CN101839953A - Dynamic aging test bed for component product of microcomputer network control system of locomotive - Google Patents
Dynamic aging test bed for component product of microcomputer network control system of locomotive Download PDFInfo
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- CN101839953A CN101839953A CN201010186801A CN201010186801A CN101839953A CN 101839953 A CN101839953 A CN 101839953A CN 201010186801 A CN201010186801 A CN 201010186801A CN 201010186801 A CN201010186801 A CN 201010186801A CN 101839953 A CN101839953 A CN 101839953A
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Abstract
The invention discloses a dynamic aging test bed for the component product of a microcomputer network control system of a locomotive, which comprises a temperature test box, a fixture cabinet, an industrial control computer and a multi-path switch data acquisition analyzer communicating with the industrial control computer through Ethernet. The multi-path switch data acquisition analyzer receives a control command of the industrial control computer, controls a relay switch control module and a data measurement control module inserted in the multi-path switch data acquisition analyzer; the relay switch control module electrifies and powers off a tested member on the fixture cabinet in the temperature test box, and the data measurement control module detects the current value of the tested member and the voltage value of a tested unit of the tested member. The invention is simple and reasonable in structure as well as reliable and safe to use, improves the detection intensity of early failure of the members of a locomotive electronic product unit, significantly avoids functional fault of a unit module resulting from possible member problem and greatly improves the product reliability.
Description
Technical field the invention belongs to the experiment test device, and it is dynamic aging test bed to be specifically related to a kind of component product of microcomputer network control system of locomotive.
Background technology microcomputer network control system of locomotive spare generally comprises 5 kinds of unit modules such as traction control unit, Auxiliary Control Element.The component product of microcomputer network control system of locomotive dynamic aging test, it mainly is simulation test product mission life, by under the high and low temperature loop condition, test product being carried out the power on/off operation, detect the reliability of element in the test product, thereby reduce the product problem that causes because of element initial failure.High low temperature mainly is the condition of work of analog equipment under the worst operating position.This dynamic aging test is mainly used in the product of rejecting initial failure as reliability monitoring with from batch products.But there is no the proving installation that is used for dynamic aging test in the market.
Summary of the invention is for solving the problem of above-mentioned shortage dynamic aging test device, and it is dynamic aging test bed that purpose of the present invention promptly provides a kind of component product of microcomputer network control system of locomotive that can conveniently carry out dynamic aging test.
For realizing this purpose, technical scheme of the present invention is as follows: a kind of component product of microcomputer network control system of locomotive is dynamic aging test bed, it is characterized in that: comprise temperature test chamber, the frock rack, industrial control computer and the multi-way switch data collection and analysis instrument that communicates with by Ethernet, multi-way switch data collection and analysis instrument receives the control command of industrial control computer, relay switch control module and DATA REASONING control module to its grafting are controlled, by the relay switch control module measured piece on the frock rack in the temperature test chamber is implemented power on/off, detect the magnitude of voltage of the unit under test of the current value of measured piece and measured piece by the DATA REASONING control module.
1 pin of the relay switch control module 3740 that patches on the described multi-way switch data collection and analysis instrument 3706 meets power module DY1, and the 5-8 pin of relay switch control module 3740 connects 110 power pin of unit under test TCU, RIOM, ACU, MPU respectively through resistance R 1-R4; The CH1-CH8 pin of the DATA REASONING control module 3720 that patches on the multi-way switch data collection and analysis instrument 3706 connects the I15-I22 pin of unit under test TCU respectively, the CH9-CH13 pin connects the I26-I30 pin of unit under test RIOM respectively, the CH14-CH18 pin connects the I31-I35 pin of unit under test ACU respectively, and the CH19 pin connects the I36 pin of unit under test MPU.
After adopting technique scheme, the present invention is simple and reasonable, use reliable and secure, improved inspecting force to locomotive electronic product unit elements initial failure, greatly avoided occurring because the unit module functional fault phenomenon that element problem causes has improved reliability of products greatly.
Description of drawings Fig. 1 is a structural representation block diagram of the present invention.
Fig. 2 is the circuit theory diagrams of the embodiment of the invention
Fig. 3 is the aging test program flow diagram of the embodiment of the invention
The present invention will be described in detail below in conjunction with drawings and Examples for embodiment.
As shown in Figure 1, component product of microcomputer network control system of locomotive of the present invention is dynamic aging test bed, comprises temperature test chamber, frock rack, industrial control computer and the multi-way switch data collection and analysis instrument that communicates with by Ethernet.Wherein, temperature test chamber provides required temperature environment for dynamic aging test, and the frock rack places in the temperature test chamber, and measured piece is positioned over the frock rack.Multi-way switch data collection and analysis instrument 3706 receives the control command of industrial control computer, relay switch control module 3740 and DATA REASONING control module 3720 to its grafting are controlled, implement power on/off by the 3740 pairs of measured pieces of relay switch control module, detect the magnitude of voltage of the unit under test of the current value of measured pieces and measured piece by DATA REASONING control module 3720.The circuit diagram of the embodiment of the invention as shown in Figure 2.
Industrial control computer of the present invention is controlled experimentation automatically by operation LABVIEW dynamic aging experimental arrangement, need not manual operations.Its program flow diagram as shown in Figure 3.
Experiment process of the present invention is as follows: during thermal cycle, unit under test is on/off repeatedly.Respectively to the energising of the measured piece of three racks, the current value of test measured piece, when measuring current value during greater than 2 times of the electric current under the steady state (SS), the red warning of program interface pilot lamp newspaper, the present invention will stop the aging test circulation of unit under test.Unit under test to measured piece carries out voltage detecting then, notes measured value, carries out current detecting in 20 seconds after energising, carries out voltage detecting in 120 seconds after the energising, and be 3 minutes half whole conduction time.Outage afterwards, power-off time are that half, one circulation in 2 fens needs 6 minutes altogether.The on/off total degree of power supply is 110 times in 11 hours test duration.Generate a file when finishing, write down start time, input voltage, current value and the magnitude of voltage of the power on/off in this cycle, the value that surpasses rated voltage is given " false " sign in each cycle.Finish to this dynamic aging test.
Claims (2)
1. a component product of microcomputer network control system of locomotive is dynamic aging test bed, it is characterized in that: comprise temperature test chamber, the frock rack, industrial control computer and the multi-way switch data collection and analysis instrument that communicates with by Ethernet, multi-way switch data collection and analysis instrument receives the control command of industrial control computer, relay switch control module and DATA REASONING control module to its grafting are controlled, by the relay switch control module measured piece on the frock rack in the temperature test chamber is implemented power on/off, detect the magnitude of voltage of the unit under test of the current value of measured piece and measured piece by the DATA REASONING control module.
2. component product of microcomputer network control system of locomotive as claimed in claim 1 is dynamic aging test bed, it is characterized in that: 1 pin of the relay switch control module 3740 that patches on the described multi-way switch data collection and analysis instrument 3706 meets power module DY1, and the 5-8 pin of relay switch control module 3740 connects 110 power pin of unit under test TCU, RIOM, ACU, MPU respectively through resistance R 1-R4; The CH1-CH8 pin of the DATA REASONING control module 3720 that patches on the multi-way switch data collection and analysis instrument 3706 connects the I15-I22 pin of unit under test TCU respectively, the CH9-CH13 pin connects the I26-I30 pin of unit under test RIOM respectively, the CH14-CH18 pin connects the I31-I35 pin of unit under test ACU respectively, and the CH19 pin connects the I36 pin of unit under test MPU.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201010186801A CN101839953A (en) | 2010-05-28 | 2010-05-28 | Dynamic aging test bed for component product of microcomputer network control system of locomotive |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201010186801A CN101839953A (en) | 2010-05-28 | 2010-05-28 | Dynamic aging test bed for component product of microcomputer network control system of locomotive |
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| Publication Number | Publication Date |
|---|---|
| CN101839953A true CN101839953A (en) | 2010-09-22 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201010186801A Withdrawn CN101839953A (en) | 2010-05-28 | 2010-05-28 | Dynamic aging test bed for component product of microcomputer network control system of locomotive |
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102507223A (en) * | 2011-10-31 | 2012-06-20 | 中国北车集团大连机车研究所有限公司 | Modular dynamic aging test stand for locomotive part products |
| CN103163455A (en) * | 2011-12-15 | 2013-06-19 | 海洋王照明科技股份有限公司 | Method for testing service life of temperature protection switch |
| CN105486960A (en) * | 2016-01-24 | 2016-04-13 | 南京越博电驱动***有限公司 | Vehicle control unit high temperature aging test device applied to pure electric vehicle |
| CN109490696A (en) * | 2018-12-11 | 2019-03-19 | 江苏复达智能科技有限公司 | A kind of degradation detecting device for electronic device |
| CN113325290A (en) * | 2021-06-25 | 2021-08-31 | 西安派瑞功率半导体变流技术股份有限公司 | Thyristor life aging screening device for high-voltage direct-current transmission valve |
-
2010
- 2010-05-28 CN CN201010186801A patent/CN101839953A/en not_active Withdrawn
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102507223A (en) * | 2011-10-31 | 2012-06-20 | 中国北车集团大连机车研究所有限公司 | Modular dynamic aging test stand for locomotive part products |
| CN103163455A (en) * | 2011-12-15 | 2013-06-19 | 海洋王照明科技股份有限公司 | Method for testing service life of temperature protection switch |
| CN105486960A (en) * | 2016-01-24 | 2016-04-13 | 南京越博电驱动***有限公司 | Vehicle control unit high temperature aging test device applied to pure electric vehicle |
| CN109490696A (en) * | 2018-12-11 | 2019-03-19 | 江苏复达智能科技有限公司 | A kind of degradation detecting device for electronic device |
| CN113325290A (en) * | 2021-06-25 | 2021-08-31 | 西安派瑞功率半导体变流技术股份有限公司 | Thyristor life aging screening device for high-voltage direct-current transmission valve |
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Open date: 20101027 |