CN102998261A - Terahertz wave pseudo heat light source-based imaging device - Google Patents
Terahertz wave pseudo heat light source-based imaging device Download PDFInfo
- Publication number
- CN102998261A CN102998261A CN2012105488934A CN201210548893A CN102998261A CN 102998261 A CN102998261 A CN 102998261A CN 2012105488934 A CN2012105488934 A CN 2012105488934A CN 201210548893 A CN201210548893 A CN 201210548893A CN 102998261 A CN102998261 A CN 102998261A
- Authority
- CN
- China
- Prior art keywords
- thz wave
- terahertz
- schottky barrier
- light source
- imaging device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Images
Landscapes
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
The invention discloses a terahertz wave pseudo heat light source-based imaging device. The terahertz wave pseudo heat light source-based imaging device comprises a terahertz wave parametric oscillator, a terahertz wave focusing lens, a rotating quarry-faced silicon wafer, a terahertz wave collimating lens, a terahertz wave beam splitter, a terahertz transmission light path system, a terahertz reflection light path system and a coincidence measurement circuit, wherein the terahertz transmission light path system consists of an object to be imaged, a terahertz wave collection lens, a terahertz attenuation wafer, a schottky barrier photodiode; and the terahertz reflection light path system consists of a terahertz wave attenuation wafer and a schottky barrier photodiode. The terahertz wave pseudo heat light source-based imaging device has the advantages of being simple in structure, flexible to operate, strong in anti-interference capability, and the like.
Description
Technical field
The present invention relates to THz wave optoelectronics technical field, be specifically related to a kind of THz wave imaging device.
Background technology
THz wave (THz ripple) refers to the electromagnetic wave (1THz=10 of frequency in the 0.1-10THz scope
12Hz), its wave band is in electromagnetic wave spectrum between millimeter wave and the far red light.In recent years, along with the THz wave photoelectron technology develops rapidly, THz wave imaging technique aspect makes rapid progress.At present, the most common THz wave imaging technique is pulse THz wave time-domain spectroscopy imaging technique.It just can acquire the space distribution information of its intensity and phase place by the Fourier transform to the THz wave time domain pulse that contains imaging object information, and then the THz wave image of object, also can obtain the information such as Spatial Density Distribution, refractive index of object.Yet this THz wave imaging system light channel structure is comparatively complicated, and too much optical element causes its stability of layout relatively poor, and complicated data handling procedure causes image acquisition procedures not directly perceived.
Another kind of common THz wave imaging technique is continuous THz wave imaging technique.This THz wave imaging system is embodied as picture by the strength information that the record THz wave sees through behind the object (or through object reflection), therefore compare with the time-domain spectroscopy imaging system, comparatively simple, rapid on image-forming data acquisition and processing mode, the imaging system structure is also relatively simple.The major defect of this imaging technique is that amount of image information is few, and coherence stack can occur the Multi reflection of THz wave in light path in experiment, causes may having interference fringe in the image.
In above-mentioned two kinds of THz wave imaging techniques, also all have the following disadvantages:
(1) when the THz wave of carrying imaging object information is transmitted in the space, be easy to be subject to the random disturbance of external environment, such as Air Flow, humidity variation, flue dust etc., imaging effect will inevitably be affected, antijamming capability is relatively poor, and this has just limited these practical application of THz wave imaging technique in rugged surroundings.
(2) common employed terahertz radiation source in the THz wave imaging technique, such as based on the pulse Terahertz wave source of femto-second laser, carcinotron, optical pumping THz wave laser instrument etc., what have is expensive, operation and maintenance cost is high, the volume that has is large, complicated operation, job stability remains further to be improved, and has limited its practical sexual development.
Summary of the invention
Defective or deficiency for above-mentioned prior art exists the object of the invention is to, and a kind of simple in structure, imaging device based on the pseudo-thermal light source of THz wave that antijamming capability is strong is provided.
In order to realize above-mentioned task, the present invention adopts following technical solution:
A kind of imaging device based on the pseudo-thermal light source of THz wave, it is characterized in that, comprise terahertz-wave parametric oscillator, the THz wave condenser lens, the hair side silicon chip of rotation, THz wave collimation lens, THz wave beam splitter, Terahertz reflected light path system and Terahertz transmitted light path system, and coincidence measurement device; Wherein:
Described hair side silicon chip places near the focus of THz wave condenser lens, and the hair side silicon chip is the focal length of THz wave collimation lens to the distance of THz wave collimation lens;
Described Terahertz transmitted light path system is by object to be imaged, the THz wave collecting lens, and the first Terahertz attenuator and the first schottky barrier photodiode form; Wherein, the first schottky barrier photodiode places on the focus of THz wave collecting lens; The first Terahertz attenuator places between THz wave collecting lens and the first schottky barrier photodiode;
Described Terahertz reflected light path system is comprised of the second Terahertz attenuator and the second schottky barrier photodiode; Wherein, the second schottky barrier photodiode is done the space plane image scanning; The first schottky barrier photodiode and the second schottky barrier photodiode are connected in the coincidence measurement device.
Imaging device based on the pseudo-thermal light source of THz wave of the present invention, have flexible operation, simple in structure, the advantage such as antijamming capability is strong, can be widely used in the fields such as military surveillance, remote sensing, biomedical imaging, safety and anti-terrorism, Multifunction Sensor, application prospect is huge.Compare with existing common THz wave imaging technique, have the following advantages:
1, in this THz imaging technology, object to be imaged is positioned in the Terahertz transmitted light path, the THz wave of carrying object image-forming information is all received by a point probe fixing, that do not do spatial discrimination, and the point probe in the Terahertz reflected light path is done the aerial image flat scanning, serves as the measurement of spatial resolution task.Like this, just realized separating of object and imaging detector.That is to say, even carry in the Terahertz transmitted light path after the light field of imaging object information is subject to the random disturbance of external environment, still can in the Terahertz reflected light path, obtain clearly as.Therefore, this THz imaging technology can significantly improve antijamming capability and the imaging dirigibility of terahertz imaging system;
2, in this imaging technique based on the pseudo-thermal light source of THz wave, therefore lower to the sensitivity requirement of terahertz detector because its image-forming principle is based on the principle of intensity fluctuation association, select the schottky barrier photodiode of terahertz wave band to get final product.
3, terahertz radiation source is terahertz-wave parametric oscillator, but it have volume little, simple and compact for structure, with low cost, be easy to safeguard the room temperature running, and can produce that the coherence is good, good directionality, linear polarization, narrow linewidth, linear polarization, high-octane pulse terahertz radiation.
Description of drawings
Fig. 1 is the imaging device structural representation based on the pseudo-thermal light source of THz wave of the present invention.
Mark among the figure represents respectively: 1, terahertz-wave parametric oscillator, 2, THz wave condenser lens, 3, the hair side silicon chip of rotation, 4, the THz wave collimation lens, 5, THz wave beam splitter, 6, object to be imaged, 7, the THz wave collecting lens, the 8, first Terahertz attenuator, 9 first schottky barrier photodiodes, 10, the second Terahertz attenuator, the 11, second schottky barrier photodiode, 12, the coincidence measurement device.
Below in conjunction with drawings and Examples the present invention is described in further detail.
Embodiment
As shown in Figure 1, present embodiment provides a kind of imaging device based on the pseudo-thermal light source of THz wave, comprise terahertz-wave parametric oscillator 1, THz wave condenser lens 2, the hair side silicon chip 3 of rotation, THz wave collimation lens 4, THz wave beam splitter 5, Terahertz transmitted light path system and Terahertz reflected light path system, and coincidence measurement device 12; Wherein:
Hair side silicon chip 3 places near the focus of THz wave condenser lens 2, and hair side silicon chip 3 is the focal length of THz wave collimation lens 4 to the distance of THz wave collimation lens 4;
Terahertz transmitted light path system is by object 6 to be imaged, and THz wave collecting lens 7, the first Terahertz attenuators 8 and the first schottky barrier photodiode 9 form; Wherein, the first schottky barrier photodiode 9 places on the focus of THz wave collecting lens 7; The first Terahertz attenuator 8 places between THz wave collecting lens 7 and the first schottky barrier photodiode 9;
Terahertz reflected light path system is comprised of the second Terahertz attenuator 10 and the second schottky barrier photodiode 11; Wherein, the second schottky barrier photodiode 11 is done the space plane image scanning; The first schottky barrier photodiode 9 and the second schottky barrier photodiode 11 are connected in coincidence measurement device 12.
In the present embodiment, select MgO:LiNbO
3Crystal or LiNbO
3Crystal is as terahertz-wave parametric oscillator 1(TPO) actuating medium, but TPO has the advantages such as little, simple and compact for structure, the cheap room temperature running of volume, and can produce the terahertz radiation of continuously adjustable, good directionality, relevant narrow linewidth.In addition, the THz wave that TPO produces has high line bias, can significantly improve the visibility based on the pseudo-hot photoimaging of THz wave.
In the present embodiment, Terahertz focus lamp 2, THz wave collimation lens 4 and THz wave collecting lens 7 all are to utilize high density white polyethylene or TPX material to make.
The THz wave that 2 couples of TPO of Terahertz focus lamp produce focuses on, and places the hair side silicon chip 3 of being made by high resistivity silicon near its focus, and with the angular velocity omega rotation, so that shorten the coherence time of the THz wave of transmission, has the character of pseudo-hot light.To reach coherence time in employed first, second schottky barrier photodiode of terahertz wave band (9,11) scope of time response.Distance between hair side silicon chip 3 and the THz wave collimation lens 4 is the focal length of THz wave collimation lens 4, like this so that become the parallel beam of collimation by the pseudo-hot light of Terahertz of rotation hair side silicon chip 3.By adjusting near the position of hair side silicon chip 3 THz wave focus lamp 2 focuses, with the size of control by the pseudo-hot light hot spot of the Terahertz behind the THz wave collimation lens 4, can realize the visibility of imaging and the optimum matching of resolution, to adapt to the concrete actual conditions of experiment.
The pseudo-hot light of this narrow band terahertz band is incident on the THz wave beam splitter 5 of being made by the twin polishing high resistivity wafers, by changing the THz wave incident angle, so that the THz wave of the THz wave of transmission and reflection output energy equates, and so that the facular model regularity of distribution of two THz wave light beams is identical, the intensity fluctuation Changing Pattern of two hot spots on the same point of correspondence is also identical.
In the THz wave transmission light path of THz wave beam splitter 5 transmissions, place object 6 to be imaged, the THz wave of carrying object spatial information is collected by THz wave collecting lens 7, and placing one in its focus, fixing point probe---the first Schottky-barrier diode 9 that is operated in terahertz wave band is surveyed.Between THz wave collecting lens 7 and the first schottky barrier photodiode 9, place the first Terahertz attenuator 8, saturated to prevent the first schottky barrier photodiode 9.In the present embodiment, above-mentioned light path is defined as Terahertz transmitted light path system.Distance from THz wave beam splitter 5 to object 6 to be imaged, and the distance from object 6 to be imaged to THz wave collecting lens 7 is not done restriction.
From the THz wave of THz wave beam splitter 5 reflections, after 10 decay of the second Terahertz attenuator, the second schottky barrier photodiode 11 of being done the space plane image scanning receives.In the present embodiment, above-mentioned light path is defined as Terahertz reflected light path system.Do not do restriction from the distance of THz wave beam splitter 5 to the second schottky barrier photodiodes 11 aerial image planes of scanning motion.
The first schottky barrier photodiode 9 in the Terahertz transmitted light path system and the signal of the second schottky barrier photodiode 11 in the Terahertz reflected light path system enter the coincidence measurement device 12 that is comprised of time-to-amplitude conversion instrument and multichannel analyzer, and carry out image-forming data acquisition with computer.
Need to prove; above-mentioned is a kind of optimal way of the present invention with embodiment; should be understood to be used for those skilled in the art by above-described embodiment and further understand the present invention; the invention is not restricted to above-described embodiment; those skilled in the art is on the technical scheme basis that above-described embodiment provides; the interpolation of making and equivalence are replaced, and all should belong to protection scope of the present invention.
Claims (7)
1. imaging device based on the pseudo-thermal light source of THz wave, it is characterized in that, comprise terahertz-wave parametric oscillator (1), THz wave condenser lens (2), the hair side silicon chip (3) of rotation, THz wave collimation lens (4), THz wave beam splitter (5), Terahertz transmitted light path system and Terahertz reflected light path system, and coincidence measurement device (12); Wherein:
Described hair side silicon chip (3) places near the focus of THz wave condenser lens (2), and hair side silicon chip (3) is the focal length of THz wave collimation lens (4) to the distance of THz wave collimation lens (4);
Described Terahertz transmitted light path system is by object to be imaged (6), THz wave collecting lens (7), and the first Terahertz attenuator (8) and the first schottky barrier photodiode (9) form; Wherein, the first schottky barrier photodiode (9) places on the focus of THz wave collecting lens (7); The first Terahertz attenuator (8) places between THz wave collecting lens (7) and the first schottky barrier photodiode (9);
Described Terahertz reflected light path system is comprised of the second Terahertz attenuator (10) and the second schottky barrier photodiode (11); Wherein, the second schottky barrier photodiode (11) is done the space plane image scanning; The first schottky barrier photodiode (9) and the second schottky barrier photodiode (11) are connected in coincidence measurement device (12).
2. the imaging device based on the pseudo-thermal light source of THz wave as claimed in claim 1 is characterized in that the actuating medium of described terahertz-wave parametric oscillator (1) is MgO:LiNbO
3Crystal or LiNbO
3Crystal.
3. the imaging device based on the pseudo-thermal light source of THz wave as claimed in claim 1 is characterized in that, described hair side silicon chip (3) adopts high resistivity silicon to make.
4. the imaging device based on the pseudo-thermal light source of THz wave as claimed in claim 1 is characterized in that, described THz wave beam splitter (5) adopts the high resistivity silicon of twin polishing to make.
5. the imaging device based on the pseudo-thermal light source of THz wave as claimed in claim 1 is characterized in that described first, second schottky barrier photodiode (9,11) is the schottky barrier photodiode that is operated in the THz wave wave band.
6. the imaging device based on the pseudo-thermal light source of THz wave as claimed in claim 1, it is characterized in that described THz wave condenser lens (2), THz wave collimation lens (4) and THz wave collecting lens (7) are made by high density white polyethylene or TPX.
7. the imaging device based on the pseudo-thermal light source of THz wave as claimed in claim 1 is characterized in that described coincidence measurement device (12) comprises time-to-amplitude conversion instrument and multichannel analyzer.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201210548893.4A CN102998261B (en) | 2012-12-17 | 2012-12-17 | Terahertz wave pseudo heat light source-based imaging device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201210548893.4A CN102998261B (en) | 2012-12-17 | 2012-12-17 | Terahertz wave pseudo heat light source-based imaging device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN102998261A true CN102998261A (en) | 2013-03-27 |
| CN102998261B CN102998261B (en) | 2015-02-04 |
Family
ID=47927108
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201210548893.4A Expired - Fee Related CN102998261B (en) | 2012-12-17 | 2012-12-17 | Terahertz wave pseudo heat light source-based imaging device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN102998261B (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103256503A (en) * | 2013-04-19 | 2013-08-21 | 中国科学院上海光学精密机械研究所 | Preparation method for addressing type high-speed pseudo-thermal light source |
| CN103776795A (en) * | 2013-12-31 | 2014-05-07 | 西北大学 | Terahertz-stokes two-photon entangled imaging device of spherical wave pump |
| CN106290226A (en) * | 2016-09-19 | 2017-01-04 | 成都曙光光纤网络有限责任公司 | A kind of Terahertz transmission imaging device and method |
| CN106769997A (en) * | 2016-11-14 | 2017-05-31 | 中国电子科技集团公司第四十研究所 | A kind of Terahertz scanned imagery device |
| CN107727234A (en) * | 2017-09-27 | 2018-02-23 | 上海理工大学 | The instable devices and methods therefor of quick detection backward wave tube Terahertz output frequency |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP2040094A2 (en) * | 2007-09-18 | 2009-03-25 | Honeywell International Inc. | Correlated ghost imager |
-
2012
- 2012-12-17 CN CN201210548893.4A patent/CN102998261B/en not_active Expired - Fee Related
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP2040094A2 (en) * | 2007-09-18 | 2009-03-25 | Honeywell International Inc. | Correlated ghost imager |
Non-Patent Citations (5)
| Title |
|---|
| WU LING-AN ET.AL: "《Correlated two－photon imaging with true thermal light》", 《OPTICS LETTERS》 * |
| ZHAI YAN-HUA ET.AL: "《Two-photon interference with two independent pseudothermal sources》", 《PHYSICAL REVIEW A》 * |
| 孙博等: "《基于光学方法的太赫兹辐射源》", 《中国激光》 * |
| 曹彬等: "《利用红外光源实现二维"鬼"成像》", 《半导体光电》 * |
| 陈明亮等: "《基于稀疏阵赝热光***的强度关联成像研究》", 《光学学报》 * |
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103256503A (en) * | 2013-04-19 | 2013-08-21 | 中国科学院上海光学精密机械研究所 | Preparation method for addressing type high-speed pseudo-thermal light source |
| CN103776795A (en) * | 2013-12-31 | 2014-05-07 | 西北大学 | Terahertz-stokes two-photon entangled imaging device of spherical wave pump |
| CN103776795B (en) * | 2013-12-31 | 2016-05-18 | 西北大学 | A kind of Terahertz-Stokes two-photon of spherical wave pumping tangles imaging device |
| CN106290226A (en) * | 2016-09-19 | 2017-01-04 | 成都曙光光纤网络有限责任公司 | A kind of Terahertz transmission imaging device and method |
| CN106290226B (en) * | 2016-09-19 | 2020-04-17 | 成都曙光光纤网络有限责任公司 | Terahertz transmission imaging device and method |
| CN106769997A (en) * | 2016-11-14 | 2017-05-31 | 中国电子科技集团公司第四十研究所 | A kind of Terahertz scanned imagery device |
| CN107727234A (en) * | 2017-09-27 | 2018-02-23 | 上海理工大学 | The instable devices and methods therefor of quick detection backward wave tube Terahertz output frequency |
| CN107727234B (en) * | 2017-09-27 | 2020-03-10 | 上海理工大学 | Device and method for rapidly detecting terahertz output frequency instability of backward wave tube |
Also Published As
| Publication number | Publication date |
|---|---|
| CN102998261B (en) | 2015-02-04 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US10393657B2 (en) | SPR detection system and method | |
| US7897924B2 (en) | Beam scanning imaging method and apparatus | |
| US9733108B2 (en) | Method and apparatus for remote sensing using optical orbital angular momentum (OAM)-based spectroscopy for detecting lateral motion of a remote object | |
| US9529083B2 (en) | Three-dimensional scanner with enhanced spectroscopic energy detector | |
| CN102175662B (en) | Portable Terahertz remote sensing detector and remote detection method | |
| US7557348B2 (en) | Method and system for imaging an object using multiple distinguishable electromagnetic waves transmitted by a source array | |
| CN102998261B (en) | Terahertz wave pseudo heat light source-based imaging device | |
| CN101806625B (en) | Static Fourier transform interference imaging spectrum full-polarization detector | |
| CN102692394B (en) | Two-dimensional imaging method and device based on thermal lens effect | |
| CN102998260B (en) | Two-photon entanglement-based terahertz wave imaging device | |
| CN106290227B (en) | Terahertz wave reflection imaging device and method | |
| CN103033265A (en) | Device and method of space heterodyning interference hyper spectrum imaging | |
| CN103712993A (en) | Method and device for detecting three-dimensional distribution of absorption characteristics in transparent optical material body | |
| JP2009222616A (en) | Method and apparatus for measuring azimuth | |
| CN109946710A (en) | A kind of more polarized laser imaging devices of dual wavelength | |
| CN106769994B (en) | Terahertz sub-wavelength resolution imaging device | |
| CN103674453A (en) | Thermal wave imaging gas leakage detecting device and method | |
| KR101296748B1 (en) | Spectroscopy and imaging system of high-speed and high-resolution using electromagnetic wave based on optics | |
| CN203629778U (en) | Thermal wave imaging gas leakage detection system | |
| RU105738U1 (en) | SMALL THERAHZ SPECTROMETER | |
| RU2544305C1 (en) | Laser location system | |
| CN103558160B (en) | A kind of method and system improving light spectrum image-forming spatial resolution | |
| CN202676595U (en) | Two-dimensional imaging device based on thermal lens effect | |
| CN104535199B (en) | A kind of method of coherent measurement THz wave frequency | |
| CN104155002B (en) | Scanning imagery spectrometer system |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20150204 Termination date: 20151217 |
|
| EXPY | Termination of patent right or utility model |