CN102568580B - The CD writers of microarray strip test function and method for burn-recording thereof - Google Patents
The CD writers of microarray strip test function and method for burn-recording thereof Download PDFInfo
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- CN102568580B CN102568580B CN201010587840.4A CN201010587840A CN102568580B CN 102568580 B CN102568580 B CN 102568580B CN 201010587840 A CN201010587840 A CN 201010587840A CN 102568580 B CN102568580 B CN 102568580B
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Abstract
The present invention discloses a kind of CD writers and method for burn-recording thereof of microarray strip test function, this CD writers comprises main control module, communication module, human-machine interface module and provide the power module of power supply to above each module, main control module is responsible for carrying out control transmitting-receiving to communication module, preserve communication data, and be responsible for mutual to human-computer interaction module, also comprise a chip carrier socket, it is connected with main control module by the pin of burning, by the control of main control module after burning chip and inserting this chip carrier socket, the pin for testing also is led at chip carrier socket end, the pin of this test is also connected with main control module, comprise a chip I/O test procedure in main control module, this chip I/O test procedure is monitored and is waited whether burn chip I/O port normally can set high in test mode, set low.The present invention can get rid of chip wrong plug, the error situation such as anti-inserted occurs, and ensures to wait to burn chip and CD writers internal component and exempts from and burn.
Description
Technical field
The present invention relates to a kind of CD writers and method for burn-recording thereof of microarray strip test function.
Background technology
Current, most CD writers only supporting chip look into the operations such as sky, burning, verification.When reality uses; operative employee often has the wrong phenomenons such as chip is anti-inserted, chip wrong plug and occurs, and some chip is once chip is anti-inserted, will cause the short circuit of programming VDD-to-VSS; if now CD writers there is no corresponding protection circuit, often burn the part components and parts of CD writers.And some OTP chip is programmed under programming pattern, retaking of a year or grade time, need the high pressure enable signal adding more than 10V on a certain agreement pin, once chip is anti-inserted or wrong plug, this high-voltage signal just can be added on other pins, and this pin can be caused to be burnt.Meanwhile, if the encrypted protection under programming pattern of part OTP chip, that retaking of a year or grade cannot go out source code under programming pattern, if now need the original program inside retaking of a year or grade, needs test department tester to read.
Summary of the invention
Due to the problems referred to above that prior art exists, the present invention proposes a kind of CD writers and method for burn-recording thereof of microarray strip test function, and it can effectively solve prior art Problems existing.
To achieve these goals, the CD writers of the microarray strip test function that the present invention proposes, comprise main control module, communication module, human-machine interface module and provide the power module of power supply to above each module, described main control module is responsible for carrying out control transmitting-receiving to described communication module, preserve communication data, and be responsible for mutual to described human-computer interaction module, also comprise a chip carrier socket, it is connected with described main control module by the pin of burning, by the control of described main control module after burning chip and inserting this chip carrier socket, the pin for testing also is led at described chip carrier socket end, the pin of this test is also connected with described main control module, comprise a chip I/O test procedure in described main control module, described in the monitoring of this chip I/O test procedure, wait whether burn chip I/O port normally can set high in test mode, set low.
The present invention also propose the method for burn-recording of microarray strip test function, comprise the following steps:
1) chip I/O test pattern is first entered, whether the method whether can normally be set high in test mode by described chip I/O test procedure chip monitoring I/O port, set low is carried out detection chip pin and is connected correctly, as correctly, then carry out step 2), otherwise send error information;
2) programming pattern is entered;
3) chip looks into sky, as successfully entered step 4), otherwise error information of setting out out;
4) chip programming;
5) reading back check, as passed through then to complete whole burning step, otherwise sending error information.
As further feature of the present invention, described step 1) in enter chip I/O test pattern and comprise the following steps:
1. as successfully entered this chip I/O test pattern, then step 2 is entered), otherwise return chip I/O test crash error condition;
2. instruction testing item is beaten outside entering;
3. by beating instruction mode outward, chip I/O port to be measured is set high;
4. described main control module detects chip I/O port state to be measured, and 5. high level in this way, then enter step, otherwise returns chip I/O test crash error condition;
5. by beating instruction mode outward, chip I/O port to be measured is set low;
6. described main control module detects chip I/O port state to be measured, if low level, then enters step 7., otherwise returns chip I/O test crash error condition;
7. return chip I/O test by correct status, then complete whole test pattern.
As further feature of the present invention, described step 1) in enter chip I/O test pattern after also comprise a code retaking of a year or grade program, it comprises the following steps:
1. as successfully entered this chip I/O test pattern, then step is entered 2., otherwise reading code status of fail under returning test pattern;
2. enter code and read test item;
3. by beating instruction mode reads a program code outward;
4. main control module save routine code;
5. prepare to read next program code, as code runs through, just enter step 6., otherwise return step 3.;
6. return reading code success status under test pattern, complete whole code retaking of a year or grade program.
Owing to adopting above technical scheme, the CD writers of microarray strip test function of the present invention and method for burn-recording thereof, it is before chip enters burning pattern, first test pattern is entered, the mode of being beaten test sequence by main control module outward will wait that burning chip I/O port sets high, set low, whether the mode of simultaneously carrying out monitoring is carried out detection chip pin and is connected correctly, thus can determine chip insert right, get rid of chip wrong plug, anti-inserted error situation such as grade, then determining that chip is inserted on right basis, add burning high pressure again to enter burning pattern, thus ensure that treating that burning chip and CD writers internal component exempt from burns further.
Simultaneously, chip testing function is added in CD writers, code can be carried out read back check originally entering programming pattern to change into and enter test pattern and carry out code and read back check, thus can prevent because user causes code to read back check the problem of mistake to program area encryption.
Accompanying drawing explanation
Fig. 1 is structured flowchart of the present invention
Fig. 2 is method for burn-recording process flow diagram of the present invention
Fig. 3 is method for burn-recording chips IO test flow chart of the present invention
Fig. 4 is the code retaking of a year or grade process flow diagram under method for burn-recording chips test pattern of the present invention
In figure: 1, main control module; 2, communication module; 3, human-machine interface module; 4, power module; 5, chip carrier socket; 6, wait to burn chip
Embodiment
The invention will be further described with embodiment with reference to the accompanying drawings below:
As shown in Figure 1, the CD writers of microarray strip test function of the present invention, comprise main control module 1, communication module 2, human-machine interface module 3 and provide the power module 4 of power supply to above each module, main control module 1 is responsible for carrying out control transmitting-receiving to communication module 2, preserve communication data, and be responsible for mutual to human-computer interaction module 3, be responsible for outside chip, beat programming sequential and test sequence, this CD writers also comprises a chip carrier socket 5, it is directly connected with main control module 1 by the pin of burning, by the control of main control module 1 after burning chip and inserting this chip carrier socket 5, the pin for testing also is led at chip carrier socket 5 end, the pin of this test is also connected with main control module 1, a chip I/O test procedure is comprised in main control module 1, this chip I/O test procedure is monitored and is waited whether burn chip I/O port normally can set high in test mode, set low, this CD writers first called before entering programming pattern chip I/O test procedure check whether chip is just being inserted, whether effective, and then enter programming pattern and carry out burning chip.
The present invention also propose the method for burn-recording of microarray strip test function, as shown in Figure 2, comprise the following steps:
1) chip I/O test pattern is first entered, whether the method whether can normally be set high in test mode by described chip I/O test procedure chip monitoring I/O port, set low is carried out detection chip pin and is connected correctly, as correctly, then carry out step 2), otherwise send error information;
2) programming pattern is entered;
3) chip looks into sky, as successfully entered step 4), otherwise error information of setting out out;
4) chip programming;
5) reading back check, as passed through then to complete whole burning step, otherwise sending error information.
As shown in Figure 3, described step 1) in enter chip I/O test pattern and comprise the following steps:
1. as successfully entered this chip I/O pattern, then step 2 is entered), otherwise return chip I/O test crash error condition;
2. instruction testing item is beaten outside entering;
3. by beating instruction mode outward, chip I/O port to be measured is set high;
4. described main control module detects chip I/O port state to be measured, and 5. high level in this way, then enter step, otherwise returns chip I/O test crash error condition;
5. by beating instruction mode outward, chip I/O port to be measured is set low;
6. described main control module detects chip I/O port state to be measured, if low level, then enters step 7., otherwise returns chip I/O test crash error condition;
7. return chip I/O test by correct status, then complete whole test pattern.
As shown in Figure 4, described step 1) in enter chip I/O test pattern after also comprise a code retaking of a year or grade program, it comprises the following steps:
1. as successfully entered this chip I/O test pattern, then step is entered 2., otherwise reading code status of fail under returning test pattern;
2. enter code and read test item;
3. by beating instruction mode reads a program code outward;
4. main control module save routine code;
5. prepare to read next program code, as code runs through, just enter step 6., otherwise return step 3.;
6. return reading code success status under test pattern, complete whole code retaking of a year or grade program.
According to former CD writers (not microarray strip test function), under identical burning condition, (same size stabilized voltage supply inputs with the present invention, same level operative employee operates, same batch, equal number treat burning/recording chip) contrast test, result is as follows:
In former CD writers, in 500 burning/recording chips, 472 chips burning success, 2 burning chips lost efficacy (inserting correct), and 26 chips are because of wrong plug or anti-insertedly cause burning failure, wherein, 4 chip eventual failure, 22 chips are inserted just again can successful burning, in whole burning process, because chip wrong plug or the anti-inserted inner triode of CD writers that causes are burnt 2 times.
In the present invention, in 500 burning/recording chips, 469 chips burning success, 1 burning chip lost efficacy (inserting correct), and 30 chips are because of wrong plug or anti-insertedly cause test crash, wherein, 0 chip eventual failure, 30 chips are inserted just again all can successful burning, in whole burning process, because chip wrong plug or the anti-inserted CD writers internal component that all do not cause are burnt.
Can be found out by above data, before burning, add chip testing whether insert correct for detection chip, really serve the effect of protect IC and CD writers, also improve burning chip success ratio simultaneously.
But above-mentioned embodiment is exemplary, being to better enable those skilled in the art understand this patent, can not being interpreted as it is restriction this patent being comprised to scope; As long as according to this patent disclose any equivalent change done or the modification of spirit, all fall into the scope that this patent comprises.
Claims (3)
1. the CD writers of a microarray strip test function, comprise main control module, communication module, human-machine interface module and provide the power module of power supply to above each module, described main control module is responsible for carrying out control transmitting-receiving to described communication module, preserve communication data, and be responsible for mutual to described human-machine interface module, also comprise a chip carrier socket, it is connected with described main control module by the pin of burning, by the control of described main control module after burning chip and inserting this chip carrier socket, it is characterized in that: also lead to the pin for testing at described chip carrier socket end, the pin of this test is also connected with described main control module, a chip I/O test procedure is comprised in described main control module, in order to before entering burning pattern, first test pattern is entered, wait described in the monitoring of this chip I/O test procedure whether burn chip I/O port normally can set high in test mode, set low, and carry out code in test mode and read back check, to prevent because user causes code to read back check mistake to program area encryption.
2. based on a method for burn-recording for CD writers according to claim 1, it is characterized in that: user to program area encryption, comprises the following steps:
1) chip I/O test pattern is first entered, whether the method whether can normally be set high in test mode by described chip I/O test procedure chip monitoring I/O port, set low is carried out detection chip pin and is connected correctly, as correctly, then carry out step 2), otherwise send error information;
2) programming pattern is entered;
3) chip looks into sky, as successfully entered step 4), otherwise error information of setting out out;
4) chip programming;
5) entering test pattern to read back check to carry out code, as passed through then to complete whole burning step, otherwise sending error information;
Described step 1) described in also comprise a code retaking of a year or grade step in chip I/O test pattern, it comprises the following steps:
1. as successfully entered this chip I/O test pattern, then step is entered 2., otherwise reading code status of fail under returning test pattern;
2. enter code and read test item;
3. by beating instruction mode reads a program code outward;
4. main control module save routine code;
5. prepare to read next program code, as code runs through, just enter step 6., otherwise return step 3.;
6. return reading code success status under test pattern, complete whole code retaking of a year or grade program.
3. method for burn-recording according to claim 2, it is characterized in that: described step 1) described in whether can normally be set high in test mode by described chip I/O test procedure chip monitoring I/O port, whether the method that sets low carry out detection chip pin and connect correctly, comprise the following steps:
1. as successfully entered this chip I/O pattern, then enter step 2., otherwise return chip I/O test crash error condition;
2. instruction testing item is beaten outside entering;
3. by beating instruction mode outward, chip I/O port to be measured is set high;
4. described main control module detects chip I/O port state to be measured, and 5. high level in this way, then enter step, otherwise returns chip I/O test crash error condition;
5. by beating instruction mode outward, chip I/O port to be measured is set low;
6. described main control module detects chip I/O port state to be measured, if low level, then enters step 7., otherwise returns chip I/O test crash error condition;
7. return chip I/O test by correct status, then complete whole test pattern.
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| CN102568580B true CN102568580B (en) | 2016-03-02 |
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| CN110988658A (en) * | 2019-12-26 | 2020-04-10 | 无锡矽杰微电子有限公司 | Method for detecting pin function of MCU chip to be programmed through programming device system |
| CN113067325A (en) * | 2021-03-05 | 2021-07-02 | 山东英信计算机技术有限公司 | Chip protection circuit and board card |
| CN115061965A (en) * | 2022-05-10 | 2022-09-16 | 广州市新矽亚电子科技有限公司 | Serial-to-N-path parallel burning detector |
| CN115389912B (en) * | 2022-08-26 | 2023-08-29 | 无锡众享科技有限公司 | OTP MCU chip detection device and detection method |
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Address after: 214135 -6, Linghu Avenue, Wuxi Taihu international science and Technology Park, Wuxi, Jiangsu, China, 180 Patentee after: China Resources micro integrated circuit (Wuxi) Co., Ltd Address before: 214061 Jiangsu city of Wuxi province Liangxi Road No. 14 Patentee before: WUXI CHINA RESOURCES SEMICO Co.,Ltd. |
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