CN102565679B - Method and device for detecting limit value of power supply voltage - Google Patents
Method and device for detecting limit value of power supply voltage Download PDFInfo
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- CN102565679B CN102565679B CN201110434666.4A CN201110434666A CN102565679B CN 102565679 B CN102565679 B CN 102565679B CN 201110434666 A CN201110434666 A CN 201110434666A CN 102565679 B CN102565679 B CN 102565679B
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Abstract
The embodiment of the invention discloses a method and a device for detecting a limit value of power supply voltage. The method comprises the following steps: respectively providing a standard power supply voltage signal and a tested power supply voltage signal for a standard IC (integrated circuit) and a tested IC, respectively providing a standard driving time sequence and a tested driving time sequence for the standard IC and the tested IC, judging whether an answer signal returned by the standard IC according to the received standard driving time sequence is the same with that which is returned by the tested IC according to the received tested driving time sequence or not, if so, regulating the voltage of the tested power supply voltage signal, initializing the standard driving time sequence and further performing the next-round detection; and if not, recording the voltage value of the tested power supply voltage signal and taking the recorded value as the limit value of the power supply voltage of the tested IC. The embodiment of the invention further discloses a device for detecting the limit value of the power supply voltage. According to the method and the device, the cost of detecting the limit value of the power supply voltage of the IC can be reduced, and the limit value of the power supply voltage of the IC can be automatically detected.
Description
Technical field
The present invention relates to electronic applications, particularly relate to a kind of method and the device that detect supply voltage ultimate value.
Background technology
Due to the restriction by integrated circuit (IC, Integrated Circuit) production technology, all can there is certain tolerance in IC parameters in actual applications, and the parameters therefore detecting IC is considerable.The magnitude of voltage of supply voltage determines the duty of IC, and therefore, the supply voltage ultimate value detecting IC is of crucial importance, and at present, the method detecting the supply voltage ultimate value of IC is as follows:
Electricity consumption source meter powers to tested IC and the circuit module that is made up of tested IC and other element, the duty of manual observation IC, by manual shift voltage source instrument, progressively improves or reduces magnitude of voltage, until IC cannot normally work, draw the supply voltage ultimate value of IC in this approach.
Special voltage source instrument and manual debugging is needed to complete the detection of the supply voltage ultimate value of IC in prior art, and special voltage source instrument is very expensive, the cost that the supply voltage ultimate value of such detection IC spends is very high, and cannot realize the supply voltage ultimate value of Aulomatizeted Detect IC.
Summary of the invention
Embodiments provide a kind of method and the device that detect supply voltage ultimate value, reduce the cost detecting IC supply voltage ultimate value, and the supply voltage ultimate value of Aulomatizeted Detect IC can be realized.
In order to solve the problems of the technologies described above, a kind of method detecting supply voltage ultimate value that the embodiment of the present invention provides, comprising:
There is provided benchmark supply voltage signal and tested supply voltage signal respectively to benchmark integrated circuit (IC) and tested IC, described benchmark IC is identical with the model of tested IC;
Benchmark driver' s timing and tested driver' s timing is provided respectively to benchmark IC and tested IC, described benchmark driver' s timing is all identical with parameter all the other parameters except high level of described tested driver' s timing, and the high level of described tested driver' s timing equals the voltage of described tested supply voltage signal;
Whether the answer signal that judgment standard IC returns according to the benchmark driver' s timing received is identical with the answer signal that tested IC returns according to the tested driver' s timing received, if the determination result is YES, then regulate the voltage of described tested supply voltage signal, and initialization benchmark driver' s timing, return and perform the described step that benchmark supply voltage signal and tested supply voltage signal are provided respectively to benchmark IC and tested IC;
If judged result is no, then record the magnitude of voltage of described tested supply voltage signal, and using the supply voltage ultimate value of record value as tested IC.
Accordingly, a kind of device detecting supply voltage ultimate value that the embodiment of the present invention provides, comprising:
Elementary driver element, for providing benchmark supply voltage signal and benchmark driver' s timing to benchmark IC;
Secondary drive unit, for providing tested supply voltage signal and tested driver' s timing to tested IC, described benchmark driver' s timing is all identical with parameter all the other parameters except high level of described tested driver' s timing, the high level of described tested driver' s timing equals the voltage of described tested supply voltage signal, and described benchmark IC is identical with the model of described tested IC;
Adjustable voltage source unit, the voltage of the tested supply voltage signal provided for regulating described secondary drive unit;
Main control unit, whether the answer signal returned according to the benchmark driver' s timing received for judgment standard IC is identical with the answer signal that tested IC returns according to the tested driver' s timing received, if the determination result is YES, then control the voltage of the tested supply voltage signal that adjustable voltage source unit regulates described secondary drive unit to provide, control the benchmark driver' s timing that described elementary driver element initialization provides, and carry out the detection of next round;
If judged result is no, then record the magnitude of voltage of the tested supply voltage signal that described secondary drive unit provides, and using the supply voltage ultimate value of record value as tested IC.
The embodiment of the present invention, benchmark supply voltage signal and tested supply voltage signal is provided respectively to benchmark IC and tested IC, benchmark driver' s timing and tested driver' s timing is provided respectively to benchmark IC and tested IC, described benchmark driver' s timing is all identical with parameter all the other parameters except high level of described tested driver' s timing, the high level of described tested driver' s timing equals the voltage of described tested supply voltage signal, whether the answer signal that judgment standard IC returns according to the benchmark driver' s timing received is identical with the answer signal that tested IC returns according to the tested driver' s timing received, if the determination result is YES, then regulate the voltage of described tested supply voltage signal, and initialization benchmark driver' s timing, carry out the detection of lower whorl again, if judged result is no, record the magnitude of voltage of described tested supply voltage signal, and using the supply voltage ultimate value of record value as tested IC.So just can detect the supply voltage ultimate value of IC, reduce the cost detecting IC supply voltage ultimate value, and the supply voltage ultimate value of Aulomatizeted Detect IC can be realized.
Accompanying drawing explanation
In order to be illustrated more clearly in the embodiment of the present invention or technical scheme of the prior art, be briefly described to the accompanying drawing used required in embodiment or description of the prior art below, apparently, accompanying drawing in the following describes is only some embodiments of the present invention, for those of ordinary skill in the art, under the prerequisite not paying creative work, other accompanying drawing can also be obtained according to these accompanying drawings.
Fig. 1 is a kind of schematic flow sheet detecting the method for supply voltage ultimate value of the embodiment of the present invention;
Fig. 2 is a kind of schematic flow sheet detecting another embodiment of method of supply voltage ultimate value of the embodiment of the present invention;
Fig. 3 is a kind of schematic flow sheet detecting another embodiment of method of supply voltage ultimate value of the embodiment of the present invention;
Fig. 4 is a kind of structural representation detecting the device of supply voltage ultimate value of the embodiment of the present invention.
Embodiment
Below in conjunction with the accompanying drawing in the embodiment of the present invention, be clearly and completely described the technical scheme in the embodiment of the present invention, obviously, described embodiment is only the present invention's part embodiment, instead of whole embodiments.Based on the embodiment in the present invention, those of ordinary skill in the art, not making the every other embodiment obtained under creative work prerequisite, belong to the scope of protection of the invention.
Fig. 1 is a kind of schematic flow sheet detecting the method for supply voltage ultimate value of the embodiment of the present invention, as shown in Figure 1, comprising:
S101, provide benchmark supply voltage signal and tested supply voltage signal respectively to benchmark IC and tested IC.
Be understandable that, benchmark supply voltage signal is exactly benchmark IC supply voltage, and tested supply voltage signal is exactly the supply voltage of tested IC.
It should be noted that, benchmark IC is identical with the model of tested IC.
S102, provide benchmark driver' s timing and tested driver' s timing respectively to benchmark IC and tested IC.
Be understandable that, benchmark driver' s timing and tested driver' s timing is provided respectively to benchmark IC and tested IC, there is provided a pumping signal namely to benchmark IC and tested IC, after allowing benchmark IC and tested IC receive this signal, an answer signal can be returned according to this signal.
It should be noted that, in testing process, the high level of tested driver' s timing equals the voltage of tested supply voltage signal.
It should be noted that, benchmark driver' s timing is all identical with parameter all the other parameters except high level of tested driver' s timing, provides the sequential of driver' s timing necessarily identical in testing process benchmark IC with tested IC.All parameters except high level such as the cycle providing driver' s timing as given benchmark IC and tested IC and dutycycle are identical, so just can ensure that the answer signal returned within the scope of the logic level that can bear at benchmark IC and tested IC is identical.
It should be noted that, step S102 provides benchmark driver' s timing and tested driver' s timing to realize as follows to benchmark IC and tested IC respectively:
Benchmark driver' s timing is provided to benchmark IC;
Obtain benchmark driver' s timing;
Regulate the high level of the benchmark driver' s timing obtained, and using the benchmark driver' s timing after adjustment as tested driver' s timing;
Tested driver' s timing is provided to tested IC.
Concrete methods of realizing can be as follows:
Dual power supply bus transceiver obtains and provides tested driver' s timing to tested IC, the high level of the benchmark driver' s timing that dual power supply bus transceiver gets according to the voltage-regulation of tested supply voltage signal, driver' s timing after Drazin inverse transfers to tested IC as tested driver' s timing, and the high level of tested driver' s timing equals the voltage of tested supply voltage signal.
Just can ensure to benchmark IC all identical with parameter all the other parameters except high level of tested driver' s timing with the benchmark driver' s timing that tested IC provides by above method.
Whether the answer signal that S103, judgment standard IC return according to the benchmark driver' s timing received is identical with the answer signal that tested IC returns according to the tested driver' s timing received, if the determination result is YES, then perform the voltage that step S104 regulates tested supply voltage signal, and initialization benchmark driver' s timing.
If judged result is no, then perform the magnitude of voltage that step 105 records tested supply voltage signal, and using the supply voltage ultimate value of record value as tested IC.
It should be noted that, the answer signal whether judgment standard IC returns according to the tested driver' s timing received with tested IC according to the answer signal that returns of benchmark driver' s timing received is identical can be realized in the following manner:
Single-chip microcomputer (MCU, Micro Control Unit), digital signal processor (DSP, Digital SignalProcessing) or microprocessor (ARM, Advanced RISC Machines) in one or more controllers, whether judgment standard IC identical with the answer signal that tested IC returns according to the tested driver' s timing received according to the answer signal that returns of benchmark driver' s timing received.
It should be noted that, after benchmark IC and tested IC receives driver' s timing, answer signal will be returned, the answer signal returned can be logic level signal or protocol data, specifically different according to the difference of IC detected, IC as detected is simple integrated circuit, as logical AND gate integrated circuit, will return a logic level signal when so detecting this IC; IC as detected is complicated IC, as some wireless transceivers, sensor or microcontroller, will return a protocol data when so detecting this IC.Certain protocol data also can be twin wire serial (I2C, Inter-Integrated Circuit or) protocol data or peripheral serial line interface (SPI, Serial Peripheral Interface) protocol data, SPI protocol data will be returned, as detecting sensor will return I2C protocol data as detected wireless transceiver.
It should be noted that, the benchmark driver' s timing that benchmark IC receives and the tested driver' s timing that tested IC receives can be the sequential in multiple cycle, and such benchmark IC and tested IC is also the answer signal in multiple cycle according to the answer signal that the driver' s timing received returns.In this case, step S103 can be whether the answer signal that judgment standard IC returns according to the benchmark driver' s timing received is identical with the answer signal that tested IC returns according to the tested driver' s timing received, if the determination result is YES, continue to perform the judgement that answer signal that whether answer signal that step S103 judgment standard IC returns according to the benchmark driver' s timing received return according to the tested driver' s timing received with tested IC is identical, until the answer signal end of transmission (EOT) that benchmark IC returns according to the tested driver' s timing received according to the answer signal that returns of benchmark driver' s timing received and tested IC, then perform the voltage that step S104 regulates tested supply voltage signal, and initialization benchmark driver' s timing, if judged result is no, then perform the magnitude of voltage that step S105 records tested supply voltage signal, and using the supply voltage ultimate value of record value as tested IC.
S104, regulate the voltage of tested supply voltage signal, and initialization benchmark driver' s timing.
The answer signal returned according to the driver' s timing received as benchmark IC and tested IC is identical, just illustrate that the voltage of tested supply voltage signal is now in the safe range of tested IC, at this moment the voltage of tested supply voltage signal will be regulated, namely regulate the supply voltage of tested IC, and initialization benchmark driver' s timing, just perform step S101 and provide benchmark supply voltage signal and tested supply voltage signal respectively to benchmark integrated circuit (IC) and tested IC, start the detection of next round.
Being understandable that, initialization benchmark driver' s timing, is after the voltage in order to regulate tested supply voltage signal, restarts to detect.
It should be noted that, regulate the voltage of tested supply voltage signal to realize by the following method:
Regulate the variable voltage source be made up of digital-to-analog modular converter DAC and integrated transporting discharging, the variable voltage source be made up of Pulse width modulation module PWM and field-effect transistor MOSFET, voltage by the output signal of one or more variable voltage sources in DC-DC power supply DC/DC and programmable resistance variable voltage source or the variable voltage source that is made up of adjustable low pressure difference linearity Voltage stabilizing module LDO and potentiometer able to programme, the output signal being more than provided to variable voltage source is identical with tested supply voltage signal.
It should be noted that, regulate the voltage of tested supply voltage signal can be the voltage heightening or turn down tested supply voltage signal, the digital signal pulses width of DAC in the variable voltage source be made up of DAC and integrated transporting discharging as tuned up or turning down, regulate the voltage of the output signal of variable voltage source, realize the voltage heightening or turn down tested supply voltage signal; And for example tune up or turn down the digital signal pulses width of PWM in the variable voltage source that is made up of PWM and MOSFET, regulate the voltage of the output signal of variable voltage source, realize the voltage heightening or turn down tested supply voltage signal; And for example tune up or turn down by the resistance of adjustable DC/DC in adjustable DC/DC and programmable resistance variable voltage source, regulate the voltage of the output signal of variable voltage source, realize the voltage heightening or turn down tested supply voltage signal; And for example tune up or turn down the resistance of adjustable LDO in the variable voltage source that is made up of adjustable LDO and potentiometer able to programme, regulate the voltage of the output signal of variable voltage source, realize the voltage heightening or turn down tested supply voltage signal.So just can complete maximum value and the minimal value of the supply voltage detecting IC.
It should be noted that, step S104 heightens or turns down the voltage of tested supply voltage signal, and initialization benchmark driver' s timing, can also be:
Regulate the voltage of tested supply voltage signal;
Store the information of voltage after tested supply voltage Signal Regulation;
And initialization benchmark driver' s timing;
Read the information of voltage of the tested supply voltage signal in storing;
The voltage of tested supply voltage signal is regulated according to the information of voltage of the tested supply voltage signal in storage.
After the voltage regulating tested supply voltage signal, the information of voltage after tested supply voltage Signal Regulation being stored, can avoiding like this changing because carrying out initialization benchmark driver' s timing the voltage regulating rear tested supply voltage signal.Storing the information of voltage after tested supply voltage Signal Regulation can by flash memory Flash Memory, synchronous DRAM (SDRAM, Synchronous Dynamic RandomAccess Memory) or EPROM (Erasable Programmable Read Only Memory) (EEPROM, Electrically ErasableProgrammable Read-Only Memory) in one or more storeies, store the information of voltage after tested supply voltage Signal Regulation.
S105, record the magnitude of voltage of tested supply voltage signal, and using the supply voltage ultimate value of record value as tested IC.
The embodiment of the present invention, benchmark supply voltage signal and tested supply voltage signal is provided respectively to benchmark IC and tested IC, benchmark driver' s timing and tested driver' s timing is provided respectively to benchmark IC and tested IC, described benchmark driver' s timing is all identical with parameter all the other parameters except high level of described tested driver' s timing, the high level of described tested driver' s timing equals the voltage of described tested supply voltage signal, whether the answer signal that judgment standard IC returns according to the benchmark driver' s timing received is identical with the answer signal that tested IC returns according to the tested driver' s timing received, if the determination result is YES, then regulate the voltage of described tested supply voltage signal, and initialization benchmark driver' s timing, carry out the detection of lower whorl again, if judged result is no, record the magnitude of voltage of described tested supply voltage signal, and using the supply voltage ultimate value of record value as tested IC.So just can detect the supply voltage ultimate value of IC, reduce the cost detecting IC supply voltage ultimate value, and the supply voltage ultimate value of Aulomatizeted Detect IC can be realized.
Fig. 2 is a kind of schematic flow sheet detecting another embodiment of the method for supply voltage ultimate value of the embodiment of the present invention, as shown in Figure 2, comprising:
S201, acquisition benchmark supply voltage signal.
The voltage of acquisition benchmark supply voltage signal is the voltage in benchmark IC safe range.
It should be noted that, obtaining benchmark supply voltage signal can realize in the following manner:
Analog-digital conversion (AD, Digital-to-Analog) analog-digital conversion module (ADC in chip, MCU, Analog-to-Digital Converter), one or more circuit in ADC in ADC or ARM in DSP, obtain benchmark supply voltage signal.
S202, the information of voltage of benchmark supply voltage signal is converted to resistance information, regulates the voltage of tested supply voltage signal according to the resistance information got.
The information of voltage got is converted to resistance information to realize information of voltage by MCU or DSP in embodiment above or ARM and be converted to resistance information, regulate the regulative mode of the voltage of tested supply voltage signal can be regulate the feedback resistance of variable voltage source to realize the voltage of the output signal regulating variable voltage source by resistance information, the control method described in embodiment above can also be adopted, do not do repeat specification herein.
It should be noted that, regulate the voltage object of tested supply voltage signal to be in order to the voltage of the forward reference IC in whole testing process and the benchmark supply voltage signal provided to tested IC and tested supply voltage signal is identical here.In testing process, regulate the voltage of tested supply voltage signal more purposive like this, reduce and regulate number of times, meanwhile, also avoid the overtension of the tested supply voltage signal provided to tested IC to burn out tested IC.
S203, provide benchmark supply voltage signal and tested supply voltage signal respectively to benchmark IC and tested IC.
S204, provide benchmark driver' s timing and tested driver' s timing respectively to benchmark IC and tested IC.
Whether the answer signal that S205, judgment standard IC return according to the benchmark driver' s timing received is identical with the answer signal that tested IC returns according to the tested driver' s timing received, if the determination result is YES, then perform the voltage that step S206 regulates tested supply voltage signal, and initialization benchmark driver' s timing.
If judged result is no, then perform the magnitude of voltage that step S207 records tested supply voltage signal, and using the supply voltage ultimate value of record value as tested IC.
S206, regulate the voltage of tested supply voltage signal, and initialization benchmark driver' s timing.
S207, record the magnitude of voltage of tested supply voltage signal, and using the supply voltage ultimate value of record value as tested IC.
In the present embodiment, add in embodiment above before detecting and regulate the voltage of tested supply voltage signal, object is in order to the voltage of the forward reference IC in whole testing process and the benchmark supply voltage signal provided to tested IC and tested supply voltage signal is identical.In testing process, regulate the voltage of tested supply voltage signal more purposive like this, reduce and regulate number of times, also the overtension of the tested supply voltage signal provided to tested IC can be avoided to burn out tested IC, and the supply voltage ultimate value of IC can be detected, reduce the cost detecting IC supply voltage ultimate value, realize the supply voltage ultimate value of Aulomatizeted Detect IC.
Fig. 3 is a kind of schematic flow sheet detecting another embodiment of the method for supply voltage ultimate value of the embodiment of the present invention, as shown in Figure 3, comprising:
S301, acquisition benchmark supply voltage signal.
S302, the information of voltage of benchmark supply voltage signal is converted to resistance information, regulates the voltage of tested supply voltage signal according to the resistance information got.
S303, provide benchmark supply voltage signal and tested supply voltage signal respectively to benchmark IC and tested IC.
S304, provide benchmark driver' s timing and tested driver' s timing respectively to benchmark IC and tested IC.
Whether the answer signal that S305, judgment standard IC return according to the benchmark driver' s timing received is identical with the answer signal that tested IC returns according to the tested driver' s timing received, and perform information of voltage and the judged result that step S306 shows tested supply voltage signal, if the determination result is YES, then perform the voltage that step S308 regulates tested supply voltage signal, and initialization benchmark driver' s timing.
If judged result is no, then perform the magnitude of voltage that step S309 records tested supply voltage signal, and using the supply voltage ultimate value of record value as tested IC.
S306, the information of voltage showing tested supply voltage signal and judged result.
Whether the answer signal returned according to the benchmark driver' s timing received as judgment standard IC is identical with the answer signal that tested IC returns according to the tested driver' s timing received, information of voltage and the judged result of tested supply voltage signal just can be demonstrated after having judged, such testing process more transparence, can know the state of detection in time.
It should be noted that, show the information of voltage to tested supply voltage signal and judged result, can realize in the following manner:
By liquid crystal display (LCD, Liquid Crystal Display), electronic display (LED, LightEmitting Diode) or vacuum fluorescent display screen (VFD, Vacuum Fluorescent Display) in one or more display screens, show information of voltage and the judged result of tested supply voltage signal.
It should be noted that, can also perform step S307 according to the information of voltage of tested supply voltage signal and judged result formation characteristic curve after execution of step S306, can also be perform any one step in step S306 or step S307 certainly.
S307, according to the information of voltage of tested supply voltage signal and judged result formation characteristic curve.
Whether the answer signal returned according to the benchmark driver' s timing received as judgment standard IC is identical with the answer signal that tested IC returns according to the tested driver' s timing received, just can according to the information of voltage of tested supply voltage signal and judged result formation characteristic curve after having judged, how many volts as generated the supply voltage maximum value that tested IC can be described, minimal value is how many volts, and the safe range of the supply voltage of tested IC is how many is lied prostrate how many curve map lied prostrate.The safe power supply voltage range of the supply voltage ultimate value indicating tested IC can be known like this.
S308, regulate the voltage of tested supply voltage signal, and initialization benchmark driver' s timing.
S309, record the magnitude of voltage of tested supply voltage signal, and using the supply voltage ultimate value of record value as tested IC.
In the present embodiment, the information of voltage of tested supply voltage signal and judged result before adding the voltage of vision-control tested supply voltage signal, and according to the information of voltage of tested supply voltage signal and the method for judged result formation characteristic curve, such testing process more transparence, the state of detection can be known in time, the safe power supply voltage range of the supply voltage ultimate value indicating tested IC can be known.And the supply voltage ultimate value of IC can be detected, reduce the cost detecting IC supply voltage ultimate value, realize the supply voltage ultimate value of Aulomatizeted Detect IC.
Fig. 4 is a kind of structural representation detecting the device of supply voltage ultimate value of the embodiment of the present invention, as shown in Figure 4, comprising: elementary driver element 41, secondary drive unit 42, adjustable voltage source unit 43 and main control unit 44, wherein:
Elementary driver element 41, for providing benchmark supply voltage signal and benchmark driver' s timing to benchmark IC.
Be understandable that, the benchmark supply voltage signal that elementary driver element 41 provides is exactly the supply voltage of benchmark IC.
Secondary drive unit 42, for providing tested supply voltage signal and tested driver' s timing to tested IC.
Be understandable that, the tested supply voltage signal that secondary drive unit 42 provides is exactly the supply voltage of tested IC.
It should be noted that, parameter all the other parameters except high level of the tested driver' s timing that the benchmark driver' s timing that elementary driver element 41 provides and secondary drive unit 42 provide are all identical, the high level of tested driver' s timing equals the voltage of tested supply voltage signal, and benchmark IC is identical with the model of tested IC.
Adjustable voltage source unit 43, the voltage of the tested supply voltage signal provided for regulating secondary drive unit 42.
It should be noted that, adjustable voltage source unit 43 can be:
One or more variable voltage sources in the variable voltage source be made up of DAC and integrated transporting discharging, the variable voltage source be made up of PWM and MOSFET pipe, the variable voltage source be made up of adjustable DC/DC and programmable resistance or the variable voltage source that is made up of adjustable LDO and potentiometer able to programme.
The output signal being more than provided to variable voltage source equals the tested supply voltage signal that secondary drive unit 42 provides, and the tested supply voltage signal that secondary drive unit 42 provides is the supply voltage of tested IC, that is, the output signal of adjustable voltage source unit is exactly the supply voltage of tested IC.
It should be noted that, the voltage of the tested supply voltage signal regulating secondary drive unit 42 to export can be the voltage heightening or turn down the tested supply voltage signal that secondary drive unit 42 exports, the digital signal pulses width of DAC in the variable voltage source be made up of DAC and integrated transporting discharging as tuned up or turning down, realizes the voltage heightening or turn down the tested supply voltage signal that secondary drive unit 42 exports; And for example tune up or turn down the digital signal pulses width of PWM in the variable voltage source that is made up of PWM and MOSFET, realize heightening or the voltage of tested supply voltage signal that height secondary drive unit 42 exports; And for example tune up or turn down by the resistance of adjustable DC/DC in adjustable DC/DC and programmable resistance variable voltage source, realize the voltage heightening or turn down the tested supply voltage signal that secondary drive unit 42 exports; And for example tune up or turn down the resistance of adjustable LDO in the variable voltage source that is made up of adjustable LDO and potentiometer able to programme, realize the voltage heightening or turn down the tested supply voltage signal that secondary drive unit 42 exports.
Main control unit 44, whether the answer signal returned according to the benchmark driver' s timing received for judgment standard IC is identical with the answer signal that tested IC returns according to the tested driver' s timing received, if the determination result is YES, then control the voltage of the tested supply voltage signal that adjustable voltage source unit 43 regulates described secondary drive unit 42 to provide, control elementary driver element 41 initialization benchmark driver' s timing, and carry out the detection of next round;
If judged result is no, then record the magnitude of voltage of the tested supply voltage signal that secondary drive unit 42 exports, and using the supply voltage ultimate value of record value as tested IC.
It should be noted that, main control unit can be one or more controllers in MCU, DSP or ARM.
It should be noted that, after benchmark IC and tested IC receives driver' s timing, answer signal will be returned, the answer signal returned can be logic level signal or protocol data, specifically different according to the difference of IC detected, IC as detected is simple integrated circuit, as logical AND gate integrated circuit, will return a logic level signal when so detecting this IC; IC as detected is complicated IC, as some wireless transceivers, sensor or microcontroller, will return a protocol data when so detecting this IC.Certain protocol data also can be I2C protocol data or SPI protocol data, will return SPI protocol data, as detecting sensor will return I2C protocol data as detected wireless transceiver.
It should be noted that, the driver' s timing that benchmark IC and tested IC receives can be the sequential in multiple cycle, and such benchmark IC and tested IC is also the answer signal in multiple cycle according to the answer signal that the driver' s timing received returns.In this case, main control unit 44, whether the answer signal returned according to the benchmark driver' s timing received for judgment standard IC is identical with the answer signal that tested IC returns according to the tested driver' s timing received, if the determination result is YES, continue to perform the judgement that answer signal that whether answer signal that judgment standard IC returns according to the benchmark driver' s timing received return according to the tested driver' s timing received with tested IC is identical, until the answer signal end of transmission (EOT) that described benchmark IC returns according to the tested driver' s timing received according to the answer signal that returns of benchmark driver' s timing received and tested IC, then control the voltage of the tested supply voltage signal that adjustable voltage source unit 43 regulates described secondary drive unit to export, control elementary driver element 41 initialization benchmark driver' s timing, and carry out the detection of next round,
If judged result is no, then record the magnitude of voltage of the tested supply voltage signal that secondary drive unit 42 exports, and using the supply voltage ultimate value of record value as tested IC.
It should be noted that, this device can also comprise: regulon 45.
Regulon 45, for obtaining the benchmark driver' s timing that elementary driver element 41 provides, regulate the high level of the benchmark driver' s timing got, the driver' s timing after regulating is transferred to secondary drive unit, and the high level of the driver' s timing after adjustment equals the voltage of tested supply voltage signal.
Secondary drive unit 42 also for receive regulon 45 regulate after driver' s timing, and using the driver' s timing after described regulon regulates as tested driver' s timing.
It is identical for combining by regulon 45 and secondary drive unit 42 the tested driver' s timing benchmark driver' s timing that all the other parameters and elementary driver' s timing 41 provide except high level realizing secondary drive unit 42 and provide.
Concrete methods of realizing can adopt dual power supply bus transceiver to realize, and process is as follows:
The power port of the side of dual power supply bus transceiver provides the port of benchmark supply voltage signal and benchmark driver' s timing to be connected with elementary driver element 41 with IO port respectively, and such power supply of this side of dual power supply bus transceiver and the driver' s timing of connection are respectively the benchmark supply voltage signal and benchmark driver' s timing that elementary driver element 41 provides.
Opposite side power port and the secondary drive unit 42 of dual power supply bus transceiver provide the port of tested supply voltage signal to be connected, to ensure that the high level of tested driver' s timing equals the voltage of tested supply voltage signal.
The supply voltage that dual power supply bus transceiver provides with reference to secondary drive unit 42, regulates the high level of the benchmark driver' s timing got, and the driver' s timing after regulating is transferred to secondary drive unit 42; The driver' s timing that dual power supply bus transceiver transmits by secondary drive unit 42 is as tested driver' s timing, and the tested driver' s timing benchmark driver' s timing that all the other parameters and elementary driver' s timing 41 provide except high level that so just can realize secondary drive unit 42 provides is identical.
Dual power supply bus transceiver mentioned here can be ternary output dual power supply bus transceiver, that is the both sides of dual power supply bus transceiver, no matter which side provide the port of benchmark supply voltage signal and benchmark driver' s timing to be connected with elementary driver element 41 can, opposite side just provides the port of tested supply voltage signal and tested driver' s timing to be connected with secondary drive unit 42, because the signal transmission direction after ternary output dual power supply bus transceiver level conversion can control, as the signal after level conversion can being transferred to right side from left side, also left side can be transferred to from right side.
It should be noted that, this device can also comprise: voltage sampling unit 46.
Voltage sampling unit 46, for obtaining the benchmark supply voltage signal that elementary driver element 41 provides, and by the benchmark supply voltage Signal transmissions of acquisition to main control unit 44, to make the information of voltage of main control unit 44 benchmark supply voltage signal convert resistance information to, the voltage of the tested supply voltage signal that adjustable voltage source unit 43 regulates secondary drive unit 42 to provide according to the resistance information that main control unit 44 is changed.The tested supply voltage signal that the benchmark supply voltage signal provided with elementary driver element 41 before making detection and secondary drive unit 42 provide is identical.
The voltage of the tested supply voltage signal regulating elementary driver element 41 to export like this in testing process is more purposive, reduces and regulates number of times, meanwhile, also avoid the overtension of the tested supply voltage signal provided to tested IC to burn out tested IC.Voltage sampling unit 46 can be one or more in the ADC in ADC or ARM in ADC, the DSP in A/D chip, MCU.
It should be noted that, this device can also comprise: display unit 47.
Display unit 47, for the result that the information of voltage before showing tested supply voltage Signal Regulation that secondary drive unit 42 provides and main control unit 44 judge.
Display unit 47 can be in LCD, LED or VFD one or more.
Such testing process more transparence, can know the state of detection in time.
It should be noted that, this device can also comprise: host computer 48.
Host computer 48, for the result formation characteristic curve that the information of voltage before the tested supply voltage Signal Regulation that provides according to secondary drive unit 42 and 44 main control units 44 judge.
Generate one and can illustrate that tested IC supply voltage maximum value is how many volts, minimal value is how many volts, and tested IC safe power supply voltage range is how many is lied prostrate how many curve map lied prostrate.The safe power supply voltage range of the supply voltage ultimate value indicating tested IC can be known like this.
It should be noted that, this device can also comprise: storage unit 49.
Storage unit 49, for storing the information of voltage after tested supply voltage Signal Regulation that secondary drive unit 42 provides.
Storage unit 49 can be one or more storeies in Flash Memory, SDRAM or EEPROM.
Information of voltage after the tested supply voltage Signal Regulation provide the secondary drive unit 42 after regulating, can avoid the tested supply voltage signal that the secondary drive unit 42 after because of elementary driver element 41 initialization benchmark driver' s timing change adjustment provides like this.
In the present embodiment, elementary driver element provides benchmark supply voltage signal and benchmark driver' s timing to benchmark IC, secondary drive unit provides to tested IC and surveys supply voltage signal and tested driver' s timing, benchmark driver' s timing is all identical with parameter all the other parameters except high level of tested driver' s timing, benchmark IC is identical with by the model of IC, whether the answer signal that main control unit judgment standard IC returns according to the benchmark driver' s timing received is identical with the answer signal that tested IC returns according to the tested driver' s timing received, if the determination result is YES, then control the voltage of the tested supply voltage signal that adjustable voltage source unit regulates secondary drive unit to provide, control elementary driver element initialization benchmark driver' s timing, and carry out the detection of next round, if judged result is no, then record the magnitude of voltage of the tested supply voltage signal that secondary drive unit exports, and using the supply voltage ultimate value of record value as tested IC.So just can detect the supply voltage ultimate value of IC, reduce the cost detecting IC supply voltage ultimate value, and the supply voltage ultimate value of Aulomatizeted Detect IC can be realized.
Above disclosedly be only present pre-ferred embodiments, certainly can not limit the interest field of the present invention with this, therefore according to the equivalent variations that the claims in the present invention are done, still belong to the scope that the present invention is contained.
Claims (17)
1. detect a method for supply voltage ultimate value, it is characterized in that, comprising:
There is provided benchmark supply voltage signal and tested supply voltage signal respectively to benchmark IC and tested IC, described benchmark IC is identical with the model of tested IC;
Benchmark driver' s timing and tested driver' s timing is provided respectively to benchmark IC and tested IC, described benchmark driver' s timing is all identical with parameter all the other parameters except high level of described tested driver' s timing, and the high level of described tested driver' s timing equals the voltage of described tested supply voltage signal;
Whether the answer signal that judgment standard IC returns according to the benchmark driver' s timing received is identical with the answer signal that tested IC returns according to the tested driver' s timing received, if the determination result is YES, then regulate the voltage of described tested supply voltage signal, and initialization benchmark driver' s timing, return and perform the described step that benchmark supply voltage signal and tested supply voltage signal are provided respectively to benchmark IC and tested IC;
If judged result is no, then record the magnitude of voltage of described tested supply voltage signal, and using the supply voltage ultimate value of record value as tested IC.
2. the method for claim 1, is characterized in that, the voltage of the described tested supply voltage signal of described adjustment comprises:
Heighten the voltage of described tested supply voltage signal;
Or,
Turn down the voltage of described tested supply voltage signal.
3. the method for claim 1, is characterized in that, described provide benchmark supply voltage signal and tested supply voltage signal respectively to benchmark IC and tested IC before comprise:
Obtain benchmark supply voltage signal;
The information of voltage of benchmark supply voltage signal being converted to resistance information, and regulating the voltage of tested supply voltage signal according to described resistance information, is identical with benchmark supply voltage signal before making detection and tested supply voltage signal.
4. the method according to any one of claim 1-3, is characterized in that, describedly provides benchmark driver' s timing and tested driver' s timing to comprise respectively to benchmark IC and tested IC:
Benchmark driver' s timing is provided to benchmark IC;
The benchmark driver' s timing provided to benchmark IC is provided;
Regulate the high level of the benchmark driver' s timing got, and using the benchmark driver' s timing after adjustment as tested driver' s timing, the high level of described tested driver' s timing equals the voltage of described tested supply voltage signal;
Tested driver' s timing is provided to tested IC.
5. the method according to any one of claim 1-3, is characterized in that, comprises after the answer signal whether described judgment standard IC returns according to the tested driver' s timing received with tested IC according to the answer signal that returns of benchmark driver' s timing received is identical:
Show the information of voltage before tested supply voltage Signal Regulation and described judged result;
And/or,
According to the information of voltage before tested supply voltage Signal Regulation and described judged result formation characteristic curve;
And/or,
Store the information of voltage after tested supply voltage Signal Regulation.
6. the method according to any one of claim 1-3, is characterized in that, described answer signal comprises:
Logic level signal or protocol data.
7. the method according to any one of claim 1-3, it is characterized in that, whether the answer signal that described judgment standard IC returns according to the benchmark driver' s timing received is identical with the answer signal that tested IC returns according to the tested driver' s timing received, if the determination result is YES, then the step of the voltage of described tested supply voltage signal is regulated to comprise:
Whether the answer signal that judgment standard IC returns according to the benchmark driver' s timing received is identical with the answer signal that tested IC returns according to the tested driver' s timing received, if the determination result is YES, continue to perform the judgement that answer signal that whether described judgment standard IC return according to the tested driver' s timing received with tested IC according to the answer signal that returns of benchmark driver' s timing received is identical, until the answer signal end of transmission (EOT) that described benchmark IC returns according to the tested driver' s timing received according to the answer signal that returns of benchmark driver' s timing received and tested IC, then regulate the step of the voltage of described tested supply voltage signal.
8. detect a device for supply voltage ultimate value, it is characterized in that, comprising:
Elementary driver element, for providing benchmark supply voltage signal and benchmark driver' s timing to benchmark IC;
Secondary drive unit, for providing tested supply voltage signal and tested driver' s timing to tested IC, described benchmark driver' s timing is all identical with parameter all the other parameters except high level of described tested driver' s timing, the high level of described tested driver' s timing equals the voltage of described tested supply voltage signal, and described benchmark IC is identical with the model of described tested IC;
Adjustable voltage source unit, the voltage of the tested supply voltage signal provided for regulating described secondary drive unit;
Main control unit, whether the answer signal returned according to the benchmark driver' s timing received for judgment standard IC is identical with the answer signal that tested IC returns according to the tested driver' s timing received, if the determination result is YES, then control the voltage of the tested supply voltage signal that adjustable voltage source unit regulates described secondary drive unit to provide, control described elementary driver element initialization benchmark driver' s timing, and carry out the detection of next round;
If judged result is no, then record the magnitude of voltage of the tested supply voltage signal that described secondary drive unit provides, and using the supply voltage ultimate value of record value as tested IC.
9. device as claimed in claim 8, is characterized in that, the voltage of tested supply voltage signal of described adjustable voltage source unit for heightening or turn down described secondary drive unit and providing.
10. device as claimed in claim 8, it is characterized in that, this device also comprises:
Voltage sampling unit, for obtaining the benchmark supply voltage signal that described elementary driver element provides;
Described main control unit is also converted to resistance information for the information of voltage of the benchmark supply voltage signal obtained by described voltage sampling unit, and described resistance information is transferred to described adjustable voltage source unit;
Described adjustable voltage source unit is also for the voltage of the tested supply voltage signal that regulates described secondary drive unit to provide according to the resistance information of described master unit transmissions, and the tested supply voltage signal that the benchmark supply voltage signal exported with described elementary driver element before making detection and described secondary drive unit export is identical.
11. devices as claimed in claim 8, it is characterized in that, this device also comprises:
Regulon, for obtaining the benchmark driver' s timing that described elementary driver element provides, regulate the high level of the benchmark driver' s timing got, driver' s timing after regulating is transferred to described secondary drive unit, regulates the high level of rear drive sequential to equal the voltage of described tested supply voltage signal;
Described secondary drive unit, also for receiving the driver' s timing after the adjustment of described regulon, and using the driver' s timing after described regulon adjustment as tested driver' s timing.
12. devices according to any one of claim 8-11, it is characterized in that, this device also comprises:
Display unit, for the result that the information of voltage before showing tested supply voltage Signal Regulation that described secondary drive unit provides and described main control unit judge;
And/or,
Host computer, for the result formation characteristic curve that the information of voltage before the tested supply voltage Signal Regulation that provides according to described secondary drive unit and described main control unit judge;
And/or,
Storage unit, for storing the information of voltage after tested supply voltage Signal Regulation that described secondary drive unit provides.
13. devices as claimed in claim 12, it is characterized in that, if described device comprises display unit, described display unit comprises:
One or more in LCDs LCD or electronic display LED or vacuum fluorescent display screen VFD;
If described device comprises storage unit, described storage unit comprises:
One or more in flash memory Flash Memory, synchronous DRAM SDRAM or programmable read only memory EEPROM.
14. devices according to any one of claim 8-11, it is characterized in that, described main control unit comprises: one or more in MCU, DSP or ARM.
15. devices as claimed in claim 10, it is characterized in that, described main control unit comprises: one or more in MCU, DSP or ARM;
Described voltage sampling unit comprises: one or more in the ADC in the ADC in A/D chip, described MCU, the ADC in described DSP or described ARM.
16. devices according to any one of claim 8-11, is characterized in that described adjustable voltage source unit comprises:
One or more in the variable voltage source be made up of DAC and integrated transporting discharging, the variable voltage source be made up of PWM and field-effect transistor MOSFET, the variable voltage source be made up of DC/DC and programmable resistance or the variable voltage source that is made up of LDO and potentiometer able to programme.
17. devices according to any one of claim 8-11, it is characterized in that whether the answer signal that described main control unit also returns according to the benchmark driver' s timing received for judgment standard IC is identical with the answer signal that tested IC returns according to the tested driver' s timing received, if the determination result is YES, continue to perform the judgement that answer signal that whether answer signal that judgment standard IC returns according to the benchmark driver' s timing received return according to the tested driver' s timing received with tested IC is identical, until the answer signal end of transmission (EOT) that described benchmark IC returns according to the tested driver' s timing received according to the answer signal that returns of benchmark driver' s timing received and tested IC, then control the voltage of the tested supply voltage signal that adjustable voltage source unit regulates described secondary drive unit to provide, control elementary driver element initialization benchmark driver' s timing, and carry out the detection of next round,
If judged result is no, then record the magnitude of voltage of the tested supply voltage signal that described secondary drive unit provides, and using the supply voltage ultimate value of record value as tested IC.
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| CN201110434666.4A CN102565679B (en) | 2011-12-22 | 2011-12-22 | Method and device for detecting limit value of power supply voltage |
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| CN201110434666.4A CN102565679B (en) | 2011-12-22 | 2011-12-22 | Method and device for detecting limit value of power supply voltage |
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| CN112782569B (en) * | 2019-11-11 | 2023-09-05 | 圣邦微电子（北京）股份有限公司 | Threshold value testing device and method for digital chip pin logic level |
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