CN102047770A - 电子装置和用于检验电路板的方法 - Google Patents
电子装置和用于检验电路板的方法 Download PDFInfo
- Publication number
- CN102047770A CN102047770A CN200980119797.4A CN200980119797A CN102047770A CN 102047770 A CN102047770 A CN 102047770A CN 200980119797 A CN200980119797 A CN 200980119797A CN 102047770 A CN102047770 A CN 102047770A
- Authority
- CN
- China
- Prior art keywords
- circuit board
- com
- circuit
- under
- signal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
- G01R31/2815—Functional tests, e.g. boundary scans, using the normal I/O contacts
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F21/00—Security arrangements for protecting computers, components thereof, programs or data against unauthorised activity
- G06F21/70—Protecting specific internal or peripheral components, in which the protection of a component leads to protection of the entire computer
- G06F21/86—Secure or tamper-resistant housings
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/0275—Security details, e.g. tampering prevention or detection
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2836—Fault-finding or characterising
- G01R31/2839—Fault-finding or characterising using signal generators, power supplies or circuit analysers
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/10—Details of components or other objects attached to or integrated in a printed circuit board
- H05K2201/10007—Types of components
- H05K2201/10151—Sensor
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/10—Details of components or other objects attached to or integrated in a printed circuit board
- H05K2201/10007—Types of components
- H05K2201/10204—Dummy component, dummy PCB or template, e.g. for monitoring, controlling of processes, comparing, scanning
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Computer Security & Cryptography (AREA)
- Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Software Systems (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
Description
Claims (5)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102008026276.5 | 2008-06-02 | ||
DE102008026276A DE102008026276B4 (de) | 2008-06-02 | 2008-06-02 | Verfahren zum Untersuchen einer Leiterplatte und elektronisches Gerät |
PCT/EP2009/003785 WO2009146828A1 (de) | 2008-06-02 | 2009-05-28 | Elektronisches gerät und verfahren zum untersuchen einer leiterplatte |
Publications (2)
Publication Number | Publication Date |
---|---|
CN102047770A true CN102047770A (zh) | 2011-05-04 |
CN102047770B CN102047770B (zh) | 2012-11-28 |
Family
ID=40947584
Family Applications (3)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN200980119796.XA Expired - Fee Related CN102047769B (zh) | 2008-06-02 | 2009-05-28 | 电子装置和用于检验电路板的方法 |
CN200980119797.4A Expired - Fee Related CN102047770B (zh) | 2008-06-02 | 2009-05-28 | 电子装置和用于检验电路板的方法 |
CN200980119800.2A Expired - Fee Related CN102047771B (zh) | 2008-06-02 | 2009-05-28 | 电子装置和用于检验电路板的方法 |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN200980119796.XA Expired - Fee Related CN102047769B (zh) | 2008-06-02 | 2009-05-28 | 电子装置和用于检验电路板的方法 |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN200980119800.2A Expired - Fee Related CN102047771B (zh) | 2008-06-02 | 2009-05-28 | 电子装置和用于检验电路板的方法 |
Country Status (6)
Country | Link |
---|---|
US (3) | US8508235B2 (zh) |
EP (3) | EP2283716B1 (zh) |
CN (3) | CN102047769B (zh) |
AT (3) | ATE551885T1 (zh) |
DE (1) | DE102008026276B4 (zh) |
WO (3) | WO2009146830A1 (zh) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102047771B (zh) * | 2008-06-02 | 2012-11-28 | 赛多利斯称量技术有限责任公司 | 电子装置和用于检验电路板的方法 |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102010048036A1 (de) * | 2010-05-14 | 2012-08-30 | Häusermann GmbH | Leiterplatte mit Kopierschutz und Verfahren zur Herstellung und Anwendung |
US9692476B2 (en) | 2012-04-25 | 2017-06-27 | 3M Innovative Properties Company | Wireless connectors |
DE102012019645A1 (de) * | 2012-10-06 | 2014-04-10 | Volkswagen Aktiengesellschaft | Verfahren zum Testen einer Schaltung sowie entsprechende Schaltung |
US9959430B2 (en) * | 2014-02-05 | 2018-05-01 | The United States Of America As Represented By The Secretary Of The Navy | Counterfeit microelectronics detection based on capacitive and inductive signatures |
EP3478032B1 (de) | 2017-10-24 | 2021-09-01 | VARTA Microbattery GmbH | Leiterplatte und verwendung einer kantenschutzleiste |
EP3861361B1 (de) * | 2018-10-01 | 2022-11-30 | Volkswagen Aktiengesellschaft | Verfahren und vorrichtung zum überwachen der zuverlässigkeit eines elektronischen systems |
CN110287072A (zh) * | 2019-06-20 | 2019-09-27 | 深圳忆联信息***有限公司 | 随机验证响应的方法、装置、计算机设备及存储介质 |
Family Cites Families (24)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4675769A (en) * | 1985-11-15 | 1987-06-23 | Data General Corporation | Electronic board identification |
DE3602960C1 (de) * | 1986-01-31 | 1987-02-19 | Philips Patentverwaltung | Dickschicht-Schaltungsanordnung mit einer keramischen Substratplatte |
US4908576A (en) * | 1987-09-08 | 1990-03-13 | Jackson Daniel K | System for printed circuit board testing |
US5203004A (en) * | 1990-01-08 | 1993-04-13 | Tandem Computers Incorporated | Multi-board system having electronic keying and preventing power to improperly connected plug-in board with improperly configured diode connections |
JP2898814B2 (ja) * | 1992-02-25 | 1999-06-02 | 株式会社日立製作所 | 印刷インダクタ付き多層配線板 |
DE4334355A1 (de) * | 1993-10-08 | 1995-04-13 | Vdo Schindling | Informationsgeber |
US5588202A (en) * | 1995-03-17 | 1996-12-31 | Honeywell Inc. | Method for manufacturing an overmolded sensor |
US5736862A (en) * | 1995-06-22 | 1998-04-07 | Genrad, Inc. | System for detecting faults in connections between integrated circuits and circuit board traces |
JP3116863B2 (ja) | 1997-07-07 | 2000-12-11 | 日本電気株式会社 | デバイスシミュレーション方法 |
AU6209300A (en) * | 1999-07-15 | 2001-02-05 | Thomson Licensing S.A. | Method and apparatus for supporting two different types of integrated circuit cards with a single connector |
JP2002366505A (ja) * | 2001-06-07 | 2002-12-20 | Nec Corp | 実装位置検出方法及び装置 |
JP4318417B2 (ja) * | 2001-10-05 | 2009-08-26 | ソニー株式会社 | 高周波モジュール基板装置 |
US7587695B2 (en) * | 2001-12-10 | 2009-09-08 | Mentor Graphics Corporation | Protection boundaries in a parallel printed circuit board design environment |
US6606252B1 (en) * | 2002-07-17 | 2003-08-12 | Delphi Technologies, Inc. | Fastener detection for encased electrical assembly |
US7230316B2 (en) * | 2002-12-27 | 2007-06-12 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device having transferred integrated circuit |
JP2005156212A (ja) * | 2003-11-21 | 2005-06-16 | Fuji Xerox Co Ltd | 回路基板検査装置 |
TWM250504U (en) * | 2003-11-27 | 2004-11-11 | Optimum Care Int Tech Inc | Assembly structure for hiding electronic component |
JP4362386B2 (ja) * | 2004-02-06 | 2009-11-11 | ソニー株式会社 | 電子回路基板、パネル型表示装置および製品の判別方法 |
EP1607899B1 (en) * | 2004-06-15 | 2007-08-15 | STMicroelectronics Limited | Card detection |
US7772974B2 (en) * | 2005-02-28 | 2010-08-10 | Cypak Ab | Tamper evident seal system and method |
KR100949282B1 (ko) * | 2005-10-28 | 2010-03-25 | 가부시키가이샤 어드밴티스트 | 시험장치, 픽쳐 보드 및 핀 일렉트로닉스 카드 |
DE102005062800A1 (de) * | 2005-12-28 | 2007-07-12 | El-Me Ag | Elektronik-Sicherheits-Modul |
JP2008026217A (ja) * | 2006-07-24 | 2008-02-07 | Toshiba Corp | 接近センサ及び電子機器 |
DE102008026276B4 (de) * | 2008-06-02 | 2012-08-09 | Sartorius Weighing Technology Gmbh | Verfahren zum Untersuchen einer Leiterplatte und elektronisches Gerät |
-
2008
- 2008-06-02 DE DE102008026276A patent/DE102008026276B4/de not_active Expired - Fee Related
-
2009
- 2009-05-28 AT AT09757213T patent/ATE551885T1/de active
- 2009-05-28 EP EP09757211A patent/EP2283716B1/de not_active Not-in-force
- 2009-05-28 CN CN200980119796.XA patent/CN102047769B/zh not_active Expired - Fee Related
- 2009-05-28 EP EP09757212A patent/EP2283717B1/de not_active Not-in-force
- 2009-05-28 WO PCT/EP2009/003787 patent/WO2009146830A1/de active Application Filing
- 2009-05-28 CN CN200980119797.4A patent/CN102047770B/zh not_active Expired - Fee Related
- 2009-05-28 EP EP09757213A patent/EP2283718B1/de not_active Not-in-force
- 2009-05-28 CN CN200980119800.2A patent/CN102047771B/zh not_active Expired - Fee Related
- 2009-05-28 AT AT09757211T patent/ATE551883T1/de active
- 2009-05-28 WO PCT/EP2009/003785 patent/WO2009146828A1/de active Application Filing
- 2009-05-28 AT AT09757212T patent/ATE551884T1/de active
- 2009-05-28 WO PCT/EP2009/003786 patent/WO2009146829A1/de active Application Filing
-
2010
- 2010-12-02 US US12/958,982 patent/US8508235B2/en not_active Expired - Fee Related
- 2010-12-02 US US12/958,869 patent/US8395407B2/en not_active Expired - Fee Related
- 2010-12-02 US US12/959,049 patent/US8508236B2/en not_active Expired - Fee Related
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102047771B (zh) * | 2008-06-02 | 2012-11-28 | 赛多利斯称量技术有限责任公司 | 电子装置和用于检验电路板的方法 |
CN102047769B (zh) * | 2008-06-02 | 2012-11-28 | 赛多利斯称量技术有限责任公司 | 电子装置和用于检验电路板的方法 |
Also Published As
Publication number | Publication date |
---|---|
DE102008026276B4 (de) | 2012-08-09 |
CN102047770B (zh) | 2012-11-28 |
WO2009146830A1 (de) | 2009-12-10 |
ATE551883T1 (de) | 2012-04-15 |
CN102047771B (zh) | 2012-11-28 |
EP2283717B1 (de) | 2012-03-28 |
CN102047769A (zh) | 2011-05-04 |
EP2283716B1 (de) | 2012-03-28 |
EP2283718A1 (de) | 2011-02-16 |
ATE551885T1 (de) | 2012-04-15 |
US20110140731A1 (en) | 2011-06-16 |
EP2283716A1 (de) | 2011-02-16 |
DE102008026276A1 (de) | 2009-12-24 |
ATE551884T1 (de) | 2012-04-15 |
US8508235B2 (en) | 2013-08-13 |
EP2283717A1 (de) | 2011-02-16 |
US20110133752A1 (en) | 2011-06-09 |
EP2283718B1 (de) | 2012-03-28 |
US20110133753A1 (en) | 2011-06-09 |
WO2009146829A1 (de) | 2009-12-10 |
CN102047771A (zh) | 2011-05-04 |
CN102047769B (zh) | 2012-11-28 |
US8395407B2 (en) | 2013-03-12 |
US8508236B2 (en) | 2013-08-13 |
WO2009146828A1 (de) | 2009-12-10 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
ASS | Succession or assignment of patent right |
Owner name: SARTORIUS MEASUREMENT TECHNOLOGIES AG Free format text: FORMER OWNER: SARTORIUS AG Effective date: 20110901 |
|
C41 | Transfer of patent application or patent right or utility model | ||
TA01 | Transfer of patent application right |
Effective date of registration: 20110901 Address after: German gttingen Applicant after: Sartorius Weighing Technology GmbH Address before: German gttingen Applicant before: Sartorius GmbH |
|
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
ASS | Succession or assignment of patent right |
Owner name: SARTORIUS LABORATORY INSTRUMENT GMBH + CO. KG Free format text: FORMER OWNER: SARTORIUS WEIGHING TECHNOLOGY GMBH Effective date: 20131010 |
|
C41 | Transfer of patent application or patent right or utility model | ||
TR01 | Transfer of patent right |
Effective date of registration: 20131010 Address after: German gttingen Patentee after: SARTORIUS WEIGHING TECHNOLOGY GMBH Address before: German gttingen Patentee before: Sartorius Weighing Technology GmbH |
|
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20121128 Termination date: 20160528 |