CN101377980A - Laminated ceramic capacitor - Google Patents
Laminated ceramic capacitor Download PDFInfo
- Publication number
- CN101377980A CN101377980A CNA200710182180XA CN200710182180A CN101377980A CN 101377980 A CN101377980 A CN 101377980A CN A200710182180X A CNA200710182180X A CN A200710182180XA CN 200710182180 A CN200710182180 A CN 200710182180A CN 101377980 A CN101377980 A CN 101377980A
- Authority
- CN
- China
- Prior art keywords
- ceramic capacitor
- laminated ceramic
- internal electrode
- dielectric
- dielectric ceramics
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Landscapes
- Ceramic Capacitors (AREA)
Abstract
The invention provides a laminated ceramic capacitor, which can sinter below 1080 DEG C under the reducing atmosphere; Pb is not included in the material of a dielectric ceramic layer; the dielectric constant is above 2000, and the temperature characteristics thereof is X7R characteristics; and the same lever of high-temperature accelerated life characteristics as the prior Ni internal electrode laminated ceramic capacitor is provided. The laminated ceramic capacitor has a plurality of dielectric ceramic layers (3), an internal electrode (4) which is formed among the dielectric ceramic layers (3), and an external electric electrode (5) which is connected with the internal electrode (4) by electricity, wherein, the dielectric ceramic layer (3) is a sintered body which is composed of a principal component and a subsidiary component. When the principal component is expressed by ABO3+aRe2O3+bMnO, A/B is more than or equal to 1.000 and less than or equal to 1.035, a is no less than 0.05 but no more than 0.75, and b is no less than 0.25 but no more than 2.0, and the subsidiary component includes over one among B, Li, or Si; simultaneously, the sum thereof when B2O3, Li2O, and SiO2 are respectively used for the conversion is 0.16 to 1.6 parts by quality; and the internal electrode (4) is composed of Cu or Cu alloy.
Description
Technical field
The present invention relates to constitute the laminated ceramic capacitor of internal electrode, relate to the laminated ceramic capacitor that in internal electrode, uses Cu by base metal.
Background technology
For the laminated ceramic capacitor that uses in electronic equipments such as portable equipment, communication equipment, the requirement of miniaturization and high capacity has improved.As this small-sized, jumbo laminated ceramic capacitor, for example for to open the laminated ceramic capacitor that disclosed internal electrode is made of Ni in the 2001-39765 communique the spy.In this laminated ceramic capacitor, because must roasting in reducing atmosphere, therefore by at the BaTiO that constitutes the dielectric ceramics layer
3Add various additives in the class ceramic material and improve reducing resistance.But because the interpolation of additive causes the agglutinating property of ceramic material to reduce, so firing temperature is up to more than 1200 ℃.
Consider from the energy efficiency aspect, proposed a kind of by laminated ceramic capacitor that can the material of sintering constitutes under the low temperature about 1000 ℃.For example, open in the flat 5-217426 communique, proposed by adding the method for reduction firing temperatures such as glass the spy.But, when increasing the addition of glass in order to reduce firing temperature, cause dielectric constant to reduce, be difficult to obtain small-sized jumbo laminated ceramic capacitor.
Open in the clear 63-265412 communique the spy, disclose by can and having the laminated ceramic capacitor that the high dielectric constant materials more than 2000 constitutes in reduction roasting below 1080 ℃.In this laminated ceramic capacitor, can in internal electrode, use Cu or with the alloy of Cu as principal component.But,, so in unleaded trend in recent years, have the problem aspect the environment because this laminated ceramic capacitor uses Pb perovskite dielectric in the principal phase of dielectric ceramics layer.In addition, open in the flat 10-212162 communique, disclose by the laminated ceramic capacitor that can constitute at the non-plumbous class material of sintering below 1080 ℃ the spy.But to be difficult to obtain dielectric constant at this laminated ceramic capacitor be about 20, compare BaTiO
3The small-sized big capacity laminated ceramic capacitor that the class material is low.
Patent documentation 1: the spy opens the 2001-39765 communique
Patent documentation 2: the spy opens flat 5-217426 communique
Patent documentation 3: the spy opens clear 63-265412 communique
Patent documentation 4: the spy opens flat 10-212162 communique
Summary of the invention
The present invention obtains a kind of laminated ceramic capacitor, and this capacitor can not contain Pb at sintering below 1080 ℃ under reducing atmosphere in the material of dielectric ceramics layer, and dielectric constant is more than 2000, and the temperature characterisitic of dielectric constant is the X7R characteristic.Have with existing Ni in the high temperature accelerated aging characteristic of electricity (internal electrode) laminated ceramic capacitor par.
The invention provides a kind of laminated ceramic capacitor, this laminated ceramic capacitor has a plurality of dielectric ceramics layers, between this dielectric ceramics layer relatively to and alternately be drawn out to different end faces and the internal electrode that forms, two end faces that are formed on above-mentioned dielectric ceramics layer and the outer electrode that is electrically connected with above-mentioned internal electrode respectively, above-mentioned dielectric ceramics layer is the sintered body that is made of principal component and accessory ingredient, and described principal component is by ABO
3+ aRe
2O
3+ bMnO (wherein, ABO
3For with BaTiO
3Be the perovskite dielectric of main body, Re
2O
3Be the oxide of selecting from La, Ce, Pr, Nd, Sm, Eu, Gd, Tb, Dy, Ho, Er, Tm, Yb, Lu and Y of metal more than a kind, a, b are with respect to 100 moles of ABO
3Molal quantity) when expression, 1.000 ≦ A/B ≦ 1.035,0.05 ≦ a ≦ 0.75,0.25 ≦ b ≦ 2.0.Described accessory ingredient contains more than one among B, Li or the Si, uses B respectively
2O
3, Li
2O, SiO
2Summation during conversion is 0.16～1.6 mass parts, and above-mentioned internal electrode is made of Cu or Cu alloy.
According to the present invention, because the dielectric ceramics layer is with BaTiO
3As the perovskite dielectric of main body, therefore can make dielectric constant, and satisfy the X7R characteristic more than 2000.In addition, have the dielectric ceramics layer of above-mentioned composition and the internal electrode that constitutes by Cu or Cu alloy by combination, can be below 1080 ℃, preferably at 1000 ℃ of left and right sides sintering.
In addition, the invention provides a kind of laminated ceramic capacitor, in above-mentioned dielectric ceramics layer, contain Cu compound or Cu internally electrode diffusion be distributed in the above-mentioned dielectric ceramics layer.
According to the present invention, by in the dielectric ceramics layer, containing the Cu compound, perhaps Cu internally electrode diffusion be distributed in the above-mentioned dielectric ceramics layer, the potential barrier of crystal boundary is uprised, insulating properties uprises, and therefore can improve high temperature accelerated aging characteristic.
According to the present invention, can access a kind of laminated ceramic capacitor, described laminated ceramic capacitor can be at sintering below 1080 ℃ under reducing atmosphere, in the material of dielectric ceramics layer, do not contain Pb, dielectric constant is more than 2000, the temperature characterisitic of dielectric constant is the X7R characteristic, have with existing Ni in the high temperature accelerated aging characteristic of electricity (internal electrode) laminated ceramic capacitor par.
Description of drawings
Fig. 1 is the mode sectional drawing of expression laminated ceramic capacitor of the present invention.
Symbol description
1 laminated ceramic capacitor
2 ceramic layer zoariums
3 dielectric ceramics layers
4 internal electrodes
5 outer electrodes
6 first coating
7 second coating
Embodiment
The following describes the execution mode of laminated ceramic capacitor of the present invention.As shown in Figure 1, the laminated ceramic capacitor 1 of present embodiment comprises the ceramic layer zoarium 2 that is made of a plurality of dielectric ceramics layers 3, the internal electrode 4 that forms between this dielectric ceramics layer.On two end faces of ceramic layer zoarium 2, be electrically connected formation outer electrode 5 with internal electrode, form first coating 6, second coating 7 thereon as required.
Dielectric ceramics layer 3 is made of following sintered body, promptly with respect to 100 moles of A/B be 1.000～1.035 with BaTiO
3Perovskite dielectric for main body contains 0.05～0.75 mole Re
2O
3(Re
2O
3Oxide at least a metal from La, Ce, Pr, Nd, Sm, Eu, Gd, Tb, Dy, Ho, Er, Tm, Yb, Lu and Y, selected), contain 0.25～2.0 mole MnO, and add comprise among B, Li or the Si more than one, when using B respectively
2O
3, Li
2O, SiO
2Summation is the accessory ingredient of 0.16～1.6 mass parts during conversion.As the perovskite dielectric, remove BaTiO
3Outside, the part that for example can also be Ba also can be the material that the part of Ti is replaced by Zr by the material of Sr, Ca displacement.For MnO, because as long as convert in compositing range with MnO, so initial feed can be MnCO
3Or Mn
3O
4As the accessory ingredient that becomes sintering aid, for example be Li
2O-SiO
2Class glass, B
2O
3-SiO
2Class glass, Li
2O-B
2O
3-SiO
2Class glass etc.Need to prove that the value of A/B also is included in the Ba that comprises in glass ingredient etc. and Ti etc. in the perovskite dielectric except that Ba that comprises and Ti etc., be used in the value of recently representing A/B of the total amount of the Ba that comprises in the sintered body and Ti etc.
Embodiment
Based on the following examples, verify effect of the present invention.
For the sintered body that obtains forming shown in the table 1, prepare BaTiO
3(BT), MnO, terres rares (Dy
2O
3), additive (MgO) and as accessory ingredient (glass ingredient or the SiO of sintering aid
2) as initial feed.Need to prove, in table 1, use the addition of representing MnO, terres rares and additive with respect to the molal quantity of 100 moles of BT, the B when being 100 mass parts with BT
2O
3, Li
2O or SiO
2In more than one gross mass part represent addition as the accessory ingredient of sintering aid.In addition, as glass ingredient, use 0.45SiO at this
2-0.10B
2O
3-0.45Li
2O class glass.The numeral of representing in this glass ingredient is mole %.
Table 1
Outside the ※ scope of the present invention
By the ready BaTiO of ball mill wet mixed
3, MnO, Dy
2O
3And sintering aid.Need to prove, in the sample of No.3 and No.4, also added MgO and carried out wet mixed.In 400 ℃ of following atmosphere, calcined 2 hours after dry, pulverize through dry type and obtain dielectric ceramic powder.
In above-mentioned powder, add polyvinyl butyral resin, organic solvent, plasticizer, mix, form ceramic size.Make this ceramic size sheet by rolling method, obtain the ceramic printed-circuit board of 5 microns of thickness.On this ceramic printed-circuit board, apply Cu internal electrode thickener by silk screen printing, form internal electrode pattern.In addition, at this as a comparison, preparation forms the ceramic printed-circuit board of internal electrode pattern by coating Ni internal electrode thickener.With laminated 20 of the ceramic printed-circuit board that has formed internal electrode pattern, carry out pressurized adhesion, be cut into 4.0 * 2.0mm size, form raw material chip (raw chip).Should give birth to chip unsticking mixture in blanket of nitrogen, then in reducing atmosphere, under the firing temperature shown in the table 2, burn till.Burn till the following formation of pattern.Under temperature shown in the table, kept 2 hours, after this reduce this temperature,, drop to room temperature and form pattern under about 700 ℃ atmosphere being become the blanket of nitrogen maintenance after 2 hours.Behind the sintering, expose face at internal electrode and apply Cu outer electrode thickener, sintering in inert gas.To so obtaining being of a size of 3.2 * 1.6mm, dielectric ceramics layer thickness is 4 microns laminated ceramic capacitor, measures agglutinating property, dielectric constant, temperature characterisitic, high temperature accelerated aging, is summarized in the table 2.In addition, (ink test) carries out the judgement of agglutinating property by ink test, in ink the sample marking of dipping poststaining be *, the sample marking that does not have to dye is zero.Down measure electrostatic capacitances with the LCR testers at 25 ℃, intersection area, dielectric thickness and the number of plies of the laminated ceramic capacitor by sample are calculated and are obtained dielectric constant.Need to prove, for temperature characterisitic, be benchmark with 25 ℃ electrostatic capacitances, and the sample in the scope (X7R) of variation ± 15% of the electrostatic capacitance under-55 ℃～125 ℃ is qualified.In addition, for the high temperature accelerated aging, measure by 15 samples of each sample with 150 ℃, the load of 15V/ μ m, it is zero in the sample marking more than 48 hours that insulating resistance value is reduced to the following time of 1M Ω.
Table 2
Outside the ※ scope of the present invention
According to the result of No.1～4, internal electrode is the sample of Cu, obtained dielectric constant more than 2000, temperature characterisitic satisfies X7R, the good laminated ceramic capacitor of high temperature accelerated aging characteristic.Internal electrode is the sample of Ni, as No.2 and 4, high temperature accelerated aging characteristic under 1000 ℃ or 1080 ℃ does not reach the level of hope, at failing the sample of sintering, as No.3, obtain dielectric constant more than 2000, temperature characterisitic satisfies X7R, the good laminated ceramic capacitor of high temperature accelerated aging characteristic, needs 1300 ℃ firing temperature.
According to the result of No.5～9, for the sample that is in 1.000≤A/B≤1.035 scopes, obtained dielectric constant more than 2000, temperature characterisitic satisfies X7R, the good laminated ceramic capacitor of high temperature accelerated aging characteristic.
According to the result of No.10～14, be the sample of a in 0.05～0.75 molar range for the ratio of components of terres rares, obtained dielectric constant more than 2000, temperature characterisitic satisfies X7R, the good laminated ceramic capacitor of high temperature accelerated aging characteristic.
According to the result of No.15～19, be the sample of b in 0.25～2.0 molar range for the ratio of components of MnO, obtained dielectric constant more than 2000, temperature characterisitic satisfies X7R, the good laminated ceramic capacitor of high temperature accelerated aging characteristic.In addition, the temperature characterisitic X7S of No.15 is illustrated in being changed to of-55 ℃～125 ℃ of following electrostatic capacitances ± 22%, because the standard of discontented unabridged version embodiment, so defective.
Result according to No.20～24, for the accessory ingredient as sintering aid is the sample of glass ingredient in 0.16～1.6 mass parts scope, obtained dielectric constant more than 2000, temperature characterisitic satisfies X7R, the good laminated ceramic capacitor of high temperature accelerated aging characteristic.
By above result as can be known, have the dielectric ceramics layer and the Cu internal electrode of compositing range of the present invention by combination, obtained dielectric constant more than 2000, temperature characterisitic satisfies X7R, the good laminated ceramic capacitor of high temperature accelerated aging characteristic.
Be the sintered body that obtains forming shown in the table 3, operation obtains dielectric ceramic powder similarly to Example 1.At this, the kind of conversion terres rares is verified its effect.
Table 3
Use above-mentioned dielectric ceramic powder, operation similarly to Example 1 forms laminated ceramic capacitor, and test agglutinating property, dielectric constant, temperature characterisitic, high temperature accelerated aging are summarized in table 4.
Table 4
By The above results as can be known, for using Dy
2O
3The sample of terres rares in addition, perhaps mix the sample that uses 2 kinds of terres rares, as long as within the scope of the invention, by with the combination of Cu internal electrode, just can access dielectric constant more than 2000, temperature characterisitic satisfies X7R, the good laminated ceramic capacitor of high temperature accelerated aging characteristic.
Embodiment 3
In order to obtain the sintered body of composition as shown in table 5, operation obtains dielectric ceramic powder similarly to Example 1.Change other additives, the dielectric composition of perovskite and verify its effect at this as the accessory ingredient of sintering aid.In table 5, in the mark of principal phase, Ca, Sr represent the replacement amount (atom %) with respect to Ba, and Zr uses the replacement amount (atom %) with respect to Ti to represent.Be that No.47 is Ba
0.9Ca
0.1TiO
2, No.48 is Ba
0.9Sr
0.1TiO
2, No.49 is BaTi
0.75Zr
0.25O
2
Table 5
Use above-mentioned dielectric ceramic powder, operation similarly to Example 1 forms laminated ceramic capacitor, and test agglutinating property, dielectric constant, temperature characterisitic, high temperature accelerated aging are summarized in table 6.
Table 6
By The above results as can be known, as long as within the scope of the invention, even add suitable additive, perhaps change the dielectric composition of perovskite, also can by with Cu internal electrode combination, obtain dielectric constant more than 2000, temperature characterisitic satisfies X7R, the good laminated ceramic capacitor of high temperature accelerated aging characteristic.In addition, for for the accessory ingredient of sintering aid, can contain a kind of among B, Li or the Si.
In order to obtain the sintered body of composition as shown in table 7, operation obtains dielectric ceramic powder similarly to Example 1.The effect that in this check dielectric ceramics layer, has Cu.Use resulting dielectric ceramic powder, operation similarly to Example 1 forms laminated ceramic capacitor, measures agglutinating property, dielectric constant, temperature characterisitic, high temperature accelerated aging, is summarized in table 7.In addition, the Cu compound of interpolation is CuO.
Table 7
Outside the ※ scope of the present invention
By The above results as can be known, be under the situation of Ni at internal electrode, high temperature accelerated aging characteristic can not reach the level of hope.By using EPMA to analyze internal electrode as can be known as the result of the sample of Ni, the CuO of interpolation most of with the coexistence of Ni internal electrode, in the dielectric ceramics layer, exist hardly.On the other hand, be under the situation of Cu at internal electrode, the high temperature accelerated aging reaches the level of hope.Analyze No.55 with XAFS (X ray absorb fine structure analysis) method, results verification in the dielectric ceramics layer, have Cu.In addition, for the No.56 that does not add CuO, also confirmed in the dielectric ceramics layer, to have Cu.Based on this fact, be diffused into the dielectric ceramics layer from the Cu internal electrode by making Cu, the potential barrier of crystal boundary is uprised, insulating properties uprises, and has therefore improved high temperature accelerated aging characteristic.
In addition, as No.58, No.59, compare with No.57, increase the additive amount in order to improve high temperature accelerated aging characteristic, caused agglutinating property to worsen, as No.60, No.61, increase sintering aid in order to improve agglutinating property, caused dielectric constant to reduce.But, as No.56, by in internal electrode, using Cu, the amount of additive and sintering aid is suppressed can access high-k for can just making high temperature accelerated aging characteristic reach the level of hope in the amount of 1000 ℃ of left and right sides sintering.
According to the above description, as described herein, by making up with BaTiO
3Be dielectric dielectric ceramics layer of the perovskite of main body and Cu internal electrode, can access can be at the laminated ceramic capacitor of sintering below 1080 ℃, its dielectric constant is more than 2000, and the temperature characterisitic of dielectric constant is the X7R characteristic, has good high-temperature accelerated aging characteristic.
Claims (3)
1, a kind of laminated ceramic capacitor, this laminated ceramic capacitor has a plurality of dielectric ceramics layers, between this dielectric ceramics layer relatively to and alternately be drawn out to different end faces and the internal electrode that forms, two end faces that are formed on described dielectric ceramics layer and the outer electrode that is electrically connected with described internal electrode respectively, it is characterized in that
Described dielectric ceramics layer is the sintered body that is made of principal component and accessory ingredient, and described principal component is by ABO
3+ aRe
2O
3When+bMnO represents, 1.000 ≦ A/B ≦ 1.035,0.05 ≦ a ≦ 0.75,0.25 ≦ b ≦ 2.0, wherein ABO
3For with BaTiO
3Be the perovskite dielectric of main body, Re
2O
3Be the oxide of selecting from La, Ce, Pr, Nd, Sm, Eu, Gd, Tb, Dy, Ho, Er, Tm, Yb, Lu and Y of metal more than a kind, a, b are with respect to 100 moles of ABO
3Molal quantity,
Described accessory ingredient contains more than one among B, Li or the Si, uses B respectively
2O
3, Li
2O, SiO
2Summation during conversion is 0.16～1.6 mass parts,
Described internal electrode is made of Cu or Cu alloy.
2, laminated ceramic capacitor as claimed in claim 1 is characterized in that, contains the Cu compound in the described dielectric ceramics layer.
3, laminated ceramic capacitor as claimed in claim 1 is characterized in that, diffusion profile has Cu in described dielectric ceramics layer.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNA200710182180XA CN101377980A (en) | 2007-08-31 | 2007-08-31 | Laminated ceramic capacitor |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNA200710182180XA CN101377980A (en) | 2007-08-31 | 2007-08-31 | Laminated ceramic capacitor |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN101377980A true CN101377980A (en) | 2009-03-04 |
Family
ID=40421468
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNA200710182180XA Pending CN101377980A (en) | 2007-08-31 | 2007-08-31 | Laminated ceramic capacitor |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN101377980A (en) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109180177A (en) * | 2018-09-27 | 2019-01-11 | 中国科学院上海硅酸盐研究所 | A kind of X9R type medium material for multilayer ceramic capacitors and its preparation method and application |
| CN110310825A (en) * | 2018-03-27 | 2019-10-08 | Tdk株式会社 | Monolithic ceramic electronic component |
| CN110310830A (en) * | 2018-03-27 | 2019-10-08 | Tdk株式会社 | Monolithic ceramic electronic component |
| CN110310826A (en) * | 2018-03-27 | 2019-10-08 | Tdk株式会社 | Monolithic ceramic electronic component |
| CN112349518A (en) * | 2019-08-07 | 2021-02-09 | 株式会社村田制作所 | Laminated electronic component |
| CN115483026A (en) * | 2019-07-24 | 2022-12-16 | 三星电机株式会社 | Multilayer ceramic capacitor |
-
2007
- 2007-08-31 CN CNA200710182180XA patent/CN101377980A/en active Pending
Cited By (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110310825A (en) * | 2018-03-27 | 2019-10-08 | Tdk株式会社 | Monolithic ceramic electronic component |
| CN110310830A (en) * | 2018-03-27 | 2019-10-08 | Tdk株式会社 | Monolithic ceramic electronic component |
| CN110310826A (en) * | 2018-03-27 | 2019-10-08 | Tdk株式会社 | Monolithic ceramic electronic component |
| US10892098B2 (en) | 2018-03-27 | 2021-01-12 | Tdk Corporation | Multilayer ceramic electronic component |
| CN110310826B (en) * | 2018-03-27 | 2021-08-03 | Tdk株式会社 | Laminated ceramic electronic component |
| CN110310825B (en) * | 2018-03-27 | 2021-08-03 | Tdk株式会社 | Laminated ceramic electronic component |
| US11114246B2 (en) | 2018-03-27 | 2021-09-07 | Tdk Corporation | Multilayer ceramic electronic component |
| US11289272B2 (en) | 2018-03-27 | 2022-03-29 | Tdk Corporation | Multilayer ceramic electronic component |
| CN109180177A (en) * | 2018-09-27 | 2019-01-11 | 中国科学院上海硅酸盐研究所 | A kind of X9R type medium material for multilayer ceramic capacitors and its preparation method and application |
| CN115483026A (en) * | 2019-07-24 | 2022-12-16 | 三星电机株式会社 | Multilayer ceramic capacitor |
| CN112349518A (en) * | 2019-08-07 | 2021-02-09 | 株式会社村田制作所 | Laminated electronic component |
| CN112349518B (en) * | 2019-08-07 | 2022-05-31 | 株式会社村田制作所 | Laminated electronic component |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN101081734B (en) | Dielectric ceramics and multi-layer ceramic capacitor | |
| CN101276659B (en) | Dielectric ceramics and multi-layer ceramic capacitor | |
| JP4936825B2 (en) | Multilayer ceramic capacitor | |
| CN101162620B (en) | Dielectric ceramic composition, multi-layer ceramic capacitor and manufacturing method thereof | |
| CN100497251C (en) | Electronic device, dielectric ceramic composition and the production method | |
| JP4936850B2 (en) | Multilayer ceramic capacitor | |
| CN101628809B (en) | Dielectric ceramic material and monolithic ceramic capacitor | |
| KR101358488B1 (en) | Dielectric ceramic composition and electronic device | |
| CN101456727A (en) | Dielectric ceramic composition and electric device | |
| CN102219478A (en) | Dielectric ceramic composition and ceramic electronic component | |
| US7239501B2 (en) | Dielectric ceramic composition and laminated ceramic capacitor | |
| US6962888B2 (en) | Dielectric ceramic composition and electronic device | |
| CN101377980A (en) | Laminated ceramic capacitor | |
| JP4548423B2 (en) | Dielectric ceramic and multilayer ceramic capacitors | |
| US9153382B2 (en) | Multilayer ceramic capacitor and method for manufacturing multilayer ceramic capacitor | |
| JP2021082686A (en) | Ceramic electronic component and manufacturing method thereof | |
| KR100673916B1 (en) | Dielectric porcelain composition and electronic part | |
| JP2008201616A (en) | Dielectric ceramic and laminated ceramic capacitor | |
| JP5133080B2 (en) | Dielectric ceramics and multilayer ceramic capacitors | |
| US6572793B2 (en) | Method of producing ceramic composition and method of producing electronic device | |
| JP2008227093A (en) | Manufacturing method of multilayer electronic component | |
| JP2023541576A (en) | Dielectric ceramic composition and ceramic capacitor using the same |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C12 | Rejection of a patent application after its publication | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20090304 |