CN101093461A - Device and method for testing electronic equipment - Google Patents
Device and method for testing electronic equipment Download PDFInfo
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- CN101093461A CN101093461A CN 200610095940 CN200610095940A CN101093461A CN 101093461 A CN101093461 A CN 101093461A CN 200610095940 CN200610095940 CN 200610095940 CN 200610095940 A CN200610095940 A CN 200610095940A CN 101093461 A CN101093461 A CN 101093461A
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Abstract
A test device of electronic unit is prepared for connecting switchover component at position between electronic unit and the second component and connecting switchover component at position between electronic unit and the first component then deciding to carry out test on electronic unit with the first component or to record information of electronic unit with the second component by switchover component according to control signal.
Description
Technical field
The present invention relates to a kind of proving installation and method of electronic installation, particularly a kind of proving installation of output/input interface of electronic installation and method.
Background technology
On-the-spot real time information system (Shop Floor Information System is hereinafter to be referred as SFIS) has been used in many manufacturing industry.SFIS and extends to real-time production information service to the client gradually except can monitoring the production scene.The client can be by the Internet (internet) and client's that the supplier offers customer number (user ID) and password (password), and sees the production real-time information that the supplier provides from computer screen.The characteristics of SFIS comprise:
(1) can satisfy the requirement of client's punctual delivery
SFIS can follow the trail of according to client's specific demand and part material table at finished product or part stage.In addition, also can provide production management unit's optimal scheduling resource, testing apparatus and transport flow process.In addition, the client also can accurately grasp the time of receiving.
(2) change the production management mode in the production
SFIS can collect complete production process information in process of production, and whether tracing product is made according to requirement specification, provides real-time production process to improve and product quality tracing and improvement in the future.
Because on-the-spot real time information system has can satisfy client's punctual delivery, change advantages such as production management mode and minimizing stock aborning, therefore on-the-spot real time information system is applied in all types of industries gradually.With the computer main frame panel is example, import the SFIS system and will in database, set up the relevant information of a correspondence each motherboard, caing be compared to is that each finished product has had I.D. separately, thereby has very great help for the foundation of output, product quality keyholed back plate and stock or the like information.
In addition, motherboard disposes various electronic components and connecting interface, and whether connection status to each other will have influence on motherboard can operate as normal.In order to confirm the welding situation of each tie point between electronic package gang socket and the motherboard, usually to test the assembly on the motherboard (for example input/output port or the like), so as to confirming whether tie point has defectives such as cold welding or empty weldering, to avoid occurring bad product.With the input/output port is example, has comprised serial port etc.Serial port refers to the equipment that is used for doing communication terminal in the computer system, and it can carry out with the position is the transmission of unit, is used for connecting modulator-demodular unit or early stage mouse.At least all there are two serial ports to use in the computer system for us, our PORT COM COM1, COM2 of often saying just, these two serial ports are commonly used to connect mouse and modulator-demodular unit.The pin of serial port (Pin) has two kinds of patterns, and a kind of is 9 pins, and another kind then is 25 pins.What mouse was used usually is 9 pins, and modulator-demodular unit then is 25 pins.These two kinds of pins are the same in fact, and the mode that can see through wire jumper between them change, as on earth will be that a kind of pin, do not have certain rule, depend on the circumstances, if the equipment that uses is 9 pins, with regard to joint with 9 pins.Each pin of PORT COM (9Pin) is defined as follows:
Pin 1: data medium detects (DCD-Data Carrier Detect)
Pin 2: receive data-signal (RXD-Recive Data)
Pin 3: data signal (TXD-Transmit Data)
Pin 4: DTR (DTR-Data Terminal Ready)
Pin 5: ground connection (GND-Signal Common)
Pin 6: data set is ready to (DSR-Data Set Ready)
Pin 7: the continuous data (RTS-Request to Send) that pass of request
Pin 8: remove working area (CTS-Clear to Send)
Pin 9: the tinkle of bells indication (RI-Ring Indictor)
For the PORT COM on the motherboard, if PORT COM is used as SFIS system transmissions data, then PORT COM only can be used the TXD and the RXD signal pin of PORT COM when transmission.In other words, in the process of PORT COM, the SFIS system can only test TXD and RXD signal pin, and other signal DCD, TXD, DTR, DSR, RTS, CTS, RI are not had actual test on the Test Host plate, therefore will increase the test leakage risk.
Certainly, the tester can also use existing testing tool to test PORT COM.The general test instrument is to use regression test (loop back test) technology to test PORT COM.So, comprise that DCD, TXD, DTR, DSR, RTS, CTS, RI can intactly testedly arrive.Since when carrying out regression test, be necessary for short circuit between TXD and the RXD, in the time of still will utilizing the information of SFIS system transmissions motherboard, then can not short circuit between TXD and the RXD.Therefore, factory in process of production need be by the operating personnel in artificial mode from the connecting line of the PORT COM of motherboard plug testing tool or the connecting line of SFIS, transmit this two tests to finish regression test and SFIS.The operational motion that operator will carry out can be divided into following several steps:
(1) previous operations: the PORT COM that the SFIS system is connected motherboard to be measured from (Auto Link) test transmission line that is dynamically connected.
(2) carry out the PORT COM regression test: the PORT COM from motherboard to be measured is pulled up the Auto Link of SFIS system test transmission line, connects the regression tested testing tool again.Press "enter" key" at motherboard platform to be measured then and continue test.
(3) after the PORT COM regression test, pull up the regression tested testing tool from the PORT COM of motherboard to be measured, turn back to the Auto Link of SFIS system test transmission line then, and press "enter" key" at motherboard platform to be measured and continue test.
From the above, if want PORT COM is carried out test operation and SFIS system transmissions, existing operating process need be taked manual type plug testing tool and SFIS transmission line.Yet, the like this practice not only consuming time and artificial careless mistake of easy generation on the one hand, on the other hand, frequent Plug Action also makes assembly such as testing tool shorten serviceable life because of consume easily.
Summary of the invention
The object of the present invention is to provide a kind of proving installation of electronic installation, utilize the switching device shifter in the proving installation, do not need, reach the purpose of simplified system configuration via artificial plug testing tool.
Another purpose of the present invention provides a kind of method of testing of electronic installation, utilizes the switching device shifter in the proving installation to carry out switching, omits artificial Plug Action, reaches simplify the operation flow process and the purpose that shortens the running time.
Based on above-mentioned purpose, the present invention proposes a kind of proving installation of electronic installation, comprises first device, second device and the switching device shifter, and wherein first device is in order to the function of the output/input interface of testing electronic devices.Second device is in order to the information of recorded electronic device.Switching device shifter is connected between the electronic installation and second device, and be connected between the electronic installation and first device, wherein switching device shifter is according to control signal, and decision is tested electronic installation by first device, or by the information of the second device recording electronic installation.
The proving installation of electronic installation of the present invention, wherein first device comprises a testing tool, the output/input port of this testing tool is a PORT COM, and the second above-mentioned device comprises a pen recorder, this pen recorder is applied to a real time information system.
The proving installation of electronic installation of the present invention, wherein the output/input interface of this electronic installation is a PORT COM.
The present invention also provides a kind of method of testing of electronic installation, and it is as follows to comprise step: the switching device shifter that is coupled to the electronic installation output/input interface is provided, and wherein this switching device shifter carries out blocked operation according to a control signal; Carry out a testing procedure to test the output/input interface of this electronic installation; Carry out a recording step to write down the information of this electronic installation; Change the logic state of control signal, determine to carry out testing procedure or recording step to carry out blocked operation.
The present invention is because of utilizing switching device shifter, therefore do not need in artificial mode from the connecting line of the PORT COM plug testing tool of motherboard or the connecting line of SFIS, and can finish regression test and SFIS transmits this two tests.The present invention not only can simplified design dispose, increase the test coverage rate, more can save the running time of test process.
Description of drawings
Fig. 1 is the synoptic diagram of the proving installation of electronic installation of the present invention.
Fig. 2 is the circuit diagram according to switching device shifter in the embodiments of the invention key diagram 1.
Embodiment
For above and other objects of the present invention, feature and advantage can be become apparent, hereinafter, be described in detail below in conjunction with embodiment and accompanying drawing.
For embodiments of the present invention can clearly be described, will be example below, but also be applicable to the output/input interface of other all size with the PORT COM (being commonly referred to as COM port) that meets rs-232 standard on the motherboard.
Fig. 1 is the synoptic diagram according to the proving installation of electronic installation of the present invention.Comprise proving installation 100 and electronic installation 140, wherein proving installation 110 comprises: first device, 110, second device 120, switching device shifter 130, electronic installation 140 has an output/input interface 150.In the present embodiment, the above-mentioned electronic installation 140 to be measured motherboard (claiming mainboard again) that can be personal computer.Proving installation 100 is connected in the output/input interface 150 of electronic installation 140, and proving installation 100 comprises first device, 110, second device 120 and the switching device shifter 130.Wherein, switching device shifter 130 is connected between the electronic installation 140 and second device 120, and is connected between the electronic installation 140 and first device 110.In addition, switching device shifter is according to a control signal, and decision is tested by the output/input interface 150 of 110 pairs of electronic installations 140 of first device, or by second information of installing 120 recorded electronic devices 140.In the present embodiment, first device 110 is implemented by testing tool, and second device 120 is then implemented by pen recorder.This pen recorder can be used to on-the-spot real time information system, and (Shop FloorInformation System is SFIS) or in other system.
Fig. 2 is the circuit diagram according to switching device shifter 130 in the embodiments of the invention key diagram 1.Please be simultaneously with reference to Fig. 1 and Fig. 2, switching device shifter 130 comprises the 3rd connectivity port 210, first connectivity port 290, second connectivity port 310 and switch unit 200.In the present embodiment, output/input interface 150 will be an example with PORT COM (COM PORT).Wherein, the output/input interface 150 of connectivity port 210 in order to be connected to electronic installation 140 to be measured, connectivity port 290 is in order to being connected to the output/input interface of testing tool (first device 110), and connectivity port 310 is in order to be connected to the output/input interface of pen recorder in the on-the-spot real time information system (second device 120).In the present embodiment, the output/input interface between connectivity port 150, testing tool and the pen recorder of electronic installation 140 to be measured is that the PORT COM with 9 pins is an example.To utilize the DTR pin of the output/input interface 150 of electronic installation 140 in the present embodiment, and come transmission of control signals to give switching device shifter 130.
In switching device shifter 130, connectivity port 290 is connected in parallel to connectivity port 210.Switch unit 200 is coupled between connectivity port 210 and the connectivity port 310.Switch unit 200 comprises diode 220, first relay 234 and second relay 280.In the present embodiment, the 4th pin that sees through connectivity port 210 comes transmission of control signals (being the DTR pin signal of the output/input interface 150 of electronic installation 140) to give switch unit 200.First relay 234 comprises first coil 230 and first magnetic reed switch, 232, the second relays 280 then comprise second coil 260, second magnetic reed switch 270 and the 3rd magnetic reed switch 272.The 4th pin of connectivity port 210 is connected to first end of coil 230 via diode 220, and the second end ground connection of coil 230.First end of magnetic reed switch 232 is connected to the power end of power supply 250 with received power voltage, and second end of magnetic reed switch 232 then is connected to first end of coil 260.Second end of coil 260 then is coupled to the earth terminal (being ground connection) of power supply 250.In second relay 280, the main end c1 of the main end c2 of magnetic reed switch 270 and magnetic reed switch 272 is coupled to the 3rd pin (being the TXD pin of output/input interface 150) and second pin (being the RXD pin of output/input interface 150) of the 3rd connectivity port 210 respectively.First switch terminal a2 of second magnetic reed switch 270 and the first switch terminal a1 of the 3rd magnetic reed switch 272 are coupled to second pin (i.e. the RXD pin of second device 120) and the 3rd pin (i.e. the TXD pin of second device 120) of second connectivity port 310 respectively.The second switch terminal b1 of the 3rd magnetic reed switch 272 then is coupled to the main end c2 of second magnetic reed switch 270.In the present embodiment, the second switch terminal b2 of second magnetic reed switch 270 then is float (floating).
At first, when electronic installation 140 to be measured via the DTR pin (being the 4th pin of connectivity port 210) of PORT COM 150 when output signal is low level, because diode 220 can conducting, this moment, the no current flowing through coil 230, so coil 230 can not produce magnetic field.Because coil 230 does not produce magnetic field, therefore can't draw magnetic reed switch 232 makes its closure.Because magnetic reed switch 232 keeps open-circuit condition, therefore the loop by power supply 250, magnetic reed switch 232 and coil 260 are formed will present off state.Because the coil 260 on the aforementioned loop does not produce magnetic field because there is not electric current to pass through, therefore can't draw magnetic reed switch 270 and make its closure with magnetic reed switch 272.This moment, the main end c2 of magnetic reed switch 270 was connected to the second switch terminal b2, and the main end c1 of magnetic reed switch 272 is connected to the second switch terminal b1.Because the 3rd pin of connectivity port 210 and the second switch terminal b1 that second pin is connected to magnetic reed switch 272 respectively and main end c1, therefore second pin and the 3rd pin of connectivity port 210 also present short-circuit condition, short circuit mutually between the RXD of output/input interface 150 and the TXD pin just.Just can utilize testing tool 110 this moment, via connectivity port 290 and 210, with regression test (loop back test) method test PORT COM 150.Therefore, pin DCD, the TXD of PORT COM 150, DTR, DSR, RTS, CTS, RI can be arrived by complete test.
After regression test finished, the 4th pin DTR output signal of the PORT COM 150 of electronic installation 140 to be measured transferred high levle to, and diode 220 is incited somebody to action therefore conducting and made electric current flowing through coil 230.So coil 230 produces magnetic fields and draws magnetic reed switch 232 and make its closure.During magnetic reed switch 232 closures, incite somebody to action therefore conducting by the loop that power supply 250, magnetic reed switch 232 and coil 260 are formed.Coil 260 on the loop will pass through to produce magnetic field because of electric current at this moment, and magnetic reed switch 270 is subjected to magnetic field suction with magnetic reed switch 272, and make main end c2 and c1 be electrically connected to first switch terminal a2 and the a1 respectively respectively.At this moment, second pin of connectivity port 210 and the 3rd pin are electrically connected to the 3rd pin and second pin of connectivity port 310 respectively.Therefore, pen recorder 120 (being example in the present embodiment with SFIS) can be noted the relevant information (for example identification signal of motherboard, testDate, test data etc.) of electronic installation 140 to be measured with connectivity port 310, and then be stored in the database (not shown) via PORT COM 150, connectivity port 210.The data that this database provides will help manufacturing schedule and quantity are made effective keyholed back plate, and grasp product turnout progress and production status or the like.In addition, aspect QC, the data in the database also can be carried out Analysis of Countermeasure to phenomenon, the reason of bad product, provide relevant units such as researching and developing engineering to make the foundation of improving.
In sum, the foregoing description mainly utilizes switching device shifter to replace artificial manual plug, and changeable operator scheme not only can simplified design dispose, increase the test coverage rate in regression test or SFIS system, more can save the running time.
Claims (14)
1. the proving installation of an electronic installation is characterized in that, comprising:
One first device is in order to the function of an output/input interface testing this electronic installation;
One second device is in order to write down the information of this electronic installation; And
One switching device shifter, be connected between this electronic installation and this second device, and be connected between this electronic installation and this first device, wherein this switching device shifter is according to a control signal, and decision is tested this electronic installation by this first device, or by the information of this this electronic installation of second device recording.
2. proving installation as claimed in claim 1 is characterized in that: this first device comprises a testing tool, and the output/input port of this testing tool is a PORT COM.
3. proving installation as claimed in claim 1 is characterized in that: this second device comprises a pen recorder, and this pen recorder is used to an on-the-spot real time information system.
4. proving installation as claimed in claim 1 is characterized in that, this switching device shifter comprises:
One first connectivity port is in order to be connected to this first device;
One second connectivity port is in order to be connected to this second device;
One the 3rd connectivity port, it is connected in parallel to this first connectivity port, and the 3rd connectivity port is in order to be connected to the output/input interface of this electronic installation; And
One switches the unit, is coupled between this second connectivity port and the 3rd connectivity port, in order to determine whether this second connectivity port is electrically connected to the 3rd connectivity port according to this control signal.
5. proving installation as claimed in claim 4 is characterized in that, this switch unit comprises:
One diode, its first termination is received this control signal;
One first relay comprises one first coil and one first magnetic reed switch, and wherein first end of this first coil is coupled to second end of this diode, the second end ground connection of this first coil, and first end of this first magnetic reed switch couples a power voltage; And
One second relay, comprise one second coil, one second magnetic reed switch and one the 3rd magnetic reed switch, first end of this second coil is coupled to second end of this first magnetic reed switch, the second end ground connection of this second coil, wherein each self-contained master of this second magnetic reed switch and the 3rd magnetic reed switch holds, one first switch terminal and one second switch terminal, and the main end of this second magnetic reed switch and the 3rd magnetic reed switch is coupled to wherein two pins of the 3rd connectivity port respectively, first switch terminal of this second magnetic reed switch and the 3rd magnetic reed switch is coupled to wherein two pins of this second connectivity port respectively, and second switch terminal of the 3rd magnetic reed switch then is coupled to the main end of this second magnetic reed switch.
6. proving installation as claimed in claim 1 is characterized in that: the output/input interface of this electronic installation is a PORT COM.
7. proving installation as claimed in claim 1 is characterized in that: the information of this electronic installation comprises a test data and an identification signal.
8. the method for testing of an electronic installation is characterized in that, comprises the following step at least:
Carry out a testing procedure, in order to test the output/input interface of this electronic installation;
Carry out a recording step, in order to write down the information of this electronic installation;
One switching device shifter is provided, and this switching device shifter is coupled to the output/input interface of this electronic installation, and this switching device shifter carries out blocked operation according to a control signal; And
Change the logic state of this control signal, determine to carry out this testing procedure to carry out blocked operation, or carry out this recording step.
9. method of testing as claimed in claim 8 is characterized in that: also comprise one first device is provided, in order to carry out this testing procedure.
10. method of testing as claimed in claim 9 is characterized in that: this first device comprises a testing tool, and the output/input port of this testing tool is a PORT COM.
11. method of testing as claimed in claim 8 is characterized in that: the output/input interface of this electronic installation comprises a PORT COM.
12. method of testing as claimed in claim 8 is characterized in that: also comprise one second device is provided, in order to carry out this recording step.
13. method of testing as claimed in claim 12 is characterized in that: this second device is a pen recorder, and this pen recorder is used to an on-the-spot real time information system.
14. method of testing as claimed in claim 8 is characterized in that: the information of this electronic installation comprises a test data and an identification signal.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB2006100959409A CN100538655C (en) | 2006-06-23 | 2006-06-23 | The proving installation of electronic installation and method of testing |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB2006100959409A CN100538655C (en) | 2006-06-23 | 2006-06-23 | The proving installation of electronic installation and method of testing |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN101093461A true CN101093461A (en) | 2007-12-26 |
| CN100538655C CN100538655C (en) | 2009-09-09 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNB2006100959409A Expired - Fee Related CN100538655C (en) | 2006-06-23 | 2006-06-23 | The proving installation of electronic installation and method of testing |
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| Country | Link |
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| CN (1) | CN100538655C (en) |
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102546291A (en) * | 2011-12-14 | 2012-07-04 | 北京华力创通科技股份有限公司 | Testing method, testing apparatus and testing system of device |
| CN102624572A (en) * | 2011-01-26 | 2012-08-01 | 技嘉科技股份有限公司 | Test system for transmitting data in wireless mode |
| CN102915030A (en) * | 2012-10-25 | 2013-02-06 | 无锡建仪仪器机械有限公司 | RS232 (recommended standard 232) serial port fFault diagnosis device applied to controller of tester |
| CN103389954A (en) * | 2012-05-11 | 2013-11-13 | 光宝电子(广州)有限公司 | Transmission line, electronic device thereof and operation mode switching method |
| CN105842615A (en) * | 2015-01-14 | 2016-08-10 | 扬智科技股份有限公司 | System chip capable of being debugged in abnormal state, and debugging method thereof |
| CN106034234A (en) * | 2015-03-11 | 2016-10-19 | 晨星半导体股份有限公司 | Testing apparatus and method of intelligent card module for television |
| CN107340447A (en) * | 2016-05-03 | 2017-11-10 | 技嘉科技股份有限公司 | Test device and method of testing |
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2006
- 2006-06-23 CN CNB2006100959409A patent/CN100538655C/en not_active Expired - Fee Related
Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102624572A (en) * | 2011-01-26 | 2012-08-01 | 技嘉科技股份有限公司 | Test system for transmitting data in wireless mode |
| CN102546291A (en) * | 2011-12-14 | 2012-07-04 | 北京华力创通科技股份有限公司 | Testing method, testing apparatus and testing system of device |
| CN103389954A (en) * | 2012-05-11 | 2013-11-13 | 光宝电子(广州)有限公司 | Transmission line, electronic device thereof and operation mode switching method |
| CN102915030A (en) * | 2012-10-25 | 2013-02-06 | 无锡建仪仪器机械有限公司 | RS232 (recommended standard 232) serial port fFault diagnosis device applied to controller of tester |
| CN105842615A (en) * | 2015-01-14 | 2016-08-10 | 扬智科技股份有限公司 | System chip capable of being debugged in abnormal state, and debugging method thereof |
| CN105842615B (en) * | 2015-01-14 | 2019-03-05 | 扬智科技股份有限公司 | The System on Chip/SoC and its adjustment method that can be debugged under abnormality |
| CN106034234A (en) * | 2015-03-11 | 2016-10-19 | 晨星半导体股份有限公司 | Testing apparatus and method of intelligent card module for television |
| CN106034234B (en) * | 2015-03-11 | 2018-03-23 | 晨星半导体股份有限公司 | The test device and method of television set intelligently card module |
| CN107340447A (en) * | 2016-05-03 | 2017-11-10 | 技嘉科技股份有限公司 | Test device and method of testing |
| CN107340447B (en) * | 2016-05-03 | 2020-07-10 | 技嘉科技股份有限公司 | Test apparatus and test method |
Also Published As
| Publication number | Publication date |
|---|---|
| CN100538655C (en) | 2009-09-09 |
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Granted publication date: 20090909 Termination date: 20110623 |