CN102042820A - Method for detecting micro space debris - Google Patents

Abstract

The invention relates to a method for detecting micro space debris and belongs to the technical field of micro space debris. A detection thin film comprises a debris capturing layer material, a transitional layer material and a base material from top down, wherein the micro space debris layer material is 1to 4 micrometer-thick Au; the base material is 1 to 3-millimeter-thick quartz glass, and the transitional layer material is 50 to 100 nanometer-thick Ir; the detection thin film is carried by the windward side or leeside of spacecraft, and after being exposed in space, the detection thin film is brought back to the ground; ground analysis is performed by secondary ion mass spectroscopic analysis or X-ray photoelectron spectroscopic analysis under ion gun analysis to obtain the correspondence between the data after the analysis of the detection thin film and the related data of the space debris; and thus, the chemical composition of the captured debris is obtained. In the invention, a low-weight power-free detection thin film is used to realize the detection of the space micro debris, and the space debris that can be captured and analyzed by the debris capturing layer is of mg order.

Description

The detection method of the small fragment in a kind of space

Technical field

The present invention relates to the detection method of the small fragment in a kind of space, belong to space environment Detection Techniques field.

Background technology

Along with China's spacecraft obvious lengthening of time in orbit, the monitoring space junk regularity of distribution and speed in orbit, and the assessment fragment is to being even more important that the influence of spacecraft material just shows.Simultaneously because recent satellite in orbit by incidents such as destructions, causes the regularity of distribution pace of change of space junk to strengthen.Also the development space junk is surveyed film at rail and proposed requirement.

Smaller portions are difficult to obtain by ground observation in these fragments, and it is exactly to monitor by surveying film at rail that the universe fragment in U.S.'s long duration exposure facility (LDEF) is surveyed.The carrying out of the Space Stn. Program of China provides application background for the space of surveying film at rail exposes operation and returns.

The present invention proposes to survey film at rail.This film plan is carried and can be provided on the spacecraft that returns sample capability at spacelab or space station etc., so, on the environment and track that the design of this film and preparation are all faced according to Chinese Space laboratory or space station.

Summary of the invention

The objective of the invention is to propose the detection method of the small fragment in a kind of space in order to solve surveying of the small fragment in space at rail.

The objective of the invention is to be achieved through the following technical solutions.

The detection method of the small fragment in a kind of space of the present invention, utilize the detection film to be exposed to the space and carry out small debris capture, to survey film then and transport ground back, adopt Physical Analysis Methods to analyze the injection degree of depth and the fragment chemical composition of small fragment, according to the calculating of bump degree of depth formula, inject the size that the degree of depth can reflect the incident fragment; Its concrete steps are:

1) film is surveyed in design and preparation:

The detection film comprises from top to bottom captures debris layer, transition bed and base material; Prepare two or more and survey film;

Capturing the used material of debris layer is Au, and its thickness is 1～4 μ m; Capture debris layer for surveying the chief component of film, main effect is directly to receive the bump of space junk and form to inject phenomenon, by the analytical instrument on ground film is analyzed then, analyzed physical hazard and the injection element of space junk in film that the space fragment causes in this layer and form;

The Au atomic number is bigger, and content is less in the micrometeroroid in universe, owing to adopt Au also less in the spacecraft, therefore seldom sees Au in artificial space junk; Simultaneously, Au has good inertia, and other space environment effect is less to the influence of Au;

According to the high-speed impact principle, capturing the space junk that debris layer can capture and analyze is the mg magnitude;

The material that base material adopts is the thick quartz glass of 1～3mm, and it is the accompanying structure of debris capture layer, and this material requirements is all insensitive to space environment effect, and weight wants light simultaneously, and is easy to install and be convenient to the analytical instrument clamping; In addition, if larger particles may puncture the debris capture layer,, reduce interference to Ground analysis so base material needs higher degree as far as possible;

The material that transition bed adopts is Ir, and its thickness is 50～100nm; The selection of transition bed also will consideration and the diffusivity and the wellability of Au and base material except considering the factor identical with the debris capture layer;

2) carry in the space

Two or more are surveyed film carry on the spacecraft on the Low Earth Orbit, be installed in respectively on the windward side and lee face of spacecraft, after exposing through the space, carry go back to ground then; The time that exposes in the space is 1～24 month;

3) Ground analysis

Ground analysis adopts secondary ion mass spectrum or the ion gun analysis analytical approach of x-ray photoelectron power spectrum down, the corresponding relation of the related data of data and space junk after the acquisition detection film analysis; Thereby obtain the chemical composition of the fragment of capturing; Simultaneously, obtain fragment by ion gun analysis time and ion gun analysis speed and inject the degree of depth;

Fragment bump degree of depth formula is shown in the formula (1):

$p\≈0.06m_p^{0.352}{\mathrm{\ρ}}_t^{1/6}{v}_{\⊥}^{2/3}---\left(1\right)$

In the formula (1), p is that fragment injects the degree of depth (m), m _pFor fragment quality (g), ρ are fragment density g/cm ³, v is fragment stroke speed m/s;

According to the calculating of fragment bump degree of depth formula, the injection degree of depth of fragment can reflect that the size Φ (nm) of incident fragment is approximately equal to 1.5t (s), and t finds the fragment required time for analytical instrument ion sputtering analysis.

Beneficial effect

The present invention utilizes low weight not have the detection film of power consumption, the detection of the small fragment in implementation space, and capturing the space junk that debris layer can capture and analyze is the mg magnitude.

Description of drawings

Fig. 1 is for surveying the structural representation of film.

Embodiment

The present invention will be further described below in conjunction with drawings and Examples.

The detection method of the small fragment in a kind of space, utilize the detection film to be exposed to the space and carry out small debris capture, to survey film then and transport ground back, adopt Physical Analysis Methods to analyze the injection degree of depth and the fragment chemical composition of small fragment, according to the calculating of bump degree of depth formula, inject the size that the degree of depth can reflect the incident fragment; Its concrete steps are:

1) film is surveyed in design and preparation:

The detection film comprises from top to bottom captures debris layer, transition bed and base material, as shown in Figure 1; Prepare two and survey film;

Capturing the used material of debris layer is Au, and its thickness is 4 μ m; Capture debris layer for surveying the chief component of film, main effect is directly to receive the bump of space junk and form to inject phenomenon, by the analytical instrument on ground film is analyzed then, analyzed physical hazard and the injection element of space junk in film that the space fragment causes in this layer and form; According to the high-speed impact principle, capturing the space junk that debris layer can capture and analyze is the mg magnitude;

The material that base material adopts is the thick quartz glass of 1mm, and it is the accompanying structure of debris capture layer;

The material that transition bed adopts is Ir, and its thickness is 50nm;

2) carry in the space

Survey film with two and carry on the spacecraft on the Low Earth Orbit, be installed in respectively on the windward side and lee face of spacecraft, after exposing through the space, carry go back to ground then; The time that exposes in the space is 3 months;

3) Ground analysis

Ground analysis adopts secondary ion mass spectrum or the ion gun analysis analysis mode of x-ray photoelectron power spectrum down, the corresponding relation of the related data of data and space junk after the acquisition detection film analysis; Thereby obtain the chemical composition and the chip size of the fragment of capturing; Obtain fragment by ion gun analysis time and ion gun analysis speed and inject the degree of depth;

Fragment bump degree of depth formula is shown in the formula (1):

$p\≈0.06m_p^{0.352}{\mathrm{\ρ}}_t^{1/6}{v}_{\⊥}^{2/3}---\left(1\right)$

In the formula (1), p is that fragment injects the degree of depth (m), m _pFor fragment quality (g), ρ are fragment density g/cm ³, v is fragment stroke speed m/s;

V is generally approximate fixed value for the space junk stroke speed, according to ion gun analysis time and ion gun analysis speed acquisition fragment injection degree of depth p, and by mass spectrophotometry acquisition fragment chemical composition and density p, thereby obtain fragment quality m according to formula (1) _pThe size Φ (nm) that reflects the incident fragment thus is approximately equal to 1.5t (s), and t finds the fragment required time for analytical instrument ion sputtering analysis.

Claims (1)

1. the detection method of the small fragment in space, it is characterized in that: utilize the detection film to be exposed to the space and carry out small debris capture, to survey film then and transport ground back, adopt Physical Analysis Methods to analyze the injection degree of depth and the fragment chemical composition of small fragment, according to the calculating of bump degree of depth formula, inject the size that the degree of depth can reflect the incident fragment; Its concrete steps are:

1) film is surveyed in design and preparation:

The detection film comprises from top to bottom captures debris layer, transition bed and base material; Prepare two or more and survey film;

Capturing the used material of debris layer is Au, and its thickness is 1～4 μ m;

The material that base material adopts is the thick quartz glass of 1～3mm;

The material that transition bed adopts is Ir, and its thickness is 50～100nm;

2) carry in the space

Two or more are surveyed film carry on the spacecraft on the Low Earth Orbit, be installed in respectively on the windward side and lee face of spacecraft, after exposing through the space, carry go back to ground then; The time that exposes in the space is 1～24 month;

3) Ground analysis

Ground analysis adopts secondary ion mass spectrum or the ion gun analysis analytical approach of x-ray photoelectron power spectrum down, the corresponding relation of the related data of data and space junk after the acquisition detection film analysis; Thereby obtain the chemical composition of the fragment of capturing; Simultaneously, obtain fragment by ion gun analysis time and ion gun analysis speed and inject the degree of depth;

Fragment bump degree of depth formula is shown in the formula (1):

$p\≈0.06m_p^{0.352}{\mathrm{\ρ}}_t^{1/6}{v}_{\⊥}^{2/3}---\left(1\right)$

In the formula (1), p is that fragment injects the degree of depth (m), m _pFor fragment quality (g), ρ are fragment density g/cm ³, v is fragment stroke speed m/s;

According to the calculating of fragment bump degree of depth formula, the injection degree of depth of fragment can reflect that the size Φ (nm) of incident fragment is approximately equal to 1.5t (s), and t finds the fragment required time for analytical instrument ion sputtering analysis.

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