CN102621401A - 单粒子瞬态脉冲宽度测量电路 - Google Patents
单粒子瞬态脉冲宽度测量电路 Download PDFInfo
- Publication number
- CN102621401A CN102621401A CN2012100809318A CN201210080931A CN102621401A CN 102621401 A CN102621401 A CN 102621401A CN 2012100809318 A CN2012100809318 A CN 2012100809318A CN 201210080931 A CN201210080931 A CN 201210080931A CN 102621401 A CN102621401 A CN 102621401A
- Authority
- CN
- China
- Prior art keywords
- signal
- circuit
- upset
- input end
- output terminal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000002245 particle Substances 0.000 title claims abstract description 58
- 230000001052 transient effect Effects 0.000 title claims abstract description 18
- 230000007274 generation of a signal involved in cell-cell signaling Effects 0.000 claims description 14
- 230000008676 import Effects 0.000 claims description 5
- 230000000694 effects Effects 0.000 description 22
- 238000005259 measurement Methods 0.000 description 7
- 230000005855 radiation Effects 0.000 description 6
- 238000000034 method Methods 0.000 description 4
- 230000008859 change Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 230000008569 process Effects 0.000 description 2
- 230000000191 radiation effect Effects 0.000 description 2
- 238000009825 accumulation Methods 0.000 description 1
- JJWKPURADFRFRB-UHFFFAOYSA-N carbonyl sulfide Chemical compound O=C=S JJWKPURADFRFRB-UHFFFAOYSA-N 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000012938 design process Methods 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000005510 radiation hardening Methods 0.000 description 1
- 238000004088 simulation Methods 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
Images
Landscapes
- Measurement Of Current Or Voltage (AREA)
Abstract
Description
Claims (6)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201210080931.8A CN102621401B (zh) | 2012-03-23 | 2012-03-23 | 单粒子瞬态脉冲宽度测量电路 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201210080931.8A CN102621401B (zh) | 2012-03-23 | 2012-03-23 | 单粒子瞬态脉冲宽度测量电路 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN102621401A true CN102621401A (zh) | 2012-08-01 |
CN102621401B CN102621401B (zh) | 2014-08-20 |
Family
ID=46561433
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201210080931.8A Expired - Fee Related CN102621401B (zh) | 2012-03-23 | 2012-03-23 | 单粒子瞬态脉冲宽度测量电路 |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN102621401B (zh) |
Cited By (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102981063A (zh) * | 2012-11-13 | 2013-03-20 | 工业和信息化部电子第五研究所 | 单粒子瞬态脉冲宽度测量方法和测量装置、脉冲产生装置 |
CN103219970A (zh) * | 2013-04-02 | 2013-07-24 | 工业和信息化部电子第五研究所 | 单粒子瞬态脉冲宽度展宽方法与电路 |
CN104678188A (zh) * | 2014-12-22 | 2015-06-03 | 中国科学院微电子研究所 | 单粒子瞬态脉冲宽度测量电路 |
CN104808073A (zh) * | 2015-04-20 | 2015-07-29 | 中国科学院微电子研究所 | 单粒子瞬态脉冲宽度测量电路 |
CN105675984A (zh) * | 2016-01-19 | 2016-06-15 | 中国科学院上海微***与信息技术研究所 | 一种脉冲波形测试电路 |
CN106443202A (zh) * | 2016-08-31 | 2017-02-22 | 西北核技术研究所 | 一种片上自触发单粒子瞬态脉冲宽度测量方法及*** |
CN106569041A (zh) * | 2016-10-31 | 2017-04-19 | 中国科学院微电子研究所 | 单粒子瞬态脉冲宽度测量电路、集成电路和电子设备 |
CN106569042A (zh) * | 2016-10-31 | 2017-04-19 | 中国科学院微电子研究所 | 单粒子瞬态脉冲宽度测量电路、集成电路和电子设备 |
CN104808073B (zh) * | 2015-04-20 | 2018-02-09 | 中国科学院微电子研究所 | 单粒子瞬态脉冲宽度测量电路 |
CN108333440A (zh) * | 2017-12-30 | 2018-07-27 | 聚光科技(杭州)股份有限公司 | 脉冲检测方法及装置 |
CN110208608A (zh) * | 2019-05-10 | 2019-09-06 | 中国人民解放军国防科技大学 | 一种低功耗小型化单粒子瞬态参数测试装置及方法 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20060119410A1 (en) * | 2004-12-06 | 2006-06-08 | Honeywell International Inc. | Pulse-rejecting circuit for suppressing single-event transients |
US20080258792A1 (en) * | 2007-04-19 | 2008-10-23 | Honeywell International Inc. | Digital Single Event Transient Hardened Register Using Adaptive Hold |
CN101447786A (zh) * | 2008-12-29 | 2009-06-03 | 北京时代民芯科技有限公司 | 一种抗单粒子瞬态缓冲器单元电路 |
CN101551421A (zh) * | 2009-02-27 | 2009-10-07 | 北京时代民芯科技有限公司 | 一种单粒子瞬态脉冲收集及检测电路结构 |
-
2012
- 2012-03-23 CN CN201210080931.8A patent/CN102621401B/zh not_active Expired - Fee Related
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20060119410A1 (en) * | 2004-12-06 | 2006-06-08 | Honeywell International Inc. | Pulse-rejecting circuit for suppressing single-event transients |
US20080258792A1 (en) * | 2007-04-19 | 2008-10-23 | Honeywell International Inc. | Digital Single Event Transient Hardened Register Using Adaptive Hold |
CN101447786A (zh) * | 2008-12-29 | 2009-06-03 | 北京时代民芯科技有限公司 | 一种抗单粒子瞬态缓冲器单元电路 |
CN101551421A (zh) * | 2009-02-27 | 2009-10-07 | 北京时代民芯科技有限公司 | 一种单粒子瞬态脉冲收集及检测电路结构 |
Cited By (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102981063B (zh) * | 2012-11-13 | 2015-09-16 | 工业和信息化部电子第五研究所 | 单粒子瞬态脉冲宽度测量方法和测量装置、脉冲产生装置 |
CN102981063A (zh) * | 2012-11-13 | 2013-03-20 | 工业和信息化部电子第五研究所 | 单粒子瞬态脉冲宽度测量方法和测量装置、脉冲产生装置 |
CN103219970A (zh) * | 2013-04-02 | 2013-07-24 | 工业和信息化部电子第五研究所 | 单粒子瞬态脉冲宽度展宽方法与电路 |
CN103219970B (zh) * | 2013-04-02 | 2016-03-23 | 工业和信息化部电子第五研究所 | 单粒子瞬态脉冲宽度展宽方法与电路 |
CN104678188A (zh) * | 2014-12-22 | 2015-06-03 | 中国科学院微电子研究所 | 单粒子瞬态脉冲宽度测量电路 |
CN104678188B (zh) * | 2014-12-22 | 2017-12-12 | 中国科学院微电子研究所 | 单粒子瞬态脉冲宽度测量电路 |
CN104808073A (zh) * | 2015-04-20 | 2015-07-29 | 中国科学院微电子研究所 | 单粒子瞬态脉冲宽度测量电路 |
CN104808073B (zh) * | 2015-04-20 | 2018-02-09 | 中国科学院微电子研究所 | 单粒子瞬态脉冲宽度测量电路 |
CN105675984A (zh) * | 2016-01-19 | 2016-06-15 | 中国科学院上海微***与信息技术研究所 | 一种脉冲波形测试电路 |
CN105675984B (zh) * | 2016-01-19 | 2019-03-29 | 中国科学院上海微***与信息技术研究所 | 一种脉冲波形测试电路 |
CN106443202B (zh) * | 2016-08-31 | 2018-11-23 | 西北核技术研究所 | 一种片上自触发单粒子瞬态脉冲宽度测量方法及*** |
CN106443202A (zh) * | 2016-08-31 | 2017-02-22 | 西北核技术研究所 | 一种片上自触发单粒子瞬态脉冲宽度测量方法及*** |
CN106569041A (zh) * | 2016-10-31 | 2017-04-19 | 中国科学院微电子研究所 | 单粒子瞬态脉冲宽度测量电路、集成电路和电子设备 |
CN106569042A (zh) * | 2016-10-31 | 2017-04-19 | 中国科学院微电子研究所 | 单粒子瞬态脉冲宽度测量电路、集成电路和电子设备 |
CN106569042B (zh) * | 2016-10-31 | 2019-07-26 | 中国科学院微电子研究所 | 单粒子瞬态脉冲宽度测量电路、集成电路和电子设备 |
CN106569041B (zh) * | 2016-10-31 | 2019-07-26 | 中国科学院微电子研究所 | 单粒子瞬态脉冲宽度测量电路、集成电路和电子设备 |
CN108333440A (zh) * | 2017-12-30 | 2018-07-27 | 聚光科技(杭州)股份有限公司 | 脉冲检测方法及装置 |
CN110208608A (zh) * | 2019-05-10 | 2019-09-06 | 中国人民解放军国防科技大学 | 一种低功耗小型化单粒子瞬态参数测试装置及方法 |
CN110208608B (zh) * | 2019-05-10 | 2021-05-14 | 中国人民解放军国防科技大学 | 一种低功耗小型化单粒子瞬态参数测试装置及方法 |
Also Published As
Publication number | Publication date |
---|---|
CN102621401B (zh) | 2014-08-20 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN102621401B (zh) | 单粒子瞬态脉冲宽度测量电路 | |
CN102818939B (zh) | 单粒子瞬态脉冲宽度测量电路 | |
Yu et al. | A 12-Bit Vernier Ring Time-to-Digital Converter in 0.13$\mu {\hbox {m}} $ CMOS Technology | |
Eaton et al. | Single event transient pulsewidth measurements using a variable temporal latch technique | |
CN104678188B (zh) | 单粒子瞬态脉冲宽度测量电路 | |
CN104461808B (zh) | 一种fpga单粒子软错误影响评估方法 | |
CN103063933B (zh) | 单粒子脉冲宽度测量电路 | |
CN101499788A (zh) | 抗单粒子翻转和单粒子瞬态脉冲的d触发器 | |
CN106569040B (zh) | 单粒子瞬态脉冲宽度测量电路、集成电路和电子设备 | |
CN105740555B (zh) | 一种单粒子瞬态脉冲电流源的建模方法 | |
Berg et al. | An analysis of single event upset dependencies on high frequency and architectural implementations within actel RTAX-S family field programmable gate arrays | |
US20190018062A1 (en) | Flip flop of a digital electronic chip | |
CN106569042B (zh) | 单粒子瞬态脉冲宽度测量电路、集成电路和电子设备 | |
Felici et al. | A 20 mW, 4.8 Gbit/sec, SEU robust serializer in 65nm for read-out of data from LHC experiments | |
CN105866659A (zh) | 一种通用型单粒子多瞬态脉冲分布测量方法 | |
Bartra et al. | SET and SEU simulation toolkit for LabVIEW | |
Julai et al. | Error detection and correction of single event upset (SEU) tolerant latch | |
CN106569041B (zh) | 单粒子瞬态脉冲宽度测量电路、集成电路和电子设备 | |
CN103983834A (zh) | 一种单粒子瞬态脉冲信号幅度测量电路 | |
CN106998198B (zh) | 一种自适应的触发器加固电路 | |
CN104808073B (zh) | 单粒子瞬态脉冲宽度测量电路 | |
CN104808073A (zh) | 单粒子瞬态脉冲宽度测量电路 | |
Ben-Romdhane et al. | Design methodology of an ASIC TRNG based on an open-loop delay chain | |
Hiemstra et al. | Dynamic single event upset characterization of the Virtex-II and Spartan-3 SRAM field programmable gate arrays using proton irradiation | |
Yang et al. | Initial designs of an on-chip EMI sensor array |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
C41 | Transfer of patent application or patent right or utility model | ||
TR01 | Transfer of patent right |
Effective date of registration: 20160712 Address after: 300304 Tianjin District of Dongli City Huaming High-tech Zone HuaFeng Road No. 6 E1 Patentee after: Zhongke Huayi (Tianjin) Microelectronics Co.,Ltd. Address before: 100029 Beijing city Chaoyang District Beitucheng West Road No. 3 Patentee before: Institute of Microelectronics of the Chinese Academy of Sciences |
|
TR01 | Transfer of patent right |
Effective date of registration: 20230531 Address after: 100029 Beijing city Chaoyang District Beitucheng West Road No. 3 Patentee after: Institute of Microelectronics of the Chinese Academy of Sciences Address before: 300304 E1, No. 6 Huafeng Road, Huaming High tech Zone, Dongli District, Tianjin City Patentee before: Zhongke Huayi (Tianjin) Microelectronics Co.,Ltd. |
|
TR01 | Transfer of patent right | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20140820 |
|
CF01 | Termination of patent right due to non-payment of annual fee |