CN102723398A - Method for removing phosphorosilicate glass from monocrystalline silicon wafer in monocrystalline silicon battery production - Google Patents

Method for removing phosphorosilicate glass from monocrystalline silicon wafer in monocrystalline silicon battery production Download PDF

Info

Publication number
CN102723398A
CN102723398A CN2011100773909A CN201110077390A CN102723398A CN 102723398 A CN102723398 A CN 102723398A CN 2011100773909 A CN2011100773909 A CN 2011100773909A CN 201110077390 A CN201110077390 A CN 201110077390A CN 102723398 A CN102723398 A CN 102723398A
Authority
CN
China
Prior art keywords
monocrystalline silicon
phosphorosilicate glass
silicon piece
cleaning fluid
battery production
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN2011100773909A
Other languages
Chinese (zh)
Inventor
刘万学
刘志坚
程明辉
吴帅
杨帅
韩丽
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jilin Qingda New Energy Electric Power Co Ltd
Original Assignee
Jilin Qingda New Energy Electric Power Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jilin Qingda New Energy Electric Power Co Ltd filed Critical Jilin Qingda New Energy Electric Power Co Ltd
Priority to CN2011100773909A priority Critical patent/CN102723398A/en
Publication of CN102723398A publication Critical patent/CN102723398A/en
Pending legal-status Critical Current

Links

Classifications

    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P70/00Climate change mitigation technologies in the production process for final industrial or consumer products
    • Y02P70/50Manufacturing or production processes characterised by the final manufactured product

Abstract

The invention relates to the solar battery production field and concretely relates to a method for removing phosphorosilicate glass from a monocrystalline silicon wafer in monocrystalline silicon battery production. According to the method, an HF acid (electronic grade) solution with certain concentration is controlled to react with the phosphorosilicate glass generated after diffusion to remove a phosphorus-containing SiO2 layer, peel off surface impurities and effectively generate passivation. Meanwhile, excessive corrosion of the HF acid is easily controlled, no damage to the Si-Si bond of the silicon wafer is caused, and the occurrence of defective wafers such as wafers with white lines caused by composition during PECVD film forming process is prevented.

Description

During producing, removes a kind of monocrystalline silicon battery the method for phosphorosilicate glass on the monocrystalline silicon piece
Technical field
The present invention relates to the manufacture of solar cells field, remove the method for phosphorosilicate glass on the monocrystalline silicon piece during a kind of specifically monocrystalline silicon battery is produced.
Background technology
China pays much attention to the research and development of solar cell, and as far back as during the Seventh Five-Year Plan period, national key subjects have been listed in the research work of amorphous silicon semiconductor in; 85 and during the State's Ninth Five-Year Plan period, China focuses on aspect such as solar energy in large area battery to research and development.In October, 2003; National Development and Reform Committee, the Department of Science and Technology make the development plan of the five-year solar energy resources; Committee of Development and Reform's " bright engineering " 10,000,000,000 yuan of application that are used to advance solar energy generation technology of will raising funds are planned national solar power system total installation of generating capacity in 2015 and are reached 300 megawatts.China has become the maximum manufacturing nation of global photovoltaic product, and China is about to " the new forms of energy development planning " of appearance, and the installed capacity of China's photovoltaic generation is planned to the year two thousand twenty and reaches 20GW, is more than 10 times of original " regenerative resource medium-term and long-term plans " middle 1.8GW.
The application of solar cell gets into departments such as industry, commerce, agricultural, communication, household electrical appliance and public utility from military field, space industry; Especially can be dispersedly in the outlying district, high mountain, desert, island and rural area use, to save the very expensive transmission line of cost.
At present; Because different manufacturers is used different diffusion technology technology when the produce single crystal silicon chip; So cause one deck phosphorosilicate glass that monocrystalline silicon sheet surface forms in different diffusion technologys to have different othernesses, cause the generation that can produce the defective sheets such as white line of different probabilities behind the PECVD plated film, influence the quality of product; Increase is in the amount of doing over again of PECVD operation, and what influence was produced normally carries out.
Summary of the invention
The objective of the invention is in order to solve the deficiency of above-mentioned prior art; Provide a kind of monocrystaline silicon solar cell sheet production to remove a kind of method of phosphorosilicate glass; Use this method and not only can effectively remove the phosphorosilicate glass that produces because of different diffusion technologys; But also can guarantee to carry out avoiding producing defectives such as white line in the coating process in the PECVD operation, can effectively control product quality.
The objective of the invention is to realize like this; Be to add 130-140 liters of deionized waters in 150-160 process of jacking grooves at volume at first, temperature is controlled between 18-23 ℃, once adds 16 liters of the electron level HF acid of concentration 48% ~ 49%; Evenly stir with the long rod of PP material, it is subsequent use to obtain cleaning fluid; Then specification is put into Carrier box for the 125*125 monocrystalline silicon piece; A plurality of Carrier boxs are packed in the Da Hua basket as one batch successively; The quantity that requires each batch monocrystalline silicon piece is between 300-400; The Da Hua indigo plant that monocrystalline silicon piece will be housed is at last put into the technology groove of being furnished with cleaning fluid, soaks 100 ~ 120 seconds, and cleaning fluid subsequent use in the above-mentioned technology groove can be produced 40 ~ 50 batches continuously.
Advantage of the present invention is:
1, the present invention with the phosphorosilicate glass reaction that the diffusion back produces, removes phosphorous SiO through the certain density HF acid of control (electron level) solution 2Layer is peeled off surface impurity, effectively produces passivation.Simultaneously easily the excessive corrosion of control HF acid is not destroyed silicon chip Si-Si key, has avoided producing in the PECVD film forming procedure compound and the generation of defective sheets such as white line occurs.
2, the inventive method in process of production can fluid infusion and other parameter adjustments, can produce a plurality of batches continuously.
Embodiment
Embodiment 1
At volume is to add 130 liters of deionized waters in the 150 process of jacking grooves, and temperature is controlled at 18 ℃, once adds 16 liters of HF acid (electron level, concentration 48% ~ 49%), evenly stirs with the long rod of PP material, and it is subsequent use to obtain cleaning fluid; Then specification is put into Carrier box for the 125*125 monocrystalline silicon piece; A plurality of Carrier boxs are packed in the Da Hua basket as one batch successively; The quantity that requires each batch monocrystalline silicon piece is at 300; The Da Hua indigo plant that monocrystalline silicon piece will be housed is at last put into the technology groove of being furnished with cleaning fluid, soaks 100 seconds, and cleaning fluid subsequent use in the above-mentioned technology groove can be produced 40 batches continuously.
Embodiment 2
At volume is to add 135 liters of deionized waters in the 155 process of jacking grooves, and temperature is controlled at 20 ℃, once adds 16 liters of HF acid (electron level, concentration 48% ~ 49%), evenly stirs with the long rod of PP material, and it is subsequent use to obtain cleaning fluid; Then specification is put into Carrier box for the 125*125 monocrystalline silicon piece; A plurality of Carrier boxs are packed in the Da Hua basket as one batch successively; The quantity that requires each batch monocrystalline silicon piece is at 400; The Da Hua indigo plant that monocrystalline silicon piece will be housed is at last put into the technology groove of being furnished with cleaning fluid, soaks 110 seconds, and cleaning fluid subsequent use in the above-mentioned technology groove can be produced 45 batches continuously.
Embodiment 3
At volume is to add 140 liters of deionized waters in the 160 process of jacking grooves, and temperature is controlled at 23 ℃, once adds 16 liters of HF acid (electron level, concentration 48% ~ 49%), evenly stirs with the long rod of PP material, and it is subsequent use to obtain cleaning fluid; Then specification is put into Carrier box for the 125*125 monocrystalline silicon piece; A plurality of Carrier boxs are packed in the Da Hua basket as one batch successively; The quantity that requires each batch monocrystalline silicon piece is at 400; The Da Hua indigo plant that monocrystalline silicon piece will be housed is at last put into the technology groove of being furnished with cleaning fluid, soaks 120 seconds, and cleaning fluid subsequent use in the above-mentioned technology groove can be produced 50 batches continuously.

Claims (1)

1. remove the method for phosphorosilicate glass on the monocrystalline silicon piece during a monocrystalline silicon battery is produced; It is characterized in that: this method may further comprise the steps: be to add 130-140 liters of deionized waters in 150-160 process of jacking grooves at volume at first; Temperature is controlled between 18-23 ℃; Once add 16 liters of the electron level HF acid of concentration 48% ~ 49%, with the evenly stirring of the long rod of PP material, it is subsequent use to obtain cleaning fluid; Then specification is put into Carrier box for the 125*125 monocrystalline silicon piece; A plurality of Carrier boxs are packed in the Da Hua basket as one batch successively; The quantity that requires each batch monocrystalline silicon piece is between 300-400; The Da Hua indigo plant that monocrystalline silicon piece will be housed is at last put into the technology groove of being furnished with cleaning fluid, soaks 100 ~ 120 seconds, and cleaning fluid subsequent use in the above-mentioned technology groove can be produced 40 ~ 50 batches continuously.
CN2011100773909A 2011-03-30 2011-03-30 Method for removing phosphorosilicate glass from monocrystalline silicon wafer in monocrystalline silicon battery production Pending CN102723398A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN2011100773909A CN102723398A (en) 2011-03-30 2011-03-30 Method for removing phosphorosilicate glass from monocrystalline silicon wafer in monocrystalline silicon battery production

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN2011100773909A CN102723398A (en) 2011-03-30 2011-03-30 Method for removing phosphorosilicate glass from monocrystalline silicon wafer in monocrystalline silicon battery production

Publications (1)

Publication Number Publication Date
CN102723398A true CN102723398A (en) 2012-10-10

Family

ID=46949111

Family Applications (1)

Application Number Title Priority Date Filing Date
CN2011100773909A Pending CN102723398A (en) 2011-03-30 2011-03-30 Method for removing phosphorosilicate glass from monocrystalline silicon wafer in monocrystalline silicon battery production

Country Status (1)

Country Link
CN (1) CN102723398A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103746030A (en) * 2013-12-24 2014-04-23 宁夏银星能源股份有限公司 Technology for removing phosphorosilicate glass of single crystalline silicon solar cells
CN109637943A (en) * 2018-10-23 2019-04-16 百力达太阳能股份有限公司 A method of monitoring hydrofluoric acid solution concentration

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1696349A (en) * 2004-05-15 2005-11-16 三星电子株式会社 Etching liquid for removing oxyde film, and its prepn. method and method of mfg. semiconductor device
US20050252525A1 (en) * 2004-05-12 2005-11-17 United Microelectronics Corp. Method of cleaning a semiconductor substrate and cleaning recipes
WO2009067475A1 (en) * 2007-11-19 2009-05-28 Applied Materials, Inc. Crystalline solar cell metallization methods
CN101866984A (en) * 2010-05-18 2010-10-20 常州亿晶光电科技有限公司 Method for selectively doping emitting stage on surface of crystalline silicon cell film

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20050252525A1 (en) * 2004-05-12 2005-11-17 United Microelectronics Corp. Method of cleaning a semiconductor substrate and cleaning recipes
CN1696349A (en) * 2004-05-15 2005-11-16 三星电子株式会社 Etching liquid for removing oxyde film, and its prepn. method and method of mfg. semiconductor device
WO2009067475A1 (en) * 2007-11-19 2009-05-28 Applied Materials, Inc. Crystalline solar cell metallization methods
CN101866984A (en) * 2010-05-18 2010-10-20 常州亿晶光电科技有限公司 Method for selectively doping emitting stage on surface of crystalline silicon cell film

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103746030A (en) * 2013-12-24 2014-04-23 宁夏银星能源股份有限公司 Technology for removing phosphorosilicate glass of single crystalline silicon solar cells
CN103746030B (en) * 2013-12-24 2016-05-11 宁夏银星能源股份有限公司 A kind of monocrystaline silicon solar cell sheet is removed the technique of phosphorosilicate glass
CN109637943A (en) * 2018-10-23 2019-04-16 百力达太阳能股份有限公司 A method of monitoring hydrofluoric acid solution concentration

Similar Documents

Publication Publication Date Title
Dross et al. Crystalline thin‐foil silicon solar cells: where crystalline quality meets thin‐film processing
CN100573928C (en) A kind of phosphorus diffusion method of making solar cell
Del Canizo et al. Crystalline silicon solar module technology: Towards the 1€ per watt‐peak goal
CN101777606B (en) Crystalline silicon solar battery selective diffusion process
CN110571149B (en) Preparation method of P-type full-contact passivated solar cell
CN111029437B (en) Preparation method of small-sized battery
CN101587919A (en) Method for manufacturing selective emitter junction of multricrytalline silicon solar cell
CN102938431A (en) Silicon wafer cleaning flocking method of solar battery
CN101740659A (en) Method for manufacturing buried-contact solar battery
CN103022253B (en) A kind of solar cell and preparation method thereof
CN102437236A (en) Passivation method for surface of black silicon solar cell
CN103632933B (en) The Boron diffusion method of N-type silicon chip, crystal silicon solar energy battery and preparation method thereof
CN102593268A (en) Method for carrying out cleaning and texture-surface-making on heterojunction solar cells by using texturing smoothing and rounding technique
CN106601835A (en) Control method for controlling suede dimension of monocrystalline silicon heterojunction solar battery cell
CN101609796B (en) Film forming method and method for manufacturing film solar battery
CN104538485A (en) Preparation method of double-sided battery
CN104143589A (en) Double-faced diffusion method for solar cell
Gambhir et al. The impact of policy on technology innovation and cost reduction: a case study on crystalline silicon solar PV modules
CN102723398A (en) Method for removing phosphorosilicate glass from monocrystalline silicon wafer in monocrystalline silicon battery production
CN113921649A (en) Preparation method of silicon-based heterojunction solar cell
CN111599892A (en) Processing technology for preparing battery piece by cutting silicon chip through diamond wire
CN204167329U (en) Metallurgy polycrystalline silicon solar battery sheet and solar panel
CN110190155A (en) A kind of efficient passivation contact crystalline silicon solar cell comprising and preparation method thereof
CN102214728A (en) Technology for processing dead layers on surface of crystalline silicon solar cell
CN102716867A (en) Method for cleaning crystalline silicon slice of solar battery

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C02 Deemed withdrawal of patent application after publication (patent law 2001)
WD01 Invention patent application deemed withdrawn after publication

Application publication date: 20121010