CN102004335A - Line repairing structure and repairing method thereof - Google Patents
Line repairing structure and repairing method thereof Download PDFInfo
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- CN102004335A CN102004335A CN2009101951963A CN200910195196A CN102004335A CN 102004335 A CN102004335 A CN 102004335A CN 2009101951963 A CN2009101951963 A CN 2009101951963A CN 200910195196 A CN200910195196 A CN 200910195196A CN 102004335 A CN102004335 A CN 102004335A
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- section
- reparation
- bar side
- repair
- data line
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- 238000000034 method Methods 0.000 title claims abstract description 53
- 230000008439 repair process Effects 0.000 claims abstract description 443
- 238000009413 insulation Methods 0.000 claims abstract description 106
- 230000002093 peripheral effect Effects 0.000 claims abstract description 97
- 238000003466 welding Methods 0.000 claims description 53
- 239000000463 material Substances 0.000 claims description 49
- 238000005520 cutting process Methods 0.000 claims description 12
- 230000007547 defect Effects 0.000 abstract description 12
- 239000000758 substrate Substances 0.000 abstract description 4
- 230000002950 deficient Effects 0.000 description 50
- 239000004973 liquid crystal related substance Substances 0.000 description 17
- 238000005516 engineering process Methods 0.000 description 11
- 239000010409 thin film Substances 0.000 description 7
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 6
- 239000004411 aluminium Substances 0.000 description 6
- 229910052782 aluminium Inorganic materials 0.000 description 6
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 6
- 229910052750 molybdenum Inorganic materials 0.000 description 6
- 239000011733 molybdenum Substances 0.000 description 6
- 238000010586 diagram Methods 0.000 description 5
- 229910045601 alloy Inorganic materials 0.000 description 4
- 239000000956 alloy Substances 0.000 description 4
- 239000011651 chromium Substances 0.000 description 4
- 239000000470 constituent Substances 0.000 description 4
- 230000000694 effects Effects 0.000 description 4
- 229910021654 trace metal Inorganic materials 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 3
- 229910000838 Al alloy Inorganic materials 0.000 description 2
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 description 2
- 229910001182 Mo alloy Inorganic materials 0.000 description 2
- 229910052779 Neodymium Inorganic materials 0.000 description 2
- 229910052804 chromium Inorganic materials 0.000 description 2
- 239000004020 conductor Substances 0.000 description 2
- 238000005530 etching Methods 0.000 description 2
- 239000012528 membrane Substances 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- QEFYFXOXNSNQGX-UHFFFAOYSA-N neodymium atom Chemical compound [Nd] QEFYFXOXNSNQGX-UHFFFAOYSA-N 0.000 description 2
- 238000013459 approach Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000003749 cleanliness Effects 0.000 description 1
- 239000010408 film Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
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- 230000000630 rising effect Effects 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
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Abstract
A line repairing structure of a flat panel display device and a repairing method thereof, wherein the line repairing structure comprises: the repairing strip is arranged in the peripheral area of the array substrate and is in insulated intersection with the scanning line or the data line in the peripheral area; a first repair section adjacent to the repair strip side or a second repair section adjacent to the repair strip side, wherein the first repair section adjacent to the repair strip side is in insulation intersection with the scanning line, and the second repair section adjacent to the repair strip side is in insulation intersection with the data line; and the redundant segment is arranged in the peripheral area of the array substrate and is used for electrically connecting the repair strip with the first repair section or the second repair section when the circuit is repaired. Compared with the prior art, the line repair structure and the repair method thereof can repair the breakpoint defect of the peripheral area, and solve the problem that the position of the line with the breakpoint defect is limited when the line is repaired.
Description
Technical field
The present invention relates to flat panel display, particularly the line repair structure of panel display apparatus and restorative procedure thereof.
Background technology
Because advantages such as liquid crystal indicator has gently, approaches, occupation of land is little, power consumption is little, radiation is little are widely used in the various data processing equipments, for example TV, notebook computer, mobile phone, personal digital assistant etc.(Thin Film Transistor Liquid Crystal Display TFT-LCD) is modal a kind of liquid crystal indicator to adopt thin film transistor (TFT) to control the thin-film transistor LCD device that liquid crystal molecule is arranged in the liquid crystal indicator.
Liquid crystal indicator comprises array base palte, color membrane substrates and the liquid crystal layer that is oppositely arranged, wherein, the pixel electrode that array base palte is provided with sweep trace, data line and is defined by sweep trace and data line, the substrate of liquid crystal indicator is made of a large amount of display units, be provided with a large amount of sweep traces and data line simultaneously, these sweep traces are connected with other telltales by the pad that is arranged at a horizontal and vertical side respectively with data line, described sweep trace links to each other with the grid of thin film transistor (TFT), is used for the conducting membrane transistor; Described data line links to each other with the source electrode of thin film transistor (TFT), is used for providing voltage to pixel.But in the technological process of making liquid crystal indicator, a large amount of sweep traces that are provided with and data line are always because of some production defectives, and for example the cleanliness factor of the quality of quality of forming film, environment, scuffing, equipment etc. cause the circuit breakpoint.For example,, then just can not obtain normal data-signal, thereby form the display defect of display panel with the corresponding pixel electrode of the data line of described breakpoint if the breakpoint defective appears in data line.In fact, no matter described breakpoint defective appears at viewing area or outer peripheral areas, all may reduce the display quality of image.
Therefore, liquid crystal panel manufacturer can test to it before its product export and exist the product of line defct to carry out the circuit reparation to those.
In the prior art that relevant circuit is repaired, normally repair the disconnected line defect that causes of line by the mode that one to two reparation ring is set in the viewing area.Fig. 1 has shown the schematic layout pattern that circuit is repaired in a kind of prior art.As shown in Figure 1, described liquid crystal indicator comprises many data line D
1, D
2, D
3... D
k, D
K-1... D
n(k, n are natural number) and two reparation ring R
1, R
2, described reparation ring R
1, R
2Be the periphery that is positioned at the viewing area, and with being different from data line D
1, D
2... D
nMaterial make.In actual applications, a data line being arranged in the viewing area, for example is data line D
1, when breakpoint defective (show as bright line for normal white mode, show as concealed wire) occurring, can utilize and repair ring R for normal black pattern
1, R
2In any one repair.Two kinds of restorative procedures are arranged: the one, utilize and repair ring R
1Carry out laser welding at S11 and S21 place; The 2nd, utilize and repair ring R
2Carry out laser welding at S12 and S22 place.When there are two data lines the viewing area, for example be data line D
1, D
2, when the breakpoint defective occurring, can utilize and repair ring R
1, R
2Repair.Two kinds of restorative procedures are arranged: the one, utilize and repair ring R
1Carry out laser welding repair data line D at S11 and S21 place
1Breakpoint, utilize to repair ring R
2Carry out the breakpoint of laser welding repair data line D2 at S32 and S42 place; The 2nd, utilize and repair ring R
2Carry out laser welding repair data line D at S12 and S22 place
2, utilize and repair ring R
1Carry out laser welding repair data line D at S31 and S41 place
1Breakpoint.So far the disconnected line defect reparation success that causes of liquid crystal indicator viewing area data line.
More details about the circuit reparation of liquid crystal indicator can find in the disclosed content of U.S. publication US2006/0187722 in addition.
But, prior art has following problem: described repair structure only is arranged on the viewing area, and repair structure is not designed in the periphery circuit zone, just can't repair when the data line in outer peripheral areas produces the breakpoint defective, and the position of the feasible circuit that can repair is restricted.
Summary of the invention
The purpose of this invention is to provide a kind of line repair structure and circuit restorative procedure thereof, to solve the problem that to repair the limited location of circuit in the existing line recovery technique.
For addressing the above problem, the present invention provides a kind of line repair structure on the one hand, described line repair structure is applied in the array base palte of display device, and described array base palte has outer peripheral areas and viewing area, and described viewing area has the sweep trace and the data line of cross arrangement; Described line repair structure comprises: repair bar, be located at the outer peripheral areas of described array base palte, intersect with sweep trace or data line insulation in the described outer peripheral areas; Facing the reparation bar side first of closing on of being located at described reparation bar repairs section or closes on the reparation bar side second reparation section, described closing on repaired bar side first and repaired section and intersects with described sweep trace insulation, and described closing on repaired the bar side second reparation section and insulated with described data line and intersect; Redundant segments is located at the outer peripheral areas of described array base palte, is used for when circuit is repaired described reparation bar and described first repaired section or second and repairs section and be electrically connected.
Alternatively, described line repair structure also comprise with the insulation of described sweep trace intersects away from repair bar side first repair section and with described data line insulation intersects away from the reparation bar side second reparation section; Described closing on repaired bar side first and repaired section, describedly repairs section and describedly repair section and be electrically connected when circuit is repaired away from repairing bar side first away from repairing bar side second; Described closing on repaired bar side second and repaired section, describedly repairs section and describedly repair section and be electrically connected when circuit is repaired away from repairing bar side second away from repairing bar side first.
Alternatively, the insulation of sweep trace in described reparation bar and the described outer peripheral areas or data line intersects and specifically comprises: described reparation bar and described sweep trace be arranged in parallel and be arranged in parallel with described data line cross arrangement or described reparation bar and described data line and with described sweep trace cross arrangement.
Alternatively, the material of described reparation bar is identical with the material of described sweep trace.
Alternatively, the described reparation bar side first of closing on is repaired section, the described reparation bar side second reparation section, described away from repairing the bar side first reparation section with described identical with the material of described sweep trace away from the material of repairing the bar side second reparation section that closes on.
Alternatively, described closing on repaired bar side first and repaired section or describedly repair in the section identical with insulate the mutually material of the material of the part section that intersects and described data line of described sweep trace away from repairing bar side first.
Alternatively, the quantity of described redundant segments is at least one.
Alternatively, the material of described redundant segments is identical with described data line material.
The present invention provides a kind of line repair structure on the one hand again, and described line repair structure is applied in the array base palte of display device, and described array base palte has outer peripheral areas and viewing area, and described viewing area has the sweep trace and the data line of cross arrangement; Described line repair structure comprises: repair bar, be located at the outer peripheral areas of described array base palte, intersect with sweep trace or data line insulation in the described outer peripheral areas; Facing the reparation bar side first of closing on of being located at described reparation bar repairs section and closes on the reparation bar side second reparation section, described closing on repaired bar side first and repaired section and intersects with described sweep trace insulation, and described closing on repaired the bar side second reparation section and insulated with described data line and intersect; Redundant segments is located at the outer peripheral areas of described array base palte, is used for when circuit is repaired described reparation bar and described first repaired section or second and repairs section and be electrically connected.
Alternatively, described line repair structure also comprise with the insulation of described sweep trace intersects away from repair bar side first repair section or with described data line insulation intersects away from the reparation bar side second reparation section; Described closing on repaired bar side first and repaired section, describedly repairs section and describedly repair section and be electrically connected when circuit is repaired away from repairing bar side first away from repairing bar side second; Described closing on repaired bar side second and repaired section, describedly repairs section and describedly repair section and be electrically connected when circuit is repaired away from repairing bar side second away from repairing bar side first.
Alternatively, described line repair structure also comprise with the insulation of described sweep trace intersects away from repair bar side first repair section and with described data line insulation intersects away from the reparation bar side second reparation section; Described closing on repairs that bar side first is repaired section, described closing on repaired bar side second and repaired section, describedly repair section and describedly repair section and be electrically connected away from repairing bar side second away from repairing bar side first when circuit is repaired.
Alternatively, the insulation of sweep trace in described reparation bar and the described outer peripheral areas or data line intersects and specifically comprises: described reparation bar and described sweep trace be arranged in parallel and be arranged in parallel with described data line cross arrangement or described reparation bar and described data line and with described sweep trace cross arrangement.
Alternatively, the material of described reparation bar is identical with the material of described sweep trace.
Alternatively, the described reparation bar side first of closing on is repaired section, the described reparation bar side second reparation section, described away from repairing the bar side first reparation section with described identical with the material of described sweep trace away from the material of repairing the bar side second reparation section that closes on.
Alternatively, described closing on repaired bar side first and repaired section or describedly repair in the section identical with insulate the mutually material of the material of the part section that intersects and described data line of described sweep trace away from repairing bar side first.
Alternatively, the quantity of described redundant segments is at least one.
Alternatively, the material of described redundant segments is identical with described data line material.
The present invention also provides a kind of circuit restorative procedure according to above-mentioned line repair structure on the other hand, and it comprises: when breakpoint appears in described sweep trace or data line, determine the region of described breakpoint; When the region of described breakpoint is outer peripheral areas, the reparation bar that intersects in the selected and described sweep trace insulation of relative two sides of the breakpoint of described sweep trace and repair bar side first with closing on of intersecting of described sweep trace insulation and repair section, perhaps the selected and described data line of relative two sides of the breakpoint of described data line insulate the reparation bar that intersects and with described data line insulate intersect close on the reparation bar side second reparation section; Select described reparation bar and described redundant segments or selected described reparation bar and the described redundant segments of repairing between the bar side first reparation section of repairing between the bar side second reparation section that closes on that close on; Selected described reparation bar, described closing on are repaired bar side first reparation section and the described sweep trace that breakpoint occurs of described redundant segments electrical connection, the described reparation bar that perhaps will select, described closing on are repaired bar side second reparation section and the described data line that breakpoint occurs of described redundant segments electrical connection, set up and repair circuit.
Alternatively, described circuit restorative procedure also comprises: when the region of described breakpoint is the viewing area, repair bar side first closing on of intersecting of the selected and described sweep trace insulation of relative two sides of the breakpoint of described sweep trace and repair section and repair section away from repairing bar side first, perhaps the selected and described data line insulation of relative two sides of the breakpoint of described data line intersects close on the reparation bar side second reparation section and away from the reparation bar side second reparation section; Selected described closing on repaired the bar side first reparation section and be electrically connected the described sweep trace that breakpoint occurs away from repairing the bar side first reparation section, described the closing on that perhaps will select repaired the bar side second reparation section and repaired the described data line that breakpoint occurs of section electrical connection away from repairing bar side second, sets up the reparation circuit.
Alternatively, the described described reparation bar that will select, described closing on are repaired bar side first and are repaired section and described redundant segments and be electrically connected the described sweep trace that breakpoint occurs and specifically comprise: described reparation bar and the described sweep trace that breakpoint occurs are located electrical welding in the point of crossing of the two; Described closing on repaired that bar side first is repaired section and the described sweep trace that breakpoint occurs is located electrical welding in the point of crossing of the two; Described redundant segments is electrically connected with described reparation bar and the described reparation bar side first reparation section that closes on respectively.
Alternatively, the described described reparation bar that will select, described closing on are repaired bar side second and are repaired section and described redundant segments and be electrically connected the described data line that breakpoint occurs and specifically comprise: described reparation bar and the described data line that breakpoint occurs are located electrical welding in the point of crossing of the two; Described closing on repaired that bar side second is repaired section and the described data line that breakpoint occurs is located electrical welding in the point of crossing of the two; Described redundant segments is electrically connected with described reparation bar and the described reparation bar side second reparation section that closes on respectively.
Alternatively, described described the closing on that will select repaired bar side first and repaired section and repair section and be electrically connected the described sweep trace that breakpoint occurs and specifically comprise away from repairing bar side first: will describedly close on and repair bar side first and repair section and locate electrical welding away from repairing bar side first reparation section and the described sweep trace that breakpoint occurs in its point of crossing.
Alternatively, described described the closing on that will select repaired bar side second and repaired section and repair section and be electrically connected the described sweep trace that breakpoint occurs and specifically comprise away from repairing bar side second: will describedly close on and repair bar side second and repair section and locate electrical welding away from repairing bar side second reparation section and the described data line that breakpoint occurs in its point of crossing.
Alternatively, described electrical welding realizes by laser welding.
Alternatively, described circuit restorative procedure also comprises: the sweep trace that breakpoint occurs in described outer peripheral areas during at least two to described reparation bar with repair the bar side first reparation section with closing on of intersecting of described sweep trace insulation and carry out step of cutting, when perhaps the data line that breakpoint occurs in described outer peripheral areas is at least two to described reparation bar with repair bar side second with closing on of intersecting of described data line insulation and repair section and carry out step of cutting, so that many reparation circuits of setting up are separate.
Alternatively, described circuit restorative procedure also comprises: the sweep trace that occurs breakpoint in described viewing area is repaired bar side first with closing on of intersecting of described sweep trace insulation during at least two pair and is repaired section and carry out step of cutting away from the reparation bar side first reparation section, the data line that perhaps occurs breakpoint in described viewing area is repaired bar side second with closing on of intersecting of described data line insulation during at least two pair and is repaired section and repair section and carry out step of cutting away from repairing bar side second, so that many reparation circuits of foundation are separate.
Compared with prior art, line repair structure of the present invention and restorative procedure thereof have solved the problem that can repair the limited location of circuit in the prior art, particularly, can repair, enlarge recoverable range of application at the breakpoint defective that in outer peripheral areas, occurs.
In addition, no matter line repair structure of the present invention and restorative procedure thereof is that many broken strings that occur in outer peripheral areas or viewing area are repaired if can being repaired simultaneously, improve its repair ability.
Have again, utilize line repair structure of the present invention and restorative procedure thereof, can also repair, enlarged the type that to repair circuit breakpoint defective at sweep trace.
Description of drawings
Fig. 1 is the schematic layout pattern of the circuit reparation ring of prior art panel display apparatus;
Fig. 2 is the line repair structure schematic layout pattern in the first embodiment of panel display apparatus of the present invention;
Fig. 3 to Fig. 4 repairs synoptic diagram for the circuit of using the line repair structure in first embodiment shown in Figure 2;
Fig. 5 is the schematic layout pattern of line repair structure in second embodiment of panel display apparatus of the present invention;
Fig. 6 to Figure 17 repairs synoptic diagram for the circuit of using the line repair structure in second embodiment shown in Figure 5.
Embodiment
The present inventor finds, repair in the circuit at the existing circuit that is applied to panel display apparatus, mostly that adopts is to repair ring structure, described reparation ring structure all is subjected to certain restriction at the zone and the circuit types that produce the breakpoint defective at the circuit that can repair, for example can only repair the data line in the viewing area, and can not repair the circuit in the outer peripheral areas, the yield that product is repaired is lower, cause the scrappage of product higher, cause the rising of production cost.
Before technology contents of the present invention is described in detail, need to prove, in following each embodiment, described panel display apparatus is that example describes with thin-film transistor LCD device (TFT-LCD), but be not limited to thin-film transistor LCD device, and for sake of convenience, here, we are that the breakpoint defective with data line is that example describes, but be not limited to the breakpoint defect repair of data line, for example also go for the breakpoint defect repair of sweep trace or comprise the breakpoint defect repair of data line and sweep trace simultaneously.
First embodiment:
Described line repair structure of the present invention is formed on the array base palte, and described line repair structure comprises: repair bar, be located at the outer peripheral areas of described array base palte, intersect with sweep trace or data line insulation in the described outer peripheral areas; Facing the reparation bar side first of closing on of being located at described reparation bar repairs section or closes on the reparation bar side second reparation section, described closing on repaired bar side first and repaired section and intersects with described sweep trace insulation, and described closing on repaired the bar side second reparation section and insulated with described data line and intersect; Redundant segments is located at the outer peripheral areas of described array base palte, is used for when circuit is repaired described reparation bar and described first repaired section or second and repairs section and be electrically connected.
Fig. 2 shows the line repair structure schematic layout pattern in one embodiment of liquid crystal indicator of the present invention.As shown in Figure 2, described line repair structure is applied to comprise on described array base palte on the array base palte of liquid crystal indicator: driving circuit 101; Many data line D
1, D
2, D
3... D
N-2, D
N-1, D
n(n is a natural number); Be used for driving circuit 101 and many data line D
1, D
2, D
3... D
N-2, D
N-1, D
nThe a plurality of binding terminals 102 that connect are to be input to the signal on the driving circuit 101 many data line D
1, D
2, D
3... D
N-2, D
N-1, D
nWith many data line D
1, D
2, D
3... D
N-2, D
N-1, D
nThe multi-strip scanning line S of cross arrangement
1... S
n(n is a natural number).
In the present embodiment, described line repair structure is formed on the described array base palte, and described line repair structure comprises: be located at the reparation bar 103 of the outer peripheral areas 107 of described array base palte, at least one reparation section of being located at 108 outsides, viewing area and the redundant segments of being located at the outer peripheral areas of described array base palte.
Repair the data line D in bar 103 and the outer peripheral areas 107
1, D
2, D
3... D
N-2, D
N-1, D
nInsulation intersects.In one embodiment, repair bar 103 material can with sweep trace S
1... S
nMaterial identical.The material that described sweep trace metal adopts can for example can be molybdenum, aluminium alloy for one or more the combined alloy in chromium (Cr), molybdenum (Mo) or the aluminium (Al).
In the present embodiment, described reparation section is one, that is: face the reparation bar side second of closing on of being located at reparation bar 103 and repair section 104-2.Described close on repair bar side second repair section 104-2 be with viewing area 108 in data line D
1, D
2, D
3... D
N-2, D
N-1, D
nInsulation intersect and with viewing area 108 in sweep trace S
1... S
nBe arranged in parallel.In one embodiment, close on repair bar side second repair section 104-2 can for sweep trace S
1... S
nMaterial identical.
Be located at the redundant segments of the outer peripheral areas 107 of described array base palte, can play and to repair bar 103 and to close on the effect that connects that the second reparation section 104-2 foundation of bar side is electrically connected of repairing.In actual applications, described redundant segments is that the etch rate of balance external region 107 data lines designs when the data line etching.The quantity of described redundant segments is at least one, is that example describes with two in the present embodiment, but is not limited to can be many in other embodiments.As shown in Figure 2, two redundant segments 105-1,105-2 be positioned at outer peripheral areas 107 central authorities, with data line D
1, D
2, D
3... D
N-2, D
N-1, D
nBe arranged in parallel.Redundant segments 105-1,105-2 can be by connecting line segment 106 repair bar side second and repair section 104-2 and be electrically connected with repairing bar 103 and close on respectively.In one embodiment, redundant segments 105-1,105-2 can be and data line D
1, D
2, D
3... D
N-2, D
N-1, D
nThe data line metal that constituent material is identical, the material that described data line adopts can be one or more the combined alloy in aluminium, neodymium (Nd) or the molybdenum, for example alloy of molybdenum, aluminium.Connecting line segment 106 can be and data line D
1, D
2, D
3... D
N-2, D
N-1, D
nThe sweep trace metal that constituent material is different.
By by the above-mentioned reparation bar 103 of being located at outer peripheral areas 107, be located at redundant segments 105-1, the 105-2 of outer peripheral areas 107 and close on and repair bar side second and repair the line repair structure that section 104-2 constituted and can repair the breakpoint defective that occurs at least one data line in the outer peripheral areas 107, make the data line operate as normal again after repairing that produces the breakpoint defective before described, improve the circuit repair ability, promote image display effect.
Below be described in detail at the concrete restorative procedure of the breakpoint defective (the breakpoint defective with data line is an example) of the various situations that produce.
In actual applications, the conductor wire that is positioned at outer peripheral areas is easy to be scratched by physics, when having a data line to produce the breakpoint defective in the outer peripheral areas, at first, determines to occur the data line of breakpoint.The described method of determining to occur the data line of breakpoint can be by applying high level signal to described data line and observing display screen and come the specified data line whether to have the region of breakpoint and described breakpoint.Specifically, comprising: apply any monochrome signal for example represented in the Red Green Blue or their mixed signal to data line; Observe display screen,, then can on screen, demonstrate and the described signal colour that applies inconsistent (for example being black or white) in the part or all of zone at corresponding described data line place if there is breakpoint in data line; Further, if the Zone Full of corresponding described data line demonstrates and the described signal colour that applies inconsistent (being that a whole piece data line shows black or white in the display screen), the breakpoint that then can determine described data line is positioned at outer peripheral areas, correspondingly, if the subregion of corresponding described data line demonstrates and the described signal colour that applies inconsistent (data line that is part in the display screen shows black or white), can determine that then the breakpoint of described data line is positioned at the viewing area.Then, when the breakpoint that determine to occur is positioned at outer peripheral areas, the reparation bar that intersects in the selected and described data line insulation of relative two sides of the breakpoint of described data line and close on the reparation bar side second reparation section with described data line insulation intersects.Then, selected described reparation bar and described closing on are repaired the redundant segments that bar side second is repaired between the section.At last, selected described reparation bar, described closing on are repaired bar side second reparation section and the described data line that breakpoint occurs of described redundant segments electrical connection, set up and repair circuit.
In the present embodiment, existing with data line D
3Producing the breakpoint defective is that example describes, particularly, the circuit restorative procedure as shown in Figure 3, at first, to all data line D
1, D
2, D
3... D
N-2, D
N-1, D
nApply the method for high level signal, specified data line D
3Because of not having signal to produce to resolve point defect and described breakpoint appears in the outer peripheral areas 107; Then, at data line D
3Breakpoint along data line D
3, near a side of driving circuit 101 selected with data line D
3The reparation bar 103 that insulation intersects, and along data line D
3, away from a side of driving circuit 101 selected with data line D
3The bar side second reparation section 104-2 is repaired in closing on that insulation intersects; Then, at described selected reparation bar 103 with close on and repair bar side second and repair selected redundant segments 105-1 between the section 104-2; At last, utilize the laser welding technology, at data line D
3With repair the point of crossing P that bar 103 insulation intersect
1, with data line D
3With repair bar 103 weldings, make data line D
3Be electrically connected and repair bar 103; And at data line D
3Repair bar side second and repair the point of crossing P that section 104-2 insulation intersects with closing on
2, with data line D
3Repair bar side second and repair section 104-2 welding with closing on, make data line D
3Electrical connection closes on repairs the bar side second reparation section 104-2.Like this, comprise repairing bar 103, redundant segments 105-1 and closing on and repair the reparation circuit that bar side second repairs section 104-2 and just set up that driving circuit 101 sends the signal of binding terminal 104 to, as electric current, just can send data line D to
3Described electric current just can flow along the direction of arrow shown in Figure 3, repairs and finishes by data line D
3The breakpoint defective that produces.
As from the foregoing, circuit restorative procedure of the present invention, utilized line repair structure, breakpoint location at the data line that produces the breakpoint defective, can select the reparation bar that intersects with described data line insulation in the relative both sides of described breakpoint neatly and close on the reparation bar side second reparation section, utilize the laser welding technology again, described data line is electrically connected on described reparation bar respectively and closes on the reparation bar side second reparation section, form and repair circuit, can repair at the breakpoint defective that in outer peripheral areas, occurs, enlarge recoverable range of application.
Fig. 4 has shown the circuit reparation synoptic diagram that occurs at least two data lines generation breakpoint defectives in outer peripheral areas 107.
In Fig. 4, with data line D
3, D
N-1Breakpoint occurring in outer peripheral areas 107 is example.Described circuit restorative procedure comprises: for data line D
3, at data line D
3With repair the point of crossing P that bar 103 insulation intersect
1With data line D
3Repair bar side second and repair the point of crossing P that section 104-2 insulation intersects with closing on
2Carry out welding respectively, make data line D
3Be electrically connected respectively and repair bar 103 and close on the reparation bar side second reparation section 104-2; Utilize to connect line segment 106, selected redundant segments 105-1 is repaired bar side second and repairs section 104-2 and be electrically connected with repairing bar 103 and close on respectively; Foundation comprises repairs bar 103, redundant segments 105-1 and closes on the reparation circuit of repairing the bar side second reparation section 104-2.For data line D
N-1, at data line D
N-1With repair the point of crossing P that bar 103 insulation intersect
7With data line D
N-1Repair bar side second and repair the point of crossing P that section 104-2 insulation intersects with closing on
8Carry out welding, make data line D
N-1Be electrically connected respectively and repair bar 103 and close on the reparation bar side second reparation section 104-2; Utilize to connect line segment 106, selected redundant segments 105-2 is repaired bar side second and repairs section 104-2 and be electrically connected with repairing bar 103 and close on respectively; Foundation comprises repairs bar 103, redundant segments 105-2 and closes on the reparation circuit of repairing the bar side second reparation section 104-2.
Be noted that, it still is example with the data line, when existing many data lines breakpoint to occur, also comprise described reparation bar, described reparation section (for example close on and repair the bar side second reparation section) are carried out step of cutting, so that many reparation circuits of setting up are separate.Specifically as shown in Figure 4, here, for avoiding respective data lines D
3With data line D
N-1Two current directions of repairing in the circuit being set up produce conflict, guarantee the separate of the two, so also be included in the B that repairs on the bar 103
3Point and close on and repair the B that bar side second is repaired on the section 104-2
4Point is got and is used for the line of cut (as shown in Figure 4) that disconnecting circuit connects, and makes respective data lines D
3, data line D
N-1Two reparation circuits setting up are independently of one another.Like this, then distinguish respective data lines D
3, D
N-1Electric current just can flow along the direction of arrow shown in Figure 4, repair and finish by data line D
3, D
N-1Breakpoint defective in outer peripheral areas 107 appearance.
As from the foregoing, circuit restorative procedure of the present invention can be repaired the breakpoint defective of many data lines occurring in the outer peripheral areas, has improved its repair ability.
In the above-described first embodiment, described data repair structure comprise the outer peripheral areas of being located at described array base palte the reparation bar, be located at closing on of the viewing area outside and repair one or more redundant segments that bar side second is repaired section and is located at the outer peripheral areas of described array base palte, can repair at the disconnection defect of the data line that occurs in the outer peripheral areas.Accordingly, described data repair structure still can be done other changes, for example, in other embodiments, for example, described data repair structure comprise the outer peripheral areas of being located at described array base palte the reparation bar, be located at closing on of the viewing area outside and repair one or more redundant segments that bar side first is repaired section and is located at the outer peripheral areas of described array base palte, like this, just can repair at the disconnection defect of the sweep trace that occurs in the outer peripheral areas, because of the description in described repair structure and restorative procedure and the above-mentioned embodiment similar, so do not give unnecessary details at this.
Second embodiment:
Described line repair structure of the present invention is formed on the array base palte, and described line repair structure comprises: repair bar, be located at the outer peripheral areas of described array base palte, intersect with sweep trace or data line insulation in the described outer peripheral areas; Facing the reparation bar side first of closing on of being located at described reparation bar repairs section and closes on the reparation bar side second reparation section, described closing on repaired bar side first and repaired section and intersects with described sweep trace insulation, and described closing on repaired the bar side second reparation section and insulated with described data line and intersect; Redundant segments is located at the outer peripheral areas of described array base palte, is used for when circuit is repaired described reparation bar and described first repaired section or second and repairs section and be electrically connected.
More preferably, described line repair structure also comprises: also comprise with the insulation of described sweep trace intersects away from repair bar side first repair section or with described data line insulation intersects away from the reparation bar side second reparation section; Described closing on repaired bar side first and repaired section, describedly repairs section and describedly repair section and be electrically connected when circuit is repaired away from repairing bar side first away from repairing bar side second; Described closing on repaired bar side second and repaired section, describedly repairs section and describedly repair section and be electrically connected when circuit is repaired away from repairing bar side second away from repairing bar side first.
Fig. 5 shows the line repair structure schematic layout pattern in one embodiment of liquid crystal indicator of the present invention.As shown in Figure 5, described line repair structure is applied to comprise on described array base palte on the array base palte of liquid crystal indicator: driving circuit 101; Many data line D
1, D
2, D
3... D
N-2, D
N-1, D
n(n is a natural number); Be used for driving circuit 101 and many data line D
1, D
2, D
3... D
N-2, D
N-1, D
nThe a plurality of binding terminals 102 that connect are to be input to the signal on the driving circuit 101 many data line D
1, D
2, D
3... D
N-2, D
N-1, D
nWith many data line D
1, D
2, D
3... D
N-2, D
N-1, D
nThe multi-strip scanning line S of cross arrangement
1... S
n(n is a natural number).
In the present embodiment, described line repair structure is formed on the described array base palte, and described line repair structure comprises: be located at the reparation bar 103 of the outer peripheral areas 107 of described array base palte, at least one reparation section of being located at 108 outsides, viewing area and the redundant segments of being located at the outer peripheral areas of described array base palte.
Repair the data line D in bar 103 and the outer peripheral areas 107
1, D
2, D
3... D
N-2, D
N-1, D
nInsulation intersects.In one embodiment, repair bar 103 material can with sweep trace S
1... S
nMaterial identical.The material that described sweep trace metal adopts can for example can be molybdenum, aluminium alloy for one or more the combined alloy in chromium (Cr), molybdenum (Mo) or the aluminium (Al).
In the present embodiment, be provided with four altogether and repair section, they are respectively: close on and repair bar side first and repair section 104-1, close on and repair bar side second and repair section 104-2, repair section 104-3 and repair section 104-4 away from repairing bar side second away from repairing bar side first, wherein, close on repair bar side first repair section 104-1 and away from repair bar side first repair section 104-3 be with viewing area 108 in sweep trace S
1... S
nInsulation intersect and with viewing area 108 in data line D
1, D
2, D
3... D
N-2, D
N-1, D
nBe arranged in parallel; Close on repair bar side second repair section 104-2 and away from repair bar side second repair section 104-4 then be with viewing area 108 in data line D
1, D
2, D
3... D
N-2, D
N-1, D
nInsulation intersect and with viewing area 108 in sweep trace S
1... S
nBe arranged in parallel.
More preferably, close on and repair bar side first and repair section 104-1, close on and repair bar side second and repair section 104-2, repair section 104-3 and repair section 104-4 and be electrically connected mutually, and roughly be and for example be the closed-loop construct of square shape away from repairing bar side second away from repairing bar side first.In one embodiment, close on repair bar side first repair section 104-1, close on repair bar side second repair section 104-2, away from repair bar side first repair section 104-3 and away from repair bar side second repair section 104-4 can for sweep trace S
1... S
nMaterial identical.But what pay special attention to is, repairs bar side first and repairs section 104-1 and repair among the section 104-3 and sweep trace S away from repairing bar side first closing on
1... S
nThe material of the part section that insulation intersects then with data line D
1, D
2, D
3... D
N-2, D
N-1, D
nMaterial identical.
Have again, be located at the redundant segments of the outer peripheral areas 107 of described array base palte, can play and to repair bar 103 and to close on the reparation bar side first reparation section 104-1 or close on the effect that connects that bar side second is repaired arbitrary reparation section foundation electrical connection among the section 104-2 of repairing.In actual applications, described redundant segments is that the etch rate of balance external region 107 data lines designs when the data line etching.The quantity of described redundant segments is at least one, is that example describes with two in the present embodiment, but is not limited to can be many in other embodiments.As shown in Figure 5, two redundant segments 105-1,105-2 be positioned at outer peripheral areas 107 central authorities, with data line D
1, D
2, D
3... D
N-2, D
N-1, D
nBe arranged in parallel.Redundant segments 105-1,105-2 can be by connecting line segment 106 repair bar side first and repair section 104-1 or close on and repair bar side second and repair among the section 104-2 arbitrary and repair section and be electrically connected with repairing bar 103 and close on respectively.In one embodiment, redundant segments 105-1,105-2 can be and data line D
1, D
2, D
3... D
N-2, D
N-1, D
nThe data line metal that constituent material is identical, the material that described data line adopts can be one or more the combined alloy in aluminium, neodymium (Nd) or the molybdenum, for example alloy of molybdenum, aluminium.Connecting line segment 106 can be and data line D
1, D
2, D
3... D
N-2, D
N-1, D
nThe sweep trace metal that constituent material is different.
By by the above-mentioned reparation bar 103 of being located at outer peripheral areas 107, be located at the redundant segments 105-1 of outer peripheral areas 107,105-2 and close on and repair bar side first and repair section 104-1, close on and repair the bar side second reparation section 104-2, away from repair bar side first repair section 104-3 and away from repair bar side second repair line repair structure that section 104-4 constituted can be to being in outer peripheral areas 107 or in viewing area 108 no matter or at least one sweep trace that occurs in outer peripheral areas 107 and viewing area 108 simultaneously or the breakpoint defective of data line are repaired, make the sweep trace that produces the breakpoint defective before described or data line operate as normal again after repairing, improve the circuit repair ability, promote image display effect.
Below be described in detail at the concrete restorative procedure of the breakpoint defective (the breakpoint defective with data line is an example) of the various situations that produce.
In actual applications, the conductor wire that is positioned at outer peripheral areas is easy to be scratched by physics, when having a data line to produce the breakpoint defective in the outer peripheral areas, at first, determines to occur the data line of breakpoint.The described method of determining to occur the data line of breakpoint can be by applying high level signal to described data line and observing display screen and come the specified data line whether to have the region of breakpoint and described breakpoint.Specifically, comprising: apply any monochrome signal for example represented in the Red Green Blue or their mixed signal to data line; Observe display screen,, then can on screen, demonstrate and the described signal colour that applies inconsistent (for example being black or white) in the part or all of zone at corresponding described data line place if there is breakpoint in data line; Further, if the Zone Full of corresponding described data line demonstrates and the described signal colour that applies inconsistent (being that a whole piece data line shows black or white in the display screen), the breakpoint that then can determine described data line is positioned at outer peripheral areas, correspondingly, if the subregion of corresponding described data line demonstrates and the described signal colour that applies inconsistent (data line that is part in the display screen shows black or white), can determine that then the breakpoint of described data line is positioned at the viewing area.Then, when the breakpoint that determine to occur is positioned at outer peripheral areas, the reparation bar that intersects in the selected and described data line insulation of relative two sides of the breakpoint of described data line and close on the reparation bar side second reparation section with described data line insulation intersects.Then, selected described reparation bar and described closing on are repaired the redundant segments that bar side second is repaired between the section.At last, selected described reparation bar, described closing on are repaired bar side second reparation section and the described data line that breakpoint occurs of described redundant segments electrical connection, set up and repair circuit.
In the present embodiment, existing with data line D
3Producing the breakpoint defective is that example describes, particularly, the circuit restorative procedure as shown in Figure 6, at first, to all data line D
1, D
2, D
3... D
N-2, D
N-1, D
nApply the method for high level signal, specified data line D
3Because of not having signal to produce to resolve point defect and described breakpoint appears in the outer peripheral areas 107; Then, at data line D
3Breakpoint along data line D
3, near a side of driving circuit 101 selected with data line D
3The reparation bar 103 that insulation intersects, and along data line D
3, away from a side of driving circuit 101 selected with data line D
3The bar side second reparation section 104-2 is repaired in closing on that insulation intersects; Then, at described selected reparation bar 103 with close on and repair bar side second and repair selected redundant segments 105-1 between the section 104-2; At last, utilize the laser welding technology, at data line D
3With repair the point of crossing P that bar 103 insulation intersect
1, with data line D
3With repair bar 103 weldings, make data line D
3Be electrically connected and repair bar 103; And at data line D
3Repair bar side second and repair the point of crossing P that section 104-2 insulation intersects with closing on
2, with data line D
3Repair bar side second and repair section 104-2 welding with closing on, make data line D
3Electrical connection closes on repairs the bar side second reparation section 104-2.Like this, comprise repairing bar 103, redundant segments 105-1 and closing on and repair the reparation circuit that bar side second repairs section 104-2 and just set up that driving circuit 101 sends the signal of binding terminal 104 to, as electric current, just can send data line D to
3Described electric current just can flow along the direction of arrow shown in Figure 6, repairs and finishes by data line D
3The breakpoint defective that produces.
As from the foregoing, circuit restorative procedure of the present invention, utilized line repair structure, breakpoint location at the data line that produces the breakpoint defective, can select the reparation bar that intersects with described data line insulation in the relative both sides of described breakpoint neatly and close on the reparation bar side second reparation section, utilize the laser welding technology again, described data line is electrically connected on described reparation bar respectively and closes on the reparation bar side second reparation section, form and repair circuit.Restorative procedure is succinct convenient, flexible and changeable.
This shows that the region of the breakpoint of the data line of generation breakpoint defective is not limited in outer peripheral areas 107, the breakpoint of described data line also can appear in the viewing area 108.For example, when having data line to produce the breakpoint defective simultaneously in outer peripheral areas 107 and viewing area 108, existing with data line D
3Breakpoint and data line D appear in outer peripheral areas 107
1108 breakpoint to occur be example in the viewing area.The circuit restorative procedure as shown in Figure 7, at this, for sake of convenience, in present embodiment and following other each embodiment, for ease of narration, with wherein by applying high level signal to described data line with the step of the data line of determining to occur breakpoint and utilize and connect line segment 106 so that redundant segments 105-1 or 105-2 are repaired bar side second and repair the step that section 104-2 is electrically connected and omitted with repairing bar 103 and close on respectively.
For the data line D that in outer peripheral areas 107, produces the breakpoint defective
3, restorative procedure comprises: at data line D
3Breakpoint along data line D
3, near the selected bar 103 of repairing of a side of driving circuit 101; Along data line D
3, repair bar side second and repair section 104-2 away from selected the closing on of a side of driving circuit 101; At described selected reparation bar 103 with close on and repair bar side second and repair selected redundant segments 105-1 between the section 104-2; Utilize the laser welding technology, at data line D
3With repair the point of crossing P that bar 103 insulation intersect
1, with data line D
3With repair bar 103 weldings, make data line D
3Be electrically connected and repair bar 103; And at data line D
3Repair bar side second and repair the point of crossing P that section 104-2 insulation intersects with closing on
2, with data line D
3Repair bar side second and repair section 104-2 welding with closing on, make data line D
3Electrical connection closes on repairs the bar side second reparation section 104-2.Like this, comprise repairing bar 103, redundant segments 105-1 and closing on and repair the reparation circuit that bar side second repairs section 104-2 and just set up that driving circuit 101 sends the signal of binding terminal 104 to, as electric current, just can send data line D to
3
For the data line D that in viewing area 108, produces the breakpoint defective
1, restorative procedure comprises: at data line D
1Breakpoint along data line D
1, repair bar side second and repair section 104-2 near selected the closing on of a side of driving circuit 101; Along data line D
1, repair section 104-4 away from a side of driving circuit 101 is selected away from repairing bar side second; Utilize the laser welding technology, at data line D
1Repair bar side second and repair the point of crossing P that section 104-2 insulation intersects with closing on
3, with data line D
1Repair bar side second and repair section 104-2 welding with closing on, make data line D
1Electrical connection closes on repairs the bar side second reparation section 104-2; At data line D
1With the point of crossing P that intersects away from the second reparation section 104-4 insulation of reparation bar side
4, with data line D
1With repair section 104-4 welding away from repairing bar side second, make data line D
1Electrical connection is repaired section 104-4 away from repairing bar side second; Like this, comprise closing on and repair bar side second and repair section 104-2 and just set up that driving circuit 101 sends the signal of binding terminal 104 to, as electric current, just can send data line D to away from repairing the reparation circuit that bar side second repairs section 104-4
1
Be noted that, it still is example with the data line, when existing many data lines breakpoint to occur, also comprise described reparation bar, described reparation section (closing on reparation bar side second repairs section and repair section away from repairing bar side second) are carried out step of cutting, so that many reparation circuits of setting up are separate.In some cases, only need cut to close on and repair the bar side second reparation section and repair section, when a broken string for example in viewing area and outer peripheral areas, respectively occurring away from repairing bar side second; In other cases, cutting is simultaneously repaired bar and is closed on and repair the bar side second reparation section and repair section away from reparation bar side second, when for example two broken strings occurring in outer peripheral areas.Specifically as shown in Figure 7, here, for avoiding respective data lines D
3With data line D
1Two current directions of repairing in the circuit being set up produce conflict, guarantee the separate of the two, so also be included in point of crossing P
2With point of crossing P
3Between, close on and repair the B that bar side second is repaired on the section 104-2
1Point and point of crossing P
2With point of crossing P
4Between, away from repairing the B that bar side second is repaired section 104-4
2Point is got and is used for the line of cut (as shown in Figure 7) that disconnecting circuit connects, and makes that the reparation circuit of the two is independently of one another.Like this, then distinguish respective data lines D
1, D
3Electric current just can flow along the direction of arrow shown in Figure 7, repair simultaneously and finish by data line D
1, D
3The breakpoint defective that produces.
Referring to Fig. 8, it is with data line D in addition
3Breakpoint and data line D appear in outer peripheral areas 107
n108 breakpoint to occur be that example describes in the viewing area.Restorative procedure and Fig. 7 are similar, and have carried out the circuit cutting between the reparation circuit of the two.Particular content can not repeat them here with reference to method shown in Figure 7.
As shown in Figure 9, it has shown that occurring the circuit that three data lines produce the breakpoint defectives simultaneously in outer peripheral areas 107 and viewing area 108 repairs synoptic diagram.Now with data line D
3Breakpoint, data line D appear in outer peripheral areas 107
1And D
n108 breakpoint to occur be that example describes in the viewing area.
For the data line D that in outer peripheral areas 107, produces the breakpoint defective
3, at data line D
3Relative two sides of breakpoint selected respectively repair bar 103 and close on repair bar side second and repair section 104-2; At described selected reparation bar 103 with close on and repair bar side second and repair selected redundant segments 105-1 between the section 104-2; Utilize the laser welding technology, at data line D
3With repair the point of crossing P that bar 103 insulation intersect
1With data line D
3Repair bar side second and repair the point of crossing P that section 104-2 insulation intersects with closing on
2Carry out welding respectively, make data line D
3Be electrically connected reparation bar 103 respectively and close on the reparation bar side second reparation section 104-2, set up the reparation circuit that comprises reparation bar 103, redundant segments 105-1 and close on the reparation bar side second reparation section 104-2.
For the data line D that in viewing area 108, produces the breakpoint defective
1, at data line D
1Selected respectively the closing on of relative two sides of breakpoint repair bar side second and repair section 104-2 and repair section 104-4 away from repairing bar side second; Utilize the laser welding technology, at data line D
1Repair bar side second and repair the point of crossing P that section 104-2 insulation intersects with closing on
3With data line D
1With the point of crossing P that intersects away from the second reparation section 104-4 insulation of reparation bar side
4Respectively welding makes data line D
1Be electrically connected respectively to close on and repair the bar side second reparation section 104-2 and repair section 104-4, set up the reparation circuit away from repairing bar side second.
For the data line D that in viewing area 108, produces the breakpoint defective
n, at data line D
nSelected respectively the closing on of relative two sides of breakpoint repair bar side second and repair section 104-2 and repair section 104-4 away from repairing bar side second; Utilize the laser welding technology, at data line D
nRepair bar side second and repair the point of crossing P that section 104-2 insulation intersects with closing on
5With data line D
nWith the point of crossing P that intersects away from the second reparation section 104-4 insulation of reparation bar side
6Respectively welding makes data line D
nBe electrically connected respectively to close on and repair the bar side second reparation section 104-2 and repair section 104-4, set up the reparation circuit away from repairing bar side second.
Equally, as shown in Figure 9, for avoiding respective data lines D
3, data line D
1With data line D
nRepair circuit for three that are set up and produce conflict, repair the B that bar side second is repaired on the section 104-2 so also be included in to close on
1Point and the B that repairs on the section 104-4 away from reparation bar side second
2Point is got and is used for the line of cut that disconnecting circuit connects, and makes respective data lines D
3, data line D
1Two reparation circuits setting up are independently of one another; B on the reparation bar 103 between redundant segments 105-1 and the redundant segments 105-2
3Point and close on and repair the B that bar side second is repaired on the section 104-2
4Point and the B that repairs on the section 104-4 away from reparation bar side second
5Point is got and is used for the line of cut that disconnecting circuit connects, and makes respective data lines D
3, data line D
nTwo reparation circuits setting up are independently of one another.Like this, then distinguish respective data lines D
1, D
2, D
3... D
N-2, D
N-1, D
nElectric current just can flow along the direction of arrow shown in Figure 9, repair simultaneously and finish by data line D
1, D
2, D
3... D
N-2, D
N-1, D
nThe breakpoint defective that produces.
Figure 10 to Figure 13 has shown that the data line under other situations carries out the signal that circuit is repaired when producing the breakpoint defective.Distinguish mutually with Fig. 6 to Fig. 9 and to be, in each embodiment of Fig. 6 to Fig. 9, the data line that produces the breakpoint defective in outer peripheral areas is the left side that is positioned at described redundant segments, so that use is redundant segments 105-1; On the other side, in each embodiment of Figure 10 to Figure 13, the data line that produces the breakpoint defective in outer peripheral areas is the right side that is positioned at described redundant segments, so that use is redundant segments 105-2.Certainly, here the selected rule of described redundant segments only is to be a preferred embodiment, be beneficial to the convenient and simplification circuit of narration, but not as limit, in other embodiments, redundant segments 105-1 also can be applied to the breakpoint reparation of data line on the right side of described redundant segments, and redundant segments 105-2 also can be applied to the breakpoint reparation of data line in the left side of described redundant segments.Described concrete restorative procedure is then similar to restorative procedure shown in Figure 9 with Fig. 6, so no longer give unnecessary details at this.
Figure 14 to Figure 17 shows the circuit reparation synoptic diagram that occurs two data lines generation breakpoint defectives at least in outer peripheral areas 107.
In Figure 14, with data line D
3, D
N-1Breakpoint occurring in outer peripheral areas 107 is example.Described circuit restorative procedure comprises: for data line D
3, at data line D
3With repair the point of crossing P that bar 103 insulation intersect
1With data line D
3Repair bar side second and repair the point of crossing P that section 104-2 insulation intersects with closing on
2Carry out welding respectively, make data line D
3Be electrically connected respectively and repair bar 103 and close on the reparation bar side second reparation section 104-2; Utilize to connect line segment 106, selected redundant segments 105-1 is repaired bar side second and repairs section 104-2 and be electrically connected with repairing bar 103 and close on respectively; Foundation comprises repairs bar 103, redundant segments 105-1 and closes on the reparation circuit of repairing the bar side second reparation section 104-2.For data line D
N-1, at data line D
N-1With repair the point of crossing P that bar 103 insulation intersect
7With data line D
N-1Repair bar side second and repair the point of crossing P that section 104-2 insulation intersects with closing on
8Carry out welding, make data line D
N-1Be electrically connected respectively and repair bar 103 and close on the reparation bar side second reparation section 104-2; Utilize to connect line segment 106, selected redundant segments 105-2 is repaired bar side second and repairs section 104-2 and be electrically connected with repairing bar 103 and close on respectively; Foundation comprises repairs bar 103, redundant segments 105-2 and closes on the reparation circuit of repairing the bar side second reparation section 104-2.In addition, at the B that repairs on the bar 103
3Point and close on and repair the B that bar side second is repaired on the section 104-2
4Point and repair section 104-4 and go up B away from repairing bar side second
5Point is got and is used for the line of cut (as shown in figure 14) that disconnecting circuit connects, and makes respective data lines D
3, data line D
N-1Two reparation circuits setting up are independently of one another.Like this, then distinguish respective data lines D
3, D
N-1Electric current just can flow along the direction of arrow shown in Figure 14, repair and finish by data line D
3, D
N-1The breakpoint defective that produces.
In Figure 15, with data line D
3, D
N-1Breakpoint and data line D appear in outer peripheral areas 107
n108 breakpoint to occur be example in the viewing area.Described circuit restorative procedure comprises: for data line D
3, at data line D
3With repair the point of crossing P that bar 103 insulation intersect
1With data line D
3Repair bar side second and repair the point of crossing P that section 104-2 insulation intersects with closing on
2Carry out welding respectively, make data line D
3Be electrically connected respectively and repair bar 103 and close on the reparation bar side second reparation section 104-2; Utilize to connect line segment 106, selected redundant segments 105-1 is repaired bar side second and repairs section 104-2 and be electrically connected with repairing bar 103 and close on respectively; Foundation comprises repairs bar 103, redundant segments 105-1 and closes on the reparation circuit of repairing the bar side second reparation section 104-2.For data line D
N-1, at data line D
N-1With repair the point of crossing P that bar 103 insulation intersect
7With data line D
N-1Repair bar side second and repair the point of crossing P that section 104-2 insulation intersects with closing on
8Carry out welding respectively, make data line D
N-1Be electrically connected respectively and repair bar 103 and close on the reparation bar side second reparation section 104-2; Utilize to connect line segment 106, selected redundant segments 105-2 is repaired section 104-2 with reparation bar 103 and second respectively be electrically connected; Foundation comprises repairs bar 103, redundant segments 105-2 and closes on the reparation circuit of repairing the bar side second reparation section 104-2.For data line D
n, at data line D
nRepair bar side second and repair the point of crossing P that section 104-2 insulation intersects with closing on
9With data line D
nWith the point of crossing P that intersects away from the second reparation section 104-4 insulation of reparation bar side
10Carry out welding respectively, make data line D
nBe electrically connected respectively to close on and repair the bar side second reparation section 104-2 and repair section 104-4, set up and repair circuit away from repairing bar side second.In addition, at the B that repairs on the bar 103
3Point, close on and repair the B that bar side second is repaired on the section 104-2
4Point, B
6Put and repair section 104-4 away from reparation bar side second and go up B
5Point, B
7Point is got and is used for the line of cut (as shown in figure 15) that disconnecting circuit connects, and makes that repairing circuit for three disconnects according to need.Like this, then distinguish respective data lines D
3, D
N-1, D
nElectric current just can flow along the direction of arrow shown in Figure 15, repair and finish by data line D
3, D
N-1, D
nThe breakpoint defective that produces.
In Figure 16, with data line D
3, D
N-1Breakpoint and data line D appear in outer peripheral areas 107
1108 breakpoint to occur be example in the viewing area.Described circuit restorative procedure comprises: for data line D
3, at data line D
3With repair the point of crossing P that bar 103 insulation intersect
1With data line D
3Repair bar side second and repair the point of crossing P that section 104-2 insulation intersects with closing on
2Get contact hole with laser respectively, with data line D
3Repair bar side second and repair section 104-2 and link together with repairing bar 103 and close on; Utilize to connect line segment 106, selected redundant segments 105-1 is repaired bar side second and repairs section 104-2 and be electrically connected with repairing bar 103 and close on respectively; Foundation comprises repairs bar 103, redundant segments 105-1 and closes on the reparation circuit of repairing the bar side second reparation section 104-2.For data line D
N-1, at data line D
N-1With repair the point of crossing P that bar 103 insulation intersect
7With data line D
N-1Repair bar side second and repair the point of crossing P that section 104-2 insulation intersects with closing on
8Get contact hole with laser respectively, with data line D
N-1Repair bar side second and repair section 104-2 and link together with repairing bar 103 and close on; Utilize to connect line segment 106, selected redundant segments 105-2 is repaired bar side second and repairs section 104-2 and be electrically connected with repairing bar 103 and close on respectively; Foundation comprises repairs bar 103, redundant segments 105-2 and closes on the reparation circuit of repairing the bar side second reparation section 104-2.For data line D
1, at data line D
1Repair bar side second and repair the point of crossing P that section 104-2 insulation intersects with closing on
3With data line D
1With the point of crossing P that intersects away from the second reparation section 104-4 insulation of reparation bar side
4Get contact hole with laser respectively, with data line D
1Repair bar side second and repair section 104-2 and repair section 104-4 and link together with closing on, set up and repair circuit away from repairing bar side second.In addition, closing on the B that repairs on the bar side second reparation section 104-2
1Point, away from repairing the B that bar side second is repaired on the section 104-4
2Point is got and is used for the line of cut that disconnecting circuit connects, and makes respective data lines D
3, data line D
1Two reparation circuits setting up are independently of one another; B on the reparation bar 103 between redundant segments 105-1 and the redundant segments 105-2
3Point, close on and repair the B that bar side second is repaired on the section 104-2
4Point and the B that repairs on the section 104-4 away from reparation bar side second
5Point is got and is used for the line of cut that disconnecting circuit connects, and makes respective data lines D
3, data line D
N-1Two reparation circuits setting up are independently of one another.Like this, then distinguish respective data lines D
3, D
N-1, D
1Electric current just can flow along the direction of arrow shown in Figure 16, repair and finish by data line D
3, D
N-1, D
1The breakpoint defective that produces.
In Figure 17, with data line D
3, D
N-1Breakpoint and data line D appear in outer peripheral areas 107
1, D
n108 breakpoint to occur be example in the viewing area.Described circuit restorative procedure comprises: for data line D
3, at data line D
3With repair the point of crossing P that bar 103 insulation intersect
1With data line D
3Repair bar side second and repair the point of crossing P that section 104-2 insulation intersects with closing on
2Carry out welding respectively, make data line D
3Be electrically connected respectively and repair bar 103 and close on the reparation bar side second reparation section 104-2; Utilize to connect line segment 106, selected redundant segments 105-1 is repaired bar side second and repairs section 104-2 and be electrically connected with repairing bar 103 and close on respectively; Foundation comprises repairs bar 103, redundant segments 105-1 and closes on the reparation circuit of repairing the bar side second reparation section 104-2.For data line D
N-1, at data line D
N-1With repair the point of crossing P that bar 103 insulation intersect
7With data line D
N-1Repair bar side second and repair the point of crossing P that section 104-2 insulation intersects with closing on
8Carry out welding respectively, make data line D
N-1Be electrically connected respectively and repair bar 103 and close on the reparation bar side second reparation section 104-2; Utilize to connect line segment 106, selected redundant segments 105-2 is repaired bar side second and repairs section 104-2 and be electrically connected with repairing bar 103 and close on respectively; Foundation comprises repairs bar 103, redundant segments 105-2 and closes on the reparation circuit of repairing the bar side second reparation section 104-2.For data line D
1, at data line D
1Repair bar side second and repair the point of crossing P that section 104-2 insulation intersects with closing on
3With data line D
1With the point of crossing P that intersects away from the second reparation section 104-4 insulation of reparation bar side
4Carry out welding respectively, make data line D
1Be electrically connected respectively to close on and repair the bar side second reparation section 104-2 and repair section 104-4 away from repairing bar side second; Foundation comprises closing on repairs the reparation circuit that bar side second is repaired section 104-2 and repaired section 104-4 away from reparation bar side second.For data line D
n, at data line D
nRepair bar side second and repair the point of crossing P that section 104-2 insulation intersects with closing on
9With data line D
nWith the point of crossing P that intersects away from the second reparation section 104-4 insulation of reparation bar side
10Carry out welding respectively, make data line D
nBe electrically connected respectively to close on and repair the bar side second reparation section 104-2 and repair section 104-4 away from repairing bar side second; Foundation comprises closing on repairs the reparation circuit that bar side second is repaired section 104-2 and repaired section 104-4 away from reparation bar side second.
In addition, closing on the B that repairs on the bar side second reparation section 104-2
1Point and the B that repairs on the section 104-4 away from reparation bar side second
2Point is got and is used for the line of cut that disconnecting circuit connects, and makes respective data lines D
3, data line D
1Two reparation circuits setting up are independently of one another; B on the reparation bar 103 between redundant segments 105-1 and the redundant segments 105-2
3Point and close on and repair the B that bar side second is repaired on the section 104-2
4Point and the B that repairs on the section 104-4 away from reparation bar side second
5Point is got and is used for the line of cut that disconnecting circuit connects, and makes respective data lines D
3, data line D
N-1Two reparation circuits setting up are independently of one another; Closing on the B that repairs on the bar side second reparation section 104-2
6Point and the B that repairs on the section 104-4 away from reparation bar side second
7Point is got and is used for the line of cut that disconnecting circuit connects, and makes respective data lines D
N-1, data line D
nTwo reparation circuits setting up are independently of one another.Like this, then distinguish respective data lines D
1, D
3, D
N-1, D
nElectric current just can flow along the direction of arrow shown in Figure 17, repair and finish by data line D
1, D
3, D
N-1, D
nThe breakpoint defective that produces.
In a word, line repair structure of the present invention and restorative procedure thereof are simple flexibly, can effectively repair the breakpoint defective that outer peripheral areas occurs, and can also repair many broken strings, can reduce fraction defective to a great extent, reduce manufacturing cost.
Though the present invention discloses as above with preferred embodiment, the present invention is defined in this.Any those skilled in the art without departing from the spirit and scope of the present invention, all can do various changes and modification, so protection scope of the present invention should be as the criterion with claim institute restricted portion.
Claims (26)
1. line repair structure, described line repair structure is applied in the array base palte of display device, and described array base palte has outer peripheral areas and viewing area, and described viewing area has the sweep trace and the data line of cross arrangement, it is characterized in that described line repair structure comprises:
Repair bar, be located at the outer peripheral areas of described array base palte, intersect with sweep trace or data line insulation in the described outer peripheral areas;
Facing the reparation bar side first of closing on of being located at described reparation bar repairs section or closes on the reparation bar side second reparation section, described closing on repaired bar side first and repaired section and intersects with described sweep trace insulation, and described closing on repaired the bar side second reparation section and insulated with described data line and intersect;
Redundant segments is located at the outer peripheral areas of described array base palte, is used for when circuit is repaired described reparation bar and described first repaired section or second and repairs section and be electrically connected.
2. line repair structure according to claim 1 is characterized in that, also comprise with the insulation of described sweep trace intersects away from repair bar side first repair section and with described data line insulation intersects away from the reparation bar side second reparation section; Described closing on repaired bar side first and repaired section, describedly repairs section and describedly repair section and be electrically connected when circuit is repaired away from repairing bar side first away from repairing bar side second; Described closing on repaired bar side second and repaired section, describedly repairs section and describedly repair section and be electrically connected when circuit is repaired away from repairing bar side second away from repairing bar side first.
3. line repair structure according to claim 1, it is characterized in that sweep trace in described reparation bar and the described outer peripheral areas or data line insulation intersect and specifically comprise: described reparation bar and described sweep trace be arranged in parallel and be arranged in parallel with described data line cross arrangement or described reparation bar and described data line and with described sweep trace cross arrangement.
4. line repair structure according to claim 1 is characterized in that, the material of described reparation bar is identical with the material of described sweep trace.
5. line repair structure according to claim 2, it is characterized in that the described reparation bar side first of closing on is repaired section, the described reparation bar side second reparation section, described away from repairing the bar side first reparation section with described identical with the material of described sweep trace away from the material of repairing the bar side second reparation section that closes on.
6. line repair structure according to claim 2, it is characterized in that described closing on repaired bar side first and repaired section or describedly repair in the section identical with insulate the mutually material of the material of the part section that intersects and described data line of described sweep trace away from repairing bar side first.
7. line repair structure according to claim 1 is characterized in that, the quantity of described redundant segments is at least one.
8. line repair structure according to claim 1 is characterized in that, the material of described redundant segments is identical with described data line material.
9. line repair structure, described line repair structure is applied in the array base palte of display device, and described array base palte has outer peripheral areas and viewing area, and described viewing area has the sweep trace and the data line of cross arrangement, it is characterized in that described line repair structure comprises:
Repair bar, be located at the outer peripheral areas of described array base palte, intersect with sweep trace or data line insulation in the described outer peripheral areas;
Facing the reparation bar side first of closing on of being located at described reparation bar repairs section and closes on the reparation bar side second reparation section, described closing on repaired bar side first and repaired section and intersects with described sweep trace insulation, and described closing on repaired the bar side second reparation section and insulated with described data line and intersect;
Redundant segments is located at the outer peripheral areas of described array base palte, is used for when circuit is repaired described reparation bar and described first repaired section or second and repairs section and be electrically connected.
10. line repair structure according to claim 9 is characterized in that, also comprise with the insulation of described sweep trace intersects away from repair bar side first repair section or with described data line insulation intersects away from the reparation bar side second reparation section; Described closing on repaired bar side first and repaired section, describedly repairs section and describedly repair section and be electrically connected when circuit is repaired away from repairing bar side first away from repairing bar side second; Described closing on repaired bar side second and repaired section, describedly repairs section and describedly repair section and be electrically connected when circuit is repaired away from repairing bar side second away from repairing bar side first.
11. line repair structure according to claim 9 is characterized in that, also comprise with the insulation of described sweep trace intersects away from repair bar side first repair section and with described data line insulation intersects away from the reparation bar side second reparation section; Described closing on repairs that bar side first is repaired section, described closing on repaired bar side second and repaired section, describedly repair section and describedly repair section and be electrically connected away from repairing bar side second away from repairing bar side first when circuit is repaired.
12. line repair structure according to claim 9, it is characterized in that sweep trace in described reparation bar and the described outer peripheral areas or data line insulation intersect and specifically comprise: described reparation bar and described sweep trace be arranged in parallel and be arranged in parallel with described data line cross arrangement or described reparation bar and described data line and with described sweep trace cross arrangement.
13. line repair structure according to claim 9 is characterized in that, the material of described reparation bar is identical with the material of described sweep trace.
14. according to claim 10 or 11 described line repair structures, it is characterized in that the described reparation bar side first of closing on is repaired section, the described reparation bar side second reparation section, described away from repairing the bar side first reparation section with described identical with the material of described sweep trace away from the material of repairing the bar side second reparation section that closes on.
15. according to claim 10 or 11 described line repair structures, it is characterized in that described closing on repaired bar side first and repaired section or describedly repair in the section identical with insulate the mutually material of the material of the part section that intersects and described data line of described sweep trace away from repairing bar side first.
16. line repair structure according to claim 9 is characterized in that, the quantity of described redundant segments is at least one.
17. line repair structure according to claim 9 is characterized in that, the material of described redundant segments is identical with described data line material.
18. according to the restorative procedure of each described line repair structure in the claim 1 to 17, described circuit restorative procedure comprises:
When breakpoint appears in described sweep trace or data line, determine the region of described breakpoint;
When the region of described breakpoint is outer peripheral areas, the reparation bar that intersects in the selected and described sweep trace insulation of relative two sides of the breakpoint of described sweep trace and repair bar side first with closing on of intersecting of described sweep trace insulation and repair section, perhaps the selected and described data line of relative two sides of the breakpoint of described data line insulate the reparation bar that intersects and with described data line insulate intersect close on the reparation bar side second reparation section;
Select described reparation bar and described redundant segments or selected described reparation bar and the described redundant segments of repairing between the bar side first reparation section of repairing between the bar side second reparation section that closes on that close on;
Selected described reparation bar, described closing on are repaired bar side first reparation section and the described sweep trace that breakpoint occurs of described redundant segments electrical connection, the described reparation bar that perhaps will select, described closing on are repaired bar side second reparation section and the described data line that breakpoint occurs of described redundant segments electrical connection, set up and repair circuit.
19. circuit restorative procedure according to claim 18 is characterized in that, also comprises:
When the region of described breakpoint is the viewing area, repair bar side first closing on of intersecting of the selected and described sweep trace insulation of relative two sides of the breakpoint of described sweep trace and repair section and repair section away from repairing bar side first, perhaps the selected and described data line insulation of relative two sides of the breakpoint of described data line intersects close on the reparation bar side second reparation section and away from the reparation bar side second reparation section;
Selected described closing on repaired the bar side first reparation section and be electrically connected the described sweep trace that breakpoint occurs away from repairing the bar side first reparation section, described the closing on that perhaps will select repaired the bar side second reparation section and repaired the described data line that breakpoint occurs of section electrical connection away from repairing bar side second, sets up the reparation circuit.
20. circuit restorative procedure according to claim 18 is characterized in that, the described described reparation bar that will select, described closing on are repaired bar side first and are repaired section and described redundant segments and be electrically connected the described sweep trace that breakpoint occurs and specifically comprise:
Described reparation bar and the described sweep trace that breakpoint occurs are located electrical welding in the point of crossing of the two;
Described closing on repaired that bar side first is repaired section and the described sweep trace that breakpoint occurs is located electrical welding in the point of crossing of the two;
Described redundant segments is electrically connected with described reparation bar and the described reparation bar side first reparation section that closes on respectively.
21. circuit restorative procedure according to claim 18 is characterized in that, the described described reparation bar that will select, described closing on are repaired bar side second and are repaired section and described redundant segments and be electrically connected the described data line that breakpoint occurs and specifically comprise:
Described reparation bar and the described data line that breakpoint occurs are located electrical welding in the point of crossing of the two;
Described closing on repaired that bar side second is repaired section and the described data line that breakpoint occurs is located electrical welding in the point of crossing of the two;
Described redundant segments is electrically connected with described reparation bar and the described reparation bar side second reparation section that closes on respectively.
22. circuit restorative procedure according to claim 19 is characterized in that, described described the closing on that will select repaired bar side first and repaired section and repair section and be electrically connected the described sweep trace that breakpoint occurs and specifically comprise away from repairing bar side first:
Described closing on repaired the bar side first reparation section and located electrical welding away from repairing bar side first reparation section and the described sweep trace that breakpoint occurs in its point of crossing.
23. circuit restorative procedure according to claim 19 is characterized in that, described described the closing on that will select repaired bar side second and repaired section and repair section and be electrically connected the described sweep trace that breakpoint occurs and specifically comprise away from repairing bar side second:
Described closing on repaired the bar side second reparation section and located electrical welding away from repairing bar side second reparation section and the described data line that breakpoint occurs in its point of crossing.
24., it is characterized in that described electrical welding realizes by laser welding according to claim 20,21,22 or 23 described circuit restorative procedures.
25. circuit restorative procedure according to claim 18, it is characterized in that, when also being included in sweep trace that breakpoint appears in described outer peripheral areas at least two to described reparation bar with repair the bar side first reparation section with closing on of intersecting of described sweep trace insulation and carry out step of cutting, when perhaps the data line that breakpoint occurs in described outer peripheral areas is at least two to described reparation bar with repair bar side second with closing on of intersecting of described data line insulation and repair section and carry out step of cutting, so that many reparation circuits of setting up are separate.
26. circuit restorative procedure according to claim 19, it is characterized in that, repairing bar side first with closing on of intersecting of described sweep trace insulation when also being included in sweep trace that breakpoint appears in described viewing area at least two pair repairs section and carries out step of cutting away from the reparation bar side first reparation section, the data line that perhaps occurs breakpoint in described viewing area is repaired bar side second with closing on of intersecting of described data line insulation during at least two pair and is repaired section and repair section and carry out step of cutting away from repairing bar side second, so that many reparation circuits of foundation are separate.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CN2009101951963A CN102004335A (en) | 2009-09-01 | 2009-09-01 | Line repairing structure and repairing method thereof |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN2009101951963A CN102004335A (en) | 2009-09-01 | 2009-09-01 | Line repairing structure and repairing method thereof |
Publications (1)
Publication Number | Publication Date |
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CN102004335A true CN102004335A (en) | 2011-04-06 |
Family
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CN2009101951963A Pending CN102004335A (en) | 2009-09-01 | 2009-09-01 | Line repairing structure and repairing method thereof |
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Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
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CN102929050A (en) * | 2012-10-31 | 2013-02-13 | 合肥京东方光电科技有限公司 | Array substrate, panel and display device |
CN103745662A (en) * | 2013-09-27 | 2014-04-23 | 友达光电股份有限公司 | Display, repairing method of display and manufacturing method of display |
CN106297646A (en) * | 2015-05-20 | 2017-01-04 | 上海和辉光电有限公司 | A kind of array base palte and restorative procedure thereof |
WO2017107951A1 (en) * | 2015-12-23 | 2017-06-29 | 南京中电熊猫液晶显示科技有限公司 | Liquid crystal display panel and method of repairing same |
CN110456583A (en) * | 2019-06-11 | 2019-11-15 | 惠科股份有限公司 | Display panel, repairing method thereof and display device |
CN114333580A (en) * | 2021-12-21 | 2022-04-12 | Tcl华星光电技术有限公司 | Display panel and display device |
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2009
- 2009-09-01 CN CN2009101951963A patent/CN102004335A/en active Pending
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102929050A (en) * | 2012-10-31 | 2013-02-13 | 合肥京东方光电科技有限公司 | Array substrate, panel and display device |
CN102929050B (en) * | 2012-10-31 | 2015-12-02 | 合肥京东方光电科技有限公司 | Array base palte, panel and display device |
US9268186B2 (en) | 2012-10-31 | 2016-02-23 | Hefei Boe Optoelectronics Technology Co., Ltd. | Array substrate, display panel and display device |
CN103745662A (en) * | 2013-09-27 | 2014-04-23 | 友达光电股份有限公司 | Display, repairing method of display and manufacturing method of display |
CN106297646A (en) * | 2015-05-20 | 2017-01-04 | 上海和辉光电有限公司 | A kind of array base palte and restorative procedure thereof |
WO2017107951A1 (en) * | 2015-12-23 | 2017-06-29 | 南京中电熊猫液晶显示科技有限公司 | Liquid crystal display panel and method of repairing same |
CN110456583A (en) * | 2019-06-11 | 2019-11-15 | 惠科股份有限公司 | Display panel, repairing method thereof and display device |
CN114333580A (en) * | 2021-12-21 | 2022-04-12 | Tcl华星光电技术有限公司 | Display panel and display device |
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