CN101278601B - Circuit for measuring the brightness of light sources - Google Patents
Circuit for measuring the brightness of light sources Download PDFInfo
- Publication number
- CN101278601B CN101278601B CN200680034767XA CN200680034767A CN101278601B CN 101278601 B CN101278601 B CN 101278601B CN 200680034767X A CN200680034767X A CN 200680034767XA CN 200680034767 A CN200680034767 A CN 200680034767A CN 101278601 B CN101278601 B CN 101278601B
- Authority
- CN
- China
- Prior art keywords
- operational amplifier
- circuit arrangement
- input end
- electrically connected
- brightness
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 239000004065 semiconductor Substances 0.000 claims description 12
- 238000005259 measurement Methods 0.000 claims description 11
- 238000001514 detection method Methods 0.000 description 4
- 230000003321 amplification Effects 0.000 description 3
- 238000003199 nucleic acid amplification method Methods 0.000 description 3
- 230000032683 aging Effects 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 230000001143 conditioned effect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/44—Electric circuits
- G01J1/46—Electric circuits using a capacitor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J2001/4247—Photometry, e.g. photographic exposure meter using electric radiation detectors for testing lamps or other light sources
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- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
- Led Devices (AREA)
Abstract
Circuit arrangement for measuring the brightness of light sources comprising an operational amplifier (2), the gain of which is fixedly set, wherein at least one photodetector (3, 4) is electrically connected to a first input of the operational amplifier (2) and a current path (5) for feeding in current to the operational amplifier (2) is electrically connected to the first input of the operational amplifier (2).
Description
Technical field
The present invention relates to a kind of circuit arrangement that is used for light source is carried out brightness measurement.
Background technology
In many aspects, at light source, for example have in the light source of one or more LED (light-emitting diode) or other electric lights, need and expectation be brightness when determining its work.Then, use these information, so that can regulate the best operating condition of light source and can guarantee to work efficiently conscientiously.This brightness measurement for example is important, proofreaies and correct so that can carry out chromaticity coordinate.Cause the chromaticity coordinate skew of the light that light source launches by the influence of aging and working temperature, and need initiatively measure this chromaticity coordinate skew and proofread and correct this chromaticity coordinate skew.Have only the light that just can on the run duration of the length of light source, launch by such mode that required chromatic spectrum is provided by light source.
Because light-source brightness changes on very large scope usually, so the circuit arrangement that can measure and detect this large-scale brightness need be provided.At the present known circuit arrangement that is used for measurement light source brightness, utilization can realize gain conversions (Verstaerkungsumschaltung) by digital regulated resistance.Yet this configuration with digital regulation resistance is complexity and cost height very.Be known that in addition circuit arrangement is configured to integrated circuit, utilize these integrated circuits numeral to change gain.
Yet known circuit arrangement only can be realized the very limited scope of brightness is detected, and only can realize the chromaticity coordinate correction in suboptimum ground thus.
Summary of the invention
Therefore, the present invention based on task provide a kind of circuit arrangement, utilize this circuit arrangement can with economical and reliably mode on the very large brightness range of light source, realize the light-source brightness measurement.
This task solves by a kind of circuit arrangement that is used at least one light source is carried out brightness measurement, this circuit arrangement has the operational amplifier that its gain is fixed and is provided with, wherein at least one photoelectric detector is electrically connected with the first input end of operational amplifier, and be used for the current fed current path of operational amplifier of giving is electrically connected with the first input end of operational amplifier, wherein current path is connected with D/A converter.
The circuit arrangement that is used for light source is carried out brightness measurement according to the present invention comprises operational amplifier, and the gain of operational amplifier wherein is set basically regularly.In addition, this circuit arrangement has at least one photoelectric detector, and this photoelectric detector is electrically connected with the first input end of operational amplifier, and is configured and is set for the light of detection light source.As other Important Thought of the present invention, this circuit arrangement has current path, and this current path is configured to be electrically connected to operational amplifier feed-in electric current and with the first input end of operational amplifier.First input end by not only having the fixing operational amplifier of amplification coefficient is connected with common circuit node, and additional current path and at least one photoelectric detector that is used for detection light source brightness also be connected with common circuit node, can realize accurately carrying out on very large brightness range reliably the brightness measurement of the light launched by at least one light source.Also can realize economy and the detection of carrying out brightness at low cost as far as possible in addition.
Preferably, the first input end of operational amplifier is constructed to negative input end.For the gain of operational amplifier is set regularly, preferably, resistance is electrically connected with the first input end and the output of operational amplifier.At this, this electrical connection makes this resistance and operational amplifier be similar to and is connected in parallel.
Preferably, the voltage supply of at least one photoelectric detector provides by negative supply voltage.
Can be designed as, at least two photoelectric detectors are connected in this circuit arrangement, and wherein said at least two photoelectric detectors are connected to parallel circuits, and wherein this parallel circuits is electrically connected with the first input end of operational amplifier.Can realize detecting bigger area and therefore also energy measurement brightness in a big way thus.
Photoelectric detector can be constructed to semiconductor transducer, and this semiconductor transducer preferably is being driven on direction.Current path preferably is connected with D/A converter.Light source can be constructed to LED or electric light.
Description of drawings
Embodiments of the invention have been set forth in more detail below with reference to schematic diagram.Unique Fig. 1 illustrates device in a circuit according to the invention.
Embodiment
Shown in Figure 1 according to the circuit arrangement 1 that is used for the light source (not shown) is carried out brightness measurement of the present invention.Circuit arrangement 1 comprises operational amplifier 2, and this operational amplifier 2 has fixing amplification coefficient.Operational amplifier 2 has first input end, and this first input end marks by negative input end in the present embodiment.This negative input end of operational amplifier 2 is connected with circuit node, and the parallel circuits of photoelectric detector also is connected with this circuit node.Photoelectric detector is constructed to semiconductor transducer 3 and 4 in the present embodiment.In addition, circuit arrangement 1 comprises additional current path 5, and this current path 5 is electrically connected with this circuit node equally and therefore is electrically connected with the negative input end of operational amplifier 2.Photoelectric detector is constructed to semiconductor transducer 3 and 4 in the present embodiment.In addition, circuit arrangement 1 comprises additional current path 5, and this current path 5 is electrically connected with this circuit node equally and therefore is electrically connected with the negative input end of operational amplifier 2.In this current path 5, be connected with resistance 5a, wherein additionally provided for the electric current I _ SHIFT of operational amplifier 2 by unshowned D/A converter by feed-in by current path 5.By this additional current path 5 be transferred to the electric current I _ SHIFT of the negative input end of operational amplifier 2 thus, can realize the very large-scale brightness of the light launched by light source can be measured or detect.D/A converter can very accurately be conditioned.
As in addition can be from seeing Fig. 1, second input of operational amplifier be connected with earth potential, and this second input is a positive input terminal.
In addition, as can see from Figure 1, semiconductor transducer 3 and 4 is being driven on direction, and is supplied with negative supply voltage, and this negative supply voltage is pact-5V in the present embodiment.Thus, as near semiconductor transducer 3 and 4 by arrow shown, can carry out respective detection to the brightness of the light of light source.Also can be designed as, a semiconductor transducer 3 or 4 or semiconductor transducer 3 and 4 more than the parallel connection shown in two also is set only are set.It is many more to connect this semiconductor transducer in circuit arrangement 1, and then the detectable area of these semiconductor transducers is just big more.
The fixed gain of operational amplifier 2 or fixing amplification coefficient realize in the following manner that in the present embodiment promptly resistance 6 is electrically connected with the negative input end of operational amplifier 2 and is electrically connected with the output of operational amplifier 2.
In addition, in circuit arrangement 1, comprise another signal path, in this signal path, comprise the series circuit that constitutes by resistance 7 and capacitor 8.Described another signal path and resistance 6 are connected in parallel.So, on the output of operational amplifier 2, have the voltage signal U_PHOTO that characterizes light-source brightness.
Claims (7)
1. circuit arrangement that is used at least one light source is carried out brightness measurement, this circuit arrangement has the operational amplifier (2) that its gain is fixed and is provided with, at least one photoelectric detector (3 wherein, 4) first input end with operational amplifier (2) is electrically connected, and be used for the current fed current path (5) of operational amplifier (2) of giving is electrically connected with the first input end of operational amplifier (2), wherein current path is connected with D/A converter.
2. circuit arrangement according to claim 1 is characterized in that, the first input end of operational amplifier (2) is constructed to negative input end.
3. circuit arrangement according to claim 1 and 2 is characterized in that, for the gain of operational amplifier (2) is set regularly, resistance (6) is electrically connected with the first input end of operational amplifier (2) and with the output of operational amplifier (2).
4. circuit arrangement according to claim 1 and 2 is characterized in that, the voltage supply of described at least one photoelectric detector (3,4) realizes by negative supply voltage.
5. circuit arrangement according to claim 1 and 2 is characterized in that, at least two photoelectric detectors (3,4) are connected to parallel circuits, and this parallel circuits is electrically connected with the first input end of operational amplifier (2).
6. circuit arrangement according to claim 1 and 2 is characterized in that, photoelectric detector is constructed to semiconductor transducer (3,4), and described semiconductor transducer (3,4) is being driven on direction.
7. circuit arrangement according to claim 1 and 2 is characterized in that, light source is constructed to LED or is constructed to electric light.
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE202005015058.4 | 2005-09-23 | ||
DE202005015058U DE202005015058U1 (en) | 2005-09-23 | 2005-09-23 | Lamp brightness sensor has fixed gain operational amplifier with D/A driven current supply to photodetector connected input terminal |
PCT/EP2006/066515 WO2007033966A1 (en) | 2005-09-23 | 2006-09-19 | Circuit for measuring the brightness of light sources |
Publications (2)
Publication Number | Publication Date |
---|---|
CN101278601A CN101278601A (en) | 2008-10-01 |
CN101278601B true CN101278601B (en) | 2010-10-06 |
Family
ID=35502320
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN200680034767XA Expired - Fee Related CN101278601B (en) | 2005-09-23 | 2006-09-19 | Circuit for measuring the brightness of light sources |
Country Status (6)
Country | Link |
---|---|
EP (1) | EP1927270A1 (en) |
KR (1) | KR101457021B1 (en) |
CN (1) | CN101278601B (en) |
DE (1) | DE202005015058U1 (en) |
TW (1) | TW200716955A (en) |
WO (1) | WO2007033966A1 (en) |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4417179A (en) * | 1981-05-08 | 1983-11-22 | Hitachi, Ltd. | Light quantity control device |
US5089748A (en) * | 1990-06-13 | 1992-02-18 | Delco Electronics Corporation | Photo-feedback drive system |
EP0632679A1 (en) * | 1993-06-22 | 1995-01-04 | Siemens Aktiengesellschaft | Method and circuit for control of room lighting |
CN1621812A (en) * | 2004-12-23 | 2005-06-01 | 北京源德生物医学工程有限公司 | Photoelectric detection circuit for single photon counting instrument |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
AU6794000A (en) * | 1999-08-23 | 2001-03-19 | Bausch & Lomb Incorporated | Method of and system for closed loop control of fluorescent lamps |
JP2003185497A (en) * | 2001-12-20 | 2003-07-03 | Ando Electric Co Ltd | Optical power measuring apparatus and offset adjusting method thereof |
US7183727B2 (en) * | 2003-09-23 | 2007-02-27 | Microsemi Corporation | Optical and temperature feedbacks to control display brightness |
-
2005
- 2005-09-23 DE DE202005015058U patent/DE202005015058U1/en not_active Expired - Lifetime
-
2006
- 2006-09-19 KR KR1020087009601A patent/KR101457021B1/en not_active IP Right Cessation
- 2006-09-19 WO PCT/EP2006/066515 patent/WO2007033966A1/en active Application Filing
- 2006-09-19 CN CN200680034767XA patent/CN101278601B/en not_active Expired - Fee Related
- 2006-09-19 EP EP06806781A patent/EP1927270A1/en not_active Withdrawn
- 2006-09-22 TW TW095135088A patent/TW200716955A/en unknown
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4417179A (en) * | 1981-05-08 | 1983-11-22 | Hitachi, Ltd. | Light quantity control device |
US5089748A (en) * | 1990-06-13 | 1992-02-18 | Delco Electronics Corporation | Photo-feedback drive system |
EP0632679A1 (en) * | 1993-06-22 | 1995-01-04 | Siemens Aktiengesellschaft | Method and circuit for control of room lighting |
CN1621812A (en) * | 2004-12-23 | 2005-06-01 | 北京源德生物医学工程有限公司 | Photoelectric detection circuit for single photon counting instrument |
Non-Patent Citations (1)
Title |
---|
EP 0632679 A1,全文. |
Also Published As
Publication number | Publication date |
---|---|
EP1927270A1 (en) | 2008-06-04 |
DE202005015058U1 (en) | 2005-12-08 |
KR101457021B1 (en) | 2014-10-31 |
TW200716955A (en) | 2007-05-01 |
WO2007033966A1 (en) | 2007-03-29 |
KR20080050624A (en) | 2008-06-09 |
CN101278601A (en) | 2008-10-01 |
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Granted publication date: 20101006 |