CN101196546B - 可供不同ip产品进行老化测试的方法及其所用测试板 - Google Patents
可供不同ip产品进行老化测试的方法及其所用测试板 Download PDFInfo
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CN101196546B true CN101196546B (zh) | 2011-02-02 |
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Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
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CN101738503B (zh) * | 2008-11-18 | 2011-10-05 | 中芯国际集成电路制造(上海)有限公司 | 接口装置与其控制方法、老化测试*** |
CN101763097B (zh) * | 2009-12-18 | 2012-01-04 | 北京七星华创电子股份有限公司 | 质量流量控制器/计老化监测*** |
CN101975904A (zh) * | 2010-10-25 | 2011-02-16 | 温州大学 | 电子组件高温老化智能检测*** |
CN103336237B (zh) * | 2013-06-28 | 2016-10-19 | 上海华虹宏力半导体制造有限公司 | 内建耐力测试***、老化测试装置及相应的耐力测试方法 |
CN105717439B (zh) * | 2016-02-24 | 2019-07-12 | 上海东软载波微电子有限公司 | 芯片测试方法及*** |
CN107271879B (zh) * | 2017-05-31 | 2020-07-31 | 上海华力微电子有限公司 | 半导体芯片老化测试装置及方法 |
CN107271888A (zh) * | 2017-07-31 | 2017-10-20 | 上海华力微电子有限公司 | 一种单个测试芯片实现多个ip芯片测试的方法 |
CN109342921A (zh) * | 2018-10-09 | 2019-02-15 | 天津芯海创科技有限公司 | 一种高速交换芯片的老化测试方法与*** |
CN110808778B (zh) * | 2019-10-15 | 2022-04-29 | 四川天邑康和通信股份有限公司 | 基于环路的光猫动态自动老化***及方法 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
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CN1206194A (zh) * | 1997-07-18 | 1999-01-27 | 联华电子股份有限公司 | 可预老化测试的动态存储器模块及其电路板 |
CN1233841A (zh) * | 1998-04-30 | 1999-11-03 | 西门子公司 | 测试在一个晶片上的多个存储器芯片的装置 |
CN1734278A (zh) * | 2005-05-27 | 2006-02-15 | 上海大学 | 集成电路片上***中故障的测试***和方法 |
CN2789929Y (zh) * | 2005-03-17 | 2006-06-21 | 上海华虹集成电路有限责任公司 | 非接触式应用芯片的多通道测试仪芯片测试接口 |
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Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
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CN1206194A (zh) * | 1997-07-18 | 1999-01-27 | 联华电子股份有限公司 | 可预老化测试的动态存储器模块及其电路板 |
CN1233841A (zh) * | 1998-04-30 | 1999-11-03 | 西门子公司 | 测试在一个晶片上的多个存储器芯片的装置 |
CN2789929Y (zh) * | 2005-03-17 | 2006-06-21 | 上海华虹集成电路有限责任公司 | 非接触式应用芯片的多通道测试仪芯片测试接口 |
CN1734278A (zh) * | 2005-05-27 | 2006-02-15 | 上海大学 | 集成电路片上***中故障的测试***和方法 |
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Owner name: SHANGHAI HUAHONG GRACE SEMICONDUCTOR MANUFACTURING Free format text: FORMER OWNER: HUAHONG NEC ELECTRONICS CO LTD, SHANGHAI Effective date: 20131218 |
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