CN100533123C - 4f phase coherent imaging method based on michelson interferometer - Google Patents
4f phase coherent imaging method based on michelson interferometer Download PDFInfo
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Abstract
The coherent imaging method of 4f position based on the Michelson's interferometer is the nonlinear refractive method of 4f position coherent imaging measuring medium based on the Michelson's interferometer. It can solves the problem of data treating bother, nonlinear absorption of traditional 4f coherent imaging technology and the small deform range, high request for stability and complex data treating of Mach-Zehnder interference. The method is composed of the processes: one: starting and adjusting the device; two: collecting the image without image; three: collecting the linear image; four: collecting the nonlinear image; five: computing the linear penetrant ratio; six: computing the nonlinear phase movement; seven: computing the third-order nonlinear refraction coefficient.
Description
Technical field
The method of the nonlinear refraction character of a kind of 4f coherent phase imaging technique measuring media based on Michael's interferometer that involved in the present invention is belongs to non-linear photon and learns material and nonlinear optics field of information processing.
Background technology
Along with the develop rapidly in fields such as optical communication and optical information processing, nonlinear optical material research becomes more and more important.The realization of functions such as photoswitch, phase place complex conjugate, light amplitude limit and optical modulation mainly depends on the progress of nonlinear optical material, and the optical nonlinearity measuring technique is to study non-linear photon to learn one of gordian technique of material.Measurement nonlinear optics parametric technique commonly used at present has Z scanning, 4f system coherent imaging technology, Mach-Zehnder interferometric method, four-wave mixing, the non-linear interferometric method of third harmonic, elliptic polarization method etc.Back three kinds of light path more complicated in the above-mentioned measuring method, and when measuring the nonlinear refraction effect, can't distinguish the real part and the imaginary part of material three rank polarizabilitys; Above-mentioned Z scanning technique light path is simple, highly sensitive, it is a measuring technique that is most widely used at present, but need sample moving in the laser propagation direction, need laser repeatedly to excite, material to film and easy damaged is inapplicable, since need repeatedly excite, powerless aspect the photodynamics of research material; Above-mentioned Mach-Zehnder interference technique has single-pulse measurement, highly sensitive advantage, but can't distinguish non-linear absorption, the light path complexity of material, the shortcoming of data processing complex.
When the 4f phase coherent imaging device measuring media nonlinear refraction character of using based on Michelson interferometer, have that light path is simple, Data Processing in Experiment is simple, the measurement of the nonlinear phase shift of material is not subjected to the influence of non-linear absorption, the advantage of single-pulse measurement, its advantage when MEASUREMENTS OF THIN and easy damaged material is also apparent, and is the powerful measure of the photodynamics character of research material.And the processing of traditional 4f system coherent imaging technical data comparatively bothers, can't avoid the influence of non-linear absorption.
The method of Mach-Zehnder interferometer is to propose (G.Boudebs in 2000 by people such as Georges Boudebs the earliest, M.Chis, and X.Nguyen Phu, " Third-order susceptibilitymeasurement by a new Mach-Zehnder interferometry technique ", J.Opt.Soc.Am.B, 18 (5), 623-627).This method is that utilization produces phase transition and makes interference fringe that local deformation take place in arm of Mach-Zehnder interferometer, and the result with CCD receives deformation does the function distribution that a time Fourier transform obtains the nonlinear phase conversion then.It is the same with the Z scan method, also belonging to beam aberration measures, its ultimate principle is to place sample on an arm of Mach-Zehnder interferometer, method by pumping allows the single wall by this sample produce nonlinear phase shift, thereby make interference fringe produce the deformation of local, but the method is because to produce the scope of deformation too little, and, data processing complex very high to the stability requirement of noise and laser and error are bigger.
Summary of the invention
The present invention comparatively bothers, can't avoid non-linear absorption for the processing of the traditional 4f of solution system coherent imaging technical data, and the scope of the deformation of Mach-Zehnder interferometric method existence is less, stability requirement to noise and laser is higher, data processing complex and the bigger problem of error, and a kind of 4f phase coherent imaging method based on Michelson interferometer is provided.Finish the device that method of the present invention adopts following structure, this device is by the first linear attenuation sheet 1, first completely reflecting mirror 2, first aperture diaphragm 3, second completely reflecting mirror 4, second aperture diaphragm 5, first spectroscope 6, second spectroscope 7, first convex lens 8, second convex lens 10, the second linear attenuation sheet 11, the 3rd spectroscope 12, CCD camera 13, the 3rd convex lens 14, the 3rd completely reflecting mirror 15, the 4th completely reflecting mirror 18, the 4th convex lens 19, the 5th convex lens 20 and laser instrument 21 are formed, the 4th convex lens 19, the first linear attenuation sheet 1, the 5th convex lens 20, first spectroscope 6, second aperture diaphragm 5 and second completely reflecting mirror 4 all are successively set on the central axis of laser instrument 21 upsides, the optical axis axis of the transmitted light of the 4th convex lens 19, the optical axis axis of the transmitted light of the first linear attenuation sheet 1, the optical axis axis of the transmitted light of the 5th convex lens 20, the central axis of the central axis of the light hole of second aperture diaphragm 5 and second completely reflecting mirror 4 all coincides with the central axis of the Laser emission mouth of laser instrument 21, the central axis of the right flank of first spectroscope, 6 downside incidence points and the Laser emission mouth upside of laser instrument 21 is 45, the reflecting surface of second completely reflecting mirror 4 is towards the Laser emission mouth of laser instrument 21, the 3rd spectroscope 12, the second linear attenuation sheet 11, second convex lens 10, first convex lens 8, second spectroscope 7, first spectroscope 6, first aperture diaphragm 3 and first completely reflecting mirror 2 all are successively set on the central axis of image acquisition left side of face of CCD camera 13, the optical axis axis of the transmitted light of the second linear attenuation sheet 11, the optical axis axis of the transmitted light of second convex lens 10, the optical axis axis of the transmitted light of first convex lens 8, the central axis of the central axis of the light hole of first aperture diaphragm 3 and first completely reflecting mirror 2 all coincides with the central axis of the image acquisition left side of face of CCD camera 13, the central axis of the downside of first spectroscope, 6 right side eye points and the image acquisition left side of face of CCD camera 13 is 45, second spectroscope 7 and first spectroscope 6 are arranged in parallel, angle between the 3rd spectroscope 12 and second spectroscope 7 is 90 °, the reflecting surface of first completely reflecting mirror 2 is towards the image acquisition face of CCD camera 13, the 3rd completely reflecting mirror 15 is arranged on the catoptrical light path of second spectroscope 7, the reflecting surface of the 3rd completely reflecting mirror 15 is 45 towards the right side and with the central axis of the emergent light of second spectroscope 7, the 5th convex lens 14 and the 4th completely reflecting mirror 18 all are successively set on the catoptrical light path of the 3rd completely reflecting mirror 15, the optical axis axis of the optical axis axis of the transmitted light of the 5th convex lens 14 and the incident light of the 4th completely reflecting mirror 18 all coincides with the optical axis axis of the emergent light of the 3rd completely reflecting mirror 15, and the optical axis axis of the optical axis axis of the emergent light of the 4th completely reflecting mirror 18 and the incident light of the 3rd spectroscope 12 coincides;
This method of the present invention is made up of following steps:
Step 3: gather linear image: testing sample 9 is arranged on the focus that overlaps between first convex lens 8 and second convex lens 10, gathers a pulse diagram picture with CCD camera 13, this image is designated as linear image;
Step 4: gather nonlinear images: take down the first linear attenuation sheet 1 and the second linear attenuation sheet 11, gather a pulse diagram picture with CCD camera 13, this image is designated as nonlinear images;
Step 5: calculate linear transmittance: the image without image that collects in the linear image that collects in the step 3 and the step 2 is carried out integration respectively, obtain through the energy of the linear impulsive behind the sample and the gross energy of incident pulse, both ratio is the linear transmittance of testing sample 9;
Step 6: calculate nonlinear phase shift: the linear image that collects in the nonlinear images that collects in the step 4 and the step 3 is compared, calculate striped displacement, calculate the nonlinear phase shift that testing sample 9 places produce according to striped displacement then;
Step 7: calculate the third-order non-linear refraction coefficient: the nonlinear phase shift that calculates in the step 6 is passed through formula through the linear transmittance that calculates in energy calibration and the step 5:
Φ
max＝n
2·I
max(0，0)·L
Calculate the third-order non-linear refraction coefficient n that promptly draws testing sample 9
2, wherein L is the thickness of testing sample 9, I
Max(0,0) is the maximum distribution of light intensity of aperture diaphragm center, Φ
MaxNon-linear maximum phase shift for testing sample 9.
The invention has the beneficial effects as follows:
(1) compare with traditional 4f coherent imaging technology, the present invention has the non-linear absorption coefficient that does not need to measure material both can obtain maximum nonlinear phase shift, data processing characteristic of simple;
(2) compare with the Mach-Zehnder interference technique, the present invention has that light path is simple, data processing easy,, the characteristics that are not subjected to the influence of non-linear absorption lower to the stability requirement of laser instrument;
(3) compare with other nonlinear optics measuring technique (as the Z scan method), the present invention has single-pulse measurement, does not have movement of sample, the theoretical model characteristic of simple, and the characteristics of its single-pulse measurement can also be used to measure the dynamic process that the nonlinear refractive index of material changed with the time shutter;
(4) measuring method of the present invention, can be widely used in non-linear photon and learn research fields such as material, nonlinear optics information processing and photonics device, especially key links such as the test of nonlinear optical functional material and modification, utilize the test result of the inventive method accurate, got rid of the influence of non-linear absorption when measuring nonlinear phase shift, this method requires simply the quality and the light path of laser in addition, convenient data processing, and test speed is quick.
Description of drawings
Fig. 1 is the structural representation of apparatus of the present invention; Fig. 2 is the process flow diagram of the inventive method; Fig. 3 is the Nonlinear Two-Dimensional figure that CCD camera 13 obtains; Fig. 4 is one-dimensional linear figure and the one-dimensional nonlinear figure perpendicular to stripe direction that CCD camera 13 obtains; Fig. 5 is one-dimensional linear figure that is parallel to stripe direction and the one-dimensional nonlinear figure that CCD camera 13 obtains.
Embodiment
Embodiment one: referring to Fig. 1～Fig. 5, the method of finishing present embodiment adopts the device of following structure, this device is by the first linear attenuation sheet 1, first completely reflecting mirror 2, first aperture diaphragm 3, second completely reflecting mirror 4, second aperture diaphragm 5, first spectroscope 6, second spectroscope 7, first convex lens 8, second convex lens 10, the second linear attenuation sheet 11, the 3rd spectroscope 12, CCD camera 13, the 3rd convex lens 14, the 3rd completely reflecting mirror 15, the 4th completely reflecting mirror 18, the 4th convex lens 19, the 5th convex lens 20 and laser instrument 21 are formed, the 4th convex lens 19, the first linear attenuation sheet 1, the 5th convex lens 20, first spectroscope 6, second aperture diaphragm 5 and second completely reflecting mirror 4 all are successively set on the central axis of laser instrument 21 upsides, the optical axis axis of the transmitted light of the 4th convex lens 19, the optical axis axis of the transmitted light of the first linear attenuation sheet 1, the optical axis axis of the transmitted light of the 5th convex lens 20, the central axis of the central axis of the light hole of second aperture diaphragm 5 and second completely reflecting mirror 4 all coincides with the central axis of the Laser emission mouth of laser instrument 21, the central axis of the right flank of first spectroscope, 6 downside incidence points and the Laser emission mouth upside of laser instrument 21 is 45, the reflecting surface of second completely reflecting mirror 4 is towards the Laser emission mouth of laser instrument 21, the 3rd spectroscope 12, the second linear attenuation sheet 11, second convex lens 10, first convex lens 8, second spectroscope 7, first spectroscope 6, first aperture diaphragm 3 and first completely reflecting mirror 2 all are successively set on the central axis of image acquisition left side of face of CCD camera 13, the optical axis axis of the transmitted light of the second linear attenuation sheet 11, the optical axis axis of the transmitted light of second convex lens 10, the optical axis axis of the transmitted light of first convex lens 8, the central axis of the central axis of the light hole of first aperture diaphragm 3 and first completely reflecting mirror 2 all coincides with the central axis of the image acquisition left side of face of CCD camera 13, the central axis of the downside of first spectroscope, 6 right side eye points and the image acquisition left side of face of CCD camera 13 is 45, second spectroscope 7 and first spectroscope 6 are arranged in parallel, angle between the 3rd spectroscope 12 and second spectroscope 7 is 90 °, the reflecting surface of first completely reflecting mirror 2 is towards the image acquisition face of CCD camera 13, the 3rd completely reflecting mirror 15 is arranged on the catoptrical light path of second spectroscope 7, the reflecting surface of the 3rd completely reflecting mirror 15 is 45 towards the right side and with the central axis of the emergent light of second spectroscope 7, the 3rd convex lens 14 and the 4th completely reflecting mirror 18 all are successively set on the catoptrical light path of the 3rd completely reflecting mirror 15, the optical axis axis of the optical axis axis of the transmitted light of the 3rd convex lens 14 and the incident light of the 4th completely reflecting mirror 18 all coincides with the optical axis axis of the emergent light of the 3rd completely reflecting mirror 15, and the optical axis axis of the optical axis axis of the emergent light of the 4th completely reflecting mirror 18 and the incident light of the 3rd spectroscope 12 coincides;
This method of the present invention is made up of following steps:
Step 3: gather linear image: testing sample 9 is arranged on the focus that overlaps between first convex lens 8 and second convex lens 10, gathers a pulse diagram picture with CCD camera 13, this image is designated as linear image;
Step 4: gather nonlinear images: take down the first linear attenuation sheet 1 and the second linear attenuation sheet 11, gather a pulse diagram picture with CCD camera 13, this image is designated as nonlinear images;
Step 5: calculate linear transmittance: the image without image that collects in the linear image that collects in the step 3 and the step 2 is carried out integration respectively, obtain through the energy of the linear impulsive behind the sample and the gross energy of incident pulse, both ratio is the linear transmittance of testing sample 9;
Step 6: calculate nonlinear phase shift: the linear image that collects in the nonlinear images that collects in the step 4 and the step 3 is compared, calculate striped displacement, calculate the nonlinear phase shift that testing sample 9 places produce according to striped displacement then;
Step 7: calculate the third-order non-linear refraction coefficient: the nonlinear phase shift that calculates in the step 6 is passed through formula through the linear transmittance that calculates in energy calibration and the step 5:
Φ
max＝n
2·I
max(0，0)·L
Calculate the third-order non-linear refraction coefficient n that promptly draws testing sample 9
2, wherein L is the thickness of testing sample 9, I
Max(0,0) is the maximum distribution of light intensity of aperture diaphragm center, Φ
MaxNon-linear maximum phase shift for testing sample 9.
In the present embodiment, laser instrument 21 can adopt Nd:YAG laser instrument (Ekspla, PL2143B) the later 532nm laser of frequency multiplication, pulsewidth 21ps; The Image QE that CCD camera 13 can adopt German Lavision company to produce, pixel size is 6.4 * 6.4 μ m
2, each pixel has 4095 grades of gray scales; Testing sample 9 can be selected CS for use
2Making the ratio of radius of the light hole of first aperture diaphragm 3 and second aperture diaphragm 5 is 1:3, the light hole of first aperture diaphragm 3 all equals the focal length of first convex lens 8 to the light path stroke of first convex lens 8 to the light hole of the light path stroke of first convex lens 8 and second aperture diaphragm 5, the transmissivity of first spectroscope 6 and reflectivity all are 50%, a focus of first convex lens 8 and a focus of second convex lens 10 overlap between two at them, the focal length of the 4th convex lens 19 is less than the focal length of the 5th convex lens 20, and a focus of the 4th convex lens 19 and a focus of the 5th convex lens 20 overlap between two at them.
Computing formula to the nonlinear measurement of testing sample 9 is as follows:
The Electric Field Distribution at the place, plane of first aperture diaphragm 3 and second aperture diaphragm 5 is:
O
1(x，y)、O
2(x，y)；
Then the Electric Field Distribution of frequency plane is:
S(u，v)＝F{O
1(x，y)+O
2(x，y)}
This moment, the transmitance of testing sample 9 was:
Wherein T (u, v) only influence as the electric-field intensity distribution on plane, and
Both influenced intensity distributions as the plane, influence PHASE DISTRIBUTION again as the plane, and move only relevant with the PHASE DISTRIBUTION of electric field as the striped on plane, compare with the electric field phase distribution of the plane of incidence as the electric field phase at planar central place for single beam, its recruitment is directly proportional with the maximum non-linear line phase shift at sample place, and ratio is 0.5.When the radius size difference of the light hole of first aperture diaphragm 3 and second aperture diaphragm 5 is that 1:3 is when above, because the airy's disk size that goes out at frequency plane is inversely proportional to pore size, the nonlinear effect that the single beam of small-bore produces can be ignored with respect to the nonlinear effect that the large aperture produces, and therefore moves the nonlinear phase shift that just can calculate the sample place by calculating striped.Calculate by the striped situation of movement among Fig. 4 and Fig. 5 and can obtain striped and move and be approximately 0.12 striped, because the non-linear absorption of article 9 to be measured is smaller, therefore the nonlinear phase shift at sample place can be obtained, the third-order non-linear refraction coefficient n of sample can also be obtained through the calibration energy
2, through calculating n
2Value be 2.8 ± 0.2m
2/ W, this result matched with the former measured result of the whole bag of tricks.
Claims (1)
1,4f phase coherent imaging method based on Michelson interferometer, finish the device that this method adopts following structure, this device is by the first linear attenuation sheet (1), first completely reflecting mirror (2), first aperture diaphragm (3), second completely reflecting mirror (4), second aperture diaphragm (5), first spectroscope (6), second spectroscope (7), first convex lens (8), second convex lens (10), the second linear attenuation sheet (11), the 3rd spectroscope (12), CCD camera (13), the 3rd convex lens (14), the 3rd completely reflecting mirror (15), the 4th completely reflecting mirror (18), the 4th convex lens (19), the 5th convex lens (20) and laser instrument (21) are formed, the 4th convex lens (19), the first linear attenuation sheet (1), the 5th convex lens (20), first spectroscope (6), second aperture diaphragm (5) and second completely reflecting mirror (4) all are successively set on the central axis of laser instrument (21) upside, the optical axis axis of the transmitted light of the 4th convex lens (19), the optical axis axis of the transmitted light of the first linear attenuation sheet (1), the optical axis axis of the transmitted light of the 5th convex lens (20), the central axis of the central axis of the light hole of second aperture diaphragm (5) and second completely reflecting mirror (4) all coincides with the central axis of the Laser emission mouth of laser instrument (21), a focus of the 4th convex lens (19) and a focus of the 5th convex lens (20) overlap between two at them, the central axis of the right flank of first spectroscope (6) downside incidence point and the Laser emission mouth upside of laser instrument (21) is 45, the reflecting surface of second completely reflecting mirror (4) is towards the Laser emission mouth of laser instrument (21), the 3rd spectroscope (12), the second linear attenuation sheet (11), second convex lens (10), first convex lens (8), second spectroscope (7), first spectroscope (6), first aperture diaphragm (3) and first completely reflecting mirror (2) all are successively set on the central axis of image acquisition left side of face of CCD camera (13), the optical axis axis of the transmitted light of the second linear attenuation sheet (11), the optical axis axis of the transmitted light of second convex lens (10), the optical axis axis of the transmitted light of first convex lens (8), the central axis of the central axis of the light hole of first aperture diaphragm (3) and first completely reflecting mirror (2) all coincides with the central axis of the image acquisition left side of face of CCD camera (13), the central axis of the downside of first spectroscope (6) right side eye point and the image acquisition left side of face of CCD camera (13) is 45, second spectroscope (7) is arranged in parallel with first spectroscope (6), angle between the 3rd spectroscope (12) and second spectroscope (7) is 90 °, the reflecting surface of first completely reflecting mirror (2) is towards the image acquisition face of CCD camera (13), the 3rd completely reflecting mirror (15) is arranged on the catoptrical light path of second spectroscope (7), the reflecting surface of the 3rd completely reflecting mirror (15) is 45 towards the right side and with the central axis of the emergent light of second spectroscope (7), the 3rd convex lens (14) and the 4th completely reflecting mirror (18) all are successively set on the catoptrical light path of the 3rd completely reflecting mirror (15), the optical axis axis of the incident light of the optical axis axis of the transmitted light of the 3rd convex lens (14) and the 4th completely reflecting mirror (18) all coincides with the optical axis axis of the emergent light of the 3rd completely reflecting mirror (15), the optical axis axis of the incident light of the optical axis axis of the emergent light of the 4th completely reflecting mirror (18) and the 3rd spectroscope (12) coincides
It is characterized in that this method of the present invention is made up of following steps:
Step 1, unlatching and regulating device: open laser instrument (21), adjust first completely reflecting mirror (2) and second completely reflecting mirror (4) and make laser beam on the image acquisition face of CCD camera (13), form 3 to 5 stripeds;
Step 2, collection image without image: gather a pulse diagram picture with CCD camera (13) when testing sample is set, this image is designated as image without image;
Step 3: gather linear image: testing sample (9) is arranged on the focus that overlaps between first convex lens (8) and second convex lens (10), gathers a pulse diagram picture with CCD camera (13), this image is designated as linear image;
Step 4: gather nonlinear images: take down the first linear attenuation sheet (1) and the second linear attenuation sheet (11), gather a pulse diagram picture with CCD camera (13), this image is designated as nonlinear images;
Step 5: calculate linear transmittance: the image without image that collects in the linear image that collects in the step 3 and the step 2 is carried out integration respectively, obtain through the energy of the linear impulsive behind the sample and the gross energy of incident pulse, both ratio is the linear transmittance of testing sample (9);
Step 6: calculate nonlinear phase shift: the linear image that collects in the nonlinear images that collects in the step 4 and the step 3 is compared, calculate striped displacement, calculate the nonlinear phase shift that testing sample (9) is located to produce according to striped displacement then; Computing formula to the nonlinear measurement of testing sample (9) is as follows:
The Electric Field Distribution at the place, plane of first aperture diaphragm (3) and second aperture diaphragm (5) is:
O
1(x，y)、O
2(x，y)；
Then the Electric Field Distribution of frequency plane is:
S(u，v)＝F{O
1(x，y)+O
2(x，y)}
The transmitance of testing sample this moment (9) is:
Wherein T (u, v) only influence as the electric-field intensity distribution on plane, and
Both influenced intensity distributions as the plane, influence PHASE DISTRIBUTION again as the plane, and move only relevant with the PHASE DISTRIBUTION of electric field as the striped on plane, compare with the electric field phase distribution of the plane of incidence as the electric field phase at planar central place for single beam, its recruitment is directly proportional with the maximum non-linear line phase shift at sample place, and ratio is 0.5; When the radius size difference of the light hole of first aperture diaphragm (3) and second aperture diaphragm (5) is that 1:3 is when above, because the airy's disk size that goes out at frequency plane is inversely proportional to pore size, the nonlinear effect that the single beam of small-bore produces can be ignored with respect to the nonlinear effect that the large aperture produces, and therefore moves the nonlinear phase shift that just can calculate the sample place by calculating striped;
Step 7: calculate the third-order non-linear refraction coefficient: the nonlinear phase shift that calculates in the step 6 is passed through formula through the linear transmittance that calculates in energy calibration and the step 5:
Φ
max＝n
2·I
max(0，0)·L
Calculate the third-order non-linear refraction coefficient n that promptly draws testing sample (9)
2, wherein L is the thickness of testing sample (9), I
Max(0,0) is the maximum distribution of light intensity of aperture diaphragm center, Φ
MaxNon-linear maximum phase shift for testing sample (9).
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| CN101806717B (en) * | 2010-04-21 | 2011-07-13 | 中国科学院上海光学精密机械研究所 | Device for measuring nonlinear transmission characteristic of laser beam |
| CN102156133B (en) * | 2011-03-02 | 2012-07-25 | 中国科学院上海光学精密机械研究所 | Three-dimensional measurement method for high-power laser body damage of KDP (Potassium Dihydrogen Phosphate) crystal |
| CN104180832A (en) * | 2013-05-24 | 2014-12-03 | 无锡万润光子技术有限公司 | Distributed orthogonal vector disturbance sensing system based on four-core optical fiber |
| CN103513254B (en) * | 2013-09-16 | 2015-06-03 | 中国科学院力学研究所 | High-precision double star laser interference dynamic distance measuring ground simulation device |
| CN106952668B (en) * | 2017-04-07 | 2018-06-19 | 中国工程物理研究院激光聚变研究中心 | Multifunction laser fusion diagnoses interferometer |
| CN108896221B (en) * | 2018-06-30 | 2020-09-01 | 天津大学 | Shock wave signal detection device and method based on Mach-Zehnder interference |
| CN109297930B (en) * | 2018-11-14 | 2020-11-06 | 深圳大学 | Third-order nonlinear measurement device and method based on vortex beam conjugate interference |
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