CN102435621A - Dual-energy under-sampled matter identification method and system - Google Patents

Dual-energy under-sampled matter identification method and system Download PDF

Info

Publication number
CN102435621A
CN102435621A CN2011103918990A CN201110391899A CN102435621A CN 102435621 A CN102435621 A CN 102435621A CN 2011103918990 A CN2011103918990 A CN 2011103918990A CN 201110391899 A CN201110391899 A CN 201110391899A CN 102435621 A CN102435621 A CN 102435621A
Authority
CN
China
Prior art keywords
projection
data
energy
dual
image
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN2011103918990A
Other languages
Chinese (zh)
Other versions
CN102435621B (en
Inventor
陈志强
张丽
刘圆圆
邢宇翔
赵自然
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tsinghua University
Nuctech Co Ltd
Original Assignee
Tsinghua University
Nuctech Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tsinghua University, Nuctech Co Ltd filed Critical Tsinghua University
Priority to CN 201110391899 priority Critical patent/CN102435621B/en
Publication of CN102435621A publication Critical patent/CN102435621A/en
Application granted granted Critical
Publication of CN102435621B publication Critical patent/CN102435621B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Landscapes

  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

The invention discloses a dual-energy under-sampled matter identification method and a dual-energy under-sampled matter identification system. The method comprises the following steps of: acquiring the computed tomography (CT) image of a detected matter by a CT image reconstruction method, acquiring a small quantity of dual-energy under-sampled projections, and solving photoelectric coefficient integration and Compton coefficient integration by looking up a table according to dual-energy projection data; performing region segmentation on the acquired CT image of the detected matter by an image processing technology, marking the segmented regions, and calculating the lengths of the small quantity of acquired dual-energy projection rays which pass through the marked regions; and establishing an equation system by a duel-energy preprocessing dual-effect decomposition and reconstruction method to calculate a Compton coefficient and a photoelectric coefficient, and further solving the atomic number and the electron density of a substance in each segmented region. The type of the substance in the detected matter can be identified by the atomic number of the substance.

Description

Dual-energy under-sampling substance recognition methods and system
The application is the dividing an application of application for a patent for invention 200910085925.X that is called " dual-energy under-sampling substance recognition methods and system " in the name that on May 27th, 2009 submitted to.
Technical field
The present invention relates to the radiant image technical field, be specifically related to a kind of dual-energy under-sampling substance recognition methods and system, can reduce radiation dose and system cost, and improve sweep velocity.
Background technology
In recent years, because dual intensity CT imaging technique can obtain best accuracy of detection, effectively to the detected material volume reconstruction and carry out material identification, make it in safety inspection, Non-Destructive Testing has crucial meaning in the fields such as medical diagnosis.
At present, dual intensity CT imaging technique mainly contains two kinds of implementations: a kind of is to utilize custom-designed double decker detector to realize the pseudo-dual intensity system of dual intensity imaging, as shown in Figure 1.According to method shown in Figure 1, during scanning, ray passes the low energy detector that arrives ground floor after the object earlier, then passes filter plate, arrives the high energy detector of the second layer at last again, the corresponding identical automatically raypath of pixel on this moment two transmission images.
The another kind true dual intensity system that to be the radiographic source that utilizes different-energy carry out twice circular scan to object is shown in Fig. 2 A and 2B.Shown in Fig. 2 A, in first all scanning processes, use the ray of first energy that object is scanned.Then ray energy is switched to second energy from first energy.Shown in Fig. 2 B, in second all scanning processes, use the ray of second energy that object is scanned.According to the method shown in Fig. 2 A and the 2B, probably are equivalent to radiation dose and sweep time the twice of single sweep operation.And need carry out registration to low energy and high energy transmission image, guarantee the corresponding identical raypath of pixel of same coordinate on two images.
But see from the angle of Project Realization,,, be difficult for popularizing so cost is higher because first kind of system needs two-layer detector to gather simultaneously.Second kind of system is except need be strict to the registration of low energy and high energy transmission image, and length consuming time, and sweep velocity is slow, and since many scannings a week increased scanning dose to object to be detected.These problems all cause bad influence to the popularization of dual intensity CT imaging technique.
Summary of the invention
The objective of the invention is to propose a kind of dual-energy under-sampling substance recognition methods and system; Solving present two types utilizes dual intensity CT imaging technique to the detected material volume reconstruction and carry out can't realizing low cost in the system of material identification; Low dosage, the difficult problem that fast speed detects.The method and system of the embodiment of the invention can be applied to safety inspection, Non-Destructive Testing, many detection ranges such as medical diagnosis.
In one aspect of the invention; A kind of dual-energy under-sampling substance recognition methods has been proposed; Comprise: utilize the beam of first energy that inspected object is carried out CT scan, obtain the data for projection of all angles under first energy and the CT image of reconstruction object to be detected; Utilize the beam of second energy that inspected object is scanned, obtain the data for projection of the second energy lower part angle; Make up data for projection and the data for projection under second energy under first energy, to obtain the dual-energy under-sampling data of part angle; The method of tabling look-up according to the dual-energy under-sampling The data obtains photoelectric coefficient integrated value and Compton coefficient integrated value; CT image to object to be detected carries out Region Segmentation, and a plurality of zones after obtaining cutting apart and calculating dual intensity ray pass each regional length; Pass each regional length according to the dual intensity ray, photoelectric coefficient integrated value and Compton coefficient integrated value are utilized dual intensity pre-treatment economic benefits and social benefits should decompose method for reconstructing and are found the solution Compton coefficient and photoelectric coefficient; At least calculate the atomic number of material in the zone of respectively cutting apart based on Compton coefficient and photoelectric coefficient; At least based on atomic number the material of inspected object is discerned.
The said step of calculating the atomic number of material in the zone of respectively cutting apart at least based on Compton coefficient and photoelectric coefficient comprises atomic number and the electron density of calculating material in each cut zone, and the said step of based on atomic number the material of inspected object being discerned at least comprises based on the electron density of atomic number and calculating the material of inspected object is discerned.
The step that the material of inspected object is discerned comprises: utilize look-up table to confirm the material in each cut zone of inspected object.
The step that the material of inspected object is discerned comprises: utilize the classification curve of creating in advance to confirm the material in each cut zone of inspected object.
The data for projection of the said second energy lower part projection angle is the data for projection under the single projection angle.
The data for projection of the said second energy lower part projection angle is the data for projection under a plurality of projection angles, and the degree of correlation between the data for projection under said a plurality of projection angle is less than predetermined threshold value.
This method also comprises the step of the zone of cutting apart being carried out mark.
In another aspect of this invention, proposed a kind of dual-energy under-sampling substance recognition system, having comprised: ray generating means, generation will penetrate beam and the beam of second energy of first energy of inspected object; The mechanical rotation control section comprises wheelwork and control system, is used to realize the rotation sweep to inspected object; The data acquisition subsystem comprises detector array, is used to obtain the transmission projection data of the beam that penetrates inspected object; Main control and data handling machine; Control above-mentioned ray generating means; Mechanical rotation control section and data acquisition subsystem utilize the beam of first energy that inspected object is carried out CT scan, obtain the data for projection under first energy and rebuild the CT image of object to be detected; And utilize the beam of second energy that inspected object is scanned, obtain the data for projection of the second energy lower part angle; Wherein said main control and data handling machine comprise: make up data for projection and the data for projection under second energy under first energy, with the device of the dual-energy under-sampling data that obtain the part angle; The method of tabling look-up according to the dual-energy under-sampling The data obtains the device of photoelectric coefficient integrated value and Compton coefficient integrated value; CT image to object to be detected carries out Region Segmentation, and a plurality of zones after obtaining cutting apart and calculating dual intensity ray pass the device of each regional length; Pass each regional length according to the dual intensity ray, photoelectric coefficient integrated value and Compton coefficient integrated value utilize dual intensity pre-treatment economic benefits and social benefits should decompose the device that method for reconstructing is found the solution Compton coefficient and photoelectric coefficient; At least calculate the device of the atomic number of material in the zone of respectively cutting apart based on Compton coefficient and photoelectric coefficient; At least the device of based on atomic number the material of inspected object being discerned.
The said device that calculates the atomic number of material in the zone of respectively cutting apart at least based on Compton coefficient and photoelectric coefficient comprises the atomic number that calculates material in each cut zone and the device of electron density, and the said device of based on atomic number the material of inspected object being discerned at least comprises the device of the material of inspected object being discerned based on the electron density of atomic number and calculating.
The device that the material of inspected object is discerned comprises: utilize look-up table to confirm the device of the material in each cut zone of inspected object.
The device that the material of inspected object is discerned comprises: utilize the classification curve of creating in advance to confirm the device of the material in each cut zone of inspected object.
The data for projection of the said second energy lower part projection angle is the data for projection under the single projection angle.
The data for projection of the said second energy lower part projection angle is the data for projection under a plurality of projection angles, and the degree of correlation between the data for projection under said a plurality of projection angle is less than predetermined threshold value.
Described system also comprises the device that the zone of cutting apart is carried out mark.
According to the embodiment of the invention based on the dual intensity projection under-sampling substance recognition methods of CT image and system for the traditional pseudo-dual intensity of two-layer detector system; Can reduce the number of detector; Effectively reduce cost, making dual intensity material recognition imaging system large batch ofly to be applied to becomes possibility in the safety inspection; For true dual intensity system, can reduce number of revolutions, can realize that fast the dual intensity material recognition imaging of low dosage is that ten minutes is significant for reducing the radiation dose that patient receives in quick check and the medical diagnosis in the safety check field.
Therefore, the method and system of the embodiment of the invention serves as that the basis effectively solves the several crucial difficult point in the dual intensity material recognition imaging problem with the priori of CT image, realizes low cost, fast speed, and the quick scanning of low dosage has very big application market potentiality.
Description of drawings
From the detailed description below in conjunction with accompanying drawing, above-mentioned feature and advantage of the present invention will be more obvious, wherein:
Fig. 1 is pseudo-dual intensity CT imaging system circle track scanning floor map;
Fig. 2 A and 2B are true dual intensity CT imaging system circle track scanning floor map;
Fig. 3 A is the structural representation according to the improved true dual intensity material recognition imaging detection system of the embodiment of the invention;
Fig. 3 B is main control and the structural representation of data handling machine shown in Fig. 3 A;
Fig. 4 is the dual intensity projection under-sampling substance recognition methods schematic flow sheet based on the CT image according to the embodiment of the invention;
Fig. 5 A and 5B are the improved true dual intensity material recognition imaging detection circle track scanning floor map according to the embodiment of the invention;
Fig. 6 shows the look-up table of photoelectric coefficient integration and Compton coefficient integration; And
Fig. 7 describes to calculate to pass the ray length synoptic diagram of cut zone.
Embodiment
Below, specify preferred implementation of the present invention with reference to accompanying drawing.In the accompanying drawings, though be shown in the different drawings, identical Reference numeral is used to represent identical or similar assembly.For clear and simple and clear, the known function and the detailed description of structure that are included in here will be omitted, otherwise they will make theme of the present invention unclear.
Being a kind of utilization according to the system of the embodiment of the invention realizes improved true dual intensity circle track material recognition imaging detection system based on the dual intensity projection under-sampling substance recognition methods of CT image.Shown in Fig. 3 A, the fan-beam circle track scanning that this system adopts a radiographic source and one deck detector to form.Shown in Fig. 5 A and 5B; Utilize the shape information of the CT image acquisition object of first week circle track scanning reconstruction; Utilize the projection information of second all one or several angles to obtain a spot of dual intensity projection samples again, can realize fast the dual intensity material recognition imaging of low dosage.Shown in Fig. 5 A, in first week, for example utilize low energy ray to carry out 360 complete degree scannings, rebuild the CT image.In second week, utilize high-energy ray optionally to scan, obtain the high energy data for projection of part.
Shown in Fig. 3 A, possesses following ingredient according to the system of the embodiment of the invention.
Ray generating means 11, it comprises X ray accelerator, X-ray machine or radioactive isotope, and corresponding utility appliance.
Mechanical rotation control section 12, it comprises the wheelwork and the control system of a rotation inspected object (perhaps source and detector), object of which movement and source and detector motion belong to relative motion, are of equal value.In medical field, because patient is difficult for rotating, ROTATING SOURCE and detector are realized simultaneously, in the present embodiment, adopt the mode of rotation inspected object to realize.
Data acquisition subsystem 13, it mainly comprises detector array (generally being that equidistance is arranged, also can be that isogonism is arranged), is used to obtain the transmission projection data of ray.This subsystem 13 also comprises sensing circuit and logic control element of data for projection on the detector etc.Detector can be a solid probe, also can be gas detector, can also be semiconductor detector.
When data acquisition was adopted, requiring the SI was uniformly on time shaft, if also uniform motion of inspected object, and require all detector array synchronous acquisition.
Main control and data handling machine 14; It sends and receives signal through control signal and data line 15, is responsible for the main control of CT system operational process, comprises mechanical rotation; Electrical control; Safety interlocking control etc., and to being handled by the data for projection of data acquisition subsystem 13 acquisitions, the data for projection of gathering through first week reconstructs the object faultage image and carries out the image region segmentation mark; The small sample of utilizing the second week scanning to obtain is again formed atomic number that a small amount of dual intensity projection samples reconstructs each segmented areas material and is carried out material with the electron density image and discern, and shows through display.This computing machine 14 can be high performance single PC, also can be a workstation or a group of planes.
Fig. 3 B shows main control and the structured flowchart of data handling machine 14 shown in Fig. 3 A.Shown in Fig. 3 B, the data storage that data acquisition subsystem 13 is gathered is in storer 141.Store the configuration information and the program of computer data processor in the ROM (read-only memory) (ROM) 142.Random-access memory (ram) 143 is used in the temporary various data of processor 146 courses of work.In addition; Also store in the storer 141 and be used to carry out the computer program of data processing and the database of establishment in advance; This database storing has the relevant information of various known objects, photoelectric coefficient integration and Compton coefficient integration look-up table, atomic number look-up table or atomic number classification curve; And the information such as electron density of material, each the regional attribute such as atomic number and electron density of inspected object that is used for being calculated with processor 146 compares.Internal bus 144 connects above-mentioned storer 141, ROM (read-only memory) 142, RAS 143, input media 145, processor 146 and display device 147.
After the operational order of user through 145 inputs of the input media such as keyboard and mouse; Processor 146 in this computer program is carried out predetermined data processing algorithm; After obtaining data processed result; It is presented on the display device 147 such as LCD display, perhaps directly exports result with the form of hard copy.
With reference to the accompanying drawings 4 describe the method for the embodiment of the invention in detail implementation.Fig. 4 is the dual intensity projection under-sampling substance recognition methods schematic flow sheet based on the CT image according to the embodiment of the invention.
At step S11; Main control and data handling machine 14 are controlled ray generating means 11, mechanical rotation control section 12 and data acquisition subsystem 13; Utilize circle track fan-beam method for reconstructing will under first all energy-1 situation, scan data for projection sampling the carrying out CT that obtains and rebuild, obtain the CT image of object to be detected.At step S21, utilize this data for projection and the projection information under the several angles of second all energy-2 even angle to form a spot of dual-energy under-sampling data for projection, promptly under second week scanning visual angle, testee is carried out dual-energy under-sampling scanning.
According to embodiments of the invention, the scanning visual angle in second week can be one or more.Under the situation at a plurality of visual angles, the degree of correlation of the data for projection under these a plurality of visual angles is preferably smaller, for example less than predetermined threshold value.
And then, can from the look-up table the storer 141 that is stored in computing machine 14, table look-up and obtain every couple of photoelectric coefficient integration and Compton coefficient integrated value A that high low energy projection is corresponding at step S22.
As shown in Figure 6, horizontal ordinate P1, P2 represent that respectively the projection that obtains under the high low energy situation, each the coordinate points place in table all have and can data for projection corresponding photoelectric coefficient integration of height this moment and the value of Compton coefficient integration A.Promptly when known high low energy data for projection, just can obtain corresponding with it photoelectric coefficient integration and the value of Compton coefficient integration A through searching this table.Above-mentioned look-up table is disclosed in existing document (" A Volumetric Object Detection Framework with Dual-Energy CT " IEEE NSS/MIC 2008).
At step S12, main control and data handling machine 14 adopts based on the method for Region Segmentation the CT reconstructed image is divided into different several zones row labels of going forward side by side according to the difference of gray scale.For example, above-mentioned method based on Region Segmentation is that improved one way division merges dividing method.
As shown in Figure 7, l j(i) expression i bar ray passes the length that j cuts the zone; T (i) representes data for projection.Like this, at step S13, go out the length l of the pairing beam of i group data for projection through j piece zone according to the dual intensity projection samples information calculations that obtains among the step S21 j(i).
At step S14, main control and data handling machine 14 utilize dual intensity pre-treatment economic benefits and social benefits should decompose method for reconstructing and set up system of equations A=∑ al, and wherein a representes Compton coefficient and photoelectric coefficient.Order has obtained M group DR dual intensity transmission data altogether under second all scanning visual angle, the CT image is divided into be slit into N piece marked region and use T H(i) and T L(i) expression i group is high and low can data for projection.Through formula (1) linear attenuation coefficient being carried out economic benefits and social benefits should decompose:
μ(E)=a 1f ph(E)+a 2f KN(E)……(1)
And then, can transparency represent high and low with following formula (2) and (3):
T H = ∫ E H D H ( E ) exp ( - ∫ μ ( E ) dl ) dE = ∫ E H D H ( E ) exp ( - A 1 f ph ( E ) - A 2 f KN ( E ) ) dE · · · · · · ( 2 )
T L = ∫ E L D L ( E ) exp ( - ∫ μ ( E ) dl ) dE = ∫ E L D L ( E ) exp ( - A 1 f ph ( E ) - A 2 f KN ( E ) ) dE · · · · · · ( 3 )
F wherein Ph(E) the expression photoelectric cross-section is to the dependence of ray energy E; f KN(E) relation of portrayal Compton cross-section and photon energy; D H(E) represent the X-ray machine ray energy spectrum that high energy detector measures; D L(E) represent the X-ray machine ray energy spectrum that the low energy detector measurement arrives; a 1The expression photoelectric coefficient; a 2Expression Compton coefficient; A 1Expression photoelectric coefficient integration; A 2Expression Compton coefficient integration, shown in the promptly following formula (4):
A=∫adl……(4)
Thereby structure system of linear equations:
A=∑a·l ……(5)
Particularly, with following system of equations (6) and (7) to a 1, a 2Find the solution:
l 1 ( 1 ) l 2 ( 1 ) . . l N ( 1 ) l 1 ( 2 ) . . . . . . . . l 1 ( M ) . . . l N ( M ) a 1,1 a 1,2 . . a 1 , N = A 1 ( 1 ) A 1 ( 2 ) . . A 1 ( M ) · · · · · · ( 6 )
l 1 ( 1 ) l 2 ( 1 ) . . l N ( 1 ) l 1 ( 2 ) . . . . . . . . l 1 ( M ) . . . l N ( M ) a 2 , 1 a 2,2 . . a 2 , N = A 2 ( 1 ) A 2 ( 2 ) . . A 2 ( M ) · · · · · · ( 7 )
Utilize the system of equations that makes up among the method solution procedure S14 of least square at step S15, calculate a, i.e. photoelectric coefficient a 1With Compton coefficient a 2Then, at step S16, obtain atomic number and electron density through formula (8) and (9):
a 1 ≈ K 1 N A 2 ρZ n ( n ≈ 3 ) · · · · · · ( 8 )
a 2 ≈ K 2 N A 2 ρ · · · · · · ( 9 )
Wherein Z representes atomic number, and ρ representes electron density, N AThe expression avogadros constant, K 1For constant promptly comprise other all with ray energy and the irrelevant coefficient of material parameter, K 2For constant promptly comprise other all with ray energy and the irrelevant coefficient of material parameter.Can obtain the atomic number and the electron density of segmented areas material like this, thereby effectively material discerned.For example, utilize atomic number to come the material in each zone of inspected object is discerned based on the method for the LUT Method or the curve of classifying.According to another embodiment, can use the atomic number of calculating and electron density to come material is discerned simultaneously.
As stated, on based on the CT image basis, only utilize a spot of several dual intensity projection samples can realize low cost according to the method and system of the embodiment of the invention, low dosage, the dual intensity material recognition imaging of fast speed.Has the safety inspection of being applied to, Non-Destructive Testing, the potentiality in fields such as medical diagnosis.
Top description only is used to realize embodiment of the present invention; It should be appreciated by those skilled in the art; In any modification that does not depart from the scope of the present invention or local replacement; All should belong to claim of the present invention and come restricted portion, therefore, protection scope of the present invention should be as the criterion with the protection domain of claims.

Claims (18)

1. dual-energy under-sampling substance recognition methods comprises:
Utilize the shape information of the CT image acquisition object of first week circle track scanning reconstruction,
Utilize the projection information of second all one or several angles to obtain a spot of dual intensity projection samples, realize dual intensity material recognition imaging.
2. the method for claim 1, wherein in first week, for example utilize low energy ray to carry out 360 complete degree scannings, rebuild the CT image; In second week, utilize high-energy ray optionally to scan, obtain the high energy data for projection of part.
3. the method for claim 1; Wherein, The data for projection of gathering through first week reconstructs the object faultage image and carries out the image region segmentation mark; The small sample of utilizing the second week scanning to obtain is again formed atomic number that a small amount of dual intensity projection samples reconstructs each segmented areas material and is carried out material with the electron density image and discern, and shows through display.
4. method as claimed in claim 3 wherein, adopts based on the method for Region Segmentation the CT reconstructed image is divided into different several zones row labels of going forward side by side according to the difference of gray scale.
5. method as claimed in claim 4, wherein, said region segmentation method is specially the one way division and merges dividing method.
6. the method for the method of claim 1, wherein tabling look-up according to the dual-energy under-sampling The data obtains photoelectric coefficient integrated value and Compton coefficient integrated value; CT image to object to be detected carries out Region Segmentation, and a plurality of zones after obtaining cutting apart and calculating dual intensity ray pass each regional length; Pass each regional length according to the dual intensity ray, photoelectric coefficient integrated value and Compton coefficient integrated value are utilized dual intensity pre-treatment economic benefits and social benefits should decompose method for reconstructing and are found the solution Compton coefficient and photoelectric coefficient; At least calculate the atomic number of material in the zone of respectively cutting apart based on Compton coefficient and photoelectric coefficient; At least based on atomic number the material of inspected object is discerned.
7. dual-energy under-sampling substance recognition methods comprises:
Utilize the beam of first energy that inspected object is carried out CT scan, obtain the data for projection of all angles under first energy and the CT image of reconstruction object to be detected;
Utilize the beam of second energy that inspected object is scanned, obtain the data for projection of the second energy lower part angle;
Make up data for projection and the data for projection under second energy under first energy, to obtain the dual-energy under-sampling data of part angle;
Wherein, The data for projection of gathering through first week reconstructs the object faultage image and carries out image region segmentation and mark; The small sample of utilizing the second week scanning to obtain is again formed atomic number that a small amount of dual intensity projection samples reconstructs each segmented areas material and is carried out material with the electron density image and discern, and shows through display.
8. method as claimed in claim 7 wherein adopts based on the method for Region Segmentation the CT reconstructed image is divided into different several zones row labels of going forward side by side according to the difference of gray scale.
9. method as claimed in claim 7 wherein utilizes look-up table to confirm the material in each cut zone of inspected object.
10. method as claimed in claim 7 wherein utilizes the classification curve of creating in advance to confirm the material in each cut zone of inspected object.
11. method as claimed in claim 7, the data for projection of the wherein said second energy lower part projection angle is the data for projection under the single projection angle.
12. method as claimed in claim 7, the data for projection of the wherein said second energy lower part projection angle is the data for projection under a plurality of projection angles, and the degree of correlation between the data for projection under said a plurality of projection angle is less than predetermined threshold value.
13. a dual-energy under-sampling substance recognition system comprises:
Ray generating means, generation will penetrate beam and the beam of second energy of first energy of inspected object;
The mechanical rotation control section comprises wheelwork and control system, is used to realize the rotation sweep to inspected object;
The data acquisition subsystem comprises detector array, is used to obtain the transmission projection data of the beam that penetrates inspected object;
Main control and data handling machine; Control above-mentioned ray generating means; Mechanical rotation control section and data acquisition subsystem utilize the beam of first energy that inspected object is carried out CT scan, obtain the data for projection under first energy and rebuild the CT image of object to be detected; And utilize the beam of second energy that inspected object is scanned, obtain the data for projection of the second energy lower part angle;
The data for projection that wherein said main control and data handling machine were gathered through first week reconstructs the object faultage image and carries out image region segmentation and mark; The small sample of utilizing the second week scanning to obtain is again formed atomic number that a small amount of dual intensity projection samples reconstructs each segmented areas material and is carried out material with the electron density image and discern, and shows through display.
14. system as claimed in claim 13 wherein adopts based on the method for Region Segmentation the CT reconstructed image is divided into different several zones row labels of going forward side by side according to the difference of gray scale.
15. system as claimed in claim 13 wherein utilizes look-up table to confirm the material in each cut zone of inspected object.
16. system as claimed in claim 13 wherein utilizes the classification curve of creating in advance to confirm the material in each cut zone of inspected object.
17. system as claimed in claim 13, the data for projection of the wherein said second energy lower part projection angle is the data for projection under the single projection angle.
18. system as claimed in claim 13, the data for projection of the wherein said second energy lower part projection angle is the data for projection under a plurality of projection angles, and the degree of correlation between the data for projection under said a plurality of projection angle is less than predetermined threshold value.
CN 201110391899 2009-05-27 2009-05-27 Dual-energy under-sampled matter identification method and system Active CN102435621B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN 201110391899 CN102435621B (en) 2009-05-27 2009-05-27 Dual-energy under-sampled matter identification method and system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN 201110391899 CN102435621B (en) 2009-05-27 2009-05-27 Dual-energy under-sampled matter identification method and system

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
CN200910085925XA Division CN101900696B (en) 2009-05-27 2009-05-27 Method for identifying material by means of dual-energy undersampling and system thereof

Publications (2)

Publication Number Publication Date
CN102435621A true CN102435621A (en) 2012-05-02
CN102435621B CN102435621B (en) 2013-09-11

Family

ID=45983788

Family Applications (1)

Application Number Title Priority Date Filing Date
CN 201110391899 Active CN102435621B (en) 2009-05-27 2009-05-27 Dual-energy under-sampled matter identification method and system

Country Status (1)

Country Link
CN (1) CN102435621B (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2014198237A1 (en) * 2013-06-14 2014-12-18 同方威视技术股份有限公司 Ct imaging method and system
WO2015010632A1 (en) * 2013-07-26 2015-01-29 清华大学 X-ray dual energy ct reconstruction method
CN106353828A (en) * 2015-07-22 2017-01-25 清华大学 Method and device for estimating weight of inspected object in security inspection system
CN107019496A (en) * 2017-04-12 2017-08-08 上海联影医疗科技有限公司 Electron density information acquisition method, device and equipment
CN116046815A (en) * 2023-02-21 2023-05-02 上海福柯斯智能科技有限公司 Dual-energy CT imaging method, device and system

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7197172B1 (en) * 2003-07-01 2007-03-27 Analogic Corporation Decomposition of multi-energy scan projections using multi-step fitting
CA2618341A1 (en) * 2005-08-09 2007-02-15 Koninklijke Philips Electronics, N.V. System and method for dual energy dynamic x-ray imaging
JP5274812B2 (en) * 2007-11-12 2013-08-28 ジーイー・メディカル・システムズ・グローバル・テクノロジー・カンパニー・エルエルシー X-ray CT apparatus and image processing apparatus

Cited By (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9702832B2 (en) 2013-06-14 2017-07-11 Nuctech Company Limited CT imaging methods and systems
CN104240270A (en) * 2013-06-14 2014-12-24 同方威视技术股份有限公司 CT imaging method and system
CN104240270B (en) * 2013-06-14 2017-12-05 同方威视技术股份有限公司 CT imaging methods and system
WO2014198237A1 (en) * 2013-06-14 2014-12-18 同方威视技术股份有限公司 Ct imaging method and system
CN104346820A (en) * 2013-07-26 2015-02-11 清华大学 X-ray dual-energy CT reconstruction method
CN104346820B (en) * 2013-07-26 2017-05-17 清华大学 X-ray dual-energy CT reconstruction method
EP2843623A3 (en) * 2013-07-26 2015-04-22 Tsinghua University X-ray dual-energy CT reconstruction method
WO2015010632A1 (en) * 2013-07-26 2015-01-29 清华大学 X-ray dual energy ct reconstruction method
CN106353828A (en) * 2015-07-22 2017-01-25 清华大学 Method and device for estimating weight of inspected object in security inspection system
CN106353828B (en) * 2015-07-22 2018-09-21 清华大学 The method and apparatus that checked property body weight is estimated in safe examination system
US10379252B2 (en) 2015-07-22 2019-08-13 Tsinghua University Methods and devices for estimating weight of an object to be inspected in an inspection system
CN107019496A (en) * 2017-04-12 2017-08-08 上海联影医疗科技有限公司 Electron density information acquisition method, device and equipment
CN116046815A (en) * 2023-02-21 2023-05-02 上海福柯斯智能科技有限公司 Dual-energy CT imaging method, device and system
CN116046815B (en) * 2023-02-21 2023-11-03 上海福柯斯智能科技有限公司 Dual-energy CT imaging method, device and system

Also Published As

Publication number Publication date
CN102435621B (en) 2013-09-11

Similar Documents

Publication Publication Date Title
CN101900696B (en) Method for identifying material by means of dual-energy undersampling and system thereof
CN101900695B (en) System for recognizing pseudo dual-energy undersampling substance and method thereof
US10539516B2 (en) X-ray inspection apparatus and X-ray inspection method
CN101900694B (en) Dual-energy under-sampling substance recognition system and method based on straight path scanning
US8306180B2 (en) Image reconstruction method for high-energy, dual-energy CT system
Fortin et al. Destructive and non-destructive density determination: method comparison and evaluation from the Laguna Potrok Aike sedimentary record
US8588494B2 (en) System and method for material decomposition optimization in image domain
CN107209944A (en) The correction of beam hardening pseudomorphism in the sample microtomography being imaged in a reservoir
JP2009536322A (en) Baggage security inspection method by spiral scan
CN102435621B (en) Dual-energy under-sampled matter identification method and system
CN102590234B (en) Dual-energy under-sampling substance identification system and method based on linear track scanning
EP2764380B1 (en) A computed tomography imaging process and system
CN201666881U (en) Pseudo dual energy under-sampling substance identification system
CN109919868A (en) A kind of detecting of cone-beam CT beam hardening curve and projection weighted correction method
US9330493B2 (en) Method for generating a 3D representation of an object
US20140169520A1 (en) Systems and methods for dual energy imaging
CN102519989B (en) Method and system for recognizing pseudo-dual-energy under-sampling substance
US8456469B2 (en) 3D reconstruction from oversampled 2D projections
US8854355B2 (en) System and method of visualizing features in an image
Sau et al. Using CAT to obtain density maps in Sherbrooke specimens of silty soils
CN116413290B (en) Industrial CT scattering correction method
Liu et al. Feasibility study: Low-cost dual energy CT for security inspection
Fortin et al. Destructive and non-destructive density determination: method comparison and evaluation from the Laguna Potrok Aike sedimentary record
Oliveira et al. Comparison among tomographic reconstruction with limited data
Bonner et al. X-ray tomography of preserved samples from the Geysers scientific corehole

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant