CN101931477A - System and method for automatically testing performance of TD-LTE (Time Division-Long Term Evolution) terminal - Google Patents

System and method for automatically testing performance of TD-LTE (Time Division-Long Term Evolution) terminal Download PDF

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Publication number
CN101931477A
CN101931477A CN2010102703569A CN201010270356A CN101931477A CN 101931477 A CN101931477 A CN 101931477A CN 2010102703569 A CN2010102703569 A CN 2010102703569A CN 201010270356 A CN201010270356 A CN 201010270356A CN 101931477 A CN101931477 A CN 101931477A
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project
terminal
measurement
lte
lte terminal
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CN101931477B (en
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曾志雄
李婷
王波
晏建军
张家平
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Hubei Zhongyou Technology Industry & Commerce Co Ltd
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Hubei Zhongyou Technology Industry & Commerce Co Ltd
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Abstract

The invention discloses a system for automatically testing the performance of a TD-LTE (Time Division-Long Term Evolution) terminal, comprising a terminal tester and a PC (Personal Computer), wherein the terminal tester starts performance measurement under the control of the PC to carry out performance measurement on the TD-LTE terminal to be measured according to the information of each measuring item in an item configuring file of the PC and then transmits a measuring result to the PC. The system can successfully measure the performance of the TD-LTE terminal to be measured without artificial participation in the whole process of performance measurement so that the manpower cost is reduced, and the measuring progress is improved. The system can measure one item or all times for many times. The invention simultaneously discloses a method for automatically testing the performance of the TD-LTE terminal.

Description

TD-LTE terminal capabilities Auto-Test System and method
Technical field
The present invention relates to a kind of Auto-Test System and automatic test approach that is used to measure the TD-LTE terminal capabilities.
Background technology
Along with the TD-LTE technology is increasingly mature, TD-LTE terminal output strengthens gradually.Because the influence of the factors such as different assembling sequences of the type of device of being selected when the TD-LTE terminal is produced, the variations in temperature in the production process, device, even based on same platform and same design, the TD-LTE terminal that different performance also may occur, the performance that therefore detects the TD-LTE terminal of producing is real in necessary.
Terminal tester is the equipment that the TD-LTE terminal is carried out performance test.The performance of the existing TD-LTE of detection terminal realizes that by manual terminal tester this method of testing does not reach the progress of appointment far away.
Therefore, be necessary to provide a kind of improved system and method that is used to detect the TD-LTE terminal capabilities, improve the detection progress.
Summary of the invention
The purpose of this invention is to provide a kind of TD-LTE terminal capabilities Auto-Test System and method, need not manual operation, can improve the progress that detects.
To achieve these goals, the invention provides a kind of TD-LTE terminal capabilities Auto-Test System, comprising: terminal tester is applicable to TD-LTE terminal to be measured to be connected; PC, be connected with described terminal tester and dispose project profile, described project profile comprises a plurality of measurement project information, measure project information for every and comprise corresponding measurement project, and the test frequency range of measurement project correspondence, frequency, bandwidth, cell power, parameter rolls off the production line on the test event result, wherein, described terminal tester startability under the control of described PC is measured, according to each the measurement project information in the project profile in the described PC described TD-LTE terminal to be measured is carried out performance measurement, measurement result is sent to described PC.
In one embodiment of the invention, described terminal tester is connected with described TD-LTE terminal to be measured via its radio frequency delivery outlet and by radio frequency line.
In another embodiment of the present invention, described PC is by the USB-GPIB patchcord or directly by network and described terminal tester.
In an embodiment more of the present invention, the project profile of described terminal tester configuration is directed into test program.
In another embodiment of the present invention, described measurement project comprises transmitting power, receiving sensitivity, maximum input level, ACLR, occupied bandwidth, spectrum radiation template, power control, emission modulation, switch power, frequency error, phase error, performance index, the report of channel shape body.
The present invention also provides a kind of TD-LTE terminal capabilities automatic test approach, comprise the steps: to dispose project profile, described project profile comprises a plurality of measurement project information, measure project information for every and comprise corresponding measurement project, and the test frequency range of measurement project correspondence, frequency, bandwidth, cell power, test event result on the parameter that rolls off the production line; Power-on command is to terminal tester, so that the terminal tester start is in order to test; Set up being connected between terminal tester and the TD-LTE terminal to be measured; Set up the conversation between terminal tester and the TD-LTE terminal to be measured; Terminal tester carries out performance measurement according to each the measurement project information in the described project profile to described TD-LTE terminal to be measured.
In one embodiment of the invention, described measurement project comprises transmitting power, receiving sensitivity, maximum input level, ACLR, occupied bandwidth, spectrum radiation template, power control, emission modulation, switch power, frequency error, phase error, performance index, the report of channel shape body.
In another embodiment of the present invention, also comprise step: described project profile is imported test program; Revise described test program to revise the environment of the measurement project or the project of measurement.
In an embodiment more of the present invention, described method also comprises step: when the measurement result of arbitrary measurement project information correspondence during not in prescribed limit, this measurement project information is remeasured.
In another embodiment of the present invention, described method also comprises step: after all the measurement project information measurements in the described project profile finish, all the measurement project information in the described project profile are remeasured.
Compared with prior art, TD-LTE terminal capabilities Auto-Test System of the present invention and method can successfully be measured the performance of TD-LTE terminal to be measured, and whole performance measurement process need not artificial participation, can save human cost, improve terminal research and development and the progress of producing.
In addition, TD-LTE terminal capabilities Auto-Test System of the present invention and method can be provided with resurveys to a certain measurement project, so native system can repeatedly be measured certain project.
Moreover TD-LTE terminal capabilities Auto-Test System of the present invention and method can repeatedly be measured whole projects, to reflect stability and the consistency of TD-LTE terminal 200 to be measured in a period of time.。
By following description also in conjunction with the accompanying drawings, it is more clear that the present invention will become, and these accompanying drawings are used to explain embodiments of the invention.
Description of drawings
Fig. 1 is the composition frame chart of TD-LTE terminal capabilities Auto-Test System of the present invention.
Fig. 2 is the flow chart of TD-LTE terminal capabilities automatic test approach of the present invention.
Embodiment
With reference now to accompanying drawing, describe embodiments of the invention, the similar elements label is represented similar elements in the accompanying drawing.
With reference to figure 1, TD-LTE terminal capabilities Auto-Test System 100 of the present invention comprises:
Terminal tester 120, its radio frequency delivery outlet is connected with TD-LTE terminal 200 to be measured by radio frequency line;
PC 110, by the USB-GPIB patchcord or directly be connected with terminal tester 120 by network,
Wherein, terminal tester 120 automatically performs test event under the control of PC 110, and TD-LTE terminal 200 to be measured is carried out performance measurement, and measurement result is sent to PC 110.
With reference to figure 2, the step that 100 pairs of TD-LTE terminals 200 to be measured of TD-LTE terminal capabilities Auto-Test System shown in Figure 1 are carried out performance measurement is as follows:
Step S1, the project profile that configures on the PC 110 is imported the test program of PC 110, use all measurement project information of autotest program TpItem structural array stock item configuration file, wherein, comprise in the project profile that many are measured project information, measure project information for every and comprise corresponding measurement project, and the test frequency range of measurement project correspondence, frequency, bandwidth, cell power, test event result on the parameter that rolls off the production line;
Step S2, PC send power-on command to terminal tester 120, so that terminal tester 120 starts prepare to measure;
Step S3, terminal tester 120 sends cell power to TD-LTE terminal 200 to be measured, TD-LTE terminal 200 to be measured receives that signal and feedback signal are to terminal tester 120, whether the state of checking terminal tester 120 when terminal tester 120 be IDLE state represents terminal tester 120 and to be measured TD-LTE terminal 200 successfully connect for going into net state (IDLE);
Step S4, terminal tester 120 sends calling order to TD-LTE terminal 200 to be measured, TD-LTE terminal 200 to be measured is received calling order and is fed back calling order to terminal tester 120, successfully to set up conversation (after the successfully foundation of conversing, the beginning terminal capabilities is measured);
Step S5, PC is measured project information as current measurement project information with article one of autotest program TpItem structural array;
Step S6, terminal tester 120 calls respective function according to the current project information in the PC, according to the current project of this function measurement, reads currentitem purpose measurement result;
Step S7, terminal tester 120 judge currentitem purpose measurement result whether in prescribed limit (3GPP 36.521 agreements stipulated each measure project survey result's scope), if, continue next step, if not, change step S11;
Step S8, terminal tester 120 judge whether all items information of the autotest program TpItem structural array in the PC travels through and finish, if, continue next step, if not, change step S10;
Step S9, project survey finishes, and the integrality of measuring project is 0, and terminal tester 120 is sent to PC 110 with the measurement result of each project, and PC 110 shows the measurement result of all items and the number of measurement result, finishes;
Step S10 measures project information as current measurement project information with next of current measurement project information, changes step S6;
Step S11 judges whether current project is resurveyed, if, continue next step, if not, change step S13;
Step S12 judges whether the number of times of resurveying surpasses the threshold values number of times, if, continue next step, if not, change step S6;
Step S13 shows that current project survey does not pass through, and changes step S8.
As from the foregoing, this TD-LTE terminal capabilities Auto-Test System 100 can successfully be measured the performance of TD-LTE terminal 200 to be measured, and easy to use, can improve terminal research and development and the progress of producing.Whole performance measurement process need not artificial participation, can save human cost.
In addition, in step S11, can be provided with a certain measurement project is resurveyed, so native system can repeatedly be measured certain project.
Moreover, if terminal tester 120 is provided with repeatedly and measures, so after all items information of Tp I t em structural array has traveled through and has shown (being step S9), automatically discharge being connected between TD-LTE terminal 200 to be measured and the terminal tester 120, set up again and connect for the second time and carry out performance test, till testing time is the specified measurement number of times, so native system can repeatedly measure whole projects, reflects stability and the consistency of TD-LTE terminal 200 to be measured in a period of time.
At last, as Fig. 3, the PC 110 of native system and method can be connected with a plurality of terminal testers 120 by USB-G PIB or network (LAN mouth), thereby a plurality of TD-LTE terminals 200 to be measured are carried out performance test.
Need to prove, native system can be to every of the project profile content of measuring project information (as rolling off the production line on frequency range, frequency, bandwidth, cell power, test event and the judged result, be the basic parameter of terminal tester) be provided with, also can produce the power-on command (promptly testing control command) that is sent to terminal tester 120 among the step S2, to start the performance measurement of 120 pairs of terminals of terminal tester.
In addition, in step S9, after project survey finishes, terminal tester 120 is with the information of other measurement projects except that measurement result of each project, as measure the title of project, corresponding measuring frequency, terminal transmit power, terminal received power, measured value lower limit, measurement result, the measured value upper limit etc. and be sent to PC 110, PC 110 shows that all measure the information of projects.
According to protocol requirement, the measurement project in the project profile that configures among the step S1 comprises transmitting power, receiving sensitivity, maximum input level, ACLR, occupied bandwidth, spectrum radiation template, power control, emission modulation, switch power, frequency error, phase error, performance index (demand), the report of channel shape body.Above-mentioned measurement project comprises the measurement index of two kinds of terminals of TD-LTE (mobile phone and card of surfing Internet).
Because the measurement project in the project profile that configures in the native system imports test program, therefore can in test program, revise the measurement project, this on the one hand can be according to user's the relevant measurement project of different demand configurations, can change certain environment of measuring project (, may change cell power) on the other hand according to different demands according to real needs such as requiring cell power to be-the 25dbm test in the maximum input level agreement.This method provides configurable measurement environment such as frequency, cell power, measurement number of times, and wherein measurement lower limit value and higher limit are all decided according to TD-LTE dependence test agreement.
When PC 110 by the USB-GPIB patchcord or by network with after terminal tester 120 is connected, native system can be selected the communication mode of PC 110 and terminal tester 120, promptly selects GPI B to communicate by letter or network service.Particularly, as Fig. 4, after PC 110 passes through the USB-GPIB patchcord and terminal tester 120 is connected, PC 110 obtains the GPI B address and the line loss value of terminal tester 120, open VI SA resource, initialization GP IB, obtain GPIB control handle to set up communicating by letter between PC 110 and the terminal tester 120 according to GPIB address and line loss value, PC 110 is created the process of test threads with control communication then, and then the process of carrying out performance test by 120 pairs of TD-LTE terminals 200 to be measured of GPIB Control on Communication terminal tester; When PC 110 by network with after terminal tester 120 is connected, PC 110 obtains the network address and the line loss value of terminal tester 120, open Internet resources, obtain the network control handle to set up communicating by letter between PC 110 and the terminal tester 120 according to the network address and line loss value, PC 110 is created the process of test threads with control communication then, and then the process of carrying out performance test by 120 pairs of TD-LTE terminals 200 to be measured of network service control terminal tester.
Above invention has been described in conjunction with most preferred embodiment, but the present invention is not limited to the embodiment of above announcement, and should contain various modification, equivalent combinations of carrying out according to essence of the present invention.

Claims (10)

1. TD-LTE terminal capabilities Auto-Test System comprises:
Terminal tester is applicable to TD-LTE terminal to be measured to be connected; And
PC, be connected with described terminal tester and dispose project profile, described project profile comprises a plurality of measurement project information, measure project information for every and comprise corresponding measurement project, and the test frequency range of measurement project correspondence, frequency, bandwidth, cell power, test event result on the parameter that rolls off the production line;
Wherein, described terminal tester startability under the control of described PC is measured, and according to each the measurement project information in the project profile in the described PC described TD-LTE terminal to be measured is carried out performance measurement, and measurement result is sent to described PC.
2. TD-LTE terminal capabilities Auto-Test System as claimed in claim 1 is characterized in that, described terminal tester is connected with described TD-LTE terminal to be measured via its radio frequency delivery outlet and by radio frequency line.
3. TD-LTE terminal capabilities Auto-Test System as claimed in claim 1 is characterized in that, described PC is by the USB-GPIB patchcord or directly by network and described terminal tester.
4. TD-LTE terminal capabilities Auto-Test System as claimed in claim 1 is characterized in that, the project profile of described terminal tester configuration is directed into test program.
5. TD-LTE terminal capabilities Auto-Test System as claimed in claim 1, it is characterized in that described measurement project comprises transmitting power, receiving sensitivity, maximum input level, ACLR, occupied bandwidth, spectrum radiation template, power control, emission modulation, switch power, frequency error, phase error, performance index and the report of channel shape body.
6. a TD-LTE terminal capabilities automatic test approach comprises the steps:
The configuration project profile, described project profile comprises a plurality of measurement project information, measure project information for every and comprise corresponding measurement project, and the test frequency range of measurement project correspondence, frequency, bandwidth, cell power, test event result on the parameter that rolls off the production line;
Send power-on command to terminal tester, so that the terminal tester start is in order to test;
Set up being connected between terminal tester and the TD-LTE terminal to be measured;
Set up the conversation between terminal tester and the TD-LTE terminal to be measured;
Terminal tester carries out performance measurement according to each the measurement project information in the described project profile to described TD-LTE terminal to be measured.
7. TD-LTE terminal capabilities automatic test approach as claimed in claim 6, it is characterized in that described measurement project comprises transmitting power, receiving sensitivity, maximum input level, ACLR, occupied bandwidth, spectrum radiation template, power control, emission modulation, switch power, frequency error, phase error, performance index and the report of channel shape body.
8. TD-LTE terminal capabilities automatic test approach as claimed in claim 6 is characterized in that, also comprises step:
Described project profile is imported test program;
Revise described test program to revise the environment of the measurement project or the project of measurement.
9. TD-LTE terminal capabilities automatic test approach as claimed in claim 6 is characterized in that, also comprises step:
When the measurement result of arbitrary measurement project information correspondence during, this measurement project information is remeasured not in prescribed limit.
10. TD-LTE terminal capabilities automatic test approach as claimed in claim 6 is characterized in that, also comprises step:
After all the measurement project information measurements in the described project profile finish, all the measurement project information in the described project profile are remeasured.
CN2010102703569A 2010-09-02 2010-09-02 System and method for automatically testing performance of TD-LTE (Time Division-Long Term Evolution) terminal Expired - Fee Related CN101931477B (en)

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Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102882611A (en) * 2011-07-11 2013-01-16 联芯科技有限公司 Automatic test method and device for radio-frequency performance comparison
CN103209039A (en) * 2013-03-21 2013-07-17 大唐联仪科技有限公司 Multi-bandwidth neighborhood radio frequency testing method, device and system
CN103218280A (en) * 2013-04-15 2013-07-24 飞天诚信科技股份有限公司 Hardware general testing method of USB (Universal Serial Bus) equipment
CN103346850A (en) * 2013-07-11 2013-10-09 深圳供电局有限公司 Terminal testing device based on LTE230 system
CN103546345A (en) * 2013-10-24 2014-01-29 广东欧珀移动通信有限公司 Method and device for testing performance of communication equipment
CN104168583A (en) * 2013-05-17 2014-11-26 深圳市豪恩安全科技有限公司 Wireless bidirectional communication testing method, apparatus and system
CN106612149A (en) * 2015-10-23 2017-05-03 小米科技有限责任公司 Radio frequency circuit test method, device, system and mobile terminal
CN108683465A (en) * 2018-05-16 2018-10-19 深圳市广和通无线通信软件有限公司 Signaling testing method, device, computer equipment and storage medium
CN111239503A (en) * 2020-04-29 2020-06-05 延锋伟世通电子科技(南京)有限公司 LTE performance test method of IVI host based on integrated 4G module
CN114828061A (en) * 2021-01-22 2022-07-29 成都鼎桥通信技术有限公司 Radio frequency test method, device, equipment and readable storage medium

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20030028343A1 (en) * 2001-05-23 2003-02-06 Micron Technology, Inc. Intelligent measurement modular semiconductor parametric test system
US20040203726A1 (en) * 2002-11-20 2004-10-14 Arima Communication Corp. Testing system for cellular phone module and method thereof
CN1983828A (en) * 2006-05-25 2007-06-20 华为技术有限公司 Terminal scramble testing system and method
CN101119168A (en) * 2007-09-21 2008-02-06 深圳市虹远通信有限责任公司 Automatic testing method and system of TDSCDMA integrated module to digital interface

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20030028343A1 (en) * 2001-05-23 2003-02-06 Micron Technology, Inc. Intelligent measurement modular semiconductor parametric test system
US20040203726A1 (en) * 2002-11-20 2004-10-14 Arima Communication Corp. Testing system for cellular phone module and method thereof
CN1983828A (en) * 2006-05-25 2007-06-20 华为技术有限公司 Terminal scramble testing system and method
CN101119168A (en) * 2007-09-21 2008-02-06 深圳市虹远通信有限责任公司 Automatic testing method and system of TDSCDMA integrated module to digital interface

Cited By (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102882611A (en) * 2011-07-11 2013-01-16 联芯科技有限公司 Automatic test method and device for radio-frequency performance comparison
CN102882611B (en) * 2011-07-11 2015-01-07 联芯科技有限公司 Automatic test method and device for radio-frequency performance comparison
CN103209039A (en) * 2013-03-21 2013-07-17 大唐联仪科技有限公司 Multi-bandwidth neighborhood radio frequency testing method, device and system
CN103218280A (en) * 2013-04-15 2013-07-24 飞天诚信科技股份有限公司 Hardware general testing method of USB (Universal Serial Bus) equipment
CN103218280B (en) * 2013-04-15 2016-12-28 飞天诚信科技股份有限公司 A kind of hardware universal testing method of USB device
CN104168583B (en) * 2013-05-17 2018-07-20 深圳市豪恩安全科技有限公司 A kind of wireless bidirectional communication test method, device and system
CN104168583A (en) * 2013-05-17 2014-11-26 深圳市豪恩安全科技有限公司 Wireless bidirectional communication testing method, apparatus and system
CN103346850A (en) * 2013-07-11 2013-10-09 深圳供电局有限公司 Terminal testing device based on LTE230 system
CN103346850B (en) * 2013-07-11 2015-10-21 深圳供电局有限公司 A kind of terminal test device based on LTE230 system
CN103546345A (en) * 2013-10-24 2014-01-29 广东欧珀移动通信有限公司 Method and device for testing performance of communication equipment
CN106612149A (en) * 2015-10-23 2017-05-03 小米科技有限责任公司 Radio frequency circuit test method, device, system and mobile terminal
CN106612149B (en) * 2015-10-23 2021-06-01 小米科技有限责任公司 Radio frequency circuit testing method, device and system and mobile terminal
CN108683465A (en) * 2018-05-16 2018-10-19 深圳市广和通无线通信软件有限公司 Signaling testing method, device, computer equipment and storage medium
CN108683465B (en) * 2018-05-16 2021-08-17 深圳市广和通无线通信软件有限公司 Signaling test method and device, computer equipment and storage medium
CN111239503A (en) * 2020-04-29 2020-06-05 延锋伟世通电子科技(南京)有限公司 LTE performance test method of IVI host based on integrated 4G module
CN111239503B (en) * 2020-04-29 2020-08-28 延锋伟世通电子科技(南京)有限公司 LTE performance test method of IVI host based on integrated 4G module
CN114828061A (en) * 2021-01-22 2022-07-29 成都鼎桥通信技术有限公司 Radio frequency test method, device, equipment and readable storage medium
CN114828061B (en) * 2021-01-22 2023-10-03 成都鼎桥通信技术有限公司 Radio frequency test method, device, equipment and readable storage medium

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