CN101320076B - 一种快恢复二极管的反向动态漏电流测试方法及测试电路 - Google Patents
一种快恢复二极管的反向动态漏电流测试方法及测试电路 Download PDFInfo
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CN102707216A (zh) * | 2012-06-04 | 2012-10-03 | 扬州扬杰电子科技股份有限公司 | 一种肖特基半导体元件的检测方法 |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
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JP2011003760A (ja) * | 2009-06-19 | 2011-01-06 | Sanyo Electric Co Ltd | 半導体装置 |
CN102540042B (zh) * | 2011-12-09 | 2014-01-08 | 绍兴文理学院 | 一种高压整流二极管性能检测电路 |
CN102854435B (zh) * | 2012-08-31 | 2014-06-18 | 南通市通州区华昌电子有限公司 | 一种二极管高温漏电测试*** |
CN103969564A (zh) * | 2013-01-30 | 2014-08-06 | 苏州同冠微电子有限公司 | 一种二极管反向恢复特性测试仪 |
CN103745926B (zh) * | 2013-12-18 | 2016-10-05 | 常州星海电子有限公司 | 低压降高反压快恢复二极管工艺控制方法 |
CN109901040A (zh) * | 2019-04-08 | 2019-06-18 | 西安交通大学 | 一种高压大功率晶闸管反向恢复电流测试***及测试方法 |
CN111308389B (zh) * | 2020-03-24 | 2022-05-24 | 合肥恒钧检测技术有限公司 | 一种变流器及其功率半导体器件漏电流自检方法 |
CN112034321B (zh) * | 2020-08-03 | 2022-10-28 | 中国空间技术研究院 | 一种快速软恢复二极管功能性能的评估方法 |
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US5111137A (en) * | 1990-10-29 | 1992-05-05 | Hewlett-Packard Company | Method and apparatus for the detection of leakage current |
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US5111137A (en) * | 1990-10-29 | 1992-05-05 | Hewlett-Packard Company | Method and apparatus for the detection of leakage current |
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
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CN102707216A (zh) * | 2012-06-04 | 2012-10-03 | 扬州扬杰电子科技股份有限公司 | 一种肖特基半导体元件的检测方法 |
CN102707216B (zh) * | 2012-06-04 | 2014-04-09 | 扬州扬杰电子科技股份有限公司 | 一种肖特基半导体元件的检测方法 |
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