CN101988939B - External power supply device and power supply method thereof - Google Patents
External power supply device and power supply method thereof Download PDFInfo
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- CN101988939B CN101988939B CN200910055702.9A CN200910055702A CN101988939B CN 101988939 B CN101988939 B CN 101988939B CN 200910055702 A CN200910055702 A CN 200910055702A CN 101988939 B CN101988939 B CN 101988939B
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Abstract
The invention discloses an external power supply device and a power supply method thereof. The external power supply device is coupled to a card reading device and a device to be tested, and comprises a power supply unit and a power switching unit, wherein the power supply unit is used for providing an external voltage; the power switching unit is coupled to the card reading device, the power supply unit and the device to be tested, receives an internal voltage from the card reading device, and is controlled by a time sequence of the internal voltage to synchronously switch the external voltage into a testing voltage and output the testing voltage to the device to be tested. The external power supply device of the invention can provide the testing voltage with the time sequence the same as the starting time sequence of the internal voltage of the card reading device so as to normally start the device to be tested, and simultaneously can provide the power supply time sequence the same as the time sequence of the internal voltage of the card reading device and supply a sufficient operating voltage to the device to be tested under the condition of not modifying the original circuit of the device to be tested or the circuit of the card reading device in a computer.
Description
Technical field
The present invention relates to a kind of external power supply device and power supply method thereof, particularly relate to and a kind ofly can provide one to be synchronized with the test voltage of reader device output voltage sequential to external power supply device and the power supply method thereof of a device to be measured.
Background technology
The new spec that SD (secure digital) or Expresscard(are released by PCMCIA alliance, its advantage is that volume is less, transmission speed is faster, be more suitable for mobile system) be the product of interface, have that speed is fast, volume is little, power consumption is low and be easy to the advantages such as development, so the product application take SD or Expresscard interface as design basis is more and more extensive, function is also more and more.So, in the process of SD (secure digital) or Expresscard product development, need additional many circuit in a SD (secure digital) or Expresscard device to be measured, in order to experiment or the test of auxiliary this device to be measured.
But the power supply deliverability that the SD of computer-internal (secure digital) or Expresscard reader device provide is limited, the required power supply of this device to be measured often cannot meet all experiments or test time.In the case, easily cause unstable or this device to be measured of computing machine None-identified of test environment.
In addition, when SD (secure digital) or Expresscard product are linked up by reader device and computing machine, this also all has certain start-up routine regardless of data transmission or power supply supply in the time starting, even if directly supply voltage from outside to SD or Expresscard product, still can cause the reader device of externally fed sequential and computer-internal inconsistent, thereby the phenomenon generation of rear malfunction occurs normally to start or to start.
Please refer to Fig. 1, is the test macro block schematic diagram of legacy interface product.As shown in Figure 1, traditional test macro, utilize in computing machine (do not indicate) or a reader device 2 that is connected in computing machine directly connects devices 3 to be measured, and the function of this device 3 to be measured is when more, the peripheral circuit unit that coordinates experiment or test also can increase, therefore, the power consumption of device 3 entirety to be measured also can increase.In the time that overall power consumption is increased to voltage V1 that reader device 2 supplied and cannot loads, computing machine will generating means identification error or device to be measured 3 cannot normally start.
Even if directly directly supply voltage to device 3 to be measured by outside, also can supply the startup sequential of voltage and the voltage sequential of reader device 2 is inconsistent because of outside, and cause device 3 to be measured normally to start.Otherwise, if directly supplied by reader device 2 additional power sources, need to spend sizable cost and the existing circuit of time modification, and after having revised, be also not necessarily applicable to all SD newly developed (secure digital) or Expresscard product.
Prior art:
Supply voltage V1
The present invention:
External power supply device 1,1 '
Power-supply unit 10
Electrical source exchange unit 12
Power supply indicating member 14
Builtin voltage V1
External voltage V2
Test voltage V3
Resistance R 1, R2, R3, R4
P-MOS switch Q1
Earth terminal G
Switch Q2
Power input (+,-)
The 3rd output terminal OUT1
The 4th output terminal OUT2
Light emitting diode D1
Summary of the invention
In view of this, the invention provides a kind of external power supply device and power supply method thereof, the builtin voltage that external power supply device system can detect a reader device starts sequential, and provide a test voltage of the builtin voltage startup sequential that is same as reader device, so that device to be measured normally starts, and provide device to be measured required electricity consumption, and then solution legacy test system cannot meet the defect of installation's power source demand to be measured.
The present invention solves above-mentioned technical matters by following technical proposals:
A technical scheme of the present invention is: a kind of external power supply device, be coupled to a reader device and a device to be measured, and external power supply device includes a power-supply unit and an electrical source exchange unit.Wherein, power-supply unit is in order to provide an external voltage.Electrical source exchange unit is coupled to reader device, power-supply unit and device to be measured, electrical source exchange unit receives a builtin voltage from reader device, and be controlled by the sequential of builtin voltage, become a test voltage in order to synchronous switching external voltage, and output test voltage is to device to be measured, required power source during as device to be measured experiment or test, wherein the sequential of this test voltage is same as this builtin voltage, and the voltage swing of this test voltage is same as this external voltage.
Wherein, this electrical source exchange unit is a P-MOS(P type metal oxide semiconductor) switch, the grid of this P-MOS switch is coupled to this reader device, and the drain electrode of this P-MOS switch is coupled to this power-supply unit, and the source electrode of this P-MOS switch is coupled to an earth terminal and this device to be measured.
Wherein, this electrical source exchange unit comprises:
One switch, has a control end, one first output terminal and one second output terminal, and wherein this control end is coupled to this reader device, and for receiving this builtin voltage, this first output terminal is coupled to this power-supply unit, and this second output terminal is coupled to an earth terminal; And
One relay, has a power input, one the 3rd output terminal and one the 4th output terminal, and wherein this power input and the 3rd output terminal are coupled to this power-supply unit, and the 4th output terminal is coupled to this device to be measured.
Than last technical scheme of the present invention, the external power supply device of another technical scheme of the present invention also comprises a power supply indicating member, and wherein, power supply indicating member is coupled to electrical source exchange unit, it is according to the sequential of builtin voltage, in order to the indication of synchronous generation out/off.
Wherein, this electrical source exchange unit is a P-MOS switch, and the grid of this P-MOS switch is coupled to this reader device, and the drain electrode of this P-MOS switch is coupled to this power-supply unit, and the source electrode of this P-MOS switch is coupled to this power supply indicating member and this device to be measured.
Wherein, this power supply indicating member comprises a light emitting diode.
Wherein, this electrical source exchange unit comprises:
One switch, has a control end, one first output terminal and one second output terminal, and wherein this control end is coupled to this reader device, and for receiving this builtin voltage, this first output terminal is coupled to this power-supply unit, and this second output terminal is coupled to an earth terminal; And
One relay, has a power input and one the 3rd output terminal and one the 4th output terminal, and wherein this power input and the 3rd output terminal are coupled to this power-supply unit, and the 4th output terminal is coupled to this device to be measured.
Wherein, this power supply indicating member comprises a light emitting diode.
In addition, the present invention also provides a kind of external power source Supply Method, the steps include: first, receives a builtin voltage from a reader device.Then, according to the sequential of this builtin voltage, an external voltage is switching to a test voltage output, wherein the sequential of this test voltage is same as this builtin voltage, and the voltage swing of this test voltage is same as this external voltage.Finally, export this test voltage to one device to be measured, required power source during as device to be measured experiment or test.
Wherein, in step b, also comprise the step of adjusting this external voltage size.
Positive progressive effect of the present invention is:
External power supply device of the present invention can provide the test voltage that is same as reader device builtin voltage startup sequential, so that device to be measured normally starts.Meanwhile, do not need to revise under the reader device circuit conditions of original device to be measured or computer-internal, external power supply device of the present invention can provide the power supply timing identical with reader device builtin voltage, and supplies the operating voltage that device to be measured is sufficient.And external power supply device can directly be adjusted the different test voltage of output to device to be measured, to increase convenience and the elasticity of exploitation or experiment.And stable external power source supply also can allow the result of experiment or test more accurate simultaneously.
Above general introduction and ensuing detailed description all illustrate, and are in order to further illustrate claim of the present invention.And other objects and advantages of the present invention are set forth the explanation follow-up and diagram.
Accompanying drawing explanation
Fig. 1 is the test macro block schematic diagram of legacy interface product;
Fig. 2 is the circuit box schematic diagram of the external power supply device of the present invention's the first preferred embodiment;
Fig. 3 is the first implementing circuit schematic diagram of the present invention's the first preferred embodiment;
Fig. 4 is the second implementing circuit schematic diagram of the present invention's the first preferred embodiment;
Fig. 5 is the circuit box schematic diagram of the external power supply device of the present invention's the second preferred embodiment;
Fig. 6 is the first implementing circuit schematic diagram of the present invention's the second preferred embodiment;
Fig. 7 is the second implementing circuit schematic diagram of the present invention's the second preferred embodiment; And
Fig. 8 is voltage waveform view of the present invention.
Description of reference numerals:
Embodiment
Provide preferred embodiment of the present invention below in conjunction with accompanying drawing, to describe technical scheme of the present invention in detail.
Please refer to Fig. 2, is the circuit box schematic diagram of the external power supply device of the present invention's the first preferred embodiment.As shown in Figure 2, external power supply device 1 is coupled to a reader device 2 and a device 3 to be measured.External power supply device 1 includes a power-supply unit 10 and an electrical source exchange unit 12.Wherein, power-supply unit 10 provides an external voltage V2 to electrical source exchange unit 12.In addition, electrical source exchange unit 12 is coupled to reader device 2, power-supply unit 10 and device to be measured 3, simultaneously, electrical source exchange unit 12 receives a builtin voltage V1 from reader device 2, and be controlled by the sequential of builtin voltage V1, become a test voltage V3 in order to synchronous switching external voltage V2, and output test voltage V3 is to device 3 to be measured, required power source when testing or test as device 3 to be measured.
Referring again to Fig. 2, the sequential of the builtin voltage V1 that external power supply device 1 of the present invention is sent according to reader device 2, to provide the test voltage V3 of the sequential that is same as builtin voltage V1 to device 3 to be measured, so that device to be measured 3 normally starts.By adjusting, the power-supply unit 10 in external power supply device 1 can produce the external voltage V2 varying in size.In addition, electrical source exchange unit 12 is switching to test voltage V3 according to the sequential of builtin voltage V1 by external voltage V2.So, the sequential of test voltage V3 will be same as the sequential of builtin voltage V1, and the size of test voltage V3 can be directly proportional to external voltage V2.
So, external power supply device 1 of the present invention can provide the power supply timing identical with reader device 2 builtin voltages to device 3 to be measured, and, can directly adjust different test voltage V3 to device 3 to be measured, to increase convenience and the elasticity of exploitation or experiment, and stable external voltage V2 supply allows the result of experiment or test more accurate simultaneously.
Coordinate Fig. 2, please refer to Fig. 3.Fig. 3 is the first implementing circuit schematic diagram of the present invention's the first preferred embodiment.As shown in Figure 3, electrical source exchange unit 12 comprises a resistance R 1 and a P-MOS switch Q1, wherein, the grid of P-MOS switch Q1 is coupled to reader device 2 by resistance R 1, simultaneously, the drain electrode of P-MOS switch Q1 is coupled to power-supply unit 10, and the source electrode of P-MOS switch Q1 is coupled to an earth terminal G and device to be measured 3.
Referring again to Fig. 2 and Fig. 3.P-MOS switch Q1 receives builtin voltage V1 from reader device 2, and be controlled by the sequential of builtin voltage V1, and then external voltage V2 is switched to test voltage V3, so the sequential of test voltage V3 will be same as builtin voltage V1, and the large young pathbreaker of test voltage V3 is same as external voltage V2, as shown in Figure 8.
Coordinate Fig. 2, please refer to Fig. 4.Fig. 4 is the second implementing circuit schematic diagram of the present invention's the first preferred embodiment.As shown in Figure 4, electrical source exchange unit 12 comprises a switch Q2, a relay 120, resistance R 2 and resistance R 3.Wherein, the control end of switch Q2 is coupled to reader device 2 by resistance R 2, receive builtin voltage V1, and the first output terminal of switch Q2 is coupled to power-supply unit 10 by resistance R 3, and meanwhile, the second output terminal of switch Q2 is coupled to an earth terminal G.In addition, relay 120 have a power input+,-, one the 3rd output terminal OUT1 and one the 4th output terminal OUT2, wherein this power input+,-be coupled to power-supply unit 10 by resistance R 3, simultaneously, the 3rd output terminal OUT1 is coupled to power-supply unit 10, in addition, the 4th output terminal OUT2 is couple to device 3 to be measured.
Referring again to Fig. 2 and Fig. 4.Switch Q2 receives builtin voltage V1 from reader device 2, and is controlled by the sequential of builtin voltage V1, and conducting (ON) or cut-off (OFF).In the time of switch Q2 conducting, the power input of relay 120+,-excitation voltage (not indicating) received from resistance R 3, and then making a change-over switch (the not indicating) conducting between the 3rd output terminal OUT1 and the 4th output terminal OUT2, excitation voltage is that the external voltage V2 that power-supply unit 10 is exported is based upon the voltage in resistance R 3.So, the external voltage V2 that power-supply unit 10 is exported will become test voltage V3 via change-over switch, to deliver to device 3 to be measured.In addition, in the time that switch Q2 ends, the power input of relay 120+,-cannot receive excitation voltage, therefore, change-over switch between the 3rd output terminal OUT1 and the 4th output terminal OUT2 is cut-off state, and so, the test voltage V3 that delivers to device 3 to be measured will be no-voltage.
Referring again to Fig. 2 and Fig. 4.Switch Q2 receives builtin voltage V1 from reader device 2, and be controlled by the sequential of builtin voltage V1, and then external voltage V2 is switched to test voltage V3, so the sequential of test voltage V3 will be same as builtin voltage V1, and the large young pathbreaker of test voltage V3 is same as external voltage V2, as shown in Figure 8.
Coordinate Fig. 2, with reference to figure 5.Fig. 5 is the circuit box schematic diagram of the external power supply device of the present invention's the second preferred embodiment.Assembly in the present invention's the second preferred embodiment is identical with the first preferred embodiment, indicates with same-sign.The second preferred embodiment is identical with the effect reaching with the circuit operation principle of the first preferred embodiment, its main difference be in: the external power supply device 1 ' of the second preferred embodiment also comprises a power supply indicating member 14, wherein, power supply indicating member 14 is coupled to electrical source exchange unit 12, it is according to the sequential of builtin voltage V1, in order to the indication of synchronous generation out/off.
Coordinate Fig. 3 and Fig. 5, please refer to Fig. 6.Fig. 6 is the first implementing circuit schematic diagram of the present invention's the second preferred embodiment.Assembly in the first implementing circuit of the present invention's the second preferred embodiment is identical with the first implementing circuit of the first preferred embodiment, indicates with same-sign.The first implementing circuit of the second preferred embodiment is identical with the effect reaching with the circuit operation principle of the first implementing circuit of the first preferred embodiment, its main difference be in: the first implementing circuit of the second preferred embodiment also comprises the power supply indicating member 14 that a light emitting diode D1 and resistance R 4 form, and wherein light emitting diode D1 and resistance R 4 are connected in series between the source electrode and earth terminal G of P-MOS switch Q1.Meanwhile, light emitting diode D1 is according to the sequential of builtin voltage V1, in order to the indication of synchronous generation out/off.
Coordinate Fig. 4 and Fig. 5, with reference to figure 7.Fig. 7 is the second implementing circuit schematic diagram of the present invention's the second preferred embodiment.Assembly in the second implementing circuit of the present invention's the second preferred embodiment is identical with the second implementing circuit of the first preferred embodiment, indicates with same-sign.The second implementing circuit of the second preferred embodiment is identical with the effect reaching with the circuit operation principle of the second implementing circuit of the first preferred embodiment, its main difference be in: the second implementing circuit of the second preferred embodiment also comprises the power supply indicating member 14 that a light emitting diode D1 and resistance R 4 are composed in series, and wherein light emitting diode D1 and resistance R 4 are connected in parallel in resistance R 3.Meanwhile, light emitting diode D1 is according to the sequential of builtin voltage V1, in order to the indication of synchronous generation out/off.
Coordinate Fig. 2, next external power source Supply Method of the present invention is described.External power source Supply Method step of the present invention comprises as follows, first, receives a builtin voltage V1 from a reader device 2.Then, according to the sequential of builtin voltage V1, switch an external voltage V2 and become a test voltage V3, wherein can be by adjusting the size of external voltage V2, synchronously to adjust the size of test voltage V3.Finally, timing synchronization is delivered to a device 3 to be measured in builtin voltage V1 and the big or small test voltage V3 that is same as external voltage V2.
In sum, external power supply device of the present invention can provide the power supply timing identical with reader device builtin voltage, and supplies the operating voltage that device to be measured is sufficient.Meanwhile, external power supply device of the present invention can directly be adjusted the different voltage to be measured of output to device to be measured, to increase convenience and the elasticity of exploitation or experiment.
Although more than described the specific embodiment of the present invention, it will be understood by those of skill in the art that these only illustrate, do not deviating under the prerequisite of principle of the present invention and essence, can make various changes or modifications to these embodiments.Therefore, protection scope of the present invention is limited by appended claims.
Claims (10)
1. an external power supply device, is characterized in that, it is coupled to a reader device and a device to be measured, and this external power supply device includes:
One power-supply unit, provides an external voltage; And
One electrical source exchange unit, be coupled to this reader device, this power-supply unit and this device to be measured, this electrical source exchange unit receives a builtin voltage from this reader device, and be controlled by the sequential of this builtin voltage, synchronous this external voltage that switches becomes a test voltage, and export this test voltage to this device to be measured, wherein the sequential of this test voltage is same as this builtin voltage, and the voltage swing of this test voltage is same as this external voltage.
2. external power supply device as claimed in claim 1, it is characterized in that, this electrical source exchange unit is a P-MOS switch, the grid of this P-MOS switch is coupled to this reader device, the drain electrode of this P-MOS switch is coupled to this power-supply unit, and the source electrode of this P-MOS switch is coupled to an earth terminal and this device to be measured.
3. external power supply device as claimed in claim 1, is characterized in that, this electrical source exchange unit comprises:
One switch, has a control end, one first output terminal and one second output terminal, and wherein this control end is coupled to this reader device, and for receiving this builtin voltage, this first output terminal is coupled to this power-supply unit, and this second output terminal is coupled to an earth terminal; And
One relay, has a power input, one the 3rd output terminal and one the 4th output terminal, and wherein this power input and the 3rd output terminal are coupled to this power-supply unit, and the 4th output terminal is coupled to this device to be measured.
4. an external power supply device, is characterized in that, it is coupled to a reader device and a device to be measured, and this external power supply device includes:
One power-supply unit, provides an external voltage;
One electrical source exchange unit, be coupled to this reader device, this power-supply unit and this device to be measured, this electrical source exchange unit receives a builtin voltage from this reader device, and be controlled by the sequential of this builtin voltage, synchronous this external voltage that switches becomes a test voltage, and export this test voltage to this device to be measured, wherein the sequential of this test voltage is same as this builtin voltage, and the voltage swing of this test voltage is same as this external voltage; And
One power supply indicating member, this power supply indicating member is coupled to this electrical source exchange unit, according to the sequential of this builtin voltage, synchronously to produce out/off indication.
5. external power supply device as claimed in claim 4, it is characterized in that, this electrical source exchange unit is a P-MOS switch, the grid of this P-MOS switch is coupled to this reader device, the drain electrode of this P-MOS switch is coupled to this power-supply unit, and the source electrode of this P-MOS switch is coupled to this power supply indicating member and this device to be measured.
6. external power supply device as claimed in claim 5, is characterized in that, this power supply indicating member comprises a light emitting diode.
7. external power supply device as claimed in claim 4, is characterized in that, this electrical source exchange unit comprises:
One switch, has a control end, one first output terminal and one second output terminal, and wherein this control end is coupled to this reader device, and for receiving this builtin voltage, this first output terminal is coupled to this power-supply unit, and this second output terminal is coupled to an earth terminal; And
One relay, has a power input and one the 3rd output terminal and one the 4th output terminal, and wherein this power input and the 3rd output terminal are coupled to this power-supply unit, and the 4th output terminal is coupled to this device to be measured.
8. external power supply device as claimed in claim 7, is characterized in that, this power supply indicating member comprises a light emitting diode.
9. an external power source Supply Method, is characterized in that, is applicable to comprise a power-supply unit and an electrical source exchange unit and is coupled to a reader device and an external power supply device of a device to be measured, and its step comprises:
A. this electrical source exchange unit receives a builtin voltage from this reader device;
B. this electrical source exchange unit is according to the sequential of this builtin voltage, the external voltage that synchronous this power-supply unit of switching provides becomes a test voltage, wherein the sequential of this test voltage is same as this builtin voltage, and the voltage swing of this test voltage is same as this external voltage;
C. this test voltage is exported to this device to be measured in this electrical source exchange unit.
10. external power source Supply Method as claimed in claim 9, is characterized in that, in step b, also comprises the step of adjusting this external voltage size.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN200910055702.9A CN101988939B (en) | 2009-07-31 | 2009-07-31 | External power supply device and power supply method thereof |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN200910055702.9A CN101988939B (en) | 2009-07-31 | 2009-07-31 | External power supply device and power supply method thereof |
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| CN101988939A CN101988939A (en) | 2011-03-23 |
| CN101988939B true CN101988939B (en) | 2014-06-04 |
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| TWI505603B (en) * | 2013-12-23 | 2015-10-21 | Fsp Technology Inc | Apparatus and method for power supply |
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| US5706426A (en) * | 1996-02-07 | 1998-01-06 | United Microelectronics Corporation | Software protection method and apparatus |
| CN2533519Y (en) * | 2001-10-29 | 2003-01-29 | 伦飞电脑实业股份有限公司 | Output/input port module circuit for connecting computer peripheral |
| CN1793991A (en) * | 2005-10-31 | 2006-06-28 | 李博航 | Testing system of IC card interface electric characteristics |
| TW200641898A (en) * | 2005-05-27 | 2006-12-01 | Yield Microelectronics Corp | Voltage level converting circuit for use in flash memory |
| CN101452746A (en) * | 2007-12-06 | 2009-06-10 | 精工电子有限公司 | Power supply switching circuit |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002024046A (en) * | 2000-07-11 | 2002-01-25 | Mitsubishi Electric Corp | Microcomputer, its memory contents changing system and memory contents changing method |
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Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5706426A (en) * | 1996-02-07 | 1998-01-06 | United Microelectronics Corporation | Software protection method and apparatus |
| CN2533519Y (en) * | 2001-10-29 | 2003-01-29 | 伦飞电脑实业股份有限公司 | Output/input port module circuit for connecting computer peripheral |
| TW200641898A (en) * | 2005-05-27 | 2006-12-01 | Yield Microelectronics Corp | Voltage level converting circuit for use in flash memory |
| CN1793991A (en) * | 2005-10-31 | 2006-06-28 | 李博航 | Testing system of IC card interface electric characteristics |
| CN101452746A (en) * | 2007-12-06 | 2009-06-10 | 精工电子有限公司 | Power supply switching circuit |
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Effective date of registration: 20150924 Address after: 201206 Shanghai City Jingqiao export processing zone of Pudong New Area dragon road 501 Patentee after: USI ELECTRONICS (SHANGHAI) CO., LTD. Address before: Zhangjiang hi tech park integrated circuit industry Zhang Road 201203 Shanghai City No. 1558 Patentee before: Huanxu Electronics Co., Ltd. |