CN103063407B - Multichannel electronic control birefringence liquid crystal attenuation ripple test system - Google Patents

Multichannel electronic control birefringence liquid crystal attenuation ripple test system Download PDF

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Publication number
CN103063407B
CN103063407B CN201210569823.7A CN201210569823A CN103063407B CN 103063407 B CN103063407 B CN 103063407B CN 201210569823 A CN201210569823 A CN 201210569823A CN 103063407 B CN103063407 B CN 103063407B
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China
Prior art keywords
liquid crystal
test
birefringence liquid
electronic control
hyperchannel
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CN201210569823.7A
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CN103063407A (en
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赵利刚
刘华
袁海骥
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COADNA (SUZHOU) Ltd
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COADNA (SUZHOU) Ltd
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Abstract

The present invention discloses one can accurately test out multichannel electronic control birefringence liquid crystal attenuation ripple test system, the accurate voltage under the fixed attenuation of each passage is drawn by the voltage of each passage-Insertion Loss fitting of a curve, have that cost is low, testing method simple, be applicable to large-lot producer to the test of multichannel electronic control birefringence liquid crystal attenuation ripple. The use of the present invention can overcome that traditional method test multichannel electronic control birefringence liquid crystal attenuation ripple test speed is slow, test precision is low and cannot realize the shortcomings such as automatization, possesses that test speed is very fast, test precision height and the advantage such as test specification is wide.

Description

Multichannel electronic control birefringence liquid crystal attenuation ripple test system
Technical field
The present invention relates to multichannel electronic control birefringence liquid crystal attenuation ripple test system. The present invention can accurately test out the decay ripple numerical value of the automatically controlled two-fold liquid crystal of hyperchannel, and then judge the state of the art of liquid crystal rubbingmark, the every field requiring detection hyperchannel electrically conerolled birefringence liquid crystal can be widely used in, especially being applicable to large-lot producer and multichannel electronic control birefringence liquid crystal attenuation ripple is tested by scientific research institution, cost is low, speed is fast.
Background technology
In the last few years, hyperchannel electrically conerolled birefringence liquid crystal occurred that the innovation impact of the development on science and technology and industrial production technology became clear day by day. Electrically conerolled birefringence liquid crystal not only can be applied to liquid-crystal display LCD field, especially the big picture multicolor displaying field of projective amplification; Meanwhile, the power equalization of DWDM fiber optic communication field also has good market using value.
Traditional multichannel electronic control birefringence liquid crystal attenuation ripple testing method is because its passage is more, complexity is higher, lane testing needs the time longer one by one, simultaneously, need each the Channel depletion ripple numerical value tested under particular decay at fiber optic communication field due to electrically conerolled birefringence liquid crystal, owing to the voltage under different passage particular decay has difference, therefore traditional method test is comparatively complicated, test precision is low, test speed is slow.
Summary of the invention
The present invention discloses one can accurately test out multichannel electronic control birefringence liquid crystal attenuation ripple test system, the accurate voltage under the fixed attenuation of each passage is drawn by the voltage of each passage-Insertion Loss fitting of a curve, have that cost is low, testing method simple, be applicable to large-lot producer to the test of multichannel electronic control birefringence liquid crystal attenuation ripple. The use of the present invention can overcome that traditional method test multichannel electronic control birefringence liquid crystal attenuation ripple test speed is slow, test precision is low and cannot realize the shortcomings such as automatization, possesses that test speed is very fast and test precision advantages of higher.
The technical solution adopted in the present invention is:
Multichannel electronic control birefringence liquid crystal attenuation ripple test system, comprise light source module, optics platform, hyperchannel electrically conerolled birefringence liquid crystal to be measured and folder thereof, control tool, 45 degree of polaroids, plane mirror, annular device, spectrum analyzer and test procedure, wherein light source module is as wideband light source, wideband light source incides with folder through optics platform, control on the hyperchannel electrically conerolled birefringence liquid crystal to be measured of tool, 45 degree of polaroids are used for producing the decay change of different polarization light from hyperchannel electrically conerolled birefringence liquid crystal, plane mirror is for reflecting the broadband light of different polarization states, this light is again through optics platform, spectrum analyzer is received via annular device, spectrum analyzer is for measuring the insertion attenuation loss of hyperchannel electrically conerolled birefringence liquid crystal, the data gathering of whole test macro and data analysis are automatically controlled by the test procedure of Labview platform stand-alone development.
Further, aforesaid multichannel electronic control birefringence liquid crystal attenuation ripple test system, it is characterized in that the position by pressing from both sides, control tool adjustment hyperchannel electrically conerolled birefringence liquid crystal, make the line polarisation of all passage incidence at same level line, and control tool to hyperchannel electrically conerolled birefringence liquid crystal with full high-voltage by it so that line polarisation is incident with minimal losses.
Further, aforesaid multichannel electronic control birefringence liquid crystal attenuation ripple test system, it is characterized in that the test procedure that Labview writes can set electrically conerolled birefringence liquid crystal all passages several groups of voltage values respectively, loss under the different voltage of spectrum analyzer test, preserve the voltage-Insertion Loss numerical value of hyperchannel electrically conerolled birefringence liquid crystal in real time, then calculated the accurate voltage envisioned under decaying by fitting of a curve.
The use of the present invention can overcome traditional method test multichannel electronic control birefringence liquid crystal attenuation ripple test inaccurate, test specification is little, test speed is slow and cannot realize the shortcomings such as automatization, there is test precision height, speed fast, it is applicable to large-lot producer and the rubbingmark situation of hyperchannel electrically conerolled birefringence liquid crystal is detected by scientific research institution.
Accompanying drawing explanation
Fig. 1 is multichannel electronic control birefringence liquid crystal attenuation ripple test system schematic diagram.
In figure, the implication of each Reference numeral is: 1, light source module; 2, annular device; 3, optics platform; 4, hyperchannel electrically conerolled birefringence liquid crystal to be measured and folder thereof, control tool; 5,45 degree of polaroids; 6, plane mirror; 7, spectrum analyzer; 8, test procedure.
Fig. 2 is multichannel electronic control birefringence liquid crystal attenuation ripple test procedure surface chart.
Fig. 3 is multichannel electronic control birefringence liquid crystal attenuation ripple test result schematic diagram.
Embodiment
In order to realize the low cost of multichannel electronic control birefringence liquid crystal attenuation ripple, wide region, high speed and automatization test, the present invention proposes multichannel electronic control birefringence liquid crystal attenuation ripple test system. This test macro can accurately test out the decay ripple of hyperchannel electrically conerolled birefringence liquid crystal, it is possible to is widely used in large-lot producer and scientific research institution to the detection of hyperchannel electrically conerolled birefringence liquid crystal rubbingmark state of the art. This test macro comprises light source module 1, annular device 2, optics platform 3, hyperchannel electrically conerolled birefringence liquid crystal to be measured and folder thereof, controls tool 4,45 degree of polaroids 5, plane mirror 6, spectrum analyzer 7 and test procedure 8. Its structure is as shown in Figure 1.
The embodiment of this multichannel electronic control birefringence liquid crystal attenuation ripple test system comprises two parts:
(1) assembling of system:
(1) Installation and adjustment of hyperchannel electrically conerolled birefringence liquid crystal to be measured. First hyperchannel electrically conerolled birefringence liquid crystal is placed on its fixture, and control tool by it and power to it, then by the position of its fixture adjustment hyperchannel electrically conerolled birefringence liquid crystal, make 45 degree of polaroid laminatings on itself and optics platform, 45 degree of polaroids and plane mirror laminating, and making that incident line polarisation is parallel to be incided on hyperchannel electrically conerolled birefringence liquid crystal, central position can be adjusted by the ITU deviation that the fixing passage ITU of hyperchannel electrically conerolled birefringence liquid crystal and spectrum analyzer are tested.
(2) installation of annular device: by the input terminus of annular device and light source model calling; The complementary end of annular device is connected with collimator on optics platform; The output terminal of annular device is connected with spectrum analyzer.
(2) test of multichannel electronic control birefringence liquid crystal attenuation ripple:
Open test procedure, the operation according to carrying out automatization test as follows:
(1) control hyperchannel electrically conerolled birefringence liquid crystal is selected to control the com mouth of tool.
(2) test template is selected, for preserving in real time from the voltage-lossy data after spectrum analyzer acquisition process.
(3) sequence number of hyperchannel electrically conerolled birefringence liquid crystal to be measured is inputted, and testing results program.
(4) after terminating, the test result of observation test program interface and the test result being automatically kept on computer hard disc (acquiescence: D: LCrippleresult).
By the description of above structure and detection method, the essential characteristics of the present invention clearly, its effect key factor be following some:
1, the present invention can test out the decay ripple numerical value of hyperchannel electrically conerolled birefringence each passage of liquid crystal accurately, directly reflects the state of the art of LCrubbingmark.
2, the test macro of the present invention and testing method can realize low cost, wide region, high speed and automatization test.
3, the present invention is applicable to large-lot producer and multichannel electronic control birefringence liquid crystal attenuation ripple is tested by scientific research institution.
In sum; the present invention can test out the decay ripple numerical value of hyperchannel electrically conerolled birefringence each passage of liquid crystal accurately; directly reflect the state of the art of LCrubbingmark; its constitutional features and testing method are by publicity in detail; in every case the equivalence done based on above-described embodiment and testing method thereof is replaced or simple modification, all should be contained within the scope of patent protection of Patent request of the present invention.

Claims (1)

1. multichannel electronic control birefringence liquid crystal attenuation ripple test system, it is characterized in that: comprise light source module, optics platform, hyperchannel electrically conerolled birefringence liquid crystal to be measured and folder thereof, control tool, 45 degree of polaroids, plane mirror, annular device, spectrum analyzer and test procedure, wherein light source module is as wideband light source, wideband light source incides with folder through optics platform, control on the hyperchannel electrically conerolled birefringence liquid crystal to be measured of tool, 45 degree of polaroids are used for producing the decay change of different polarization light from hyperchannel electrically conerolled birefringence liquid crystal, plane mirror is for reflecting the broadband light of different polarization states, this light is again through optics platform, spectrum analyzer is received via annular device, spectrum analyzer is for measuring the insertion attenuation loss of hyperchannel electrically conerolled birefringence liquid crystal, the data gathering of whole test macro and data analysis are automatically controlled by the test procedure of Labview platform stand-alone development.
CN201210569823.7A 2012-12-25 2012-12-25 Multichannel electronic control birefringence liquid crystal attenuation ripple test system Expired - Fee Related CN103063407B (en)

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Citations (5)

* Cited by examiner, † Cited by third party
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JPH08210948A (en) * 1995-02-07 1996-08-20 Kawasaki Heavy Ind Ltd Optical fiber high-speed delivering test device
CN102289038A (en) * 2011-07-14 2011-12-21 华中科技大学 Ultra-narrow band comb type filter
CN202204955U (en) * 2011-08-26 2012-04-25 方水塔 Wavelength blocker based on liquid crystal technology
CN102590952A (en) * 2012-02-29 2012-07-18 华中科技大学 Multi-channel dynamic optical dispersion compensator
CN102636332A (en) * 2012-04-12 2012-08-15 科纳技术(苏州)有限公司 Test system for variation of groove microstructure of blazed grating

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Publication number Priority date Publication date Assignee Title
JP4597898B2 (en) * 2006-03-31 2010-12-15 住友電工デバイス・イノベーション株式会社 Test system
JP5140451B2 (en) * 2008-02-05 2013-02-06 富士フイルム株式会社 Birefringence measuring method, apparatus and program
CN102252825B (en) * 2011-04-14 2013-02-27 西安电子科技大学 System for measuring loss of optical resonant cavity based on optical cavity ring-down method
CN102519713A (en) * 2011-12-26 2012-06-27 上海大学 Device and method for measuring all physical polarization parameters based on least square optimization
CN102721528B (en) * 2011-12-31 2016-08-03 北京滨松光子技术股份有限公司 The test device of a kind of photo-detector range of linearity and method of testing

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08210948A (en) * 1995-02-07 1996-08-20 Kawasaki Heavy Ind Ltd Optical fiber high-speed delivering test device
CN102289038A (en) * 2011-07-14 2011-12-21 华中科技大学 Ultra-narrow band comb type filter
CN202204955U (en) * 2011-08-26 2012-04-25 方水塔 Wavelength blocker based on liquid crystal technology
CN102590952A (en) * 2012-02-29 2012-07-18 华中科技大学 Multi-channel dynamic optical dispersion compensator
CN102636332A (en) * 2012-04-12 2012-08-15 科纳技术(苏州)有限公司 Test system for variation of groove microstructure of blazed grating

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