CN101625902A - Method, system and device for acquiring service life of semiconductor storage medium - Google Patents
Method, system and device for acquiring service life of semiconductor storage medium Download PDFInfo
- Publication number
- CN101625902A CN101625902A CN 200810068481 CN200810068481A CN101625902A CN 101625902 A CN101625902 A CN 101625902A CN 200810068481 CN200810068481 CN 200810068481 CN 200810068481 A CN200810068481 A CN 200810068481A CN 101625902 A CN101625902 A CN 101625902A
- Authority
- CN
- China
- Prior art keywords
- life
- storage medium
- semiconductor storage
- span
- information
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Images
Landscapes
- Techniques For Improving Reliability Of Storages (AREA)
Abstract
The invention relates to the field of electric digital data processing, in particular to a method, a system and a device for acquiring the service life of semiconductor storage medium. The method comprises the following steps: establishing a semiconductor storage medium service life model comprising the service life information of semiconductor storage medium; and acquiring the service life information of the semiconductor storage medium. By recording the service life information of the semiconductor storage medium in the form of a list to form a service life list, the method establishes the service life model which comprises all kinds of service life information of the semiconductor storage medium and is convenient for use; then, the all kinds of service life information can be acquired from the service life model. The service life information of the semiconductor storage medium acquired by the method can be displayed after calculation or can give service life prompt by other modes; thus, backup of important data can be carried out in time before storage equipment aging, thereby protecting data security and avoiding data loss.
Description
Technical field
The present invention relates to electric digital data processing field, relate in particular to a kind of life-span acquisition methods, system and device of semiconductor storage medium.
Background technology
The use of semiconductor storage medium is very extensive now, as common USB flash disk flash disk, flash card etc., and also all used semiconductor storage medium on the products such as mobile phone, digital camera, and semiconductor storage medium entered into fields such as computer and server, and the development trend of taking over hard disk is arranged.
Along with the continuous progress and the maturation of technology and technology, it is increasing that the capacity of semiconductor storage medium also becomes, and meanwhile, the storage density of semiconductor storage medium is also increasing, and it is shorter and shorter also to become its serviceable life.With the flash media is example, and the erasable number of times of each piece generally all has only several thousand times, have in addition have only hundreds of time, tens times.So the user does not know in use when the semiconductor storage medium life-span reach capacity, and causes losing of some significant datas so probably.The user more and more wishes to have a kind of method can allow them obtain life information on the own semiconductor memory apparatus.Life information generally comprises the maximum life of semiconductor storage medium, mean lifetime, lifetime threshold, the life-span of all logical blocks of semiconductor memory apparatus and the life-span of all physical blocks of semiconductor storage medium.And meanwhile, previous semiconductor memory apparatus is mainly only paid close attention to performance, and does not pay close attention to the life-span, and this part that obtains of life information always is blank out.
So, how to allow the user obtain the life information of semiconductor storage medium, so that the significant data on their the timely treatment of aged equipment has become the problem that the developer presses for solution.
Summary of the invention
One of purpose of the present invention provides a kind of life-span read method, system and device of semiconductor storage medium, is intended to solve the problem that can't obtain the life information of semiconductor memory apparatus in the prior art.
Life-span read method of the present invention adopts following technical scheme, comprises step:
Set up the semiconductor storage medium life model, comprise the life information of semiconductor storage medium in the semiconductor storage medium life model;
Obtain the life information of semiconductor storage medium.
The present invention also provides a kind of semiconductor memory apparatus life-span to obtain system, be used to obtain the life information of semiconductor memory apparatus, the described life-span obtains system and comprises host computer system and semiconductor memory apparatus, semiconductor memory apparatus comprises master control, internal memory and semiconductor storage medium, master control connects internal memory and semiconductor storage medium respectively, and host computer system is obtained the semiconductor memory apparatus life information by master control.
The present invention also provides a kind of semiconductor storage medium life-span reading device, be used to obtain the life information of semiconductor storage medium, described life-span apparatus system comprises main control chip, internal memory and semiconductor storage medium, main control chip connects internal memory and semiconductor storage medium respectively, and main control chip obtains service life information of semiconductor storage medium.
The present invention forms the life-span table by the form record of life information to show with semiconductor storage medium, thereby sets up the life model that comprises the various life information of semiconductor storage medium, so that use.From then on obtain various life information in the life model then.The life information of the semiconductor storage medium of Huo Deing can be through showing after calculating or the life-span prompting of other modes of carrying out by this method; can before memory device is aging, in time back up like this significant data; protect safety of data, avoided losing of data.
Description of drawings
Fig. 1 is the process flow diagram that first embodiment of the invention is obtained the service life information of semiconductor storage medium method;
Fig. 2 and Fig. 3 are the process flow diagrams that second embodiment of the invention is set up the semiconductor storage medium life model;
Fig. 4 obtains system construction drawing in the semiconductor memory apparatus life-span of third embodiment of the invention;
Fig. 5 is the semiconductor storage medium life-span reading device structural representation of fourth embodiment of the invention.
The object of the invention, function and advantage will be in conjunction with the embodiments, are described further with reference to accompanying drawing.
Embodiment
The present invention writes down with the form of showing by the life information with semiconductor storage medium, forms the life-span table, thereby sets up the life model that comprises the various life information of semiconductor storage medium, so that use.From then on obtain various life information in the life model then.
Fig. 1 shows the first embodiment of the present invention, and present embodiment comprises step:
S110, set up the semiconductor storage medium life model.The specific implementation process of this step is: set up a semiconductor storage medium life model, the life information of record semiconductor storage medium in this life model, when certain physical block of semiconductor storage medium when erasable, corresponding life information can will add 1.
S120, read life information.The specific implementation process of this step is: find the address of storage life information in the above-mentioned life model, obtain required life information from this address then.
Propose second embodiment based on first embodiment, as shown in Figures 2 and 3, in a second embodiment, set up the semiconductor storage medium life model and comprise at least: step S111, set up summary table; Step S112, the logical block mapping table.Between summary table and logical block mapping table, also can comprise: step S113, set up the partition map table.
The partition map table can comprise multilayer partition map table, is example with three grades of tables, and the semiconductor storage medium life model of present embodiment comprises three grades of tables, and summary table is the one-level table, and the partition map table is a secondary table, and the logical block mapping table is three grades of tables.Every grade of table can be shown in a corresponding life-span, also has at least the one-level table to need corresponding life-span table simultaneously in the tables at different levels.One-level table corresponding entire life of table, the corresponding subregion life-span table of secondary table, three grades of table counterlogic piece life-span tables, entire life the table record semiconductor storage medium maximum life, current entire life, mean lifetime and/or lifetime threshold, the life-span of each logical block in subregion life-span this subregion of table record, the life-span of the corresponding physical block of this logical block of logical block life-span table record.While each table itself need take several physical blocks and come recorded information, and these physical blocks also have address and/or life information.
Described semiconductor storage medium is controlled and is operated it by firmware.When certain physical block of semiconductor storage medium when erasable, the respective logical block mapping table can add 1 with the life-span of this physical block, if add 1 this physical block of back and be maximum in this logical block/little one, then the life-span of this logical block also increases by 1 in the logical block life-span table, equally, the subregion life-span of this piece place subregion also can corresponding increase by 1, and semiconductor storage medium current entire life also can corresponding increase by 1.
When obtaining the life-span of all physical blocks of semiconductor storage medium, have different situations according to the heterogeneity of physical block:
1, logical block corresponding physical piece
Owing to need to find concrete physical address in the actual read-write operation, operate accordingly then according to the logical block mapping table of semiconductor storage medium.Therefore, need obtain the life-span of physical block by logical block.
The logical block mapping table is kept at the semiconductor storage medium certain location, and this position can obtain according to its higher level's table.When needs are visited certain logical block, if the logical block mapping table of this logical block correspondence not in internal memory, firmware will read out it from semiconductor storage medium.Therefore,, just can access its corresponding logical block mapping table, thereby obtain all physical blocks and corresponding life-span that this logical block comprises as long as read the data of at least one byte in the logical block.
At least one byte data in the logical block of firmware read semiconductor storage medium obtains respective physical piece and life-span thereof at this moment, reads the life-span that all logical blocks obtain all logical block corresponding physical pieces so successively.
2, the physical block of record tables at different levels
Physical block for mapping relations such as record logical block mapping tables obtains the logical block mode in corresponding physical block life-span with the reference front.When reading a certain logical block information, corresponding logical block mapping table can be read in the internal memory, simultaneously, write down the information of the piece of this mapping table and also can read in the internal memory, these information can comprise: have several physical blocks to write down the piece number of this mapping table, these physical blocks and/or corresponding life-span etc.Just can obtain the life information of these physical block correspondences by rdma read.In addition, also can adopt the mode of directly reading mapping table to obtain the life information of these physical blocks.With top is example, and what table is the mapping table information of semiconductor storage medium comprise, as one-level table, secondary table, three grades of tables.This what table is tree structure, can find secondary table according to the one-level table, can find three grades of tables according to secondary table, and by that analogy, and each table is all writing down this table and by which physical block come together the record and the life-span of each physical block correspondence.Semiconductor storage medium can find the one-level table at least by firmware in the use that powers on, it is read the internal memory the inside, can find following all secondary table by the one-level table, find three grades of all tables again, obtain the life information that all write down the physical block of these mapping table information by these tables.
3, be used as the physical block of cache blocks or swap block
For physical block as cache blocks or swap block use, their information is recorded in as in top said certain grade of table, as the one-level table, be used for writing down how many cache blocks or swap block are arranged in this semiconductor storage medium now, and their piece number and/or corresponding life-span.Like this, just can adopt, obtain these pieces number and/or corresponding life-span by corresponding mapping table as top said mode.
4, other physical block
In addition, some physical block need be used for writing down some special information, as semiconductor storage
Some configuration informations of medium.Such physical block should be the physical block of fixing, and semiconductor storage medium will find these pieces by firmware program in the use that powers on, and reads corresponding information.Such physical block should be can not carry out erasable operation to them again after production is dispatched from the factory, so the life-span of their correspondences is exactly 0, or 1, if the life-span increase is arranged, that also can produce corresponding record, these can according to read information directly obtain.
When obtaining the life-span of all logical blocks of semiconductor storage medium, because life-span of all logical blocks all is kept in the corresponding subregion life-span table, only the physical address that need deposit by the secondary table that writes down in the one-level table just can be read the corresponding subregion life-span and show.By reading subregion life-span tables all in the semiconductor storage medium, just can access the life-span of all logical blocks.In addition, can read the data of at least one byte in the logical block, corresponding logical block mapping table will be read in the internal memory, thereby obtains the life-span of this logical block.Can obtain the life-span of all logical blocks by the data that read at least one byte in all logical blocks successively.
The maximum life of semiconductor storage medium, current entire life, mean lifetime and/or lifetime threshold all are recorded in the one-level table, semiconductor storage medium can find the one-level table at least by firmware in the use that powers on, it is read the internal memory the inside, so just can ask that internal memory directly obtains the maximum life of semiconductor storage medium, current entire life, mean lifetime and/or lifetime threshold by this.
The maximum life value of above-mentioned semiconductor storage medium, mean lifetime value, lifetime threshold all are the information of regular length, and the life value of all physical blocks is relevant with the number of physical block, and each physical block all has the dawn only to have a life value corresponding with it.
The third embodiment of the present invention provides a kind of life-span of semiconductor memory apparatus to obtain system, and as shown in Figure 4, this system comprises host computer system 31 and semiconductor memory apparatus 32.Wherein:
(1) host computer system 31 is by SCSI, ATA, SATA, PCI, PCI Express, EMMC (embedded MultiMediaCard, the built-in multimedia storage card), LBA (Logical BlockAddressing, the LBA (Logical Block Addressing) pattern), agreement such as TCP/IP sends order to master control 321, relevant information is obtained in requirement, after master control 321 receives order, from semiconductor storage medium 323, read relevant information respectively, and return to host computer system 31, finish corresponding operating by corresponding protocol.
(2) semiconductor memory apparatus 32 comprises master control 321, internal memory 322 and semiconductor storage medium 323, and master control 321 connects internal memory 322 and semiconductor storage medium 323 respectively, and host computer system 31 is obtained semiconductor storage medium 323 life information by master control 321.Wherein:
When obtaining the semiconductor memory apparatus life information, for the information that is temporarily stored in internal memory 322, master control 321 returns to it host computer system 31 respectively.And for the information that only leaves semiconductor storage medium 323 itself in, master control 321 needs to send order and reads from the relevant position.For example, the maximum life of semiconductor memory apparatus 32, mean lifetime, lifetime threshold have all existed in the internal memory 322, then 321 of master controls need be with these information according to the agreement of reaching with host computer system 31, return to host computer system 31 together or respectively, perhaps the life value with all logical blocks or physical block returns.If the life-span of physical block does not exist in the internal memory 322, then need from semiconductor storage medium 323, to read respectively respectively these values, and then return according to the agreement of reaching with host computer system 31.
When obtaining the life-span of semiconductor memory apparatus 32 all physical blocks, because host computer system 31 sends to the logical address of having only of master control 321 in the practical operation, master control 321 is found concrete physical address according to the logical address that receives, and operates accordingly then.So the life-span that need obtain physical block by logical block.The logical block mapping table is kept at the semiconductor memory apparatus certain location, and this position can obtain according to its higher level's table.When needs visit respective logical block, master control 321 will read out it from semiconductor storage medium 323.Therefore,, just can access its corresponding logical block mapping table, thereby obtain physical block and corresponding life-span that this logical block comprises as long as read the data of at least one byte in the logical block.Can be only by at least one byte data in the logical block of master control 321 read semiconductor memory devices 32, and these data are not returned to host computer system 31, thereby obtain respective physical piece and life-span thereof, read the life-span that all logical blocks obtain all logical block corresponding physical pieces so successively.
At least one byte data in the logical block of master control this moment 321 read semiconductor memory devices 32, and these data are not returned to host computer system 31, obtain respective physical piece and life-span thereof, read the life-span that all logical blocks obtain all logical block corresponding physical pieces so successively.
In addition, not all physical block all corresponds on the logical block, and some physical block need be used for writing down some special information, as logical block mapping table etc.; Some piece may be in order to accelerate read or write speed, to use as cache blocks or swap block.
Wherein, the configuration information of semiconductor memory apparatus 32 should be to have fixing position, Gu Ding physical block just, semiconductor memory apparatus 32 will find these pieces by the firmware program in the main control chip when using powering on, and read corresponding information.Such piece should be can not carry out erasable operation to them again after production is dispatched from the factory, so the life-span of their correspondences is exactly 0, or 1, if there is increase in the life-span, that also can produce corresponding record, these can according to read information directly obtain.
Physical block for mapping relations such as record logical block mapping tables also can adopt the mode of directly reading mapping table to obtain the life information of these physical blocks.Comprise what table for its mapping table information of some semiconductor memory apparatus, as one-level table, secondary table, three grades of tables etc., the information of one-level table record equipment, the information of a certain logic region in the secondary table recording unit, the information of a certain logical block in three grades of table record logic regions.This what table is tree structure, can find secondary table according to the one-level table, can find three grades of tables according to secondary table, and by that analogy, and each table is all writing down this table and by which physical block come together the record and the life-span of each physical block correspondence.Firmware program in the master control finds the one-level table at least, reads this one-level table, can find following all secondary table by the one-level table, finds three grades of all tables again, obtains the life information that all write down the physical block of these mapping table information by these tables.
For physical block as cache blocks or swap block use, their information is recorded in as in top said certain grade of table, as the one-level table, be used for writing down how many cache blocks or swap block are arranged in this semiconductor memory apparatus now, and their piece number and/or corresponding life-span.Like this, just can adopt, obtain these pieces number and corresponding life-span by corresponding mapping table as top said mode.
When returning to host computer system 31, can return the life information of physical block is single, also can return in batches, can also all return together.
In addition, also can send order, by reading the life information that logical block in all semiconductor memory apparatus 32 obtains all logical block corresponding physical pieces successively by host computer system 31.When reading, can have only the life information of a physical block with return message at every turn, also can be several at every turn, can also be once with all returning.
Obtain the life-span of semiconductor memory apparatus 32 all logical blocks, because the life-span of all logical blocks all is kept in the corresponding subregion life-span table, the physical address that master control 321 is deposited by the secondary table that writes down in the one-level table just can be read corresponding subregion life-span table.By reading subregion life-span tables all in the semiconductor memory apparatus 32, just can access the life-span of all logical blocks.And then return according to the agreement of reaching with host computer system 31.In addition, can read the data of at least one byte in the logical block, corresponding logical block mapping table will be read in the internal memory 322, thereby obtains the life-span of this logical block.Can obtain the life-span of all logical blocks by the data that read at least one byte in all logical blocks successively.
The maximum life of semiconductor memory apparatus 32, mean lifetime and/or lifetime threshold all are recorded in the one-level table, semiconductor memory apparatus 32 master control 321 in the use that powers on can be found the one-level table at least by firmware, it is read internal memory 322 the insides, so just can directly obtain maximum life, mean lifetime and/or the lifetime threshold of semiconductor memory apparatus 32 by access memory 322.And then return according to the agreement of reaching with host computer system 31.
The above-mentioned semiconductor memory apparatus life information of obtaining comprises: obtain the maximum life of semiconductor memory apparatus, mean lifetime, lifetime threshold, the life-span of all physical blocks of semiconductor memory apparatus and/or the life-span of all logical blocks of semiconductor memory apparatus of semiconductor memory apparatus.
The above-mentioned described host computer system of the 4th embodiment can be the computing machine, server at semiconductor memory apparatus (as flash memory hard disk) place etc., also can be the another one equipment that is different from this semiconductor memory apparatus place equipment, this equipment can be visited semiconductor memory apparatus, and these access modes can comprise data line, network, infrared, wireless or the like the mode that can transmit information between two equipment.For example a computing machine is by the other computing machine of access to netwoks, and computing machine is by data line visit USB flash disk flash disk, mobile phone, digital camera etc., and the computing machine that visit miscellaneous equipment this moment just can be regarded as host computer system.
The fifth embodiment of the present invention provides a kind of life information deriving means of semiconductor storage medium, be used to obtain the life information of semiconductor storage medium, as shown in Figure 5, described service life information of semiconductor storage medium deriving means comprises main control chip 51, internal memory 322, semiconductor storage medium 323, and main control chip 51 obtains semiconductor storage medium 323 life information; Main control chip 51 carries out exchanges data with semiconductor storage medium 323 by internal memory 322.Wherein:
(1) main control chip 51 is to linking to each other with semiconductor storage medium 323 and sending semiconductor storage medium control and read write command;
(2) semiconductor storage medium 323 receives and carries out control and read-write.
When obtaining semiconductor storage medium 323 life information, for the information that is temporarily stored in internal memory 322, main control chip 51 does not need to carry out additional operations again.And for the information that only leaves semiconductor storage medium 323 itself in, main control chip 51 needs to send order and reads from the relevant position.Such as the maximum life of semiconductor storage medium 323, mean lifetime, lifetime threshold have all existed in the internal memory 322.If the life information of physical block does not exist in the internal memory 322, then need from semiconductor storage medium 323, to read respectively respectively these values.
When obtaining the life-span of semiconductor storage medium 323 all physical blocks,, operate accordingly then because main control chip 51 is that logical address according to semiconductor memory apparatus finds concrete physical address in the practical operation.Therefore, need obtain the life-span of physical block by logical block.
Realize the conversion from the logical address to the physical address, need kind of mapping relations, be i.e. the logical block mapping table.The logical block mapping table is kept at this position of semiconductor storage medium certain location and can obtains according to its higher level's table.When needs are visited certain logical block, if the logical block mapping table of this logical block correspondence not in internal memory 322, main control chip 51 will read out it from semiconductor storage medium 323.Therefore,, just can access its corresponding logical block mapping table, thereby obtain physical block and corresponding life-span that this logical block comprises as long as read the data of at least one byte in the logical block.
At least one byte data in the logical block of main control chip 51 read semiconductor memory devices obtains respective physical piece and life-span thereof at this moment, reads the life-span that all logical blocks obtain all logical block corresponding physical pieces so successively.
In addition, not all physical block all corresponds on the logical block, and some physical block need be used for writing down some special information, as some configuration informations of service life information of semiconductor storage medium deriving means and logical block mapping table etc.; Some piece is in order to accelerate read or write speed, to use as cache blocks or swap block.
Wherein, the configuration information of service life information of semiconductor storage medium deriving means should be to have fixing position, Gu Ding physical block just, the service life information of semiconductor storage medium deriving means will find these pieces by the firmware program in the main control chip in the use that powers on, and reads corresponding information.Such piece should be can not carry out erasable operation to them again after production is dispatched from the factory, so the life-span of their correspondences is exactly 0, or 1, if there is increase in the life-span, that also can produce corresponding record, these can according to read information directly obtain.
Physical block for mapping relations such as record logical block mapping tables can obtain the logical block mode in corresponding physical block life-span with reference to the front.When reading a certain logical block information, corresponding logical block mapping table can be read in the internal memory, simultaneously, write down the information of the piece of this mapping table and also can read in the internal memory, these information can comprise: have several physical blocks to write down the piece number of this mapping table, these physical blocks and corresponding life-span etc.Just can obtain the life information of these physical block correspondences by rdma read.In addition, also can adopt the mode of directly reading mapping table to obtain the life information of these physical blocks.For some service life information of semiconductor storage medium deriving means, what table is its mapping table information comprise, information as one-level table, secondary table, three grades of tables etc., one-level table record semiconductor memory apparatus, the information of a certain logical block in the information of a certain logic region in the secondary table recording unit, three grades of table record logic regions.This what table is tree structure, can find secondary table according to the one-level table, can find three grades of tables according to secondary table, and by that analogy, and each table is all writing down this table and by which physical block come together the record and the life-span of each physical block correspondence.The service life information of semiconductor storage medium deriving means can find the one-level table at least by the firmware program in the main control chip in the use that powers on, it is read the internal memory the inside, can find following all secondary table by the one-level table, find three grades of all tables again, obtain the life information that all write down the physical block of these mapping table information by these tables.
For physical block as cache blocks or swap block use, their information is recorded in as in top said certain grade of table, as the one-level table, be used for writing down how many cache blocks or swap block are arranged in this semiconductor memory apparatus now, and their piece number and corresponding life-span.Like this, just can adopt, obtain these pieces number and corresponding life-span by corresponding mapping table as top said mode.
In addition, also can send order, obtain life-span of all logical block corresponding physical pieces by reading all logical blocks successively by main control chip 51.
Obtain the life-span of semiconductor storage medium 323 all logical blocks, because the life-span of all logical blocks all is kept in the corresponding subregion life-span table, the physical address that master control 51 is deposited by the secondary table that writes down in the one-level table just can be read corresponding subregion life-span table.By reading subregion life-span tables all in the semiconductor storage medium 323, just can access the life-span of all logical blocks.In addition, can read the data of at least one byte in the logical block, corresponding logical block mapping table will be read in the internal memory 322, thereby obtains the life-span of this logical block.Can obtain the life-span of all logical blocks by the data that read at least one byte in all logical blocks successively.
The maximum life of semiconductor storage medium 323, mean lifetime and/or lifetime threshold all are recorded in the one-level table, the master control 51 in the use that powers on of service life information of semiconductor storage medium deriving means can be found the one-level table at least by firmware, it is read internal memory 322 the insides, so just can directly obtain maximum life, mean lifetime and/or the lifetime threshold of semiconductor storage medium 323 by access memory 322.
The semiconductor memory apparatus that the described service life information of semiconductor storage medium deriving means of present embodiment can be the semiconductor storage medium place is as MP3, mobile phone, digital camera, USB flash disk flash disk etc.
The present invention is by the maximum life that obtains semiconductor storage medium, mean lifetime, lifetime threshold, the life-span of all logical blocks of semiconductor storage medium and/or the life-span of all physical blocks of semiconductor storage medium, and each life value is handled the back show, or carry out early warning according to result, inform the aging conditions of this semiconductor storage medium of user, make the user make corresponding processing to the data in the semiconductor storage medium, guaranteed the safety of data according to the aging conditions of semiconductor storage medium.
The above only is the preferred embodiments of the present invention; be not so limit claim of the present invention; every equivalent structure or equivalent flow process conversion that utilizes instructions of the present invention and accompanying drawing content to be done; or directly or indirectly be used in other relevant technical fields, all in like manner be included in the scope of patent protection of the present invention.
Claims (13)
1, a kind of semiconductor storage medium life-span acquisition methods is characterized in that, comprises the steps:
Set up the semiconductor storage medium life model, comprise the life information of semiconductor storage medium in the semiconductor storage medium life model;
Obtain the life information of semiconductor storage medium.
2, semiconductor storage medium life-span acquisition methods as claimed in claim 1 is characterized in that, the described step of setting up the semiconductor storage medium life model comprises:
Set up a summary table and the logical mappings table of setting up under the summary table, at least a corresponding life-span table in summary table and the logical mappings table, record sheet entire life of summary table corresponding record summary table life information, the logical block life-span table of logical mappings table corresponding record logical block life information.
3, semiconductor storage medium life-span acquisition methods as claimed in claim 1 is characterized in that, the described step of setting up the semiconductor storage medium life model comprises:
Set up a summary table, set up at least one partition map table and set up a logical mappings table, at least a corresponding life-span table in summary table, partition map table and the logical mappings table, the subregion life-span table of partition map table corresponding record subregion life information.
4, semiconductor storage medium life-span acquisition methods as claimed in claim 3, it is characterized in that: the described life information of obtaining semiconductor storage medium comprises step:
Find its all partition map table down by summary table;
Find logical mappings tables all under the partition map table;
Obtain the life information that all write down the physical block of these mapping table information by described logical mappings table.
5, semiconductor storage medium life-span acquisition methods as claimed in claim 4 is characterized in that
At least one byte data in the logical block of read semiconductor storage medium obtains the respective logical block life-span, and reads all logical blocks successively to obtain the life-span of all logical block correspondences.
6, semiconductor storage medium life-span acquisition methods as claimed in claim 4 is characterized in that:
Partition map table by reading logical block life-span table place or summary table obtain the life-span of the logical block that this table comprises, by reading the life-span that all upper level tables that the logical block life-span shows obtain all logical blocks.
7, a kind of semiconductor memory apparatus life-span is obtained system, it is characterized in that:
The described life-span obtains system and comprises host computer system and semiconductor memory apparatus, semiconductor memory apparatus comprises master control, internal memory and semiconductor storage medium, it is mutual that master control connects the semiconductor storage medium line data of going forward side by side, and host computer system is obtained the semiconductor memory apparatus life information by master control.
8, the semiconductor memory apparatus life-span as claimed in claim 7 is obtained system, it is characterized in that:
Host computer system is to linking to each other with master control and sending semiconductor storage medium control and read write command;
Master control connects semiconductor storage medium and carries out the semiconductor storage medium control command and return the read-write result;
Semiconductor storage medium receives and carries out control and read-write.
9, obtain system as claim 7 or 8 described semiconductor memory apparatus life-spans, it is characterized in that: comprise summary table storage area, partition map table storage area and logical mappings table storage area in the described semiconductor storage medium.
10, the semiconductor memory apparatus life-span as claimed in claim 9 is obtained system, it is characterized in that: host computer system sends order by SCSI, ATA, SATA, PCI, PCI Express, EMMC, agreements such as LBA, TCP/IP to master control, relevant information is obtained in requirement, by corresponding protocol information is returned to host computer system after the life information in the master control read semiconductor storage medium.
11, a kind of semiconductor storage medium life-span reading device, it is characterized in that: the life information that is used to obtain semiconductor storage medium, described life-span reading system comprises main control chip, internal memory and semiconductor storage medium, main control chip connects internal memory and semiconductor storage medium respectively, and main control chip obtains service life information of semiconductor storage medium.
12, semiconductor memory apparatus life-span deriving means as claimed in claim 11 is characterized in that:
Main control chip is to linking to each other with semiconductor storage medium and sending semiconductor storage medium control and read write command;
Semiconductor storage medium receives and carries out control and read-write.
13, as claim 11 or 12 described semiconductor memory apparatus life-span deriving means, it is characterized in that: main control chip comprises sets up mapping table module and life information acquisition module, set up mapping table module semiconductor storage medium is set up map operation, the life information in the life information acquisition module read semiconductor storage medium.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200810068481 CN101625902B (en) | 2008-07-10 | 2008-07-10 | Method, system and device for acquiring service life of semiconductor storage medium |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200810068481 CN101625902B (en) | 2008-07-10 | 2008-07-10 | Method, system and device for acquiring service life of semiconductor storage medium |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN101625902A true CN101625902A (en) | 2010-01-13 |
| CN101625902B CN101625902B (en) | 2013-07-10 |
Family
ID=41521698
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 200810068481 Active CN101625902B (en) | 2008-07-10 | 2008-07-10 | Method, system and device for acquiring service life of semiconductor storage medium |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN101625902B (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103514958A (en) * | 2012-12-31 | 2014-01-15 | Tcl集团股份有限公司 | Method for detecting service life of EMMC (embedded multi-media card) chip |
| CN105045523A (en) * | 2014-04-15 | 2015-11-11 | 三星电子株式会社 | Storage controller, storage device, storage system and method of operating the storage controller |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN100511484C (en) * | 2007-06-15 | 2009-07-08 | 华为技术有限公司 | Storage device, life monitoring device and monitoring method thereof |
-
2008
- 2008-07-10 CN CN 200810068481 patent/CN101625902B/en active Active
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103514958A (en) * | 2012-12-31 | 2014-01-15 | Tcl集团股份有限公司 | Method for detecting service life of EMMC (embedded multi-media card) chip |
| CN103514958B (en) * | 2012-12-31 | 2016-02-10 | Tcl集团股份有限公司 | A kind of EMMC chip life detecting method |
| CN105045523A (en) * | 2014-04-15 | 2015-11-11 | 三星电子株式会社 | Storage controller, storage device, storage system and method of operating the storage controller |
| CN105045523B (en) * | 2014-04-15 | 2020-11-24 | 三星电子株式会社 | Memory controller, memory device and system, and method of operating memory controller |
Also Published As
| Publication number | Publication date |
|---|---|
| CN101625902B (en) | 2013-07-10 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN101727295B (en) | Method for writing in and reading out data based on virtual block flash memory address mapping | |
| CN102511044B (en) | Method for deleting the data and device thereof | |
| CN110008136A (en) | The method of management flash memory module and relevant flash controller and electronic device | |
| US7515500B2 (en) | Memory device performance enhancement through pre-erase mechanism | |
| CN102332290B (en) | Apparatuses for managing and accessing flash memory module | |
| CN106469122B (en) | Valid data merging method, Memory Controller and memorizer memory devices | |
| CN106548789A (en) | Method and apparatus for operating stacked tile type magnetic recording equipment | |
| US20150161039A1 (en) | Data erasing method, memory control circuit unit and memory storage apparatus | |
| CN102096561B (en) | Hierarchical data storage processing method, device and storage equipment | |
| CN101673243B (en) | Data storage device and method | |
| CN104461935A (en) | Method, device and system for data storage | |
| US8255656B2 (en) | Storage device, memory controller, and data protection method | |
| CN103984641A (en) | Storage space recycling method and storage space recycling device based on thin provisioning technology | |
| CN110674056B (en) | Garbage recovery method and device | |
| CN101702139B (en) | Method and device for accessing data of Nand flash memory | |
| US9389998B2 (en) | Memory formatting method, memory controller, and memory storage apparatus | |
| CN102890655B (en) | Memory storage device, memory controller and valid data recognition method thereof | |
| CN101714065A (en) | Method for managing mapping information of flash controller | |
| CN109117383A (en) | Method for managing flash memory module and flash memory controller | |
| KR20080074584A (en) | Memory system and data storaging method thereof | |
| CN101582084A (en) | Method and device for data storage | |
| CN105988950B (en) | Storage management method, memorizer control circuit unit and memory storage apparatus | |
| CN102867046B (en) | Database optimizing method based on solid state hard disc and system | |
| CN102880432B (en) | Method and system for increasing writing speeds of flash memory chips by aid of limited lives of data and controller of system | |
| CN103389941B (en) | Storer formatting method, Memory Controller and memory storage apparatus |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant |