CN101750544A - New method for measuring direct capacitance of quartz crystal - Google Patents
New method for measuring direct capacitance of quartz crystal Download PDFInfo
- Publication number
- CN101750544A CN101750544A CN200810229669A CN200810229669A CN101750544A CN 101750544 A CN101750544 A CN 101750544A CN 200810229669 A CN200810229669 A CN 200810229669A CN 200810229669 A CN200810229669 A CN 200810229669A CN 101750544 A CN101750544 A CN 101750544A
- Authority
- CN
- China
- Prior art keywords
- quartz crystal
- frequency
- new method
- direct capacitance
- quartz
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Measurement Of Resistance Or Impedance (AREA)
Abstract
The invention relates to a new method for measuring the direct capacitance of a quartz crystal, which belongs to the field of analog designs. The invention provides the new method for measuring the direct capacitance of the quartz crystal. The method comprises the direct capacitance of the quartz crystal, the dynamic capacitance of the quartz crystal, the dynamic inductance of the quartz crystal, and the series resonance resistance of the quartz crystal. When the frequency of an excitation signal is equal to the resonance frequency of the quartz crystal, an equivalent electrical parameter model is a pure resistor. Because the values of C1 and L1 are very small, when the frequency of the excitation signal keeps away from the resonance frequency of the quartz crystal, the influences caused by R1, the C1 and the L1 can be ignored, and at that moment, the quartz crystal is equivalent to a capacitor with the value of C0.
Description
Technical field:
The invention belongs to the board design field, relate to a kind of new method of measuring direct capacitance of quartz crystal.
Background technology:
Quartz-crystal resonator (being designated hereinafter simply as quartz crystal) as a kind of frequency reference of function admirable and clock source in the electronic applications extensive application.Test is the operation that is between fine setting and the encapsulation in the production of quartz crystal in the middle of the quartz crystal, requires the basic electrical quantity of quartz crystal is measured, to guarantee the product final mass.In the middle of quartz crystal, in the test, need to measure parameters such as series resonance frequency, series resonance resistance, load resonant frequency, load resonant resistance, static capacity, dynamic condenser, frequency pulling sensitivity and DLD.Wherein, static capacity C0 has characterized the static characteristics of quartz crystal mainly by the silver-plated film decision of quartz crystal two ends institutes, and to use index closely related with the series resonance frequency of quartz crystal and load resonant frequency etc.Relation according to static capacity and other parameter can also calculate load resonant resistance, dynamic condenser, frequency pulling sensitivity and the isoparametric value of DLD, and this is the method that often adopts in actual measurement.The measurement of static capacity is the important content of test in the middle of the quartz crystal.At present, the standard method of measuring of the quartz crystal recommended of IEC (International Electrotechnical Commission) is a π network zero phase method.In the method, the not standard method of specifying measurement static capacity.If adopt common methods such as resonance method, alternating current bridge method to come measurement of electrostatic to hold, can increase the complicacy of whole measuring system, and the measurement of resonance frequency is had a negative impact.This problem has proposed a kind of new method of the measurement direct capacitance of quartz crystal based on π network zero phase method, and has designed and produced the experiment measuring system in view of the above.
Summary of the invention:
The present invention is exactly at the problems referred to above, and a kind of new method of measuring direct capacitance of quartz crystal is provided.
For achieving the above object, the present invention adopts following technical scheme, the present invention includes the static capacity of quartz crystal, the dynamic condenser of quartz crystal, the dynamic inductance of quartz crystal, quartz crystal series resonance resistance.When the frequency of pumping signal equaled resonant frequency of quartz crystal, its equivalent electrical parameter model was a pure resistance.Because the value of C1, L1 is very little, when the frequency of pumping signal during away from resonant frequency of quartz crystal, the influence of R1, C1, L1 can be ignored, and at this moment, the quartz crystal equivalence becomes the electric capacity that value is C0.
Beneficial effect of the present invention:
On the basis of π network zero phase method, adopted the method for " DDS excitation, the response of π network, width of cloth phase detection computations capacitive reactance " to measure the static capacity of quartz crystal, and designed and produced the experiment measuring system thus and realize this scheme.This method is united static capacity and the resonance frequency of measuring quartz crystal, has simplified metering circuit.By a collection of crystal of actual measurement and little electric capacity, prove that measuring error can satisfy actual requirement less than 0.1pF in 1～10pF scope, can develop the middle test macro of actual quartz crystal on this basis.
Description of drawings:
Fig. 1 is circuit theory diagrams of the present invention.
Embodiment:
The present invention includes the static capacity of quartz crystal, the dynamic condenser of quartz crystal, the dynamic inductance of quartz crystal, quartz crystal series resonance resistance.When the frequency of pumping signal equaled resonant frequency of quartz crystal, its equivalent electrical parameter model was a pure resistance.Because the value of C1, L1 is very little, when the frequency of pumping signal during away from resonant frequency of quartz crystal, the influence of R1, C1, L1 can be ignored, and at this moment, the quartz crystal equivalence becomes the electric capacity that value is C0.
Embodiment 1: the impedance of network and the impedance phase of test instrumentation coupling, and decay is from the reflected signal of testing tool.M is a quartz crystal to be measured.Va is an input signal, and Vb is a π network output signal, and they all are the vector voltage signals.When quartz crystal was in resonant condition, it showed as the pure resistance characteristic, and phase differential is zero between Va and the Vb at this moment, and the frequency of Va is the series resonance frequency of quartz crystal.So, the frequency by changing Va and detect Va and Vb between phase differential can find resonant frequency of quartz crystal.How static capacity for quartz crystal in the π network is measured, and IEC is the proposed standard method not.The π network is made up of two π type resistance loops of symmetry, and R1, R2 and R3 constitute input attenuator, and R4, R5 and R6 constitute output pad.
Utilize DDS (Direct Digital frequency synthesis) signal source as driving source, its output AC signal frequency is away from quartz-crystal resonance frequency, and this signal excitation is connected to the π network of tested quartz crystal.At this moment, the quartz crystal electric capacity that to be equivalent to a value be C0.There are certain functional relation in the output voltage of π network and this electric capacity, because the parameter of input voltage and π network is known, measures output voltage and according to this funtcional relationship, can calculate the C0 value.This method is very similar to the method for surveying quartz-crystal resonance frequency, all needs to utilize the DDS output signal as pumping signal and detect the vector voltage of π network output.Both differences are to measure resonance frequency and require to detect phase differential between input voltage and the output voltage, and measurement of electrostatic is held then requirement and measured input voltage and output voltage amplitude.Therefore, the way that adopts the width of cloth to detect mutually to these two vector voltage signals can make measurement resonant frequency of quartz crystal and static capacity unite.
Wherein, DDS output two-way amplitude, signal that frequency is all identical with phase place.One tunnel excitation π network, another road input width of cloth phase detection module.The measurement range of this project request quartz-crystal resonance frequency is 0～200MHz.In this scope, choose the setpoint frequency of two Frequency points of 30MHz and 68MHz as pumping signal.Concrete grammar is, when resonant frequency of quartz crystal was near 30MHz, setting the DDS output signal frequency was 68MHz, otherwise, then be made as 30MHz.
Claims (2)
1. new method of measuring direct capacitance of quartz crystal is characterized in that comprising the static capacity of quartz crystal, the dynamic condenser of quartz crystal, the dynamic inductance of quartz crystal, quartz crystal series resonance resistance; When the frequency of pumping signal equaled resonant frequency of quartz crystal, its equivalent electrical parameter model was a pure resistance; Because the value of C1, L1 is very little, when the frequency of pumping signal during away from resonant frequency of quartz crystal, the influence of R1, C1, L1 can be ignored, and at this moment, the quartz crystal equivalence becomes the electric capacity that value is C0.
2. a kind of new method of measuring direct capacitance of quartz crystal according to claim 1, the measurement range that it is characterized in that quartz-crystal resonance frequency is 0～200MHz.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN200810229669A CN101750544A (en) | 2008-12-12 | 2008-12-12 | New method for measuring direct capacitance of quartz crystal |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN200810229669A CN101750544A (en) | 2008-12-12 | 2008-12-12 | New method for measuring direct capacitance of quartz crystal |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN101750544A true CN101750544A (en) | 2010-06-23 |
Family
ID=42477824
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN200810229669A Pending CN101750544A (en) | 2008-12-12 | 2008-12-12 | New method for measuring direct capacitance of quartz crystal |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN101750544A (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102508024A (en) * | 2011-09-20 | 2012-06-20 | 郑州轻工业学院 | Frequency and phase difference precision measurement method based on frequency and phase relationship auxiliary processing |
| CN109307799A (en) * | 2018-10-26 | 2019-02-05 | 北京无线电计量测试研究所 | A kind of quartz crystal level of drive frequency hopping characteristic determination method |
| CN109490663A (en) * | 2018-10-26 | 2019-03-19 | 北京无线电计量测试研究所 | A kind of crystal resonator test macro and calibration method |
| CN111190057A (en) * | 2020-01-21 | 2020-05-22 | 同济大学 | Method and system for monitoring ESR (equivalent series resistance) of direct current capacitor on line |
| CN115629268A (en) * | 2022-12-19 | 2023-01-20 | 天津伍嘉联创科技发展股份有限公司 | Method and system for testing crystal parameters of tuning fork quartz resonator |
-
2008
- 2008-12-12 CN CN200810229669A patent/CN101750544A/en active Pending
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102508024A (en) * | 2011-09-20 | 2012-06-20 | 郑州轻工业学院 | Frequency and phase difference precision measurement method based on frequency and phase relationship auxiliary processing |
| CN109307799A (en) * | 2018-10-26 | 2019-02-05 | 北京无线电计量测试研究所 | A kind of quartz crystal level of drive frequency hopping characteristic determination method |
| CN109490663A (en) * | 2018-10-26 | 2019-03-19 | 北京无线电计量测试研究所 | A kind of crystal resonator test macro and calibration method |
| CN109307799B (en) * | 2018-10-26 | 2020-08-07 | 北京无线电计量测试研究所 | Method for judging frequency hopping characteristic of excitation level of quartz crystal |
| CN109490663B (en) * | 2018-10-26 | 2021-03-19 | 北京无线电计量测试研究所 | Crystal resonator test system and calibration method |
| CN111190057A (en) * | 2020-01-21 | 2020-05-22 | 同济大学 | Method and system for monitoring ESR (equivalent series resistance) of direct current capacitor on line |
| CN111190057B (en) * | 2020-01-21 | 2021-03-26 | 同济大学 | Method and system for monitoring ESR (equivalent series resistance) of direct current capacitor on line |
| CN115629268A (en) * | 2022-12-19 | 2023-01-20 | 天津伍嘉联创科技发展股份有限公司 | Method and system for testing crystal parameters of tuning fork quartz resonator |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN101750544A (en) | New method for measuring direct capacitance of quartz crystal | |
| CN102012464B (en) | Micro capacitance measurement method and special device | |
| CN103245819B (en) | Magnetic excitation resonant piezoresistive cantilever beam is adopted to measure the method for DC current or DC voltage | |
| CN101963514B (en) | For measurement mechanism and the measuring system of remote measurement analyte sensors | |
| CN102507050B (en) | Stimulation and vibration pick integrated pressure sensor of electric heating stimulation-piezoresistance vibration pick resonance beam | |
| CN204177872U (en) | A kind of absolute capacitance and differential capacitor metering circuit | |
| CN102508034B (en) | Method and device for measuring parameters of micro solid gyroscope equivalent circuit | |
| CN114629438A (en) | Acceleration compensation anti-vibration crystal oscillator and compensation method thereof | |
| CN102621397A (en) | Inductance measuring meter | |
| CN209840953U (en) | Leading device of taking care of eddy current sensor that low temperature floats | |
| US2602838A (en) | Electrical measuring instrument | |
| CN102117354A (en) | Piezoelectric crystal simulation engine | |
| CN103983854B (en) | Quartz crystal electronic parameter test system | |
| CN104833849A (en) | Quartz crystal series connection resonant frequency test method | |
| CN202329529U (en) | External excitation type eddy current displacement sensor excitation circuit | |
| CN109357727A (en) | A kind of capacitance-type fuel quantity measuring system with permittivity compensation | |
| CN1041821A (en) | Glass container wall thickness in specting machine | |
| CN202793425U (en) | Signal sampling circuit of inductive sensor | |
| CN204740293U (en) | Capacitive sensor circuit | |
| CN204142265U (en) | A kind of sensor detection circuit | |
| CN103197153B (en) | A kind of capacitor and inductor parameter measurement circuit based on vector triangle and measuring method thereof | |
| CN217112515U (en) | Inductance measuring device | |
| CN102694523A (en) | Crystal oscillation circuit | |
| CN206670653U (en) | One kind detection circuit | |
| CN104316774A (en) | Absolute capacitor and differential capacitor measuring circuit |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C02 | Deemed withdrawal of patent application after publication (patent law 2001) | ||
| WD01 | Invention patent application deemed withdrawn after publication |
Open date: 20100623 |