CN102590222A - Photovoltaic component defect detection method and system - Google Patents
Photovoltaic component defect detection method and system Download PDFInfo
- Publication number
- CN102590222A CN102590222A CN2012100570330A CN201210057033A CN102590222A CN 102590222 A CN102590222 A CN 102590222A CN 2012100570330 A CN2012100570330 A CN 2012100570330A CN 201210057033 A CN201210057033 A CN 201210057033A CN 102590222 A CN102590222 A CN 102590222A
- Authority
- CN
- China
- Prior art keywords
- coordinate
- image
- blackspot
- photovoltaic module
- shadow region
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Landscapes
- Photovoltaic Devices (AREA)
Abstract
The invention discloses a photovoltaic component defect detection method and system. The method comprises: performing defect detection imaging on a photovoltaic component to obtain an image of the photovoltaic component to be detected; scanning the image of the photovoltaic component to be detected; acquiring coordinates on dark/light junctures in the image, using the coordinate from the light area to the dark area as the first coordinate in coordinates and using the coordinate from the dark area to the light area as the second coordinate; calculating the sum of the area of all the black-spot shadow areas on the image by using the coordinate difference between the first coordinate and the second coordinate in the image; and judging whether the sum of the area of all the black-spot shadow areas is larger than the standard value or not, if yes, the photovoltaic component to be detected is judged to be ineligible. Compared with the prior detection way, the technical scheme has high detection efficiency and good accuracy.
Description
Technical field
The present invention relates to solar cell characterization processes technical field, more particularly, relate to a kind of photovoltaic module defect inspection method and system.
Background technology
Along with highlighting day by day of energy crisis, the development and use new forms of energy become the major subjects of current energy field research.Because sun power has the restriction of pollution-free, no region, advantage such as inexhaustible, the research solar energy power generating becomes the main direction that develops new forms of energy.
Thereby photovoltaic generation is to utilize the photovoltaic effect of interface luminous energy directly to be changed into a kind of technology of electric energy.The key element of this technology is a solar battery sheet, and solar battery sheet carries out packaging protection and can form large-area solar photovoltaic assembly through welding after the series connection, cooperates parts such as going up power controller just to form photovoltaic generating system again.
Some battery sheet of photovoltaic module is in carrying out welding process; Because temperature is higher or break off than local thin grid line and the main grid line that length will cause weld interval; Testing component is carried out the electroluminescence imaging, on the gained image, be shown as rectangular blackspot shade in areas of disconnection.With reference to figure 1, Fig. 1 shows the blackspot shade synoptic diagram of a battery sheet that has the blackspot shade in the photovoltaic module image to be measured, above a main grid line 2 of battery sheet 1, has three rectangular blackspot shades 3.
Existing photovoltaic module defect inspection method at first is carried out to picture to testing component, and the total area of blackspot shade in all battery sheets that have the blackspot shade is judged in the said image of range estimation in artificial afterwards and normal pictures contrast.The blackspot shaded area that gained is total and the quality standard of setting relatively judge whether photovoltaic module is qualified.
Can know through foregoing description; Existing photovoltaic module defect inspection method is the total area that blackspot shade in all battery sheets that have the blackspot shade is judged in the said image of range estimation in artificial and normal pictures contrast, and each assembly has tens or even up to a hundred battery sheets, wherein exists the battery sheet of blackspot shade several or even tens; Workload is big; And the inefficiency of artificial estimation, and degree of accuracy is poor, is prone to cause wrong choosing or leaks choosing.
Summary of the invention
For solving the problems of the technologies described above, the present invention provides a kind of photovoltaic module defect inspection method and system, and said detection method high efficiency, measuring accuracy are good.
For realizing above-mentioned purpose, the present invention provides following technical scheme:
A kind of photovoltaic module defect inspection method, this method comprises:
Photovoltaic module is carried out the defects detection imaging, obtain photovoltaic module image to be measured, have a plurality of blackspots shadow region on the said image, the brightness of said blackspot shadow region is lower than other regional brightness;
Said photovoltaic module image to be measured is scanned;
Collect the coordinate of bright dark intersection in the said image, in a plurality of coordinates, will be by the clear zone to the coordinate of dark space as first coordinate; Will be by the dark space to the coordinate in clear zone as second coordinate; Wherein, in a plurality of coordinates that obtain, said first coordinate and second coordinate alternately distribute; A certain second coordinate and the difference of previous first coordinate are represented the size in corresponding blackspot shadow region;
Utilize the coordinate difference of first coordinate and second coordinate in the said image, calculate the area sum of all blackspot shadow regions on the said image;
Whether the area sum of judging said blackspot shadow region the overgauge value, if then this photovoltaic module to be measured is defective.
Preferably, in the said method, saidly photovoltaic module is carried out defects detection be imaged as: adopt the EL imaging device to treat the photometry photovoltaic assembly and carry out the defects detection imaging.
Preferably, in the said method, the horizontal ordinate direction of said coordinate is identical with the bearing of trend of battery sheet main grid line, and the direction of ordinate is identical with the bearing of trend of said blackspot shadow region.
Preferably, in the said method, the bearing of trend of said blackspot shadow region is meant the direction vertical with the direction of said horizontal ordinate in the picture plane.
The present invention also provides a kind of photovoltaic module defect detecting system, and this system comprises:
Image-generating unit is used to treat the photometry photovoltaic assembly and carries out the defects detection imaging;
Graphics processing unit;
Wherein, said graphics processing unit comprises:
Be used for scanning element that said photovoltaic module image to be measured is carried out image scanning;
Be used for collecting the coordinate collecting unit of the bright dark intersection coordinate of said image; In a plurality of coordinates that said collecting unit is gathered, will be by the clear zone to the coordinate of dark space as first coordinate, will be by the dark space to the coordinate in clear zone as second coordinate; In a plurality of coordinates that obtain; Said first coordinate and second coordinate alternately distribute, and wherein, a certain second coordinate and the difference of previous first coordinate are represented the size in corresponding blackspot shadow region;
Be used for calculating the computing unit of photovoltaic module image blackspot shaded area to be measured, the coordinate difference of first coordinate and second coordinate in the said image of the unit by using of said calculating calculates the area sum of all blackspot shadow regions on the said image;
Whether judging unit, the area sum of the said blackspot of said judgment unit judges shadow region the overgauge value, if then this photovoltaic module to be measured is defective.
Preferably, in the said system, said image-generating unit is the EL imaging device.
Can find out from technique scheme; Photovoltaic module defect inspection method provided by the present invention comprises: photovoltaic module is carried out the defects detection imaging; Obtain photovoltaic module image to be measured; Have a plurality of blackspots shadow region on the said image, the brightness of said blackspot shadow region is lower than other regional brightness; Said photovoltaic module image to be measured is scanned; Collect the coordinate of bright dark intersection in the said image, in a plurality of coordinates, will be by the clear zone to the coordinate of dark space as first coordinate; Will be by the dark space to the coordinate in clear zone as second coordinate; Wherein, in a plurality of coordinates that obtain, said first coordinate and second coordinate alternately distribute; A certain second coordinate and the difference of previous first coordinate are represented the size in corresponding blackspot shadow region; Utilize the coordinate difference of first coordinate and second coordinate in the said image, calculate the area sum of all blackspot shadow regions on the said image; Whether the area sum of judging said blackspot shadow region the overgauge value, if then this photovoltaic module to be measured is defective.
Description through technique scheme can be known; Photovoltaic module defect inspection method provided by the present invention is through the area of said first coordinate and each blackspot shade of second coordinate Calculation; After all blackspot shaded area summations; With gained and value and standard value relatively, judge the assembly of surveying whether qualified.Can realize the automatic measurement of photovoltaic module blackspot shaded area, can also judge automatically whether said assembly is qualified according to result of calculation simultaneously.Compare and existing detection mode, detection efficiency is high, and degree of accuracy is good.
Description of drawings
In order to be illustrated more clearly in the embodiment of the invention or technical scheme of the prior art; To do to introduce simply to the accompanying drawing of required use in embodiment or the description of the Prior Art below; Obviously, the accompanying drawing in describing below only is some embodiments of the present invention, for those of ordinary skills; Under the prerequisite of not paying creative work, can also obtain other accompanying drawing according to these accompanying drawings.
Fig. 1 is some blackspot shade synoptic diagram that has blackspot shade battery sheet in the photovoltaic module image to be measured;
Fig. 2 is the schematic flow sheet of a kind of photovoltaic module defect inspection method that the embodiment of the invention provided;
Fig. 3 is the structural representation of photovoltaic module;
Fig. 4 is the structural representation of a kind of photovoltaic module defect detecting system that the embodiment of the invention provided;
Fig. 5 is the structural representation of the graphics processing unit of photovoltaic module defect detecting system described in Fig. 4;
The structural representation of the another kind of photovoltaic module defect detecting system that Fig. 6 provides for the embodiment of the invention;
Front elevation when Fig. 7 carries out the photovoltaic module imaging for the said EL imaging device of the embodiment of the invention.
Embodiment
To combine the accompanying drawing in the embodiment of the invention below, the technical scheme in the embodiment of the invention is carried out clear, intactly description, obviously, described embodiment only is the present invention's part embodiment, rather than whole embodiment.Based on the embodiment among the present invention, those of ordinary skills are not making the every other embodiment that is obtained under the creative work prerequisite, all belong to the scope of the present invention's protection.
Embodiment one
Present embodiment provides a kind of photovoltaic module defect inspection method, and with reference to figure 2, said method comprises:
Step S1: photovoltaic module is carried out the defects detection imaging, obtain photovoltaic module image to be measured.
Can adopt the EL imaging device that photovoltaic module to be measured is detected as picture, obtain the EL image of testing component, have a plurality of blackspots shadow region on the said image, the brightness of said blackspot shadow region is lower than other regional brightness.As shown in Figure 1, on the EL of testing component image, one of them contains in the image of battery sheet of blackspot shade has three rectangular blackspot shades.
Step S2: said photovoltaic module image to be measured is scanned.
In above-mentioned steps S1 through the EL imaging device to after the testing component imaging, the image of gained is scanned, to obtain the image information that contains the testing component defective data.
Step S3: collect the coordinate of bright dark intersection in the said image, in a plurality of coordinates, will be by the clear zone to the coordinate of dark space as first coordinate, will be by the dark space to the coordinate in clear zone as second coordinate.
In a plurality of coordinates that obtain, said first coordinate and second coordinate alternately distribute, in the image in testing component, one by bright to dark junction to its nearest by being a blackspot shade secretly to bright zone.
With reference to figure 1 and Fig. 3, two of each battery sheet 1 main grid lines 2 are parallel in the photovoltaic module 4, and the main grid line 2 with the correspondence of the battery sheet 1 of delegation is point-blank in the photovoltaic module 4.So, preferably, can the main grid line bearing of trend of battery sheet be set at the horizontal ordinate direction of said coordinate, will be set at the ordinate direction of said coordinate with the bearing of trend of said blackspot shadow region.
Wherein, available a certain second coordinate and the difference of previous first coordinate are represented the size in corresponding blackspot shadow region.Can know by Fig. 3; The blackspot shade is a rectangular region, and for a blackspot shade, its bright dark junction is two line segments; Some horizontal ordinate on every line segment is identical; The ordinate difference of two end points of line segment is the length of blackspot shadow region, is known definite value, and promptly battery sheet main grid line 2 is to the distance of adjacent edge in parallel.So the horizontal ordinate that only needs to gather two bright dark junctions of blackspot shade gets final product, promptly first coordinate of a blackspot shade and second coordinate abscissa value that only need gather the two gets final product.
Carrying out coordinate when gathering, can treat that all exist the battery sheet of blackspot shade to carry out the coordinate collection in the photometry photovoltaic assembly with the row or the unit of classifying as, promptly the carries out a coordinate and the second coordinate collection.Said coordinate acquisition order is not unique, and carrying out the coordinate collection with every row or every row battery sheet described in the present embodiment is a kind of preferred implementation.
Step S4: utilize the coordinate difference of first coordinate and second coordinate in the said image, calculate the area sum of all blackspot shadow regions on the said image.
Can obtain the width of the corresponding blackspot shade of said first coordinate and second coordinate, the difference of first coordinate of promptly gathering and the horizontal ordinate of second coordinate according to above-mentioned first coordinate and second coordinate.The absolute value of gained difference multiply by known length value, can try to achieve the area of corresponding blackspot shade.
The present invention is the concrete area size that accurately solves blackspot shade in the photovoltaic module.And prior art is judged in the said image of range estimation the total area of blackspot shade in all battery sheets that have the blackspot shade through artificial and normal pictures contrast when the area of measuring light photovoltaic assembly blackspot shade; Promptly the blackspot shade is estimated measurement through the coordinate that is arranged on the normal pictures; Degree of accuracy is low, and error is bigger.So the present invention asks the area of photovoltaic module blackspot shade more accurate than prior art.
Can try to achieve the area of all blackspot shades through said method, with the area summation of all blackspot shades can get all blackspot shades in the photovoltaic module image to be measured the total area.Simultaneously, can obtain first coordinate and second coordinate of all blackspot shades after, the second all coordinate additions is deducted the first all coordinates, the absolute value of institute's value multiply by known length value, can try to achieve the total area of all blackspot shades.
Step S5: whether the area sum of judging said blackspot shadow region the overgauge value, if then this photovoltaic module to be measured is defective.
When drawing the total area of all blackspot shades in the image of photovoltaic module to be measured, can with its with the standard value of setting relatively, if the overgauge value, then said assembly is defective, need reprocess; If be less than or equal to standard value, then be qualified.
Description through above-mentioned photovoltaic module defect inspection method can be known; Said detection method can be through first coordinate and second coordinate of autoscan blackspot shade; Try to achieve the area of corresponding blackspot shade according to the difference of said first coordinate and second coordinate, try to achieve the area of all blackspot shades after, to all blackspot shaded area summations; With gained and value and standard value comparison, whether determination component is qualified.Can realize the automatic calculating of photovoltaic module blackspot shaded area, can also judge automatically whether said assembly is qualified according to result of calculation simultaneously.Compare and the existing manual detection mode, detection efficiency is high, and degree of accuracy is good.
Embodiment two
Based on photovoltaic module defect inspection method in the foregoing description, present embodiment provides a kind of photovoltaic module defect detecting system, and with reference to figure 4, said detection system comprises: image-generating unit 011, graphics processing unit 012.
Wherein, Said image-generating unit 011 is used to treat the photometry photovoltaic assembly and carries out the defects detection imaging; To obtain to contain the detected image of assembly defect information, have a plurality of blackspots shadow region on the said image, the brightness of said blackspot shadow region is lower than other regional brightness.
With reference to figure 5, said graphics processing unit 012 comprises:
Coordinate collecting unit 022, said coordinate collecting unit 022 collects the coordinate of bright dark intersection in the said image, in a plurality of coordinates; Will be by the clear zone to the coordinate of dark space as first coordinate; Will be by the dark space to the coordinate in clear zone as second coordinate, in a plurality of coordinates that obtain, said first coordinate and second coordinate alternately distribute; In the image in testing component, one by bright to dark junction to its nearest by dark be a blackspot shade to bright zone;
Wherein, a certain second coordinate and the difference of previous first coordinate are represented the size in corresponding blackspot shadow region.Because the blackspot shade is a rectangular region, so for a blackspot shade, its bright dark junction is two line segments; Some horizontal ordinate on every line segment is identical; The ordinate difference of two end points of line segment is the length of blackspot shade, is known definite value, so; The horizontal ordinate that only needs to gather two bright dark junctions of blackspot shade self gets final product, and promptly first coordinate of a blackspot shade and second coordinate abscissa value that only need gather the two gets final product;
Whether the area sum that judging unit 024, said judging unit 024 are judged said blackspot shadow region the overgauge value, if then this photovoltaic module to be measured is defective, if be less than or equal to standard value, then is specification product.
Wherein, identical among the horizontal ordinate direction setting of said coordinate and the embodiment one.
Can know that through foregoing description said photovoltaic module defect detecting system can be realized the automatic calculating of the blackspot shaded area of photovoltaic module to be measured, simultaneously, can also judge automatically whether said assembly is qualified according to result of calculation, detection efficiency is high, and degree of accuracy is good.
Embodiment three
The said photovoltaic module defect detecting system of technical scheme of the present invention can be realized by the mode that software adds essential hardware platform.So on the basis of the foregoing description, present embodiment provides another kind of photovoltaic module defect detecting system.
With reference to figure 6, the structural representation of the another kind of photovoltaic module defect detecting system that Fig. 6 provides for the embodiment of the invention.Said system comprises: be used for photovoltaic module is carried out to the EL imaging device of picture, EL is the abbreviation of " electroluminescence ", shown in the dashed rectangle of top among Fig. 6; With the image processing apparatus 8 that said EL imaging device is connected, said image processing apparatus 8 is for being equipped with the computing machine of graphics processing unit described in the embodiment two.
Wherein, D.C. regulated power supply 9 provides working current for said EL imaging device, makes testing component 10 electroluminescence, so that camera 7 is carried out to picture to it, obtains containing the image of assembly defect information.
Need to prove that Fig. 6 is merely a structural representation,, for the ease of describing explanation, only illustrate its structure among Fig. 6 through said dashed rectangle because EL imaging device structure and each parts annexation are comparatively complicated; Said EL imaging device is claimed the EL tester again, is the proving installation of developing according to the electroluminescence principle of solar cell that is used to detect and study the photovoltaic module product quality.
With reference to figure 7, the front elevation when Fig. 7 carries out the photovoltaic module imaging for EL imaging device according to the invention.Said EL imaging device mainly is divided into three parts: transmission range A, imaging area B and transmission range C.Said transmission range A, imaging area B and transmission range C divide shown in two dotted lines among the figure.
Concrete, said transmission range A, transmission range C mainly transmit photovoltaic module, and its critical piece is power wheel 11 and is wrapped in the driving belt 12 on the said power wheel 11.Detected light photovoltaic assembly 22 transmits on said transmission belt 12, and direction shown in the arrow is the transmission direction of said belt 12 among the figure.
Article two, part is the imaging area B of said EL imaging device between the dotted line.Said imaging area B comprises: darkroom 13; The correspondence position of 13 left and right sides, said darkroom and said transmission range A, transmission range C feed belt 12 is provided with darkroom inlet and darkroom outlet, said darkroom inlet and darkroom outlet be respectively arranged with can automatic switch safety door 14 and safety door 15; Be arranged on the rack platform 16 in the said darkroom 13.
Wherein, said rack platform 16 is provided with lifting cylinder 17, is used to control the height of said rack platform 16; Said rack platform 16 tops are provided with driving drum 18 a plurality of, equidistant, parallel distribution, are wound with feed belt 12 on the said driving drum 18.
When photovoltaic module 22 transmits in said darkroom 13, carry out spacingly through the 19 pairs of said photovoltaic modulies 22 of guide pulley that are arranged on feed belt 12 both sides, prevent that it from wandering off.Through be arranged on the said photovoltaic module of position block 21 control on the said rack platform 16 be sent to treat image space after; Both positive and negative polarity connects electric probe 20 (because mapping angle limitations; Only show an electric probe among the figure) be connected with the both positive and negative polarity of said photovoltaic module 22, be said assembly power supply, make its electroluminescence; Obtain the image information of said photovoltaic module through video camera 22, and send said image information to be attached thereto image processing apparatus.
Said safety door 14 is connected with open the door control sensor and pass gate control sensor with safety door 15, with unlatching and the closure of controlling said safety door.The position of photovoltaic module is confirmed through the position transducer that is arranged on the direction of transfer.
Need to prove, because the restriction at observation visual angle, simultaneously for the ease of illustrating, part-structure among Fig. 7, not shown like the parts such as sensor of said position transducer, the said safety door switch of control.
After testing component moves to imaging process point; Said position transducer is controlled said position block 21 and is risen, and makes said photovoltaic module 22 stop motions, and said both positive and negative polarity of while connects electric probe 20 and is connected with the both positive and negative polarity of said assembly; Be said assembly power supply; Make its electroluminescence, obtain the image of said photovoltaic module 22, and send said image to be attached thereto image processing apparatus and carry out quality testing through video camera 23.Afterwards, said position block 21 descends, and said photovoltaic module is transmitted out darkroom 13, continues the detection of next photovoltaic module.Said image processing apparatus obtains said image, and is identical with embodiment two, at first, through its inner scanning element said image carried out image scanning, to obtain the image information that contains the testing component defective data.Afterwards through coordinate collecting unit coordinate acquisition, according to the coordinate information of being gathered, through the area sum of all blackspot shadow regions in the computing unit computed image.At last, whether qualified through judgment unit judges detected light photovoltaic assembly.Can be through image processing apparatus display output testing result.But the processing procedure of a unit in the concrete processing procedure reference implementation example two.
Can know through foregoing description, adopt the described photovoltaic module defect detecting system of present embodiment, can realize the automatic calculating of the blackspot shaded area of photovoltaic module to be measured; Simultaneously; Can also judge automatically whether said assembly is qualified according to result of calculation, detection efficiency is high, and degree of accuracy is good.
At last; Also need to prove; In this article; Relational terms such as first and second grades only is used for an entity or operation are made a distinction with another entity or operation, and not necessarily requires or hint relation or the order that has any this reality between these entities or the operation.And; Term " comprises ", " comprising " or its any other variant are intended to contain comprising of nonexcludability; Thereby make and comprise that process, method, article or the equipment of a series of key elements not only comprise those key elements; But also comprise other key elements of clearly not listing, or also be included as this process, method, article or equipment intrinsic key element.Under the situation that do not having much more more restrictions, the key element that limits by statement " comprising ... ", and be not precluded within process, method, article or the equipment that comprises said key element and also have other identical element.
Description through above embodiment; Those skilled in the art can be well understood to the present invention and can realize by the mode that software adds essential hardware platform; Can certainly all implement, but the former is better embodiment under a lot of situation through hardware.Based on such understanding; All or part of can the coming out that technical scheme of the present invention contributes to background technology with the embodied of software product; This computer software product can be stored in the storage medium, like ROM/RAM, magnetic disc, CD etc., comprises that some instructions are with so that a computer equipment (can be a personal computer; Server, the perhaps network equipment etc.) carry out the described method of some part of each embodiment of the present invention or embodiment.
Each embodiment adopts the mode of going forward one by one to describe in this instructions, and what each embodiment stressed all is and the difference of other embodiment that identical similar part is mutually referring to getting final product between each embodiment.For the disclosed system of embodiment, because it is corresponding with the embodiment disclosed method, so description is fairly simple, relevant part is partly explained referring to method and is got final product.
Used concrete example among this paper principle of the present invention and embodiment are set forth, the explanation of above embodiment just is used for helping to understand method of the present invention and core concept thereof; Simultaneously, for one of ordinary skill in the art, according to thought of the present invention, part all can change on embodiment and range of application.In sum, this description should not be construed as limitation of the present invention.
Claims (6)
1. a photovoltaic module defect inspection method is characterized in that, comprising:
Photovoltaic module is carried out the defects detection imaging, obtain photovoltaic module image to be measured, have a plurality of blackspots shadow region on the said image, the brightness of said blackspot shadow region is lower than other regional brightness;
Said photovoltaic module image to be measured is scanned;
Collect the coordinate of bright dark intersection in the said image, in a plurality of coordinates, will be by the clear zone to the coordinate of dark space as first coordinate; Will be by the dark space to the coordinate in clear zone as second coordinate; Wherein, in a plurality of coordinates that obtain, said first coordinate and second coordinate alternately distribute; A certain second coordinate and the difference of previous first coordinate are represented the size in corresponding blackspot shadow region;
Utilize the coordinate difference of first coordinate and second coordinate in the said image, calculate the area sum of all blackspot shadow regions on the said image;
Whether the area sum of judging said blackspot shadow region the overgauge value, if then this photovoltaic module to be measured is defective.
2. method according to claim 1 is characterized in that, saidly photovoltaic module is carried out defects detection is imaged as: adopt the EL imaging device to treat the photometry photovoltaic assembly and carry out the defects detection imaging.
3. method according to claim 1 is characterized in that, the horizontal ordinate direction of said coordinate is identical with the bearing of trend of battery sheet main grid line, and the direction of ordinate is identical with the bearing of trend of said blackspot shadow region.
4. method according to claim 2 is characterized in that, the bearing of trend of said blackspot shadow region is meant the direction vertical with the direction of said horizontal ordinate in the picture plane.
5. a photovoltaic module defect detecting system is characterized in that, comprising:
Image-generating unit is used to treat the photometry photovoltaic assembly and carries out the defects detection imaging;
Graphics processing unit;
Wherein, said graphics processing unit comprises:
Be used for scanning element that said photovoltaic module image to be measured is carried out image scanning;
Be used for collecting the coordinate collecting unit of the bright dark intersection coordinate of said image; In a plurality of coordinates that said collecting unit is gathered, will be by the clear zone to the coordinate of dark space as first coordinate, will be by the dark space to the coordinate in clear zone as second coordinate; In a plurality of coordinates that obtain; Said first coordinate and second coordinate alternately distribute, and wherein, a certain second coordinate and the difference of previous first coordinate are represented the size in corresponding blackspot shadow region;
Be used for calculating the computing unit of photovoltaic module image blackspot shaded area to be measured, the coordinate difference of first coordinate and second coordinate in the said image of the unit by using of said calculating calculates the area sum of all blackspot shadow regions on the said image;
Whether judging unit, the area sum of the said blackspot of said judgment unit judges shadow region the overgauge value, if then this photovoltaic module to be measured is defective.
6. system according to claim 4 is characterized in that, said image-generating unit is the EL imaging device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2012100570330A CN102590222A (en) | 2012-03-06 | 2012-03-06 | Photovoltaic component defect detection method and system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2012100570330A CN102590222A (en) | 2012-03-06 | 2012-03-06 | Photovoltaic component defect detection method and system |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN102590222A true CN102590222A (en) | 2012-07-18 |
Family
ID=46479161
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2012100570330A Pending CN102590222A (en) | 2012-03-06 | 2012-03-06 | Photovoltaic component defect detection method and system |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN102590222A (en) |
Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107046083A (en) * | 2017-03-13 | 2017-08-15 | 南京日托光伏科技股份有限公司 | A kind of MWT photovoltaic modulies partial short-circuit repair method |
| CN107290348A (en) * | 2017-08-07 | 2017-10-24 | 伟创力电子技术(苏州)有限公司 | A kind of EL test equipments of the crystal silicon component defect of automatic sorting |
| CN107764832A (en) * | 2017-09-29 | 2018-03-06 | 青海黄河上游水电开发有限责任公司光伏产业技术分公司 | The hidden of photovoltaic module splits defect inspection method |
| CN107831173A (en) * | 2017-10-17 | 2018-03-23 | 哈尔滨工业大学（威海） | Photovoltaic component defect detection method and system |
| CN108181310A (en) * | 2017-12-16 | 2018-06-19 | 武汉谷丰光电科技有限公司 | Detect wire type small potted plant plant detection platform |
| CN110443278A (en) * | 2019-07-02 | 2019-11-12 | 广州大学 | A kind of detection method, device and the equipment of solar battery sheet grid line thickness exception |
| CN110866916A (en) * | 2019-11-29 | 2020-03-06 | 广州大学 | Machine vision-based photovoltaic cell black-core black-corner detection method, device and equipment |
| CN114972150A (en) * | 2021-02-24 | 2022-08-30 | 正泰集团研发中心(上海)有限公司 | Photovoltaic module size defect detection method |
| CN115205509A (en) * | 2022-09-16 | 2022-10-18 | 上海英立视电子有限公司 | Method and system for adjusting stereoscopic impression of image |
| CN116593400A (en) * | 2023-07-17 | 2023-08-15 | 国家电投集团江西电力有限公司 | Method and system for detecting black spot damage of solar panel |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS54119843A (en) * | 1978-03-10 | 1979-09-18 | Hitachi Ltd | Recognition unit for graphic shape |
| JPH04236343A (en) * | 1991-01-18 | 1992-08-25 | Nippon Sheet Glass Co Ltd | Detecting method of defect of glass edge |
| JPH08101130A (en) * | 1994-09-29 | 1996-04-16 | Fuji Xerox Co Ltd | Surface flaw inspecting device |
| JP2006023130A (en) * | 2004-07-06 | 2006-01-26 | Daido Steel Co Ltd | End face position detector for semifinished product of steel |
| CN101620257A (en) * | 2008-07-01 | 2010-01-06 | 日清纺控股株式会社 | Photovoltaic devices inspection apparatus and method of determining defects in photovoltaic device |
| CN101696945A (en) * | 2009-11-13 | 2010-04-21 | 无锡众望四维科技有限公司 | On-line detection method of machine vision system to photovoltaic glass flaws |
-
2012
- 2012-03-06 CN CN2012100570330A patent/CN102590222A/en active Pending
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS54119843A (en) * | 1978-03-10 | 1979-09-18 | Hitachi Ltd | Recognition unit for graphic shape |
| JPH04236343A (en) * | 1991-01-18 | 1992-08-25 | Nippon Sheet Glass Co Ltd | Detecting method of defect of glass edge |
| JPH08101130A (en) * | 1994-09-29 | 1996-04-16 | Fuji Xerox Co Ltd | Surface flaw inspecting device |
| JP2006023130A (en) * | 2004-07-06 | 2006-01-26 | Daido Steel Co Ltd | End face position detector for semifinished product of steel |
| CN101620257A (en) * | 2008-07-01 | 2010-01-06 | 日清纺控股株式会社 | Photovoltaic devices inspection apparatus and method of determining defects in photovoltaic device |
| CN101696945A (en) * | 2009-11-13 | 2010-04-21 | 无锡众望四维科技有限公司 | On-line detection method of machine vision system to photovoltaic glass flaws |
Cited By (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107046083A (en) * | 2017-03-13 | 2017-08-15 | 南京日托光伏科技股份有限公司 | A kind of MWT photovoltaic modulies partial short-circuit repair method |
| CN107046083B (en) * | 2017-03-13 | 2018-08-31 | 南京日托光伏科技股份有限公司 | A kind of MWT photovoltaic modulies partial short-circuit repair method |
| CN107290348A (en) * | 2017-08-07 | 2017-10-24 | 伟创力电子技术(苏州)有限公司 | A kind of EL test equipments of the crystal silicon component defect of automatic sorting |
| CN107764832A (en) * | 2017-09-29 | 2018-03-06 | 青海黄河上游水电开发有限责任公司光伏产业技术分公司 | The hidden of photovoltaic module splits defect inspection method |
| CN107831173A (en) * | 2017-10-17 | 2018-03-23 | 哈尔滨工业大学（威海） | Photovoltaic component defect detection method and system |
| CN108181310A (en) * | 2017-12-16 | 2018-06-19 | 武汉谷丰光电科技有限公司 | Detect wire type small potted plant plant detection platform |
| CN110443278A (en) * | 2019-07-02 | 2019-11-12 | 广州大学 | A kind of detection method, device and the equipment of solar battery sheet grid line thickness exception |
| CN110443278B (en) * | 2019-07-02 | 2022-02-15 | 广州大学 | Method, device and equipment for detecting thickness abnormality of grid line of solar cell |
| CN110866916A (en) * | 2019-11-29 | 2020-03-06 | 广州大学 | Machine vision-based photovoltaic cell black-core black-corner detection method, device and equipment |
| CN114972150A (en) * | 2021-02-24 | 2022-08-30 | 正泰集团研发中心(上海)有限公司 | Photovoltaic module size defect detection method |
| CN114972150B (en) * | 2021-02-24 | 2023-12-05 | 正泰集团研发中心(上海)有限公司 | Method for detecting dimension defect of photovoltaic module |
| CN115205509A (en) * | 2022-09-16 | 2022-10-18 | 上海英立视电子有限公司 | Method and system for adjusting stereoscopic impression of image |
| CN115205509B (en) * | 2022-09-16 | 2022-11-18 | 上海英立视电子有限公司 | Method and system for adjusting stereoscopic impression of image |
| CN116593400A (en) * | 2023-07-17 | 2023-08-15 | 国家电投集团江西电力有限公司 | Method and system for detecting black spot damage of solar panel |
| CN116593400B (en) * | 2023-07-17 | 2023-10-17 | 国家电投集团江西电力有限公司 | Method and system for detecting black spot damage of solar panel |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN102590222A (en) | Photovoltaic component defect detection method and system | |
| CN102508110B (en) | Texture-based insulator fault diagnostic method | |
| CN104978748B (en) | A kind of liquid crystal display defect inspection method based on local pixel value | |
| CN106238350B (en) | A kind of solar battery sheet method for separating and system based on machine vision | |
| CN202837487U (en) | Solar cell detecting device | |
| CN106093068A (en) | The imaging system of lithium battery pole slice surface defect detection apparatus and using method thereof | |
| CN203232220U (en) | Liquid crystal display panel detecting equipment | |
| CN106228532B (en) | A kind of LCD screen sub-pixel defect inspection method | |
| CN108647677A (en) | The ammeter appearance and performance intelligent detecting method and device that view-based access control model calculates | |
| CN107612503B (en) | Solar panel fault detection method and system and robot | |
| CN104270065A (en) | Solar Power Generation System | |
| CN105783794B (en) | A kind of plane monitoring-network method and apparatus | |
| CN106656035B (en) | A kind of photovoltaic plant fault detection method | |
| CN105158678A (en) | Printed circuit board short-circuit fault rapid detection device | |
| JP2015043395A (en) | Solar cell device and utilization of the same | |
| CN107515481A (en) | The detection method and device of a kind of display panel | |
| CN202952978U (en) | Train part information collector | |
| CN103616167A (en) | Automatic detection system for luminance uniformity of backlight source | |
| CN110455827A (en) | A kind of smart new energy solar panel qualification detection system and method | |
| CN205941399U (en) | A imaging system for lithium - ion battery pole pieces surface defect detection device | |
| CN104931907B (en) | Digital display electrical measuring amount instrument quality group's check system based on machine vision | |
| CN111604916A (en) | Machine room IT equipment fault cabinet U-position positioning system and method | |
| CN204575561U (en) | A kind of machine vision surface detection apparatus | |
| CN104101614B (en) | A kind of detection method and device | |
| JP2014228517A (en) | Method for evaluating solar cell module and use of the same |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C12 | Rejection of a patent application after its publication | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20120718 |