CN102577102B - 用于校准放大器中的偏移的电路和方法 - Google Patents
用于校准放大器中的偏移的电路和方法 Download PDFInfo
- Publication number
- CN102577102B CN102577102B CN201080045652.7A CN201080045652A CN102577102B CN 102577102 B CN102577102 B CN 102577102B CN 201080045652 A CN201080045652 A CN 201080045652A CN 102577102 B CN102577102 B CN 102577102B
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- amplifier
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- circuit
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- 238000000034 method Methods 0.000 title claims description 23
- 238000001514 detection method Methods 0.000 claims abstract description 43
- 238000002347 injection Methods 0.000 claims description 14
- 239000007924 injection Substances 0.000 claims description 14
- 238000003860 storage Methods 0.000 claims description 13
- 230000008878 coupling Effects 0.000 claims description 5
- 238000010168 coupling process Methods 0.000 claims description 5
- 238000005859 coupling reaction Methods 0.000 claims description 5
- 230000008859 change Effects 0.000 claims description 3
- 238000002372 labelling Methods 0.000 description 12
- 230000008569 process Effects 0.000 description 8
- 230000008901 benefit Effects 0.000 description 7
- 230000004044 response Effects 0.000 description 7
- 230000007423 decrease Effects 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 3
- 238000012360 testing method Methods 0.000 description 3
- 230000003321 amplification Effects 0.000 description 2
- 239000013078 crystal Substances 0.000 description 2
- 230000005611 electricity Effects 0.000 description 2
- 238000003199 nucleic acid amplification method Methods 0.000 description 2
- 230000006399 behavior Effects 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 238000002955 isolation Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 230000004899 motility Effects 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
Classifications
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/45—Differential amplifiers
- H03F3/45071—Differential amplifiers with semiconductor devices only
- H03F3/45076—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier
- H03F3/45179—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier using MOSFET transistors as the active amplifying circuit
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/06—Sense amplifiers; Associated circuits, e.g. timing or triggering circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
- G11C29/026—Detection or location of defective auxiliary circuits, e.g. defective refresh counters in sense amplifiers
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
- G11C29/028—Detection or location of defective auxiliary circuits, e.g. defective refresh counters with adaption or trimming of parameters
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/06—Sense amplifiers; Associated circuits, e.g. timing or triggering circuits
- G11C7/062—Differential amplifiers of non-latching type, e.g. comparators, long-tailed pairs
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/45—Differential amplifiers
- H03F3/45071—Differential amplifiers with semiconductor devices only
- H03F3/45076—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier
- H03F3/45475—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier using IC blocks as the active amplifying circuit
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/45—Differential amplifiers
- H03F3/45071—Differential amplifiers with semiconductor devices only
- H03F3/45479—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection
- H03F3/45928—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection using IC blocks as the active amplifying circuit
- H03F3/45968—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection using IC blocks as the active amplifying circuit by offset reduction
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C2207/00—Indexing scheme relating to arrangements for writing information into, or reading information out from, a digital store
- G11C2207/22—Control and timing of internal memory operations
- G11C2207/2254—Calibration
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
- H03F2203/45—Indexing scheme relating to differential amplifiers
- H03F2203/45048—Calibrating and standardising a dif amp
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
- H03F2203/45—Indexing scheme relating to differential amplifiers
- H03F2203/45101—Control of the DC level being present
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
- H03F2203/45—Indexing scheme relating to differential amplifiers
- H03F2203/45212—Indexing scheme relating to differential amplifiers the differential amplifier being designed to have a reduced offset
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
- H03F2203/45—Indexing scheme relating to differential amplifiers
- H03F2203/45586—Indexing scheme relating to differential amplifiers the IC comprising offset generating means
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
- H03F2203/45—Indexing scheme relating to differential amplifiers
- H03F2203/45588—Indexing scheme relating to differential amplifiers the IC comprising offset compensating means
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
- H03F2203/45—Indexing scheme relating to differential amplifiers
- H03F2203/45681—Indexing scheme relating to differential amplifiers the LC comprising offset compensating means
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Amplifiers (AREA)
Abstract
Description
Claims (18)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US28548409P | 2009-12-10 | 2009-12-10 | |
US61/285,484 | 2009-12-10 | ||
PCT/US2010/059142 WO2011071836A1 (en) | 2009-12-10 | 2010-12-06 | Circuits and methods for calibrating offset in an amplifier |
Publications (2)
Publication Number | Publication Date |
---|---|
CN102577102A CN102577102A (zh) | 2012-07-11 |
CN102577102B true CN102577102B (zh) | 2016-11-30 |
Family
ID=44142235
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201080045652.7A Expired - Fee Related CN102577102B (zh) | 2009-12-10 | 2010-12-06 | 用于校准放大器中的偏移的电路和方法 |
Country Status (3)
Country | Link |
---|---|
US (2) | US8339195B2 (zh) |
CN (1) | CN102577102B (zh) |
WO (1) | WO2011071836A1 (zh) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9203351B2 (en) * | 2013-03-15 | 2015-12-01 | Megachips Corporation | Offset cancellation with minimum noise impact and gain-bandwidth degradation |
GB2521477A (en) | 2013-12-23 | 2015-06-24 | Surecore Ltd | Offset detection |
US9602062B2 (en) | 2014-06-30 | 2017-03-21 | Qualcomm Incorporated | Audio switching amplifier |
US9384791B1 (en) * | 2014-12-30 | 2016-07-05 | Altera Corporation | Apparatus and method for sense amplifier offset cancellation |
US9754638B1 (en) * | 2015-08-04 | 2017-09-05 | Marvell International Ltd. | Sense amplifier |
US10097140B1 (en) * | 2017-06-02 | 2018-10-09 | Nxp B.V. | Method and system for amplifier calibration |
US10938353B2 (en) | 2019-03-26 | 2021-03-02 | Analog Devices International Unlimited Company | Coulomb counter with offset calibration |
EP4042422B1 (en) * | 2020-02-06 | 2024-07-10 | Changxin Memory Technologies, Inc. | Sense amplifier circuit, memory device, and operation method thereof |
CN113674774B (zh) * | 2021-08-20 | 2022-08-09 | 山东芯慧微电子科技有限公司 | 一种灵敏放大器 |
US11881969B2 (en) * | 2022-04-22 | 2024-01-23 | Samsung Display Co., Ltd. | Real-time DC-balance aware AFE offset cancellation |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5434821A (en) * | 1991-12-12 | 1995-07-18 | Kabushiki Kaisha Toshiba | Dynamic semiconductor memory device having sense amplifier with compensated offset voltage |
CN1675830A (zh) * | 2002-08-19 | 2005-09-28 | 皇家飞利浦电子股份有限公司 | 运算放大器 |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
ATE127590T1 (de) * | 1988-08-24 | 1995-09-15 | Liaison Electroniques Mecaniqu | Stromsensor. |
US6583660B2 (en) * | 2001-05-25 | 2003-06-24 | Infineon Technologies Ag | Active auto zero circuit for time continuous open loop amplifiers |
TWI261444B (en) * | 2004-10-08 | 2006-09-01 | Mediatek Inc | DC offset calibration apparatus |
US7532065B2 (en) * | 2005-07-12 | 2009-05-12 | Agere Systems Inc. | Analog amplifier having DC offset cancellation circuit and method of offset cancellation for analog amplifiers |
US7321259B1 (en) * | 2005-10-06 | 2008-01-22 | Altera Corporation | Programmable logic enabled dynamic offset cancellation |
US7315482B2 (en) * | 2005-10-13 | 2008-01-01 | Macronix International Co., Ltd. | Memory device with a plurality of reference cells on a bit line |
CN100527580C (zh) * | 2006-01-23 | 2009-08-12 | 崇贸科技股份有限公司 | 利用前馈电压补偿的电源转换装置及其方法 |
JP2008263760A (ja) | 2007-04-13 | 2008-10-30 | Yazaki Corp | 過電流保護装置 |
US7636013B2 (en) * | 2007-07-25 | 2009-12-22 | Infineon Technologies Ag | Method and integrated circuit including an amplifier calibration circuit |
US7940105B2 (en) * | 2008-08-08 | 2011-05-10 | Beckman Coulter, Inc. | High-resolution parametric signal restoration |
GB2485620B (en) * | 2010-12-16 | 2013-04-17 | Wolfson Microelectronics Plc | DC offset compensation |
-
2010
- 2010-12-06 US US12/961,422 patent/US8339195B2/en active Active
- 2010-12-06 WO PCT/US2010/059142 patent/WO2011071836A1/en active Application Filing
- 2010-12-06 CN CN201080045652.7A patent/CN102577102B/zh not_active Expired - Fee Related
-
2012
- 2012-12-21 US US13/723,401 patent/US8933749B2/en active Active
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5434821A (en) * | 1991-12-12 | 1995-07-18 | Kabushiki Kaisha Toshiba | Dynamic semiconductor memory device having sense amplifier with compensated offset voltage |
CN1675830A (zh) * | 2002-08-19 | 2005-09-28 | 皇家飞利浦电子股份有限公司 | 运算放大器 |
Also Published As
Publication number | Publication date |
---|---|
US20130294179A1 (en) | 2013-11-07 |
US20110140773A1 (en) | 2011-06-16 |
US8339195B2 (en) | 2012-12-25 |
CN102577102A (zh) | 2012-07-11 |
WO2011071836A1 (en) | 2011-06-16 |
US8933749B2 (en) | 2015-01-13 |
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C06 | Publication | ||
PB01 | Publication | ||
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SE01 | Entry into force of request for substantive examination | ||
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TR01 | Transfer of patent right |
Effective date of registration: 20200427 Address after: Singapore City Patentee after: Marvell Asia Pte. Ltd. Address before: Ford street, Grand Cayman, Cayman Islands Patentee before: Kaiwei international Co. Effective date of registration: 20200427 Address after: Ford street, Grand Cayman, Cayman Islands Patentee after: Kaiwei international Co. Address before: Hamilton, Bermuda Patentee before: Marvell International Ltd. Effective date of registration: 20200427 Address after: Hamilton, Bermuda Patentee after: Marvell International Ltd. Address before: Babado J San Mega Le Patentee before: MARVELL WORLD TRADE Ltd. |
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TR01 | Transfer of patent right | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20161130 Termination date: 20201206 |
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CF01 | Termination of patent right due to non-payment of annual fee |