CN100530130C - Function testing system - Google Patents
Function testing system Download PDFInfo
- Publication number
- CN100530130C CN100530130C CNB2006101223604A CN200610122360A CN100530130C CN 100530130 C CN100530130 C CN 100530130C CN B2006101223604 A CNB2006101223604 A CN B2006101223604A CN 200610122360 A CN200610122360 A CN 200610122360A CN 100530130 C CN100530130 C CN 100530130C
- Authority
- CN
- China
- Prior art keywords
- test
- chip microcomputer
- scm
- single chip
- circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Landscapes
- Test And Diagnosis Of Digital Computers (AREA)
Abstract
The invention provides a functional test system, comprising a signal collection system, a signal processing circuit, a singlechip system, a multiple signal option switch, an IIC bus circuit and a storage device which stores an automatic test program; the functional test system collects useful signals through the signal connection circuit; the parts processed by the signal processing circuit are transmitted to the singlechip system to be processed, and are finally communicated with the automatic test program of the storage device in a tested mainboard through the IIC bus circuit. The singlechip system is matched with the automatic test program in the storage device to realize the final effects of high efficiency and automatic testing; additionally, the singlechip system is connected with a computer through a RS232 circuit, which can transmit the test state into the computer to realize the test monitoring of the computer.
Description
Technical field
The present invention relates to a kind of function test system, particularly relate to a kind of main board function Auto-Test System.
Background technology
A link after the mainboard assembling is finished is functional test, and the normal functions of use of testing host determines whether mainboard can operate as normal.The mainboard test normally utilizes a mainboard testing apparatus, is detected at the various function errors that may occur on the mainboard, and utilizes a display screen that various function errors are shown, and makes things convenient for the testing staff to search various function errors, thus convenient for maintaining.
Circuit board for testing function of main equipment before, need the artificial step that participates in more, operating personnel it at first need operating personnel that tested mainboard is placed on the testing apparatus, after peripheral hardware installs, for all selection tests of other one one of very important person's work point of all items of test.Because artificial action is too many, operating personnel occur producing some function phenomenon of test leakage because of fatigue in the long-time operation process easily, thus there is the quality risk, and also work efficiency is lower.
Summary of the invention
For addressing the above problem, the invention provides a kind of main board function Auto-Test System, it can carry out comprehensively test automatically to mainboard easily.
Technical scheme of the present invention is: a kind of function automatic detection system, and it comprises a signal acquisition circuit, gathers the useful signal of tested mainboard, and signal is passed to signal processing circuit; After the signal Processing that one signal processing circuit transmits signal acquisition circuit is finished, give Single Chip Microcomputer (SCM) system; After one Single Chip Microcomputer (SCM) system will be analyzed, handle according to the various signals that signal processing circuit sends, send dependent instruction; One multiple signals selector switch receives single-chip microcomputer instruction back and selects to carry out relevant metering circuit and switches; The autotest program that single-chip microcomputer is delivered to relevant signal in the memory storage that is connected on tested mainboard and this mainboard by the IIC bus of circuit is linked up, thereby realizes testing automatically.
Test line traffic control function, can be between tested mainboard and Single Chip Microcomputer (SCM) system, connect an array type analogue signal circuit, by Single Chip Microcomputer (SCM) system the array type analogue signal circuit is controlled and to be made its circuit in test, produce different aanalogvoltages, reach the purpose of test line traffic control.
For handled easily personnel observation test process, can connect a computing machine in Single Chip Microcomputer (SCM) system, and be provided with a functional test watchdog routine in this computing machine at least, whole test process is monitored.
Wherein, the aforementioned calculation machine is connected by the RS232 circuit with single-chip microcomputer.
For reminding operating personnel, be provided with a warning system in the above-mentioned functions test macro, and this warning system can be arranged in the Single Chip Microcomputer (SCM) system, when in the test during wrong generation, warning system is with warning reminding.
For reducing artificial participation link, increase work efficiency, the invention allows for a kind of function test method, step is as follows, and a. is connected tested mainboard, assemble with the above-mentioned functions test macro, and b. is with system's energising, system start-up; C. Single Chip Microcomputer (SCM) system sends out an autotest program enabled instruction by the autotest program of the memory storage of iic bus circuit in tested mainboard; D. whether the Single Chip Microcomputer (SCM) system decision instruction finds relevant autotest program, do not find autotest program, warning system is with warning reminding (if tested mainboard has showing of Presentation Function meeting on display screen), and autotest program is found, starts this autotest program; E. autotest program is selected a test event, and this function of tested mainboard is tested; F. Single Chip Microcomputer (SCM) system judges whether tested item-function is passed through, and does not pass through, and Single Chip Microcomputer (SCM) system is with warning reminding, and simultaneous computer is kept test record, selects another test event then; Keep test record by supervisory control comuter, autotest program is selected another test event; G. repeat the e-f step, finish up to all items test.
Description of drawings
Fig. 1 is a function test system configuration diagram of the present invention.
Fig. 2 is a function test method schematic flow sheet of the present invention.
Embodiment
Below in conjunction with accompanying drawing in detail embodiments of the invention are described in detail.
The function test system of a kind of MP3 motherboard as shown in Figure 1, it comprises a signal acquisition circuit 21, is connected with tested MP3 motherboard 20, is used to accept the useful signal that sends from tested MP3 motherboard 20, and the signal that receives is spread out of; One signal processing circuit 31 is connected with signal acquisition circuit 21, be used for the signal that processing signals Acquisition Circuit 21 transmits, and the signal after will handling spreads out of; One Single Chip Microcomputer (SCM) system 30 has directly with signal processing circuit 31 to be connected, the various signals that send in the received signal treatment circuit, and after signal analyzed, handles, send instruction; One multiple signals selector switch 32 is connected in Single Chip Microcomputer (SCM) system and the auxiliary testing apparatus in relevant outside as earphone, line in.Receive Single Chip Microcomputer (SCM) system 30 instructions, and select to carry out, as: the multiple signals selector switch will link together the TV signal of tested motherboard and TV the final signal of TV is shown on TV when testing TV.Iic bus circuit 320, memory storage in tested MP3 motherboard 20 and the tested mainboard, Single Chip Microcomputer (SCM) system 30 is just by multiple signals selector switch 32 and iic bus circuit 320, reach with tested MP3 motherboard 20 and this mainboard on the hard disk 22 that the is connected purpose of communicating with each other; One array type analogue signal circuit 33 is arranged on 30 of tested MP3 motherboard 20 and Single Chip Microcomputer (SCM) system, is the usefulness of test line traffic control, and this circuit can produce different aanalogvoltages in test, reach the purpose of test line traffic control; Also have a hard disk 22, be connected with tested MP3 motherboard 20, and store an autotest program, this autotest program can produce a test event sequential list, and above-mentioned functions is tested test event one by one according to this project sequential list.
Be handled easily personnel observation test process, also pass through to connect a computing machine 40 in Single Chip Microcomputer (SCM) system 30, Single Chip Microcomputer (SCM) system is connected with computing machine by RS232 circuit 34, can pass to realization computer testing in computing machine the inside to test status and monitor; And be provided with a functional test watchdog routine in this computing machine 40 at least, whole test process monitored, and also be provided with a warning system in Single Chip Microcomputer (SCM) system 30, during wrong generation, warning system is with the warning reminding operating personnel in test.
Above-mentioned connection is all electric connection.
The function test system of above-mentioned MP3 motherboard, its using method flow process as shown in Figure 2.A kind of function test method, step is as follows, and tested MP3 motherboard 20 is connected, assembles (S10) with the above-mentioned functions test macro, then, with total system logical power on, system start-up initialization (S11); Single Chip Microcomputer (SCM) system 30 is sent an autotest program enabled instruction (S12) by the autotest program of the memory storage of iic bus circuit in tested mainboard; Whether Single Chip Microcomputer (SCM) system 30 decision instructions find autotest program (S13), Single Chip Microcomputer (SCM) system is by iic bus circuit 320, searching is arranged on the autotest program in the hard disk 22 on the mainboard, if do not find autotest program, warning system is with warning reminding (S130), autotest program is found, start this autotest program, the relevant circuit of tested circuit board this moment can produce relevant signal, this information will be received (signal feedback) by signal acquisition circuit 21, after handling by signal processing circuit 31 then, be sent to Single Chip Microcomputer (SCM) system 30 (S131) again, Single Chip Microcomputer (SCM) system is controlled this autotest program by the iic bus circuit again will select a test event, such as button, loudspeaker etc. are tested (S14) to tested MP3 motherboard 20 these functions, above-mentioned autotest program will be tested back information, feed back to Single Chip Microcomputer (SCM) system by iic bus circuit 320, but when the test line traffic control, will use array type analogue signal circuit 33.
This Single Chip Microcomputer (SCM) system 30 will judge that whether tested item-function is by (S15), if test event is not by detecting, single-chip microcomputer 30 warning systems are with warning reminding, and utilize supervisory control comuter 40 to keep test record (S150), then, judge whether test finishes (S151), if finish, end of test (EOT) (S16) then is if test for finishing then jump to step S14, is tested up to all items and finished.
If test event is by detecting, supervisory control comuter 40 is kept test record, autotest program is selected another test event, then, judge whether test finishes (S151), if finish, end of test (EOT) (S16) then, if test is for finishing then jump to step S14, tests up to all items and to finish.
Claims (5)
1. function test system is characterized in that: comprise a signal acquisition circuit, and a signal processing circuit, a Single Chip Microcomputer (SCM) system, a multiple signals selector switch, an iic bus also have a memory storage, and this memory device stores has an autotest program; Auto-Test System is gathered useful signal on the tested mainboard by signal acquisition circuit, flow to Single Chip Microcomputer (SCM) system through the part after the signal processing circuit processing, single-chip microcomputer is by multiple signals selector switch and iic bus circuit, link up with the memory storage that is connected on tested mainboard and this mainboard, between tested mainboard and Single Chip Microcomputer (SCM) system, connect an array type analogue signal circuit, in order to reach the test line traffic control.
2. a kind of function test system according to claim 1 is characterized in that: connect a computing machine in Single Chip Microcomputer (SCM) system, and be provided with a functional test watchdog routine in this computing machine at least.
3. a kind of function test system according to claim 1 is characterized in that: computing machine is connected with single-chip microcomputer by the RS232 circuit.
4. a kind of function test system according to claim 1 is characterized in that: be provided with a warning system in the above-mentioned functions test macro, and this warning system is arranged in the Single Chip Microcomputer (SCM) system.
5. function test method, it is characterized in that: step is as follows,
A. assembling;
B. with system's energising, system initialization;
C. Single Chip Microcomputer (SCM) system sends out an autotest program enabled instruction;
D. Single Chip Microcomputer (SCM) system judges whether to find autotest program, does not find autotest program, and warning system is with warning reminding, and autotest program is found, starts this autotest program;
E. autotest program selects a test event to test;
F. Single Chip Microcomputer (SCM) system judges whether tested item-function is passed through, and does not pass through, and supervisory control comuter is kept test record, and Single Chip Microcomputer (SCM) system is reported to the police, and selects another test event then; By, supervisory control comuter is kept test record, and autotest program is selected another test event;
G. repeat the e-f step, finish up to all items test.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB2006101223604A CN100530130C (en) | 2006-09-25 | 2006-09-25 | Function testing system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB2006101223604A CN100530130C (en) | 2006-09-25 | 2006-09-25 | Function testing system |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN101154176A CN101154176A (en) | 2008-04-02 |
| CN100530130C true CN100530130C (en) | 2009-08-19 |
Family
ID=39255849
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNB2006101223604A Expired - Fee Related CN100530130C (en) | 2006-09-25 | 2006-09-25 | Function testing system |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN100530130C (en) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103631684A (en) * | 2012-08-21 | 2014-03-12 | 达丰(上海)电脑有限公司 | Transformer type machine table for automatically testing notebook computer mainboard |
| CN104931823B (en) * | 2015-06-08 | 2018-09-25 | 小米科技有限责任公司 | The test method and device of electronic equipment |
| CN105004986A (en) * | 2015-07-14 | 2015-10-28 | 佰电科技(苏州)有限公司 | RSG circuit motherboard function testing system and testing method thereof |
| CN105975370A (en) * | 2015-07-23 | 2016-09-28 | 乐视致新电子科技（天津）有限公司 | Method and device for testing |
| CN105892445A (en) * | 2016-04-05 | 2016-08-24 | 珠海格力电器股份有限公司 | Mainboard function test system and method |
| CN110018931A (en) * | 2018-01-09 | 2019-07-16 | 佛山市顺德区顺达电脑厂有限公司 | TPM test device and method |
-
2006
- 2006-09-25 CN CNB2006101223604A patent/CN100530130C/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| CN101154176A (en) | 2008-04-02 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN100530130C (en) | Function testing system | |
| CN106055438B (en) | The method and system of memory bar exception on a kind of quick positioning mainboard | |
| RU2757436C9 (en) | Device and method for monitoring indications of malfunction from vehicle, computer-readable media | |
| CN103970628A (en) | Automatic detection system and automatic detection method thereof | |
| CN102331569B (en) | Intelligent interactive detection apparatus for detection on electric energy meter | |
| US9336109B2 (en) | Real-time rule engine for adaptive testing of integrated circuits | |
| CN111224721A (en) | Wireless program-controlled test system and method for electronic measuring instrument | |
| CN105183593A (en) | Homemade computer based build in test system and method | |
| JP5457717B2 (en) | Test apparatus and failure module identification method | |
| CN202383661U (en) | Fault diagnosing and repairing system for computer hardware and software | |
| CN108319516B (en) | Test system and test method | |
| US8185337B1 (en) | System, method, and computer program product for testing and re-testing integrated circuits | |
| CN107766198B (en) | Server mainboard monitoring system | |
| CN100535815C (en) | Operation instruction system, operation instruction device, operation instruction program storage medium, and operation instruction method | |
| CN103217654B (en) | Touch screen remotely monitors fault diagnosis system and method | |
| US20040032249A1 (en) | Electric component test system and electric component test method | |
| CN112441255A (en) | Automatic testing device and method for flight parameter quick-taking recording system | |
| CN213457239U (en) | Test circuit and chip circuit test device | |
| CN101369243A (en) | Power consumption state test method | |
| CN110399258A (en) | A kind of stability test method, system and device of server system | |
| CN213024002U (en) | Medical imaging equipment fault diagnosis system | |
| CN114489240B (en) | Motherboard with dual power supply keys and computer complete machine | |
| CN220752232U (en) | Detection device for 300S type ATP functional module | |
| CN111896824B (en) | Unattended reliability testing device and system | |
| CN210109636U (en) | Integrated type airplane electrical control detection equipment |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C17 | Cessation of patent right | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20090819 Termination date: 20120925 |