CN103065280A - Method and device of non-uniformed correction for short wave infrared detector - Google Patents
Method and device of non-uniformed correction for short wave infrared detector Download PDFInfo
- Publication number
- CN103065280A CN103065280A CN2012105411523A CN201210541152A CN103065280A CN 103065280 A CN103065280 A CN 103065280A CN 2012105411523 A CN2012105411523 A CN 2012105411523A CN 201210541152 A CN201210541152 A CN 201210541152A CN 103065280 A CN103065280 A CN 103065280A
- Authority
- CN
- China
- Prior art keywords
- short
- wave infrared
- infrared detector
- nonuniformity correction
- correction
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Landscapes
- Transforming Light Signals Into Electric Signals (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
Abstract
The invention relates to a method and a device of non-uniformed correction for a short wave infrared detector, and belongs to the field of the technical field of image processing. The method of non-uniformed correction for the short wave infrared detector make the non-uniformed correction standard radiation as a source of radiation of the short wave infrared detector, and control the radiation flux received by the short wave infrared detector by adopting a diaphragm, provide standard input for the non-uniformed correction, calculate and correct the non-uniformed correction coefficient through a stream-lined module mode. Thus non-uniformed correction effect of the short wave infrared detector is improved. The device for non-uniformed correction of short wave infrared detector is simple in structure, easy to realize and good in effect.
Description
Technical field
The present invention relates to a kind of short-wave infrared detector nonuniformity correction method and device, belong to technical field of image processing.
Background technology
Infrared imaging system has been widely used in a plurality of fields such as infrared forward sight, infrared reconnaissance tracking in recent years.Short-wave infrared refers to the infrared band of 1.0～2.5 μ m, and different from medium wave, LONG WAVE INFRARED imaging is that the short-wave infrared imaging mainly utilizes the short-wave infrared radiation characteristic in the room temperature scenery reflection environment to realize surveying.Green plants is eager to excel to the reflection potential comparison visible light of short-wave infrared.The part mineral have strong absorption peak at short infrared wave band.Because its characteristics, short-wave infrared plays an important role for vegetation, rock, cloud layer detection aspect.Short-wave infrared is surveyed and to be distinguished unique advantage also being arranged aspect the camouflage.Based on above characteristics, the information that the short-wave infrared imaging can provide visible light, lll night vision, medium wave, LONG WAVE INFRARED imaging not to provide has its significance.The short-wave infrared detector has the same heteropical problem that all has with medium wave, long wave, imaging system all must be proofreaied and correct its heterogeneity, but the response of different is short-wave infrared is near visible-range, can't adopt calibration blackbody that it is carried out nonuniformity correction, therefore need to be for the new short-wave infrared nonuniformity correction method of short-wave infrared detector characteristics design.
Summary of the invention
The purpose of this invention is to provide a kind of short-wave infrared detector nonuniformity correction method and apparatus, to solve the heteropical problem of short-wave infrared detector.
The present invention provides a kind of short-wave infrared detector nonuniformity correction method for solving the problems of the technologies described above, and the step of this bearing calibration is as follows:
1). the calibrated radiation source of nonuniformity correction is provided for the short-wave infrared detector;
2). the standard bin that radiate source radiation is gone out converges on the focal plane of short-wave infrared detector;
3). calculate the nonuniformity correction coefficient of short-wave infrared detector;
4). utilize the nonuniformity correction coefficient that calculates that the short-wave infrared detector is carried out real-time nonuniformity correction.
Described step 4) needs also that when carrying out real-time nonuniformity correction the short-wave infrared image is carried out blind element and searches replacement.
Described step 2) be to control the radiation flux that receives on the short-wave infrared detector focal plane by the size that changes diaphragm in.
The calculating of nonuniformity correction coefficient is to gather the response of Single Infrared Image Frame or the mean value of multiframe infrared image response is finished by the mode that adopts freeze frame is static in the described step 3).
What described step 4) adopted when carrying out nonuniformity correction is the mode of streamline, by the response of each pixel of short-wave infrared detector focal plane is carried out computing with the nonuniformity correction coefficient of its correspondence position point successively.
The present invention also provides a kind of short-wave infrared detector correction device for solving the problems of the technologies described above, and this means for correcting comprises:
Integrating sphere is used to the short-wave infrared detector that the calibrated radiation source of nonuniformity correction is provided;
Optical lens is used for the standard bin that integrating sphere gives off is converged to the focal plane of short-wave infrared detector;
The nonuniformity correction circuit comprises correction factor calculation module and real time correction module, is respectively applied to calculate the nonuniformity correction system of short-wave infrared detector and the short-wave infrared detector is carried out real-time nonuniformity correction.
Described nonuniformity correction circuit comprises that also blind element searches replacement module, is used for that the short-wave infrared image is carried out blind element and searches replacement.
Described optical lens is to control the radiation flux that short-wave infrared detector focal plane receives by the size that changes its diaphragm.
Described correction factor calculation module is to carry out the calculating of Non Uniformity Correction of Infrared Image coefficient by the response of the static collection of the mode Single Infrared Image Frame that adopts freeze frame or the mean value of infrared image response.
Described real time correction module adopts the mode of streamline to carry out nonuniformity correction, by the response of each pixel of short-wave infrared detector focal plane is carried out computing with the nonuniformity correction coefficient of its correspondence position point successively.
The invention has the beneficial effects as follows: the present invention passes through the standard radiation of nonuniformity correction as the radiation source of short-wave infrared detector, the radiation flux that adopts simultaneously diaphragm control short-wave infrared detector to receive, for nonuniformity correction provides standard input, carry out at last calculating and the correction of nonuniformity correction coefficient by streamline mould mode, improved the nonuniformity correction effect of short-wave infrared detector, the present invention is simple in structure, easily realizes, and is effective.
Description of drawings
Fig. 1 is the structural map of short-wave infrared detector nonuniformity correction device of the present invention;
Fig. 2 is the synoptic diagram of nonuniformity correction circuit in the short-wave infrared detector nonuniformity correction device of the present invention;
Fig. 3 is the schematic diagram of nonuniformity correction circuit in the short-wave infrared detector nonuniformity correction device of the present invention;
Fig. 4 is the process flow diagram of short-wave infrared detector nonuniformity correction method of the present invention.
Embodiment
Below in conjunction with accompanying drawing concrete embodiment of the present invention is described further.
The embodiment of a kind of short-wave infrared detector nonuniformity correction method of the present invention
The non-homogeneous antidote of a kind of short-wave infrared detector of the present invention, the step of the method as shown in Figure 3, its detailed process is as follows:
1. the calibrated radiation source input of nonuniformity correction is provided for the short-wave infrared detector, for example, uses integrating sphere as the radiation source of short-wave infrared detector.
2. the radiothermy infrared optical lens standard bin that converges integrating sphere output is radiated on the focal plane of short-wave infrared detector, controls the radiation flux that converges to short-wave infrared detector focal plane by the size that changes diaphragm in the short-wave infrared optical lens.
3. utilize that the inner SOPC of FPGA is soft to check calculating of short-wave infrared nonuniformity correction coefficient, carry out computing with the nonuniformity correction coefficient of its correspondence position point successively by the static response that gathers Single Infrared Image Frame of the mode that adopts freeze frame.
4. the mode that adopts streamline is carried out computing with the nonuniformity correction coefficient of its correspondence position point successively to the response of each pixel of short-wave infrared detector focal plane, adopts simultaneously the FPGA module to carry out blind element and searches and replace the blind element that the mode of employing medium filtering is searched the short-wave infrared image.
The embodiment of a kind of short-wave infrared detector nonuniformity correction device of the present invention
As shown in Figure 1, this means for correcting comprises integrating sphere, optical lens and nonuniformity correction circuit, integrating sphere provides the calibrated radiation source of nonuniformity correction for the short-wave infrared detector, the standard bin that optical lens converges integrating sphere output is radiated on the focal plane of short-wave infrared detector, the nonuniformity correction circuit as shown in Figure 2, comprising that correction factor calculation module, real time correction module and blind element are replaced searches module, and its principle as shown in Figure 3.
Short-wave infrared detector nonuniformity correction is divided into real-time treatment scheme and two kinds of duties of coefficient calculations flow process, and pretreatment unit adopts the soft nuclear of SOPC to finish the nonuniformity correction coefficient calculations and the result of calculation of correction coefficient is write correction coefficient memory in the coefficient calculations flow process.In real time treatment scheme at first the real time correction module according to correction coefficient infrared signal is carried out nonuniformity correction, then blind element is searched replacement module 7 and is adopted the method for 3 * 3 window medium filterings to determine the blind element position and replace blind element with the mean value of 9 pixels in the window.
With reference to Fig. 4, be to guarantee the real-time of system works, short-wave infrared detector nonuniformity correction circuit take every frame signal begin carry out work as starting point.After beginning, every frame signal judges at first that whether host computer is by communication module sending mode switching command, if receive the pattern switching command, the nonuniformity correction coefficient calculation means of the soft nuclear of employing SOPC is writing by freeze frame device forbidden storage device at once, then carry out the calculating of nonuniformity correction coefficient according to the data in the storer, turn back to the frame inquiring position after calculating is finished and wait for that next frame arrives; Then do not carry out successively the operations under the real-time mode if receive the pattern switching command.
Claims (10)
1. short-wave infrared detector nonuniformity correction method, it is characterized in that: the step of this bearing calibration is as follows:
1). the calibrated radiation source of nonuniformity correction is provided for the short-wave infrared detector;
2). the standard bin that radiate source radiation is gone out converges on the focal plane of short-wave infrared detector;
3). calculate the nonuniformity correction coefficient of short-wave infrared detector;
4). utilize the nonuniformity correction coefficient that calculates that the short-wave infrared detector is carried out real-time nonuniformity correction.
2. short-wave infrared detector nonuniformity correction method according to claim 1 is characterized in that: described step 4) also needs to carry out blind element to the short-wave infrared image and searches replacement when carrying out real-time nonuniformity correction.
3. short-wave infrared detector nonuniformity correction method according to claim 2 is characterized in that: be to control the radiation flux that receives on the short-wave infrared detector focal plane by the size that changes diaphragm in the optical system described step 2).
4. short-wave infrared detector nonuniformity correction method according to claim 3 is characterized in that: the calculating of nonuniformity correction coefficient is to gather the response of Single Infrared Image Frame or the mean value of multiframe infrared image response is finished by the mode that adopts freeze frame is static in the described step 3).
5. short-wave infrared detector nonuniformity correction method according to claim 4, it is characterized in that: what described step 4) adopted when carrying out nonuniformity correction is the mode of streamline, by the response of each pixel of short-wave infrared detector focal plane is carried out computing with the nonuniformity correction coefficient of its correspondence position point successively.
6. short-wave infrared detector nonuniformity correction device, it is characterized in that: this means for correcting comprises:
Integrating sphere is used to the short-wave infrared detector that the calibrated radiation source of nonuniformity correction is provided;
Optical lens is used for the standard bin that integrating sphere gives off is converged to the focal plane of short-wave infrared detector;
The nonuniformity correction circuit comprises correction factor calculation module and real time correction module, is respectively applied to calculate the nonuniformity correction system of short-wave infrared detector and the short-wave infrared detector is carried out real-time nonuniformity correction.
7. short-wave infrared detector nonuniformity correction device according to claim 6 is characterized in that: described nonuniformity correction circuit comprises that also blind element searches replacement module, is used for that the short-wave infrared image is carried out blind element and searches replacement.
8. short-wave infrared detector nonuniformity correction device according to claim 7, it is characterized in that: described optical lens is to control the radiation flux that short-wave infrared detector focal plane receives by the size that changes its diaphragm.
9. short-wave infrared detector nonuniformity correction device according to claim 8 is characterized in that: described correction factor calculation module is to gather the response of Single Infrared Image Frame or the mean value of infrared image response carries out the calculating of Non Uniformity Correction of Infrared Image coefficient by the mode that adopts freeze frame is static.
10. short-wave infrared detector nonuniformity correction device according to claim 9, it is characterized in that: described real time correction module adopts the mode of streamline to carry out nonuniformity correction, by the response of each pixel of short-wave infrared detector focal plane is carried out computing with the nonuniformity correction coefficient of its correspondence position point successively.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2012105411523A CN103065280A (en) | 2012-12-13 | 2012-12-13 | Method and device of non-uniformed correction for short wave infrared detector |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2012105411523A CN103065280A (en) | 2012-12-13 | 2012-12-13 | Method and device of non-uniformed correction for short wave infrared detector |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN103065280A true CN103065280A (en) | 2013-04-24 |
Family
ID=48107897
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2012105411523A Pending CN103065280A (en) | 2012-12-13 | 2012-12-13 | Method and device of non-uniformed correction for short wave infrared detector |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN103065280A (en) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105466562A (en) * | 2014-09-09 | 2016-04-06 | 南京理工大学 | Thermal imager calibration device and method through combination of non-uniformity calibration and temperature calibration |
| CN105716720A (en) * | 2016-02-03 | 2016-06-29 | 姜志富 | Infrared image heterogeneity correction method and device |
| CN106851141A (en) * | 2016-12-14 | 2017-06-13 | 中国资源卫星应用中心 | A kind of asymmetric correction method of remote sensing images |
| CN107888804A (en) * | 2017-11-13 | 2018-04-06 | 烟台艾睿光电科技有限公司 | Thermal imaging system image processing method and device |
| CN109738072A (en) * | 2019-01-07 | 2019-05-10 | 山东大学 | A kind of cross blind element detection of InGaAs short-wave infrared imager and means for correcting and method |
| CN110146173A (en) * | 2019-06-13 | 2019-08-20 | 合肥金星机电科技发展有限公司 | Thermometric consistency desired result method based on infrared temperature-test technology |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0855209A (en) * | 1994-08-08 | 1996-02-27 | Kobe Steel Ltd | Method and device for radiation image processing |
| US20020126313A1 (en) * | 2001-02-21 | 2002-09-12 | Yoshiyuki Namizuka | Image processing method and apparatus for varibly processing image based upon image characteristics |
| CN201653554U (en) * | 2010-02-23 | 2010-11-24 | 宝山钢铁股份有限公司 | Infrared thermogragh calibrating device |
| CN102819822A (en) * | 2011-12-17 | 2012-12-12 | 中国航空工业集团公司洛阳电光设备研究所 | Short-wave non-refrigeration infrared imaging device |
-
2012
- 2012-12-13 CN CN2012105411523A patent/CN103065280A/en active Pending
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0855209A (en) * | 1994-08-08 | 1996-02-27 | Kobe Steel Ltd | Method and device for radiation image processing |
| US20020126313A1 (en) * | 2001-02-21 | 2002-09-12 | Yoshiyuki Namizuka | Image processing method and apparatus for varibly processing image based upon image characteristics |
| CN201653554U (en) * | 2010-02-23 | 2010-11-24 | 宝山钢铁股份有限公司 | Infrared thermogragh calibrating device |
| CN102819822A (en) * | 2011-12-17 | 2012-12-12 | 中国航空工业集团公司洛阳电光设备研究所 | Short-wave non-refrigeration infrared imaging device |
Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105466562A (en) * | 2014-09-09 | 2016-04-06 | 南京理工大学 | Thermal imager calibration device and method through combination of non-uniformity calibration and temperature calibration |
| CN105466562B (en) * | 2014-09-09 | 2019-07-02 | 南京理工大学 | In conjunction with the thermal imaging system caliberating device and method of heterogeneity calibration and Temperature Scaling |
| CN105716720A (en) * | 2016-02-03 | 2016-06-29 | 姜志富 | Infrared image heterogeneity correction method and device |
| CN105716720B (en) * | 2016-02-03 | 2019-05-31 | 姜志富 | Infrared Image Non-uniformity Correction method and device |
| CN106851141A (en) * | 2016-12-14 | 2017-06-13 | 中国资源卫星应用中心 | A kind of asymmetric correction method of remote sensing images |
| CN106851141B (en) * | 2016-12-14 | 2019-06-28 | 中国资源卫星应用中心 | A kind of asymmetric correction method of remote sensing images |
| CN107888804A (en) * | 2017-11-13 | 2018-04-06 | 烟台艾睿光电科技有限公司 | Thermal imaging system image processing method and device |
| CN109738072A (en) * | 2019-01-07 | 2019-05-10 | 山东大学 | A kind of cross blind element detection of InGaAs short-wave infrared imager and means for correcting and method |
| CN110146173A (en) * | 2019-06-13 | 2019-08-20 | 合肥金星机电科技发展有限公司 | Thermometric consistency desired result method based on infrared temperature-test technology |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN103065280A (en) | Method and device of non-uniformed correction for short wave infrared detector | |
| CN104501956B (en) | A kind of ultra wide wave band collection of illustrative plates association detection device and detection method | |
| CN111415409B (en) | Modeling method, system, equipment and storage medium based on oblique photography | |
| CN103049879B (en) | A kind of Infrared images pre-processing method based on FPGA | |
| CN105067633A (en) | Vehicle-mounted type automatic pavement damage recognition device based on image processing and application method | |
| CN106772338A (en) | Unmanned machine positioning device, method and system | |
| CN204882391U (en) | Damaged automatic identification equipment in vehicular road surface based on image processing | |
| CN103986871A (en) | Method and system for intelligent zoom video monitoring | |
| US11972596B2 (en) | Intelligent smog-penetrating optical imaging detection device and use method thereof | |
| CN105282492A (en) | Near-space airborne-to-ground real-time imaging system | |
| CN103115685A (en) | Infrared multi-detector combined detecting device and infrared detecting method | |
| CN109949231A (en) | A kind of method and device for urban managing information acquiring and processing | |
| CN116545122B (en) | Power transmission line external damage prevention monitoring device and external damage prevention monitoring method | |
| CN102135777B (en) | Vehicle-mounted infrared tracking system | |
| CN104580928A (en) | Camera shooting light fill-in method and device | |
| CN105551043B (en) | Unmanned plane image data real-time processing method | |
| CN107830928A (en) | A kind of heliograph for cirrus optical characteristic measurement | |
| CN204697170U (en) | A kind of autofocus system and video monitoring equipment | |
| CN103175527A (en) | Large-visual-field and low-power-consumption earth sensor system applied to microsatellite | |
| CN105333960A (en) | Non-uniformity correction and blind pixel replacement method and device of infrared focal plane detector | |
| CN101634555B (en) | Image motion compensation method of area array CCD camera | |
| CN103018901A (en) | Infrared searching and tracking integrated optical imaging system | |
| CN207096113U (en) | A kind of device for shooting cylinder different faces | |
| CN109443325A (en) | Utilize the space positioning system of floor-mounted camera | |
| CN204442567U (en) | A kind of digital picture real-time display system based on industrial computer platform |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C12 | Rejection of a patent application after its publication | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20130424 |