CN102735887B - Single-ended active probe circuit of digital oscilloscope - Google Patents
Single-ended active probe circuit of digital oscilloscope Download PDFInfo
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- CN102735887B CN102735887B CN201210245621.7A CN201210245621A CN102735887B CN 102735887 B CN102735887 B CN 102735887B CN 201210245621 A CN201210245621 A CN 201210245621A CN 102735887 B CN102735887 B CN 102735887B
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Abstract
The invention discloses a single-ended active probe circuit of a digital oscilloscope, which combines high-speed signal completeness test requirements and combines an existing component based on a broadband testing principle for analyzing a single-ended active probe. Through an impedance conversion module, the requirements of the single-ended active probe in high input impedance, smallest input capacitance and small output impedance are realized; simultaneously, through an output circuit, the single-ended active probe circuit can be matched with the input impedance of 50 ohm of the oscilloscope.
Description
Technical field
The invention belongs to oscillograph technical field, more specifically say, relate to the single-ended active probe circuit of a kind of digital oscilloscope.
Background technology
Digital oscilloscope probe is the electronic unit that connects circuit-under-test and digital oscilloscope input end, in Electronic Testing, is widely used.Conventionally digital oscilloscope probe is divided into passive probe and active probe.
Passive probe is made by wire and connector, when needs decay or compensation, also comprises resistor and capacitor.In passive probe, there is no active device, transistor or amplifier, be not therefore required to be probe power supply.Conventionally, passive probe input impedance high (1M Ω or 1M Ω), but limited bandwidth is generally no more than 500MHz(-3dB), in low bandwidth test, use extensively.
Active probe comprises or relies on active device, as transistor field effect transistor, needs outside that power supply is provided.In modal situation, active device is a kind of field effect transistor (FET), and it provides low-down input capacitance, and low electric capacity can guarantee high input impedance in wider frequency range, reduces the loss of high-frequency signal.
Active probe is divided into single-ended active probe and difference active probe, and single-ended active probe be take ground as reference, realizes circuit-under-test single-spot testing, can meet major applications occasion; Difference active probe can be measured the signal of the device of floating, it is that two symmetrical voltage probes form in fact, respectively there are to good insulation and higher resistance in location, differential signal is mutual reference, rather than with reference to the signal of ground connection, so difference detector is mainly used in the test to differential signal, can in wider frequency range, provide very high common-mode rejection ratio (CMRR).
Domestic digital oscilloscope is started late, and is mainly several years ago to take the low side oscillograph of low bandwidth, low sampling rate as main, and supporting probe is passive probe.Middle and high-end market is monopolized by U.S. San great oscillograph manufacturer, and matching component active probe is also formed to blockade on new techniques and monopolization, and active probe price is very expensive, several thousand dollars often of unit prices.In recent years along with continuous progress and the accumulation of domestic technique, domestic digital oscilloscope bandwidth starts to enter the 1GHz epoch, realize the accurate measurement to higher frequency signal, except improving self analog signal conditioner passage input bandwidth, also need to provide matching used active probe with it.
Active probe principle:
The data providing from foreign vendor, single-ended active probe ultimate principle as shown in Figure 1, the front end of single-ended active probe has the amplifier of a high bandwidth, and the input impedance of amplifier is higher conventionally, so single-ended active probe can provide higher input impedance; Simultaneously amplifier output has stronger driving force, after can connect the transmission lines of the extraordinary impedances of 50 Ω and the load that drives 50 Ω.Because the transmission line of 50 Ω can provide very high bandwidth, and the amplifier of front end is broad band amplifier, so whole single-ended active probe system can provide the bandwidth higher than passive probe.From principle, analyze, the height input bandwidth characteristic key of single-ended active probe is to have the amplifier of front end to guarantee, this high bandwidth high input impedance amplifier is realized by custom layout by external oscillograph producer, and to guarantee that volume is little, so just can be placed in the limited space of probe, therefore realize cost very high, and the broadband operational amplifier of this customization articles not for sale that are manufacturer.
Difference active probe structural principle as shown in Figure 2, is that with the difference of single-ended active probe its front end is differential amplifier, same, and this type of broadband difference input amplifier in difference active probe is also that customization forms.
Although it is many that relevant oscillograph active probe principle relevant introduced data, but be all to describe from the principle of work and power, do not provide specific design circuit, and oscillograph producer realizes abroad by customizing special-purpose integrated circuit (IC), and this class IC does not sell on market.
Summary of the invention
The object of the invention is to overcome the deficiencies in the prior art, provide a kind of digital oscilloscope single-ended active probe circuit, low to reduce the cost of active probe, promote cost performance.
For achieving the above object, the single-ended active probe circuit of a kind of digital oscilloscope of the present invention, is characterized in that, comprising:
One high pass module, is high-frequency signal path, and for direct current and the low frequency part of Isolation input signal, the HFS of input signal passes through thus;
One low-pass module, is low frequency signal path, and direct current and the low frequency part of input signal are passed through thus; Include a LOCAL FEEDBACK network, for regulating input signal to allow the upper limiting frequency of passing through, in addition, low-pass module also receives the feedback signal from DC feedback network, for stablizing the quiescent point of single-ended active probe circuit;
One impedance transformation module, includes broadband field effect transistor and voltage follower circuit;
Wherein wideband field effect pipe has high input impedance, and output impedance is minimum, realizes the impedance transformation of input signal;
For strengthening, drive, in broadband, field effect transistor output terminal is connected to voltage follower circuit, and voltage follower circuit is designed to penetrate a grade follower with broadband transistor, or is designed to voltage follower with broadband operational amplifier;
One DC feedback network, delivers to low-pass module by the d. c. voltage signal feedback of voltage follower circuit output, realizes stable DC point;
One output circuit, for frequency input signal being compensated and gain regulates, regulates output impedance, thereby matches with the 50 Ω input impedance of rear class oscillograph.
First input signal is input to impedance transformation module through high pass module, low-pass module carries out impedance transformation and strengthens driving, and then in output circuit, carries out that frequency is supplemented, gain-adjusted and output impedance regulates, and finally exports to rear class oscillograph.
Goal of the invention of the present invention is achieved in that
The single-ended active probe circuit of digital oscilloscope of the present invention is in conjunction with high speed signal integrity test requirement, by analyzing the broadband test principle of single-ended active probe, in conjunction with existing components and parts, proposes.By impedance transformation module realized single-ended active probe high input impedance, input capacitance is as far as possible little, the simultaneously little requirement of output impedance by output circuit, can match with oscillograph 50 Ω input impedance single-ended active probe simultaneously.
Accompanying drawing explanation
Fig. 1 is the single-ended active probe structural principle of oscillograph in prior art;
Fig. 2 is oscillograph difference active probe structural principle in prior art
Fig. 3 is a kind of embodiment theory diagram of the single-ended active probe circuit of digital oscilloscope of the present invention;
Fig. 4 is the schematic diagram of the single-ended active probe circuit of the digital oscilloscope shown in Fig. 3;
Fig. 5 is the single-ended active probe circuit one embodiment lower frequency response curve of digital oscilloscope.
Embodiment
Below in conjunction with accompanying drawing, the specific embodiment of the present invention is described, so that those skilled in the art understands the present invention better.Requiring particular attention is that, in the following description, when perhaps the detailed description of known function and design can desalinate main contents of the present invention, these are described in here and will be left in the basket.
Fig. 3 is a kind of embodiment theory diagram of the single-ended active probe circuit of digital oscilloscope of the present invention.
In the present embodiment, as shown in Figure 3, the single-ended active probe circuit of digital oscilloscope of the present invention comprises high pass module 1, low-pass module 2, impedance transformation module 3, DC feedback network 4 and output circuit 5.
High pass module 1 is high-frequency signal path, includes a capacitance, and for direct current and the low frequency part of Isolation input signal, the HFS of input signal passes through thus, sends in impedance transformation module 3.
Low-pass module 2 is low frequency signal path, and direct current and the low frequency part of input signal are passed through thus, and sends into impedance transformation module 3.In low-pass module 2, include a LOCAL FEEDBACK network, for regulating the upper limiting frequency that allows input signal to pass through, in addition, low-pass module 2 also receives the feedback signal from DC feedback network 4, for stablizing the quiescent point of single-ended active probe circuit.
In impedance transformation module 3, there are broadband field effect transistor and voltage follower circuit.Wherein wideband field effect pipe has high input impedance, and output impedance is minimum, realizes the impedance transformation of input signal; For strengthening, drive, in broadband, field effect transistor output terminal is connected to voltage follower circuit, and voltage follower circuit is designed to penetrate a grade follower with broadband transistor, or is designed to voltage follower with broadband operational amplifier.
DC feedback network 4 is delivered to low-pass module 3 by the d. c. voltage signal feedback of voltage follower circuit output, realizes stable DC point.Meanwhile, by regulating the parameter in this DC feedback network, can realize the adjusting of single-ended active probe circuit DC current gain.
5 pairs of frequency input signals of output circuit compensate and gain-adjusted, output impedance is regulated, thereby match with the 50 Ω input impedance of rear class oscillograph.
First input signal is input to impedance transformation module 3 through high pass module 1, low-pass module 2 carries out impedance transformation and strengthens driving, and then in output circuit 5, carries out that frequency is supplemented, gain-adjusted and output impedance regulates, and finally exports to rear class oscillograph.
In output circuit 5, by its gain-adjusted, can realize attenuation multiple is 20dB(10 times), or decay to 14dB(5 doubly).
Fig. 4 is the schematic diagram of the single-ended active probe circuit of the digital oscilloscope shown in Fig. 3.
In the present embodiment, as shown in Figure 4, the input signal input end of the single-ended active probe circuit of digital oscilloscope of the present invention is also connected to the parallel circuit of a small resistor R1 and little capacitor C 1 composition, small resistor R1 resistance at several ~ tens ohm, little capacitor C 1 capacity at several pF, input signal, after this parallel circuit, is sent into respectively high pass module 1, low-pass module 2.In damping test link, due to distributed capacitance, distributed inductance that the factors such as lead-in wire exist, this small resistor R1 and little capacitor C 1, for preventing resonance, play the effect of buffering.
High pass module 1 comprises resistance R 2 and capacitance C3, and the HFS of input signal is delivered to the broadband field effect transistor Q1 grid g1 in impedance transformation module 3 by resistance R 2 and capacitance C3.
Low-pass module 2 comprises that JFET type operational amplifier U1, resistance R 7, R8 and the capacitor C 4 of resistance R 3 and R4, the low drift of low noise form a LOCAL FEEDBACK network and output resistance R6.
Resistance R 3 and R4 series connection sum are 1M Ω, and input signal is through resistance R 3, resistance R 4 ground connection, and resistance R 3 and R4 are connected in series the anode of a little receiving operational amplifier U1, thereby guarantee that input resistance is strict 1M Ω.
Operational amplifier U1 output terminal is received broadband field effect transistor Q1 grid g1 by resistance R 6 on the one hand, on the other hand by resistance R 7, R8 ground connection, the tie point of resistance R 7, R8 is connected to the negative terminal of operational amplifier U1 by capacitor C 4, form LOCAL FEEDBACK network, for regulating input signal to allow the upper limiting frequency of passing through, and meet:
What impedance transformation module 3 comprised that broadband field effect transistor Q1 and peripheral circuit thereof and broadband transistor Q2 and peripheral circuit thereof form penetrates grade follower as voltage follower circuit.
Broadband field effect transistor Q1 is broadband dual-gate field-effect pipe, input is respectively grid g1 and g2, wherein grid g1 is for the input of input signal, and grid g2 is for DC offset voltage input, very high input resistance (G Ω level) and very little input capacitance (a few pF).
The peripheral circuit of broadband field effect transistor Q1 comprises the resistance R 9 of be connected to-5V of source class power supply and resistance R 16, R15, capacitor C 2, + 5V power supply is received ground through resistance R 16, R15, resistance R 16, R15 tie point meet the grid g2 of broadband field effect transistor Q1, can make wideband field effect pipe Q1 obtain best DC point, the partial pressure value of choosing is here 4V.Capacitor C 2 is in parallel with resistance R 15, to offering the voltage of the grid g2 of broadband field effect transistor Q1, carries out filtering.Connect+5V of the drain electrode power supply of broadband field effect transistor Q1.
The source class of broadband field effect transistor Q1 is connected with broadband transistor Q2 base stage through resistance R 11, the collector of broadband transistor Q2, emitter are respectively by resistance R 10, be connected to+5V of resistance R 12 power supply ,-5V voltage, form voltage follower circuit, input signal is through resistance R 13 outputs.Wherein, the value that is connected on the source class of broadband field effect transistor Q1 and the small resistor R11 of broadband transistor Q2 base stage is greater than 1 Ω and is less than 100 Ω, for adjusting high frequency response, makes frequency response have good flatness.Resistance R 13 is about 1 ~ 2 Ω resistance, for buffering, avoids broadband transistor to produce high frequency oscillation.In addition, the collector of broadband transistor Q2 is connected to ground by electric capacity, and resistance R 10 and capacitor C 5 form the RC filtering of right+5V power supply like this, can reduce like this noise of broadband transistor Q2 power supply.
The output of impedance transformation module 3, input signal outputs to DC feedback network 4 and output circuit 5 through resistance R 13.
DC feedback network 4 is comprised of resistance R 15, resistance R 5 with being connected in series to, and the output of impedance transformation module 3, after resistance R 15, resistance R 5 dividing potential drops, feeds back to the negative terminal of operational amplifier U1, and meets:
In formula 1-2, the resistance of resistance R 15 and R5 is except considering the ratio relation of resistance R 3 and R4, also needs to consider that AC signal carries out trickle adjustment through broadband field effect transistor and transistorized insertion loss A, and insertion loss A is about 0.5 ~ 2dB conventionally.Relation is as follows accurately:
By regulating resistance R15, resistance R 5 ratios, can realize the adjusting of circuit DC current gain, compensation insertion loss A.
Output circuit 5 comprises capacitor C 6, C7 and resistance R 14, and resistance R 14 is in parallel with capacitor C 7; One termination input signal, one end capacitor C 6 ground connection, for the adjusting of high frequency frequency response, carry out frequency compensation to input signal; Input signal is through resistance R in parallel 14 and capacitor C 7 outputs, output impedance is mainly determined by R14, output circuit output signal is received oscillograph input end after probe transmission line, form high frequency low-resistance potential-divider network with 50 Ω of oscillograph inside, reach the object of decay and coupling, wherein, capacitor C 7 and resistance R 14 parallel connections, for compensating high-frequency signal.Here the value of resistance R 14 (during decay 20dB) is determined by following mode:
Wherein A is the insertion loss of broadband field effect transistor and broadband transistor, can be according to field effect transistor and transistorized model emulation obtain accurately, conventionally be about-0.5 ~-2dB, the resistor network decay sum of this loss and rear class is-20dB, the probe (be conventionally also expressed as * 10) of 10 times of decaying.
Table 1 is in this example, the components and parts reference list of the single-ended active probe circuit of digital oscilloscope.
Table 1
In this example, by the single-ended active probe circuit of digital oscilloscope is tested, as shown in Figure 5, active probe circuit decays to 10 times (20dB) to frequency response curve, and three dB bandwidth is better than the frequency response of 1.5GHz.
In the present embodiment, select the JFET type operational amplifier A DA4XXX of low noise, low drift, because JFET type amplifier has very high input impedance (approximately 10
12Ω), can guarantee that like this input impedance is controlled at strict 1M Ω; Q1, Q2 select that broadband performance is good, low noise, pipe that volume is little, and Q1 is BF9XXX, and Q is BFS5XXX; PCB selects the little medium sheet material of high-frequency loss in addition, contributes to guarantee high frequency bandwidth.
The single-ended active probe circuit of digital oscilloscope proposing in the present invention, except because what select is resolution element, compare external probe, volume is bigger, but substantially can accept, and it is low to realize cost, sexual valence is high, contributes to promote domestic oscillograph level of aggregation, breaks the monopolization situation of external minority oscillograph producer, greatly save broadband test cost, there is extraordinary promotional value.
In addition,, along with the continuous progress of domestic semiconductor technology, this circuit can also customize as future the prototype circuit of probe IC, thereby this circuit is realized by integrated circuit, will contribute to further to reduce volume, improves the consistance of product.
Although above the illustrative embodiment of the present invention is described; so that those skilled in the art understand the present invention; but should be clear; the invention is not restricted to the scope of embodiment; to those skilled in the art; as long as various variations appended claim limit and definite the spirit and scope of the present invention in, these variations are apparent, all utilize innovation and creation that the present invention conceives all at the row of protection.
Claims (4)
1. the single-ended active probe circuit of digital oscilloscope, is characterized in that, comprising:
One high pass module, is high-frequency signal path, and for direct current and the low frequency part of Isolation input signal, the HFS of input signal passes through thus;
One low-pass module, is low frequency signal path, and direct current and the low frequency part of input signal are passed through thus; Include a LOCAL FEEDBACK network, for regulating input signal to allow the upper limiting frequency of passing through, in addition, low-pass module also receives the feedback signal from DC feedback network, for stablizing the quiescent point of single-ended active probe circuit;
One impedance transformation module, includes broadband field effect transistor and voltage follower circuit;
Wherein wideband field effect pipe has high input impedance, and output impedance is minimum, realizes the impedance transformation of input signal;
For strengthening, drive, in broadband, field effect transistor output terminal is connected to voltage follower circuit, and voltage follower circuit is designed to penetrate a grade follower with broadband transistor, or is designed to voltage follower with broadband operational amplifier;
One DC feedback network, delivers to low-pass module by the d. c. voltage signal feedback of voltage follower circuit output, realizes stable DC point;
One output circuit, for frequency input signal being compensated and gain regulates, regulates output impedance, thereby matches with the 50 Ω input impedance of rear class oscillograph;
First input signal is input to impedance transformation module through high pass module, low-pass module carries out impedance transformation and strengthens driving, and then in output circuit, carries out that frequency is supplemented, gain-adjusted and output impedance regulates, and finally exports to rear class oscillograph;
In described impedance transformation module, broadband field effect transistor Q1 is broadband dual-gate field-effect pipe, input is respectively grid g1 and g2, wherein grid g1 is for the input of input signal, grid g2 is for DC offset voltage input, has for the very high input resistance of G Ω level and is the very little input capacitance of several pF;
The peripheral circuit of broadband field effect transistor Q1 comprises the resistance R 9 of be connected to-5V of source class power supply and resistance R 16, R15;
+ 5V power supply is received ground through resistance R 16, R15, and resistance R 16, R15 tie point meet the grid g2 of broadband field effect transistor Q1, can make wideband field effect pipe Q1 obtain best DC point;
Capacitor C 2 is in parallel with resistance R 15, to offering the voltage of the grid g2 of broadband field effect transistor Q1, carries out filtering, connect+5V of the drain electrode power supply of broadband field effect transistor Q1;
The collector of broadband transistor Q2, emitter, respectively by resistance R 10, be connected to+5V of resistance R 12 power supply ,-5V voltage, form voltage follower circuit; The source class of broadband field effect transistor Q1 is connected with broadband transistor Q2 base stage through resistance R 11, input signal is through resistance R 13 outputs, wherein, the value that is connected on the source class of broadband field effect transistor Q1 and the small resistor R11 of broadband transistor Q2 base stage is greater than 1 Ω and is less than 100 Ω, be used for adjusting high frequency response, make frequency response there is good flatness; Resistance R 13 is about 1～2 Ω resistance, for buffering, avoids broadband transistor to produce high frequency oscillation.
2. active probe circuit according to claim 1, it is characterized in that, described high pass module comprises resistance R 2 and capacitance C3, and the HFS of input signal is delivered to the grid g1 of the broadband field effect transistor Q1 in impedance transformation module by resistance R 2 and capacitance C3;
Described low-pass module comprises that JFET type operational amplifier U1, resistance R 7, R8 and the capacitor C 4 of resistance R 3 and R4, the low drift of low noise form a LOCAL FEEDBACK network and output resistance R6;
Resistance R 3 and R4 series connection sum are 1M Ω, and input signal is through resistance R 3, resistance R 4 ground connection, and resistance R 3 and R4 are connected in series the anode of a little receiving operational amplifier U1;
Operational amplifier U1 output terminal is received broadband field effect transistor Q1 grid g1 by resistance R 6 on the one hand, on the other hand by resistance R 7, R8 ground connection, the tie point of resistance R 7, R8 is connected to the negative terminal of operational amplifier U1 by capacitor C 4, form LOCAL FEEDBACK network, for regulating input signal to allow the upper limiting frequency of passing through, and meet:
3. active probe circuit according to claim 2, it is characterized in that, described DC feedback network is comprised of resistance R 15, resistance R 5 with being connected in series to, and the output of impedance transformation module is after resistance R 15, resistance R 5 dividing potential drops, feed back to the negative terminal of operational amplifier U1, and meet:
Wherein A is the insertion loss of broadband field effect transistor and broadband transistor.
4. active probe circuit according to claim 1, is characterized in that, described output circuit comprises capacitor C 6, C7 and resistance R 14, and resistance R 14 is in parallel with capacitor C 7; Input signal end, by capacitor C 6 ground connection, for the adjusting of high frequency frequency response, carries out frequency compensation to input signal; Input signal is through resistance R in parallel 14 and capacitor C 7 outputs, output impedance is mainly determined by R14, output circuit output signal is received oscillograph input end after probe transmission line, form high frequency low-resistance potential-divider network with 50 Ω of oscillograph inside, reach the object of decay and coupling, wherein, capacitor C 7 and resistance R 14 parallel connections, for compensating high-frequency signal.
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Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4803423A (en) * | 1986-06-06 | 1989-02-07 | U.S. Philips Corp. | Input circuit for a probe of a logic analyser and probe and logic analyser provided with such a circuit |
| JP2008014846A (en) * | 2006-07-07 | 2008-01-24 | Yokogawa Electric Corp | Active probe |
| JP2008261722A (en) * | 2007-04-12 | 2008-10-30 | Yokogawa Electric Corp | Probe |
| CN101750522A (en) * | 2004-06-01 | 2010-06-23 | 特克特朗尼克公司 | Wide bandwidth attenuator input circuit for a measurement probe |
| DE102010027567A1 (en) * | 2010-02-19 | 2011-08-25 | Rohde & Schwarz GmbH & Co. KG, 81671 | Probe head system i.e. oscilloscope for detecting input signal, has transfer line transmitting input signal, where low and high frequency ranges of transmitted input signal are amplified by two different amplifiers |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102008009962A1 (en) * | 2007-12-04 | 2009-06-10 | Rohde & Schwarz Gmbh & Co. Kg | Probe with high accuracy DC voltage measurement |
-
2012
- 2012-07-16 CN CN201210245621.7A patent/CN102735887B/en not_active Expired - Fee Related
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4803423A (en) * | 1986-06-06 | 1989-02-07 | U.S. Philips Corp. | Input circuit for a probe of a logic analyser and probe and logic analyser provided with such a circuit |
| CN101750522A (en) * | 2004-06-01 | 2010-06-23 | 特克特朗尼克公司 | Wide bandwidth attenuator input circuit for a measurement probe |
| JP2008014846A (en) * | 2006-07-07 | 2008-01-24 | Yokogawa Electric Corp | Active probe |
| JP2008261722A (en) * | 2007-04-12 | 2008-10-30 | Yokogawa Electric Corp | Probe |
| DE102010027567A1 (en) * | 2010-02-19 | 2011-08-25 | Rohde & Schwarz GmbH & Co. KG, 81671 | Probe head system i.e. oscilloscope for detecting input signal, has transfer line transmitting input signal, where low and high frequency ranges of transmitted input signal are amplified by two different amplifiers |
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