CN102507267B - High-flux laser system suspended particle sampling device and method - Google Patents
High-flux laser system suspended particle sampling device and method Download PDFInfo
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- CN102507267B CN102507267B CN 201110315567 CN201110315567A CN102507267B CN 102507267 B CN102507267 B CN 102507267B CN 201110315567 CN201110315567 CN 201110315567 CN 201110315567 A CN201110315567 A CN 201110315567A CN 102507267 B CN102507267 B CN 102507267B
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Abstract
The invention discloses a high-flux laser system suspended particle sampling device and method, belonging to the environment measurement field. The device is mainly composed of an upper template and a lower template, wherein the upper template is provided with 12 or more round slots by etching; a through concentric circle is arranged at the bottom of the round slot; a copper wire mesh is placed in the round slot; the lower template is provided with a copper wire mesh fixing circular ring by etching in a position corresponding to the round slot of the upper template, the copper wire mesh fixing circular ring is used for fixing the copper wire mesh in the round slot of the upper template and matches with the round slot, a through hole is formed by etching in the copper wire mesh fixing circular ring, the upper template concentric circle and the through hole in the copper wire mesh fixing circular ring are in through-communication; and the upper and lower templates are provided with position-corresponding threaded holes respectively, and can completely fit with each other and fix the inventive device at a laser gas outlet for sampling after the upper and lower templates are butt-jointed. The inventive method can realize simultaneous sampling by a plurality of copper wire meshes at one time, and has large sampling area. The inventive device is portable, and suitable for sampling suspended particles and aerosol at the container port.
Description
Technical field
The present invention relates to a kind of high-flux laser system suspended particle sampling device and method, specifically adopt a plurality of copper mesh to realize the method for multi-point sampling, belong to the environment measurement field.
Background technology
In the high power laser system course of work, can produce a large amount of suspended particle and gasoloid, these suspended particles and gasoloid are suspended on light path can affect beam quality, is attached to the transmitance that optical element surface can reduce light, and serious also can cause the damage of optical element surface.In order to find out the aerocolloidal source of these suspended particles and on the impact of optical element surface, to need to gather suspended particle and aerosol sample in high power laser system, its pattern, particle size and composition are carried out Measurement and analysis.The aerocolloidal method of sampling of superpower laser inner suspension particle has sampling pocket method, particle counter method and negative pressure absorbing method etc. at present, these methods can only be used for analyzing wherein one or both parameters, measure whole parameters as need, need in conjunction with other method of sampling resampling, what cause measuring is not same group of particle, so just can not true, completely reflect the characteristics of measuring particle.Therefore accurate, complete measurement result to be expected, just the new method of sampling must be sought.Adopt the sampling of copper mesh method, can simultaneously above-mentioned several parameters be measured in the lump.Copper mesh is placed in sampler, then is still in atmosphere, utilize the natural subsidence of suspended particle to take a sample (Yang Shushen, Shao Longyi, the transmission electron microscope research of airborne fine particulate matter, ACTA Scientiae Circumstantiae, 27(2), 2007).The method is applicable to outdoor collection atmosphere suspended particulate substance, and the sampler of employing is too large, can't be used for the suspended particle in collection container exit, and the copper mesh quantity of once placing in sampler is few, and Sampling Area is little.
Summary of the invention
The object of the present invention is to provide a kind of high-flux laser system suspended particle sampling device and method, this device can be realized the once sampling simultaneously of a plurality of copper mesh, and Sampling Area is large, and installs small and exquisite portablely, is suitable for collection container mouth place's suspended particle and gasoloid.
Purpose of the present invention is realized by following technical scheme:
A kind of high-flux laser system suspended particle sampling device, described device mainly is comprised of cope match-plate pattern and lower bolster.
Wherein, cope match-plate pattern is etched with 12 or greater than 12 circular troughs; There is a diameter circular trough bottom than the concentric circles of the little 0.5mm of circular trough diameter, and described concentric circles penetrates cope match-plate pattern, forms penetrating hole, as sampling part; Copper mesh is placed in circular trough; Lower bolster is being etched with the copper mesh clamping rings of the projection that matches with circular trough with the circular trough relevant position of cope match-plate pattern, be used for fixing the copper mesh in the cope match-plate pattern circular trough, the internal diameter of described copper mesh clamping rings is than the little 0.5mm of external diameter, copper mesh clamping rings projection one end is etched into penetrating hole along copper mesh clamping rings internal diameter, and the hole in the copper mesh clamping rings of the concentric circles of cope match-plate pattern and lower bolster is penetrating up and down; Cope match-plate pattern and lower bolster are respectively equipped with the corresponding screw in position; Two templates can fit like a glove, and are docked to a time-out, leave the gap between the copper mesh clamping rings of the circular trough of cope match-plate pattern and lower bolster and are used for placing copper mesh, and gap length is regulated according to copper mesh thickness.
The method of sampling step of described device is as follows:
(1) copper mesh is placed in the circular trough of cope match-plate pattern;
(2) buckle well, compress the circular trough of the copper mesh clamping rings of lower bolster and cope match-plate pattern is corresponding one by one, and fix with bolt;
(3) described device is fixed on the place's sampling of laser instrument gas outlet;
(4) take sample after, the sealing of described device is preserved, take the laboratory to and carry out sample analysis.
Beneficial effect
A kind of high-flux laser system suspended particle sampling device of the present invention and method, this device can realize the once sampling simultaneously of a plurality of copper mesh, and Sampling Area is large, and installs small and exquisite portablely, is suitable for collection container mouth place's suspended particle and gasoloid.
Description of drawings
Fig. 1 is the structural drawing of cope match-plate pattern in high-flux laser system suspended particle sampling device of the present invention;
Fig. 2 is the sectional view of cope match-plate pattern in high-flux laser system suspended particle sampling device of the present invention;
Fig. 3 is the partial enlarged drawing of A in Fig. 2;
Fig. 4 is the partial enlarged drawing of B in Fig. 2;
Fig. 5 is the structural drawing of lower bolster in high-flux laser system suspended particle sampling device of the present invention;
Fig. 6 is the sectional view of lower bolster in high-flux laser system suspended particle sampling device of the present invention
Fig. 7 is the partial enlarged drawing of C in Fig. 6;
Fig. 8 is the partial enlarged drawing of D in Fig. 6;
Wherein, 1-cope match-plate pattern, 2-cope match-plate pattern screw, 3-circular trough, 4-lower bolster, 5-lower bolster screw, 6-copper mesh clamping rings, 7-circular trough, 8-cope match-plate pattern screw, 9-lower bolster screw, 10-copper mesh clamping rings.
Embodiment
Below in conjunction with the drawings and specific embodiments in detail the present invention is described in detail, but is not limited to this.
Embodiment
As shown in figs. 1 and 3, a kind of high-flux laser system suspended particle sampling device, described device mainly are comprised of cope match-plate pattern 1 and lower bolster 4.
Wherein, cope match-plate pattern 1 is etched with the circular trough 3 of 18 diameter 3mm, degree of depth 0.1mm; The concentric circles of a diameter 2.5mm is arranged at circular trough 3 bottoms, and the described concentric round degree of depth is 0.1mm, penetrates cope match-plate pattern 1, forms penetrating hole, as sampling part; The copper mesh of thickness 0.03mm is placed in circular trough 3; Lower bolster 4 is being etched with the copper mesh clamping rings 6 of the projection of 18 external diameter 2.95mm, internal diameter 2.45mm, height 0.07mm with cope match-plate pattern 1 circular trough 3 relevant positions, is used for fixing the copper mesh in the circular trough 3 of cope match-plate pattern; The protruding end of copper mesh clamping rings 6 is the penetrating hole of 0.2mm along copper mesh clamping rings 6 internal diameter etching one degree of depth, and the hole in the copper mesh clamping rings 6 of the concentric circles of cope match-plate pattern 1 and lower bolster 4 is penetrating up and down; Cope match-plate pattern 1 is provided with nineteen cope match-plate pattern screw 2, and lower bolster 4 is provided with nineteen and the cope match-plate pattern screw 2 corresponding lower bolster screws 5 in position.
The method of sampling step of described device is as follows:
(1) copper mesh is placed in the circular trough of cope match-plate pattern;
(2) buckle well, compress the circular trough of the copper mesh clamping rings of lower bolster and cope match-plate pattern is corresponding one by one, and fix with bolt;
(3) described device is fixed on the place's sampling of laser instrument gas outlet;
(4) take sample after, the sealing of described device is preserved, take the laboratory to and carry out sample analysis.
The present invention includes but be not limited to above embodiment, every any being equal to of carrying out under the principle of spirit of the present invention, replace or local improvement, all will be considered as within protection scope of the present invention.
Claims (2)
1. high-flux laser system suspended particle sampling device, it is characterized in that: described device mainly is comprised of cope match-plate pattern (1) and lower bolster (4);
Wherein, cope match-plate pattern (1) is etched with 12 or greater than 12 circular troughs (3); There is a diameter circular trough (3) bottom than the concentric circles of the little 0.5mm of circular trough (3) diameter, and described concentric circles penetrates cope match-plate pattern (1), forms penetrating hole; Copper mesh is placed in circular trough (3); Lower bolster (4) is being etched with the copper mesh clamping rings (6) of the projection that matches with circular trough (3) with circular trough (3) relevant position of cope match-plate pattern (1), the internal diameter of described copper mesh clamping rings (6) is than the little 0.5mm of external diameter, the protruding end of copper mesh clamping rings (6) is etched into penetrating hole along internal diameter, and the hole in the copper mesh clamping rings (6) of the concentric circles of cope match-plate pattern (1) and lower bolster (4) is penetrating up and down; Cope match-plate pattern (1) and lower bolster (4) are respectively equipped with the corresponding screw in position; Two templates can fit like a glove, and are docked to a time-out, leave the gap between the circular trough (3) of cope match-plate pattern (1) and lower bolster (4) copper mesh clamping rings (6) and are used for placing copper mesh.
2. the method for sampling of a kind of high-flux laser system suspended particle sampling device according to claim 1, it is characterized in that: the method for sampling step of described device is as follows:
(1) copper mesh is placed in the circular trough (3) of cope match-plate pattern (1);
(2) buckle well, compress the circular trough (3) of the copper mesh clamping rings (6) of lower bolster and cope match-plate pattern (1) is corresponding one by one, and fix with bolt;
(3) described device is fixed on the place's sampling of laser instrument gas outlet;
(4) take sample after, the sealing of described device is preserved, take the laboratory to and carry out sample analysis.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201110315567 CN102507267B (en) | 2011-10-18 | 2011-10-18 | High-flux laser system suspended particle sampling device and method |
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|---|---|---|---|
| CN 201110315567 CN102507267B (en) | 2011-10-18 | 2011-10-18 | High-flux laser system suspended particle sampling device and method |
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| Publication Number | Publication Date |
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| CN102507267A CN102507267A (en) | 2012-06-20 |
| CN102507267B true CN102507267B (en) | 2013-06-26 |
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Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN201707237U (en) * | 2010-07-01 | 2011-01-12 | 中国气象科学研究院 | High voltage electrostatic particulate sampling device |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3335313B2 (en) * | 1998-10-12 | 2002-10-15 | 日本電信電話株式会社 | Dust amount measurement device |
| US6491872B1 (en) * | 1999-09-17 | 2002-12-10 | The United States Of America As Represented By The Secretary Of The Army | Method and system for detecting and recording submicron sized particles |
| KR100865712B1 (en) * | 2006-07-12 | 2008-10-28 | 안강호 | System and method for measuring particles |
| WO2010113520A1 (en) * | 2009-04-01 | 2010-10-07 | 新日本製鐵株式会社 | Device and method for continuously measuring horizontal flux of falling particulate matter in atmosphere |
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Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN201707237U (en) * | 2010-07-01 | 2011-01-12 | 中国气象科学研究院 | High voltage electrostatic particulate sampling device |
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| JP特开2000-121541A 2000.04.28 |
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