CN102647313B - A kind of network test system - Google Patents
A kind of network test system Download PDFInfo
- Publication number
- CN102647313B CN102647313B CN201210148992.3A CN201210148992A CN102647313B CN 102647313 B CN102647313 B CN 102647313B CN 201210148992 A CN201210148992 A CN 201210148992A CN 102647313 B CN102647313 B CN 102647313B
- Authority
- CN
- China
- Prior art keywords
- under test
- tester
- equipment under
- ether
- shdsl
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Landscapes
- Maintenance And Management Of Digital Transmission (AREA)
Abstract
The invention discloses a kind of network test system, comprising: first, second equipment under test; SHDSL cable or SHDSL circuit emulation instrument; Ether tester, for constructing ether packet; First jitter/wander tester, for constructing TDM business data packet; First equipment under test by the TDM business data packet received from the first jitter/wander tester and the ether Packet Generation that receives from ether tester to the second equipment under test; And by the ether Packet Generation that receives from the second equipment under test to ether tester; Second equipment under test be used for will the ether Packet Generation that receive from ether tester to the first equipment under test; And by the ether Packet Generation that receives from the first equipment under test to ether tester, the TDM business data packet received from the first equipment under test is sent to the first jitter/wander tester.The present invention can test the transmission network both also comprising ETH business containing TDM business.
Description
Technical field
The present invention relates to the communications field, particularly relate to a kind of network test system.
Background technology
SHDSL (Symmetrical High bite Digital Subscriber Line, symmetrical HDSL High-Speed Digital Subscriber Line) be by ITU-T (International Telecommunication Union's telecommunication standardsization tissue) define single to twisted-pair feeder providing a kind of technology transmitting bi-directional symmetrical bandwidth data services, meet International Telecommunication Association's G.991.2 proposed standard, owing to adopting 16 level grid coding pulse amplitude modulation (TC-PAM) technology of superior performance, have compressed transmission spectrum, improve noiseproof feature, extend transmission range, SHDSL is the DSL of symmetric form, its feature is, the transmission rate of upper and lower property is consistent, single line is 5.7Mbit/s to maximum up-downgoing speed, transmission range is 3 ~ 6km.
The transmission range of SHDSL is directly proportional to the wire diameter (i.e. thickness) of subscriber's telephone line, and transmission range and the bandwidth of SHDSL are inversely proportional to.SHDSL can support various protocols, current mainly ATM (time division multiplexing) and TDM (time division multiplexing) two kinds, up-to-date SHDSL supports EFM (eight to fourteenmodulation, 8 ~ 14 modulation) agreement, supports that multipair line transmits.ATM primary interface has Ethernet interface, and the type of service of traditional SHDSL transmission is: ether business or TDM business.Both separately transmission separately.The encapsulated type that ether business adopts is EFM or HDLC (High-Level DataLink Control, High-Level Data Link Control) encapsulation, and what TDM business adopted is E1/T1 encapsulated type.
SHDSL modulator-demodulator utilizes a pair audio frequency twisted-pair feeder (Telephone Cable) as some transmission medium Ethernet service and TDM business, as shown in Figure 1, GE (gigabit Ethernet) data in IP network and the input of the E1 business datum in TDM Access Network access in cabinet, then in SHDSL transmission system, send to SHDSL modulator-demodulator, then be transmitted to LAN (local area network (LAN)) or terminal.
When only transmitting ether business in SHDSL, only has ether business in this network, i.e. Ethernet access net.Content measurement is only confined to the test of ether business.Comprise packet loss test, stability test, Flow Control is tested, and supports minimax frame length test etc.
In SHDSL during TDM operation transmission, only has TDM business in this network, i.e. TDM service access net.Achieve TDM business long-distance transmissions, when transmitting the E1 business datum of TDM, can framed mode be adopted, also can be arranged to unframed mode.Under framed mode, support that any time slot is specified.The clock recovery performance of the TDM business in this network is all single, does not need to consider the impact of other business on clock recovery performance.Only have burst and the disconnection of Network, just can have an impact to the clock recovery performance of equipment.Test is all that E1 interface function is tested, and comprise E1 framed mode, time slot allocation, CRC multi-frame synchronization, TS0 time slot transparent transmission, and time slot follows the test of function for interface alarm test during transmission E1 business datum.
Connection diagram during test as shown in Figure 2, mainly sends E1 business datum to the first equipment under test DUT1 by Error Detector, is transmitted to the second equipment under test DUT2, returns to DUT1, then return to Error Detector by DUT1 by after DUT2 process by DUT1; Can the warning information such as following slotting AIS with Error Detector, check whether equipment can report and alarm.Then revise the time slot of DUT, framed mode, during CRC can, time slot such as to follow at the functional configuration, checks with or without error code.
Along with the development of Network, the Network of current SHDSL transmission can not meet the demand of user.To the increase in demand of data service.Both need TDM business to transmit, need again the transmission of ETH (Ethernet) business.Transmit two kinds of business, corresponding content measurement will be different simultaneously.Traditional testing scheme is all test according to respective method of testing, separately test ETH business, or tests E1 business separately.
Summary of the invention
The technical problem to be solved in the present invention how is tested the transmission network both also comprising ETH business containing TDM business.
In order to solve the problem, the invention provides a kind of network test system, comprising:
First equipment under test, the second equipment under test;
Symmetrical HDSL High-Speed Digital Subscriber Line SHDSL cable or SHDSL circuit emulation instrument;
Ether tester, for constructing ether packet and sending to first, second equipment under test described;
First jitter/wander tester, for constructing time division multiplexing tdm business data packet and sending to described first equipment under test;
Described first equipment under test is used for sending to described second equipment under test by the TDM business data packet received from described first jitter/wander tester and from the ether packet that described ether tester receives by described SHDSL cable or SHDSL circuit emulation instrument; And give described ether tester by the ether Packet Generation that receives from described second equipment under test;
Described second equipment under test is used for the ether packet received from described ether tester to send to described first equipment under test by described SHDSL cable or SHDSL circuit emulation instrument; And give described ether tester by the ether Packet Generation that receives from described first equipment under test, the TDM business data packet received from described first equipment under test is sent to described first jitter/wander tester.
Further, described system also comprises:
First clock source, provides clock signal for giving described first jitter/wander tester;
Described first equipment under test adopts from E1 clock module, and described second equipment under test adopts from SHDSL line-recovered clock pattern.
Further, in the ether packet that constructs of described ether tester and in the TMD business data packet that constructs of the first jitter/wander tester the packets of information of minimum dimension all more than 75%;
Or
Maximum sized packets of information all exceedes half in the ether packet that described ether tester constructs and in the TMD business data packet that constructs of the first jitter/wander tester.
Further, described first jitter/wander tester sends described TDM business data packet by two or more circuit to described first equipment under test;
Described second equipment under test sends to described first jitter/wander tester the TDM business data packet received from described first equipment under test by two or more circuit.
Further, described ether tester sends described ether packet by two circuits to first, second equipment under test described;
Described first equipment under test sends the ether packet received from described second equipment under test to described ether tester by two or more circuit;
Described second equipment under test sends the ether packet received from described first equipment under test to described ether tester by two or more circuit.
Further, described system also comprises:
Second jitter/wander tester, for constructing TDM business data packet and sending to described second equipment under test;
Described second equipment under test is also for sending to described first equipment under test by SHDSL cable or SHDSL circuit emulation instrument by the TDM business data packet received from described second jitter/wander tester;
Described first equipment under test is also for sending to described second jitter/wander tester by the TDM business data packet received from described second equipment under test.
Further, described system also comprises:
Second clock source, provides clock signal for giving described second jitter/wander tester;
Frequency deviation is had between the master clock frequency that first, second clock source described provides;
First, second equipment under test described all adopts from SHDSL line-recovered clock pattern.
Further, in the TMD business data packet that constructs of described second jitter/wander tester the packets of information of minimum dimension more than 75%;
Or
In the TMD business data packet that described second jitter/wander tester constructs, maximum sized packets of information exceedes half.
Further, first, second jitter/wander tester described is also for showing according to the situation of received TDM business data packet structure time interval error curve and maximum time interval error curve.
Further, described ether packet and TDM business data packet are transmitted simultaneously on SHDSL circuit; Described SHDSL circuit comprises SHDSL cable or SHDSL circuit emulation instrument.
Further, described SHDSL circuit emulation instrument is also for being set to N rice by transmission range, and wherein N is a positive number variable.
Further, described TDM business data packet adopts the E1 encapsulation of 8 ~ 14 modulation, or adopts the E1 encapsulation of High-Level Data Link Control.
Further, the ether traffic frame comprised in described ether packet is fixing frame length or random frame length.
Further, described E1 business is framed mode or unframed mode.
Further, described E1 business band CRC or be not with CRC.
The network test system that technical scheme of the present invention provides can for the impact of TDM business in different network traffic types test networks, TDM business or ETH business is only comprised in traditional SHDSL transmission network, and both also comprised ETH business containing TDM business in current network, the present invention can be utilized to carry out system testing to the clock performance of equipment.Prioritization scheme of the present invention can also test the change of SHDSL line transmission distance, on the impact of the clock recovery performance of equipment.Utilize network test system provided by the present invention, specially for the clock recovery performance test of mass data business, when can test sudden change of short duration in business in real network, whether can have impact to clock recovery performance.
Accompanying drawing explanation
Fig. 1 is that SHDSL of the prior art transmits schematic diagram;
Fig. 2 is the network test system schematic diagram using SHDSL cable in embodiment two;
Fig. 3 is the network test system schematic diagram using SHDSL circuit emulation instrument in embodiment two;
Fig. 4 is the network test system schematic diagram using SHDSL cable in embodiment three;
Fig. 5 is the network test system schematic diagram using SHDSL circuit emulation instrument in embodiment three;
Fig. 6 is the network test system schematic diagram using SHDSL cable in embodiment four;
Fig. 7 is the network test system schematic diagram using SHDSL circuit emulation instrument in embodiment four;
Fig. 8 is the network test system schematic diagram using SHDSL cable in embodiment five;
Fig. 9 is the network test system schematic diagram using SHDSL circuit emulation instrument in embodiment five.
Embodiment
Below in conjunction with drawings and Examples, technical scheme of the present invention is described in detail.
It should be noted that, if do not conflicted, each feature in the embodiment of the present invention and embodiment can be combined with each other, all within protection scope of the present invention.
Embodiment one, a kind of network test system, comprising:
First equipment under test DUT1, the second equipment under test DUT2;
SHDSL cable or SHDSL circuit emulation instrument, for connecting first, second equipment under test described;
Ether tester, for constructing ether packet and sending to first, second equipment under test described;
First jitter/wander tester, for constructing TDM business data packet and sending to described first equipment under test;
Described first equipment under test is used for sending to described second equipment under test by the TDM business data packet received from described first jitter/wander tester and from the ether packet that described ether tester receives by described SHDSL cable or SHDSL circuit emulation instrument; And give described ether tester by the ether Packet Generation that receives from described second equipment under test;
Described second equipment under test is used for the ether packet received from described ether tester to send to described first equipment under test by described SHDSL cable or SHDSL circuit emulation instrument; And give described ether tester by the ether Packet Generation that receives from described first equipment under test, the TDM business data packet received from described first equipment under test is sent to described first jitter/wander tester.
In the present embodiment, ether business and TDM business are simulated respectively by ether tester and jitter/wander tester; Ether packet is sent by ether tester, ether business in analog network, TDM business data packet is sent by jitter/wander tester, TDM business in simulation legacy network, two kinds of business are transmitted by SHDSL circuit (realizing with SHDSL cable or SHDSL circuit emulation instrument) simultaneously.For the network transmitting ether business and TDM business in SHDSL cable simultaneously, except traditional content measurement, the present embodiment can also test service by after this network, influencing each other of TDM business and ETH business.
In the present embodiment, described first jitter/wander tester is also for showing according to the situation of received TDM business data packet structure time interval error curve and maximum time interval error curve; The acquisition of described time interval error and maximum time interval error can same prior art.
In the present embodiment, described network test system can also comprise the first clock source, provides clock signal for giving described first jitter/wander tester.Described first equipment under test adopts from E1 clock module, and described second equipment under test adopts from SHDSL line-recovered clock pattern.
Need enable Qos (Quality of Service, service quality) function when test network is congested, be set to the highest by the priority of clock recovery business, performing other test case does not need to open Qos function.
Embodiment two, a kind of network test system, structure is identical with embodiment one.Also can comprise described first clock source, described first equipment under test adopts from E1 clock module, and described second equipment under test adopts from SHDSL line-recovered clock pattern.
In the present embodiment, described first jitter/wander tester can be, but not limited to send described TDM business data packet by single line to described first equipment under test, simulation single channel TDM business; Described ether tester can be, but not limited to send described ether packet by single line to first, second equipment under test described, simulation single channel ETH business.
In the present embodiment, when being connected by SHDSL cable between first, second equipment under test, as shown in Figure 2, SHDSL line not distance is arranged the schematic diagram of described network test system.When being connected by SHDSL circuit emulation instrument between first, second equipment under test, as shown in Figure 3, SHDSL circuit emulation instrument can analogue transmission distance for the schematic diagram of described network test system.
In the present embodiment, described first jitter/wander tester is also for showing according to the situation of received TDM business data packet structure time interval error curve and maximum time interval error curve; The acquisition of described time interval error and maximum time interval error can same prior art.
The present embodiment can test single channel ETH business and single channel TDM business is transmitted simultaneously on G.SHDSL circuit, and packet is by after SHDSL transmission network, and single channel ETH business is on the impact of single channel TEM business.Check whether TIE (time interval error) curve and MTIE (maximum time interval error) curve exceed the template line for standard (G.823) by the first jitter/wander tester.
In the present embodiment, situation when can adopt the E1 encapsulation of EFM by the described TDM business data packet of contrast and adopt the E1 encapsulation of HDLC, test adopts during different encapsulation format and the size of TDM business data packet can be caused how to change, and how test pack size can affect the time delay of transfer of data, thus affect clock performance recovery.
In the present embodiment, the ether traffic frame comprised in described ether packet can be set to fixing frame length (64 bytes---1518 bytes) or random frame length, can test setting when being random frame length, the paroxysmal increase of business in network, and different Network backgrounds is on the impact of the extensive performance of equipment clock.
In the present embodiment, test respectively E1 business be framed mode or unframed mode time situation, band CRC or not with situation during CRC.Due to E1 business setting be unframed mode time, transmission E1 business transmission be 32 time slots, each time slot accounts for 8 bytes, occupies 32 time slots in a frame, occupies 64 bytes in a frame.And during framed mode, time slot can be configured, the E1 business packet size transmitted can be caused to change, affect the transmission of equipment in network TDM business.
In the present embodiment, in SHDSL transmission network, the change of distance has certain influence, when therefore adopting SHDSL circuit emulation instrument to connect first, second equipment under test to business, mainly can test service after transmission is remote, to the performance impact of equipment recovered clock from network.
The network service flow transmitted in the network test system of the present embodiment is the network environment in order to simulated clock simulation clock recovery service operation, do not comprise clock recovery business, with ether tester send in network environment different load, different frame length ether packet as clock recovery business background stream and in test process, make total load change in time, to simulate the parameters such as time delay in existing network, shake, congested and packet loss.
The network service flow transmitted in the network test system of the present embodiment can be, but not limited to arrange according to following two class network models:
First kind network model is the relevant code according to 3GPP, transmit in SHDSL circuit network service flow comprise the type such as call (speech), data flow (phonotape and videotape), interactive (such as http) and backstage (sms, Email).Know, in the service network of SHDSL transmission, the Business Stream of 80% to 90% is call, and its mean call duration is between 1 minute to 2 minutes.In order to simulate this Business Stream modeling, respectively comprise in the ether packet that described ether tester constructs and the TMD business data packet that the first jitter/wander tester constructs: the packets of information of the minimum dimension of 85%, the mixing of the medium and full-size packets of information of 15%.
The distribution of packets of information size can be, but not limited to into:
The load of 85% is the packets of information of minimum dimension (64 byte);
The load of 10% is the packets of information of full-size (1518 byte);
The load of 5% is the packets of information of medium size (576 byte).
During practical application, also can be adjusted to other ratio, but the packets of information of minimum dimension should be great majority (being such as but not limited to more than 75%), maximum sized packets of information is more than middle-sized packets of information.The concrete size of the packets of information of each size also can adjust according to actual conditions.
Equations of The Second Kind network model takies the model of more full-size packets of information than first kind network model can the network of simulation process more data Business Stream.In order to this Business Stream modeling, respectively comprise in the ether packet that described ether tester constructs and the TMD business data packet that the first jitter/wander tester constructs: the maximum sized packets of information of 65%, the mixing of the minimum and medium size packets of information of 35%.
The distribution of packets of information size can be, but not limited to into:
The load of 65% is the packets of information of full-size (1518 byte);
The load of 25% is the packets of information of minimum dimension (64 byte);
The load of 10% is the packets of information of medium size (576 byte).
Equally, during practical application, also can be adjusted to other ratio, but maximum sized packets of information should exceed half, the packets of information of minimum dimension is more than middle-sized packets of information.The concrete size of the packets of information of each size also can adjust according to actual conditions.
In the present embodiment, when testing, first the first jitter/wander tester is set to from E1 clock, first equipment under test DUT1 is set to from E1 clock, and the second equipment under test DUT2 is set to from G. circuit (for meeting itu standard SHDSL cable G.991.2, maybe can simulating the SHDSL circuit emulation instrument meeting itu standard SHDSL circuit G.991.2) clock.The framed mode of whole piece link is consistent.Business packed type is consistent.
When adopting SHDSL cable to connect first, second equipment under test described, can test in accordance with the following steps, the order of each step is not limit, and the parameter (comprising running time) during actual test can be arranged according to demand, is not limited only to following configuration:
(1) the E1 business configuring DUT1 with DUT2 becomes frame type to be non-framing, band CRC.The frame length of ETH business is set to fixing frame length.The encapsulated type EFM+E1 pattern of business in network, in first kind network model, transmits E1 business and ETH business simultaneously in network.Run after 1 hour, check whether TIE and the MTIE curve of the first jitter/wander analyzer is above standard template line.
(2) the E1 business configuring DUT1 with DUT2 becomes frame type to be non-framing, band CRC.ETH business frame length is set to random frame length.In network, the encapsulated type of business is EFM+E1 pattern, in Equations of The Second Kind network model, transmits E1 business and ETH business in network simultaneously.Run after 1 hour, check whether TIE and the MTIE curve of the first jitter/wander analyzer is above standard template line.
(3) the E1 business configuring DUT1 with DUT2 becomes frame type to be non-framing, is not with CRC.ETH business frame length is set to random frame length.In network, the encapsulated type of business is HDLC+E1 pattern, in Equations of The Second Kind network model, transmits E1 business and ETH business in network simultaneously.Run after 1 hour, check whether TIE and the MTIE curve of the first jitter/wander analyzer is above standard template line.
(4) the E1 business configuring DUT1 with DUT2 becomes frame type to be framing, band CRC.ETH business frame length is set to random frame length.In network, the encapsulated type of business is HDLC+E1 pattern, in first kind network model, transmits E1 business and ETH business in network simultaneously.Run after 1 hour, check whether TIE and the MTIE curve of the first jitter/wander analyzer is above standard template line.
(5) the E1 business configuring DUT1 with DUT2 becomes frame type to be framing, band CRC.ETH business frame length is set to fixing frame length.In network, the encapsulated type of business is EFM+E1 pattern, in Equations of The Second Kind network model, transmits E1 business and ETH business in network simultaneously.Run after 1 hour, check whether TIE and the MTIE curve of the first jitter/wander analyzer is above standard template line.
(6) the E1 business configuring DUT1 with DUT2 becomes frame type to be framing, band CRC.ETH business frame length is set to random frame length.In network, the encapsulated type of business is EFM+E1 pattern, in first kind network model, transmits E1 business and ETH business in network simultaneously.Run after 1 hour, check whether TIE and the MTIE curve of the first jitter/wander analyzer is above standard template line.
When adopting SHDSL circuit emulation instrument to connect first, second equipment under test described, also can above-mentioned testing procedure be carried out, unlike, transmission range is also set to N rice by SHDSL circuit emulation instrument, and wherein N is a positive number variable.
Embodiment three, a kind of network test system, structure is identical with embodiment one.Also can comprise described first clock source, described first equipment under test adopts from E1 clock module, and described second equipment under test adopts from SHDSL line-recovered clock pattern.
In the present embodiment, described first jitter/wander tester sends described TDM business data packet by two or more circuit to described first equipment under test;
Described second equipment under test also sends to described first jitter/wander tester the TDM business data packet received from described first equipment under test by two or more circuit.
In the present embodiment, when being connected by SHDSL cable between first, second equipment under test, as shown in Figure 4, SHDSL line not distance is arranged the schematic diagram of described network test system.When being connected by SHDSL circuit emulation instrument between first, second equipment under test, as shown in Figure 5, SHDSL circuit emulation instrument can analogue transmission distance for the schematic diagram of described network test system.
In the present embodiment, described first jitter/wander tester is also for showing according to the situation of received TDM business data packet structure time interval error curve and maximum time interval error curve; The acquisition of described time interval error and maximum time interval error can same prior art.
The present embodiment can simulate single channel ETH business and multichannel TDM business (shown in Fig. 4 and Fig. 5 is two).
In the present embodiment, when multichannel E1 business and single channel ETH business are transmitted in a network simultaneously, band shared by E1 business is roomy, during the transmission of multichannel E1 business, can testing equipment extraction clock be according to which extract, that is have interference between multichannel E1 business, the impact of ETH business on TDM business can be added in test network simultaneously.Check whether TIE curve and MTIE curve are above standard the template line of (G.823) by the first shake drift test instrument.
In the present embodiment, can be situation when EFM+E1 encapsulates and HDLC+E1 encapsulates by the business packed type transmitted in contrast SHDSL network, the change of test ETH encapsulated type be on the impact of TDM business.
In the present embodiment, testing two-way E1 business is respectively framed mode or unframed mode, is with CRC or how affects business by after network, the clock performance of TDM business when not being with CRC.
In the present embodiment, the ether traffic frame comprised in described ether packet can be set to fixing frame length (64 bytes---1518 bytes) or random frame length, can test setting when being random frame length, the paroxysmal increase of business in network, and the change that the time delay causing TDM business to be transmitted occurs.
In the present embodiment, when adopting SHDSL circuit emulation instrument to connect first, second equipment under test, can test when distance increases, single channel ETH business is on the impact of multichannel TDM business; Because the transmission of ETH business is larger by the impact of distance change, transmission range increases simultaneously, also influenced to the transmission of multichannel TDM business.Two kinds of TDM business are after distance increases, and influencing each other between them can cause the TDM business in network influenced.
When the network model that the present embodiment adopts, test, setting in advance and testing procedure can with embodiments two.
Embodiment four, a kind of network test system, structure is identical with embodiment one.Also can comprise described first clock source, described first equipment under test adopts from E1 clock module, and described second equipment under test adopts from SHDSL line-recovered clock pattern.
In the present embodiment, described ether tester sends described ether packet by two circuits to first, second equipment under test described;
Described first equipment under test also sends the ether packet received from described second equipment under test to described ether tester by two or more circuit;
Described second equipment under test also sends the ether packet received from described first equipment under test to described ether tester by two or more circuit.
In the present embodiment, when being connected by SHDSL cable between first, second equipment under test, as shown in Figure 6, SHDSL line not distance is arranged the schematic diagram of described network test system.When being connected by SHDSL circuit emulation instrument between first, second equipment under test, as shown in Figure 7, SHDSL circuit emulation instrument can analogue transmission distance for the schematic diagram of described network test system.
In the present embodiment, described first jitter/wander tester is also for showing according to the situation of received TDM business data packet structure time interval error curve and maximum time interval error curve; The acquisition of described time interval error and maximum time interval error can same prior art.
The present embodiment can Multipexer ETH business (shown in Fig. 6 and Fig. 7 is two) and single channel TDM business.
In the present embodiment, when multichannel ETH business and single channel E1 business are transmitted simultaneously in a network, the band that in network, ETH service traffics take is roomy, also larger on the propagation delay time impact of E1 business.The impact of multichannel ETH on single channel TDM business can be tested.Check whether TIE curve and MTIE curve are above standard the template line of (G.823) by the first shake drift test instrument.
In the present embodiment, can be situation when EFM+E1 encapsulates and HDLC+E1 encapsulates by the business packed type transmitted in contrast SHDSL network, the change of test ETH encapsulated type be on the impact of TDM business.
In the present embodiment, testing two-way E1 business is respectively framed mode or unframed mode, is with CRC or how affects business by after network, the clock performance of TDM business when not being with CRC.
In the present embodiment, the ether traffic frame comprised in described ether packet can be set to fixing frame length (64 bytes---1518 bytes) or random frame length, can test setting when being random frame length, the paroxysmal increase of business in network, and different Network backgrounds is on the impact of TDM business.
In the present embodiment, when adopting SHDSL circuit emulation instrument to connect first, second equipment under test, can test when distance increases, multichannel ETH business is on the impact of single channel TDM business, because the transmission of ETH business is larger by the impact of distance change, transmission range increases simultaneously, and the band that in network, ETH service traffics take is roomy, also larger on the propagation delay time impact of E1 business.Check whether TIE curve and MTIE curve are above standard the template line of (G.823) by the first shake drift test instrument.
When the network model that the present embodiment adopts, test, setting in advance and testing procedure can with embodiments two.
Embodiment five, a kind of network test system, structure is identical with embodiment one.Also described first clock source can be comprised.
In the present embodiment, described network test system also comprises:
Second jitter/wander tester, for constructing TDM business data packet and sending to described second equipment under test;
Described second equipment under test is also for sending to described first equipment under test by SHDSL cable or SHDSL circuit emulation instrument by the TDM business data packet received from described second jitter/wander tester;
Described first equipment under test is also for sending to described second jitter/wander tester by the TDM business data packet received from described second equipment under test.
In the present embodiment, when being connected by SHDSL cable between first, second equipment under test, as shown in Figure 8, SHDSL line not distance is arranged the schematic diagram of described network test system.When being connected by SHDSL circuit emulation instrument between first, second equipment under test, as shown in Figure 9, SHDSL circuit emulation instrument can analogue transmission distance for the schematic diagram of described network test system.
In the present embodiment, first, second jitter/wander tester described is also for showing according to the situation of received TDM business data packet structure time interval error curve and maximum time interval error curve; The acquisition of described time interval error and maximum time interval error can same prior art.
The present embodiment can simulate single channel ETH business and two-way TDM business.
In the present embodiment, described network test system can also comprise:
Second clock source, provides clock signal for giving described second jitter/wander tester;
The clock frequency that first, second clock source described provides is different, has frequency deviation between two master clock frequencies provided.
In the present embodiment, first, second equipment under test described all adopts from SHDSL line-recovered clock pattern, when transmitting single channel ETH and multichannel TDM business in network, analyze the clock recovery performance TIE of two rightabout TDM business and the curve of MTIE by two jitter/wander testers.
In the present embodiment, article two, the clock of TDM business adopts different clock sources, transmits two rightabout TDM business, test the impact at network of these two rightabout TDM business in network, and for this application, guarantee that the clock recovery performance of equipment can reach standard-required.
In the present embodiment, the TDM business data packet transmitted in test network can be distinguished and adopt different encapsulated types: situation when EFM+E1 encapsulation and HDLC+E1 encapsulation; The frame type can also testing ETH business be respectively random frame or fixing frame length time transmission range change; And the one-tenth frame type can testing E1 is respectively framing or non-framing, band CRC or not with situation during CRC; Thus full test can be carried out to the clock recovery performance of the equipment under test of two in this network.
The network service flow that the present embodiment adopts can with embodiment two.
The network model that the present embodiment adopts can with embodiment two.
In the present embodiment, when test, first the first jitter/wander tester is set to from E1 clock.DUT1 is set to from G. line-recovered clock, and DUT2 is set to from G. line-recovered clock.The framed mode of whole piece link is consistent.Business packed type is consistent.
When adopting SHDSL cable to connect first, second equipment under test described, can test in accordance with the following steps, the order of each step is not limit, and the parameter (comprising running time) during actual test can be arranged according to demand, is not limited only to following configuration:
(1) configure first, second jitter/wander tester, the E1 business of DUT1 with DUT2 becomes frame type to be non-framing, band CRC.Second shake shift analysis instrument adds the frequency deviation of Xppm, and the first jitter/wander tester subtracts the frequency deviation of Xppm, and wherein X is a variable.ETH business setting is fixing frame length.The encapsulated type EFM+E1 pattern of business in network, in first kind network model, transmits E1 business and ETH business simultaneously in network.Run after 1 hour, check whether TIE and the MTIE curve of two jitter/wander analyzers is above standard template line respectively.
(2) configure first, second jitter/wander tester, the E1 business of DUT1 with DUT2 becomes frame type to be non-framing, band CRC.Second shake shift analysis instrument adds the frequency deviation of Xppm, and the first jitter/wander tester subtracts the frequency deviation of Xppm, and wherein X is a variable.ETH business frame length is set to random frame length.In network, the encapsulated type of business is EFM+E1 pattern, in Equations of The Second Kind network model, transmits E1 business and ETH business in network simultaneously.Run after 1 hour, check whether TIE and the MTIE curve of two jitter/wander analyzers is above standard template line respectively.
(3) configure first, second jitter/wander tester, the E1 business of DUT1 with DUT2 becomes frame type to be non-framing, is not with CRC.Second shake shift analysis instrument adds the frequency deviation of Xppm, and the first jitter/wander tester subtracts the frequency deviation of Xppm, and wherein X is a variable.ETH business frame length is set to random frame length.In network, the encapsulated type of business is HDLC+E1 pattern, in Equations of The Second Kind network model, transmits E1 business and ETH business in network simultaneously.Run after 1 hour, check whether TIE and the MTIE curve of two jitter/wander analyzers is above standard template line respectively.
(4) configure first, second jitter/wander tester, the E1 business of DUT1 with DUT2 becomes frame type to be framing, band CRC.Second shake shift analysis instrument adds the frequency deviation of Xppm, and the first jitter/wander tester subtracts the frequency deviation of Xppm, and wherein X is a variable.ETH business frame length is set to random frame length.In network, the encapsulated type of business is HDLC+E1 pattern.In first kind network model, in network, transmit E1 business and ETH business simultaneously.Run after 1 hour, check whether TIE and the MTIE curve of two jitter/wander analyzers is above standard template line respectively.
When adopting SHDSL circuit emulation instrument to connect first, second equipment under test described, also can above-mentioned testing procedure be carried out, unlike, transmission range is also set to N rice by SHDSL circuit emulation instrument, and wherein N is a positive number variable.
Certainly; the present invention also can have other various embodiments; when not deviating from the present invention's spirit and essence thereof; those of ordinary skill in the art are when making various corresponding change and distortion according to the present invention, but these change accordingly and are out of shape the protection range that all should belong to claim of the present invention.
Claims (12)
1. a network test system, is characterized in that, comprising:
First equipment under test, the second equipment under test;
Symmetrical HDSL High-Speed Digital Subscriber Line SHDSL cable or SHDSL circuit emulation instrument;
Ether tester, for constructing ether packet and sending to first, second equipment under test described;
First jitter/wander tester, for constructing time division multiplexing tdm business data packet and sending to described first equipment under test;
Described first equipment under test is used for sending to described second equipment under test by the TDM business data packet received from described first jitter/wander tester and from the ether packet that described ether tester receives by described SHDSL cable or SHDSL circuit emulation instrument; And give described ether tester by the ether Packet Generation that receives from described second equipment under test;
Described second equipment under test is used for the ether packet received from described ether tester to send to described first equipment under test by described SHDSL cable or SHDSL circuit emulation instrument; And give described ether tester by the ether Packet Generation that receives from described first equipment under test, the TDM business data packet received from described first equipment under test is sent to described first jitter/wander tester;
First clock source, provides clock signal for giving described first jitter/wander tester;
Described first equipment under test adopts from E1 clock module, and described second equipment under test adopts from SHDSL line-recovered clock pattern;
Described ether packet and TDM business data packet are transmitted simultaneously on SHDSL circuit; Described SHDSL circuit comprises SHDSL cable or SHDSL circuit emulation instrument.
2. the system as claimed in claim 1, is characterized in that:
The packets of information of minimum dimension is all more than 75% in the ether packet that described ether tester constructs and in the TMD business data packet that constructs of the first jitter/wander tester;
Or
Maximum sized packets of information all exceedes half in the ether packet that described ether tester constructs and in the TMD business data packet that constructs of the first jitter/wander tester.
3. the system as claimed in claim 1, is characterized in that:
Described first jitter/wander tester sends described TDM business data packet by two or more circuit to described first equipment under test;
Described second equipment under test sends to described first jitter/wander tester the TDM business data packet received from described first equipment under test by two or more circuit.
4. the system as claimed in claim 1, is characterized in that:
Described ether tester sends described ether packet by two circuits to first, second equipment under test described;
Described first equipment under test sends the ether packet received from described second equipment under test to described ether tester by two or more circuit;
Described second equipment under test sends the ether packet received from described first equipment under test to described ether tester by two or more circuit.
5. the system as claimed in claim 1, is characterized in that, also comprises:
Second jitter/wander tester, for constructing TDM business data packet and sending to described second equipment under test;
Described second equipment under test is also for sending to described first equipment under test by SHDSL cable or SHDSL circuit emulation instrument by the TDM business data packet received from described second jitter/wander tester;
Described first equipment under test is also for sending to described second jitter/wander tester by the TDM business data packet received from described second equipment under test;
Second clock source, provides clock signal for giving described second jitter/wander tester;
Frequency deviation is had between the master clock frequency that first, second clock source described provides;
The E1 clock module that described first equipment under test adopts replaces with from SHDSL line-recovered clock pattern.
6. system as claimed in claim 5, is characterized in that:
In the TMD business data packet that described second jitter/wander tester constructs, the packets of information of minimum dimension is more than 75%;
Or
In the TMD business data packet that described second jitter/wander tester constructs, maximum sized packets of information exceedes half.
7. system as claimed in claim 5, is characterized in that:
First, second jitter/wander tester described is also for showing according to the situation of received TDM business data packet structure time interval error curve and maximum time interval error curve.
8. the system according to any one of claim 1 to 6, is characterized in that:
Described SHDSL circuit emulation instrument is also for being set to N rice by transmission range, and wherein N is a positive number variable.
9. the system according to any one of claim 1 to 6, is characterized in that:
Described TDM business data packet adopts the E1 encapsulation of 8 ~ 14 modulation, or adopts the E1 encapsulation of High-Level Data Link Control.
10. the system according to any one of claim 1 to 6, is characterized in that:
The ether traffic frame comprised in described ether packet is fixing frame length or random frame length.
11. systems according to any one of claim 1 to 6, is characterized in that:
Described TDM business is framed mode or unframed mode.
12. systems according to any one of claim 1 to 6, is characterized in that:
Described TDM business band CRC or be not with CRC.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201210148992.3A CN102647313B (en) | 2012-05-14 | 2012-05-14 | A kind of network test system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201210148992.3A CN102647313B (en) | 2012-05-14 | 2012-05-14 | A kind of network test system |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN102647313A CN102647313A (en) | 2012-08-22 |
| CN102647313B true CN102647313B (en) | 2015-08-05 |
Family
ID=46659898
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201210148992.3A Active CN102647313B (en) | 2012-05-14 | 2012-05-14 | A kind of network test system |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN102647313B (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106712922A (en) * | 2015-11-12 | 2017-05-24 | 上海远景数字信息技术有限公司 | High-precision clock signal test system and high-precision clock signal test method |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112881826B (en) * | 2021-01-12 | 2023-04-28 | 国网山东省电力公司经济技术研究院 | SPN technology-based method for testing performance of load-bearing power service |
| CN114844804B (en) * | 2022-06-01 | 2023-07-25 | 重庆奥普泰通信技术有限公司 | Network measurement method, system, electronic device and computer readable storage medium |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1472930A (en) * | 2002-07-30 | 2004-02-04 | 华为技术有限公司 | Device and method for carrying wideband business by narrow band resource |
| CN1859041A (en) * | 2006-03-18 | 2006-11-08 | 华为技术有限公司 | Clock synchronous method for interface index test of BWA terminal El/T1 port |
| CN101304344A (en) * | 2008-06-02 | 2008-11-12 | ***通信计量中心 | Apparatus and method for calibrating time delay of network performance tester |
| CN102413015A (en) * | 2011-11-28 | 2012-04-11 | 瑞斯康达科技发展股份有限公司 | Circuit simulation service testing method and system |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20020016937A1 (en) * | 2000-08-02 | 2002-02-07 | Henry Houh | Method and apparatus for utilizing a network processor as part of a test system |
| EP2014016B1 (en) * | 2006-04-25 | 2013-03-27 | Tektronix International Sales GmbH | System and method of remote testing in loopback mode using mgcp/ncs |
-
2012
- 2012-05-14 CN CN201210148992.3A patent/CN102647313B/en active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1472930A (en) * | 2002-07-30 | 2004-02-04 | 华为技术有限公司 | Device and method for carrying wideband business by narrow band resource |
| CN1859041A (en) * | 2006-03-18 | 2006-11-08 | 华为技术有限公司 | Clock synchronous method for interface index test of BWA terminal El/T1 port |
| CN101304344A (en) * | 2008-06-02 | 2008-11-12 | ***通信计量中心 | Apparatus and method for calibrating time delay of network performance tester |
| CN102413015A (en) * | 2011-11-28 | 2012-04-11 | 瑞斯康达科技发展股份有限公司 | Circuit simulation service testing method and system |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106712922A (en) * | 2015-11-12 | 2017-05-24 | 上海远景数字信息技术有限公司 | High-precision clock signal test system and high-precision clock signal test method |
Also Published As
| Publication number | Publication date |
|---|---|
| CN102647313A (en) | 2012-08-22 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN105099828B (en) | A kind of implementation method of high performance network tester | |
| US9071394B2 (en) | Remote timing communications | |
| CN103841009B (en) | FPGA method for achieving conversion and cascading between Ethernet data and E1 data | |
| CN100382517C (en) | Network QoS test method and system | |
| CN1972219A (en) | Network performance test method, system and network device | |
| EP4049477B1 (en) | Transmission rate adaptation | |
| CN102647313B (en) | A kind of network test system | |
| CN110708206A (en) | Method and equipment for measuring air interface time delay of base station | |
| CN102664765B (en) | Pseudo-random sequence self transceiving test system in PTN simulation service and method thereof | |
| CN105323030A (en) | Time delay compensation method and device | |
| CN115766506A (en) | Communication network quality testing method and device based on FPGA | |
| CN210578589U (en) | Reliability test system for synchronous wireless channel of wireless expander | |
| CN109194393A (en) | A kind of multi tate error code testing device and its test method | |
| CN108696385A (en) | The emulation mode of SDH Optical Transmission Network OTNs in electric system based on EXata | |
| Cisco | Configuring the 24-Port E1 Line Card | |
| CN102413015B (en) | Circuit simulation service testing method and system | |
| CN106850148B (en) | The method and system of data frame transfer | |
| US8599936B2 (en) | Code violation generator and methods of generating code violations | |
| Ward et al. | Network errors and their influence on current differential relaying | |
| CN106549832A (en) | The method that the crossing of extremely low fast shortwave number detects packet loss by analog channel | |
| Verdianto et al. | The development of power substation communication using independent network of synchronous digital hierarchy | |
| JP3398709B2 (en) | Burst frame transfer system | |
| CN203933664U (en) | A kind of test macro of PTN equipment | |
| Walker et al. | Telecommunication system measurements | |
| RU112803U1 (en) | HARDWARE AND SOFTWARE COMPLEX OF MODELING INFOCOMMUNICATION TECHNOLOGIES |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant |