CN102364396A - All-optical solid stripe camera - Google Patents
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Abstract
The invention provides a full-gloss solid stripe camera, which aims to solve the technical problem that the prior art is difficult to have a large measurable dynamic range and a measurable time span at the same time. The large-dynamic-range picosecond all-optical solid fringe camera comprises an optical coupling system, an optical deflector, a pump light system and a reading system, wherein the optical deflector comprises an optical waveguide, pump light is arranged to be incident to the optical waveguide along the vertical direction, and signal light passes through the optical waveguide along the horizontal direction and then is collected and read by the reading system; the functional layer of the optical waveguide adopts an AlGaAs/GaAs/AlGaAs sandwich structure, the middle core layer is a signal light channel, and a saw-toothed pumping light mask used for enabling pumping light to form a light prism array in the core layer is arranged on the pumping light incidence end face of the cladding layer. The invention realizes the breakthrough of the prior art of the image converter tube stripe camera based on photoelectric conversion; meanwhile, important scientific basis and theoretical basis are provided for the maturity and popularization of the all-optical fringe camera technology.
Description
Technical field
The present invention relates to a kind of ultrafast diagnostic techniques equipment, be specifically related to full light solid streak camera.
Background technology
Ultrafast phenomena (duration is less than 1 μ s) appears in nature or the related science technical research widely.For example; Photoexcited state relaxation process in photosynthesis of plants process, the luminescent material, the molecular dynamics process of chemical reaction, biomaterial fluorescent emission, high light and matter interaction physical process equal time yardstick are many in psec to femtosecond magnitude, even in Ah's second-time scope
[1]Therefore ultrafast phenomena research is to the development of physicisms such as material, biology, optical physics, photochemistry, and the progress of technical fields such as laser technology, high light physics, high-energy physics all has huge impetus and important practical sense.Can imagine, on the human basis that must the while also be based upon technological sciences just and can provide corresponding laboratory facilities and technical equipment deepening continuously on the understanding aspect of the ultrafast field of transient state.Therefore we can say that the renewal progress of ultrafast diagnosis technical equipment in technological sciences field and laboratory facilities has directly caused human going deep into microworld understanding.
Based on being applied as the engineering development theory of guiding, the level degree of depth of transient state ultrafast phenomena research and emphasis are directly determining the direction of ultrafast diagnostic techniques means development.Therefore; The parameter of describing ultrafast phenomena will mean that as duration and signal intensity power scope etc. take place ultrafast diagnostic techniques means must possess corresponding performance diagnogtics parameter, but like temporal resolution, can measure dynamic range and Measuring Time span etc.In the development course of ultrafast phenomena research, require once to have occurred polytype ultrafast diagnostic techniques means and method: like streak camera technology based on the image converter tube scanning imagery to the detection study of different emphasis
[2-3], light oscillograph technology
[4], the frequency resolution optical gating (Frequency-Resolved Optical Gating, FROG)
[5]And the reconstruction of spectrum phase interference direct electric field (Spectral Phase Interferometry for Direct Electric field Reconstruction, SPIDER)
[6]Deng, these methods can reach the temporal resolution of femtosecond magnitude, but these technology but are difficult to possess the big dynamic range measured simultaneously, but Measuring Time span and high spatial resolution, therefore application is very limited; The streak camera technology possesses the characteristics that dynamic range is big, time span is big, spatial resolution is high simultaneously, in great most advanced and sophisticated front line science, is used widely.
List of references:
[1]Scrinzi?A，Ivanov?MY，Kienberger?R，et?al.Attosecond?physics.J.Phys.B：At.Mol.Opt.Phys.，2006，39：R1-R37
[2]Guidi?V，Novokhatsky?AV.A?proposal?for?a?radio-frequency-based?streak?camera?with?time?resolution?less?than?100?fs.Meas.Sci.Technol.，1995，6(11)：1555-1556
[3]Losovoi?V，Ushkov?I，Prokhorenko?E，et?al.200?femtosecond?streak?camera(development?and?dynamic?measurements).Proc?of?SPIE.2002，4948：297-301.
[4]Foster?M?A，Reza?S，Geraghty?D?F，et?al.Silicon-chip-based?single-shot?ultrafast?optical?oscilloscope.Nature，2008，456：81-84.
[5]Kane?D?J，Trebino?R.Characterization?of?Arbitrary?Femtosecond?Pul?ses?Using?Frequency-Resolved?Optical?Gating.IEEE?J.Quantum?Electron，1993，29(2)：571-579
[6]Iaconis?C，Walmsley?I?A.Spectral?phase?interferometry?for?direct?electric-field?reconstruction?of?ultrashort?optical?pulses.Opt.Lett.，1998，23(10)：792-794
Summary of the invention
The invention provides a kind of full light solid streak camera, but to solve the technical matters that prior art is difficult to possess simultaneously the big dynamic range measured and Measuring Time span and vacuum device reliability, poor stability.
Technical scheme of the present invention is following:
Full light solid streak camera; Comprise optically coupled system, light deflector, pump light system and read-out system; Wherein light deflector comprises optical waveguide, establishes pump light and vertically is incident to optical waveguide, and then the flashlight along continuous straight runs is read by the read-out system collection after through optical waveguide; The functional layer of optical waveguide adopts the sandwich construction of AlGaAs/GaAs/AlGaAs, and middle sandwich layer is the flashlight passage, and the pump light incident end face of covering is provided with to be used so that pump light forms the zigzag pump light mask of light prism array in sandwich layer.
The prism vertex angle of the light prism array of above-mentioned formation be provided with 5 °～15 ° preferable, number of prisms is 50～500.
The Al atomic percentage conc is 25%～80% in the above-mentioned covering, and the carrier concentration of covering and sandwich layer is 10 during normality
15Level; Said pump light system is a short pulse pump light system, and the pumping light wavelength is 532～850nm, and pump power 10mW～1W is adjustable, and modulating frequency 1GHz, modulation signal are sawtooth signal.Thereby (make the GaAs carrier concentration 10
16～10
18Change, change refringence)
Along the pump light incident direction, it is preferable that the thickness of three functional layers of above-mentioned optical waveguide is followed successively by 1-3 μ m, 0.6 μ m, 2-3 μ m.
Above-mentioned read-out system adopts the high speed linear array detector that matees with the spectral range of flashlight.
Above-mentioned optically coupled system comprises coupled lens that is arranged at optical waveguide signal light incident side and the condenser lens that is arranged at optical waveguide flashlight exit end; It is good that condenser lens adopts the post mirror.
The present invention is based on current research and application demand, have picosecond magnitude temporal resolution, 10 simultaneously to substitute the mechanism innovation of electron-beam deflection system, to develop through adopting beam deflection system
3-10
5The dynamic range measured of magnitude, but and the full light solid streak camera of a hundreds of picosecond magnitude Measuring Time span.This beam deflection system essence is the light prism array that is formed by carrier-induced variations in refractive index effect in the semiconductor optical waveguide sandwich layer, and this is based on the technological breakthrough of the image converter tube streak camera of opto-electronic conversion to existing.Simultaneously, the present invention also will provide important scientific basis and theoretical foundation for the maturation and the popularization of full striations camera technique.
The waveguide core layer material is to infrared transparent, thus can be to the infrared light of 900nm～25um, even the ultrafast signal of THz, can both realize deflection and analyzing and processing.New ability be can start like this and near infrared and mid and far infrared even THz wave band expanded to from present visible light with ultrafast analysis.With obtaining to the observation wave band of ultrafast phenomena broadening greatly.The greatly abundant human level of understanding to nature is estimated therefore to produce numerous original scientific payoffss.
Description of drawings
Fig. 1 is a fundamental diagram of the present invention.
Fig. 2 is the structural representation of one dimension optical waveguide of the present invention.
Fig. 3 forms the synoptic diagram of light prism array for carrier-induced variations in refractive index effect.
Fig. 4 is incident light produces light deflection in optical waveguide a schematic diagram; Wherein (a) characterized the influence of carrier concentration refractive index, (b) embodied refringence and produced light deflection.
Fig. 5 is the synoptic diagram of the photon constraint and the charge carrier constraint of optical waveguide of the present invention; Wherein (a) embodied the photon constraint, (b) embodied the charge carrier constraint.
Fig. 6 is the basic design of optical waveguide structure parameter of the present invention.
Fig. 7 is a system architecture diagram of the present invention.
Embodiment
The present invention is on the basis of traditional image converter tube streak camera based on opto-electronic conversion; Through adopting beam deflection system to substitute the mechanism innovation of electron-beam deflection system; Carry out the theory and the Study on Engineering Design of full light solid streak camera, have picosecond magnitude temporal resolution, 10 simultaneously in the hope of developing
3-10
5The dynamic range measured of magnitude, but and the full light solid streak camera of a hundreds of picosecond magnitude Measuring Time span, to satisfy the needs of correlative study to the ultrafast diagnostic techniques equipment of high combination property.
Compare the image converter tube streak camera; Thereby full striations camera of the present invention has been abandoned the bottleneck factor that light-to-current inversion is finally eliminated image converter tube streak camera temporal resolution and dynamic range performance raising aspect---intrinsic Coulomb force effect between the imaging electronics significantly improves it and can measure dynamic range to reach under the condition that suitably reduces the camera system temporal resolution.
Beam deflection system (light deflector) is the core of the full striations camera of great dynamic range, and is as shown in Figure 1, and this beam deflection system essence is the light prism array that is formed by carrier-induced variations in refractive index effect in the semiconductor optical waveguide sandwich layer.
A. semiconductor optical waveguide
This optical waveguide is the one dimension optical waveguide, and is as shown in Figure 2, and optical waveguide sandwich layer and base material are GaAs, and the optical waveguide covering is Al
xGa
1-xAs, wherein x represents the atomic percentage of Al atom.Like the change of component of Al to Al
xGa
1-xThe refractive index of As has material impact, regulates Al through the component of regulating Al
xGa
1-xThe refractive index of As forms Al
xGa
1-xAs/GaAs/Al
xGa
1-xThe As optical waveguide.The structural parameters of optical waveguide like the thickness of transverse dimension d, leaded light size 1 and each optical waveguide functional layer, can require to make corresponding optimal design according to the performance development of full striations camera system.
B. the formation of light prism array
Mask material is selected metal (comprising gold, silver, chromium, copper etc.) usually, and thickness is generally greater than 500nm.With so that the semiconductor light wave leaded light prism array of adjustable refraction takes place the flashlight light beam, as shown in Figure 3.The formation that is used for the light prism array of beam deflection is based on semiconductor carrier-induced variations in refractive index effect; Thereby the shape of zigzag pump light mask and printing opacity attribute will directly determine the prism array that finally in the optical waveguide sandwich layer, forms; Through theoretical analysis, can confirm the refractive index of light prism and the relation between the pump light.According to the change of refractive coefficient, the drift angle angle of optimal design prism and the number of prism array, these parameter determining the deflection angle of device.Take all factors into consideration, the prism vertex angle of light prism array be provided with 5 °～15 ° preferable, number of prisms is 50～500.
Free carrier concentration is to the influence of semiconductor material refractive index; Band filling effect Bandfilling (Burstein-Moss effect) is generally arranged; Band blockage effect band-gap shrinkage, three kinds of effect combined influences of free carrier absorption effect free-carrier absorption (plasma effect).Wherein have the greatest impact with band filling effect and free carrier absorption effect.Represent with formula respectively:
With GaAs is example, and carrier concentration changes to 10
18Can produce 1% variations in refractive index.The refractive index interfaces that tilts thus can be with incident light deflection.As shown in Figure 4.
Because refringence is less, institute thinks that increasing deflection angle improves resolution, and the combination that must adopt a plurality of prisms to be improving the deflection angle of light beam, and guarantees less to the influence of transmitance.
Can carry out device simulation to the optical waveguide of GaAs material, through experiment the variations in refractive index that the effects such as free carrier absorption of GaAs cause carried out quantitative test, and the parameter of main devices is carried out design optimization.
2.1 photoscanner's spectrum design
The GaAs material, very high to the infrared light transmitance, 0.9～25 micron transmitance of 7 millimeters GaAs crystal reaches more than 55%, thus can handle very wide infrared spectroscopy signals, highly beneficial for the development of infrared streak camera; And the optical pumping below the available 850nm, realize modulation to carrier concentration.And GaAs radioresistance characteristic is superior to silicon materials, is suitable for being operated under the radiation environment condition.
The GaAs carrier concentration is 10
16～10
18Change, can form-10
-2Variation.Because refringence is very little by 1%, so improve deflection angle through forming multistage prism group.
2.2 the design of optical waveguide
Adopt the AlGaAs/GaAs/AlGaAs waveguiding structure, like figure, the refractive index of AlGaAs is regulated refractive index less than GaAs through the component of regulating Al, forms optical waveguide.General Al component reaches more than 0.25, and refringence can reach 5%, can form good optical waveguide, forms the operative constraint to photon.
Simultaneously the AlGaAs energy gap can form potential well greater than GaAs through be with design, and formation is to the operative constraint of charge carrier, and the diffusion of inhibition charge carrier forms precipitous refractive index interfaces, and is as shown in Figure 5, helps improving the resolution of the deflection angle of device.
Based on the MOCVD growing technology of III-V compound semiconductor material, improve crystal and interface quality, reduce impurity and absorb.Regulate through the AlGaAs material component, optimize the refractive index parameter, form operative constraint photon; Regulate band structure, realize operative constraint, prevent the diffusion of charge carrier photo-generated carrier.Improve GaAs, the monocrystalline quality of material films such as AlGaAs improves the quantum efficiency to pump light.Design of Structural Parameters is as shown in Figure 6.
Total system comprises light deflector, pump light system, read-out system, the control and the information processing terminal.Flashlight gets into light deflector through the optical system shaping, and pump light exciting light deflector produces charge carrier and distributes; Form index distribution; Flashlight is carried out deflection, and deflection is handled by the big dynamically read-out system of optical system coupled entering, gives the back-end processing system and carries out information processing.Systematic schematic diagram is as shown in Figure 7.
According to the application need of streak camera, select high sensitivity for use, the high speed linear array detector.Can select the Si:1.064 μ m like InGaAs (1.1～1.6 μ m), MCT detectors such as (3～14 μ m) according to the spectral range of flashlight.Select 128 * 1,256 * 1,512 * 1 according to resolution requirement; Linear array.The sensing circuit of linear array detector has great dynamic range.Gained 1500: 1.And according to the optical coupling system of parameter detector design, to guarantee the resolution of streak camera based on the post mirror.
Select the interior interior 532～850nm of GaAs absorption peak of absorption spectrum of optical waveguide material for use.Pump power 10mW～1W is adjustable.Modulating frequency 1GHz, the sawtooth signal of modulation signal for optimizing, the linear modulation of formation pump light.For guaranteeing to form uniform light spots, light field is carried out optical shaping through the optimal design optical system.Optimize the parameters such as the linearity of modulation.
Claims (7)
1. full light solid streak camera; It is characterized in that: comprise optically coupled system, light deflector, pump light system and read-out system; Wherein light deflector comprises optical waveguide; If pump light vertically is incident to optical waveguide, then the flashlight along continuous straight runs is read by the read-out system collection after through optical waveguide; The functional layer of optical waveguide adopts the sandwich construction of AlGaAs/GaAs/AlGaAs, and middle sandwich layer is the flashlight passage, and the pump light incident end face of covering is provided with to be used so that pump light forms the zigzag pump light mask of light prism array in sandwich layer.
2. full light solid streak camera according to claim 1 is characterized in that: the prism vertex angle of the light prism array of formation is 5 °～15 °, and number of prisms is 50～500.
3. full light solid streak camera according to claim 1, it is characterized in that: the Al atomic percentage conc is 25%～80% in the covering, the carrier concentration of covering and sandwich layer is the 1015cm-3 level during normality; Said pump light system is a short pulse pump light system, and the pumping light wavelength is 532～850nm, and pump power 10mW～1W is adjustable, and modulating frequency 1GHz, modulation signal are sawtooth signal.
4. full light solid streak camera according to claim 1 is characterized in that: along the pump light incident direction, the thickness of three functional layers of optical waveguide is followed successively by 1-3 μ m, 0.6-1 μ m, 2-3 μ m.
5. full light solid streak camera according to claim 1 is characterized in that: said read-out system adopts the high speed linear array detector that matees with the spectral range of flashlight.
6. full light solid streak camera according to claim 1 is characterized in that: said optically coupled system comprises coupled lens that is arranged at optical waveguide signal light incident side and the condenser lens that is arranged at optical waveguide flashlight exit end.
7. full light solid streak camera according to claim 6 is characterized in that: said condenser lens adopts the post mirror.
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN103196570A (en) * | 2013-03-27 | 2013-07-10 | 中国科学院上海光学精密机械研究所 | Measuring device of ultrafast optical pulse time wave form |
| CN103837241A (en) * | 2014-03-26 | 2014-06-04 | 中国工程物理研究院激光聚变研究中心 | Laser pulse waveform meter |
| CN104280140A (en) * | 2014-10-09 | 2015-01-14 | 中国科学院上海光学精密机械研究所 | Measurement device for time waveform and signal to noise ratio of single ultrafast pulse |
| CN108254349A (en) * | 2018-02-02 | 2018-07-06 | 中国科学院西安光学精密机械研究所 | Image enhanced all-optical solid ultrafast imaging detector |
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Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103196570A (en) * | 2013-03-27 | 2013-07-10 | 中国科学院上海光学精密机械研究所 | Measuring device of ultrafast optical pulse time wave form |
| CN103196570B (en) * | 2013-03-27 | 2015-05-13 | 中国科学院上海光学精密机械研究所 | Measuring device of ultrafast optical pulse time wave form |
| CN103837241A (en) * | 2014-03-26 | 2014-06-04 | 中国工程物理研究院激光聚变研究中心 | Laser pulse waveform meter |
| CN104280140A (en) * | 2014-10-09 | 2015-01-14 | 中国科学院上海光学精密机械研究所 | Measurement device for time waveform and signal to noise ratio of single ultrafast pulse |
| CN108254349A (en) * | 2018-02-02 | 2018-07-06 | 中国科学院西安光学精密机械研究所 | Image enhanced all-optical solid ultrafast imaging detector |
| CN108254349B (en) * | 2018-02-02 | 2024-04-05 | 中国科学院西安光学精密机械研究所 | Image enhancement type all-optical solid ultrafast imaging detector |
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