CN103074602A - Reaction chamber of chemical vapor deposition apparatus - Google Patents

Reaction chamber of chemical vapor deposition apparatus Download PDF

Info

Publication number
CN103074602A
CN103074602A CN2012100194243A CN201210019424A CN103074602A CN 103074602 A CN103074602 A CN 103074602A CN 2012100194243 A CN2012100194243 A CN 2012100194243A CN 201210019424 A CN201210019424 A CN 201210019424A CN 103074602 A CN103074602 A CN 103074602A
Authority
CN
China
Prior art keywords
substrate
spray header
pedestal
reaction chamber
chemical vapor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN2012100194243A
Other languages
Chinese (zh)
Inventor
梁秉文
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
GUANGDA PHOTOELECTRIC EQUIPMENT TECHNOLOGY (JIAXING) CO LTD
Original Assignee
GUANGDA PHOTOELECTRIC EQUIPMENT TECHNOLOGY (JIAXING) CO LTD
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by GUANGDA PHOTOELECTRIC EQUIPMENT TECHNOLOGY (JIAXING) CO LTD filed Critical GUANGDA PHOTOELECTRIC EQUIPMENT TECHNOLOGY (JIAXING) CO LTD
Priority to CN2012100194243A priority Critical patent/CN103074602A/en
Publication of CN103074602A publication Critical patent/CN103074602A/en
Pending legal-status Critical Current

Links

Images

Abstract

The embodiment of the invention discloses a reaction chamber of a chemical vapor deposition apparatus. The reaction chamber comprises a pedestal used for receiving substrates, and at least two spray heads arranged opposite to the pedestal. The spray heads are used for providing reaction gas for the substrates. At least one substrate can be placed below each spray head. With the apparatus provided by the invention, problems such as processing difficulty and high cost of large-size spray head in the reaction chamber are solved. Compared with a reaction chamber with a single spray head, two or more spray heads are arranged in the reaction chamber provided by the invention, such that reaction gas distribution uniformity on the substrates can be improved, and the uniformity of formed epitaxial layer is improved.

Description

The reaction chamber of chemical vapor depsotition equipment
Technical field
The present invention relates to chemical vapour deposition (CVD) technical field, particularly the reaction chamber of chemical vapor depsotition equipment.
Background technology
MOCVD (Metal-Organic Chemical Vapor Deposition) is a kind of Novel air phase epitaxy depositing operation that grows up on the basis of vapor phase epitaxial growth (VPE).It is with the source material as the crystal growth such as the hydride of the organic compound of III family, II family element and V, VI family element, carry out depositing operation in the pyrolysis mode at pedestal, the thin layer monocrystal material of grow various III-V family, II-VI compound semiconductor and their multivariate solid solution.
The below describes the principle of existing depositing operation.Particularly, take MOCVD as example, please refer to the structural representation of existing deposition apparatus shown in Figure 1.
Be formed with the spray header 11 and the pedestal 12 that are oppositely arranged in the glove box 10.Described spray header 11 is interior can to arrange a plurality of apertures, and described spray header 11 is used for providing reactant gases.Usually place multi-disc substrate 121 on the described pedestal 12, the material of described substrate 121 is generally expensive sapphire.The below of described pedestal 12 also is formed with heating unit 13, and 13 pairs of described substrates 121 of described heating unit heat, so that the temperature on described substrate 121 surfaces reaches the temperature that epitaxy technique needs.
When carrying out MOCVD technique, reactant gases enters the conversion zone (position on the surface of close substrate 121) of pedestal 12 tops from the aperture of spray header 11, described substrate 121 is owing to the thermal radiation effect of heating unit 13 has certain temperature, thereby this temperature is so that carry out chemical reaction between the reactant gases, thereby at substrate 121 surface deposition epitaxial films.
Find in practice, along with the size of substrate constantly increases, the number of substrate is on the increase, the size of spray header is increasing, and this is so that the processing difficult of spray header, and large-sized spray header is expensive.
Summary of the invention
The problem that the embodiment of the invention solves has provided a kind of reaction chamber of chemical vapor depsotition equipment, has solved that large size spray header in the reaction chamber of existing chemical vapor depsotition equipment is difficult to process, the problem of cost costliness.
In order to address the above problem, the invention provides a kind of reaction chamber of chemical vapor depsotition equipment, comprising:
Pedestal, described pedestal are used for placing substrate;
At least two spray headers are oppositely arranged with pedestal, and described spray header is used for providing reactant gases to described substrate, and each spray header below can be placed a substrate at least.
Alternatively, the public cover gas source of described spray header, reactant gases enters spray header from gas source through gas pipeline, mixes between spray header and substrate.
Alternatively, described spray header covers the substrate that place its below at least.
Alternatively, also comprise: pneumatic outlet, be positioned at described pedestal away from a side of described spray header, the reactant gases vertical current is to substrate and pedestal, and unnecessary gas is outside to pedestal along substrate and base-plates surface, flows to the side away from substrate of described pedestal.
Compared with prior art, the present invention has the following advantages:
At at least two spray headers of the inner setting of the reaction chamber of chemical vapor depsotition equipment, solved that large-sized spray header in the reaction chamber is difficult to process, the problem of the high expensive of large size spray header, and with single spray header be set in the reaction chamber compare, the present invention arranges two above spray headers in reaction chamber, can improve the uniformity coefficient of the distribution of the reactant gases on the substrate, improve the uniformity coefficient of the epitaxial film that forms;
Further optimally, described spray header public overlaps gas source, has simplified the structure of reaction chamber; Reactant gases enters spray header from gas source through gas pipeline, mixes between spray header and substrate, but avoids reactant gases to mix the problem of easy generation pre-reaction before entering spray header;
Further optimally, away from a side of described spray header pneumatic outlet is set at described pedestal, so that the reactant gases vertical current is to substrate and pedestal, unnecessary gas is outside to pedestal along substrate and base-plates surface, flow to the side away from substrate of described pedestal, do not arrive substrate surface and namely be pumped thereby avoid being positioned at gas on the substrate of susceptor edges, improved the uniformity coefficient of chemical vapor deposition method.
Description of drawings
Fig. 1 is the structural representation of the MOCVD device of prior art;
Fig. 2 is the structural representation of reaction chamber of the chemical vapor depsotition equipment of first embodiment of the invention.
Embodiment
Prior art is owing to only having a spray header in the reaction chamber of chemical vapor depsotition equipment, along with the size of the substrate on the pedestal constantly increases, the number of substrate on the substrate is on the increase, the size of spray header constantly increases, and this is so that spray header processing and manufacturing complicated.And utilize large-sized spray header can't be equably with reaction gas distribution to substrate, so that the uniformity coefficient of the epitaxial film that existing chemical vapor deposition method forms can't meet the demands.
In order to address the above problem, the invention provides a kind of reaction chamber of chemical vapor depsotition equipment, comprising:
Pedestal, described pedestal are used for placing substrate;
At least two spray headers are oppositely arranged with pedestal, and described spray header is used for providing reactant gases to described substrate, and each spray header below can be placed a substrate at least.
As an embodiment, chemical vapor depsotition equipment of the present invention is MOCVD equipment, and certainly, as other embodiment, described chemical vapor depsotition equipment can also utilize for other chemical vapor depsotition equipment of showerhead configuration.
Below in conjunction with specific embodiment technical scheme of the present invention is described in detail.
For technical scheme of the present invention is described better, please in conjunction with the structural representation of the reaction chamber of the chemical vapor depsotition equipment of one embodiment of the invention shown in Figure 2.Be provided with pedestal 101 in the reaction chamber 100, described pedestal 101 is used for placing substrate 102, the material of described pedestal 101 is graphite or SiC etc., described pedestal 101 belows are provided with heating unit (not shown), and this heating unit can heat pedestal 101 and substrate 102 by the thermal radiation mode.The material of described substrate 102 can be the materials such as sapphire, Si, SiC.
As an embodiment, be provided with three spray headers 103 in the described reaction chamber 100.Described spray header 103 is oppositely arranged with pedestal 101, and described spray header 103 is used for providing reactant gases to substrate 102.One or more substrates 102 can be placed in described spray header 103 belows.
As an embodiment, 3 substrates 102 are placed in described spray header 103 belows, described three substrates 102 are arranged into equilateral triangle, described spray header 103 covers three substrates 102 that place its below at least, with the uniformity coefficient of the gas distribution that improves spray header 103 edges, improve the uniformity coefficient of the epitaxial film of the formation on the substrate 102.In other embodiment, when the size of substrate large (such as above 6 inches), can one spray header is corresponding places a slice or three substrates, thereby reduce as far as possible the size of spray header, the manufacture difficulty of reduction spray header; When the size less (such as being no more than 6 inches) of substrate, then can a spray header correspondence place the multi-disc substrate, thereby improve the efficient of deposition, the production capacity of raising MOCVD equipment as far as possible.
Please continue with reference to figure 2, as optional embodiment, described spray header 103 measure-alike is convenient to integrated processing, and described spray header 103 can be equilateral triangle and be arranged in pedestal 101 tops.As other embodiment, described spray header 103 also can have different sizes is set, such as a large-sized spray header is set at the pedestal center, the undersized spray header of a circle is set around this large-sized spray header, can improve like this utilization ratio of reaction chamber.
Spray header 103 of the present invention can share a cover gas source, also can one cover gas source be set each spray header correspondence.The material layer that gas source of the present invention and chemical vapor deposition method will form has relation.As an embodiment, described chemical deposition equipment is MOCVD equipment, and the epitaxial film that form can be the materials such as GaN, GaInN, GaAlN.Therefore, described gas source should be able to provide III family gas and V family gas at least.Accordingly, described gas source comprises the first gas source 106 and the second gas source 107, and wherein said the first gas source 106 is used for providing III family gas; Described the second gas source 107 is used for providing V family gas.Certainly, needs according to technique, sweeping gas (for example comprise in nitrogen, hydrogen, the ammonia one or more) or clean air (comprise in nitrogen, hydrogen, the rare gas element one or more) or vector gas (comprise in nitrogen, hydrogen, the ammonia one or more) can also be set in the described gas source, and needing this moment to arrange to provide the gas source of above-mentioned sweeping gas, clean air or vector gas to get final product.
In order to improve the utilization ratio of gas source, simplify the layout of MOCVD equipment, as preferred embodiment, described spray header 103 shares a cover gas source.Please continue with reference to figure 3, described the first gas source 106 is connected by the first gas piping 104, and III family gas directly enters spray header 103 through the first gas piping 104; Described the second gas source 107 is connected with spray header 103 by the second gas piping 105, V family gas directly enters spray header through the second gas piping 105, the biochemical reaction of hybrid concurrency between spray header 103 and substrate 102 of III family gas and V family gas forms epitaxial film at substrate 102.Because III family gas and V family gas mix between spray header 103 and substrate 102 after by spray header 103, mix first with III family gas and V family gas and to enter the substrate top by spray header again and easily cause pre-reaction to compare, the embodiment of the invention can effectively solve the problem of pre-reaction, improves the quality of the epitaxial film that forms.
As optional embodiment, also be provided with pneumatic outlet 108 on the described reaction chamber 100, pneumatic outlet 108 is connected with pump, and the air-extraction function by pump is discharged the unnecessary gas in the chemical vapor deposition method process (comprising gas that chemical reaction does not occur, side reaction waste gas, unnecessary vector gas, clean air etc.).
The position of described pneumatic outlet 108 can arrange flexibly.As one embodiment of the present of invention, described pneumatic outlet 108 can be arranged on the reaction chamber 100 of substrate 102 tops, and namely the position of pneumatic outlet 108 is higher than the plane at substrate 102 places.But consider that if pneumatic outlet 108 is arranged on substrate 102 tops, the surface that the gas that is positioned at substrate 102 tops at pedestal 101 edges may not arrive substrate 102 namely is pumped, thereby affects the uniformity coefficient of chemical vapor deposition method.
As preferred embodiment, described gas vent 108 is arranged on the side of described pedestal 101 away from described spray head 103, the position that is gas vent 108 is lower than the plane at substrate 102 places with position fair or gas vent 108, the plane at substrate 102 places at least, like this, reacting gas is the surface to substrate 102 and pedestal 101 from spray head 103 vertical currents, on the surface of substrate 102 and pedestal 101, forming air-flow stably distributes, unnecessary gas is along substrate 102 and pedestal 101 surfaces to pedestal 101 outsides, flow to the side away from substrate 102 of described pedestal 101
To sum up, the present invention arranges at least two spray headers by the reaction chamber inside at chemical vapor depsotition equipment, solved that large-sized spray header in the reaction chamber is difficult to process, the problem of the high expensive of large size spray header, and with single spray header be set in the reaction chamber compare, the present invention arranges two above spray headers in reaction chamber, can improve the uniformity coefficient of the distribution of the reactant gases on the substrate, improve the uniformity coefficient of the epitaxial film that forms;
Further optimally, described spray header public overlaps gas source, has simplified the structure of reaction chamber; Reactant gases enters spray header from gas source through gas pipeline, mixes between spray header and substrate, but avoids reactant gases to mix the problem of easy generation pre-reaction before entering spray header;
Further optimally, away from a side of described spray header pneumatic outlet is set at described pedestal, so that the reactant gases vertical current is to substrate and pedestal, unnecessary gas is outside to pedestal along substrate and base-plates surface, flow to the side away from substrate of described pedestal, do not arrive substrate surface and namely be pumped thereby avoid being positioned at gas on the substrate of susceptor edges, improved the uniformity coefficient of chemical vapor deposition method.
Although oneself discloses the present invention as above with preferred embodiment, the present invention is defined in this.Any those skilled in the art without departing from the spirit and scope of the present invention, all can make various changes or modifications, so protection scope of the present invention should be as the criterion with the claim limited range.

Claims (4)

1. the reaction chamber of a chemical vapor depsotition equipment is characterized in that, comprising:
Pedestal, described pedestal are used for placing substrate;
At least two spray headers are oppositely arranged with pedestal, and described spray header is used for providing reactant gases to described substrate, and each spray header below can be placed a substrate at least.
2. the reaction chamber of chemical vapor depsotition equipment as claimed in claim 1 is characterized in that, the public cover gas source of described spray header, and reactant gases enters spray header from gas source through gas pipeline, mixes between spray header and substrate.
3. the reaction chamber of chemical vapor depsotition equipment as claimed in claim 1 is characterized in that, described spray header covers the substrate that place its below at least.
4. the reaction chamber of chemical vapor depsotition equipment as claimed in claim 1, it is characterized in that, also comprise: pneumatic outlet, be positioned at described pedestal away from a side of described spray header, the reactant gases vertical current is to substrate and pedestal, unnecessary gas is outside to pedestal along substrate and base-plates surface, flows to the side away from substrate of described pedestal.
CN2012100194243A 2012-01-21 2012-01-21 Reaction chamber of chemical vapor deposition apparatus Pending CN103074602A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN2012100194243A CN103074602A (en) 2012-01-21 2012-01-21 Reaction chamber of chemical vapor deposition apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN2012100194243A CN103074602A (en) 2012-01-21 2012-01-21 Reaction chamber of chemical vapor deposition apparatus

Publications (1)

Publication Number Publication Date
CN103074602A true CN103074602A (en) 2013-05-01

Family

ID=48151294

Family Applications (1)

Application Number Title Priority Date Filing Date
CN2012100194243A Pending CN103074602A (en) 2012-01-21 2012-01-21 Reaction chamber of chemical vapor deposition apparatus

Country Status (1)

Country Link
CN (1) CN103074602A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105839074A (en) * 2015-02-03 2016-08-10 Lg电子株式会社 Metal organic chemical vapor deposition apparatus for solar cell

Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1747139A (en) * 2004-09-10 2006-03-15 茂德科技股份有限公司 Improvement of atomic layer deposition and apparatus thereof
US20080214012A1 (en) * 2007-01-12 2008-09-04 Samsung Electronics Co., Ltd. Apparatus and method for fabricating semiconductor devices and substrates
JP2009016624A (en) * 2007-07-05 2009-01-22 Nikkoshi Co Ltd Method of manufacturing multi-shower head for cvd of multilayer structure
CN101495675A (en) * 2005-02-23 2009-07-29 布里奇勒克斯股份有限公司 Chemical vapor deposition reactor having multiple inlets
CN101560650A (en) * 2009-05-15 2009-10-21 江苏大学 Multiple spray header chemical vapor deposition reaction chamber structure
TW201029748A (en) * 2008-12-10 2010-08-16 Ips Ltd Apparatus for treatment of plural substrates
CN102312217A (en) * 2011-09-06 2012-01-11 中国科学院长春光学精密机械与物理研究所 Method for growing semiconductor film by using composite model, and apparatus thereof
CN102312221A (en) * 2011-09-06 2012-01-11 中国科学院长春光学精密机械与物理研究所 Atomic layer deposition apparatus employing uniform air intake system
CN202450155U (en) * 2012-01-21 2012-09-26 光达光电设备科技(嘉兴)有限公司 Reaction chamber for chemical vapor deposition equipment

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1747139A (en) * 2004-09-10 2006-03-15 茂德科技股份有限公司 Improvement of atomic layer deposition and apparatus thereof
CN101495675A (en) * 2005-02-23 2009-07-29 布里奇勒克斯股份有限公司 Chemical vapor deposition reactor having multiple inlets
US20080214012A1 (en) * 2007-01-12 2008-09-04 Samsung Electronics Co., Ltd. Apparatus and method for fabricating semiconductor devices and substrates
JP2009016624A (en) * 2007-07-05 2009-01-22 Nikkoshi Co Ltd Method of manufacturing multi-shower head for cvd of multilayer structure
TW201029748A (en) * 2008-12-10 2010-08-16 Ips Ltd Apparatus for treatment of plural substrates
CN101560650A (en) * 2009-05-15 2009-10-21 江苏大学 Multiple spray header chemical vapor deposition reaction chamber structure
CN102312217A (en) * 2011-09-06 2012-01-11 中国科学院长春光学精密机械与物理研究所 Method for growing semiconductor film by using composite model, and apparatus thereof
CN102312221A (en) * 2011-09-06 2012-01-11 中国科学院长春光学精密机械与物理研究所 Atomic layer deposition apparatus employing uniform air intake system
CN202450155U (en) * 2012-01-21 2012-09-26 光达光电设备科技(嘉兴)有限公司 Reaction chamber for chemical vapor deposition equipment

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105839074A (en) * 2015-02-03 2016-08-10 Lg电子株式会社 Metal organic chemical vapor deposition apparatus for solar cell
US10388820B2 (en) 2015-02-03 2019-08-20 Lg Electronics Inc. Metal organic chemical vapor deposition apparatus for solar cell

Similar Documents

Publication Publication Date Title
KR102544300B1 (en) Methods of forming silicon germanium tin films and structures and devices including the films
CN103098175B (en) There is the nozzle component of gas injection distributor
CN102424956B (en) Spraying apparatus for metal-organic chemical vapor deposition equipment
CN201626981U (en) Gas inlet device of chemical vapor phase deposition epitaxy equipment
US10262863B2 (en) Method for manufacturing SiC epitaxial wafer by simultaneously utilizing an N-based gas and a CI-based gas, and SiC epitaxial growth apparatus
CN1333438C (en) Coaxial air intake for acquiring uniform wide-band gap semiconductor thin film
KR20110139079A (en) Thin film deposition apparatus
CN103103501B (en) A kind of material vapour phase epitaxy Fan spray head structure
CN103014667A (en) Chemical vapor deposition (CVD) device
CN105493240B (en) Method of producing epitaxial layer of binary semiconductor material
CN103060906A (en) Square spray nozzle structure for vapor phase epitaxy of material
CN103074607A (en) Graphite plate and reaction chamber with graphite plate
CN105200395A (en) Gas inflowing and cooling device for MOCVD equipment
CN202090055U (en) Gas delivery device and reactor employing same
CN104141116A (en) Metal organic chemical vapor deposition device, gas spray component and gas distribution control method
CN103556219A (en) Device for epitaxial growth of silicon carbide
CN111188027B (en) Chemical vapor deposition equipment and film forming method
US9340875B2 (en) Reaction device with peripheral-in and center-out design for chemical vapor deposition
CN109576784A (en) A kind of preparation method and device of SiC epitaxial layer
CN202450155U (en) Reaction chamber for chemical vapor deposition equipment
CN103014669A (en) Chemical vapor deposition (CVD) device
CN103074602A (en) Reaction chamber of chemical vapor deposition apparatus
CN103774115B (en) Chemical vapor deposition unit
CN103361624B (en) Metallo-organic compound chemical vapor deposition method and device
CN103088414A (en) Vapor-phase epitaxy deposition apparatus realizing nitride crystal homoepitaxy

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C02 Deemed withdrawal of patent application after publication (patent law 2001)
WD01 Invention patent application deemed withdrawn after publication

Application publication date: 20130501