CN101021627A - 一种tft-lcd基板检测设备中探针结构 - Google Patents
一种tft-lcd基板检测设备中探针结构 Download PDFInfo
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CN100478742C CN100478742C (zh) | 2009-04-15 |
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Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103018936A (zh) * | 2012-12-14 | 2013-04-03 | 京东方科技集团股份有限公司 | 一种阵列基板检测设备的探针框架及检测设备 |
CN104280904A (zh) * | 2014-09-26 | 2015-01-14 | 京东方科技集团股份有限公司 | 阵列基板检测头及检测装置、阵列基板检测方法 |
CN104714056A (zh) * | 2013-12-13 | 2015-06-17 | 旺矽科技股份有限公司 | 电性检测机台 |
CN106568993A (zh) * | 2015-10-09 | 2017-04-19 | 苍南县三维电子塑胶有限公司 | 可编程的显示面板检测用探针结构及检测*** |
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2007
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Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103018936A (zh) * | 2012-12-14 | 2013-04-03 | 京东方科技集团股份有限公司 | 一种阵列基板检测设备的探针框架及检测设备 |
CN103018936B (zh) * | 2012-12-14 | 2015-12-02 | 京东方科技集团股份有限公司 | 一种阵列基板检测设备的探针框架及检测设备 |
US9589489B2 (en) | 2012-12-14 | 2017-03-07 | Boe Technology Group Co., Ltd. | Probe frame for array substrate detecting apparatus and detecting apparatus having the same |
CN104714056A (zh) * | 2013-12-13 | 2015-06-17 | 旺矽科技股份有限公司 | 电性检测机台 |
CN104714056B (zh) * | 2013-12-13 | 2018-01-12 | 旺矽科技股份有限公司 | 电性检测机台 |
CN104280904A (zh) * | 2014-09-26 | 2015-01-14 | 京东方科技集团股份有限公司 | 阵列基板检测头及检测装置、阵列基板检测方法 |
CN106568993A (zh) * | 2015-10-09 | 2017-04-19 | 苍南县三维电子塑胶有限公司 | 可编程的显示面板检测用探针结构及检测*** |
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CN100478742C (zh) | 2009-04-15 |
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Effective date of registration: 20201126 Address after: 215200 No. 1700, Wujiang economic and Technological Development Zone, Suzhou, Jiangsu, Zhongshan North Road Patentee after: Gaochuang (Suzhou) Electronics Co.,Ltd. Patentee after: BOE TECHNOLOGY GROUP Co.,Ltd. Address before: 100176 No. 8 West Central Road, Beijing economic and Technological Development Zone Patentee before: BEIJING BOE OPTOELECTRONICS TECHNOLOGY Co.,Ltd. Patentee before: BOE TECHNOLOGY GROUP Co.,Ltd. |
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