CN102130744B - 计算循环冗余校验码的方法和装置 - Google Patents
计算循环冗余校验码的方法和装置 Download PDFInfo
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CN102130744B true CN102130744B (zh) | 2014-12-31 |
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CN103701566B (zh) * | 2013-12-18 | 2017-09-12 | 华为技术有限公司 | 一种校验方法和装置 |
CN105049057B (zh) * | 2015-08-17 | 2018-04-20 | 中国航天科技集团公司第九研究院第七七一研究所 | 一种面向128位并行输入的crc‑32校验电路 |
CN109462458B (zh) * | 2019-01-11 | 2021-04-16 | 深圳市常茂信科技开发有限公司 | 一种多级流水电路实现并行crc的方法 |
CN112306741B (zh) * | 2020-11-19 | 2022-12-23 | 山东云海国创云计算装备产业创新中心有限公司 | 一种crc校验方法及相关装置 |
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CN101702639A (zh) * | 2009-11-23 | 2010-05-05 | 成都市华为赛门铁克科技有限公司 | 循环冗余校验的校验值计算方法及装置 |
CN101803265A (zh) * | 2007-09-18 | 2010-08-11 | 三星电子株式会社 | 产生多个循环冗余校验的方法和设备 |
CN101847999A (zh) * | 2010-05-28 | 2010-09-29 | 清华大学 | 一种用循环冗余校验码进行并行校验的方法 |
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US20050257117A1 (en) * | 2004-05-12 | 2005-11-17 | Weirong Chiang | Method and circuit for determining an ending of an ethernet frame |
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Publication number | Priority date | Publication date | Assignee | Title |
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CN101803265A (zh) * | 2007-09-18 | 2010-08-11 | 三星电子株式会社 | 产生多个循环冗余校验的方法和设备 |
CN101702639A (zh) * | 2009-11-23 | 2010-05-05 | 成都市华为赛门铁克科技有限公司 | 循环冗余校验的校验值计算方法及装置 |
CN101847999A (zh) * | 2010-05-28 | 2010-09-29 | 清华大学 | 一种用循环冗余校验码进行并行校验的方法 |
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Inventor after: Jiang Aipeng Inventor after: Miao Zhonglin Inventor after: Yuan Chun Inventor after: Tong Xiaojiu Inventor before: Jiang Aipeng Inventor before: Miao Zhonglin Inventor before: Yuan Chun |
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Free format text: CORRECT: INVENTOR; FROM: JIANG AIPENG MIU ZHONGLIN YUAN CHUN TO: JIANG AIPENG MIU ZHONGLIN YUAN CHUN TONG XIAOJIU |
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Effective date of registration: 20151125 Address after: 518057 Nanshan District Guangdong high tech Industrial Park, South Road, science and technology, ZTE building, Ministry of Justice Patentee after: ZTE Corp. Patentee after: SANECHIPS TECHNOLOGY Co.,Ltd. Address before: 518057 Nanshan District Guangdong high tech Industrial Park, South Road, science and technology, ZTE building, Ministry of Justice Patentee before: ZTE Corp. |
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Effective date of registration: 20221201 Address after: 518055 Zhongxing Industrial Park, Liuxian Avenue, Xili street, Nanshan District, Shenzhen City, Guangdong Province Patentee after: SANECHIPS TECHNOLOGY Co.,Ltd. Address before: 518057 Ministry of justice, Zhongxing building, South Science and technology road, Nanshan District hi tech Industrial Park, Shenzhen, Guangdong Patentee before: ZTE Corp. Patentee before: SANECHIPS TECHNOLOGY Co.,Ltd. |