CN101887106B - Hall chip magnetic flux test device - Google Patents
Hall chip magnetic flux test device Download PDFInfo
- Publication number
- CN101887106B CN101887106B CN201010202127A CN201010202127A CN101887106B CN 101887106 B CN101887106 B CN 101887106B CN 201010202127 A CN201010202127 A CN 201010202127A CN 201010202127 A CN201010202127 A CN 201010202127A CN 101887106 B CN101887106 B CN 101887106B
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- test
- magnetic flux
- hall chip
- coil
- magnetic
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- 238000012360 testing method Methods 0.000 title claims abstract description 126
- 230000004907 flux Effects 0.000 title claims abstract description 31
- 238000004806 packaging method and process Methods 0.000 claims description 15
- 238000000034 method Methods 0.000 claims description 12
- 239000003822 epoxy resin Substances 0.000 claims description 5
- 239000011521 glass Substances 0.000 claims description 5
- 229920000647 polyepoxide Polymers 0.000 claims description 5
- 230000008569 process Effects 0.000 claims description 5
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 4
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 3
- 229910052782 aluminium Inorganic materials 0.000 claims description 3
- 229910052802 copper Inorganic materials 0.000 claims description 3
- 239000010949 copper Substances 0.000 claims description 3
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 abstract description 5
- 229910052737 gold Inorganic materials 0.000 abstract description 5
- 239000010931 gold Substances 0.000 abstract description 5
- 238000005538 encapsulation Methods 0.000 abstract 2
- 238000009434 installation Methods 0.000 description 11
- 230000005389 magnetism Effects 0.000 description 8
- 239000004020 conductor Substances 0.000 description 5
- 239000000696 magnetic material Substances 0.000 description 5
- 238000010586 diagram Methods 0.000 description 4
- 230000005415 magnetization Effects 0.000 description 4
- 230000005355 Hall effect Effects 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 2
- 230000009466 transformation Effects 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 238000001739 density measurement Methods 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 230000005690 magnetoelectric effect Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 230000035699 permeability Effects 0.000 description 1
- 238000007747 plating Methods 0.000 description 1
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- Measuring Magnetic Variables (AREA)
Abstract
Description
Claims (3)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201010202127A CN101887106B (en) | 2010-06-13 | 2010-06-13 | Hall chip magnetic flux test device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201010202127A CN101887106B (en) | 2010-06-13 | 2010-06-13 | Hall chip magnetic flux test device |
Publications (2)
Publication Number | Publication Date |
---|---|
CN101887106A CN101887106A (en) | 2010-11-17 |
CN101887106B true CN101887106B (en) | 2012-10-17 |
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ID=43073102
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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CN201010202127A Active CN101887106B (en) | 2010-06-13 | 2010-06-13 | Hall chip magnetic flux test device |
Country Status (1)
Country | Link |
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CN (1) | CN101887106B (en) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN106125019B (en) * | 2016-08-19 | 2019-02-12 | 珠海市运泰利自动化设备有限公司 | Hall sensor magnetic flux tests structure |
CN106449463B (en) * | 2016-11-16 | 2023-05-26 | 长电科技(滁州)有限公司 | Hall device test clamp and operation method thereof |
CN107390145B (en) * | 2017-09-19 | 2023-04-04 | 长电科技(滁州)有限公司 | Hall product testing mechanism and assembling and testing method |
CN107377424B (en) * | 2017-09-19 | 2023-05-23 | 长电科技(滁州)有限公司 | Hall coil, hall product testing coil device based on Hall coil and testing method |
CN107607859B (en) * | 2017-10-24 | 2023-04-11 | 长电科技(滁州)有限公司 | Chip testing and sealing device and process thereof |
CN110764039A (en) * | 2019-11-13 | 2020-02-07 | 合肥久昌半导体有限公司 | Four-station co-test seat for Hall device of all-in-one machine |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1267173A2 (en) * | 2001-06-15 | 2002-12-18 | Sanken Electric Co., Ltd. | Hall-effect current detector |
CN1751229A (en) * | 2003-02-21 | 2006-03-22 | 费希尔控制产品国际有限公司 | Magnetic position sensor with integrated hall effect switch |
CN201804094U (en) * | 2010-06-13 | 2011-04-20 | 灿瑞半导体(上海)有限公司 | Magnetic flux testing device for Hall chip |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7116094B2 (en) * | 2004-07-28 | 2006-10-03 | International Business Machines Corporation | Apparatus and method for transmission and remote sensing of signals from integrated circuit devices |
DE102008022365B3 (en) * | 2008-05-06 | 2009-12-31 | Micronas Gmbh | Method for matching a test object |
-
2010
- 2010-06-13 CN CN201010202127A patent/CN101887106B/en active Active
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1267173A2 (en) * | 2001-06-15 | 2002-12-18 | Sanken Electric Co., Ltd. | Hall-effect current detector |
CN1751229A (en) * | 2003-02-21 | 2006-03-22 | 费希尔控制产品国际有限公司 | Magnetic position sensor with integrated hall effect switch |
CN201804094U (en) * | 2010-06-13 | 2011-04-20 | 灿瑞半导体(上海)有限公司 | Magnetic flux testing device for Hall chip |
Also Published As
Publication number | Publication date |
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CN101887106A (en) | 2010-11-17 |
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Legal Events
Date | Code | Title | Description |
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C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
C56 | Change in the name or address of the patentee | ||
CB03 | Change of inventor or designer information |
Inventor after: Yang Lianhong Inventor before: Luo Liquan Inventor before: Yang Lianhong |
|
COR | Change of bibliographic data | ||
CP01 | Change in the name or title of a patent holder |
Address after: 200081 room 1717, No. 1006, Shanghai, North Sichuan Road Patentee after: SHANGHAI CANRUI TECHNOLOGY CO., LTD. Address before: 200081 room 1717, No. 1006, Shanghai, North Sichuan Road Patentee before: Orient-Chip Semiconductor (Shanghai) Co., Ltd. |
|
C41 | Transfer of patent application or patent right or utility model | ||
TR01 | Transfer of patent right |
Effective date of registration: 20160810 Address after: 201613 Shanghai city Songjiang District Pine Road No. 338 Patentee after: Shanghai able to collect Electronic Technology Co., Ltd. Address before: 200081 room 1717, No. 1006, Shanghai, North Sichuan Road Patentee before: SHANGHAI CANRUI TECHNOLOGY CO., LTD. |
|
TR01 | Transfer of patent right | ||
TR01 | Transfer of patent right |
Effective date of registration: 20220221 Address after: 314006 No. 298, Yongqing Road, Daqiao Town, Nanhu District, Jiaxing City, Zhejiang Province Patentee after: ZHEJIANG HENGTUO ELECTRONIC TECHNOLOGY Co.,Ltd. Address before: No. 338, Songwei North Road, Songjiang District, Shanghai, 201613 Patentee before: Shanghai able to collect Electronic Technology Co.,Ltd. |