-03 | 山东矩阵软件工程股份有限公司 | Method and system for detecting three-dimensional information of running train in complex environment |
| CN115861782B (en) * | 2023-02-21 | 2023-06-13 | 济南邦德激光股份有限公司 | Visual-based residue recognition and typesetting system |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2004163113A (en) * | 2002-11-08 | 2004-06-10 | Ngk Spark Plug Co Ltd | Visual examination device of component for electronic circuit |
| WO2008120474A1 (en) * | 2007-04-03 | 2008-10-09 | Tac Kasei Co., Ltd. | Production method and inspection method of continuum of rfid adhesive label |
| CN102706887A (en) * | 2012-05-18 | 2012-10-03 | 华中科技大学 | RFID (radio frequency identification device) antenna detection device and application thereof |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006277233A (en) * | 2005-03-29 | 2006-10-12 | Fujitsu Ltd | Tag testing device, tag testing method, and tag testing program |
-
2013
- 2013-01-11 CN CN201310011252.XA patent/CN103091331B/en active Active
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2004163113A (en) * | 2002-11-08 | 2004-06-10 | Ngk Spark Plug Co Ltd | Visual examination device of component for electronic circuit |
| WO2008120474A1 (en) * | 2007-04-03 | 2008-10-09 | Tac Kasei Co., Ltd. | Production method and inspection method of continuum of rfid adhesive label |
| CN102706887A (en) * | 2012-05-18 | 2012-10-03 | 华中科技大学 | RFID (radio frequency identification device) antenna detection device and application thereof |
Non-Patent Citations (2)
| Title |
|---|
| 基于视觉技术的WireBonding中焊点质量的自动检测方法;张先青等;《计算机工程与应用》;20040630(第17期);第203页左栏第2段到第204页右栏第1段 * |
| 张洵颖等.基于Blob分析的芯片管脚检测***.《兰州大学学报(自然科学版)》.2008,第44卷 * |
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