CN102662806B - Adaptive testing method directed at different performance indicators of Java card - Google Patents

Adaptive testing method directed at different performance indicators of Java card Download PDF

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CN102662806B
CN102662806B CN201210049266.6A CN201210049266A CN102662806B CN 102662806 B CN102662806 B CN 102662806B CN 201210049266 A CN201210049266 A CN 201210049266A CN 102662806 B CN102662806 B CN 102662806B
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java card
test terminal
testing
performance
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CN102662806A (en
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李莹
殷中科
张凌飞
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Zhejiang University ZJU
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Zhejiang University ZJU
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Abstract

The invention discloses an adaptive testing method directed at different performance indicators of a Java card, comprising the following steps of: 1) sending an application command of Java Card Applet which is used for testing performance to a Java card by a test terminal; 2) setting a required degree of accuracy on the test terminal; 3) setting the value of cycle test times to be 0 by the test terminal, setting the value of cycle test times to be 1 after testing the time spent by the Java card on executing the Java Card Applet, and testing execution time of the Java Card Applet of the Java card; 4) calculating a reasonable number of cycle test times C which is suitable for the performance testing by the test terminal by using a formula; 5) setting the value of cycle test times to be C, and testing execution time of the Java Card Applet after cycling the Java card C times; and 6) calculating the average value of the execution time of a test function by the test terminal by using the formula, wherein the average value is a final test result. The adaptive testing method of the invention has the advantages that the value of the cycle test times can be adaptively determined and testing process can be executed intelligently in the performance testing process of the Java card, the adaptive testing method is not influenced by changes of testing environment, and the like.

Description

A kind of self-adapting testing method for Java card different performance index
Technical field
The present invention relates to technical field of intelligent card, especially relate to a kind of self-adapting testing method for Java card different performance index.
Background technology
In recent years, Java smart card is with the advantage such as simplification, application program dynamic download of its good platform-neutral, the support of many application, good security feature, OO programmed environment, application and development, be widely used in the every field of social life, have broad application prospects at numerous areas.Such as, domestic Local finance bank card business development is very rapid, and have 192 in 220 card sending mechanism in the whole nation for Local finance mechanism, Local finance mechanism issued volume reaches 300,000,000, and trading volume accounts for about 1/5th of national total amount.In the face of so huge card producing system, for different business demand, suitable card vendor is selected to be a difficult selection for decision maker.The test that this situation of Java card impels card developer and card provider more and more to pay attention to Java card performance.
At present, on market in the test of the non-physical performances such as Java smart card stability, application function and basic security, most employing PC/SC specification.PC/SC system is made up of three critical pieces: operating system, read write line (IFD), smart card (ICC).But in the specific implementation of its test, also there is no the recognized standard method.Comparatively general method is, the JavaCard Applet that can embody a certain performance of Java card is installed on card, send a series of APDU order by the outer terminal of card and carry out system testing, finally using the time that the interior execution test of card spends as the index of test result, its time set is present in outside card, and is connected with Java card by card reader.Therefore, there is the interference of call duration time between card reader and card in the Java card performance test methods of this Based PC/SC in its result.
For addressing this problem, comparatively simple method carries out loop test to same performance in a communication process of Java card and card reader, then get the mean value of result, so just can reduce call duration time proportion in test result, improve the precision of test result.But cannot determine fast and effectively the value of cycle index in this loop test: usually in the scope once arriving several ten thousand times, test can be increased progressively every certain number of times unit (as 100 times), if there is stable value in period in the set of test result, then stop test, and record this stationary value as a result; Or directly blindly cycle index is increased to up to ten thousand times for the consideration of result accuracy, after averaging like this, also more accurately can obtains the execution time of instruction.But which kind of method no matter, the cycle index of use is all targetedly, and when test environment changes (such as, change a card or test another performance), the possibility of result using same cycle index to obtain is inaccurate; They may be all with the longer test duration for cost, and this is unacceptable in a large amount of test.
And in fact, want the test result being met accuracy requirement, the required testing time of the properties of same Java card is different.Compared with call duration time, if the time that performance index spend is less, then need more testing time, otherwise test result will not reach accuracy requirement; Otherwise, then need less testing time, otherwise greatly will reduce testing efficiency.
Summary of the invention
For above-mentioned technical matters, the present invention proposes a kind of self-adapting testing method for Java card different performance index.
In order to solve the problems of the technologies described above, technical scheme of the present invention is as follows;
For a self-adapting testing method for Java card different performance index, comprise the steps:
1) test terminal sends the JavaCard Applet utility command being used for performance test to Java card;
2) required precision is set in test terminal;
3) test terminal is by loop test number of times for arranging 0, measures Java card and performs described JavaCard Applet time T 0after, by loop test number of times for arranging 1, measure JavaCard Applet execution time T described in Java card 1;
4) formula is utilized test terminal calculates the reasonable loop test number of times C of this performance test applicable;
5) loop test number of times is set to C by test terminal, measures the execution time T of Java card described JavaCardApplet after C circulation c;
6) according to formula test terminal calculates the execution time mean value of trial function, described in be final testing result.
Further, described test terminal judges whether to perform next step according to the status word fed back from Java card.
Beneficial effect of the present invention is:
Ease for use: this method can carry out self-adaptation value to cycle index and intelligent execution test process in Java card performance test, is easy to use and operate.
Versatility: this method not impact of changing of tested person environment (card, card reader and terminal device), supports the test to different performance in different test environment of different Java card.
Controllability: the number of significant digit of this method measured result is determined by cycle index, and the value of cycle index is obtained by the preset value calculation of accuracy requirement, so can require by Adjustment precision the precision controlling test result.
Clarity: this method seems quick and precisely in the value of cycle index, and the working time of whole test is estimated, seem more clear, clear and definite.
Credible: the precision of the adaptive testing gained net result of this method, the experiment proved that it is accurately.
Accompanying drawing explanation
Fig. 1 is the operational process of performance cycle test;
Fig. 2 is loop test framework of the present invention.
Embodiment
Below in conjunction with the drawings and specific embodiments, the present invention is described further.
Fig. 1 indicates the main implementation of Java card performance test in card of Based PC/SC: test terminal sends power up order makes Java card sheet power on, selective gist order is sent again after completing Deng initial work in Java card, choose the JavaCard Applet for performance test, then terminal test program automatically sends and arranges cycle index order, after in card, Applet receives this order, arrange cycle index, if success, terminal test program given in return state word 90 00.Terminal test program then sends startup test command, starts timing simultaneously.Execution performance test in card, after terminating, return state word 90 00.Last terminal record receives the time of 90 00, terminates timing simultaneously, and this performance test terminates.Twice timing gained mistiming is execution time of trial function.
Embodiment one
As shown in Figure 2, at the FunctionTest () function needing to be provided with in performance test JavaCard Applet, this function is the trial function that will perform, as an arithmetical operation or a cryptographic calculation; C (cycles) is for running the cycle index of FunctionTest () in Java card.
Suppose that, when calculating execution and once testing the time used, the minimum value that note measuring error allows is Δ, and true elapsed time is T, T 0when then representing that cycle index is 0, the time required for test, then T/ Δ is claimed to be the accuracy requirement tested, be designated as p (precision, general value is 0.1,0.01,0.001), when p is 0.001, mean that the precision of test result is three position effective digitals.
According to following formula
T ‾ = T 0 + C × T C = T 0 C + T
for measured value, T is actual value, when namely time, test is satisfactory, therefore will calculate C and the T meeting accuracy requirement 0, p, T be relevant, T can be measured by arranging cycle index C=0 in test terminal 0one not containing the pretreatment time value (including call duration time) of trial function execution time; Make C=1, measure execution time T 1, namely perform the time (including call duration time) needed for a trial function.T is then the value that requirement is measured, then can draw an approximate value of T:
T≈T 1-T 0
So
C > T 0 p × ( T 1 - T 0 )
For improving testing efficiency, getting difference is 1,
C = T 0 p × ( T 1 - T 0 ) + 1
Now C is the appropriate value of loop test number of times, obtains the number of significant figures of result, can meet accuracy requirement with its test.Accuracy requirement p is a relative concept, and have nothing to do with the concrete trial function execution time, such as, work as p=0.001, the magnitude that the reality of trial function is consuming time is Millisecond, then p is 0.001 millisecond.
Such as remembering that the cycle index of setting is Cycles, is below the adaptive testing step of the Java card performance index of the present invention's proposition:
(1) setting accuracy requirement, here to get 0.001;
(2) make Cycles=0, measure execution time T 0;
(3) make Cycles=1, measure execution time T 1;
(4) formula is utilized C = T 0 ( T 1 - T 0 ) + 1 , Calculate C;
(5) by performing SetCount method, making Cycles=C, then performing StartTest method and measuring execution time T c;
(6) calculate be final testing result, i.e. the execution time mean value of trial function.
The above is only the preferred embodiment of the present invention; it should be pointed out that for those skilled in the art, without departing from the inventive concept of the premise; can also make some improvements and modifications, these improvements and modifications also should be considered as in scope.

Claims (2)

1. for a self-adapting testing method for Java card different performance index, it is characterized in that, comprise the steps:
1) test terminal sends the JavaCard Applet utility command being used for performance test to Java card;
2) required precision is set in test terminal;
3) loop test number of times is set to 0 by test terminal, measures Java card and performs described JavaCard Applet time T 0after, loop test number of times is set to 1, measures Java card and perform described JavaCard Applet time T 1;
4) formula is utilized test terminal calculates the reasonable loop test number of times C of this performance test applicable;
5) loop test number of times is set to C by test terminal, measures the execution time T of Java card described JavaCard Applet after C circulation c;
6) according to formula test terminal calculates the execution time mean value of trial function, described in be final testing result.
2. a kind of self-adapting testing method for Java card different performance index according to claim 1, it is characterized in that, described test terminal judges whether to perform next step according to the status word fed back from Java card, when test terminal sends, cycle index order is set, after in Java card, Applet receives this order, arrange cycle index, if success, return state word is to test terminal; Test terminal then sends startup test command, starts timing simultaneously, execution performance test in Java card, and after terminating, return state word, test terminal record receives the time of status word, and terminate timing, this performance test terminates simultaneously.
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CN105630668A (en) * 2014-12-01 2016-06-01 深圳市腾讯计算机***有限公司 Test method and apparatus
CN106021088A (en) * 2015-07-10 2016-10-12 北京中电华大电子设计有限责任公司 Method and device for atomicity test on JAVA card
CN106339308A (en) * 2015-07-10 2017-01-18 北京中电华大电子设计有限责任公司 Test method of Java Card transaction mechanism
CN110008134A (en) * 2019-04-18 2019-07-12 上海计算机软件技术开发中心 A kind of Java card standard API method for testing security
CN114579208B (en) * 2022-05-05 2022-08-26 广州万协通信息技术有限公司 Self-adaptive adjustment execution speed increasing method for Java card

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