CN102353467A - System and method for verifying detection accuracy of internal core temperature of chip - Google Patents
System and method for verifying detection accuracy of internal core temperature of chip Download PDFInfo
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- CN102353467A CN102353467A CN2011101538785A CN201110153878A CN102353467A CN 102353467 A CN102353467 A CN 102353467A CN 2011101538785 A CN2011101538785 A CN 2011101538785A CN 201110153878 A CN201110153878 A CN 201110153878A CN 102353467 A CN102353467 A CN 102353467A
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- 238000012360 testing method Methods 0.000 claims description 79
- 238000012795 verification Methods 0.000 claims description 21
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Abstract
The invention relates to a data communication equipment technology, which solves the problem of larger deviations between the internal core temperature which is calculated by a method for verifying the detection accuracy of the internal core temperature of the conventional chip and an actual temperature, and provides a system and a method for verifying the detection accuracy of the internal core temperature of a chip. According to the technical scheme, the system for verifying the detection accuracy of the internal core temperature of the chip consists of a measured chip, an I2C bus, an analog-to-digital converter and a data acquisition device, wherein a PN node inside the measured chip is connected with the analog-to-digital converter; and the data acquisition device is connected with the analog-to-digital converter through the I2C bus and a power wire. The invention has the advantages that: the accuracy is improved, and the system and the method are suitable for verifying the detection accuracy of the internal core temperature of the chip of data communication equipment.
Description
Technical field
The present invention relates to the data communications equipment technology, particularly the verification technique of data communications equipment chip core temperature detection accuracy.
Background technology
The inner important chip of at present a lot of communication facilitiess (comprising computing machine); As: processor chips, exchanges data chip etc. all have the kernel temperature detecting function; In the Products Development process, need the interior nuclear temperature of these important chip that test subscriber's operation interface shows whether accurate.If extraneous factor or chip cause chip temperature to raise unusually in addition, we need set a temperature protection value so, and when temperature is higher than the power supply that certain a bit just breaks off chip, prerequisite is exactly that the temperature value of this test must be accurately.The acquisition scheme of existing chip core temperature; The general temperature measuring device that adopts can only the test chip surface temperature; Can not test interior nuclear temperature, need be through the surface temperature of test chip, and then calculate the chip core temperature according to the heating power of chip and the thermal resistance of chip.Therefore, the deviation of the interior nuclear temperature of reckoning and actual temperature is bigger.
Summary of the invention
The object of the invention is exactly to overcome the interior nuclear temperature that the verification method of current chip kernel temperature detection accuracy extrapolates and the bigger shortcoming of deviation of actual temperature, and the verification system and the method for a kind of chip core temperature detection accuracy is provided.
The present invention solves its technical matters; The technical scheme that adopts is; The verification system of chip core temperature detection accuracy; Comprise chip under test, A/D converter and data acquisition unit; The inner PN junction of said chip under test (position of diode P type and n type material combination) is connected with A/D converter, and said data acquisition unit is connected with A/D converter through I 2C bus;
The temperature data that said data acquisition unit is used for reading A/D converter output through the I2C bus to be offering the tester, and is used for supplying power to A/D converter;
The inside PN junction that said A/D converter is used to chip under test provides current source, after detecting the inner PN junction electric current transmitted of chip under test, converts digital signal into and is transferred to data acquisition unit.
Concrete, said data acquisition unit is a single-chip microcomputer, and the temperature data that collects is shown through the digital display tube of LED.
Further, said chip under test is processor chips or exchanges data chip.
The verification method of chip core temperature detection accuracy is characterized in that, may further comprise the steps:
A. chip under test does not power on, and is the inner PN junction power supply of chip under test by A/D converter;
B. the size of current of the inner PN junction of chip under test is followed the inner PN junction temperature variation of chip under test;
C. A/D converter converts digital signal into after with the inner PN junction electric current of detected chip under test;
D, chip under test is placed the temperature test chamber of controlled temperature, the serviceability temperature tester is confirmed the chip under test surface temperature, and data acquisition unit reads the temperature data of A/D converter transmission simultaneously;
E. the chip under test surface temperature contrast of temperature data that data recorded collector under the same temperature in the temperature test chamber is read and temperature measuring device affirmation obtains accuracy.
Concrete, said steps d may further comprise the steps:
D1. chip under test is placed the temperature test chamber of controlled temperature; Change the temperature value of temperature test chamber successively; Temperature changes equal serviceability temperature tester each time and confirms the chip under test surface temperature, and data acquisition unit reads the temperature data of A/D converter transmission simultaneously.
Further, said temperature value range of choice is 0～125 ℃.
Concrete, said temperature value is chosen as 0 ℃, 10 ℃, 20 ℃, 30 ℃, 40 ℃, 50 ℃, 60 ℃, 70 ℃, 80 ℃, 90 ℃, 100 ℃, 110 ℃, 120 ℃, 125 ℃.
The invention has the beneficial effects as follows; Verification system and method by the degree of accuracy of said chip kernel temperature detection; Because it adopts data acquisition unit is the A/D converter power supply; And the inner PN junction of chip under test is supplied power by A/D converter; Chip under test then need not power on; Chip under test does not power on, and then it does not generate heat; For athermic object under the temperature-resistant situation of temperature balance environment; Interior of articles is consistent with external temperature; Therefore nuclear temperature is identical with surface temperature in the chip under test; This moment, the serviceability temperature tester can obtain the interior nuclear temperature of chip under test accurately, had avoided the bigger problem of calculating of kernel temperature deviation, had improved accuracy.
Description of drawings
Fig. 1 is the verification system example structure block diagram of chip core temperature detection of the present invention accuracy.
Embodiment
Below in conjunction with embodiment and accompanying drawing, describe technical scheme of the present invention in detail.
The structured flowchart of the verification system embodiment of chip core temperature detection of the present invention accuracy is referring to Fig. 1.The verification system of the chip core temperature detection degree of accuracy of the embodiment of the invention is connected with A/D converter by the inner PN junction of chip under test; Data acquisition unit is connected with A/D converter by the I2C bus; Data acquisition unit connects to form by power line and A/D converter; Wherein, Data acquisition unit is used for reading by the I2C bus temperature data of A/D converter output; And supply power to A/D converter by power line; A/D converter is used to detect and is converted to digital data transmission after the inner PN junction electric current transmitted and gives data acquisition unit, and current source is provided for the inside PN junction of chip under test.In the verification method of the chip core temperature detection of the present invention degree of accuracy; At first chip under test does not power on; Is the A/D converter power supply by data acquisition unit by power line; Be that the inner PN junction of chip under test provides current source by A/D converter again; Size of current is followed the inner PN junction variations in temperature of chip under test; Then chip under test is placed the temperature test chamber of controlled temperature; The serviceability temperature tester is confirmed the chip under test surface temperature; Data acquisition unit reads the temperature data of A/D converter transmission simultaneously; The chip under test surface temperature contrast of temperature data that data recorded collector under the same temperature in the temperature test chamber is read and temperature measuring device affirmation at last obtains the degree of accuracy.
Embodiment
The verification system structured flowchart of the chip core temperature detection accuracy of present embodiment is referring to Fig. 1.The verification system of the chip core temperature detection degree of accuracy of present embodiment is by being connected with A/D converter by the inner PN junction of chip under test; Data acquisition unit is connected with A/D converter by the I2C bus; Data acquisition unit connects to form by power line and A/D converter; Wherein, A/D converter is converted to digital data transmission to data acquisition unit after being used to detect inner PN junction electric current transmitted; And be the inside PN junction power supply of chip under test; Data acquisition unit is used for reading by the I2C bus temperature data of A/D converter output; And supply power to A/D converter by power line; Data acquisition unit is made of single-chip microcomputer; And provide test data is shown by the digital display tube of LED; Make things convenient for the tester directly to observe and read data, the chip under test here can have the chip of kernel temperature detection for processor chips or exchanges data chip etc.
During test; At first chip under test does not power on; Is the A/D converter power supply by data acquisition unit by power line; Be that the inner PN junction of chip under test provides current source by A/D converter again; Size of current is followed the inner PN junction variations in temperature of chip under test; Then chip under test is placed the temperature test chamber of controlled temperature; Change the temperature value of temperature test chamber successively; Temperature changes equal serviceability temperature tester each time and confirms the chip under test surface temperature; Data acquisition unit reads the temperature data of A/D converter transmission simultaneously; The chip under test surface temperature contrast of temperature data that data recorded collector under the same temperature in the temperature test chamber is read and temperature measuring device affirmation at last obtains the degree of accuracy.
Because commercial with normally 0～70 ℃ of chip application environment temperature, normally 125 ℃ of the high workload junction temperatures of chip, storing temperature is the highest can to arrive 150 ℃, so can draw common chip normal working temperature at 0～125 ℃ by top temperature requirement.And because the wider range of temperature sensing circuit test; Need carry out accuracy validation to whole range sampling temperature spot; Promptly be to verify 0～125 ℃ of scope; Therefore the temperature value range of choice in the temperature test chamber is roughly 0～125 ℃; With 10 ℃ is that to carry out sample testing be example to the stepping gradient; Promptly be that the temperature value in the temperature test chamber is chosen as 0 ℃ successively; 10 ℃; 20 ℃; 30 ℃; 40 ℃; 50 ℃; 60 ℃; 70 ℃; 80 ℃; 90 ℃; 100 ℃; 110 ℃; 120 ℃; 125 ℃; The serviceability temperature tester is confirmed the chip under test surface temperature respectively; Utilize data acquisition unit to read the temperature data of A/D converter transmission simultaneously; And compare, obtain accuracy.And need confirm during test that all devices of device interior to be tested can both bear the temperature in the selected temperature value scope, otherwise carry out handled (for example: the plastics connector can't bear high temperature, before the test it is taken off).
Claims (8)
1. the verification system of chip core temperature detection accuracy; It is characterized in that; Comprise chip under test, I2C bus and A/D converter and data acquisition unit, the inner PN junction of said chip under test is connected with A/D converter, and said data acquisition unit is connected with A/D converter through the I2C bus;
The temperature data that said data acquisition unit is used for reading A/D converter output through the I2C bus to be offering the tester, and is used for supplying power to A/D converter;
The inside PN junction that said A/D converter is used to chip under test provides current source, after detecting the inside PN junction electric current transmitted of chip under test, converts digital signal into and is transferred to data acquisition unit.
2. the verification system of chip core temperature detection accuracy according to claim 1 is characterized in that said data acquisition unit is a single-chip microcomputer, and the temperature data that collects is shown through the digital display tube of LED.
3. the verification system of chip core temperature detection accuracy as claimed in claim 1 or 2 is characterized in that said chip under test is processor chips or exchanges data chip.
4. the verification method of chip core temperature detection accuracy is characterized in that, may further comprise the steps:
A. chip under test does not power on, and is the inner PN junction power supply of chip under test by A/D converter;
B. the size of current of the inner PN junction of chip under test is followed the inner PN junction temperature variation of chip under test;
C. A/D converter converts digital signal into after with the inner PN junction electric current of detected chip under test;
D. chip under test is placed the temperature test chamber of controlled temperature, the serviceability temperature tester is confirmed the chip under test surface temperature, and data acquisition unit reads the temperature data of A/D converter transmission simultaneously;
E. the chip under test surface temperature contrast of temperature data that data recorded collector under the same temperature in the temperature test chamber is read and temperature measuring device affirmation obtains accuracy.
5. like the verification method of chip core temperature detection accuracy as described in the claim 4, it is characterized in that said steps d may further comprise the steps:
D1. chip under test is placed the temperature test chamber of controlled temperature; Change the temperature value of temperature test chamber successively; Temperature changes equal serviceability temperature tester each time and confirms the chip under test surface temperature, and data acquisition unit reads the temperature data of A/D converter transmission simultaneously.
6. like the verification method of chip core temperature detection accuracy as described in claim 4 or 5, it is characterized in that data acquisition unit reads the temperature data of A/D converter transmission, and show, check for the tester through pilot lamp.
7. like the verification method of chip core temperature detection accuracy as described in the claim 5, it is characterized in that said temperature value range of choice is 0～125 ℃.
8. like the verification method of chip core temperature detection accuracy as described in the claim 5; It is characterized in that said temperature value is chosen as 0 ℃, 10 ℃, 20 ℃, 30 ℃, 40 ℃, 50 ℃, 60 ℃, 70 ℃, 80 ℃, 90 ℃, 100 ℃, 110 ℃, 120 ℃, 125 ℃.
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| CN201110153878.5A CN102353467B (en) | 2011-06-09 | 2011-06-09 | System and method for verifying detection accuracy of internal core temperature of chip |
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| CN201110153878.5A CN102353467B (en) | 2011-06-09 | 2011-06-09 | System and method for verifying detection accuracy of internal core temperature of chip |
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| CN102353467B CN102353467B (en) | 2014-02-19 |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108461486A (en) * | 2017-12-14 | 2018-08-28 | 天津津航计算技术研究所 | A kind of SiP chips with temperature control function |
| CN112485645A (en) * | 2020-11-30 | 2021-03-12 | 海光信息技术股份有限公司 | Chip test temperature control method, control system, temperature control board card and test system |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN85200004U (en) * | 1985-04-01 | 1985-11-10 | 天津大学 | Digital thermometer sensor with p-n junction |
| US20040071183A1 (en) * | 2002-10-09 | 2004-04-15 | Davide Tesi | Integrated digital temperature sensor |
| CN1704737A (en) * | 2004-05-26 | 2005-12-07 | 鸿富锦精密工业（深圳）有限公司 | Chip temperature measurement device and method |
| CN2869815Y (en) * | 2005-09-20 | 2007-02-14 | 深圳兆日技术有限公司 | Circuit for detecting chip temperature in safety chip |
| CN102082107A (en) * | 2009-12-01 | 2011-06-01 | 中芯国际集成电路制造(上海)有限公司 | Method and device for measuring temperature of chip |
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2011
- 2011-06-09 CN CN201110153878.5A patent/CN102353467B/en not_active Expired - Fee Related
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN85200004U (en) * | 1985-04-01 | 1985-11-10 | 天津大学 | Digital thermometer sensor with p-n junction |
| US20040071183A1 (en) * | 2002-10-09 | 2004-04-15 | Davide Tesi | Integrated digital temperature sensor |
| CN1704737A (en) * | 2004-05-26 | 2005-12-07 | 鸿富锦精密工业（深圳）有限公司 | Chip temperature measurement device and method |
| CN2869815Y (en) * | 2005-09-20 | 2007-02-14 | 深圳兆日技术有限公司 | Circuit for detecting chip temperature in safety chip |
| CN102082107A (en) * | 2009-12-01 | 2011-06-01 | 中芯国际集成电路制造(上海)有限公司 | Method and device for measuring temperature of chip |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108461486A (en) * | 2017-12-14 | 2018-08-28 | 天津津航计算技术研究所 | A kind of SiP chips with temperature control function |
| CN108461486B (en) * | 2017-12-14 | 2020-02-21 | 天津津航计算技术研究所 | SiP chip with temperature control function |
| CN112485645A (en) * | 2020-11-30 | 2021-03-12 | 海光信息技术股份有限公司 | Chip test temperature control method, control system, temperature control board card and test system |
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| CN102353467B (en) | 2014-02-19 |
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