Background technology
Fig. 1 illustrates the block schematic diagram of the test adaptor element of known technology.Because the connection specification of the PCI-E slot 800 of present server is direct as yet and the high-order PCI-E adapter 700 (for example the drawing adapter or the video graphics adapter card of high-order) of support action PCI Express module (Mobile PCIExpress Module MXM).Therefore high-order PCI-E adapter 700 need be plugged on the switching element 200, the PCI-E slot 800 of switching element 200 Connection Service devices thus again is as the bridge of high-order PCI-E adapter 700 with the server exchange signal.
Before the server shipment that is equipped with this kind high-order PCI-E adapter 700, all must guarantee the quality of switching element 200, avoid improving follow-up maintenance cost and after service cost.The products in kind that the test mode of present this kind switching element 200 is still a high-order PCI-E adapter 700 is mounted to a switching element 200 to be measured, switching element 200 to be measured is plugged in the PCI-E slot 800 of a testing server again.Wait to make that testing server could carry out the test of power supply and signal to switching element 200 to be measured after the testing server start, can learn just whether this switching element to be measured 200 is qualified.
Yet, when utilizing testing server to come that switching element carried out functional test, there is following shortcoming:
1, the collocation testing server exists a large amount of man-machine interaction test jobs when switching element is carried out functional test, and not only efficient is low, also the artificial error of judging of Chang Yinwei and cause test crash.
When 2, the collocation testing server carries out functional test to switching element, because each test all must be reinstalled high-order PCI-E adapter, switching element and PCI-E slot to be measured suitable labor intensive and time.
When 3, the collocation testing server carries out functional test to switching element, cooperate the startup of server, need a fixing on time, and then elongate the integrated testability time of switching element, and then influence production cost and product quality.
When 4, the products in kind of collocation high-order PCI-E adapter is carried out functional test to switching element, because high-order PCI-E adapter is powerful, therefore prices are rather stiff on market at present, therefore, when if above-mentioned switching element is defective products, tend to injure high-order PCI-E adapter or server, cause the loss of great value.
So, how developing a solution, can overcome above-mentioned all inconvenience and shortcoming, is a relevant dealer instant important topic at present in fact.
Summary of the invention
In view of this, the objective of the invention is to disclose a kind of test module of switching element.This kind test module comprises switching element, an artificial card and a debug plate to be measured.This switching element is suitable for transferring a high-order PCI-E adapter (Peripheral Component Interconnect Express) to the PCI-E connection slot of a server.Artificial card is inserted on the switching element versatilely, electrically connects switching element.The debug plate electrically connects switching element and artificial card respectively, and and switching element and artificial card between form a loop.Whether the debug plate is by being transmitted to the test signal in the loop, unusual to judge switching element.
In one embodiment of the invention, artificial card has a plurality of printed wires, and these a little printed wires are same as the circuit of this high-order PCI-E adapter.
Whether unusual in one embodiment of the invention, this test module also comprises a test computer, and test computer electrically connects the debug plate, test in order to indication debug plate, and accept the debug plate and pass switching element judged result back.
In one embodiment of the invention, this test module also comprises a power supply, and power supply electrically connects switching element, in order to provide switching element required working power.
In one embodiment of the invention, the debug plate has a microprocessing unit, microprocessing unit has one first universal input/output interface, in order to export a test signal to this switching element, one second universal input/output interface, in order to be received from a return path signal, the internal integrated circuit interface that this artificial card returns, can make carbon copies the information and an emulation output/input interface of ROM (read-only memory) in order to an electronics formula of erasing that reads this switching element, in order to read a power supply running status of this switching element.
In one embodiment of the invention, the debug plate has the connecting portion of one accord with PCI-E specification, and connecting portion is connected to switching element.
In sum, test module of the present invention sees through above-mentioned various information transmission interfaces can learn whether switching element is unusual, makes the switching element server of need not arranging in pairs or groups to test.So, the present invention has the following advantages:
1, simplified the man-machine interaction test job, and then raised the efficiency, also reduced the artificial error of judging and cause the probability of test crash.
2, shorten the integrated testability time that switching element is tested, and then improved production cost and product quality.
3, saved and obtain the required hardware acquisition cost of testing server and avoid injuring the entity products of high-order PCI-E adapter or the risk of server.
Description of drawings
For above and other objects of the present invention, feature, advantage and embodiment can be become apparent, being described in detail as follows of appended accompanying drawing:
Fig. 1 illustrates the block schematic diagram of known technology with the server test switching element;
Fig. 2 illustrates the block schematic diagram of the test module of switching element of the present invention;
Fig. 3 illustrates the block schematic diagram of test module under an embodiment of switching element of the present invention;
Fig. 4 illustrates the process flow diagram of method under this embodiment of test adaptor element of the present invention.
[main element symbol description]
100: 430: the seven connecting portions of test module
200: switching element 440: microprocessing unit
Connecting portion 441 in 210: the first: the content measurement firmware
450: the first universal input/output interfaces of 220: the second connecting portions
230: the electronics formula of erasing can be made carbon copies 460: the second universal input/output interfaces of ROM (read-only memory)
300: artificial card 470: the internal integrated circuit interface
310: printed wire 480: the emulation output/input interface
Connecting portion 500 in 320: the three: test computer
510: the eight connecting portions of 330: the four connecting portions
400: debug plate 600: power supply
Connecting portion 700 in 410: the five: high-order PCI-E adapter
Connecting portion 800 in 420: the six: server PCI-E connects slot
401-406: step
Embodiment
Below will clearly demonstrate spirit of the present invention with accompanying drawing and detailed description, as the person skilled in the art after understanding embodiments of the invention, when can be by the technology of teachings of the present invention, change and modification, it does not break away from spirit of the present invention and scope.
Please refer to shown in Figure 2ly, Fig. 2 illustrates the block schematic diagram of the test module of switching element of the present invention.The present invention is the test module that discloses a kind of switching element, and test module 100 comprises switching element 200, an artificial card 300 and a debug plate 400 to be measured at least.Artificial card 300 electrically connects switching element 200.Debug plate 400 electrically connects switching element 200 and artificial card 300 respectively, and and this switching element to be measured 200 and this artificial card 300 between form a loop.So, owing to form a unidirectional circuit between debug plate 400, switching element 200 and the artificial card 300, when debug plate 400 is exported a test signal to switching element 200, whether debug plate 400 can return debug plate 400 through artificial card 300 by this test signal, perhaps whether change, judge whether this switching element 200 takes place unusually by the test signal of getting back to behind the debug plate 400.
Please refer to shown in Figure 3ly, Fig. 3 illustrates the block schematic diagram of test module under an embodiment of switching element of the present invention.
In one embodiment of the invention, this switching element 200 is in when work, is that the high-order PCI-E adapter 700 (for example the drawing adapter or the video graphics adapter card of high-order) that is used for transferring connects on the slot 800 (as Fig. 1) to a PCI-E of a server.This switching element 200 have one first connecting portion 210, one second connecting portion 220 and an electronics formula of erasing can make carbon copies ROM (read-only memory) 230 (Electrically-ErasableProgrammable Read-Only Memory, EEPROM).
Artificial card 300 is inserted on the switching element to be measured 200 versatilely, electrically connect this switching element 200, and artificial card 300 is not an above-mentioned high-order PCI-E adapter 700, but dispose the identical printed wire 310 of high-order PCI-E adapter therewith 700 from the teeth outwards, in order to represent the entity products of this high-order PCI-E adapter 700.
Artificial card 300 has one the 3rd connecting portion 320 and one the 4th connecting portion 330 in addition.The 3rd connecting portion 320 is complementary with first connecting portion 210 of switching element 200, in order to be inserted on first connecting portion 210.The 3rd connecting portion 320 and the 4th connecting portion 330 electrically communicate each other by printed wire 310.Debug plate 400 also has one the 5th connecting portion 410 (for example PCI-E specification), one the 6th connecting portion 420 and one the 7th connecting portion 430 (for example RS232 specification).The 5th connecting portion 410 is complementary with second connecting portion 220 of switching element 200, in order to electrical connection debug plate 400 and switching element 200.The 6th connecting portion 420 electrically connects the 4th connecting portion 330 of artificial card 300, in order to electrical connection debug plate 400 and artificial card 300.
Among this embodiment, test module 100 also comprises a test computer 500.Test computer 500 electrically connects debug plate 400.Test computer 500 indication debug plates 400 are tested, and accept debug plate 400 test result that whether unusual this switching element 200 is.Particularly, test computer 500 has one the 8th connecting portion 510 (for example RS232 specification).The 7th connecting portion 430 and the 8th connecting portion 510 are complementary, in order to electrically connect debug plate 400 and test computer 500.Among this embodiment, test module 100 also comprises a power supply 600.Power supply 600 provides switching element 200 required working power.
Particularly, debug plate 400 has a microprocessing unit 440.Microprocessing unit 440 has multiple information transmission interface, comprise one first universal input/output interface 450 (General PurposeInput/Output, GPIO output port), one second universal input/output interface 460 (General PurposeInput/Output, GPIO input port), a plurality of internal integrated circuit interface 470 (Inter-IntegratedCircuit System, I2C) and a plurality of emulation output/input interface 480 (analog input/output).
In addition, has a content measurement firmware 441 in the microprocessing unit 440.Because microprocessing unit 440 is not limit to possess and can be override characteristic and maybe can not override characteristic, this content measurement firmware 441 can be in advance by programming in microprocessing unit 440, or computing machine 500 is updated in the microprocessing unit 440 after tested.
When 440 pairs of switching elements 200 of microprocessing unit are tested, microprocessing unit 440 is according to the indication of this content measurement firmware 441, (1) exports the test signal of one accord with PCI-E specifications to switching element 200 by first universal input/output interface 450 through the 5th connecting portion 410 respectively, (2) read power supply (P12V/P3V3_STBY/P1.8V) running status of switching element 200 through the 5th connecting portion 410 by emulation output/input interface 480, (3) see through signal (SMB_DTA by internal integrated circuit interface 470 through the 5th connecting portion 410, SMB_CLK) read the information that the electronics formula of erasing can be made carbon copies ROM (read-only memory) 230, and (4) are received from a return path signal of artificial card 300 passbacks through the 6th connecting portion 420 by second universal input/output interface 460.
So, the information of power supply (P12V/P3V3_STBY/P1.8V) running status that microprocessing unit 440 just can be by (1) switching element 200, the EEPROM of (2) switching element 200 and (3) from the return path signal of artificial card 300 passbacks compare and judge this switching element 200 whether normally transmission signals between a high-order PCI-E adapter and a server, normally to have played the part of this high-order PCI-E adapter communication bridge between the server therewith.Afterwards, microprocessing unit 440 just can be by the 8th connecting portion 510 feedbacks one test result to test computer 500.
So, test module 100 of the present invention can replace above-mentioned server, sees through above-mentioned various information transmission interfaces and can learn whether switching element 200 is unusual, makes switching element 200 server of need not arranging in pairs or groups to test.
See also shown in Figure 4ly, Fig. 4 illustrates the process flow diagram of method under this embodiment of test adaptor element of the present invention.After artificial card 300, switching element 200 and debug plate 400 were installed in regular turn and electrically connected into a loop mutually, the step that test computer 500 indication microprocessing units 440 are tested was as follows:
Step (401) microprocessing unit 440 output one test signal is to switching element 200:
In this step, microprocessing unit 440 is exported the test signal of one accord with PCI-E forms to switching element 200 by first universal input/output interface 450.For example, the test signal of microprocessing unit 440 outputs one noble potential is to switching element 200.
Step (402) judges whether to be received from a return path signal of artificial card 300 passbacks:
In this step, microprocessing unit 440 needs to judge whether to receive a return path signal from artificial card 300 by second universal input/output interface 460, if, then carry out step (403), otherwise, because on behalf of switching element 200 or artificial card 300, microprocessing unit 440 can't produce unusual by receiving a return path signal from artificial card 300.Yet the probability unusual owing to artificial card 300 generations is quite low, and therefore, but inference switching element 200 is defective, carries out step (406).
Step (403) judges whether return path signal is same as the test signal that microprocessing unit 440 is exported:
The same example when this return path signal also is the test signal of a noble potential, but then represents switching element 200 normal transmission signals between artificial card 300 and debug plate 400, then carries out step (404).Otherwise, then carry out step (406).
The power supply running status of step (404) test adaptor element 200:
In this step, microprocessing unit 440 reads power supply (P12V/P3V3_STBY/P1.8V) running status of switching element 200 by emulation output/input interface 480, and whether normal, carry out step (405) if measuring the power supply running status of switching element 200.
Whether the information that step (405) the test electronics formula of erasing can be made carbon copies ROM (read-only memory) 230 is normal:
In this step, microprocessing unit 440 sees through signal (SMB_DTA by internal integrated circuit interface 470, SMB_CLK) read the information that the electronics formula of erasing can be made carbon copies ROM (read-only memory) 230, and whether the power supply running status of measurement switching element 200 is normal, carries out step (406).
Step (406) transmission one test result is to test computer 500:
In this step, microprocessing unit 440 just can be with the test result biography test computer 500 of step (402) to step (405), for user's interpretation.
In sum, the present invention need not use server that switching element is tested, and sees through test module of the present invention and can learn whether switching element produces unusually, and so, the present invention has the following advantages:
1, simplified the man-machine interaction test job, and then raised the efficiency, also reduced the artificial error of judging and cause the probability of test crash.
2, shorten the integrated testability time that switching element is tested, and then improved production cost and product quality.
3, saved the risk that obtains the required hardware acquisition cost of testing server and avoid injuring high-order PCI-E adapter entity products or server.
The present invention discloses among as above each embodiment; be not in order to qualification the present invention, any person skilled in the art, without departing from the spirit and scope of the present invention; when can being used for a variety of modifications and variations, so protection scope of the present invention is as the criterion when looking the scope that claims define.