CN101887106B - Hall chip magnetic flux test device - Google Patents
Hall chip magnetic flux test device Download PDFInfo
- Publication number
- CN101887106B CN101887106B CN201010202127A CN201010202127A CN101887106B CN 101887106 B CN101887106 B CN 101887106B CN 201010202127 A CN201010202127 A CN 201010202127A CN 201010202127 A CN201010202127 A CN 201010202127A CN 101887106 B CN101887106 B CN 101887106B
- Authority
- CN
- China
- Prior art keywords
- test
- magnetic flux
- hall chip
- coil
- magnetic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 126
- 230000004907 flux Effects 0.000 title claims abstract description 31
- 238000004806 packaging method and process Methods 0.000 claims description 15
- 238000000034 method Methods 0.000 claims description 12
- 239000003822 epoxy resin Substances 0.000 claims description 5
- 239000011521 glass Substances 0.000 claims description 5
- 229920000647 polyepoxide Polymers 0.000 claims description 5
- 230000008569 process Effects 0.000 claims description 5
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 4
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 3
- 229910052782 aluminium Inorganic materials 0.000 claims description 3
- 229910052802 copper Inorganic materials 0.000 claims description 3
- 239000010949 copper Substances 0.000 claims description 3
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 abstract description 5
- 229910052737 gold Inorganic materials 0.000 abstract description 5
- 239000010931 gold Substances 0.000 abstract description 5
- 238000005538 encapsulation Methods 0.000 abstract 2
- 238000009434 installation Methods 0.000 description 11
- 230000005389 magnetism Effects 0.000 description 8
- 239000004020 conductor Substances 0.000 description 5
- 239000000696 magnetic material Substances 0.000 description 5
- 238000010586 diagram Methods 0.000 description 4
- 230000005415 magnetization Effects 0.000 description 4
- 230000005355 Hall effect Effects 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 2
- 230000009466 transformation Effects 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 238000001739 density measurement Methods 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 230000005690 magnetoelectric effect Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 230000035699 permeability Effects 0.000 description 1
- 238000007747 plating Methods 0.000 description 1
Images
Landscapes
- Measuring Magnetic Variables (AREA)
Abstract
The invention relates to a Hall chip magnetic flux test device (1) for use in a SOT23 encapsulation test sorter, which is characterized in that the device (1) comprises a test support (9), a test seat (2) fixed on the upper end of the test support (9), a test clamp (3) which is arranged in the test seat (2) for holding a tested Hall chip, a plurality of gold fingers (5) electrically connected with the test clamp (3), a cover plate (6) positioned above the gold fingers (5) and a coil (4) wound on the test support (9), wherein the gold fingers (5) are fixed between the cover plate (6) and the test seat (2). The device can test the magnetic flux of the Hall chip in a SOT23 encapsulation test.
Description
Technical field
The present invention relates to a kind of Hall chip magnetic flux test device, the Hall chip of volume production is carried out the test of magnetic flux when the SOT23 packaging and testing.
Background technology
Hall effect is a kind of of magnetoelectric effect, when electric current with perpendicular to the direction of external magnetic field when being arranged in the conductor in this magnetic field, electric potential difference can appear between two end faces perpendicular to magnetic field and direction of current of conductor, this phenomenon is called Hall effect.Hall element promptly is to utilize Hall element to convert a kind of sensor of electromotive force output to based on the Hall effect principle and with measured physical quantity (like electric current, magnetic field, displacement, pressure etc.).It is simple in structure, and volume is little, and is contactless, and reliability is high, is prone to microminiaturization, therefore, in measuring technique, has obtained using widely.In the production run of Hall product, need carry out the test of magnetic flux to the Hall product.
In the magnetic flux test of Hall product, realize test through the method that tested Hall chip is applied external magnetic field usually at present to its magnetic flux.General adopt twin coil to add magnetic and unicoil to add two kinds of methods of magnetic and apply external magnetic field; It is that twin coil is installed on the test fixture both sides that twin coil adds magnetism method; Chip under test is placed in parallel in (as shown in Figure 4) between two coils, and chip under test is passed in the magnetic field that two coils produce; And unicoil to add magnetism method be that coil is placed horizontally on the surface level, chip under test is placed in parallel in (as shown in Figure 5) on this coil, chip under test is passed in the magnetic field that unicoil produces.In the SOT23 packaging and testing,, therefore can't carry out the test of magnetic flux to Hall chip because traditional SOT23 packaging and testing separator is not installed magnetic field.And the measuring head of traditional SOT23 packaging and testing separator and nozzle portion all are that magnetic conductive material is processed; Even if therefore in the SOT23 packaging and testing, Hall chip is applied magnetic field to carry out the magnetic flux test; Aforementioned employed magnetic conductive material can cause when not producing externally-applied magnetic field by permanent magnetization after adding magnetic, also has remanent magnetism and occurs; Thereby bring the test deviation, produce erroneous judgement.
Summary of the invention
The object of the present invention is to provide the Hall chip magnetic flux test device of realizing the magnetic flux test in a kind of SOT23 of being used in packaging and testing.
The Hall chip magnetic flux test device of a kind of SOT23 of being used for packaging and testing separator of the present invention comprises test bracket; Be fixed on the test bench of the upper end of said test bracket; Be arranged on the test fixture that is used to place tested Hall chip in the said test bench; The a plurality of golden fingers that are electrically connected with said test fixture; Be positioned at the cover plate of said golden finger top, said golden finger is fixed between said cover plate and the said test bench; And the coil on the said test bracket.
In addition, said coil is a unicoil.The height of said test fixture flushes with the upper end face of said coil.Said test bracket is made of aluminum.Said test fixture is made of copper.Said test bench is processed by epoxy resin.Said cover plate is processed by epoxy resin.Said test bench is fixed on the said test bracket through glass screw.Said golden finger is fixed between said cover plate and the said test bench through glass screw.
Through Hall chip magnetic flux test device of the present invention traditional SOT23 packaging and testing separator is added magnetic, in the SOT23 packaging and testing, to realize magnetic flux test to Hall chip.
The present invention also adopts the non-magnetic material that the part parts of Hall chip magnetic flux test device have been carried out not having the magnetization transformation, has eliminated the remanent magnetism phenomenon, has reduced test deviation and erroneous judgement, to realize magnetic flux test accurately.
Description of drawings
Fig. 1 shows the synoptic diagram of Hall chip magnetic flux test device of the present invention.
Fig. 2 shows the one-piece construction synoptic diagram of the rotating-disk testing separator that uses Hall chip magnetic flux test device of the present invention.
Fig. 3 shows the front elevation of the rotating disk part of the Test handler among Fig. 2.
Fig. 4 shows the synoptic diagram that adopts twin coil to add magnetic.
Fig. 5 shows the synoptic diagram that adopts unicoil to add magnetic.
Reference numeral:
1, proving installation 2, test bench
3, test fixture 4, coil
5, golden finger 6, cover plate
7, screw 8, screw
9, test bracket 10, separator
11, rotating disk 12, suction nozzle
13, base 14, worktable
Embodiment
Below in conjunction with accompanying drawing and embodiment technical scheme of the present invention is done further to describe in detail.
As shown in Figure 1, show Hall chip magnetic flux test device 1 according to the SOT23 of being used for packaging and testing separator of the present invention.This proving installation 1 comprises a test bracket 9 (as shown in Figure 2), on this test bracket, is wound with a coil 4, and in the upper end of this test bracket one test bench 2 is installed, and test bench 2 is fixed on the test bracket through screw 8.In this test bench 2, be provided with one be used to place tested Hall chip test fixture 3.This proving installation 1 also comprises and being electrically connected with test fixture 3 so that two arrange golden fingers 5 with each pin of chip under test in being placed on this test fixture 3 electrically contact respectively; Said golden finger promptly is the link of chip under test pin and external testing circuit, and all signals all transmit through golden finger.Golden finger is made up of numerous flavous conductive contact blades, because of its surface gold-plating and conductive contact blade are arranged like finger-shaped, so be called " golden finger ".Golden finger is actually in copper-clad plate and is covered with one deck gold again through special process, because the inoxidizability of gold is extremely strong, and conduction is also very strong.In addition, this proving installation 1 also comprises two cover plates 6 that lay respectively at two row's golden fingers, 5 tops, and each golden finger 5 is fixed between test bench 2 and the cover plate 6 through a screw 7 respectively.
In the present invention, through being added magnetic, traditional SOT23 packaging and testing separator realizes test to Hall chip magnetic flux.The coil 4 that in this proving installation 1, adopts is a unicoil.SOT23 packaging and testing separator adopts the structure of rotating disc type; As shown in Figure 2; This Test handler comprises worktable 14, is positioned at the base 13 on the worktable 14, and proving installation 1 is installed on the base 13 through its test bracket 9; And the rotating disk 11 (as shown in Figure 3) that is positioned at this proving installation 1 top, be provided with a plurality of in the rotating disk 11 along the equally distributed suction nozzle 12 of its circumference.Each chip under test is sent to through suction nozzle 12 on the test fixture 3 of proving installation 1 successively, and the structure of this kind Test handler causes adopting twin coil to add magnetism method SOT23 packaging and testing separator is added magnetic.Therefore, in the present invention, adopted unicoil to add magnetism method SOT23 packaging and testing separator has been added magnetic.
In the present invention, two joints of unicoil 4 are inserted in the testers (figure does not show), can change the size of the input current of coil 4, control the size of the magnetic flux of the externally-applied magnetic field that this coil 4 produces by tester.The magnetic field that unicoil 4 produces is a uniform magnetic field perpendicular to coil section in the inside, the center of circle of this coil, apart from coil surface more far field will decay soon more, the magnetic line of force of formation is a curve, will no longer be perpendicular to coil surface.So the surface of tested Hall chip is parallel with coil surface and be close to inside, the coil center of circle and will obtain a good magnetic field and offer Hall chip.This proving installation 1 is configured such that the height of test fixture 3 flushes with the upper end of coil 4 in the present embodiment; To be placed in the test fixture 3 when tested Hall chip through the suction nozzle in the rotating disk 11 12 and to compress with golden finger 5 contact when good, this chip lower surface flushes with coil 4 upper end faces.This device accomplishes when carrying out the Hall chip magnetic flux test, to make externally-applied magnetic field vertically through Hall chip fully, accomplishes the most accurate magnetic flux density measurement.Its concrete magnetic flux test philosophy is following: add a high level for the input pin of tested Hall chip; This moment, the output pin of this chip also was a high level, then coil 4 energisings was added externally-applied magnetic field to give this Hall chip, and this externally-applied magnetic field changes from small to big; When output pin level during by high step-down; The magnetic field intensity of this point is the working point magnetic field intensity of required survey, reduces magnetic field then, when output pin level during by low uprising; The magnetic field intensity of this point is the point of release magnetic field intensity of required survey, and it is wide that the difference between working point magnetic field intensity and the point of release magnetic field intensity is the magnetic of this Hall chip.In this test, with the magnetic that records wide with test specification more whether in range, as if in the test specification scope, being qualified Hall chip then, otherwise be underproof Hall chip.
In the Hall chip magnetic flux test, the used permeability magnetic material of conventional test handler measuring head can when coil does not produce magnetic field, also have remanent magnetism and occur because of applying externally-applied magnetic field by permanent magnetization.And in proving installation 1 of the present invention, the test bracket 9 that is used to supply coil 4 to twine is to process with the non-magnetic materials of aluminum.The test fixture 3 that is used to place Hall chip is to become with non-magnetic material copper.The cover plate 6 that is provided with the test bench 2 of test fixture 3 and is positioned at golden finger 5 tops all is to process with non-conducting material epoxy resin.And be used for golden finger 5 is fixed in the screw 7 between cover plate 6 and the test bench 2, and the screw 8 of fixing test seat 2 on test bracket 9 all is to process with glass material.Therefore, the present invention adopts the non-magnetic material that the part parts of proving installation have been carried out not having the magnetization transformation, has eliminated the remanent magnetism phenomenon, has reduced test deviation and erroneous judgement, can obtain magnetic flux test accurately.
Above embodiment only is used for explanation but does not limit the present invention.The present invention also has various deformation and improvement within the scope of the claims.Simple, the equivalence that every foundation claims of the present invention and description are done changes and modifies, and all falls into the claim protection domain of patent of the present invention.
Claims (3)
1. Hall chip magnetic flux test device (1) that is used for SOT23 packaging and testing separator is characterized in that said device (1) comprising:
Test bracket made of aluminum (9);
Be fixed on the test bench (2) upper end, that process by epoxy resin of said test bracket;
Be arranged on and be used to place test fixture tested Hall chip, that be made of copper (3) in the said test bench (2);
The a plurality of golden fingers (5) that are electrically connected with said test fixture (3);
Be positioned at said golden finger (5) top, by the cover plate (6) that epoxy resin is processed, said golden finger (5) is fixed between said cover plate (6) and the said test bench (2); And
Coil (4) on the said test bracket (9);
Said test bench (2) is fixed on the said test bracket (9) through glass screw (8);
Said golden finger (5) is fixed between said cover plate (6) and the said test bench (2) through glass screw (7).
2. Hall chip magnetic flux test device according to claim 1 (1) is characterized in that, said coil (4) is a unicoil.
3. Hall chip magnetic flux test device according to claim 2 (1) is characterized in that, the height of said test fixture (3) flushes with the upper end face of said coil (4).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201010202127A CN101887106B (en) | 2010-06-13 | 2010-06-13 | Hall chip magnetic flux test device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201010202127A CN101887106B (en) | 2010-06-13 | 2010-06-13 | Hall chip magnetic flux test device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN101887106A CN101887106A (en) | 2010-11-17 |
| CN101887106B true CN101887106B (en) | 2012-10-17 |
Family
ID=43073102
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201010202127A Active CN101887106B (en) | 2010-06-13 | 2010-06-13 | Hall chip magnetic flux test device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN101887106B (en) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106125019B (en) * | 2016-08-19 | 2019-02-12 | 珠海市运泰利自动化设备有限公司 | Hall sensor magnetic flux tests structure |
| CN106449463B (en) * | 2016-11-16 | 2023-05-26 | 长电科技（滁州）有限公司 | Hall device test clamp and operation method thereof |
| CN107390145B (en) * | 2017-09-19 | 2023-04-04 | 长电科技（滁州）有限公司 | Hall product testing mechanism and assembling and testing method |
| CN107377424B (en) * | 2017-09-19 | 2023-05-23 | 长电科技（滁州）有限公司 | Hall coil, hall product testing coil device based on Hall coil and testing method |
| CN107607859B (en) * | 2017-10-24 | 2023-04-11 | 长电科技（滁州）有限公司 | Chip testing and sealing device and process thereof |
| CN110764039A (en) * | 2019-11-13 | 2020-02-07 | 合肥久昌半导体有限公司 | Four-station co-test seat for Hall device of all-in-one machine |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1267173A2 (en) * | 2001-06-15 | 2002-12-18 | Sanken Electric Co., Ltd. | Hall-effect current detector |
| CN1751229A (en) * | 2003-02-21 | 2006-03-22 | 费希尔控制产品国际有限公司 | Magnetic position sensor with integrated hall effect switch |
| CN201804094U (en) * | 2010-06-13 | 2011-04-20 | 灿瑞半导体(上海)有限公司 | Magnetic flux testing device for Hall chip |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7116094B2 (en) * | 2004-07-28 | 2006-10-03 | International Business Machines Corporation | Apparatus and method for transmission and remote sensing of signals from integrated circuit devices |
| DE102008022365B3 (en) * | 2008-05-06 | 2009-12-31 | Micronas Gmbh | Method for matching a test object |
-
2010
- 2010-06-13 CN CN201010202127A patent/CN101887106B/en active Active
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1267173A2 (en) * | 2001-06-15 | 2002-12-18 | Sanken Electric Co., Ltd. | Hall-effect current detector |
| CN1751229A (en) * | 2003-02-21 | 2006-03-22 | 费希尔控制产品国际有限公司 | Magnetic position sensor with integrated hall effect switch |
| CN201804094U (en) * | 2010-06-13 | 2011-04-20 | 灿瑞半导体(上海)有限公司 | Magnetic flux testing device for Hall chip |
Also Published As
| Publication number | Publication date |
|---|---|
| CN101887106A (en) | 2010-11-17 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN101887106B (en) | Hall chip magnetic flux test device | |
| CN101598573B (en) | Direct shaft power measurements for rotating machinery | |
| CN202119392U (en) | Photoelectric micrometer device | |
| CN103278216A (en) | Liquid level sensor system | |
| CN102024546B (en) | Gradient permanent magnet for constant gradient field rock sample analyzer | |
| CN103033770A (en) | Giant magneto-impedance effect two-dimensional magnetic field sensor | |
| CN111856354A (en) | Magnetic sensor with wide range and high sensitivity, and preparation method and use method thereof | |
| CN103163360A (en) | Optical current sensor and current measurement method based on comparative measurement structure | |
| CN112050836B (en) | Sensor device with test magnet and associated method | |
| CN104914374A (en) | Device for detecting electrical performance of chips | |
| CN201804094U (en) | Magnetic flux testing device for Hall chip | |
| CN203275621U (en) | Magnetic sensor | |
| CN203337221U (en) | Liquid level sensor system | |
| CN209589305U (en) | One kind being based on ultra-magnetic telescopic back wash effect pressure sensor | |
| CN209485490U (en) | Liquid level detection device | |
| CN209512678U (en) | A kind of calibrating installation of steel tape | |
| CN207250514U (en) | A kind of array optical electric transducer | |
| CN108919149B (en) | Dynamic broadband high-magnetic-density rotary magnetic characteristic measuring and sensing device | |
| CN204495494U (en) | With the iron gallium alloy force snesor of precompressed mechanism | |
| CN208672786U (en) | More physical factor coupling electrical sheet complexity magnetic characteristic measuring devices | |
| CN106482883A (en) | A kind of impact tension detection mechanism | |
| CN203365488U (en) | Probe type connector detection apparatus | |
| CN102081111A (en) | Probe card | |
| CN105466607A (en) | Transformer coil short-circuit mechanical force test system and test method thereof | |
| CN201885932U (en) | Geotechnical material rigidity testing device |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C56 | Change in the name or address of the patentee | ||
| CB03 | Change of inventor or designer information |
Inventor after: Yang Lianhong Inventor before: Luo Liquan Inventor before: Yang Lianhong |
|
| COR | Change of bibliographic data | ||
| CP01 | Change in the name or title of a patent holder |
Address after: 200081 room 1717, No. 1006, Shanghai, North Sichuan Road Patentee after: SHANGHAI CANRUI TECHNOLOGY CO., LTD. Address before: 200081 room 1717, No. 1006, Shanghai, North Sichuan Road Patentee before: Orient-Chip Semiconductor (Shanghai) Co., Ltd. |
|
| C41 | Transfer of patent application or patent right or utility model | ||
| TR01 | Transfer of patent right |
Effective date of registration: 20160810 Address after: 201613 Shanghai city Songjiang District Pine Road No. 338 Patentee after: Shanghai able to collect Electronic Technology Co., Ltd. Address before: 200081 room 1717, No. 1006, Shanghai, North Sichuan Road Patentee before: SHANGHAI CANRUI TECHNOLOGY CO., LTD. |
|
| TR01 | Transfer of patent right | ||
| TR01 | Transfer of patent right |
Effective date of registration: 20220221 Address after: 314006 No. 298, Yongqing Road, Daqiao Town, Nanhu District, Jiaxing City, Zhejiang Province Patentee after: ZHEJIANG HENGTUO ELECTRONIC TECHNOLOGY Co.,Ltd. Address before: No. 338, Songwei North Road, Songjiang District, Shanghai, 201613 Patentee before: Shanghai able to collect Electronic Technology Co.,Ltd. |