CN101344563B - Automatic test equipment and method for touch device - Google Patents
Automatic test equipment and method for touch device Download PDFInfo
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- CN101344563B CN101344563B CN2008101472502A CN200810147250A CN101344563B CN 101344563 B CN101344563 B CN 101344563B CN 2008101472502 A CN2008101472502 A CN 2008101472502A CN 200810147250 A CN200810147250 A CN 200810147250A CN 101344563 B CN101344563 B CN 101344563B
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Abstract
The invention discloses an automatic testing apparatus and a corresponding method used for a touch device. The automatic testing apparatus comprises a clamp unit (101) which is connected with the touch device (10) through data means and used for fastening the touch device; at least one detecting unit (102) which senses the touch device and is used for simulating the operation of users; a support unit (103) which is connected with the detecting unit and used for controlling and fastening the detecting unit; a data processing control unit (104) which is connected with the clamp unit and the support unit and used for receiving the data from the clamp unit and support unit and controlling the units through feedback. Adopting the automatic testing apparatus and the method used for touch devices can realize the automatic test to touch devices so as to enhance manufacturing efficiency, reduce failure products, raise the reliability of products and avoid the impact of manual errors.
Description
Technical field
The present invention relates to the automatic test technology field, relate in particular to a kind of realization capacitance touch device ATE (automatic test equipment) and method thereof.
Background technology
Touch device has been widely used on the electronic product, and touch device provides a kind of simple, light and cheap indicating device.Existing touch device has three kinds of resistance-types, electromagnetic type, condenser type.Because need compression point to concentrate during the operation of the touch device of resistance-type, the touch device of electromagnetic type then needs to cooperate a kind of input pen with battery to import, and on performance and cost, the capacitance touch device surmounts resistance-type and electromagnetic type touch device.The principle of work of capacitance touch device is to utilize user's finger or moment that conductor touches touch device to produce a capacity effect because the core of capacitance touch sensor-based system all be one group with the interactional conductor of electric field.Below skin, be full of conductive electrolyte (a kind of dielectric that diminishes) in the tissue.Thereby the position of finger or conductor is determined in the variation of passing through capacitance.Therefore the capacitance touch device must be with the input pen of electric consumption unlike the electromagnetic type touch device, and the use of capacitance touch device also need exert pressure concentratedly unlike the resistive touch device, so serviceable life is longer.Moreover the composition of capacitance touch device is simple, and element is few, and production efficient height makes that cost was lower when the capacitance touch device was produced in a large number.Thereby the capacitance touch device is subjected to consumer's welcome day by day, such as the best-selling product Ipod and the Iphone of Apple.
And at present in the process of a large amount of production capacitance touch devices, the method of testing capacitor formula touch device is but very simple, not reliable relatively specialized equipment, under a lot of situations is to depend on the hand inspection that designs previously, need the equipment of more reliable specialty to detect aborning, come touch device is tested automatically, to enhance productivity, to reduce defective products, promote product reliability and to avoid the human error to influence.
Therefore be necessary to propose a kind of touch device ATE (automatic test equipment) and method comes touch device is tested automatically, to enhance productivity, to reduce defective products, promote product reliability and to avoid the human error to influence.
Summary of the invention
The object of the present invention is to provide a kind of touch device ATE (automatic test equipment) and method thereof to come touch device is tested automatically, to enhance productivity, to reduce defective products, promote product reliability and to avoid the human error to influence.
To achieve these goals, technical scheme of the present invention is as follows: a kind of touch device ATE (automatic test equipment) comprises: a fixture unit, and it is connected with the touch device data, and fixes this touch device; At least one probe unit, its be plate electrode and with touch device induction, operate in order to analog subscriber; One support unit, it links to each other with probe unit, and controls and fix this probe unit, and described support unit applies the voltage that powers up by a voltage interface circuit or the frequency that powers up given probe unit; One data processing and control unit links to each other with support unit with fixture unit, and the data of receiving jig unit and support unit also give FEEDBACK CONTROL.
On the basis of technique scheme, additional technical feature of the present invention is as follows:
Described fixture unit is connected employing internal integrate circuit bus (Inter-Integrated Circuit) with the data of data processing and control unit, and described probe unit and support unit adopt serial ports or usb data connected mode.
The invention provides a kind of touch device automatic test approach simultaneously may further comprise the steps:
S1: be put on the fixture unit touch device fixing and be connected with the fixture unit data;
S2: probe unit and this touch device is close;
S3: select the test pattern in the data processing unit;
S4: carry out test pattern, probe unit is responded to touch device;
S5: the data that induction obtained of touch device are fed back to data processing unit by fixture unit;
S6: the data that comparison is obtained and the setting value of data processing unit;
S7: statistical result and output.
On the basis of said method scheme, of the present inventionly further comprise the steps:
The test pattern of step S3 comprises button testing fatigue, button sensitivity test, disturbed test etc. at least.
Step S4 carries out a plurality of test patterns simultaneously.
Adopt technical scheme of the present invention, have the following advantages:
1) can realize touch device is tested automatically, enhance productivity, reduce defective products, promote product reliability and avoid the human error to influence.
2) flexible selection test point need not to redesign test board for new panel.
3) can test on same platform by integrated multiple touch device, saved cost, improved efficient.
Description of drawings
Fig. 1 is the structure principle chart of touch device ATE (automatic test equipment) among the present invention.
Fig. 2 is the stereographic map of touch device ATE (automatic test equipment) among the present invention.
Fig. 3 is the process flow diagram of touch device automatic test approach among the present invention.
Embodiment
As Fig. 1 and Fig. 2, a kind ofly be used for that touch device 10 is carried out ATE (automatic test equipment) 1 and comprise: a fixture unit 101, it is the common anchor clamps platform with fixed function; Several probe units 102, it is used to award touch device 10 induced signals and operates with analog subscriber, support unit 103 is for providing the probe unit control and the fixing equipment of probe unit position, and data processing unit 104 is devices such as single-chip microcomputer or computer processing controls.
Data processing unit 104 is connected with 32 by bus 30 with anchor clamps platform 101 and support unit 103.Data processing unit 104 by support unit 103 control probe unit 102 up and down and move left and right.Data processing unit 104 comprises at least: store test pattern instruction more than at least three kinds and setting person database, be used for comparing unit that data that probe unit 102 is obtained and setting person compare and the statistical analysis unit of adding up above-mentioned comparative result, wherein test pattern comprises success of statistics button and the number of times testing fatigue pattern of failing, powers up a plurality of patterns such as test pattern, disturbed test pattern.Under the testing fatigue pattern, data processing unit 104 is given the frequent electricity that powers up and go and is operated; Under the button sensitivity test pattern, data processing unit 104 gives the test probes unit 102 of picked at random to power up and to go the electricity operation; Under the disturbed test pattern, data processing unit 104 gives certain or some probe units 102 with the interference that certain user selects, and mainly is Radio frequency interference (RFI).
With reference to Fig. 3, on the basis of above-mentioned touch device ATE (automatic test equipment), a kind of touch device automatic test approach step of employing is as follows:
S1: be put on the anchor clamps platform 101 touch device 10 fixing and be connected with anchor clamps platform 101 data;
S2: probe unit 102 and this touch device 10 is close;
S3: select the test pattern in the data processing unit 104;
S4: carry out test pattern, 102 pairs of touch devices 10 of probe unit are responded to;
S5: the data that induction obtained of touch device 10 are fed back to data processing unit 104 by anchor clamps platform 101;
S6: the data that comparison is obtained and the setting value of data processing unit;
S7: statistical result and output.
Wherein the test pattern of step S3 comprises button testing fatigue, button sensitivity test, disturbed test etc. at least.So-called button testing fatigue, from the keyboard test amplification, refer to when touch potential above necessarily not for a long time, whether button can operate as normal.So-called button sensitivity test refers to the number of times that can discern under the button situation at random.So-called disturbed test is meant at ad-hoc location to be disturbed, the method whether the test touch device is working properly.And in selection course, can carry out simultaneously by a plurality of test patterns, further to mention testing efficiency.The result of step S7 output can show by display or other fault prompting modes in addition.
Adopt touch device ATE (automatic test equipment) of the present invention and method thereof, can realize touch device is tested automatically, enhance productivity, reduce defective products, promote product reliability and avoid the human error to influence.And can be flexible on touch device, select test point, need not to redesign testing apparatus for new touch device, can on same data processing unit, save cost with multiple touch device test pattern is integrated, improved efficient.
Though the present invention with preferred embodiment openly as above; but it is not in order to qualification the present invention, any person skilled in the art, without departing from the spirit and scope of the present invention; all can do various changes and modification, so protection scope of the present invention should be with being as the criterion that claims were defined.
Claims (6)
1. touch device ATE (automatic test equipment) is characterized in that comprising:
One fixture unit (101), it is connected with touch device (10) data, and fixes this touch device;
At least one probe unit (102), its be plate electrode and with touch device (10) induction, operate in order to analog subscriber;
One support unit (103), it links to each other with probe unit (102), and controls and fix this probe unit (102), and described support unit (103) applies the voltage that powers up by a voltage interface circuit or the frequency that powers up given probe unit (102);
One data processing unit (104) links to each other with support unit (103) with fixture unit (101), and the data of receiving jig unit (101) and support unit (103) also give FEEDBACK CONTROL.
2. a kind of touch device ATE (automatic test equipment) according to claim 1, it is characterized in that, described fixture unit (101) is connected employing internal integrate circuit bus (Inter-Integrated Circuit) with the data of data processing unit (104), and described probe unit (102) adopts serial ports or usb data connected mode with support unit (103).
3. a kind of touch device ATE (automatic test equipment) as claimed in claim 1, it is characterized in that, described support unit (103) is connected with bus between the data processing unit (104) and adopts serial ports or USB interface, and data processing unit (104) moves by support unit (103) control probe unit (102).
4. touch device automatic test approach is characterized in that may further comprise the steps:
S1 a: touch device (10) is put into fixture unit (101) goes up fixing and be connected with fixture unit (101) data;
S2: probe unit (102) and this touch device (10) is close;
S3: select the test pattern in the data processing unit (104);
S4: carry out test pattern, probe unit (102) is responded to touch device (10);
S5: the data that induction obtained of touch device (10) are fed back to data processing unit (104) by fixture unit (101);
S6: the data that comparison is obtained and the setting value of data processing unit (104);
S7: statistical result and output.
5. a kind of touch device automatic test approach as claimed in claim 4 is characterized in that the test pattern of step S3 comprises button testing fatigue, button sensitivity test, disturbed test at least.
6. a kind of touch device automatic test approach as claimed in claim 5 is characterized in that step S4 carries out a plurality of test patterns simultaneously.
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2008101472502A CN101344563B (en) | 2008-08-25 | 2008-08-25 | Automatic test equipment and method for touch device |
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| Application Number | Priority Date | Filing Date | Title |
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| CN2008101472502A CN101344563B (en) | 2008-08-25 | 2008-08-25 | Automatic test equipment and method for touch device |
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| Publication Number | Publication Date |
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| CN101344563A CN101344563A (en) | 2009-01-14 |
| CN101344563B true CN101344563B (en) | 2011-08-10 |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI510987B (en) * | 2013-01-21 | 2015-12-01 | Tpk Touch Solutions Xiamen Inc | Testing device for touch panel |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102222031A (en) * | 2011-03-25 | 2011-10-19 | 苏州瀚瑞微电子有限公司 | Touch device testing method |
| CN102761648B (en) * | 2011-04-27 | 2015-12-09 | 比亚迪股份有限公司 | Calibration has the method and system of the mobile terminal of photoelectric type proximity transducer |
| TWI437245B (en) * | 2011-08-31 | 2014-05-11 | Kinpo Elect Inc | Test system and method relating to cap-sense touch input device |
| CN103257300B (en) * | 2012-02-16 | 2016-01-20 | 神讯电脑(昆山)有限公司 | Multipoint touch screen automatic testing equipment |
| CN102998619B (en) * | 2012-11-28 | 2015-07-15 | 深圳和而泰智能控制股份有限公司 | Method, device and system for testing sensing buttons |
| CN107688129A (en) * | 2017-09-08 | 2018-02-13 | 惠州市嘉和立方电子商务有限公司 | A kind of condenser type flexible touch button plug life detecting device |
| CN109964134A (en) * | 2017-10-23 | 2019-07-02 | 深圳市汇顶科技股份有限公司 | The test macro and method of touch control device anti-interference ability |
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2008
- 2008-08-25 CN CN2008101472502A patent/CN101344563B/en not_active Expired - Fee Related
Non-Patent Citations (1)
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| 李中奇等.嵌入式LINUX***中触摸屏控制的研究与实现.《现代显示》.2005,(第2期),第19－22页. * |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI510987B (en) * | 2013-01-21 | 2015-12-01 | Tpk Touch Solutions Xiamen Inc | Testing device for touch panel |
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| CN101344563A (en) | 2009-01-14 |
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