CN101566739B - 阵列电路维修***及维修方法 - Google Patents
阵列电路维修***及维修方法 Download PDFInfo
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- CN101566739B CN101566739B CN2008101050159A CN200810105015A CN101566739B CN 101566739 B CN101566739 B CN 101566739B CN 2008101050159 A CN2008101050159 A CN 2008101050159A CN 200810105015 A CN200810105015 A CN 200810105015A CN 101566739 B CN101566739 B CN 101566739B
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CN2008101050159A CN101566739B (zh) | 2008-04-25 | 2008-04-25 | 阵列电路维修***及维修方法 |
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CN2008101050159A CN101566739B (zh) | 2008-04-25 | 2008-04-25 | 阵列电路维修***及维修方法 |
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CN101566739A CN101566739A (zh) | 2009-10-28 |
CN101566739B true CN101566739B (zh) | 2011-07-20 |
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Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
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CN103885231B (zh) * | 2014-03-11 | 2016-04-20 | 京东方科技集团股份有限公司 | 显示面板标记装置和显示面板标记方法 |
CN105204195B (zh) * | 2015-09-21 | 2018-05-25 | 京东方科技集团股份有限公司 | 一种液晶面板成盒检测集成*** |
CN109634005A (zh) * | 2018-11-30 | 2019-04-16 | 深圳市华星光电技术有限公司 | 阵列基板制作过程中的修补方法 |
CN110428764B (zh) * | 2019-07-16 | 2022-10-04 | Tcl华星光电技术有限公司 | 显示面板检测方法 |
CN110890043B (zh) * | 2019-11-26 | 2023-06-02 | 深圳市华星光电半导体显示技术有限公司 | 一种十字线缺陷检测方法、***、阵列基板及显示面板 |
CN111221157B (zh) * | 2020-01-16 | 2023-03-07 | 深圳谦华益科技有限公司 | 一种带光学扫描的lcd显示检测*** |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1494047A (zh) * | 2002-07-25 | 2004-05-05 | 日本先锋公司 | 用于显示板的显示检验方法和显示检验装置 |
CN1697995A (zh) * | 2003-05-09 | 2005-11-16 | 奥林巴斯株式会社 | 缺陷修正装置及其缺陷修正方法 |
CN1755437A (zh) * | 2004-09-27 | 2006-04-05 | 株式会社日立显示器 | 图形修正装置和显示装置的制造方法 |
WO2008015738A1 (fr) * | 2006-08-01 | 2008-02-07 | Shimadzu Corporation | Dispositif d'inspection et de réparation de substrat et système d'évaluation de substrat |
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Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1494047A (zh) * | 2002-07-25 | 2004-05-05 | 日本先锋公司 | 用于显示板的显示检验方法和显示检验装置 |
CN1697995A (zh) * | 2003-05-09 | 2005-11-16 | 奥林巴斯株式会社 | 缺陷修正装置及其缺陷修正方法 |
CN1755437A (zh) * | 2004-09-27 | 2006-04-05 | 株式会社日立显示器 | 图形修正装置和显示装置的制造方法 |
WO2008015738A1 (fr) * | 2006-08-01 | 2008-02-07 | Shimadzu Corporation | Dispositif d'inspection et de réparation de substrat et système d'évaluation de substrat |
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Owner name: BEIJING BOE PHOTOELECTRICITY SCIENCE + TECHNOLOGY Effective date: 20141128 Owner name: JINGDONGFANG SCIENCE AND TECHNOLOGY GROUP CO., LTD Free format text: FORMER OWNER: BEIJING BOE PHOTOELECTRICITY SCIENCE + TECHNOLOGY CO., LTD. Effective date: 20141128 |
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