CN102636335A - Device and method for detecting optical parameter of backlight in on-line manner - Google Patents
Device and method for detecting optical parameter of backlight in on-line manner Download PDFInfo
- Publication number
- CN102636335A CN102636335A CN2012100916606A CN201210091660A CN102636335A CN 102636335 A CN102636335 A CN 102636335A CN 2012100916606 A CN2012100916606 A CN 2012100916606A CN 201210091660 A CN201210091660 A CN 201210091660A CN 102636335 A CN102636335 A CN 102636335A
- Authority
- CN
- China
- Prior art keywords
- backlight
- polynary
- sample
- brightness
- detection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Landscapes
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
Abstract
The invention discloses a device and a method for detecting optical parameter of backlight in an on-line manner. The device comprises a multi-element brightness detector plate, an A/D (analog to digital) digital acquisition circuit system, a stabilized voltage and current power supply, a test starting switch and a mechanical part. The detection method is characterized in that in the measurement, the interval between the detection surface of the multi-element brightness detector plate and the luminous surface of the backlight is reduced to the maximum extent until the object plane of a backlight brightness detection zone is coincident with the image plane of a detector conjugated with backlight brightness detection zone, thus an optical imaging system can be saved. The device disclosed by the invention has the advantages that the photoelectric data detection to the backlight is fast and convenient, the detection cost is low, the obtained brightness detection data is calculated results obtained by repeatedly acquiring dozens of detection points, and the detection precision is high. The device disclosed by the invention is an important detection device for detecting the quality and classification of the quality grades of the backlight, and can be applied in the automatic rapid on-line detection of photo-electricity detection laboratories and products of enterprises.
Description
Technical field
The present invention relates to backlight detection technique field, specifically be meant a kind of on-line measuring device and detection method that is used for backlight light-emitting area brightness data.
Background technology
LCD (LCD) has become requisite vitals such as televisor, computer, mobile phone at present.In the LCD, liquid crystal is originally as non-luminescent device, and it need could realize Presentation Function by backlight.Huge LCD display market becomes a huge industry with the backlight industry development.It is predicted that global module market scale backlight in 2012 will reach 16,800,000,000 dollars.The backlight industry is rapid with the international market development at home.
Backlight based on optical plate (LGP) technology is a LCD ideal backlight at present, and the quality of backlight optical property directly influences the image displaying quality of LCD.The visible light brightness of backlight light-emitting area and brightness uniformity parameter are to estimate the backlight product quality and differentiate the whether qualified basic optical parameter of backlight product; Very need facility, detecting instrument efficiently, even need the detecting instrument that to realize that backlight product is online.
The existing backlight product optical parametric test of countries in the world and China at present is to be applied to the image brightness meter to carry out the method that few sample is taken a sample test, to obtain to characterize backlight face luminosity distributing homogeneity and average brightness data.The ultimate principle of brightness of image meter be zone with selected detection in the area source through optical system imaging, the brightness of object plane to be detected is confirmed in the brightness that detects image planes through the detector that places image planes.Object plane and the image planes that are selected surveyed area on the area source are conjugate plane each other.This applied optics system imaging detection method needs to use the multidimensional measure support, makes sample or nitometer, does relative translation, selects the different detection point, adjusts nitometer again and tests.For example Shenzhen, Dongguan, Huizhou, big LCD and the backlight manufacturing enterprise of some China of Yangzhou; All be Application of B M-7 type nitometer or hand-held LS-100 type nitometer etc.; The backlight sample is suspended on the three-dimensional test support; In the normal direction of backlight light-emitting area, choose some test points on the backlight light-emitting area, the brightness of point-to-point measurement light-emitting area visible light.For example for nine points of undersized backlight sampling, 13 points of middle-sized backlight sampling, 25 points of backlight sampling of large scale (42 " more than) carry out manual operations to be tested.Again for example; Suzhou Fu Shida scientific instrument company limited is that family's specialty is made backlight optical testing instrument enterprise; The automatic test desk of different size backlight optics of manufacturing; All being a kind of measurement bracket type device of big volume, still is serial nitometer point-to-point measurement backlight samples such as Application of B M-7 or BM-7A.Be positioned on the article carrying platform with aforementioned different just tested backlight source module being lain low; Use the motor driven objective table or drive nitometer; Make tested backlight source module and nitometer optical gauge be two dimension (x along X axle Y axle; Y) straight line relative translation is to obtain the point-to-point measurement data of backlight light-emitting area.For the test of different size backlight product, also need use the relative vertical range (z) of manual adjustments brightness of image meter and sample light-emitting area.This applied optics system imaging detection method can only be a pointwise test, can not realize that multiple spot tests simultaneously.If will implement multiple spot detects simultaneously, just need adopt many same brightness of image meters simultaneously.
More than be applied to the manually-operated of image brightness meter or " automatically operation " proving installation all is same pointwise test method,, need half an hour at least even the time more than one hour for the measurement of a backlight sample; All can only carry out taking a sample test of very small amount sample, time-consuming, take a lot of work, testing cost is high; The condition of test operation is harsh; Factors such as test environment, parasitic light and operating personnel's technology all can cause very big test error, can not realize that more the backlight product online in real time detects.
Summary of the invention
For overcoming the defective that above-mentioned prior art exists, the objective of the invention is to propose a kind of on-line measuring device and detection method that can realize testing fast automatically backlight light-emitting area brightness data that have.
Detection method of the present invention be utilize the back light source brightness surveyed area object plane and with the detector of its conjugation as planes; Can omit the imaging optical system of nitometer; Adopt polynary brightness detector plate simultaneously, backlight is implemented multi-point scanning, brightness detection fast.
A kind of on-line measuring device that is used for the backlight optical parametric of the present invention comprises: polynary brightness detector plate, AD digital collection Circuits System, current regulator power supply and computing machine.
AD digital collection Circuits System and current regulator power supply are installed in the cabinet; The recessed cabinet inwall in cabinet bottom surface; The recessed degree of depth in bottom surface is the height that is used to carry the sample inlet/outlet before and after the cabinet; Cabinet bottom surface place have one with the window of the identical size of polynary brightness detector plate, polynary brightness detector plate is installed on this window.Be equipped with on the pedestal one run through door before and after the cabinet guide rail, be used to carry the sample objective table.Also have a starting switch that starts test procedure on the pedestal, when sample is delivered to the measuring position, trigger start-up routine.
Utilize said on-line measuring device to measure the detection method of backlight light-emitting area brightness data, its step is following:
A. the requirement that detects according to sample makes up polynary brightness detector plate, be installed on place, cabinet bottom surface that have with the window identical size of polynary brightness detector plate on.
B. then the sample backlight is fixed on the objective table; Regulate sample stage; Make the gap between the light-emitting area of test surface and sample of polynary brightness detector plate as far as possible little; The little sample that arrives can pass through the test surface of polynary brightness detector plate smoothly, and is not scratched each other.Then through guide rail with tested backlight sample delivery to the measuring position, below the promptly polynary brightness detector plate.
C. supply power to tested backlight sample and AD digital collection Circuits System by current regulator power supply; Start the test starting switch; The polynary brightness detector plate of AD digital collection Circuits System scanning collection output data; Through data transmission bus input computing machine, through data processing, show, store the luminance test data of backlight light-emitting area.
Advantage of the present invention:
1. owing to the gapless of polynary brightness detector and sample backlight coincide; Omitted imaging optical system; It is a quick test process that feasible photooptical data to backlight detects, and convenient, fast, testing cost is cheap; It is the result of calculation of repeatedly gathering the dozens of test point that the brightness that is obtained detects data, and measuring accuracy is high.
2. this device can be handled through the application software that is installed in the computing machine; The data such as total lumen of the brightness relative error data of the automatic display backlight luminescent panel of computer interface Luminance Distribution, mean flow rate and different coordinate positions and the output of entire backlight source; And directly print the test result or the bar code of product to be detected; Be loaded with product information, for example: the data such as qualified grade of date of manufacture, factory number, backlight electrical parameter, total lumen output, mean flow rate, brightness irregularities relative deviation and product.
3. the optical texture of this device is simple, can design by the backlight light-emitting area of different model size, and manufacturing process is easy, and low cost of manufacture is the important checkout equipment of the qualified and qualified grade separation of check backlight product.
4. this device both can be applicable to industrial online detection, also can be used as the breadboard detecting instrument of enterprise, had popularizing application prospect widely.
Description of drawings
Fig. 1 is the connection synoptic diagram of each parts of pick-up unit of the present invention.
Fig. 2 is polynary brightness detector plate cross-sectional view.
Fig. 3 is the cross-sectional view (omitting computing machine and printer) of pick-up unit of the present invention.
Fig. 4 is the testing software process flow diagram.
Embodiment
Below in conjunction with accompanying drawing the embodiment of technical scheme of the present invention is done further to describe:
See accompanying drawing 1, pick-up unit of the present invention comprises: polynary brightness detector plate 1, AD digital collection Circuits System 2, current regulator power supply 6 and computing machine 4.AD digital collection Circuits System and current regulator power supply are installed in the cabinet 9; Cabinet bottom surface 902 recessed cabinet inwalls; The recessed degree of depth in bottom surface is the height that is used to carry sample inlet/outlet 901 before and after the cabinet; Cabinet bottom surface place have one with the window of the identical size of polynary brightness detector plate, polynary brightness detector plate is installed on this window.Pedestal 10 be equipped with one run through door before and after the cabinet guide rail 11, be used to carry sample objective table 8; Also has a starting switch 12 that starts test procedure on the pedestal 10.
Utilize said on-line measuring device to measure the detection method of backlight light-emitting area brightness data:
The requirement that at first detects according to sample 5 makes up polynary brightness detector plate 1, is installed on the window of locating to have in the cabinet bottom surface.
Described polynary brightness detector plate 1 is seen Fig. 2 by placing the polynary solar panel 101 on the substrate 100 to form with filter board 102 successively.The number of polynary brightness detector plate unit can reach dozens of.The number and the distributing position thereof of polynary brightness detector plate unit all depend on the technical requirement that backlight is detected.Optical filter 102 is a blue transparent glass optical filter 102, and for example the GB21 optical filter matees the response spectrum of polynary brightness detector plate and human eye luminosity function; Each unit parallel connection low-resistance precision resistance of polynary solar panel, for example 25 Ω precision resistances satisfy device short-circuit current output condition, make the brightness of output signal and incident light linear.
Then sample backlight 5 is fixed on the objective table 8; Regulate sample stage; Make the gap between the light-emitting area of test surface and tested backlight sample of polynary brightness detector plate as far as possible little; Little to tested backlight sample can be smoothly test surface through polynary brightness detector plate, and be not scratched each other.Through guide rail 11 tested backlight sample delivery is arrived the measuring position then; Be below the polynary brightness detector; Give tested backlight sample 5 and AD digital collection Circuits System 2 by current regulator power supply 6 power supplies, start test starting switch 12, each surveyed area that sets on the transient state scanning backlight luminescent panel; Directly obtain the luminance brightness output of each test point of backlight light-emitting area, thereby realize robotization, fast, repeatedly scan repeated test.The AD digital collection system module circuit that is adopted; Be to design to commercial Application; The multichannel of sampling simultaneously differential signal; The analog quantity sampling precision can reach ± and 0.05%, can reach 2 times/second the full width repeated sampling speed of backlight light-emitting area, adopt photoelectricity to isolate between this inside modules input block and the control module and input signal is taked filtering measure; Greatly reduced industry spot and disturbed influence, guaranteed that module has the accuracy of good reliability and measurement result the normal operation of module.Wherein current regulator power supply 6 has digital voltmeter and digital electronic ammeter.
Use AD digital collection Circuits System each unit output analog quantity of polynary brightness detector is gathered the conversion with AD.All sampled data signal, through the RS-485 communication interface that band is isolated, promptly data bus 3 transfers to computing machine, through Computer Processing, demonstration, storage and printer 7 printing test results.The computing machine display interface is distributed in the data such as total lumen of different coordinate position brightness relative error data on the mean flow rate, backlight light-emitting area of high-high brightness in the brightness distribution data, backlight luminescent panel of different coordinate positions and position, minimum brightness and position thereof, entire backlight source luminescent panel and the output of entire backlight source luminescent panel in real time on the display backlight luminescent panel.
The polynary brightness detector test component of backlight optical parametric on-line measuring device of the present invention will be used specification product back light source brightness luminous plaque and carry out technical grade test calibration.
Backlight optical parametric on-line measuring device of the present invention can increase the spectrum test that fiber spectrometer is realized the backlight light-emitting area in case of necessity, and the light input optical fibre head of fiber spectrometer is installed in polynary brightness detector and receives in the optical plane.
Claims (6)
1. one kind is used for backlight optical parametric on-line measuring device, comprising: polynary brightness detector plate (1), AD digital collection Circuits System (2), current regulator power supply (6) and computing machine (4); It is characterized in that:
AD digital collection Circuits System (2) and current regulator power supply (6) are installed in the cabinet (9); The recessed cabinet inwall in cabinet bottom surface (902), the recessed degree of depth in bottom surface are the height that is used to carry sample inlet/outlet (901) before and after the cabinet; Cabinet bottom surface place have one with the window of the identical size of polynary brightness detector plate, polynary brightness detector plate is installed on this window; Be equipped with on the pedestal (10) one run through door before and after the cabinet guide rail (11), be used to carry sample objective table (8); Also have a starting switch (12) that starts test procedure on the pedestal, when sample is delivered to the measuring position, trigger the startup test procedure.
2. utilize said on-line measuring device to measure the detection method of backlight light-emitting area brightness data, it is characterized in that step is following:
A. detect according to sample (5) and require to make up polynary brightness detector plate (1), and it is installed on the window of locating to have in the cabinet bottom surface;
B. the sample backlight is fixed on the sample stage (8); Regulate sample stage; Make the gap between the light-emitting area of test surface and tested backlight sample of polynary brightness detector plate as far as possible little; Little to tested backlight sample can be smoothly test surface through polynary brightness detector plate, and be not scratched each other; Through guide rail (11) the sample backlight is transported to the measuring position at last, below the promptly polynary brightness detector plate;
C. supply power to tested backlight sample and AD digital collection Circuits System (2) by current regulator power supply (6); Start test starting switch (12); The polynary brightness detector plate of AD digital collection Circuits System scanning collection output data; Through data transmission bus input computing machine, through data processing, show, store the luminance test data of backlight light-emitting area.
3. according to a kind of backlight optical parametric on-line measuring device of claim 1 and 2, it is characterized in that described polynary brightness detector plate (1) is by placing polynary solar panel (101) and filter board (102) on the substrate (100) to form successively.
4. according to a kind of backlight optical parametric on-line measuring device of claim 3, it is characterized in that the number of described polynary solar panel (101) unit and distribute all requiring to decide according to the sample backlight.
5. according to a kind of backlight optical parametric on-line measuring device of claim 3, it is characterized in that described filter board (102) is a blue transparent glass optical filter 102.
6. according to a kind of backlight optical parametric on-line measuring device of claim 3; The low-resistance precision resistance that it is characterized in that each unit parallel connection of described polynary solar panel (101) will satisfy device short-circuit current output condition, makes the brightness of output signal and incident light linear.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2012100916606A CN102636335A (en) | 2012-03-31 | 2012-03-31 | Device and method for detecting optical parameter of backlight in on-line manner |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2012100916606A CN102636335A (en) | 2012-03-31 | 2012-03-31 | Device and method for detecting optical parameter of backlight in on-line manner |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN102636335A true CN102636335A (en) | 2012-08-15 |
Family
ID=46620816
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2012100916606A Pending CN102636335A (en) | 2012-03-31 | 2012-03-31 | Device and method for detecting optical parameter of backlight in on-line manner |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN102636335A (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103062718A (en) * | 2012-12-14 | 2013-04-24 | 京东方科技集团股份有限公司 | Optical simulation device of backlight source |
| CN103630332A (en) * | 2013-11-15 | 2014-03-12 | 南京中电熊猫照明有限公司 | Backlight brightness uniformity measuring device and method |
| CN105588710A (en) * | 2016-03-07 | 2016-05-18 | 京东方科技集团股份有限公司 | Backlight source monitoring device and lamp lighting device |
| CN109782164A (en) * | 2019-01-25 | 2019-05-21 | 高铭电子（惠州）有限公司 | The detection method of automobile starting switch |
Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006153698A (en) * | 2004-11-30 | 2006-06-15 | Toppan Printing Co Ltd | Device and method for measuring contrast ratio |
| CN200959025Y (en) * | 2006-10-09 | 2007-10-10 | 深圳市量子光电子有限公司 | LED testing operation platform |
| CN101159121A (en) * | 2007-11-20 | 2008-04-09 | 京东方科技集团股份有限公司 | Back-light source control system and method |
| CN101566500A (en) * | 2008-04-23 | 2009-10-28 | 广州市光机电技术研究院 | Device and method for testing LED light source intensity space distribution characteristic |
| CN101571451A (en) * | 2008-04-28 | 2009-11-04 | 广州市光机电技术研究院 | Device for continuously detecting integrative luminescence properties of light emitting diode (LED) light source |
| CN201488865U (en) * | 2009-08-05 | 2010-05-26 | 东莞东聚电子电讯制品有限公司 | Vision detector for comfort level of light source |
| CN102213615A (en) * | 2011-04-01 | 2011-10-12 | 中国兵器工业第二〇五研究所 | LED optical parameter comprehensive testing device |
-
2012
- 2012-03-31 CN CN2012100916606A patent/CN102636335A/en active Pending
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006153698A (en) * | 2004-11-30 | 2006-06-15 | Toppan Printing Co Ltd | Device and method for measuring contrast ratio |
| CN200959025Y (en) * | 2006-10-09 | 2007-10-10 | 深圳市量子光电子有限公司 | LED testing operation platform |
| CN101159121A (en) * | 2007-11-20 | 2008-04-09 | 京东方科技集团股份有限公司 | Back-light source control system and method |
| CN101566500A (en) * | 2008-04-23 | 2009-10-28 | 广州市光机电技术研究院 | Device and method for testing LED light source intensity space distribution characteristic |
| CN101571451A (en) * | 2008-04-28 | 2009-11-04 | 广州市光机电技术研究院 | Device for continuously detecting integrative luminescence properties of light emitting diode (LED) light source |
| CN201488865U (en) * | 2009-08-05 | 2010-05-26 | 东莞东聚电子电讯制品有限公司 | Vision detector for comfort level of light source |
| CN102213615A (en) * | 2011-04-01 | 2011-10-12 | 中国兵器工业第二〇五研究所 | LED optical parameter comprehensive testing device |
Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103062718A (en) * | 2012-12-14 | 2013-04-24 | 京东方科技集团股份有限公司 | Optical simulation device of backlight source |
| CN103062718B (en) * | 2012-12-14 | 2015-02-25 | 京东方科技集团股份有限公司 | Optical simulation device of backlight source |
| CN103630332A (en) * | 2013-11-15 | 2014-03-12 | 南京中电熊猫照明有限公司 | Backlight brightness uniformity measuring device and method |
| CN103630332B (en) * | 2013-11-15 | 2017-01-11 | 南京中电熊猫照明有限公司 | Backlight brightness uniformity measuring device and method |
| CN105588710A (en) * | 2016-03-07 | 2016-05-18 | 京东方科技集团股份有限公司 | Backlight source monitoring device and lamp lighting device |
| CN105588710B (en) * | 2016-03-07 | 2019-01-18 | 京东方科技集团股份有限公司 | Backlight monitoring device and lighting machine |
| US10578484B2 (en) | 2016-03-07 | 2020-03-03 | Boe Technology Group Co., Ltd. | Backlight source testing device and light-on testing apparatus |
| CN109782164A (en) * | 2019-01-25 | 2019-05-21 | 高铭电子（惠州）有限公司 | The detection method of automobile starting switch |
| CN109782164B (en) * | 2019-01-25 | 2021-04-23 | 高铭电子（惠州）有限公司 | Detection method of automobile starting switch |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN103630332B (en) | Backlight brightness uniformity measuring device and method | |
| CN103926553B (en) | Self-service single-phase electric energy meter calibrates for error devices and methods therefor | |
| CN104165752A (en) | Testing method and apparatus for illumination uniformity of light uniform lamp | |
| CN102636335A (en) | Device and method for detecting optical parameter of backlight in on-line manner | |
| CN203705021U (en) | Liquid crystal display data error detector of intelligent meter | |
| CN210108419U (en) | Equipment and system for automatic comprehensive test and aging of laser | |
| CN105445972A (en) | Probe movement device | |
| CN102507150A (en) | On-line real-time detection device of optical parameters, color parameters and electrical parameters of light emitting diode (LED) lamp | |
| CN102661715A (en) | CCD (charge coupled device) type clearance measurement system and method | |
| CN202869778U (en) | Large-area backlight brightness parameter testing device | |
| CN108387825A (en) | Automobile connector PIN needle detection machine and its detection method | |
| CN108188042A (en) | Apply the full-automatic online light transmittance detecting system in Mobile phone screen glass production line | |
| CN202631227U (en) | Device for online detecting backlight optical parameter | |
| CN207113808U (en) | A kind of cell piece angularity measuring instrument | |
| CN107316594A (en) | A kind of OLED minitype displayer automatic checkout system and method | |
| CN101680929B (en) | Integrated circuit probe card analyzer | |
| CN209116975U (en) | The assembly precision detection device of a kind of electronic equipment screen assembly | |
| CN116794047A (en) | Device and method for detecting quality of solar cell printing screen | |
| CN207832960U (en) | A kind of circuit board testing system | |
| CN208921400U (en) | A kind of automatic detection device | |
| CN109029537A (en) | A kind of pointer-type sync bit indicator test device and its application method | |
| CN110017313A (en) | A kind of Novel air cylinder performance detecting system and its detection method | |
| CN101726404A (en) | Detection platform for luminous component with a plurality of luminous elements and detection method thereof | |
| CN102243385A (en) | Device for measuring photoelectric characteristic curve of liquid crystal on silicon imaging chip | |
| CN107202679A (en) | A kind of photoelectric integral type test system and photoelectric test method |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C02 | Deemed withdrawal of patent application after publication (patent law 2001) | ||
| WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20120815 |